CN118377150B - Detector assembly and debugging device and method based on visible light - Google Patents
Detector assembly and debugging device and method based on visible light Download PDFInfo
- Publication number
- CN118377150B CN118377150B CN202410484913.9A CN202410484913A CN118377150B CN 118377150 B CN118377150 B CN 118377150B CN 202410484913 A CN202410484913 A CN 202410484913A CN 118377150 B CN118377150 B CN 118377150B
- Authority
- CN
- China
- Prior art keywords
- visible light
- differential head
- detector
- seat
- debugging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 23
- 230000007246 mechanism Effects 0.000 claims abstract description 38
- 239000013078 crystal Substances 0.000 claims description 74
- 239000011324 bead Substances 0.000 claims description 27
- 230000000903 blocking effect Effects 0.000 claims description 15
- 238000003825 pressing Methods 0.000 claims description 8
- 230000005540 biological transmission Effects 0.000 claims description 6
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000003754 machining Methods 0.000 claims description 3
- 239000011148 porous material Substances 0.000 claims description 2
- 239000000463 material Substances 0.000 abstract description 3
- 238000005259 measurement Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/62—Optical apparatus specially adapted for adjusting optical elements during the assembly of optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Radiology & Medical Imaging (AREA)
- Biochemistry (AREA)
- Theoretical Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Pulmonology (AREA)
- General Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention discloses a detector assembly debugging device and method based on visible light, comprising the following steps: a standing support structure; the base part of the three-axis adjusting platform mechanism is fixedly connected with the vertical support structure, and the three-axis adjusting platform mechanism is provided with a position adjusting output end part; the light source bracket structure is fixedly connected to the position-adjusting output end part; the light source component structure is fixedly connected to the light source support structure and can output a visible light column with a specific divergence angle and an irradiation shape; the module assembly mechanism is correspondingly positioned on the extending path of the visible light column, the visible light column corresponds to the module assembly mechanism to form a visible light spot, and the visible light spot is used as a position reference marking for the module assembly mechanism to assemble and debug the detector module. The device and the method use visible light to replace X rays for debugging the detector, remarkably improve the assembly and debugging efficiency of the detector, reduce the cost of labor and materials and time, effectively prolong the service life of functional elements such as the bulb tube and the like, and enhance the practicality of the whole function.
Description
Technical Field
The invention relates to the technical field of CT system structures, in particular to a detector assembly and debugging device and method based on visible light.
Background
In the currently known CT system or other image equipment structures, the detector is one of the core devices in the whole equipment system, its performance can directly influence the imaging performance of the whole equipment, and one of the key factors influencing the performance of the detector is the method for assembling and debugging the detector and its debugging level.
In the existing assembly and debugging process of the detector, the assembly and debugging of the detector are basically carried out in a paying-off and graph-sweeping mode. By doing the probe debugging in this way, at least the following problems are mainly present:
1. the detector debugging process needs to be accompanied with X-ray bulb tube exposure, so that the function adaptability is poor and the limitation is high;
2. in the bulb tube exposure process, a debugging engineer needs to leave an exposure space, view a debugging image outside the space, detach the detector module, and pertinently adjust the relative positions of the crystal module, the mounting frame and the ASG (anti-scattering grid) according to the debugging image, so that the operation mode is time-consuming and complex and has low efficiency;
3. bulb exposure is costly to electrical energy and can wear out the life of the bulb and its high voltage generator.
Disclosure of Invention
Therefore, the invention provides a device and a method for assembling and debugging a detector based on visible light, which are used for solving the technical problems in the prior art when the detector is assembled and debugged through paying-off and scanning.
In order to achieve the above object, the present invention provides the following technical solutions:
a detector assembly debugging device based on visible light comprises:
A standing support structure;
the three-axis adjusting platform mechanism is fixedly arranged on the standing support structure in a fixedly-assembled mode, and is provided with a position adjusting output end part capable of adjusting the position in the XYZ direction;
the light source support structure is fixedly assembled and arranged at the position-adjusting output end part of the triaxial adjustment platform mechanism;
The light source component structure is fixedly assembled and arranged on the light source bracket structure, and can output a visible light column with a specific divergence angle and an irradiation shape;
The module assembly mechanism is correspondingly positioned on the extending path of the visible light column, the visible light column corresponds to the module assembly mechanism to form a visible light spot, and the visible light spot is used as a position reference mark for the module assembly mechanism to assemble and debug the detector module.
On the basis of the technical scheme, the invention is further described as follows:
as a further scheme of the invention, the light source component structure comprises a lamp holder body, a lens pressing ring, a lens main body, a lens seat and a COB lamp bead plate;
One end part of the COB lamp bead plate is fixedly assembled and arranged on the light source support structure, and a visible light source capable of performing position fine adjustment based on the light source support structure is formed through the COB lamp bead plate;
The lamp holder body is fixedly connected and assembled on the other end face of the COB lamp bead plate;
The lens main body is arranged on the lens seat, the lens main body and the COB lamp bead plate are correspondingly arranged, the lens pressing ring is arranged on the basis of clamping and fixedly connecting assembly between the lens main body and the lens seat after the lens seat is pressed and positioned, one end part of the lens seat and one end part of the lamp holder body, which is far away from the COB lamp bead plate, are fixedly connected and arranged, and visible light beams emitted by the COB lamp beads are focused and diverged by the lens main body and then output visible light columns with specific divergence angles.
As a further scheme of the invention, the light source assembly structure further comprises a light blocking gate and a light gate seat;
The optical gate seat is detachably and fixedly arranged at the other end part of the lens seat, and the optical gate is detachably clamped at a clamping position close to one end surface of the lens seat; the light blocking gate and the lens main body are correspondingly arranged, a light hole is formed in the middle of the light blocking gate, and the visible light column with the specific divergence angle outputs the visible light column with the specific irradiation shape through the light hole.
As a further scheme of the invention, the light transmission hole is arranged as a rectangular hole, and four side edges of the rectangular light transmission hole form a divergent light transmission channel in an inclined mode based on the specific divergence angle of the visible light column respectively.
As a further aspect of the present invention, the method further comprises:
the flexible camera bellows structure comprises a fixed through seat, a flexible light shield and an operation camera;
the fixed through hole seat is fixedly sleeved on the lateral part of the periphery of the lens seat;
The small opening end part of the flexible light shield is connected with the fixed opening seat in a closed manner, and the large opening end part of the flexible light shield is connected with the operation darkroom in a closed manner;
the module assembling mechanism is correspondingly arranged in the operation darkroom;
The outer wall of the operation darkroom is provided with an operation pore canal communicated with the inside and the outside of the operation darkroom.
As a further scheme of the invention, the module assembling mechanism comprises a positioning base, a crystal alignment seat, a measuring differential head, a hand-screwed bolt assembly, a module positioning seat, an ASG anti-scattering grid and a crystal module;
the two groups of positioning bases are respectively and fixedly arranged in the operation darkroom;
The two ends of the crystal alignment seat are fixedly connected and assembled on the two groups of positioning bases in a one-to-one correspondence manner respectively, and the crystal alignment seat is correspondingly provided with a debugging channel;
The two ends of the module positioning seat are respectively and correspondingly clamped and fixedly assembled on the two groups of positioning bases, the crystal module is correspondingly arranged at the top of the module positioning seat, the ASG anti-scattering grid is correspondingly arranged at the top of the crystal module, and the crystal module and the ASG anti-scattering grid are correspondingly arranged in a debugging channel of the crystal alignment seat;
the measuring differential head is fixedly connected and assembled with the crystal alignment seat, the hand-screwed bolt assembly is screwed and assembled with the crystal alignment seat, and the measuring differential head and the hand-screwed bolt assembly are correspondingly arranged between the measuring differential head and the inside of a debugging channel of the crystal alignment seat.
As a further scheme of the invention, the measuring differential head comprises a first Z-direction differential head, a first X-direction differential head, a second Z-direction differential head and a second X-direction differential head;
The first Z-direction micro-head corresponds to the position of one side of the ASG anti-scattering grid in the Z direction, and the position parameter of the ASG anti-scattering grid in the Z direction is measured and displayed through the first Z-direction micro-head;
The first X-direction differential head and the second X-direction differential head are respectively corresponding to the X-direction one-side position of the crystal module, and position parameters of the ASG anti-scattering grid in the X direction are measured and displayed through the first X-direction differential head and the second X-direction differential head;
the second Z-direction differential head corresponds to the Z-direction one-side position of the crystal module, and the Z-direction position parameter of the crystal module is measured and displayed after the crystal module is debugged and positioned through the second Z-direction differential head.
As a further scheme of the invention, the hand-screwed bolt assembly comprises at least two groups of side hand-screwed bolts and a plurality of groups of middle hand-screwed bolts;
The at least two groups of side hand-screwed bolts and the plurality of groups of middle hand-screwed bolts are respectively screwed and assembled on the crystal alignment seat, and the at least two groups of side hand-screwed bolts and the plurality of groups of middle hand-screwed bolts are positioned on opposite side parts of the first X-direction differential head and the second X-direction differential head;
At least two groups of side hand-screwed bolts are respectively and correspondingly positioned at two side parts of the middle hand-screwed bolts, and the side hand-screwed bolts are higher than the middle hand-screwed bolts.
The debugging method for the assembly debugging device of the detector based on the visible light comprises the following steps:
the COB lamp bead plate in the light source assembly structure is used as a light source to emit visible light, the visible light is focused and diverged through the lens main body in the light source assembly structure, so that the divergence angle of the diverged light is kept equal to the divergence angle of the bulb tube or kept at a relative difference value within a specific threshold range, the diverged light further passes through the light transmission hole of the light gate seat in the light source assembly structure to form visible light spots with specific irradiation shapes, and the size of the visible light spots is adjusted to be consistent with the size of the focus of the corresponding bulb tube;
positioning the crystal module in the X direction based on the matching of the crystal alignment seat and the hand-screwed bolt assembly in the module assembly mechanism, using the visible light spot as a position reference mark for the assembly and debugging of the detector, further adjusting the position of the crystal module in the Z direction through a second Z-direction differential head in the module assembly mechanism, and displaying Z-position parameters of the crystal module by using the second Z-direction differential head;
and (3) assembling the ASG anti-scattering grid on the crystal module, continuously combining the visible light spots as position reference marks for assembling and debugging the detector, performing fine adjustment on the X direction and the Z direction of the anti-scattering grid through the first Z direction differential head and the first X direction differential head and the second X direction differential head to realize the functions of simulating the X-focus and the Z-focus of the spherical tube, further measuring and displaying the position parameters of the ASG anti-scattering grid in the Z direction through the first Z direction differential head, and simultaneously measuring and displaying the position parameters of the ASG anti-scattering grid in the X direction through the first X direction differential head and the second X direction differential head, thereby completing the assembling and debugging procedure of the detector module.
As a further scheme of the invention, the method further comprises the following steps:
the detector modules formed by the crystal modules and the ASG anti-scattering grids after assembly and debugging are further arranged on the detector guide rails, and the alignment degree of all the detector modules in the Z direction is further and integrally adjusted based on the detector guide rails so as to adapt to the precision deviation of different detector guide rails during machining, ensure the final assembly and debugging quality of the whole detector and finish the assembly and debugging of the whole detector.
The invention has the following beneficial effects:
The device and the method use visible light to replace X rays for debugging the detector, remarkably improve the assembly and debugging efficiency of the detector, reduce the cost of labor and materials and time, effectively prolong the service life of functional elements such as the bulb tube and the like, and enhance the overall functional practicality of the device.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following description will simply refer to the drawings required in the embodiments or the description of the prior art, and structures, proportions, sizes and the like which are shown in the specification are merely used in conjunction with the disclosure of the present invention, so that those skilled in the art can understand and read the disclosure, and any structural modifications, changes in proportion or adjustment of sizes should still fall within the scope of the disclosure of the present invention without affecting the effects and the achieved objects of the present invention.
Fig. 1 is a schematic diagram of an overall axial measurement exploded structure of a detector assembly and debugging device based on visible light according to an embodiment of the present invention.
Fig. 2 is an exploded view of a light source assembly in a detector assembly and debugging device based on visible light according to an embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a light blocking gate in a structure of a light source component corresponding to a detector assembly and debugging device based on visible light according to an embodiment of the present invention.
Fig. 4 is a schematic view of a state of a visible light column in a structure of a light source assembly corresponding to a detector assembly debugging device based on visible light according to an embodiment of the present invention.
Fig. 5 is a schematic diagram of the overall structure of a flexible camera bellows structure in a detector assembly and debugging device based on visible light according to an embodiment of the present invention.
Fig. 6 is an exploded view of a module assembly mechanism in a detector assembly and debugging device based on visible light according to an embodiment of the present invention.
In the drawings, the list of components represented by the various numbers is as follows:
a standing support structure 1; a triaxial adjustment platform mechanism 2; a light source support structure 3;
Light source assembly structure 4: the lamp socket 41, the lens pressing ring 42, the lens body 43, the lens holder 44, the light blocking gate 45, the light transmitting hole 451, the light gate holder 46, the COB lamp bead plate 47, and the visible light column 471;
flexible camera bellows structure 5: a fixed through hole seat 51, a flexible light shield 52, an operation darkroom 53, an operation hole channel 54 and a window 55;
Module assembling mechanism 6: the positioning base 61, the crystal alignment seat 62, the measuring differential head 63, the first Z-direction differential head 631, the first X-direction differential head 632, the second Z-direction differential head 633, the second X-direction differential head 634, the hand-screwed bolt assembly 64, the side hand-screwed bolt 641, the middle hand-screwed bolt 642, the module positioning seat 65, the ASG anti-scattering grid 66 and the crystal module 67.
Detailed Description
Other advantages and advantages of the present invention will become apparent to those skilled in the art from the following detailed description, which, by way of illustration, is to be read in connection with certain specific embodiments, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The terms such as "upper", "lower", "left", "right", "middle" and the like are also used herein for descriptive purposes only and are not intended to limit the scope of the invention for which the invention may be practiced or for which the relative relationship may be altered or modified without materially altering the technical context.
As shown in fig. 1 to 6, the embodiment of the invention provides a detector assembly and debugging device based on visible light, which comprises a standing support structure 1, a triaxial adjustment platform mechanism 2, a light source support structure 3, a light source assembly structure 4, a flexible camera bellows structure 5 and a module assembly mechanism 6, wherein visible light spots with specific irradiation shapes are formed by matching the standing support structure 1, the triaxial adjustment platform mechanism 2, the light source support structure 3 and the light source assembly structure 4 to be effectively used as position reference marks for the detector assembly and debugging, and meanwhile, the flexible camera bellows structure 5 can be utilized to remarkably enhance the gathering visibility of the visible light, so that a debugging engineer can realize real-time debugging of a detector module according to images, the debugging efficiency of the detector is greatly improved, the labor, materials and time cost required by debugging the detector are reduced, and the overall functional practicality of the device is enhanced. The specific arrangement is as follows:
Referring to fig. 1, the stand support structure 1 is configured as a vertically extending stand support, so as to effectively serve as an installation base of the whole device through the stand support structure 1; the base part of the triaxial adjustment platform mechanism 2 is fixedly assembled and arranged at the top end position of the standing support structure 1, and the triaxial adjustment platform mechanism 2 is provided with a position adjustment output end part capable of adjusting the position in the XYZ direction; the light source support structure 3 is fixedly connected and assembled at the position-adjusting output end part of the three-axis adjusting platform mechanism 2, the light source assembly structure 4 is fixedly connected and assembled at the light source support structure 3, so that the light source position fine adjustment formed on the light source assembly structure 4 through the light source support structure 3 by the three-axis adjusting platform mechanism 2 can be effectively realized, the X-direction and Z-direction position fine adjustment can be utilized to realize the X-fei-jiao and Z-fei-jiao function of the simulated bulb tube, meanwhile, the SDD parameters of an adjustment image can be realized by means of Y-direction position fine adjustment, the distance between the light source assembly structure 4 and a debugging detector can be effectively adjusted on the basis of Y-direction position fine adjustment, and then visible light with specific irradiation shape can be matched with detectors with different geometric dimensions, and the functional suitability based on visible light debugging is remarkably improved.
Specifically, referring to fig. 1 to 2, the light source assembly structure 4 includes a lamp holder 41, a lens pressing ring 42, a lens body 43, a lens holder 44, a light blocking shutter 45, a shutter holder 46, and a COB lamp bead plate 47; wherein, one end of the COB lamp bead plate 47 is fixedly assembled and arranged on the light source support structure 3, so that a light source capable of performing fine adjustment based on the light source support structure 3 is formed by the COB lamp bead plate 47; the lamp holder 41 is fixedly assembled and arranged on the other end face of the COB lamp bead plate 47, and is used as a closed accommodating cover body of the COB lamp bead light source through the lamp holder 41; the lens main body 43 is disposed in the lens seat 44, and the lens main body 43 and the COB lamp bead plate 47 are correspondingly disposed, the lens pressing ring 42 is disposed in a clamping position fixedly connected assembly connection manner between the lens main body 43 and the lens seat 44 after the lens seat 44 is pressed and positioned, one end portion of the lens seat 44 and one end portion of the lamp seat 41 away from the COB lamp bead plate 47 are fixedly connected and disposed, so that a focusing and diverging lens assembly is effectively formed based on the COB lamp bead light source, and the ray divergence angle simulation consistency with the bulb is finally realized after the ray emitted by the COB lamp bead is focused and/or diverged through the lens main body 43.
Referring to fig. 2 to 4, the shutter base 46 is detachably and fixedly mounted on the other end of the lens base 44, and the shutter base 46 is disposed near an end face of the lens base 44 and is provided with the light blocking gate 45, the light blocking gate 45 and the lens body 43 are correspondingly disposed, a light transmitting hole 451 is formed in a middle position of the light blocking gate 45, the light transmitting hole 451 is configured as a rectangular hole, and four side edges of the rectangular light transmitting hole 451 form a divergent light transmitting channel with a predetermined divergence angle based on the light blocking gate 45 respectively, so as to simulate the focus of the bulb by using the light blocking gate 45, and simultaneously, the focus of the bulb can be synchronously simulated by means of the light transmitting hole 451, so that light rays with a specific divergence angle can be allowed to pass through the divergent light transmitting channel and finally form a visible light column 471 with a specific shape.
Referring to fig. 5, the flexible camera structure 5 includes a fixed port seat 51, a flexible light shield 52, and an operation camera 53; wherein, the fixed through-hole seat 51 is fixedly sleeved on the side part of the periphery of the lens seat 44; the small opening end of the flexible light-shielding cover 52 is connected with the fixed opening seat 51 in a closed manner, and the large opening end of the flexible light-shielding cover 52 is connected with the operation darkroom 53 in a closed manner, so that the flexible light-shielding cover 52 is used as an extension passage of the visible light column 471 to remarkably enhance the gathering visibility of the visible light column 471; the module assembling mechanism 6 is correspondingly arranged in the operation darkroom 53, and an operation duct 54 communicated with the inside and the outside of the operation darkroom 53 is formed on the outer wall of the operation darkroom 53, so that the debugging process of the detector is completed based on the operation duct 54 effectively corresponding to the module assembling mechanism 6.
As a preferred solution of this embodiment, the outer wall of the operation darkroom 53 is further provided with a window 55, so as to assist synchronous observation through the window 55, thereby implementing more accurate completion of the detector debugging process.
Referring to fig. 6, the module assembling mechanism 6 includes a positioning base 61, a crystal alignment seat 62, a measuring differential head 63, a hand-screwed bolt assembly 64, a module positioning seat 65, an ASG anti-scattering grid 66 and a crystal module 67; wherein, two groups of positioning bases 61 are provided, and the two groups of positioning bases 61 are respectively and fixedly arranged in the operation darkroom 53; the two ends of the crystal alignment seat 62 are fixedly connected and assembled on the two groups of the positioning bases 61 in a one-to-one correspondence manner, and the crystal alignment seat 62 is correspondingly provided with a debugging channel; the two ends of the module positioning seat 65 are respectively and fixedly assembled on the two groups of positioning bases 61 in a one-to-one correspondence manner, the crystal module 67 is correspondingly arranged on the top of the module positioning seat 65, the ASG anti-scattering grid 66 is correspondingly arranged on the top of the crystal module 67, and the crystal module 67 and the ASG anti-scattering grid 66 are correspondingly arranged in the debugging channel of the crystal alignment seat 62; the measurement differential head 63 is fixedly assembled and arranged on the crystal alignment seat 62, the hand-screwed bolt assembly 64 is screwed and assembled on the crystal alignment seat 62, the measurement differential head 63 and the hand-screwed bolt assembly 64 are correspondingly arranged between the insides of the debugging channels of the crystal alignment seat 62, so that the positioning function can be effectively formed on the crystal module 67 and the ASG anti-scattering grid 66 in the X direction by matching the crystal alignment seat 62 with the hand-screwed bolt assembly 64 based on the position reference mark formed by the visible light column 471, the debugging positioning function can be formed on the crystal module 67 and the ASG anti-scattering grid 66 in the Z direction by utilizing the measurement differential head 63, the measurement display of the position parameters of the crystal module 67 and the ASG anti-scattering grid 66 in the X direction and the Z direction can be further respectively realized, and in addition, the X-focus and Z-focus parameters can be debugged by means of the ASG anti-scattering grid 66 based on the visible light column 471.
Specifically, the measurement differential head 63 includes a first Z-direction differential head 631, a first X-direction differential head 632, a second Z-direction differential head 633, and a second X-direction differential head 634; wherein the first Z-direction differential head 631 corresponds to a Z-direction side position of the ASG anti-scatter grid 66 for measuring a position parameter of the ASG anti-scatter grid 66 in the Z-direction by the first Z-direction differential head 631; the first X-direction micro head 632 and the second X-direction micro head 634 are corresponding to the X-direction side position of the crystal module 67, so as to display the position parameter of the ASG anti-scattering grid 66 in the X-direction through the measurement of the first X-direction micro head 632 and the second X-direction micro head 634; the second Z-direction differential head 633 corresponds to a position of one side of the crystal module 67 in the Z-direction, so that after the crystal module 67 is positioned by the second Z-direction differential head 633, the position parameter of the crystal module 67 in the Z-direction is further measured, thereby realizing the overall assembly and debugging.
The hand-screwed bolt assembly 64 comprises at least two sets of side hand-screwed bolts 641 and a plurality of sets of middle hand-screwed bolts 642; at least two sets of side hand screw bolts 641 and a plurality of sets of middle hand screw bolts 642 are respectively assembled and arranged on the crystal alignment seat 62 in a screwed manner, and at least two sets of side hand screw bolts 641 and a plurality of sets of middle hand screw bolts 642 are both positioned on opposite sides of the first X-direction differential head 632 and the second X-direction differential head 634, at least two sets of side hand screw bolts 641 are respectively positioned on two sides of a plurality of sets of middle hand screw bolts 642 in a corresponding manner, and at least two sets of side hand screw bolts 641 are both higher than a plurality of sets of middle hand screw bolts 642, so that a positioning effect is effectively formed on the ASG anti-scattering grid 66 in the X direction through the side hand screw bolts 641, and a positioning effect is effectively formed on the crystal module 67 in the X direction through the middle hand screw bolts 642, thereby ensuring the overall positioning functionality.
The debugging method of the detector assembly debugging device based on visible light specifically comprises the following steps:
S1: the COB lamp bead plate 47 in the light source assembly structure 4 is used as a light source to emit visible light, the visible light is focused and diverged by the lens main body 43 in the light source assembly structure 4, so that the divergence angle of the diverged light is equal to the divergence angle of the bulb tube or is kept relatively different within a specific threshold range, the diverged light passes through the light holes 451 of the light gate seat 46 in the light source assembly structure 4 to form visible light spots with specific irradiation shapes, and the size of the visible light spots is adjusted to be consistent with the size of the focus of the corresponding bulb tube;
S2: the crystal alignment seat 62 and the hand-screwed bolt assembly 64 in the module assembly mechanism 6 are matched to position the crystal module 67 in the X direction, a visible light spot is used as a position reference mark for the assembly and debugging of the detector, the position of the crystal module 67 is further adjusted in the Z direction through a second Z-direction differentiating head 633 in the module assembly mechanism 6, and Z-direction position parameters of the crystal module 67 are displayed through the second Z-direction differentiating head 633;
S3: the ASG anti-scattering grid 66 is assembled on the crystal module 67, the visible light spots are continuously combined to serve as position reference marks for detector assembly debugging, X-direction fine adjustment and Z-direction fine adjustment are carried out on the anti-scattering grid 66 through the first Z-direction differential head 631 and the first X-direction differential head 632 and the second X-direction differential head 634, the X-direction focusing and Z-direction focusing functions of the simulated bulb tube are achieved, the position parameters of the ASG anti-scattering grid 66 in the Z direction are further measured and displayed through the first Z-direction differential head 631, and meanwhile the position parameters of the ASG anti-scattering grid 66 in the X direction are measured and displayed through the first X-direction differential head 632 and the second X-direction differential head 634;
S4: the detector modules formed by the crystal module 67 and the ASG anti-scattering grid 66 after the assembly and debugging are further arranged on the detector guide rail, and the alignment degree of all the detector modules in the Z direction is further and integrally and uniformly adjusted based on the detector guide rail so as to adapt to the precision deviation of different detector guide rails during machining, ensure the final assembly and debugging quality of the whole detector and finish the assembly and debugging of the whole detector.
The method has the advantages of safety, convenience, time and labor saving and rapidness in the aspect of detector assembly and debugging.
While the invention has been described in detail in the foregoing general description and specific examples, it will be apparent to those skilled in the art that modifications and improvements can be made thereto. Accordingly, such modifications or improvements may be made without departing from the spirit of the invention and are intended to be within the scope of the invention as claimed.
Claims (7)
1. A detector equipment debugging device based on visible light, its characterized in that includes:
A standing support structure;
the three-axis adjusting platform mechanism is fixedly arranged on the standing support structure in a fixedly-assembled mode, and is provided with a position adjusting output end part capable of adjusting the position in the XYZ direction;
the light source support structure is fixedly assembled and arranged at the position-adjusting output end part of the triaxial adjustment platform mechanism;
The light source assembly structure is fixedly assembled and arranged on the light source bracket structure, and can output a visible light column with a preset divergence angle and an irradiation shape;
The module assembly mechanism is correspondingly positioned on the extending path of the visible light column, the visible light column corresponds to the module assembly mechanism to form a visible light spot, and the visible light spot is used as a position reference mark for the module assembly mechanism to assemble and debug the detector module;
The light source component structure comprises a lamp holder body, a lens pressing ring, a lens main body, a lens seat and a COB lamp bead plate;
One end part of the COB lamp bead plate is fixedly assembled and arranged on the light source support structure, and a visible light source capable of performing position fine adjustment based on the light source support structure is formed through the COB lamp bead plate;
The lamp holder body is fixedly connected and assembled on the other end face of the COB lamp bead plate;
The lens main body is arranged on the lens seat, the lens main body and the COB lamp bead plate are correspondingly arranged, the lens pressing ring is fixedly connected with the lens seat in a clamping position and fixedly assembled manner after the lens main body is positioned based on the pressing of the lens seat, one end part of the lens seat and one end part of the lamp holder body, which is far away from the COB lamp bead plate, are fixedly connected with each other, and visible light beams emitted by the COB lamp beads are focused and diverged by the lens main body and then output visible light beams with preset divergence angles;
the detector assembly debugging device based on visible light further comprises:
the flexible camera bellows structure comprises a fixed through seat, a flexible light shield and an operation camera;
the fixed through hole seat is fixedly sleeved on the lateral part of the periphery of the lens seat;
The small opening end part of the flexible light shield is connected with the fixed opening seat in a closed manner, and the large opening end part of the flexible light shield is connected with the operation darkroom in a closed manner;
the module assembling mechanism is correspondingly arranged in the operation darkroom;
the outer wall of the operation darkroom is provided with an operation pore canal communicated with the inside and the outside of the operation darkroom;
the module assembling mechanism comprises a positioning base, a crystal alignment seat, a measuring differential head, a hand-screwed bolt assembly, a module positioning seat, an ASG anti-scattering grid and a crystal module;
the two groups of positioning bases are respectively and fixedly arranged in the operation darkroom;
The two ends of the crystal alignment seat are fixedly connected and assembled on the two groups of positioning bases in a one-to-one correspondence manner respectively, and the crystal alignment seat is correspondingly provided with a debugging channel;
The two ends of the module positioning seat are respectively and correspondingly clamped and fixedly assembled on the two groups of positioning bases, the crystal module is correspondingly arranged at the top of the module positioning seat, the ASG anti-scattering grid is correspondingly arranged at the top of the crystal module, and the crystal module and the ASG anti-scattering grid are correspondingly arranged in a debugging channel of the crystal alignment seat;
the measuring differential head is fixedly connected and assembled with the crystal alignment seat, the hand-screwed bolt assembly is screwed and assembled with the crystal alignment seat, and the measuring differential head and the hand-screwed bolt assembly are correspondingly arranged between the measuring differential head and the inside of a debugging channel of the crystal alignment seat.
2. The detector assembly debugging device based on visible light as claimed in claim 1, wherein,
The light source assembly structure also comprises a light blocking gate and a light gate seat;
The optical gate seat is detachably and fixedly arranged at the other end part of the lens seat, and the optical gate is detachably clamped at a clamping position close to one end surface of the lens seat; the light blocking gate and the lens main body are correspondingly arranged, a light hole is formed in the middle of the light blocking gate, and the visible light column with the preset divergence angle outputs the visible light column with the preset irradiation shape through the light hole.
3. The detector assembly debugging device based on visible light as claimed in claim 2, wherein,
The light hole is set to be a rectangular hole, and four side edges of the rectangular light hole are respectively based on the light blocking gate and form a divergent light transmission channel in an inclined mode with a preset divergence angle of the visible light column.
4. The detector assembly and debugging device based on visible light as claimed in claim 3, wherein,
The measuring differential head comprises a first Z-direction differential head, a first X-direction differential head, a second Z-direction differential head and a second X-direction differential head;
the first Z-direction differential head is correspondingly arranged at one side of the ASG anti-scattering grid in the Z direction, and the position parameter of the ASG anti-scattering grid in the Z direction is measured and displayed through the first Z-direction differential head;
The first X-direction differential head and the second X-direction differential head are arranged on one side of the crystal module in the X-direction corresponding to each other, and position parameters of the ASG anti-scattering grid in the X-direction are measured and displayed through the first X-direction differential head and the second X-direction differential head;
The second Z-direction differential head is correspondingly arranged on one side of the crystal module in the Z direction, and the position parameters of the crystal module in the Z direction are measured and displayed after the crystal module is debugged and positioned through the second Z-direction differential head.
5. The detector assembly and debugging device based on visible light as claimed in claim 4, wherein,
The hand-screwed bolt assembly comprises at least two groups of side hand-screwed bolts and a plurality of groups of middle hand-screwed bolts;
The at least two groups of side hand-screwed bolts and the plurality of groups of middle hand-screwed bolts are respectively screwed and assembled on the crystal alignment seat, and the at least two groups of side hand-screwed bolts and the plurality of groups of middle hand-screwed bolts are positioned on opposite side parts of the first X-direction differential head and the second X-direction differential head;
At least two groups of side hand-screwed bolts are respectively and correspondingly positioned at two side parts of the middle hand-screwed bolts, and the side hand-screwed bolts are higher than the middle hand-screwed bolts.
6. A method for debugging a visible light-based detector assembly debugging device using the method for debugging a visible light-based detector assembly debugging device according to claim 5, comprising the following steps:
The COB lamp bead plate in the light source assembly structure is used as a light source to emit visible light, the visible light is focused and diverged through the lens main body in the light source assembly structure, so that the divergence angle of the diverged light is kept equal to the divergence angle of the bulb tube or kept at a relative difference value within a threshold range, the diverged light further passes through the light transmission hole of the optical gate seat in the light source assembly structure to form a visible light spot with a preset irradiation shape, and the size of the visible light spot is adjusted to be consistent with the size of the focus of the corresponding bulb tube;
positioning the crystal module in the X direction based on the matching of the crystal alignment seat and the hand-screwed bolt assembly in the module assembly mechanism, using the visible light spot as a position reference mark for the assembly and debugging of the detector, further adjusting the position of the crystal module in the Z direction through a second Z-direction differential head in the module assembly mechanism, and displaying Z-position parameters of the crystal module by using the second Z-direction differential head;
and (3) assembling the ASG anti-scattering grid on the crystal module, continuously combining the visible light spots as position reference marks for assembling and debugging the detector, performing fine adjustment on the X direction and the Z direction of the anti-scattering grid through the first Z direction differential head and the first X direction differential head and the second X direction differential head to realize the functions of simulating the X-focus and the Z-focus of the spherical tube, further measuring and displaying the position parameters of the ASG anti-scattering grid in the Z direction through the first Z direction differential head, and simultaneously measuring and displaying the position parameters of the ASG anti-scattering grid in the X direction through the first X direction differential head and the second X direction differential head, thereby completing the assembling and debugging procedure of the detector module.
7. The method for debugging a visible light based detector assembly debugging device of claim 6, further comprising the steps of:
the detector modules formed by the crystal modules and the ASG anti-scattering grids after assembly and debugging are further arranged on the detector guide rails, and the alignment degree of all the detector modules in the Z direction is further and integrally adjusted based on the detector guide rails so as to adapt to the precision deviation of different detector guide rails during machining, ensure the final assembly and debugging quality of the whole detector and finish the assembly and debugging of the whole detector.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202410484913.9A CN118377150B (en) | 2024-04-22 | 2024-04-22 | Detector assembly and debugging device and method based on visible light |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202410484913.9A CN118377150B (en) | 2024-04-22 | 2024-04-22 | Detector assembly and debugging device and method based on visible light |
Publications (2)
Publication Number | Publication Date |
---|---|
CN118377150A CN118377150A (en) | 2024-07-23 |
CN118377150B true CN118377150B (en) | 2024-10-18 |
Family
ID=91908002
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202410484913.9A Active CN118377150B (en) | 2024-04-22 | 2024-04-22 | Detector assembly and debugging device and method based on visible light |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN118377150B (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103674979A (en) * | 2012-09-19 | 2014-03-26 | 同方威视技术股份有限公司 | CT (computed tomography) luggage safety inspection system and detector device of CT safety inspection system |
CN103845066A (en) * | 2012-12-07 | 2014-06-11 | 上海联影医疗科技有限公司 | X-ray anti-scatter grid lattice structure, detector device and medical image system |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8525119B2 (en) * | 2009-05-20 | 2013-09-03 | Koninklijke Philips N. V. | Detector array with pre-focused anti-scatter grid |
JP2017164425A (en) * | 2016-03-18 | 2017-09-21 | 株式会社島津製作所 | X-ray apparatus |
CN113405776B (en) * | 2021-06-09 | 2022-05-20 | 中国人民解放军陆军工程大学 | Multi-optical-axis consistency detection device and method for photoelectric observation system |
KR102608202B1 (en) * | 2021-11-11 | 2023-12-01 | 서울대학교산학협력단 | UV-VIS-NIR spectroscopic analyzer for measuring transmittance |
CN116350251A (en) * | 2023-01-03 | 2023-06-30 | 赛诺威盛医疗科技(扬州)有限公司 | Alignment adjusting device for CT detector crystal and crystal module collimator |
-
2024
- 2024-04-22 CN CN202410484913.9A patent/CN118377150B/en active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103674979A (en) * | 2012-09-19 | 2014-03-26 | 同方威视技术股份有限公司 | CT (computed tomography) luggage safety inspection system and detector device of CT safety inspection system |
CN103845066A (en) * | 2012-12-07 | 2014-06-11 | 上海联影医疗科技有限公司 | X-ray anti-scatter grid lattice structure, detector device and medical image system |
Also Published As
Publication number | Publication date |
---|---|
CN118377150A (en) | 2024-07-23 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN109916916A (en) | Appearance detection equipment | |
CN103454070B (en) | A kind of X-ray combination refractor focusing performance method of testing based on CCD detection | |
CN110187512B (en) | Visual-adjustment parabolic mirror color schlieren imaging device | |
CN102435417B (en) | On-line dimension image testing device for focus degree of curved surface of optothermal-collecting electricity-generating reflecting mirror | |
CN104199082B (en) | X-ray and laser coaxial system | |
CN104964992A (en) | X ray standard detection system | |
CN103499433B (en) | Calibration method for distortion of f-theta optical system | |
CN105444993A (en) | Optical system comprehensive performance tester | |
CN114253003A (en) | Tube shell laser alignment debugging device and method | |
CN118377150B (en) | Detector assembly and debugging device and method based on visible light | |
CN215338825U (en) | Binocular camera optical axis calibration device for VR test | |
KR101418263B1 (en) | Collimator Apparatus Having Auxiliary Device for Determining Location of Film | |
CN203606107U (en) | A calibration device for distortion of f-theta optical system | |
CN101158655B (en) | Laser aiming image monitoring arrangement used for single-crystal orientation tester | |
CN101799633B (en) | Method and device for off-line measurement of optimal object plane of imaging system | |
CN113588213B (en) | A binocular camera optical axis calibration method and device for VR testing | |
CN103454068B (en) | Based on the X-ray combination refractor focusing performance proving installation of CCD detection | |
CN217005732U (en) | Real-time focusing device for testing sheet flatness under high-resolution lens | |
CN114858815A (en) | Silk screen repairing device and method with defect positioning function | |
CN203587321U (en) | X ray combined refractor focusing performance tester based on CCD detection | |
CN207501881U (en) | Lug weldering print measuring device | |
CN209250796U (en) | A kind of alignment imaging position marker focal plane commissioning device | |
CN113405782A (en) | Wide-range distortion measuring device | |
CN115014712B (en) | Ultraviolet point light source detection device and detection method for microchannel plate collimator | |
CN104280995B (en) | Quick imaging method of camera focal plane charge coupled device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |