CN118212967A - Multiport hard disk test board of automatic tester of one-stop hard disk - Google Patents
Multiport hard disk test board of automatic tester of one-stop hard disk Download PDFInfo
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- CN118212967A CN118212967A CN202410264418.7A CN202410264418A CN118212967A CN 118212967 A CN118212967 A CN 118212967A CN 202410264418 A CN202410264418 A CN 202410264418A CN 118212967 A CN118212967 A CN 118212967A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/40—Bus structure
- G06F13/4063—Device-to-bus coupling
- G06F13/4068—Electrical coupling
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/42—Bus transfer protocol, e.g. handshake; Synchronisation
- G06F13/4282—Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5004—Voltage
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- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
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- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
本发明涉及硬盘测试技术领域，尤其是涉及一种一站式硬盘自动化测试仪的多端口硬盘测试板，包括多端口硬盘测试板，多端口硬盘测试板用于连接带有测试软件的服务器，对硬盘进行测试，多端口硬盘测试板上均集成设置有起到中央控制作用的中央控制单元、用于导入测试软件的端口连接单元、用于为多端口硬盘测试板供电的供电端口、以及用于对硬盘进行测试的多组硬盘测试单元；能够大大降低测试成本和测试的繁琐度，使能够在硬盘一站式测试以及多个硬盘一起测试的基础上还能够适配不同种类的硬盘的测试。
The invention relates to the technical field of hard disk testing, and in particular to a multi-port hard disk testing board of a one-stop hard disk automatic tester, comprising a multi-port hard disk testing board, the multi-port hard disk testing board being used to connect to a server with testing software to test the hard disk, the multi-port hard disk testing board being integrated with a central control unit playing a central control role, a port connection unit for importing the testing software, a power supply port for supplying power to the multi-port hard disk testing board, and a plurality of hard disk testing units for testing the hard disk; the testing cost and the tediousness of the testing can be greatly reduced, so that the testing of different types of hard disks can be adapted on the basis of the one-stop testing of the hard disk and the testing of multiple hard disks together.
Description
Technical Field
The invention relates to the technical field of hard disk testing, in particular to a multi-port hard disk testing board of a one-stop hard disk automatic tester.
Background
In the production and manufacturing process of the solid state disk, the solid state disk generally relates to SMT, K1, RDT, K2, BIT, K3 and package grouping, namely, an artificial workstation 1, an artificial workstation 2, an artificial workstation 3, an artificial workstation 4 and an artificial workstation 5; among them, SMT is a surface mount technology, and RDT test is to accelerate malfunction of weak NAND flash blocks so as to keep only the strongest flash memory on the device, thereby maximizing reliable performance and durability. RDT tests do mask out bad blocks and unstable blocks; BIT testing is a test method for detecting problems that may occur in actual use of a solid state disk. The testing method mainly comprises the steps of simulating the working state of the hard disk under the long-time operation and high-temperature environment so as to detect whether potential faults exist; after SMT, RDT and BIT are carried out, card opening tests (K1, K2 and K3) are required to be carried out on the solid state disk, and the method is mainly used for activating the solid state disk and repairing faults of the solid state disk; in the prior art, in order to realize one-stop testing of K1, RDT, K2, BIT, and K3, some hard disk test boards are configured to perform testing of multiple steps on a hard disk, so as to prevent multiple testing operations of multiple hard disks from requiring multiple plugging operations, but complexity and cost of the hard disk test boards are increased due to integration of testing, while existing hard disks on the market have multiple different types, such as PCIE m.2, SATA2.5 inches, and the like, and the conventional hard disk test boards are single in type of hard disk for testing, and do not have the capability of intelligently identifying or adapting to different hard disks to test different types of hard disks, so that different hard disk test boards need to be adopted for testing different types of hard disks, resulting in complicated replacement and increased cost.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a technical scheme capable of solving the problems.
The multi-port hard disk test board comprises a multi-port hard disk test board, wherein the multi-port hard disk test board is used for connecting a server with test software to test a hard disk, and the multi-port hard disk test board is integrally provided with a central control unit playing a central control role, a port connection unit used for introducing the test software, a power supply port used for supplying power to the multi-port hard disk test board and a plurality of groups of hard disk test units used for testing the hard disk;
The hard disk test unit comprises a plurality of test ports for connecting the hard disk to be tested, a port logic selection circuit for performing logic selection processing on the plurality of test ports, and a power conversion chip for converting the voltage of the power supply port into the voltage required by each test port, wherein the power conversion chip is electrically connected with the test ports through the port logic selection circuit, and the server performs data transmission on the plurality of test ports in a positioning way through the port connection unit;
the central control unit comprises a central control chip for controlling the port logic selection circuit and an interface chip for serial communication with the central control chip, and the interface chip performs data interaction with the server.
Preferably, the multi-port hard disk test board is provided with a main test board and an auxiliary test board, the main test board and the auxiliary test board are respectively provided with a central control unit, a power supply port and a plurality of groups of hard disk test units, the main test board is also provided with a data transmission port connected with a server and a first communication port connected with the data transmission port, the auxiliary test board is provided with a second communication port for serial port communication with the first communication port, an interface chip on the main test board is connected with the data transmission port, and an interface chip on the auxiliary test board is connected with the second communication port.
Preferably, the test ports have PCIE M.2 test ports, SATA M.2 test ports and SATA2.5 inch test ports.
Preferably, the power supply port has a 12V output voltage, and the 12V output voltage is converted into a 5V output voltage and a 3.3V output voltage by the power conversion chip, wherein the 3.3V output voltage is supplied to the PCIE M.2 test port and the SATA M.2 test port, and the 5V output voltage is supplied to the SATA2.5 inch test port.
Preferably, the port connection unit is provided with a first connection unit, the first connection unit includes a first bus slot, a switching chip connected to the first bus slot, and a channel switching chip connected to the switching chip, where the first bus slot is used to connect to the server, the switching chip is used to convert the first bus slot to a SATA m.2 test port and a SATA2.5 inch test port, and the channel switching chip is used to branch multiple channels to connect to the SATA m.2 test port and the SATA2.5 inch test port on the multiple groups of hard disk test units, respectively.
Preferably, the port connection unit is further provided with a second connection unit, the second connection unit includes a plurality of second bus slots, and PCIE m.2 test ports on the plurality of groups of hard disk test units are respectively connected with the server through the plurality of second bus slots.
Preferably, the multiport hard disk test board is provided with eight groups of hard disk test units, the first connection unit comprises two first bus slots, two switching chips and four channel switching chips, and the second connection unit comprises eight second bus slots.
Preferably, the data transmission port is a USB interface.
Compared with the prior art, the invention has the beneficial effects that:
Through combining power supply part and control part ingenious on multiunit hard disk test unit, every group hard disk test unit adopts independent power conversion chip to do logic differentiation to the test port of different kinds on every group hard disk test unit and handle, can replace the hard disk test board of traditional single test port, reach the purpose that the different kinds of hard disk was tested to the unification more, make the different kinds of hard disk need not to change hard disk test board when the test, can greatly reduced test cost and the loaded down with trivial details degree of test, can also adapt to the test of different kinds of hard disk on the basis that a plurality of hard disks were tested together.
The test port is provided with a PCIE M.2 test port, a SATA M.2 test port and a SATA2.5 inch test port, the port connection unit is provided with a first bus slot, a transfer chip connected to the first bus slot and a channel switching chip connected to the transfer chip, so that the corresponding test port can be converted, the SATA M.2 test port and the SATA2.5 inch test port are integrated on the multi-port hard disk test board, the three-in-one multi-port hard disk test board is realized, and the three types of hard disks can be tested.
Additional aspects and advantages of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only some embodiments of the invention, and that other drawings can be obtained according to these drawings without inventive faculty for a person skilled in the art.
FIG. 1 is a block diagram of the modular connection of the present invention to a single hard disk test unit;
FIG. 2 is a block diagram of the modular connection of the hard disk test unit and the central control unit of the present invention;
FIG. 3 is a block diagram of the modular connection between the control portion and the server in the present invention;
FIG. 4 is a block diagram of a first connection unit connecting a test port according to the present invention;
fig. 5 is a block diagram of the modular connection of the primary or secondary test boards of the present invention with the central control unit removed.
Reference numerals and names in the drawings are as follows:
Server 1, main test board 2, sub test board 3, central control unit 10, central control chip 11, interface chip 12, data transmission port 13, first communication port 14, second communication port 15, port connection unit 20, first bus slot 21, switch chip 22, channel switch chip 23, second bus slot 24, power supply port 30, hard disk test unit 40, test port 41, PCIE m.2 test port 411, SATA m.2 test port 412, SATA2.5 inch test port 413, port logic selection circuit 42, power conversion chip 43.
Detailed Description
The following description of the technical solutions in the embodiments of the present invention will be clear and complete, and it is obvious that the described embodiments are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1-5, in an embodiment of the present invention, a multi-port hard disk testing board of a one-station hard disk automation tester includes a multi-port hard disk testing board, wherein the multi-port hard disk testing board is used for connecting a server 1 with testing software to test a hard disk, and the multi-port hard disk testing board is integrally provided with a central control unit 10 playing a central control role, a port connection unit 20 for introducing the testing software, a power supply port 30 for supplying power to the multi-port hard disk testing board, and a plurality of groups of hard disk testing units 40 for testing the hard disk;
the hard disk test unit 40 includes a plurality of test ports 41 for connecting the hard disk to be tested, a port logic selection circuit 42 for performing logic selection processing on the plurality of test ports 41, and a power conversion chip 43 for converting the voltage of the power supply port 30 into a voltage required for each test port 41, the power conversion chip 43 being electrically connected with the test ports 41 through the port logic selection circuit 42, the server 1 positionally transmitting data to the plurality of test ports 41 through the port connection unit 20;
the central control unit 10 includes a central control chip 11 for controlling the port logic selection circuit 42 and an interface chip 12 for serial communication with the central control chip 11, the interface chip 12 performing data interaction with the server 1.
In the above technical solution, through adopting a multi-port hard disk test board for connecting the hard disk, after the hard disk is connected to the multi-port hard disk test board by introducing a corresponding test tool into the server 1 or the computer, the multi-port hard disk test board is designed to adopt the structural design of the central control unit 10, the port connection unit 20, the power supply port 30 and the multiple groups of hard disk test units 40, through setting the hard disk test units 40 to have the power conversion chip 43 and the port logic selection circuit 42, the power supply of each test port 41 is logically processed, so that the corresponding test port 41 can be automatically identified after the hard disk is inserted, the logic processing is realized through the central control unit 10, the central control unit 10 sends the information identifying the hard disk insertion to the server 1 through the interface chip 12, so that the inserted hard disk is tested by the corresponding test tool, after the test result comes out, the result structure of the test board can be fed back to the central control unit 10 through the interface chip 12, and the central control unit 10 can be provided with a display module or an audio module on the multi-port hard disk test board, so that the central control unit 10 can feedback the feedback information to the intelligent hard disk test board through the intelligent operation module;
therefore, the power supply part and the control part are skillfully combined on the plurality of groups of hard disk test units 40, and each group of hard disk test units 40 adopts the independent power supply conversion chip 43, so that different types of test ports 41 on each group of hard disk test units 40 are logically distinguished, the hard disk test boards of the traditional single test port 41 can be replaced, the aim of testing different types of hard disks in a multi-in-one way is fulfilled, the hard disk test boards of different types are not required to be replaced during testing, the test cost and the complexity of testing can be greatly reduced, and the test of different types of hard disks can be adapted on the basis of one-stop testing of the hard disk and the test of a plurality of hard disks together.
Referring to fig. 3, in this embodiment, in order to achieve the test that one server 1 can carry more hard disks at the same time, a multi-port hard disk test board is provided with a main test board 2 and a sub test board 3, the main test board 2 and the sub test board 3 are both provided with a central control unit 10, a power supply port 30 and a plurality of groups of hard disk test units 40, the main test board 2 is also provided with a data transmission port 13 connected to the server 1 and a first communication port 14 connected to the data transmission port 13, the sub test board 3 is provided with a second communication port 15 in serial communication with the first communication port 14, an interface chip 12 on the main test board 2 is connected with the data transmission port 13, and an interface chip 12 on the sub test board 3 is connected with the second communication port 15; each server 1 can control the hard disk test conditions and the hard disk connection positions on more groups of hard disk test units 40 in a serial port communication mode through two groups of central control units 10, so that the working efficiency of hardware is improved to the greatest extent; the data transmission port 13 is a USB interface, so that the hard disk test condition and the selection of the test port 41 can be controlled and fed back through the data transmission of the USB interface.
Referring to fig. 2, in the present embodiment, three types of test ports 41 are preferably arranged according to the popular types of hard disks on the market, specifically, the test ports 41 have a PCIE m.2 test port 411, a SATA m.2 test port 412 and a SATA2.5 inch test port 413, so as to implement a three-in-one multi-port hard disk test board, and test all three types of hard disks; wherein the power supply port 30 is provided with a 12V output voltage, the 12V output voltage is converted into a 5V output voltage and a 3.3V output voltage by the power conversion chip 43, wherein the 3.3V output voltage is supplied to the PCIE m.2 test port 411 and the SATA m.2 test port 412,5V output voltage is supplied to the SATA2.5 inch test port 413.
Referring to fig. 4-5, in the present embodiment, based on the connection between the different types of test ports 41 and the server 1, since the server 1 generally uses PCIE expansion slots to connect with the multi-port hard disk test board, when in setting, PCIE m.2 test port 411 can be directly connected, SATA m.2 test port 412 and SATA2.5 inch test port 413 need to be converted, specifically, the port connection unit 20 is provided with a first connection unit, the first connection unit includes a first bus slot 21, a switch chip 22 connected to the first bus slot 21, and a channel switch chip 23 connected to the switch chip 22, where the first bus slot 21 is used for connecting with the server 1, the switch chip 22 is used for switching SATA m.2 test port 412 and SATA2.5 inch test port 413 from the first bus slot 21, the switch chip 22 is ASM1164, the channel switch chip 23 is used for branching multiple channels to be connected to SATA m.2 test port 412 and SATA2.5 inch test port 413 on the multiple sets of hard disk test units 40, and the channel switch chip 23 is ASM1480; the port connection unit 20 is further provided with a second connection unit, which includes a plurality of second bus slots 24, and PCIE m.2 test ports 411 on the plurality of groups of hard disk test units 40 are connected to the server 1 through the plurality of second bus slots 24, respectively.
Specifically, in the present embodiment, the multiport hard disk test board is provided with eight sets of hard disk test units 40, the first connection unit includes two first bus slots 21, two switching chips 22 and four channel switching chips 23, and the second connection unit includes eight second bus slots 24, so that one server 1 can connect the main test board 2 and the sub test board 3 at the same time, and test the hard disks on the 16 sets of hard disk test units 40.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein.
Claims (8)
1. The multi-port hard disk test board of the one-station hard disk automatic tester comprises a multi-port hard disk test board, wherein the multi-port hard disk test board is used for connecting a server with test software to test a hard disk, and is characterized in that a central control unit playing a central control role, a port connection unit used for importing the test software, a power supply port used for supplying power to the multi-port hard disk test board and a plurality of groups of hard disk test units used for testing the hard disk are integrated on the multi-port hard disk test board;
The hard disk test unit comprises a plurality of test ports for connecting the hard disk to be tested, a port logic selection circuit for performing logic selection processing on the plurality of test ports, and a power conversion chip for converting the voltage of the power supply port into the voltage required by each test port, wherein the power conversion chip is electrically connected with the test ports through the port logic selection circuit, and the server performs data transmission on the plurality of test ports in a positioning way through the port connection unit;
the central control unit comprises a central control chip for controlling the port logic selection circuit and an interface chip for serial communication with the central control chip, and the interface chip performs data interaction with the server.
2. The multi-port hard disk test board of the one-stop hard disk automation tester according to claim 1, wherein the multi-port hard disk test board is provided with a main test board and an auxiliary test board, the main test board and the auxiliary test board are respectively provided with a central control unit, a power supply port and a plurality of groups of hard disk test units, the main test board is also provided with a data transmission port connected with a server and a first communication port connected with the data transmission port, the auxiliary test board is provided with a second communication port in serial communication with the first communication port, an interface chip on the main test board is connected with the data transmission port, and an interface chip on the auxiliary test board is connected with the second communication port.
3. The multi-port hard disk test board of claim 1, wherein the test ports have PCIE m.2 test ports, SATA m.2 test ports, and SATA2.5 inch test ports.
4. The multi-port hard disk test board of claim 3, wherein the power supply port has a 12V output voltage, the 12V output voltage is converted into a 5V output voltage and a 3.3V output voltage by the power conversion chip, wherein the 3.3V output voltage is supplied to the PCIE m.2 test port and the SATA m.2 test port, and the 5V output voltage is supplied to the SATA2.5 inch test port.
5. The multi-port hard disk test board of the one-stop hard disk automation tester according to claim 3, wherein the port connection unit is provided with a first connection unit, the first connection unit comprises a first bus slot, a switching chip connected to the first bus slot, and a channel switching chip connected to the switching chip, wherein the first bus slot is used for being connected with a server, the switching chip is used for converting the first bus slot into a SATA m.2 test port and a SATA2.5 inch test port, and the channel switching chip is used for branching a plurality of channels to be connected with the SATA m.2 test ports and the SATA2.5 inch test ports on the plurality of groups of hard disk test units respectively.
6. The multi-port hard disk test board of claim 5, wherein the port connection unit is further provided with a second connection unit, the second connection unit includes a plurality of second bus slots, and PCIE m.2 test ports on the plurality of groups of hard disk test units are respectively connected to the server through the plurality of second bus slots.
7. The multi-port hard disk test board of claim 6, wherein the multi-port hard disk test board is provided with eight sets of hard disk test units, the first connection unit comprises two first bus slots, two switching chips and four channel switching chips, and the second connection unit comprises eight second bus slots.
8. The multi-port hard disk test board of a one-stop hard disk automation tester of claim 2, wherein the data transfer port is a USB interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410264418.7A CN118212967A (en) | 2024-03-08 | 2024-03-08 | Multiport hard disk test board of automatic tester of one-stop hard disk |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202410264418.7A CN118212967A (en) | 2024-03-08 | 2024-03-08 | Multiport hard disk test board of automatic tester of one-stop hard disk |
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| CN111752781A (en) * | 2020-06-15 | 2020-10-09 | 常州信息职业技术学院 | Hard disk automatic checkout device of many interfaces |
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| CN219105773U (en) * | 2022-10-31 | 2023-05-30 | 深圳市金田创新科技有限公司 | Hard disk dual-voltage test board |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1838306A (en) * | 2005-12-29 | 2006-09-27 | 深圳易拓科技有限公司 | Integrated testing system for hard disk |
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| US20140047286A1 (en) * | 2012-08-13 | 2014-02-13 | Unitest Inc | Solid state drive tester |
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| CN219105773U (en) * | 2022-10-31 | 2023-05-30 | 深圳市金田创新科技有限公司 | Hard disk dual-voltage test board |
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