CN117889816A - Method for detecting warping of ultrathin glass - Google Patents
Method for detecting warping of ultrathin glass Download PDFInfo
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- CN117889816A CN117889816A CN202410041196.2A CN202410041196A CN117889816A CN 117889816 A CN117889816 A CN 117889816A CN 202410041196 A CN202410041196 A CN 202410041196A CN 117889816 A CN117889816 A CN 117889816A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/32—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring the deformation in a solid
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/38—Concrete; Lime; Mortar; Gypsum; Bricks; Ceramics; Glass
- G01N33/386—Glass
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Abstract
The invention relates to the technical field of glass detection, in particular to a method for detecting the warpage of ultra-thin glass, which comprises the steps of obtaining an ultra-thin glass sample to be detected; dividing the to-be-detected part into a plurality of detection units; performing a warping test on each detection unit to obtain a warping value of each detection unit; and summarizing the warp value of each detection unit, and selecting the maximum value of the warp value, namely the warp value of the ultrathin glass sample to be detected. The ultra-thin glass to be tested is divided into the plurality of detection units, the warping of the ultra-thin glass to be tested is obtained through the warping test of each detection unit, the warping is integrated into zero, the warping detection of each part of the ultra-thin glass to be tested is realized, the representativeness is stronger, and the evaluation accuracy of the ultra-thin glass in the whole production batch is improved. The method is simple and easy to operate, and the subjective influence of the operation of an operator is greatly reduced. The method solves the problems that the method for detecting the warpage of the ultrathin glass is time-consuming and labor-consuming, and the inspection standard is difficult to grasp, so that the warpage evaluation of the ultrathin glass is inaccurate.
Description
Technical Field
The invention relates to the technical field of glass detection, in particular to a method for detecting ultrathin glass warpage.
Background
The ultra-thin glass is used as an emerging industry, the production technology is continuously fuelled and obtained, and the inspection project and the inspection means are continuously perfected. Warp is a key indicator for testing the quality of ultra-thin glass.
The warpage image detection operation standard commonly used for the current ultra-thin glass is as follows: sampling is carried out according to a specific time interval, the sampled sample is placed in a glass supporting device, a grating plate is arranged in the opposite direction of the glass, an image of the grating plate is displayed in the glass due to the reflection principle of light, an inspector photographs the glass by using a camera, and the deformation condition of the grating plate displayed in the glass is evaluated by comparing with a limit sample, so that the warp evaluation of the glass is realized.
The method for detecting the warpage image quality is time-consuming and labor-consuming, and the inspection standard is difficult to grasp due to the difference between the skills of inspectors, so that the glass warpage detection precision is poor, and the evaluation result is inaccurate.
Disclosure of Invention
Aiming at the problems that the method for detecting the warpage of the ultrathin glass in the prior art is time-consuming and labor-consuming, and the inspection standard is difficult to grasp, and the warpage evaluation of the ultrathin glass is inaccurate, the invention provides the method for detecting the warpage of the ultrathin glass.
In order to achieve the purpose, the invention is realized by adopting the following technical scheme:
a method for detecting the warpage of ultra-thin glass comprises the following steps:
s1: obtaining an ultrathin glass sample to be tested;
s2: cutting an ultrathin glass sample to be detected into a plurality of detection units;
s3: performing a warping test on each detection unit to obtain a warping value of each detection unit;
s4: and summarizing the warp value of each detection unit, and selecting the maximum value of the warp value, namely the warp value of the ultrathin glass sample to be detected.
Further, the specific method of S1 is as follows:
s1.1: aiming at the ultrathin glass production line of the same batch, segmenting the production time according to the production requirement to obtain an ultrathin glass sampling time point;
s1.2: and along with the advancing of the production line, sampling the ultrathin glass according to the sampling time point of the ultrathin glass, numbering the sampled samples, and obtaining the ultrathin glass sample to be detected.
Further, the specific operation of S2 is:
s2.1: cutting the ultrathin glass sample to be detected by adopting a cutting machine;
s2.2: setting a cutting value of a cutting machine according to the size of the ultrathin glass sample to be detected;
s2.3: cutting the ultrathin glass sample to be detected into a plurality of detection units according to the set cutting values, and numbering the detection units.
Preferably, the detection units are the same size and shape.
Further, the specific method of S3 is as follows:
s3.1: placing the detection unit on a platform;
s3.2: observing the contact gap between the edge of the detection unit and the platform;
s3.3: selecting a point with larger contact gap between the edge of the detection unit and the platform to obtain a detection point;
s3.4: sequentially inserting the feelers into detection points to read;
s3.5: turning the detection unit to the other side, and repeating S3.2-3.4;
s3.6: the maximum value of the readings in S3.4 and S3.5 is selected as the warpage of the detection unit;
s3.7: repeating S3.1-S3.6 until the warp of each detection unit is obtained.
Preferably, after the detection unit is placed on the platform, limit markers are provided on the platform along the edges of the detection unit.
Preferably, in the step S3.4, the length of the feeler inserted into the checking point is 1 mm-5 mm.
Preferably, the precision level of the platform is 000, and the precision error is 1.5 μm.
Preferably, the feeler is a single-chip feeler.
Preferably, the range of the feeler gauge is 0 mm-3 mm, and the precision is 0.01mm.
Compared with the prior art, the invention has the following beneficial effects:
the invention relates to a method for detecting the warpage of ultra-thin glass, which comprises the steps of obtaining an ultra-thin glass sample to be detected; dividing the to-be-detected part into a plurality of detection units; performing a warping test on each detection unit to obtain a warping value of each detection unit; and finally, summarizing the warp value of each detection unit, and selecting the maximum value of the warp value, namely the warp value of the ultrathin glass sample to be detected. This through cutting apart ultra-thin glass to be measured into a plurality of detecting element, through the test to each detecting element warpage, summarize, obtain ultra-thin glass to be measured's warpage, through changing into zero, realize carrying out the warpage detection to each partial region of ultra-thin glass to be measured, the representativeness is stronger, and the warpage testing result of whole ultra-thin glass to be measured is more accurate, and then promotes the evaluation accuracy to ultra-thin glass of whole production batch. The method is simple and easy to operate, and the subjective influence of the operation of an operator is greatly reduced.
The specific method for obtaining the ultrathin glass sample to be detected comprises the following steps: aiming at the ultrathin glass production line of the same batch, segmenting the production time according to the production requirement to obtain an ultrathin glass sampling time point; and finally, along with the advancing of the production line, sampling the ultrathin glass according to the sampling time point of the ultrathin glass, numbering the sampled samples, and obtaining the ultrathin glass sample to be detected. The ultrathin glass sample to be measured obtained by the method is more representative, can more accurately reflect the warpage of ultrathin glass produced in the whole production batch, and provides reliable basis for production.
The cutting machine is used for cutting the ultrathin glass sample to be detected, the cutting size is easier to control, the two efficiencies are higher, and the detection time is saved.
The detection units are the same in size and shape, high in repeatability and capable of reducing subjective errors of operators.
When testing the warpage of the detection unit, placing the detection unit on a platform, and observing the contact gap between the edge of the detection unit and the platform; selecting a point with larger contact gap between the edge of the detection unit and the platform to obtain a detection point; sequentially inserting the feelers into detection points, reading, and selecting the maximum value of the reading as the warping of the detection unit; the method is repeated to obtain the warpage of each detection unit, the time for detecting the warpage of each detection unit can be greatly saved by selecting the detection point with stronger representativeness, and the detection unit is subjected to warpage detection by using the feeler gauge, so that compared with the grid detection method, the result is more visual and accurate, and the detection efficiency is higher.
On the detection platform, the setting of the limit mark can enable each detection unit to be positioned at the same position for detection, so that errors caused by position movement are avoided, and the detection accuracy is prevented from being influenced.
The precision grade of the platform is 000, the precision error is 1.5 mu m, the detection precision is further improved, and the error caused by the influence of the platform is avoided.
The feeler gauge is a single-piece feeler gauge, the measuring range is 0 mm-3 mm, the precision is 0.01mm, the detection result is more accurate, and the applicability is stronger.
Drawings
FIG. 1 is a flow chart of a method for detecting warpage of ultra-thin glass according to the present invention.
Fig. 2 is a flowchart of a warp value of each detecting unit obtained by performing a warp test on each detecting unit in the method for detecting ultra-thin glass warp according to the present invention.
FIG. 3 is a diagram showing a distribution of detecting units in a method for detecting warpage of ultra-thin glass according to an embodiment of the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
In the description of the embodiments of the present invention, it should be noted that, if the terms "upper," "lower," "horizontal," "inner," and the like indicate an azimuth or a positional relationship based on the azimuth or the positional relationship shown in the drawings, or the azimuth or the positional relationship in which the inventive product is conventionally put in use, it is merely for convenience of describing the present invention and simplifying the description, and does not indicate or imply that the apparatus or element to be referred to must have a specific azimuth, be configured and operated in a specific azimuth, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like, are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.
Furthermore, the term "horizontal" if present does not mean that the component is required to be absolutely horizontal, but may be slightly inclined. As "horizontal" merely means that its direction is more horizontal than "vertical", and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.
In the description of the embodiments of the present invention, it should also be noted that, unless explicitly specified and limited otherwise, the terms "disposed," "mounted," "connected," and "connected" should be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention can be understood by those of ordinary skill in the art according to the specific circumstances.
The invention will now be described in further detail with reference to specific examples, which are intended to illustrate, but not to limit, the invention.
The invention discloses a method for detecting the warpage of ultra-thin glass, which comprises the following steps with reference to fig. 1:
s1: the method comprises the steps of obtaining an ultrathin glass sample to be detected, wherein the ultrathin glass sample to be detected comprises the following specific steps:
s1.1: aiming at the ultrathin glass production line of the same batch, segmenting the production time according to the production requirement to obtain an ultrathin glass sampling time point;
s1.2: and along with the advancing of the production line, sampling the ultrathin glass according to the sampling time point of the ultrathin glass, numbering the sampled samples, and obtaining the ultrathin glass sample to be detected.
S2: cutting an ultrathin glass sample to be detected, and dividing the ultrathin glass sample into a plurality of detection units, wherein the detection units are identical in size and shape, and specifically comprise:
s2.1: cutting the ultrathin glass sample to be detected by adopting a cutting machine;
s2.2: setting a cutting value of a cutting machine according to the size of the ultrathin glass sample to be detected;
s2.3: cutting the ultrathin glass sample to be detected into a plurality of detection units according to the set cutting values, and numbering the detection units.
S3: and (3) performing a warping test on each detection unit to obtain a warping value of each detection unit, wherein the warping value is specifically as follows:
s3.1: placing the detection unit on a platform; after the detection unit is placed on the platform, limit marks are arranged on the platform along the edge of the detection unit, and the marks can be used for scribing on the platform along the edge of the detection unit and can also be used for local scribing as positioning marks.
S3.2: observing the contact gap between the edge of the detection unit and the platform;
s3.3: selecting a point with larger contact gap between the edge of the detection unit and the platform to obtain a detection point;
s3.4: sequentially inserting the feelers into detection points to read; preferably, the length of the feeler inserted into the checking point is 1 mm-5 mm, which must be measured without clearance and friction, and does not allow the use of feeler to collide, rub or lift the glass plate.
S3.5: turning the detection unit to the other surface, repeating S3.2-3.4, and selecting the maximum reading value as the warping of the detection unit;
s3.6: the maximum value of the readings in S3.4 and S3.5 is selected as the warpage of the detection unit;
s3.7, repeating the steps S3.1-S3.6 until the warp of each detection unit is obtained; after the warp detection of the last detection unit is completed, the next detection unit is placed on the platform according to the limit mark.
S4: the method comprises the steps of summarizing the warp value of each detection unit, selecting the maximum value of the warp value, namely the warp value of the ultrathin glass sample to be detected, inputting the warp value of each detection unit into a computer, analyzing the warp value of the ultrathin glass sample to be detected through special software of the computer, summarizing the result to an MIS quality analysis system, obtaining the warp maximum value by using a MAX function, and evaluating OK/NG results by using an if function.
Preferably, the precision level of the platform is 000, and the precision error is 1.5 μm. Preferably, the feeler gauge is a single-piece feeler gauge, the range of the feeler gauge is 0 mm-3 mm, and the precision is 0.01mm.
Taking a certain production batch production line as an example: according to the production requirement of the production line, segmenting the sampling time, wherein each time period is 1h, and obtaining an ultrathin glass sampling time point; and along with the advancing of the production line, sampling the ultra-thin glass every 1h according to the ultra-thin glass sampling time points, numbering the sampled samples, and obtaining the ultra-thin glass sample to be detected at each sampling time point.
Referring to fig. 3, the size of the ultra-thin glass sample to be measured is 2000mm x 1500mm, the ultra-thin glass sample to be measured is cut into 25 detection units, and the size of each detection unit is 400mm x 300mm, and the number is given; placing the detection unit with the number 1 on a platform, setting a limit mark on the platform along the edge of the detection unit with the number 1, observing the contact gap between the edge of the detection unit with the number 1 and the platform and the point with larger gap, sequentially inserting a feeler gauge into the detection points for reading, turning over the detection unit with the number 1 to the other surface, and repeating the steps for detection to finally obtain the warpage of the detection unit with the number 1; according to the wave measuring method of the detection unit with the number of 1, the warpage of the detection units with the numbers of 2-25 is measured sequentially, the results are summarized, and the maximum value of the warpage value is selected, namely the warpage value of the ultrathin glass sample to be measured.
In summary, the present invention provides a method for detecting warpage of ultra-thin glass, which includes sampling ultra-thin glass of a uniform production batch, dividing the ultra-thin glass to be detected obtained by sampling into a plurality of small detection units, evaluating warpage of ultra-thin glass samples to be detected by detecting warpage of the detection units, and reacting warpage of ultra-thin glass samples to warpage of ultra-thin glass of the production batch at each sampling time point, wherein detection results are more reliable and dependences are stronger.
The foregoing description of the preferred embodiment of the present invention is not intended to limit the technical solution of the present invention in any way, and it should be understood that the technical solution can be modified and replaced in several ways without departing from the spirit and principle of the present invention, and these modifications and substitutions are also included in the protection scope of the claims.
Claims (10)
1. The method for detecting the warpage of the ultrathin glass is characterized by comprising the following steps of:
s1: obtaining an ultrathin glass sample to be tested;
s2: cutting an ultrathin glass sample to be detected into a plurality of detection units;
s3: performing a warping test on each detection unit to obtain a warping value of each detection unit;
s4: and summarizing the warp value of each detection unit, and selecting the maximum value of the warp value, namely the warp value of the ultrathin glass sample to be detected.
2. The method for detecting the warpage of the ultra-thin glass according to claim 1, wherein the specific method of S1 is as follows:
s1.1: aiming at the ultrathin glass production line of the same batch, segmenting the production time according to the production requirement to obtain an ultrathin glass sampling time point;
s1.2: and along with the advancing of the production line, sampling the ultrathin glass according to the sampling time point of the ultrathin glass, numbering the sampled samples, and obtaining the ultrathin glass sample to be detected.
3. The method for detecting the warpage of ultra-thin glass according to claim 1, wherein the specific operation of S2 is:
s2.1: cutting the ultrathin glass sample to be detected by adopting a cutting machine;
s2.2: setting a cutting value of a cutting machine according to the size of the ultrathin glass sample to be detected;
s2.3: cutting the ultrathin glass sample to be detected into a plurality of detection units according to the set cutting values, and numbering the detection units.
4. The method for detecting the warpage of ultra-thin glass according to any one of claims 1 to 3, wherein the detecting units are the same in size and shape.
5. The method for detecting the warpage of the ultra-thin glass according to claim 1, wherein the specific method of S3 is as follows:
s3.1: placing the detection unit on a platform;
s3.2: observing the contact gap between the edge of the detection unit and the platform;
s3.3: selecting a point with larger contact gap between the edge of the detection unit and the platform to obtain a detection point;
s3.4: sequentially inserting the feelers into detection points to read;
s3.5: turning the detection unit to the other side, and repeating S3.2-3.4;
s3.6: the maximum value of the readings in S3.4 and S3.5 is selected as the warpage of the detection unit;
s3.7: repeating S3.1-S3.6 until the warp of each detection unit is obtained.
6. The method for detecting warp of ultra-thin glass according to claim 5, wherein after the detecting unit is placed on the stage, a limit mark is provided on the stage along an edge of the detecting unit.
7. The method for detecting the warpage of ultra-thin glass according to claim 5, wherein in S3.4, the length of the insertion of the feeler into the detection point is 1mm to 5mm.
8. The method for detecting warpage of ultra-thin glass according to claim 5, wherein the precision level of the stage is 000 and the precision error is 1.5 μm.
9. The method for detecting warp of ultra-thin glass according to claim 5, wherein the feeler gauge is a monolithic feeler gauge.
10. The method for detecting the warpage of the ultra-thin glass according to any one of claims 5 to 9, wherein the range of the feeler gauge is 0mm to 3mm, and the precision is 0.01mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410041196.2A CN117889816A (en) | 2024-01-10 | 2024-01-10 | Method for detecting warping of ultrathin glass |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410041196.2A CN117889816A (en) | 2024-01-10 | 2024-01-10 | Method for detecting warping of ultrathin glass |
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| CN117889816A true CN117889816A (en) | 2024-04-16 |
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| CN202410041196.2A Pending CN117889816A (en) | 2024-01-10 | 2024-01-10 | Method for detecting warping of ultrathin glass |
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| CN (1) | CN117889816A (en) |
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- 2024-01-10 CN CN202410041196.2A patent/CN117889816A/en active Pending
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