CN1177309C - 电光装置的检查方法、电光装置的检查用电路、电光装置及电子设备 - Google Patents
电光装置的检查方法、电光装置的检查用电路、电光装置及电子设备Info
- Publication number
- CN1177309C CN1177309C CNB011427523A CN01142752A CN1177309C CN 1177309 C CN1177309 C CN 1177309C CN B011427523 A CNB011427523 A CN B011427523A CN 01142752 A CN01142752 A CN 01142752A CN 1177309 C CN1177309 C CN 1177309C
- Authority
- CN
- China
- Prior art keywords
- mentioned
- inspection
- electro
- voltage
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 196
- 238000000034 method Methods 0.000 title claims abstract description 15
- 239000003990 capacitor Substances 0.000 claims abstract description 97
- 230000008859 change Effects 0.000 claims description 35
- 239000000126 substance Substances 0.000 claims description 7
- 230000008676 import Effects 0.000 claims 1
- 230000007547 defect Effects 0.000 abstract description 22
- 239000000758 substrate Substances 0.000 description 27
- 239000004973 liquid crystal related substance Substances 0.000 description 22
- 230000003111 delayed effect Effects 0.000 description 7
- 230000008878 coupling Effects 0.000 description 6
- 238000010168 coupling process Methods 0.000 description 6
- 238000005859 coupling reaction Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 6
- 230000002950 deficient Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 4
- 238000005401 electroluminescence Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000003566 sealing material Substances 0.000 description 3
- 230000004913 activation Effects 0.000 description 2
- 230000001934 delay Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 239000000382 optic material Substances 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 238000011179 visual inspection Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Liquid Crystal (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
- Liquid Crystal Display Device Control (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Shift Register Type Memory (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP372839/2000 | 2000-12-07 | ||
| JP372839/00 | 2000-12-07 | ||
| JP2000372839A JP4276373B2 (ja) | 2000-12-07 | 2000-12-07 | 電気光学装置の検査用回路、電気光学装置および電子機器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1357871A CN1357871A (zh) | 2002-07-10 |
| CN1177309C true CN1177309C (zh) | 2004-11-24 |
Family
ID=18842317
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB011427523A Expired - Lifetime CN1177309C (zh) | 2000-12-07 | 2001-12-06 | 电光装置的检查方法、电光装置的检查用电路、电光装置及电子设备 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6703856B2 (zh) |
| JP (1) | JP4276373B2 (zh) |
| KR (1) | KR100471512B1 (zh) |
| CN (1) | CN1177309C (zh) |
| SG (1) | SG96662A1 (zh) |
| TW (1) | TW543025B (zh) |
Families Citing this family (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6762735B2 (en) * | 2000-05-12 | 2004-07-13 | Semiconductor Energy Laboratory Co., Ltd. | Electro luminescence display device and method of testing the same |
| JP3989756B2 (ja) * | 2002-03-18 | 2007-10-10 | シャープ株式会社 | 表示装置およびその走査回路検査方法 |
| JP2003308051A (ja) * | 2002-04-16 | 2003-10-31 | Seiko Epson Corp | 画像信号供給回路および電気光学パネル |
| JP4653775B2 (ja) * | 2002-04-26 | 2011-03-16 | 東芝モバイルディスプレイ株式会社 | El表示装置の検査方法 |
| WO2003091977A1 (fr) | 2002-04-26 | 2003-11-06 | Toshiba Matsushita Display Technology Co., Ltd. | Circuit de commande d'un ecran el |
| KR100986866B1 (ko) | 2002-04-26 | 2010-10-11 | 도시바 모바일 디스플레이 가부시키가이샤 | El 표시 장치의 구동 방법 |
| DE10241045B4 (de) * | 2002-08-30 | 2006-07-20 | Infineon Technologies Ag | Verfahren zum Durchführen von Testmessungen an lichtemittierenden Bauelementen |
| JP4610886B2 (ja) * | 2002-12-06 | 2011-01-12 | 株式会社半導体エネルギー研究所 | 画像表示装置、電子機器 |
| JP4494001B2 (ja) * | 2002-12-18 | 2010-06-30 | 株式会社半導体エネルギー研究所 | 表示装置の検査方法 |
| US7205986B2 (en) | 2002-12-18 | 2007-04-17 | Semiconductor Energy Laboratory Co., Ltd. | Image display device and testing method of the same |
| TWI220694B (en) * | 2003-04-23 | 2004-09-01 | Toppoly Optoelectronics Corp | Pixel measuring method |
| JP4572316B2 (ja) * | 2003-05-30 | 2010-11-04 | セイコーエプソン株式会社 | 電気光学パネルの駆動回路及び方法、電気光学装置並びに電子機器 |
| JPWO2004109628A1 (ja) * | 2003-06-04 | 2006-07-20 | 東芝松下ディスプレイテクノロジー株式会社 | アレイ基板の検査方法 |
| GB2403581A (en) * | 2003-07-01 | 2005-01-05 | Sharp Kk | A substrate and a display device incorporating the same |
| CN100387997C (zh) * | 2003-10-31 | 2008-05-14 | 华昀科技股份有限公司 | 薄膜晶体管显示器数组的测试电路及方法 |
| JP4529582B2 (ja) * | 2004-08-12 | 2010-08-25 | セイコーエプソン株式会社 | 電気光学装置及び電子機器、並びに電気光学装置用駆動方法及び検査方法 |
| CN101276536B (zh) * | 2004-09-06 | 2010-04-14 | 索尼株式会社 | 图像显示单元及驱动该图像显示单元的方法 |
| KR100670136B1 (ko) * | 2004-10-08 | 2007-01-16 | 삼성에스디아이 주식회사 | 데이터 구동장치 및 이를 이용한 발광 표시 장치 |
| WO2006040774A2 (en) * | 2004-10-12 | 2006-04-20 | Genoa Color Technologies Ltd. | Method, device and system of response time compensation |
| JP4761773B2 (ja) * | 2005-01-06 | 2011-08-31 | シャープ株式会社 | 表示装置およびその検査方法、ならびにその表示装置の検査システム |
| TW200630951A (en) * | 2005-02-21 | 2006-09-01 | Au Optronics Corp | Display panels and display device using same |
| KR101142784B1 (ko) * | 2005-03-03 | 2012-05-08 | 엘지디스플레이 주식회사 | 테스트패드가 마련된 액정패널 및 이의 제조방법 |
| JP2007072162A (ja) * | 2005-09-07 | 2007-03-22 | Mitsubishi Electric Corp | 表示装置 |
| US8503696B2 (en) | 2005-11-16 | 2013-08-06 | Thomson Licensing | Equalizer interface for electronic apparatus |
| EP1804229B1 (en) * | 2005-12-28 | 2016-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method for inspecting the same |
| US7312625B1 (en) * | 2006-06-08 | 2007-12-25 | Xilinx, Inc. | Test circuit and method of use thereof for the manufacture of integrated circuits |
| US7825680B2 (en) * | 2006-06-28 | 2010-11-02 | Nokia Corporation | Componet supplied with an analog value |
| KR20080010551A (ko) * | 2006-07-27 | 2008-01-31 | 삼성전자주식회사 | 표시 장치의 구동 장치 및 이를 포함하는 표시 장치 |
| CN101320542B (zh) * | 2007-06-04 | 2010-09-29 | 昆山维信诺显示技术有限公司 | 一种有机电致发光器件的检测装置 |
| JP5286818B2 (ja) * | 2008-02-21 | 2013-09-11 | セイコーエプソン株式会社 | 電気光学装置及び電子機器 |
| JP4780159B2 (ja) * | 2008-08-27 | 2011-09-28 | ソニー株式会社 | 表示装置とその駆動方法 |
| CN102654658B (zh) * | 2011-08-03 | 2015-07-29 | 北京京东方光电科技有限公司 | 一种tft阵列基板检测方法及检测装置 |
| KR20150042914A (ko) * | 2013-10-14 | 2015-04-22 | 삼성디스플레이 주식회사 | 화소 및 이를 포함하는 유기 전계 발광 표시 장치 |
| CN104280914A (zh) | 2014-10-16 | 2015-01-14 | 深圳市华星光电技术有限公司 | 一种显示面板的布线结构及显示面板 |
| CN106526923B (zh) * | 2017-01-12 | 2019-04-23 | 京东方科技集团股份有限公司 | 阵列基板、其测试方法及显示装置 |
| JP7423990B2 (ja) * | 2019-11-11 | 2024-01-30 | セイコーエプソン株式会社 | 電気光学装置および電子機器 |
| CN112331117B (zh) * | 2020-11-05 | 2022-06-03 | 北海惠科光电技术有限公司 | 液晶面板和液晶面板数据线电压检测方法 |
| CN116206572A (zh) * | 2023-02-15 | 2023-06-02 | 江西兴泰科技股份有限公司 | 一种电子纸tft架构的像素数据写入方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5113134A (en) * | 1991-02-28 | 1992-05-12 | Thomson, S.A. | Integrated test circuit for display devices such as LCD's |
| JP2792634B2 (ja) * | 1991-06-28 | 1998-09-03 | シャープ株式会社 | アクティブマトリクス基板の検査方法 |
| JP2758103B2 (ja) * | 1992-04-08 | 1998-05-28 | シャープ株式会社 | アクティブマトリクス基板及びその製造方法 |
| JPH0850796A (ja) * | 1993-11-29 | 1996-02-20 | Sanyo Electric Co Ltd | シフトレジスタおよび表示装置 |
| JP3496431B2 (ja) * | 1997-02-03 | 2004-02-09 | カシオ計算機株式会社 | 表示装置及びその駆動方法 |
| JPH10333649A (ja) * | 1997-06-04 | 1998-12-18 | Toshiba Microelectron Corp | 電圧選択回路、液晶駆動回路および半導体装置 |
| US6265889B1 (en) * | 1997-09-30 | 2001-07-24 | Kabushiki Kaisha Toshiba | Semiconductor test circuit and a method for testing a semiconductor liquid crystal display circuit |
| DE69820226T2 (de) * | 1997-10-31 | 2004-10-21 | Seiko Epson Corp | Elektrooptische vorrichtung und elektronisches gerät |
| JP3648976B2 (ja) * | 1998-03-24 | 2005-05-18 | セイコーエプソン株式会社 | アクティブマトリクス基板、液晶装置及び電子機器並びに該アクティブマトリクス基板の検査方法 |
| JP2000089191A (ja) * | 1998-09-10 | 2000-03-31 | Toshiba Corp | 液晶表示装置 |
-
2000
- 2000-12-07 JP JP2000372839A patent/JP4276373B2/ja not_active Expired - Lifetime
-
2001
- 2001-11-13 SG SG200107043A patent/SG96662A1/en unknown
- 2001-11-28 US US09/994,675 patent/US6703856B2/en not_active Expired - Lifetime
- 2001-11-30 TW TW090129713A patent/TW543025B/zh not_active IP Right Cessation
- 2001-12-06 CN CNB011427523A patent/CN1177309C/zh not_active Expired - Lifetime
- 2001-12-07 KR KR10-2001-0077288A patent/KR100471512B1/ko not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP4276373B2 (ja) | 2009-06-10 |
| CN1357871A (zh) | 2002-07-10 |
| US6703856B2 (en) | 2004-03-09 |
| SG96662A1 (en) | 2003-06-16 |
| KR20020045578A (ko) | 2002-06-19 |
| KR100471512B1 (ko) | 2005-03-08 |
| TW543025B (en) | 2003-07-21 |
| US20020070750A1 (en) | 2002-06-13 |
| JP2002174655A (ja) | 2002-06-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C06 | Publication | ||
| PB01 | Publication | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20160919 Address after: 518132 9-2, Guangming Road, Guangming New District, Guangdong, Shenzhen Patentee after: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY Co.,Ltd. Address before: Budapest 1163, XVI cilac 24-32A1ep1em122, Hungary Patentee before: Yin's High Tech Co.,Ltd. Effective date of registration: 20160919 Address after: Budapest 1163, XVI cilac 24-32A1ep1em122, Hungary Patentee after: Yin's High Tech Co.,Ltd. Address before: Tokyo, Japan Patentee before: Seiko Epson Corp. |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20041124 |