CN1176483C - Method for preparing self-supporting gallium nitride substrate by laser lift-off - Google Patents
Method for preparing self-supporting gallium nitride substrate by laser lift-off Download PDFInfo
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- CN1176483C CN1176483C CNB02113085XA CN02113085A CN1176483C CN 1176483 C CN1176483 C CN 1176483C CN B02113085X A CNB02113085X A CN B02113085XA CN 02113085 A CN02113085 A CN 02113085A CN 1176483 C CN1176483 C CN 1176483C
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Abstract
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一、技术领域1. Technical field
本发明涉及采用激光剥离技术从蓝宝石衬底上剥离氮化镓(GaN)获得无裂缝自支撑GaN衬底的方法和技术。The invention relates to a method and technology for obtaining a crack-free self-supporting GaN substrate by using a laser lift-off technique to lift gallium nitride (GaN) from a sapphire substrate.
二、技术背景2. Technical background
以GaN及InGaN、AlGaN合金材料为主的III-V族氮化物材料(又称GaN基材料)是近几年来国际上倍受重视的新型半导体材料,其1.9-6.2eV连续可变的直接带隙,优异的物理、化学稳定性,高饱和电子漂移速度,高击穿场强和高热导率等优越性能使其成为短波长半导体光电子器件和高频、高压、高温微电子器件制备的最优选材料。Group III-V nitride materials (also known as GaN-based materials) mainly based on GaN, InGaN, and AlGaN alloy materials are new semiconductor materials that have attracted much attention in the world in recent years. Its 1.9-6.2eV continuously variable direct band gap, excellent physical and chemical stability, high saturation electron drift velocity, high breakdown field strength and high thermal conductivity and other superior properties make it the best choice for the preparation of short-wavelength semiconductor optoelectronic devices and high-frequency, high-voltage, high-temperature microelectronic devices Material.
由于GaN本身物理性质的限制,GaN体单晶的生长具有很大的困难,尚未实用化。然而,用GaN衬底进行同质外延获得III族氮化物薄膜材料却显示出了极其优越的性能,因此用低位错密度衬底进行GaN同质外延是改善III族氮化物外延层质量的较好办法。Due to the limitations of the physical properties of GaN itself, the growth of GaN bulk single crystal is very difficult and has not been put into practical use. However, the homoepitaxial growth of III-nitride thin film materials with GaN substrates shows extremely superior performance, so GaN homoepitaxial growth with low dislocation density substrates is a better way to improve the quality of III-nitride epitaxial layers. Method.
目前,大面积GaN衬底通常都是在异质衬底(如蓝宝石、SiC、Si等)上气相生长GaN厚膜,然后将原异质衬底分离后获得的。其中在蓝宝石衬底上生长GaN最普遍,质量也最高。为了得到自支撑GaN衬底,必须除去蓝宝石衬底。由于蓝宝石极其稳定,难以采用化学腐蚀方法。一般的方法是机械磨削,但因蓝宝石很硬,不仅要消耗大量的金刚石磨料,成本很高而且速度极慢。采用激光辐照的方法,利用激光对GaN厚膜和衬底的界面区加热使之熔化,从而获得自支撑的GaN衬底。激光剥离方法的优点是时间快,蓝宝石衬底可回收使用。At present, large-area GaN substrates are usually obtained by gas-phase growing GaN thick films on heterogeneous substrates (such as sapphire, SiC, Si, etc.), and then separating the original heterogeneous substrates. Among them, GaN growth on sapphire substrates is the most common and of the highest quality. In order to obtain a free-standing GaN substrate, the sapphire substrate must be removed. Because sapphire is extremely stable, it is difficult to use chemical etching methods. The general method is mechanical grinding, but because sapphire is very hard, it not only consumes a lot of diamond abrasives, but also costs a lot and the speed is extremely slow. The method of laser irradiation is used to heat the GaN thick film and the interface region of the substrate to melt it, so as to obtain a self-supporting GaN substrate. The advantage of the laser lift-off method is that the time is fast and the sapphire substrate can be recycled.
在本发明中,我们采用激光扫描辐照技术,从蓝宝石衬底上将GaN薄膜剥离下来,获得自支撑无裂缝GaN衬底。In the present invention, we use laser scanning irradiation technology to peel off the GaN film from the sapphire substrate to obtain a self-supporting GaN substrate without cracks.
三、技术内容3. Technical content
本发明目的是:用激光扫描辐照技术将GaN薄膜从蓝宝石衬底上剥离下来,获得无裂缝自支撑GaN衬底。The purpose of the invention is to peel off the GaN thin film from the sapphire substrate by laser scanning irradiation technology to obtain the self-supporting GaN substrate without cracks.
本发明的技术解决方案是:采用激光辐照的方法,利用激光透过蓝宝石衬底对GaN厚膜和蓝宝石衬底的界面区加热使界面处GaN分解,在高于Ga熔点以上加热或弱盐酸腐蚀,就可以将GaN和蓝宝石分离开来,从而获得自支撑的GaN衬底。The technical solution of the present invention is: adopt the method of laser irradiation, utilize the laser to pass through the sapphire substrate to heat the GaN thick film and the interface area of sapphire substrate to decompose GaN at the interface, heat or weak hydrochloric acid above Ga melting point By etching, GaN and sapphire can be separated to obtain a self-supporting GaN substrate.
本发明的进一步改进是:先将氮化镓表面粘在一基片上,如硅片作为基片,再进行激光辐照,将GaN和蓝宝石分离开来后,再以加热方法将基片粘接层分离。The further improvement of the present invention is: first stick the gallium nitride surface on a substrate, such as a silicon wafer as the substrate, then irradiate the laser, separate GaN and sapphire, and then bond the substrate by heating Layer separation.
本发明的机理和技术特点是:Mechanism and technical characteristics of the present invention are:
在激光剥离技术中激光波长所对应的能量小于蓝宝石带隙能,但是大于GaN的带隙能。激光穿透蓝宝石衬底到达蓝宝石/GaN界面时,GaN吸收其能量,发生如下分解。In the laser lift-off technology, the energy corresponding to the laser wavelength is smaller than the band gap energy of sapphire, but larger than the band gap energy of GaN. When the laser penetrates the sapphire substrate and reaches the sapphire/GaN interface, GaN absorbs its energy and decomposes as follows.
在高于Ga熔点以上加热或弱盐酸腐蚀,就可以将GaN和蓝宝石分离开来,从而得到GaN自支撑衬底。GaN and sapphire can be separated by heating or corrosion with weak hydrochloric acid above the melting point of Ga to obtain a GaN self-supporting substrate.
四、附图说明4. Description of drawings
图1为本发明从蓝宝石衬底上激光剥离GaN技术示意图Fig. 1 is the schematic diagram of laser lift-off GaN technology from sapphire substrate according to the present invention
图2为本发明激光剥离过程中蓝宝石-GaN界面处压力产生示意图,Sappire即蓝宝石。Fig. 2 is a schematic diagram of pressure generation at the sapphire-GaN interface during the laser lift-off process of the present invention, and Sappire is sapphire.
五、具体实施方式5. Specific implementation
本发明方案主要包括下面步骤:The present invention scheme mainly comprises the following steps:
1、采用金属有机物气相外延(MOCVD)、分子束外延(MBE)、氢化物气相外延(HVPE)或其他方法在蓝宝石衬底上生长GaN薄膜。1. GaN films are grown on sapphire substrates by metal organic vapor phase epitaxy (MOCVD), molecular beam epitaxy (MBE), hydride vapor phase epitaxy (HVPE) or other methods.
2、用Si(111)作支撑材料。将硅晶片黏附在GaN上,形成蓝宝石/GaN/Si结构。2. Use Si(111) as support material. A silicon wafer is attached to GaN to form a sapphire/GaN/Si structure.
3、选择合适的激光器,将具有一定能量密度的激光垂直入射穿过蓝宝石,辐照蓝宝石/GaN界面。激光波长所对应的能量小于蓝宝石带隙能,但是大于GaN的带隙能。如采用Lambda Physik LPX 205i KrF紫外光受激准分子激光器(波长248nm,脉冲宽38ns),激光能量密度从200~5000mJ/cm2变化。3. Select a suitable laser, and vertically incident the laser with a certain energy density through the sapphire to irradiate the sapphire/GaN interface. The energy corresponding to the laser wavelength is smaller than the bandgap energy of sapphire, but larger than that of GaN. For example, using Lambda Physik LPX 205i KrF ultraviolet excimer laser (wavelength 248nm, pulse width 38ns), the laser energy density varies from 200 to 5000mJ/cm 2 .
4、在高于金属Ga的温度(29℃)下加热蓝宝石/GaN/Si结构,或用弱HCl溶液腐蚀蓝宝石/GaN界面处的金属,蓝宝石衬底就可以被剥离下来。得到GaN/Si结构。4. Heating the sapphire/GaN/Si structure at a temperature higher than metal Ga (29°C), or corroding the metal at the sapphire/GaN interface with a weak HCl solution, the sapphire substrate can be peeled off. A GaN/Si structure is obtained.
5、500℃加热GaN/Si结构,或将GaN/Si结构放入适当的有机溶剂中,将硅片去掉。即可获得自支撑GaN衬底。5. Heat the GaN/Si structure at 500°C, or put the GaN/Si structure in an appropriate organic solvent, and remove the silicon wafer. A self-supporting GaN substrate can be obtained.
利用激光辐照剥离技术,我们成功地获得了无裂缝自支撑GaN衬底。在激光剥离前后,GaN的结构和光学性质等没有较大变化。仔细地控制激光剥离条件,我们可以实现大面积(直径>2英寸)的GaN薄膜的剥离。Using the laser irradiation lift-off technique, we successfully obtained a crack-free self-supporting GaN substrate. Before and after laser lift-off, the structure and optical properties of GaN did not change much. By carefully controlling the laser lift-off conditions, we can achieve the lift-off of large-area (>2 inches in diameter) GaN films.
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Cited By (2)
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| CN100359636C (en) * | 2005-11-04 | 2008-01-02 | 南京大学 | Laser Lift-off Method for Fabricating Free-Supporting Gallium Nitride Substrates |
| CN100389503C (en) * | 2005-01-07 | 2008-05-21 | 北京大学 | Preparation method of LED chip with discrete grain vertical structure |
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| CN1329955C (en) * | 2004-07-21 | 2007-08-01 | 南京大学 | Method of preparing high quality non-polar GaN self-support substrate |
| CN101086083B (en) * | 2007-06-08 | 2011-05-11 | 中国科学院苏州纳米技术与纳米仿生研究所 | Method for preparing group III nitride substrate |
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| CN111128688B (en) * | 2019-12-31 | 2022-09-27 | 东莞市中镓半导体科技有限公司 | Method for manufacturing n-type gallium nitride self-supporting substrate |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100389503C (en) * | 2005-01-07 | 2008-05-21 | 北京大学 | Preparation method of LED chip with discrete grain vertical structure |
| CN100359636C (en) * | 2005-11-04 | 2008-01-02 | 南京大学 | Laser Lift-off Method for Fabricating Free-Supporting Gallium Nitride Substrates |
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