[go: up one dir, main page]

CN116990854A - CT system and security inspection equipment - Google Patents

CT system and security inspection equipment Download PDF

Info

Publication number
CN116990854A
CN116990854A CN202310558387.1A CN202310558387A CN116990854A CN 116990854 A CN116990854 A CN 116990854A CN 202310558387 A CN202310558387 A CN 202310558387A CN 116990854 A CN116990854 A CN 116990854A
Authority
CN
China
Prior art keywords
detector
sub
edge
edge detector
rectangular channel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202310558387.1A
Other languages
Chinese (zh)
Inventor
周志阳
邹一梅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Derek Tianjin Machinery Manufacturing Co ltd
Original Assignee
Derek Tianjin Machinery Manufacturing Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Derek Tianjin Machinery Manufacturing Co ltd filed Critical Derek Tianjin Machinery Manufacturing Co ltd
Priority to CN202310558387.1A priority Critical patent/CN116990854A/en
Publication of CN116990854A publication Critical patent/CN116990854A/en
Priority to PCT/CN2024/093889 priority patent/WO2024235312A1/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2985In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00Details of radiation-measuring instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3303Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object fixed; source and detector move

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

本发明涉及CT成像设备技术领域,公开一种CT系统及安检设备。其中CT系统包括沿Z向延伸的矩形通道、旋转组件、射线源和探测器组件。探测器组件包括中间探测器和边缘探测器,射线源的射线穿设于矩形通道并照射于探测器组件,转架转动360度时,射线源与边缘探测器之间形成检测矩形通道的环形边缘检测区域,环形边缘检测区域与矩形通道的重合部分不大于环形边缘检测区域与矩形通道的未重合部分;第一子边缘探测器和第二子边缘探测器上的晶体模块的排数是中间探测器上的晶体模块的排数的一半;第一子边缘探测器的晶体模块和第二子边缘探测器的晶体模块沿Z向交错设置且无重叠位置。

The invention relates to the technical field of CT imaging equipment, and discloses a CT system and security inspection equipment. The CT system includes a rectangular channel extending along the Z direction, a rotating component, a ray source and a detector component. The detector assembly includes a middle detector and an edge detector. The rays from the ray source pass through the rectangular channel and are irradiated on the detector assembly. When the turret rotates 360 degrees, a ring edge of the rectangular channel is formed between the ray source and the edge detector. Detection area, the overlapping part of the annular edge detection area and the rectangular channel is not larger than the non-overlapping part of the annular edge detection area and the rectangular channel; the row number of the crystal modules on the first sub-edge detector and the second sub-edge detector is the middle detection Half the number of rows of crystal modules on the detector; the crystal modules of the first sub-edge detector and the crystal modules of the second sub-edge detector are staggered along the Z direction without overlapping positions.

Description

一种CT系统及安检设备A CT system and security inspection equipment

技术领域Technical field

本发明涉及CT成像设备技术领域,尤其涉及一种CT系统及安检设备。The present invention relates to the technical field of CT imaging equipment, and in particular, to a CT system and security inspection equipment.

背景技术Background technique

目前,CT(Computed Tomography,电子计算机断层扫描)系统由射线源、探测器、转子、数据传输系统、计算机、机架、传动系统等部分组成。其中射线源和探测器均安装在转子上并一同旋转。被检测物体放置在传送带上并沿Z轴方向传动。射线源发射X射线,X射线穿过被检物后,剩余射线被探测器接收,探测器接收到的数据经由无线数据传输系统传输到电脑,电脑经过数据处理,分析被检测物体内部密度等信息,最终形成CT画像。其中射线源和探测器围绕被检测物体不断旋转,并从不同角度照射物体并接收剩余X射线。探测器接收到的数据经由无线数据传输系统传输到计算机,计算机经过数据处理,分析被检测物体形状和原子序数等信息,最终形成被检测物体的CT画像。At present, the CT (Computed Tomography) system consists of a radiation source, a detector, a rotor, a data transmission system, a computer, a rack, and a transmission system. The ray source and detector are both mounted on the rotor and rotate together. The object to be detected is placed on the conveyor belt and transmitted along the Z-axis direction. The ray source emits X-rays. After the X-rays pass through the object to be inspected, the remaining rays are received by the detector. The data received by the detector is transmitted to the computer through the wireless data transmission system. The computer processes the data and analyzes the internal density of the object to be inspected and other information. , finally forming a CT image. The ray source and detector continuously rotate around the object to be detected, irradiate the object from different angles and receive the remaining X-rays. The data received by the detector is transmitted to the computer through a wireless data transmission system. The computer processes the data, analyzes the shape and atomic number of the detected object, and finally forms a CT image of the detected object.

现有技术中,边缘探测器影响旋转半径,为了减小CT系统的尺寸,采用将边缘探测器向射线源方向移动的方式,进而减小机架的最大旋转半径。但是,边缘探测器向射线源方向移动时,边缘探测器沿Z轴方向需按照比例变小,因此边缘探测器的晶体排间距必须变小才能满足常规算法和性能要求。但是排间距变小,探测器制作难度增加,会增加成本,甚至目前技术水平无法满足边缘探测器的加工。In the prior art, the edge detector affects the rotation radius. In order to reduce the size of the CT system, the edge detector is moved toward the radiation source, thereby reducing the maximum rotation radius of the gantry. However, when the edge detector moves toward the ray source, the edge detector needs to become proportionally smaller along the Z-axis direction. Therefore, the crystal row spacing of the edge detector must become smaller to meet conventional algorithms and performance requirements. However, as the row spacing becomes smaller, the manufacturing difficulty of the detector increases, which will increase the cost, and even the current technical level cannot meet the processing of edge detectors.

基于此,亟需一种CT系统及安检设备,以解决上述存在的问题。Based on this, there is an urgent need for a CT system and security inspection equipment to solve the above existing problems.

发明内容Contents of the invention

基于以上所述,本发明的目的在于提供一种CT系统及安检设备,降低第一子边缘探测器和第二子边缘探测器的加工难度,进而降低生产成本。Based on the above, the purpose of the present invention is to provide a CT system and security inspection equipment to reduce the processing difficulty of the first sub-edge detector and the second sub-edge detector, thereby reducing production costs.

为达上述目的,本发明采用以下技术方案:In order to achieve the above objects, the present invention adopts the following technical solutions:

一方面,提供一种CT系统,包括:On the one hand, a CT system is provided, including:

沿Z向延伸的矩形通道;A rectangular channel extending along the Z direction;

旋转组件,其包括转架,所述转架环设于所述矩形通道;A rotating assembly, which includes a rotating frame, the rotating frame is ringed in the rectangular channel;

射线源和探测器组件,所述射线源和所述探测器组件均安装所述转架,且所述射线源和所述探测器组件设置于所述矩形通道的两侧;A ray source and a detector assembly, the ray source and the detector assembly are both mounted on the turret, and the ray source and the detector assembly are arranged on both sides of the rectangular channel;

所述探测器组件包括中间探测器和边缘探测器,所述边缘探测器包括对称设置于所述中间探测器两侧的第一子边缘探测器和第二子边缘探测器,所述射线源的射线穿设于所述矩形通道并照射于所述探测器组件,所述转架转动360度时,所述射线源与所述边缘探测器之间形成检测所述矩形通道的环形边缘检测区域,所述环形边缘检测区域与所述矩形通道的重合部分不大于所述环形边缘检测区域与所述矩形通道的未重合部分;The detector assembly includes a middle detector and an edge detector. The edge detector includes a first sub-edge detector and a second sub-edge detector symmetrically arranged on both sides of the middle detector. The ray source The rays pass through the rectangular channel and are irradiated on the detector assembly. When the turret rotates 360 degrees, an annular edge detection area for detecting the rectangular channel is formed between the ray source and the edge detector. The overlapping portion of the annular edge detection area and the rectangular channel is no larger than the non-overlapping portion of the annular edge detection area and the rectangular channel;

所述中间探测器、所述第一子边缘探测器和所述第二子边缘探测器均沿所述Z向均匀间隔设置有多排晶体模块,所述第一子边缘探测器上的晶体模块的排数和所述第二子边缘探测器上的晶体模块的排数相同,且所述第一子边缘探测器上的晶体模块的排数是所述中间探测器上的晶体模块的排数的一半;The middle detector, the first sub-edge detector and the second sub-edge detector are all provided with multiple rows of crystal modules evenly spaced along the Z direction. The crystal modules on the first sub-edge detector The number of rows is the same as the number of rows of crystal modules on the second sub-edge detector, and the number of rows of crystal modules on the first sub-edge detector is the number of rows of crystal modules on the middle detector half of;

所述第一子边缘探测器的晶体模块和所述第二子边缘探测器的晶体模块沿所述Z向交错设置且无重叠位置。The crystal module of the first sub-edge detector and the crystal module of the second sub-edge detector are staggered along the Z direction without overlapping positions.

作为一种CT系统的优选技术方案,所述中间探测器设置于第一圆弧面上,所述边缘探测器设置于第二圆弧面上,所述第一圆弧面和所述第二圆弧面同轴设置,且所述射线源设置于所述第一圆弧面和所述第二圆弧面的轴线上。As a preferred technical solution of the CT system, the middle detector is arranged on the first arc surface, the edge detector is arranged on the second arc surface, the first arc surface and the second arc surface are The arc surfaces are arranged coaxially, and the ray source is arranged on the axis of the first arc surface and the second arc surface.

作为一种CT系统的优选技术方案,所述第二圆弧面与所述矩形通道不干涉,且所述第二圆弧面不超出所述转架的外径。As a preferred technical solution of the CT system, the second arc surface does not interfere with the rectangular channel, and the second arc surface does not exceed the outer diameter of the turret.

作为一种CT系统的优选技术方案,所述第二圆弧面的半径小于所述第一圆弧面的半径。As a preferred technical solution of the CT system, the radius of the second arc surface is smaller than the radius of the first arc surface.

作为一种CT系统的优选技术方案,所述第一圆弧面的半径为Ra,所述第二圆弧面的半径为Rb,所述中间探测器的长度为Da,所述中间探测器的长度为Da,其中,Ra/Rb=Da/Db。As a preferred technical solution of the CT system, the radius of the first arc surface is Ra, the radius of the second arc surface is Rb, the length of the intermediate detector is Da, and the length of the intermediate detector is Da. The length is Da, where Ra/Rb=Da/Db.

作为一种CT系统的优选技术方案,所述中间探测器上的晶体模块的间隔为da,所述第一子边缘探测器上的晶体模块的间隔和所述第二子边缘探测器上的晶体模块的间隔均为db,且所述第一子边缘探测器设置有N排晶体模块,所述中间探测器设置有2N排晶体模块,其中,Db=db*(N-1),Da=da*(2N-1)。As a preferred technical solution of the CT system, the distance between the crystal modules on the middle detector is da, the distance between the crystal modules on the first sub-edge detector and the distance between the crystal modules on the second sub-edge detector. The intervals between modules are all db, and the first sub-edge detector is provided with N rows of crystal modules, and the middle detector is provided with 2N rows of crystal modules, where Db=db*(N-1), Da=da *(2N-1).

作为一种CT系统的优选技术方案,所述第一子边缘探测器的晶体模块与第二子边缘探测器的晶体模块沿所述Z向的间隔为1/2db。As a preferred technical solution of the CT system, the distance between the crystal module of the first sub-edge detector and the crystal module of the second sub-edge detector along the Z direction is 1/2db.

作为一种CT系统的优选技术方案,所述射线源照射于所述边缘探测器的射线路径与所述射线源照射于所述中间探测器的射线路径二者相邻的一侧相重合。As a preferred technical solution of the CT system, the adjacent sides of the ray path irradiated by the ray source on the edge detector and the ray path irradiated by the ray source on the middle detector coincide with each other.

作为一种CT系统的优选技术方案,所述边缘探测器为多组,所述第二圆弧面为多个,多组所述边缘探测器与多个所述第二圆弧面一一对应。As a preferred technical solution of a CT system, there are multiple sets of edge detectors and multiple second arc surfaces, and multiple sets of edge detectors correspond to multiple second arc surfaces in one-to-one correspondence. .

另一方面,提供一种安检设备,包括以上任一方案所述的CT系统。On the other hand, a security inspection equipment is provided, including the CT system described in any of the above solutions.

本发明的有益效果为:The beneficial effects of the present invention are:

本发明提供一种CT系统及安检设备,工作时,转架带动射线源和探测器组件共同绕矩形通道转动,当转架转动360度时,射线源与边缘探测器之间形成检测矩形通道的环形边缘检测区域,其中,环形边缘检测区域与矩形通道的重合部分为需要成像的区域,环形边缘检测区域与矩形通道的未重合部分为空气,不需要计算和再构成画像,计算量较小,因此第一子边缘探测器和第二子边缘探测器仅需少量的晶体模块就可以形成该层厚的画像。本发明环形边缘检测区域与矩形通道的重合部分不大于环形边缘检测区域与矩形通道的未重合部分,即检测矩形通道的四个尖角区域,相对于中间探测器,边缘探测器需要计算的数据量减少一半以上,因此能够将第一子边缘探测器上的晶体模块的排数和第二子边缘探测器上的晶体模块的排数设置成中间探测器上的晶体模块的排数的一半,当第一子边缘探测器和第二子边缘探测器上排数减少时,晶体模块的间隔可相对增大,降低第一子边缘探测器和第二子边缘探测器的加工难度,进而降低生产成本。The invention provides a CT system and security inspection equipment. During operation, the turntable drives the radiation source and the detector assembly to rotate around the rectangular channel together. When the turntable rotates 360 degrees, a detection rectangular channel is formed between the radiation source and the edge detector. Annular edge detection area, in which the overlapping part of the annular edge detection area and the rectangular channel is the area that needs to be imaged, and the non-overlapping part of the annular edge detection area and the rectangular channel is air. There is no need to calculate and reconstruct the image, and the calculation amount is small. Therefore, the first sub-edge detector and the second sub-edge detector only need a small number of crystal modules to form an image of this layer thickness. The overlapping part of the annular edge detection area and the rectangular channel of the present invention is no larger than the non-overlapping part of the annular edge detection area and the rectangular channel, that is, the four sharp corner areas of the rectangular channel are detected. Compared with the middle detector, the edge detector needs to calculate the data The amount is reduced by more than half, so the number of rows of crystal modules on the first sub-edge detector and the number of rows of crystal modules on the second sub-edge detector can be set to half the number of rows of crystal modules on the middle detector, When the number of upper rows of the first sub-edge detector and the second sub-edge detector is reduced, the spacing between the crystal modules can be relatively increased, which reduces the processing difficulty of the first sub-edge detector and the second sub-edge detector, thereby reducing production cost.

再者,由于第一子边缘探测器和第二子边缘探测器对称设置于中间探测器两侧,第一子边缘探测器和第二子边缘探测器检测位置为同一个环形边缘检测区域,为了保证该环形边缘检测区域的成像效果,第一子边缘探测器的晶体模块和第二子边缘探测器的晶体模块沿Z向交错设置且无重叠位置,即第一子边缘探测器的晶体模块获取的数据层数和第二子边缘探测器的晶体模块获取的数据层数相加等于第一子边缘探测器的晶体模块获取的数据层数,满足CT系统形成CT画像的成像需求。Furthermore, since the first sub-edge detector and the second sub-edge detector are symmetrically arranged on both sides of the middle detector, the detection positions of the first sub-edge detector and the second sub-edge detector are in the same annular edge detection area. In order to To ensure the imaging effect of the annular edge detection area, the crystal module of the first sub-edge detector and the crystal module of the second sub-edge detector are staggered along the Z direction without overlapping positions, that is, the crystal module of the first sub-edge detector acquires The sum of the number of data layers and the number of data layers acquired by the crystal module of the second sub-edge detector is equal to the number of data layers acquired by the crystal module of the first sub-edge detector, which meets the imaging requirements of the CT system to form CT images.

附图说明Description of the drawings

为了更清楚地说明本发明实施例中的技术方案,下面将对本发明实施例描述中所需要使用的附图作简单的介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据本发明实施例的内容和这些附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present invention, a brief introduction will be made below to the drawings needed to describe the embodiments of the present invention. Obviously, the drawings in the following description are only some embodiments of the present invention. , For those of ordinary skill in the art, other drawings can also be obtained based on the content of the embodiments of the present invention and these drawings without exerting creative efforts.

图1是本发明具体实施方式提供的CT系统的主视图之一;Figure 1 is one of the front views of a CT system provided by a specific embodiment of the present invention;

图2是本发明具体实施方式提供的边缘探测器的俯视图;Figure 2 is a top view of an edge detector provided by a specific embodiment of the present invention;

图3是本发明具体实施方式提供的中间探测器的俯视图;Figure 3 is a top view of an intermediate detector provided by a specific embodiment of the present invention;

图4是本发明具体实施方式提供的CT系统的部分结构左视图;Figure 4 is a left view of the partial structure of the CT system provided by the specific embodiment of the present invention;

图5是本发明具体实施方式提供的CT系统的主视图之二;Figure 5 is the second front view of the CT system provided by the specific embodiment of the present invention;

图6是本发明具体实施方式提供的安检设备的结构示意图。Figure 6 is a schematic structural diagram of the security inspection equipment provided by the specific embodiment of the present invention.

图中标记如下:The markings in the figure are as follows:

10、被检测物体;10. Object to be detected;

1、矩形通道;1. Rectangular channel;

2、旋转组件;21、转架;22、机架;2. Rotating component; 21. Turret; 22. Frame;

3、射线源;3. Ray source;

4、探测器组件;41、中间探测器;42、边缘探测器;421、第一子边缘探测器;422、第二子边缘探测器;423、环形边缘检测区域;4231、重合部分;4232、未重合部分;43、晶体模块;44、射线路径;4. Detector assembly; 41. Middle detector; 42. Edge detector; 421. First sub-edge detector; 422. Second sub-edge detector; 423. Annular edge detection area; 4231. Overlapping part; 4232. Non-overlapping parts; 43. Crystal module; 44. Ray path;

5、传送带;6、数据传输组件。5. Conveyor belt; 6. Data transmission components.

具体实施方式Detailed ways

下面结合附图和实施例对本发明作进一步的详细说明。可以理解的是,此处所描述的具体实施例仅仅用于解释本发明,而非对本发明的限定。另外还需要说明的是,为了便于描述,附图中仅示出了与本发明相关的部分而非全部结构。The present invention will be further described in detail below in conjunction with the accompanying drawings and examples. It can be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention. In addition, it should be noted that, for convenience of description, only some but not all structures related to the present invention are shown in the drawings.

在本发明的描述中,除非另有明确的规定和限定,术语“相连”、“连接”、“固定”应做广义理解,例如,可以是固定连接,也可以是可拆卸连接,或成一体;可以是机械连接,也可以是电连接;可以是直接相连,也可以通过中间媒介间接相连,可以是两个元件内部的连通或两个元件的相互作用关系。对于本领域的普通技术人员而言,可以具体情况理解上述术语在本发明中的具体含义。In the description of the present invention, unless otherwise clearly stated and limited, the terms "connected", "connected" and "fixed" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral body. ; It can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be an internal connection between two elements or an interaction between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood on a case-by-case basis.

在本发明中,除非另有明确的规定和限定,第一特征在第二特征之“上”或之“下”可以包括第一和第二特征直接接触,也可以包括第一和第二特征不是直接接触而是通过它们之间的另外的特征接触。而且,第一特征在第二特征“之上”、“上方”和“上面”包括第一特征在第二特征正上方和斜上方,或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”包括第一特征在第二特征正下方和斜下方,或仅仅表示第一特征水平高度小于第二特征。In the present invention, unless otherwise expressly provided and limited, the term "above" or "below" a first feature of a second feature may include direct contact between the first and second features, or may also include the first and second features. Not in direct contact but through additional characteristic contact between them. Furthermore, the terms "above", "above" and "above" a first feature on a second feature include the first feature being directly above and diagonally above the second feature, or simply mean that the first feature is higher in level than the second feature. “Below”, “under” and “under” the first feature is the second feature includes the first feature being directly below and diagonally below the second feature, or simply means that the first feature is less horizontally than the second feature.

在本实施例的描述中,术语“上”、“下”、“左”、“右”等方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述和简化操作,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本发明的限制。此外,术语“第一”、“第二”仅仅用于在描述上加以区分,并没有特殊的含义。In the description of this embodiment, the terms "upper", "lower", "left", "right" and other orientations or positional relationships are based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplified operation. It is not intended to indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore is not to be construed as a limitation of the invention. In addition, the terms "first" and "second" are only used for descriptive purposes and have no special meaning.

如图1-图3所示,本实施例提供一种CT系统,该CT系统包括沿Z向延伸的矩形通道1、旋转组件2、射线源3和探测器组件4。As shown in FIGS. 1 to 3 , this embodiment provides a CT system, which includes a rectangular channel 1 extending along the Z direction, a rotating component 2 , a radiation source 3 and a detector component 4 .

具体地,旋转组件2包括转架21,转架21环设于矩形通道1;射线源3和探测器组件4,射线源3和探测器组件4均安装转架21,且射线源3和探测器组件4设置于矩形通道1的两侧;探测器组件4包括中间探测器41和边缘探测器42,边缘探测器42包括对称设置于中间探测器41两侧的第一子边缘探测器421和第二子边缘探测器422,射线源3的射线穿设于矩形通道1并照射于探测器组件4,转架21转动360度时,射线源3与边缘探测器42之间形成检测矩形通道1的环形边缘检测区域423,环形边缘检测区域423与矩形通道1的重合部分4231不大于环形边缘检测区域423与矩形通道1的未重合部分4232;中间探测器41、第一子边缘探测器421和第二子边缘探测器422均沿Z向均匀间隔设置有多排晶体模块43,第一子边缘探测器421上的晶体模块43的排数和第二子边缘探测器422上的晶体模块43的排数相同,且第一子边缘探测器421上的晶体模块43的排数是中间探测器41上的晶体模块43的排数的一半;第一子边缘探测器421的晶体模块43和第二子边缘探测器422的晶体模块43沿Z向交错设置且无重叠位置。Specifically, the rotating assembly 2 includes a turret 21, which is arranged around the rectangular channel 1; the ray source 3 and the detector assembly 4. Both the ray source 3 and the detector assembly 4 are installed with the turret 21, and the ray source 3 and the detection The detector assembly 4 is arranged on both sides of the rectangular channel 1; the detector assembly 4 includes a middle detector 41 and an edge detector 42. The edge detector 42 includes a first sub-edge detector 421 and a first sub-edge detector 421 that are symmetrically arranged on both sides of the middle detector 41. In the second sub-edge detector 422, the rays from the ray source 3 pass through the rectangular channel 1 and are irradiated on the detector assembly 4. When the turret 21 rotates 360 degrees, a detection rectangular channel 1 is formed between the ray source 3 and the edge detector 42. The annular edge detection area 423, the overlapping part 4231 of the annular edge detection area 423 and the rectangular channel 1 is not larger than the non-overlapping part 4232 of the annular edge detection area 423 and the rectangular channel 1; the middle detector 41, the first sub-edge detector 421 and The second sub-edge detectors 422 are each provided with multiple rows of crystal modules 43 evenly spaced along the Z direction. The number of rows of crystal modules 43 on the first sub-edge detector 421 and the number of rows of crystal modules 43 on the second sub-edge detector 422 are The number of rows is the same, and the number of rows of crystal modules 43 on the first sub-edge detector 421 is half of the number of rows of crystal modules 43 on the middle detector 41; the crystal modules 43 of the first sub-edge detector 421 and the second The crystal modules 43 of the sub-edge detectors 422 are staggered along the Z direction without overlapping positions.

工作时,转架21带动射线源3和探测器组件4共同绕矩形通道1转动,当转架21转动360度时,射线源3与边缘探测器42之间形成检测矩形通道1的环形边缘检测区域423,其中,环形边缘检测区域423与矩形通道1的重合部分4231为需要成像的区域,环形边缘检测区域423与矩形通道1的未重合部分4232为空气,不需要计算和再构成画像,计算量较小,因此第一子边缘探测器421和第二子边缘探测器422仅需少量的晶体模块43就可以形成该层厚的画像。本实施例环形边缘检测区域423与矩形通道1的重合部分4231不大于环形边缘检测区域423与矩形通道1的未重合部分4232,即检测矩形通道1的四个尖角区域,相对于中间探测器41,边缘探测器42需要计算的数据量减少一半以上,因此能够将第一子边缘探测器421上的晶体模块43的排数和第二子边缘探测器422上的晶体模块43的排数设置成中间探测器41上的晶体模块43的排数的一半,当第一子边缘探测器421和第二子边缘探测器422上排数减少时,晶体模块43的间隔可相对增大,降低第一子边缘探测器421和第二子边缘探测器422的加工难度,进而降低生产成本。During operation, the turret 21 drives the ray source 3 and the detector assembly 4 to rotate together around the rectangular channel 1. When the turret 21 rotates 360 degrees, an annular edge detection system for detecting the rectangular channel 1 is formed between the ray source 3 and the edge detector 42. Area 423, in which the overlapping portion 4231 of the annular edge detection area 423 and the rectangular channel 1 is the area that needs imaging, and the non-overlapping portion 4232 of the annular edge detection area 423 and the rectangular channel 1 is air. There is no need to calculate and reconstruct the image. Calculate The amount is small, so the first sub-edge detector 421 and the second sub-edge detector 422 only need a small amount of crystal modules 43 to form an image with this layer thickness. In this embodiment, the overlapping portion 4231 of the annular edge detection area 423 and the rectangular channel 1 is no larger than the non-overlapping portion 4232 of the annular edge detection area 423 and the rectangular channel 1, that is, the four sharp corner areas of the rectangular channel 1 are detected, relative to the middle detector 41. The amount of data that the edge detector 42 needs to calculate is reduced by more than half, so the row number of the crystal module 43 on the first sub-edge detector 421 and the row number of the crystal module 43 on the second sub-edge detector 422 can be set. becomes half the number of rows of crystal modules 43 on the middle detector 41. When the number of rows on the first sub-edge detector 421 and the second sub-edge detector 422 is reduced, the spacing of the crystal modules 43 can be relatively increased, reducing the The processing difficulty of the first sub-edge detector 421 and the second sub-edge detector 422 thereby reduces production costs.

再者,如图1-图3所示,由于第一子边缘探测器421和第二子边缘探测器422对称设置于中间探测器41两侧,第一子边缘探测器421和第二子边缘探测器422检测位置为同一个环形边缘检测区域423,为了保证该环形边缘检测区域423的成像效果,第一子边缘探测器421的晶体模块43和第二子边缘探测器422的晶体模块43沿Z向交错设置且无重叠位置,第一子边缘探测器421的晶体模块43和第二子边缘探测器422的晶体模块43相当于实际的两倍,如图2和图3所示,即第一子边缘探测器421的晶体模块43获取的数据层数和第二子边缘探测器422的晶体模块43获取的数据层数相加等于第一子边缘探测器421的晶体模块43获取的数据层数,满足CT系统形成CT画像的成像需求。Furthermore, as shown in Figures 1 to 3, since the first sub-edge detector 421 and the second sub-edge detector 422 are symmetrically arranged on both sides of the middle detector 41, the first sub-edge detector 421 and the second sub-edge detector 421 are symmetrically arranged on both sides of the middle detector 41. The detection position of the detector 422 is the same annular edge detection area 423. In order to ensure the imaging effect of the annular edge detection area 423, the crystal module 43 of the first sub-edge detector 421 and the crystal module 43 of the second sub-edge detector 422 are arranged along Arranged staggered in the Z direction without overlapping positions, the crystal module 43 of the first sub-edge detector 421 and the crystal module 43 of the second sub-edge detector 422 are equivalent to twice the actual size, as shown in Figures 2 and 3, that is, the first The sum of the number of data layers acquired by the crystal module 43 of the first sub-edge detector 421 and the number of data layers acquired by the crystal module 43 of the second sub-edge detector 422 is equal to the data layer acquired by the crystal module 43 of the first sub-edge detector 421 number to meet the imaging needs of the CT system to form CT images.

需要说明的是,如图1所示,射线源3与边缘探测器42之间形成的边缘环形检测区域为现有技术。具体地,根据射线源3照射于边缘探测器42的射线路径44的两个边缘作外切圆并形成两个切点,外切圆的圆心在转架21的轴线上,两个切点连线并绕转架21的轴线旋转,形成边缘环形检测区域。It should be noted that, as shown in FIG. 1 , the edge annular detection area formed between the ray source 3 and the edge detector 42 is an existing technology. Specifically, according to the two edges of the ray path 44 irradiated by the ray source 3 on the edge detector 42, a circumscribed circle is formed and two tangent points are formed. The center of the circumscribed circle is on the axis of the turret 21, and the two tangent points are connected. The line rotates around the axis of the turret 21 to form an edge annular detection area.

本实施例中,如图1所示,中间探测器41设置于第一圆弧面上,边缘探测器42设置于第二圆弧面上,第一圆弧面和第二圆弧面同轴设置,且射线源3设置于第一圆弧面和第二圆弧面的轴线上,以此满足CT系统的成像需求。其中,在第一圆弧面和第二圆弧面上,转架21在相应位置设置有安装板,中间探测器41和边缘探测器42能够安装于该安装板上。In this embodiment, as shown in FIG. 1 , the middle detector 41 is disposed on the first arc surface, and the edge detector 42 is disposed on the second arc surface. The first arc surface and the second arc surface are coaxial. is set, and the ray source 3 is set on the axis of the first arc surface and the second arc surface, so as to meet the imaging requirements of the CT system. Among them, on the first arc surface and the second arc surface, the turret 21 is provided with a mounting plate at corresponding positions, and the middle detector 41 and the edge detector 42 can be installed on the mounting plate.

进一步地,第二圆弧面与矩形通道1不干涉,防止边缘探测器42在绕矩形通道1旋转时与矩形通道1干涉,且第二圆弧面不超出转架21的外径。Furthermore, the second arc surface does not interfere with the rectangular channel 1 , preventing the edge detector 42 from interfering with the rectangular channel 1 when rotating around the rectangular channel 1 , and the second arc surface does not exceed the outer diameter of the turret 21 .

本实施例中,第二圆弧面的半径小于第一圆弧面的半径,本实施例将边缘探测器42设置在更小的圆弧半径上,转架21的旋转半径变小,进而减小CT系统的尺寸。在其他实施例中,第二圆弧面的半径也可以大于第一圆弧面的半径,进而增大边缘探测器42上晶体模块43的间隔,降低边缘探测器42的生产难度及生产成本。In this embodiment, the radius of the second arc surface is smaller than the radius of the first arc surface. In this embodiment, the edge detector 42 is arranged on a smaller arc radius, so that the rotation radius of the turret 21 becomes smaller, thereby reducing the Small CT system size. In other embodiments, the radius of the second arc surface can also be larger than the radius of the first arc surface, thereby increasing the spacing between the crystal modules 43 on the edge detector 42 and reducing the production difficulty and cost of the edge detector 42 .

进一步地,如图2-图4所示,第一圆弧面的半径为Ra,第二圆弧面的半径为Rb,中间探测器41的长度为Da,中间探测器41的长度为Da,其中,Ra/Rb=Da/Db,以此满足CT系统的成像需求。其中,在选取第一圆弧面和第二圆弧面的位置后,Ra、Rb和Da均为已知数,Db可根据Ra/Rb=Da/Db计算得出。Further, as shown in Figures 2 to 4, the radius of the first arc surface is Ra, the radius of the second arc surface is Rb, the length of the middle detector 41 is Da, and the length of the middle detector 41 is Da, Among them, Ra/Rb=Da/Db, so as to meet the imaging requirements of the CT system. Among them, after selecting the positions of the first arc surface and the second arc surface, Ra, Rb and Da are all known numbers, and Db can be calculated according to Ra/Rb=Da/Db.

中间探测器41上的晶体模块43的间隔为da,第一子边缘探测器421上的晶体模块43的间隔和第二子边缘探测器422上的晶体模块43的间隔均为db,且第一子边缘探测器421设置有N排晶体模块43,中间探测器41设置有2N排晶体模块43,其中,Db=db*(N-1),Da=da*(2N-1)。其中,在计算出Db后,db可根据Db=db*(N-1)计算得出,da可根据Da=da*(2N-1)计算得出。其中,N为自然数,N值的选取为现有技术,可根据检测需求进行设置。The distance between the crystal modules 43 on the middle detector 41 is da, the distance between the crystal modules 43 on the first sub-edge detector 421 and the distance between the crystal modules 43 on the second sub-edge detector 422 are both db, and the first The sub-edge detector 421 is provided with N rows of crystal modules 43, and the middle detector 41 is provided with 2N rows of crystal modules 43, where Db=db*(N-1) and Da=da*(2N-1). Among them, after Db is calculated, db can be calculated according to Db=db*(N-1), and da can be calculated according to Da=da*(2N-1). Among them, N is a natural number, and the selection of the N value is an existing technology and can be set according to the detection requirements.

进一步优选地,第一子边缘探测器421的晶体模块43与第二子边缘探测器422的晶体模块43沿Z向的间隔为1/2db,第一子边缘探测器421的晶体模块43和第二子边缘探测器422的晶体模块43共同形成的数据层的间隔一致,提高成像画质,降低计算难度。Further preferably, the distance between the crystal module 43 of the first sub-edge detector 421 and the crystal module 43 of the second sub-edge detector 422 along the Z direction is 1/2db. The data layers formed by the crystal modules 43 of the two sub-edge detectors 422 have consistent intervals, which improves imaging quality and reduces calculation difficulty.

优选地,如图1所示,射线源3照射于边缘探测器42的射线路径44与射线源3照射于中间探测器41的射线路径44二者相邻的一侧相重合,防止射线路径44之间产生间隙,以此满足CT系统的成像需求。Preferably, as shown in FIG. 1 , the adjacent sides of the ray path 44 irradiated by the ray source 3 on the edge detector 42 and the ray path 44 irradiated by the ray source 3 on the middle detector 41 overlap to prevent the ray path 44 from collapsing. A gap is created between them to meet the imaging needs of the CT system.

进一步优选地,如图5所示,边缘探测器42为多组,第二圆弧面为多个,多组边缘探测器42与多个第二圆弧面一一对应,多个边缘探测器42可以安装在不同层的第二圆弧面上,进一步减小CT系统的尺寸。不同组的边缘探测器42的理论成像区域与实际位置区域形状和面积比例也不一样,因此不同组的边缘探测器42可以选择不同的配置。Further preferably, as shown in FIG. 5 , there are multiple sets of edge detectors 42 and multiple second arc surfaces. The multiple sets of edge detectors 42 correspond to the multiple second arc surfaces one-to-one. The multiple edge detectors 42 can be installed on the second arc surface of different layers to further reduce the size of the CT system. The shape and area ratio of the theoretical imaging area and the actual position area of different groups of edge detectors 42 are also different, so different groups of edge detectors 42 can choose different configurations.

如图6所示,本实施例还提供一种安检设备,包括上述的CT系统。旋转组件2还包括机架22,该安检设备还包括传送带5和数据传输组件6,转架21转动连接于机架22,传送带5设置在矩形通道1内,被检测物体10安装于传动带上,数据传输组件6根据CT系统的检测信息进行计算和成像。需要说明的是,该CT系统还可用于CT设备等用于CT成像的设备中。As shown in Figure 6, this embodiment also provides security inspection equipment, including the above-mentioned CT system. The rotating assembly 2 also includes a frame 22. The security inspection equipment also includes a conveyor belt 5 and a data transmission assembly 6. The turntable 21 is rotatably connected to the frame 22. The conveyor belt 5 is arranged in the rectangular channel 1, and the detected object 10 is installed on the conveyor belt. The data transmission component 6 performs calculation and imaging based on the detection information of the CT system. It should be noted that the CT system can also be used in CT equipment and other equipment used for CT imaging.

注意,上述仅为本发明的较佳实施例及所运用技术原理。本领域技术人员会理解,本发明不限于这里所述的特定实施例,对本领域技术人员来说能够进行各种明显的变化、重新调整和替代而不会脱离本发明的保护范围。因此,虽然通过以上实施例对本发明进行了较为详细的说明,但是本发明不仅仅限于以上实施例,在不脱离本发明构思的情况下,还可以包括更多其他等效实施例,而本发明的范围由所附的权利要求范围决定。Note that the above are only the preferred embodiments of the present invention and the technical principles used. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and that various obvious changes, readjustments and substitutions can be made to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in detail through the above embodiments, the present invention is not limited to the above embodiments. Without departing from the concept of the present invention, it can also include more other equivalent embodiments, and the present invention The scope is determined by the scope of the appended claims.

Claims (10)

1.一种CT系统,其特征在于,包括:1. A CT system, characterized in that it includes: 沿Z向延伸的矩形通道(1);Rectangular channel (1) extending along the Z direction; 旋转组件(2),其包括转架(21),所述转架(21)环设于所述矩形通道(1);A rotating assembly (2), which includes a rotating frame (21), and the rotating frame (21) is arranged around the rectangular channel (1); 射线源(3)和探测器组件(4),所述射线源(3)和所述探测器组件(4)均安装所述转架(21),且所述射线源(3)和所述探测器组件(4)设置于所述矩形通道(1)的两侧;A ray source (3) and a detector assembly (4) are installed on the turret (21), and the ray source (3) and the detector assembly (4) are Detector components (4) are arranged on both sides of the rectangular channel (1); 所述探测器组件(4)包括中间探测器(41)和边缘探测器(42),所述边缘探测器(42)包括对称设置于所述中间探测器(41)两侧的第一子边缘探测器(421)和第二子边缘探测器(422),所述射线源(3)的射线穿设于所述矩形通道(1)并照射于所述探测器组件(4),所述转架(21)转动360度时,所述射线源(3)与所述边缘探测器(42)之间形成检测所述矩形通道(1)的环形边缘检测区域(423),所述环形边缘检测区域(423)与所述矩形通道(1)的重合部分(4231)不大于所述环形边缘检测区域(423)与所述矩形通道(1)的未重合部分(4232);The detector assembly (4) includes a middle detector (41) and an edge detector (42). The edge detector (42) includes first sub-edges symmetrically arranged on both sides of the middle detector (41). The detector (421) and the second sub-edge detector (422), the rays of the ray source (3) pass through the rectangular channel (1) and irradiate the detector assembly (4), and the rotation When the frame (21) rotates 360 degrees, an annular edge detection area (423) for detecting the rectangular channel (1) is formed between the ray source (3) and the edge detector (42). The overlapping portion (4231) of the area (423) and the rectangular channel (1) is no larger than the non-overlapping portion (4232) of the annular edge detection area (423) and the rectangular channel (1); 所述中间探测器(41)、所述第一子边缘探测器(421)和所述第二子边缘探测器(422)均沿所述Z向均匀间隔设置有多排晶体模块(43),所述第一子边缘探测器(421)上的晶体模块(43)的排数和所述第二子边缘探测器(422)上的晶体模块(43)的排数相同,且所述第一子边缘探测器(421)上的晶体模块(43)的排数是所述中间探测器(41)上的晶体模块(43)的排数的一半;The middle detector (41), the first sub-edge detector (421) and the second sub-edge detector (422) are all provided with multiple rows of crystal modules (43) evenly spaced along the Z direction, The number of rows of crystal modules (43) on the first sub-edge detector (421) and the number of rows of crystal modules (43) on the second sub-edge detector (422) are the same, and the first The number of rows of crystal modules (43) on the sub-edge detector (421) is half of the number of rows of crystal modules (43) on the intermediate detector (41); 所述第一子边缘探测器(421)的晶体模块(43)和所述第二子边缘探测器(422)的晶体模块(43)沿所述Z向交错设置且无重叠位置。The crystal module (43) of the first sub-edge detector (421) and the crystal module (43) of the second sub-edge detector (422) are staggered along the Z direction without overlapping positions. 2.根据权利要求1所述的CT系统,其特征在于,所述中间探测器(41)设置于第一圆弧面上,所述边缘探测器(42)设置于第二圆弧面上,所述第一圆弧面和所述第二圆弧面同轴设置,且所述射线源(3)设置于所述第一圆弧面和所述第二圆弧面的轴线上。2. The CT system according to claim 1, characterized in that the middle detector (41) is arranged on the first arc surface, and the edge detector (42) is arranged on the second arc surface, The first arc surface and the second arc surface are arranged coaxially, and the ray source (3) is arranged on the axis of the first arc surface and the second arc surface. 3.根据权利要求2所述的CT系统,其特征在于,所述第二圆弧面与所述矩形通道(1)不干涉,且所述第二圆弧面不超出所述转架(21)的外径。3. The CT system according to claim 2, characterized in that the second arc surface does not interfere with the rectangular channel (1), and the second arc surface does not exceed the turret (21) ) outer diameter. 4.根据权利要求3所述的CT系统,其特征在于,所述第二圆弧面的半径小于所述第一圆弧面的半径。4. The CT system according to claim 3, wherein the radius of the second arc surface is smaller than the radius of the first arc surface. 5.根据权利要求2所述的CT系统,其特征在于,所述第一圆弧面的半径为Ra,所述第二圆弧面的半径为Rb,所述中间探测器(41)的长度为Da,所述中间探测器(41)的长度为Da,其中,Ra/Rb=Da/Db。5. The CT system according to claim 2, characterized in that the radius of the first arc surface is Ra, the radius of the second arc surface is Rb, and the length of the intermediate detector (41) is Da, and the length of the intermediate detector (41) is Da, where Ra/Rb=Da/Db. 6.根据权利要求5所述的CT系统,其特征在于,所述中间探测器(41)上的晶体模块(43)的间隔为da,所述第一子边缘探测器(421)上的晶体模块(43)的间隔和所述第二子边缘探测器(422)上的晶体模块(43)的间隔均为db,且所述第一子边缘探测器(421)设置有N排晶体模块(43),所述中间探测器(41)设置有2N排晶体模块(43),其中,Db=db*(N-1),Da=da*(2N-1)。6. The CT system according to claim 5, characterized in that the spacing between the crystal modules (43) on the middle detector (41) is da, and the crystal modules on the first sub-edge detector (421) The spacing between the modules (43) and the spacing between the crystal modules (43) on the second sub-edge detector (422) are both db, and the first sub-edge detector (421) is provided with N rows of crystal modules ( 43), the intermediate detector (41) is provided with 2N rows of crystal modules (43), where Db=db*(N-1) and Da=da*(2N-1). 7.根据权利要求6所述的CT系统,其特征在于,所述第一子边缘探测器(421)的晶体模块(43)与第二子边缘探测器(422)的晶体模块(43)沿所述Z向的间隔为1/2db。7. The CT system according to claim 6, characterized in that the crystal module (43) of the first sub-edge detector (421) and the crystal module (43) of the second sub-edge detector (422) are arranged along The interval in the Z direction is 1/2db. 8.根据权利要求1所述的CT系统,其特征在于,所述射线源(3)照射于所述边缘探测器(42)的射线路径(44)与所述射线源(3)照射于所述中间探测器(41)的射线路径(44)二者相邻的一侧相重合。8. The CT system according to claim 1, characterized in that the ray path (44) irradiated by the ray source (3) on the edge detector (42) is the same as the ray path (44) irradiated by the ray source (3) on the edge detector (42). The ray path (44) of the middle detector (41) coincides with the two adjacent sides. 9.根据权利要求2所述的CT系统,其特征在于,所述边缘探测器(42)为多组,所述第二圆弧面为多个,多组所述边缘探测器(42)与多个所述第二圆弧面一一对应。9. The CT system according to claim 2, characterized in that the edge detectors (42) are in multiple groups, the second arc surfaces are in multiple groups, and the edge detectors (42) in multiple groups are The plurality of second arc surfaces correspond to each other one by one. 10.一种安检设备,其特征在于,包括如权利要求1-9任一项所述的CT系统。10. Security inspection equipment, characterized by comprising the CT system according to any one of claims 1-9.
CN202310558387.1A 2023-05-17 2023-05-17 CT system and security inspection equipment Pending CN116990854A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN202310558387.1A CN116990854A (en) 2023-05-17 2023-05-17 CT system and security inspection equipment
PCT/CN2024/093889 WO2024235312A1 (en) 2023-05-17 2024-05-17 Ct system and security inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310558387.1A CN116990854A (en) 2023-05-17 2023-05-17 CT system and security inspection equipment

Publications (1)

Publication Number Publication Date
CN116990854A true CN116990854A (en) 2023-11-03

Family

ID=88527263

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202310558387.1A Pending CN116990854A (en) 2023-05-17 2023-05-17 CT system and security inspection equipment

Country Status (2)

Country Link
CN (1) CN116990854A (en)
WO (1) WO2024235312A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024235312A1 (en) * 2023-05-17 2024-11-21 德瑞科(天津)机械制造有限公司 Ct system and security inspection device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119438254B (en) * 2025-01-13 2025-06-03 宁德时代新能源科技股份有限公司 Battery device detection apparatus

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008006515A1 (en) * 2008-01-29 2009-08-27 Siemens Aktiengesellschaft Radiation detector module for radiological radiation, comprises pixelated radiation conversion unit and another pixelated radiation conversion unit, which is fitted downstream to it and in radiation incident direction
US20140284752A1 (en) * 2011-10-06 2014-09-25 Advacam Oy Detector structure for imaging applications and related method of manufacture
CN108811488A (en) * 2017-02-27 2018-11-13 北京纳米维景科技有限公司 Static real-time CT imaging system and its imaging method adapted to the requirement of large field of view
CN109738465A (en) * 2019-03-07 2019-05-10 北京航星机器制造有限公司 A CT detection device and system
CN220584408U (en) * 2023-05-17 2024-03-12 德瑞科(天津)机械制造有限公司 CT system and security inspection equipment

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7551712B2 (en) * 2006-04-20 2009-06-23 General Electric Company CT detector with non-rectangular cells
CN103674979B (en) * 2012-09-19 2016-12-21 同方威视技术股份有限公司 A kind of luggage and articles CT safe examination system and detector assembly thereof
CN114947911A (en) * 2021-02-26 2022-08-30 清华大学 Imaging Systems for Radiographic Inspection
CN215640962U (en) * 2021-07-07 2022-01-25 同方威视技术股份有限公司 Ray scanning device
CN116990854A (en) * 2023-05-17 2023-11-03 德瑞科(天津)机械制造有限公司 CT system and security inspection equipment

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008006515A1 (en) * 2008-01-29 2009-08-27 Siemens Aktiengesellschaft Radiation detector module for radiological radiation, comprises pixelated radiation conversion unit and another pixelated radiation conversion unit, which is fitted downstream to it and in radiation incident direction
US20140284752A1 (en) * 2011-10-06 2014-09-25 Advacam Oy Detector structure for imaging applications and related method of manufacture
CN108811488A (en) * 2017-02-27 2018-11-13 北京纳米维景科技有限公司 Static real-time CT imaging system and its imaging method adapted to the requirement of large field of view
CN109738465A (en) * 2019-03-07 2019-05-10 北京航星机器制造有限公司 A CT detection device and system
CN220584408U (en) * 2023-05-17 2024-03-12 德瑞科(天津)机械制造有限公司 CT system and security inspection equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2024235312A1 (en) * 2023-05-17 2024-11-21 德瑞科(天津)机械制造有限公司 Ct system and security inspection device

Also Published As

Publication number Publication date
WO2024235312A1 (en) 2024-11-21

Similar Documents

Publication Publication Date Title
CN116990854A (en) CT system and security inspection equipment
CN103674979B (en) A kind of luggage and articles CT safe examination system and detector assembly thereof
CN202794067U (en) Luggage CT safety inspection system and detector device thereof
US8253108B2 (en) Radiation imaging system, nuclear medicine diagnosis apparatus and positioning adjusting mechanism
JP2011232057A (en) Ct device and imaging method for ct device
US10492746B2 (en) Spherical detector for CT system
US20120069955A1 (en) Contactless power chain
CN220584408U (en) CT system and security inspection equipment
CN116973388A (en) Detection device and detection method for battery core detection
CN110865089B (en) CT detector and CT detection system
CN114280087B (en) CT imaging system and imaging method
CN114047209B (en) Distributed static CT system and imaging method
US4403338A (en) Process and apparatus for scatter reduction in radiography
JP2022044918A (en) Radiation imaging apparatus
CN109738465B (en) CT detection device and system
CN216907989U (en) CT device
US10206649B2 (en) Data transfer across a rotating boundary of a computed tomography imaging apparatus
US20230063271A1 (en) Multi-spherical detector for ct system
CN111413358B (en) Scanning component setting method and scanning component and scanning device
US10602993B2 (en) Image reconstruction for Z-flying focal spot tomography
CN217820094U (en) A CT imaging device
CN114236625B (en) CT system and CT imaging method
CN217820095U (en) Multi-view static CT device
CN217359677U (en) A static CT imaging device
CN111227858A (en) Detector module, detector and CT equipment

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination