CN116953406A - Anti-interference test equipment of electronic equipment - Google Patents
Anti-interference test equipment of electronic equipment Download PDFInfo
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- CN116953406A CN116953406A CN202310944593.6A CN202310944593A CN116953406A CN 116953406 A CN116953406 A CN 116953406A CN 202310944593 A CN202310944593 A CN 202310944593A CN 116953406 A CN116953406 A CN 116953406A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
本申请实施例提供了一种电子设备的抗干扰测试设备，其中，包括：信号发射器和控制器，其中，控制器和信号发射器连接；信号发射器，用于向待测试的电子设备发射目标电磁信号，其中，目标电磁信号用于在电子设备的电路回路中产生瞬态脉冲群干扰；控制器，用于根据电子设备的设备属性控制目标电磁信号的目标信号参数，该方法包括：通过本申请，可以解决相关技术中的对电子设备的电快速瞬变脉冲群抗干扰测试的测试效率较低的问题，达到提高对电子设备的电快速瞬变脉冲群抗干扰测试的测试效率的效果。
The embodiment of the present application provides an anti-interference test equipment for electronic equipment, which includes: a signal transmitter and a controller, wherein the controller is connected to the signal transmitter; and the signal transmitter is used to transmit signals to the electronic equipment to be tested. The target electromagnetic signal, wherein the target electromagnetic signal is used to generate transient pulse group interference in the circuit loop of the electronic device; the controller is used to control the target signal parameters of the target electromagnetic signal according to the device attributes of the electronic device. The method includes: This application can solve the problem in the related technology that the test efficiency of the electrical fast transient pulse group anti-interference test of electronic equipment is low, and achieve the effect of improving the test efficiency of the electrical fast transient pulse group anti-interference test of electronic equipment. .
Description
Technical Field
The embodiment of the application relates to the field of equipment testing, in particular to anti-interference testing equipment for electronic equipment.
Background
With the continuous acceleration of the progress of the informatization age, various IT (Information Technology ) products are continuously updated and developed. Especially, the cloud era comes, and the performance requirements on the server are higher and higher. The demand for high performance, high-profile servers is increasing. With the continuous improvement of server performance, high-power consumption and high-power servers are becoming the main stream of the server market.
The application of the server is more and more widespread, and with the increase of quality control, both the 3C certification of the domestic market and the environmental experiment of the military products comprise EFT/B (Electrical Fast Transient/Burst, electric fast transient pulse group) anti-interference test, which is a test item that the electronic products must pass, and is a difficulty in designing and modifying the electronic products. In the related art, the EFT/B anti-interference test is implemented by an EFT/B generator, and the principle is that voltage pulse interference is generated, and the voltage pulse interference is coupled on a circuit loop of the device to be tested by coupling with a power supply line of the device to be tested. While the EFT/B generator has high precision, the generator is huge in volume, needs to be provided with a specific laboratory, has great operation difficulty and is unfavorable for EFT/B test of electronic equipment.
Disclosure of Invention
The embodiment of the application provides anti-interference test equipment for electronic equipment, which at least solves the problem of lower test efficiency of anti-interference test of an electric fast transient pulse group of the electronic equipment in the related technology.
According to an embodiment of the present application, there is provided an anti-interference test apparatus for an electronic apparatus, including: the device comprises a signal transmitter and a controller, wherein the controller is connected with the signal transmitter; the signal transmitter is used for transmitting a target electromagnetic signal to the electronic equipment to be tested, wherein the target electromagnetic signal is used for generating transient pulse group interference in a circuit loop of the electronic equipment;
the controller is used for controlling target signal parameters of the target electromagnetic signals according to equipment attributes of the electronic equipment.
Optionally, the signal transmitter includes: the N signal transmitting units are respectively connected with the controller and are arranged at different positions around the electronic equipment; the signal transmitting unit is configured to transmit a sub-electromagnetic signal to a target location on the electronic device, where the target location is a location on the electronic device corresponding to the signal transmitting unit, and the target electromagnetic signal includes the sub-electromagnetic signal; the controller is configured to control a sub-signal parameter of the sub-electromagnetic signal according to the device attribute of the electronic device, where the target signal parameter includes the sub-signal parameter.
Optionally, the signal transmitting unit includes: the power supply comprises a power supply, a switch and an electromagnetic coil, wherein the first end of the power supply is connected with the first end of the switch, the second end of the power supply is connected with the first end of the electromagnetic coil, the second end of the switch is connected with the second end of the electromagnetic coil, and the controller is connected with the switch; the power supply is used for supplying power to the electromagnetic coil; the switch is used for adjusting the on-off state of a target circuit formed between the power supply and the electromagnetic coil; the electromagnetic coil is used for generating the sub electromagnetic signals which are emitted on the target position; the controller is used for controlling the target signal frequency of the sub electromagnetic signal by controlling the switch to adjust the on-off state frequency of the target circuit, wherein the sub signal parameter comprises the target signal frequency.
Optionally, the signal transmitting unit further includes: a coil adjustment component, wherein the coil adjustment component is connected with the controller; the coil adjusting component is used for adjusting the number of turns of the electromagnetic coil in the target circuit; the controller is used for controlling the target signal intensity of the sub electromagnetic signals in a mode of controlling the coil adjusting component to adjust the coil turns of the electromagnetic coil in the target circuit, wherein the sub signal parameters comprise the target signal intensity.
Optionally, the coil adjusting part includes: a connection wire, wherein a first end of the connection wire is fixed at a first location on the electromagnetic coil, a second end of the connection wire is connected with the electromagnetic coil, and the second end of the connection wire is configured to allow movement on the electromagnetic coil; the connecting wire is used for adjusting the number of turns of the coil of the electromagnetic coil in a mode of breaking the coil between the first position and the second position, and the second position is a position where the second end of the connecting wire is in contact with the electromagnetic coil.
Optionally, a target power consumption element is further connected in series in the target circuit, wherein the target power consumption element is used for controlling the formation of a power consumption loop in the target circuit.
Optionally, the anti-interference test device of the electronic device further includes: a processor, wherein the processor is configured to connect with the electronic device;
the processor is further configured to obtain a target operation state of the electronic device, where the target operation state is used to characterize an equipment operation condition of the electronic device under a transient pulse group interference generated by the target electromagnetic signal; and determining the anti-interference performance of the electric fast transient pulse group of the electronic equipment according to the target running state.
Optionally, the processor is further connected to the controller, wherein the processor is further configured to: transmitting a target instruction to the controller in the case that the performance level of the electric fast transient pulse group anti-interference performance of the electronic device is lower than a target level, wherein the target instruction is used for instructing the controller to adjust the target signal parameter of the target electromagnetic signal transmitted by the signal transmitter; acquiring running state information of the electronic equipment in the process of changing the target signal parameters of the target electromagnetic signal; and determining a target component on the electronic equipment according to the running state information, wherein the target component is a component which leads the performance level of the electronic equipment to be lower than the target level.
Optionally, the processor is further configured to: the controller is controlled to sequentially adjust sub-signal parameters of sub-electromagnetic signals output by the N signal transmitting units according to a target sequence, wherein the signal transmitter comprises N signal transmitting units, and the N signal transmitting units are arranged at different positions around the electronic equipment.
Optionally, the processor is further configured to: a target signal transmitting unit for determining that the sub-signal parameter of the sub-electromagnetic signal currently output is in an adjusted state under the condition that the operation state information of the electronic equipment is changed; and determining a component corresponding to the target signal transmitting unit on the electronic equipment as the target component.
According to the application, the anti-interference test equipment of the electronic equipment comprises: the signal transmitter and the controller are used for transmitting a target electromagnetic signal to the electronic equipment to be tested, transient pulse group interference is generated in a circuit loop of the electronic equipment through the target electromagnetic signal, and target signal parameters of the target electromagnetic signal transmitted by the signal transmitter are controlled through the controller according to equipment attributes of the electronic equipment, so that the mode of transmitting electromagnetic signals with different signal parameters to the electronic equipment with different equipment attributes is realized, the transient pulse group interference is generated in the circuit loop of the electronic equipment to be tested, and the electric quick transient pulse group anti-interference test of the electronic equipment is realized through simple test equipment. Therefore, the problem of lower test efficiency of the anti-interference test of the electric fast transient pulse group of the electronic equipment in the related technology can be solved, and the effect of improving the test efficiency of the anti-interference test of the electric fast transient pulse group of the electronic equipment is achieved.
Drawings
FIG. 1 is a schematic diagram of an tamper resistant test device for an electronic device in accordance with an embodiment of the present application;
FIG. 2 is a schematic diagram of an alternative mobile device according to an embodiment of the application;
FIG. 3 is a block diagram of an alternative tamper resistant test device in accordance with an embodiment of the present application;
FIG. 4 is a schematic illustration of an alternative coil adjustment component in accordance with an embodiment of the present application;
FIG. 5 is a schematic diagram II of an alternative coil adjustment component according to an embodiment of the application;
FIG. 6 is an alternative interference test flow chart according to an embodiment of the present application;
fig. 7 is an alternative electronic component inspection flow diagram according to an embodiment of the application.
Detailed Description
Embodiments of the present application will be described in detail below with reference to the accompanying drawings in conjunction with the embodiments.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order.
In this embodiment, an anti-interference test device of an electronic device is provided, and fig. 1 is a schematic diagram of an anti-interference test device of an electronic device according to an embodiment of the present application, as shown in fig. 1, where the device includes:
a signal transmitter and a controller, wherein,
the controller is connected with the signal transmitter;
the signal transmitter is used for transmitting a target electromagnetic signal to the electronic equipment to be tested, wherein the target electromagnetic signal is used for generating transient pulse group interference in a circuit loop of the electronic equipment;
the controller is used for controlling target signal parameters of the target electromagnetic signals according to equipment attributes of the electronic equipment.
With the above, since the tamper resistant test device of the electronic device includes: the signal transmitter and the controller are used for transmitting a target electromagnetic signal to the electronic equipment to be tested, transient pulse group interference is generated in a circuit loop of the electronic equipment through the target electromagnetic signal, and target signal parameters of the target electromagnetic signal transmitted by the signal transmitter are controlled through the controller according to equipment attributes of the electronic equipment, so that the mode of transmitting electromagnetic signals with different signal parameters to the electronic equipment with different equipment attributes is realized, the transient pulse group interference is generated in the circuit loop of the electronic equipment to be tested, and the electric quick transient pulse group anti-interference test of the electronic equipment is realized through simple test equipment. Therefore, the problem of lower test efficiency of the anti-interference test of the electric fast transient pulse group of the electronic equipment in the related technology can be solved, and the effect of improving the test efficiency of the anti-interference test of the electric fast transient pulse group of the electronic equipment is achieved.
Alternatively, in the present embodiment, the signal transmitter may be configured to transmit the target electromagnetic signal to the electronic device to be tested at a fixed position, or may also be configured to transmit the target electromagnetic signal to the electronic device to be tested at different positions around the electronic device to be tested, for example, a plurality of signal transmitting units may be provided, the signal transmitter including a plurality of signal transmitting units, the signal transmitting units being disposed at different positions around the electronic device to be tested so as to transmit the target electromagnetic signal to different positions on the electronic device from different positions, or a moving device may be provided, the signal transmitter being disposed on the moving device, the moving device being configured to rotate the signal transmitter centering around the electronic device to be tested, and further to move the signal transmitter by the moving device, thus, the requirement of transmitting the target electromagnetic signal from different positions to different positions on the electronic device is met, fig. 2 is a schematic diagram of an alternative mobile device according to an embodiment of the present application, as shown in fig. 2, the mobile device includes an objective table, a first rotating arm and a second rotating arm, the objective table is connected to a first end of the first rotating arm, the first rotating arm is configured to allow rotation at a connection point of the first rotating arm and the objective table, a second end of the first rotating arm is connected to a first end of the second rotating arm, a signal transmitter is disposed on a second end of the second rotating arm, and the first rotating arm drives the signal transmitter disposed on the second rotating arm to rotate around the electronic device disposed on the object to be carried by rotation, further, the first rotating arm and the second rotating arm are telescopic rotating arms.
Alternatively, in the present embodiment, the device attribute may include, but is not limited to, a device function, a device model, a power, and the like of the electronic device, which is not limited in this aspect.
Alternatively, in the present embodiment, the target signal parameter may include, but is not limited to, a transmission frequency, a signal strength, a transmission position, and the like of the target electromagnetic signal, which is not limited in this aspect.
Optionally, in this embodiment, the controller is configured to control signal parameters of a target electromagnetic signal transmitted to an electronic device to be tested, where the basis for controlling the signal parameters of the target electromagnetic signal may be based on a test requirement for an EFT/B anti-interference test of the electronic device, for example, an EFT/B anti-interference performance of testing signals of different types of devices, since signals of the devices are different, a transmission position of the target electromagnetic signal is also different, a signal strength of the target electromagnetic signal and a signal frequency of the transmitted target electromagnetic signal are also different, for example, an EFT/B anti-interference performance of testing devices of the same type and different types may be tested, and since power of the devices or a voltage on a circuit loop may be different due to the different types of the devices, so when testing the devices, a signal strength and a signal frequency of the target electromagnetic signal are also different.
Fig. 3 is a block diagram of an alternative anti-interference test device according to an embodiment of the present application, as shown in fig. 3, a 220V voltage of a mains supply is converted into a usable direct current through a power board, the direct current is divided into two paths, one path is used for supplying power to a motor and a controller, the other path is used for supplying power to an electronic device to be tested, and if the electronic device to be tested supplies power to the mains supply 220, the power board can be bypassed to directly take power from the mains supply 220V. The direct current motor is connected to the circuit through a wire, the power supply line of the direct current motor is longer, the electronic equipment to be tested is wound to simulate EFT interference, the number of turns of the electronic equipment to be tested is used for simulating the intensity of the EFT interference, and the more the number of turns is, the greater the intensity of the interference is. A controller of an electronic switch is designed on a power supply line of a direct current motor, and the switching frequency of the electronic switch can be adjusted through the controller to apply EFT interference to an object to be detected. The design can simply simulate the test interference of the EFT, and the interference with different intensity is applied by winding different positions of the electronic equipment to be tested, so that the weak point of the object to be tested can be found conveniently in the EFT rectifying process, and the countermeasure rectifying can be applied in a targeted manner. As shown in the figure, DC1 supplies power to the direct current motor, the return path of the DB1 direct current motor forms a loop, so that the motor can work, DC1 also supplies power to the controller in the figure, and DB3 is the return path of the controller power supply, so that the control board can operate normally. In the figure, DC2 is used for supplying power to the electronic equipment to be tested, DB2 is a return path of the electronic equipment to be tested, and if the electronic equipment to be tested is AC power supply, the electronic equipment to be tested can bypass a power panel to be directly connected with 220V AC (the dotted line schematic part in FIG. 3) of the commercial power, so that the electronic equipment to be tested can work normally. The controller is an electronic switch SW for controlling the power supply line of the dc motor, and the switching frequency of the electronic switch can be set by the controller.
The EFT test is complicated to rectify and has high cost, and a simple EFT test simulating method is designed for solving the problem that a company lacks a low-cost and simple EFT test simulating system. The test cost of the product can be reduced, the test period is shortened, and a solution is provided for the problems of large difficulty and high cost of laboratory rectification. The design can be applied to products which need to be modified in EFT anti-interference test of all electronic products, and the existing laboratory environment is utilized without purchasing expensive special instruments through simple line optimization, so that the cost is low, and the applicable scene is wide.
As an alternative embodiment, the signal transmitter includes: n signal transmitting units, wherein,
the N signal transmitting units are respectively connected with the controller and are arranged at different positions around the electronic equipment;
the signal transmitting unit is configured to transmit a sub-electromagnetic signal to a target location on the electronic device, where the target location is a location on the electronic device corresponding to the signal transmitting unit, and the target electromagnetic signal includes the sub-electromagnetic signal;
the controller is configured to control a sub-signal parameter of the sub-electromagnetic signal according to the device attribute of the electronic device, where the target signal parameter includes the sub-signal parameter.
Alternatively, in the embodiment of the present application, the controller may control sub-signal parameters of the sub-electromagnetic signals transmitted by the respective signal transmitting units, such as a signal transmission frequency and a signal transmission intensity of the sub-electromagnetic signals, respectively.
Optionally, in the embodiment of the present application, the controller may control the order in which the respective signal transmitting units transmit the sub-electromagnetic signals to the electronic device, for example, the controller may control the N signal transmitting units to transmit the sub-electromagnetic signals to the electronic device at the same time, or may further control each of the N signal transmitting units to transmit the sub-electromagnetic signals to the electronic device in sequence according to a target time interval according to a certain control sequence.
Optionally, in the embodiment of the present application, the target positions of the irradiation of the sub-electromagnetic signals emitted by different signal emitting units on the electronic device may be the same or different, for example, each signal emitting unit corresponds to an electronic element on one electronic device, the electronic elements corresponding to the different signal emitting units are different, and the signal emitting units are used for emitting the sub-electromagnetic signals to the corresponding electronic elements.
Through the above, through setting up N signal transmitting units, and disposing N signal transmitting units in different positions around electronic equipment, thereby realizing transmitting sub electromagnetic signals to different positions on electronic equipment, avoiding signal blind spots on electronic equipment, thereby ensuring the accuracy of EFT/B anti-interference test on electronic equipment.
As an alternative embodiment, the signal transmitting unit includes: a power source, a switch and an electromagnetic coil, wherein,
the first end of the power supply is connected with the first end of the switch, the second end of the power supply is connected with the first end of the electromagnetic coil, the second end of the switch is connected with the second end of the electromagnetic coil, and the controller is connected with the switch;
the power supply is used for supplying power to the electromagnetic coil;
the switch is used for adjusting the on-off state of a target circuit formed between the power supply and the electromagnetic coil;
the electromagnetic coil is used for generating the sub electromagnetic signals which are emitted on the target position;
the controller is used for controlling the target signal frequency of the sub electromagnetic signal by controlling the switch to adjust the on-off state frequency of the target circuit, wherein the sub signal parameter comprises the target signal frequency.
Optionally, in an embodiment of the present application, the number of turns of the electromagnetic coil in the coil connected in the target circuit is configured to be adjustable, and by adjusting the number of turns of the electromagnetic coil connected in the target circuit, the signal strength of the sub-electromagnetic signal output by the electromagnetic coil is adjusted.
Through the above, each signal transmitting unit comprises a switch and an electromagnetic coil, the electromagnetic coil generates a sub electromagnetic signal, and the controller controls the signal frequency of the sub electromagnetic signal in a mode of controlling the on-off frequency of the switch, so that the circuit structure is simple, and the purpose of completing the equivalent EFT/B anti-interference test of the electronic equipment through the simple circuit structure is achieved.
As an alternative embodiment, the signal transmitting unit further comprises: a coil adjusting member, wherein,
the coil adjusting component is connected with the controller;
the coil adjusting component is used for adjusting the number of turns of the electromagnetic coil in the target circuit;
the controller is used for controlling the target signal intensity of the sub electromagnetic signals in a mode of controlling the coil adjusting component to adjust the coil turns of the electromagnetic coil in the target circuit, wherein the sub signal parameters comprise the target signal intensity.
Alternatively, in the embodiment of the present application, the coil adjusting part may control the number of turns of the electromagnetic coil connected in the target circuit by shorting a part of the coils in the electromagnetic coil, or the electronic coil may further include a plurality of sub-coils connected in parallel, and the coil adjusting part adjusts the number of turns of the electromagnetic coil by adjusting the number of sub-coils connected in parallel in the target circuit. Fig. 4 is a schematic diagram of an alternative coil adjusting component according to an embodiment of the present application, as shown in fig. 4, the electromagnetic coil includes a plurality of sub-electromagnetic coils, the plurality of sub-electromagnetic coils are connected in parallel, the coil adjusting component may be a switch corresponding to each sub-electromagnetic coil, in the drawing, three sub-electromagnetic coils are shown, each sub-electromagnetic coil corresponds to one switch, and the number of sub-electromagnetic coils connected into the target circuit is controlled by controlling the on-off of the switch, so as to adjust the number of coil turns of the electromagnetic coil connected into the target circuit. Fig. 5 is a schematic diagram of an alternative coil adjustment component according to an embodiment of the present application, and as shown in fig. 5, the coil adjustment component may be a length of connection wire, a first end of the connection wire being fixed in a first position on the electromagnetic coil, and a second end of the connection wire being configured to allow movement on the electromagnetic coil, thereby adjusting the number of turns of the shorted coil via the connection wire, and thereby adjusting the number of turns of the coil that is connected to the target circuit.
Through the steps, the coil adjusting component is arranged, so that the signal intensity of an electromagnetic signal is adjusted in a mode of adjusting the number of turns of the coil connected with the electromagnetic coil in the target circuit, the signal intensity of the sub electromagnetic signal transmitted by the signal transmitting unit is adjustable, the electromagnetic signal transmitted by the signal transmitting unit can be adjusted according to different testing requirements, and the universality of the anti-interference testing equipment of the electronic equipment is improved.
As an alternative embodiment, the coil adjusting part includes: a connecting wire, wherein,
a first end of the connection wire is fixed at a first location on the solenoid coil, a second end of the connection wire is connected with the solenoid coil, and the second end of the connection wire is configured to allow movement on the solenoid coil;
the connecting wire is used for adjusting the number of turns of the coil of the electromagnetic coil in a mode of breaking the coil between the first position and the second position, and the second position is a position where the second end of the connecting wire is in contact with the electromagnetic coil.
Alternatively, in the embodiment of the present application, the connection position of the first end of the connection wire and the electromagnetic coil may also be set to be adjustable, so as to change the number of turns of the electromagnetic coil connected in the target circuit by adjusting the connection position of the first end and the second section of the connection wire on the electromagnetic coil.
As an alternative embodiment, a target power consumption element is also connected in series in the target circuit, wherein the target power consumption element is used for controlling the formation of a power consumption loop in the target circuit.
Optionally, in the embodiment of the present application, the target power consumption element may be, but not limited to, a motor, a lamp, or an auxiliary device for operating an electronic device, for example, in a case where the electronic device is a server, the target power consumption element connected in series in the target circuit may be a heat dissipation fan for dissipating heat of the target server, so that under a condition of ensuring an EFT/B anti-interference test of the electronic device, electric energy in the circuit is used for performing auxiliary heat dissipation for the target server, and the electric energy utilization rate of the anti-interference test device is improved.
As an optional embodiment, the anti-interference test device of the electronic device further includes: a processor, wherein the processor is configured to,
the processor is used for being connected with the electronic equipment;
the processor is further configured to obtain a target operation state of the electronic device, where the target operation state is used to characterize an equipment operation condition of the electronic device under a transient pulse group interference generated by the target electromagnetic signal; and determining the anti-interference performance of the electric fast transient pulse group of the electronic equipment according to the target running state.
Optionally, in the embodiment of the present application, the target operation state is an operation state corresponding to a device type of the electronic device, where the device type is different, and the operation state representing anti-interference performance of the electronic device is different, for example, when the electronic device is a computer, the operation state may be a screen display state of the computer and a network connection state of the computer, and when a screen display appears, or when a network connection appears in a screen, or when a network connection appears in a network break, a signal is low, it is determined that the anti-interference performance of the electronic device is lower.
As an alternative embodiment, the processor is further connected to the controller, wherein the processor is further configured to:
transmitting a target instruction to the controller in the case that the performance level of the electric fast transient pulse group anti-interference performance of the electronic device is lower than a target level, wherein the target instruction is used for instructing the controller to adjust the target signal parameter of the target electromagnetic signal transmitted by the signal transmitter;
acquiring running state information of the electronic equipment in the process of changing the target signal parameters of the target electromagnetic signal;
and determining a target component on the electronic equipment according to the running state information, wherein the target component is a component which leads the performance level of the electronic equipment to be lower than the target level.
Optionally, in the embodiment of the present application, the control module adjusts the target signal parameter of the target electromagnetic signal transmitted by the signal transmitter, and obtains the running state information of the electronic device in the process of changing the target signal parameter, so as to locate the target component that causes the performance level of the electronic device to be lower than the target level.
Optionally, in an embodiment of the present application, the target instruction may be used to instruct the controller to sequentially adjust the sub-signal parameters of the sub-electromagnetic signals emitted by each signal emitting unit according to the target timing or the target sequence.
Through the steps, when the performance level of the electronic equipment is determined to be lower than the target performance level, the target component which causes the performance level of the electronic equipment to be lower than the target performance level in the electronic equipment is determined by the mode of adjusting the signal parameters of the electromagnetic signals transmitted by the control signal transmitter through the instruction controller, so that the function of detecting the electronic component with weak anti-interference performance of the electronic equipment is realized through the traditional anti-interference test equipment.
As an alternative embodiment, the processor is further configured to: the controller is controlled to sequentially adjust sub-signal parameters of sub-electromagnetic signals output by the N signal transmitting units according to a target sequence, wherein the signal transmitter comprises N signal transmitting units, and the N signal transmitting units are arranged at different positions around the electronic equipment.
Optionally, in the embodiment of the present application, the manner in which the controller controls and adjusts the signal processing parameters of the sub electromagnetic signals output by the signal transmitting unit may be to sequentially adjust the signal frequency of the sub electromagnetic signals according to a first step size, and/or sequentially adjust the signal strength of the sub electromagnetic signals according to a second step size.
Through the above, the controller sequentially adjusts and controls the sub-new number parameters of the sub-electromagnetic signals output by the N signal transmitting units according to the target sequence, namely, only adjusts the signal parameters of the electromagnetic signals transmitted by one signal transmitting unit at a time, thereby being convenient for finding out the target component with weak anti-interference performance and improving the accuracy of the determined target component.
As an alternative embodiment, the processor is further configured to:
a target signal transmitting unit for determining that the sub-signal parameter of the sub-electromagnetic signal currently output is in an adjusted state under the condition that the operation state information of the electronic equipment is changed;
and determining a component corresponding to the target signal transmitting unit on the electronic equipment as the target component.
Optionally, in the embodiment of the present application, signal parameters of sub electromagnetic signals transmitted by N signal transmitting units are sequentially adjusted, and since irradiation positions of sub electromagnetic signals transmitted by different signal transmitting units on an electronic device are different, when an operation state of the electronic device changes, it can be determined that the change is caused by the sub electromagnetic signal transmitted by the signal transmitting unit that is adjusting the output sub electromagnetic signal parameter at this time, and then a component corresponding to the signal transmitting unit is determined as a target component, so that a target component that causes that anti-interference performance of the electronic device is lower than the target performance is determined according to the operation state of the electronic device in the process of changing the signal parameters of the electromagnetic signal, and accurate positioning of a component with weak anti-interference performance on the electronic device is achieved.
FIG. 6 is an alternative interference test flow chart according to an embodiment of the application, as shown in FIG. 6, comprising at least the following steps:
s601, winding an electronic device to be tested through a power supply line of a motor;
s602, controlling a motor power supply line switch through a controller;
s603, setting the switching frequency of a power supply line switch of the controller;
s604, carrying out EFT interference test on the object to be tested.
In the above embodiment, the anti-interference test device may further be configured with a processor, where the processor is configured to connect with an electronic device to be tested, and the processor is configured to instruct, according to an equipment attribute of the electronic device (such as an equipment use of the electronic device to be tested, an equipment model, an equipment power, etc.), the controller to control the signal transmitter to output a signal parameter of an electromagnetic signal, and on the other hand, enable to obtain a working performance of the electronic device under interference of the electromagnetic signal, thereby determining, according to the working performance, an anti-interference performance of the electronic device, and further, if it is determined that a performance level of the anti-interference performance of the electronic device is lower than a target level, the processor may also determine, by executing a mode of adjusting the signal parameter of the electromagnetic signal transmitted by the signal transmitter, by detecting the performance of the electronic device under interference of the electromagnetic signal of the changed signal parameter, thereby implementing a function of accurately positioning a weak point of the electronic device. FIG. 7 is a flowchart of an alternative electronic component inspection process according to an embodiment of the present application, the method being applied to a processor, as shown in FIG. 7, and comprising at least the steps of:
s701, acquiring the equipment attribute of the electronic equipment to be tested (such as equipment application, equipment model, equipment power and the like of the electronic equipment to be tested), and determining the equipment attribute corresponding to the current equipment information from the equipment information and the equipment attribute with the corresponding relation by a mode of acquiring the equipment information of the electronic equipment;
s702, because of the equipment with different equipment attributes, when the anti-interference test is performed, signal parameters of electromagnetic signals used are different, for example, signal frequencies used by different electronic equipment are different, signal strengths used by different electronic equipment are different, and further after the equipment attributes of the electronic equipment are determined, in order to meet the test requirements of the electronic equipment with the equipment attributes, signal parameters corresponding to the equipment attributes can be determined from the equipment attributes and the signal parameters with corresponding relations, and an instruction signal is sent to a controller to instruct the controller to emit electromagnetic signals with corresponding signal parameters to a control signal emitter;
s703, the processor is used for being connected with the electronic device, so that the processor can acquire the running states of the electronic device, and the dimensions of the running states acquired by different devices are different, for example, when the electronic device is a server, the running states can be network connection states, and when the electronic device is a display device, the running states can be screen display states of the display device;
s704, the running state of the electronic equipment reflects the working performance of the electronic equipment under the transient pulse group interference of electromagnetic signal simulation, and further reflects the anti-interference performance of the electronic equipment, so that the anti-interference performance of the electronic equipment is determined according to the current running state;
s705, detecting whether the current anti-interference level is lower than a target anti-interference level, wherein the target anti-interference level can be set according to requirements, such as according to national standard quality standards;
s706, under the condition that the anti-interference level of the electronic equipment is lower than the target anti-interference level, the processor can execute the detection operation on the weak electronic element on the electronic equipment through the anti-interference test equipment provided by the embodiment of the application, the specific processor can respond to the control instruction by sending the control instruction to the controller, and then the controller can change the electromagnetic interference on the electronic equipment by adjusting the signal parameters of the electromagnetic signals transmitted by the signal transmitting equipment, and the specific execution can be that the signal parameters (such as signal strength, signal frequency and the like) of the sub electromagnetic signals transmitted by the signal transmitting units are sequentially changed according to the target sequence, so that when the signal parameters of one signal transmitting unit are changed, the signal parameters of the sub electromagnetic signals transmitted by other signal transmitting units are fixed;
s707, when the signal parameters of the electromagnetic signals transmitted to the electronic equipment by the signal transmitting unit are adjusted, the target signal transmitting unit which causes the running state of the electronic equipment to change can be determined by acquiring the working performance of the electronic equipment under the electromagnetic signal interference of the changed signal parameters, and then the target electronic element corresponding to the target signal transmitting unit is determined as the element which causes the anti-interference performance level of the electronic equipment to be lower than the target level.
Through the above embodiments. The number of times of rectifying and modifying the EFT anti-interference test by the third party detection mechanism with great labor and financial resources is reduced, the weak point of the object to be tested can be found under the conventional laboratory condition by using the simple mode, the corresponding rectifying and modifying countermeasure is increased, the EFT analysis Debug work is completed, and a great amount of cost can be saved.
It will be appreciated by those skilled in the art that the controller or processor of the application as described above may be implemented in a general purpose computing device, they may be centralized on a single computing device, or distributed over a network of computing devices, they may be implemented in program code executable by computing devices, such that they may be stored in a memory device for execution by the computing devices and, in some cases, the steps shown or described may be performed in a different order than what is shown or described, or they may be implemented as individual integrated circuit modules, respectively, or as individual integrated circuit modules. Thus, the present application is not limited to any specific combination of hardware and software.
The above description is only of the preferred embodiments of the present application and is not intended to limit the present application, but various modifications and variations can be made to the present application by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the principle of the present application should be included in the protection scope of the present application.
Claims (10)
1. An anti-tamper test device for an electronic device, comprising: a signal transmitter and a controller, wherein,
the controller is connected with the signal transmitter;
the signal transmitter is used for transmitting a target electromagnetic signal to the electronic equipment to be tested, wherein the target electromagnetic signal is used for generating transient pulse group interference in a circuit loop of the electronic equipment;
the controller is used for controlling target signal parameters of the target electromagnetic signals according to equipment attributes of the electronic equipment.
2. The apparatus of claim 1, wherein the signal transmitter comprises: n signal transmitting units, wherein,
the N signal transmitting units are respectively connected with the controller and are arranged at different positions around the electronic equipment;
the signal transmitting unit is configured to transmit a sub-electromagnetic signal to a target location on the electronic device, where the target location is a location on the electronic device corresponding to the signal transmitting unit, and the target electromagnetic signal includes the sub-electromagnetic signal;
the controller is configured to control a sub-signal parameter of the sub-electromagnetic signal according to the device attribute of the electronic device, where the target signal parameter includes the sub-signal parameter.
3. The apparatus of claim 2, wherein the signal transmitting unit comprises: a power source, a switch and an electromagnetic coil, wherein,
the first end of the power supply is connected with the first end of the switch, the second end of the power supply is connected with the first end of the electromagnetic coil, the second end of the switch is connected with the second end of the electromagnetic coil, and the controller is connected with the switch;
the power supply is used for supplying power to the electromagnetic coil;
the switch is used for adjusting the on-off state of a target circuit formed between the power supply and the electromagnetic coil;
the electromagnetic coil is used for generating the sub electromagnetic signals which are emitted on the target position;
the controller is used for controlling the target signal frequency of the sub electromagnetic signal by controlling the switch to adjust the on-off state frequency of the target circuit, wherein the sub signal parameter comprises the target signal frequency.
4. A device according to claim 3, wherein the signal transmitting unit further comprises: a coil adjusting member, wherein,
the coil adjusting component is connected with the controller;
the coil adjusting component is used for adjusting the number of turns of the electromagnetic coil in the target circuit;
the controller is used for controlling the target signal intensity of the sub electromagnetic signals in a mode of controlling the coil adjusting component to adjust the coil turns of the electromagnetic coil in the target circuit, wherein the sub signal parameters comprise the target signal intensity.
5. The apparatus of claim 4, wherein the coil adjustment member comprises: a connecting wire, wherein,
a first end of the connection wire is fixed at a first location on the solenoid coil, a second end of the connection wire is connected with the solenoid coil, and the second end of the connection wire is configured to allow movement on the solenoid coil;
the connecting wire is used for adjusting the number of turns of the coil of the electromagnetic coil in a mode of breaking the coil between the first position and the second position, and the second position is a position where the second end of the connecting wire is in contact with the electromagnetic coil.
6. A device according to claim 3, characterized in that a target power consuming element is also connected in series in the target circuit, wherein the target power consuming element is used for controlling the formation of a power consuming loop in the target circuit.
7. The device of claim 1, wherein the tamper resistant test device of the electronic device further comprises: a processor, wherein the processor is configured to,
the processor is used for being connected with the electronic equipment;
the processor is further configured to obtain a target operation state of the electronic device, where the target operation state is used to characterize an equipment operation condition of the electronic device under a transient pulse group interference generated by the target electromagnetic signal; and determining the anti-interference performance of the electric fast transient pulse group of the electronic equipment according to the target running state.
8. The apparatus of claim 7, wherein the processor is further coupled to the controller, wherein the processor is further configured to:
transmitting a target instruction to the controller in the case that the performance level of the electric fast transient pulse group anti-interference performance of the electronic device is lower than a target level, wherein the target instruction is used for instructing the controller to adjust the target signal parameter of the target electromagnetic signal transmitted by the signal transmitter;
acquiring running state information of the electronic equipment in the process of changing the target signal parameters of the target electromagnetic signal;
and determining a target component on the electronic equipment according to the running state information, wherein the target component is a component which leads the performance level of the electronic equipment to be lower than the target level.
9. The apparatus of claim 8, wherein the processor is further configured to: the controller is controlled to sequentially adjust sub-signal parameters of sub-electromagnetic signals output by the N signal transmitting units according to a target sequence, wherein the signal transmitter comprises N signal transmitting units, and the N signal transmitting units are arranged at different positions around the electronic equipment.
10. The apparatus of claim 9, wherein the processor is further configured to:
a target signal transmitting unit for determining that the sub-signal parameter of the sub-electromagnetic signal currently output is in an adjusted state under the condition that the operation state information of the electronic equipment is changed;
and determining a component corresponding to the target signal transmitting unit on the electronic equipment as the target component.
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| CN202310944593.6A CN116953406A (en) | 2023-07-28 | 2023-07-28 | Anti-interference test equipment of electronic equipment |
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| CN202310944593.6A CN116953406A (en) | 2023-07-28 | 2023-07-28 | Anti-interference test equipment of electronic equipment |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117690391A (en) * | 2024-01-18 | 2024-03-12 | 东莞捷璞电子科技有限公司 | Method and electronic device for identifying EFT interference to refresh LCD |
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2023
- 2023-07-28 CN CN202310944593.6A patent/CN116953406A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117690391A (en) * | 2024-01-18 | 2024-03-12 | 东莞捷璞电子科技有限公司 | Method and electronic device for identifying EFT interference to refresh LCD |
| CN117690391B (en) * | 2024-01-18 | 2024-11-22 | 东莞捷璞电子科技有限公司 | Method and electronic device for identifying EFT interference to refresh LCD |
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