CN116203331A - Frequency conversion device noise coefficient testing method and system - Google Patents

Abstract

The invention discloses a method and system for testing the noise coefficient of frequency converter devices. The method includes: constructing a parameter configuration model of the noise coefficient test system of frequency converter devices; wherein the objects of parameter configuration include a test piece and a noise figure test instrument; According to different types of parameter configuration objects, different noise figure test modes of different types of DUTs are formed; based on different noise figure test modes, the noise figure tests of different types of DUTs are completed. At the same time, before the noise figure test of the device under test, it also includes a calibration method for the noise figure test system of the frequency converter. The invention supports the noise figure test of a single frequency conversion device and cascaded frequency conversion links of various frequency conversion mechanisms, solves the problems of complex measurement modes, difficult configuration of parameters, and low test efficiency in the noise figure test of existing frequency conversion devices, simplifies the calibration method, and can Save test time for many types of frequency converter devices.

Description

Method and system for testing noise figure of frequency converter

technical field

The invention relates to the technical field of noise figure testing, in particular to a method and system for testing the noise figure of a frequency converter.

Background technique

Frequency converter noise figure test is one of the important measurement modes in the field of noise figure measurement. With the wide application of noise figure test in radar, navigation, wireless communication and other fields, the demand for testing the noise performance of frequency converter devices is increasing. The DUTs that can be used in the frequency conversion measurement mode include mixers, receivers and transmitters, etc. The DUT can be a single frequency conversion device, or a multi-stage cascaded frequency conversion component or system of multiple frequency conversion systems.

Quick and effective measurement of the noise performance of frequency converter devices is the key to improving the efficiency of noise figure testing of frequency converter devices or systems. However, the noise figure test of frequency converter devices requires complex parameters, including not only the port frequency information of the device under test, such as RF input frequency, IF output frequency, local oscillator frequency, sideband, etc., and also includes information such as the control modes of radio frequency, intermediate frequency, and local oscillator in these ports, and other controls in the system link. There are relatively many measurement configuration conditions for the DUT. And considering the different measurement modes, the combination configuration is more complicated.

Traditional frequency converter noise figure testing only provides a parameter configuration method for primary frequency converters. Among the test parameters that need to be configured, some parameters are more professional and difficult to understand, and require higher technical requirements for testers. Faced with this kind of complex measurement, there is no intuitive configuration guide corresponding to the complicated input parameters, which makes it difficult for testers to start, and it is difficult to configure directly, and it is prone to parameter configuration errors, which in turn lead to wrong measurement results. The accuracy of the noise figure test of the frequency converter is improved. In addition, there is no direct configuration method and measurement method for multi-level cascaded frequency conversion links, which cannot meet the testing requirements for the noise figure of frequency conversion devices.

In addition, the existing noise figure test methods of frequency converters often use the Y factor method. However, before using this method to test the noise figure, it is necessary to calibrate the test system. The calibration includes the type of the device under test, the local oscillator mode of the device under test, Calibration of parameters such as sideband type, DUT frequency (RF, IF and LO) range, frequency mode, etc., for each measurement mode and state of different types of DUTs, calibration is required when performing noise figure measurements. Moreover, the calibration data is only applicable to the measurement state with the same setting, so that the calibration and testing efficiency is low.

Contents of the invention

In order to solve the above-mentioned deficiencies in the prior art, the present invention provides a method and system for testing the noise figure of a frequency conversion device, which supports the noise figure test of a single frequency conversion device and cascaded frequency conversion links of various frequency conversion mechanisms, and integrates and simplifies the measurement of complex parameters. Intuitive configuration, expanding the application range of frequency conversion calibration, effectively reducing the difficulty of measurement and technical requirements for operators, solving the problems of complex measurement modes, difficult configuration of parameters, and low test efficiency in the noise figure test of existing frequency conversion devices, and realizing various frequency conversion Fast, reliable and effective measurement of device noise figure; at the same time, based on the noise figure test of frequency converter devices, the calibration method of the noise figure test system is also given. Only one calibration is required, which can be used for various types of frequency converter devices Save test time and improve the efficiency of noise figure testing of frequency converter devices.

In a first aspect, the present disclosure provides a method for testing the noise figure of a frequency converter.

A method for testing the noise figure of a frequency converter, comprising the following steps:

Construct the parameter configuration model of the noise figure test system of the frequency converter; wherein, the objects of the parameter configuration include the device under test and the noise figure test instrument;

According to the type of DUT, configure the parameters of different parameter configuration objects to form different noise figure test modes for different types of DUTs;

Based on different noise figure test modes, complete the noise figure test of different types of DUTs.

In a further technical solution, the construction of the parameter configuration model specifically includes: grouping and configuring all measurement parameters according to parameter configuration objects according to the connection sequence of the noise figure test and guided by the connection schematic diagram.

In a further technical solution, the parameters of the device under test configuration include: the type of the device under test, frequency conversion series, sideband, LO mode, external LO control state, external LO power, radio frequency input frequency of the device under test, The intermediate frequency output frequency of the device, the local oscillator frequency of the device under test and the conversion value of the local oscillator frequency of the device under test.

In a further technical solution, the noise figure testing instrument includes a test system down-converter and a noise figure analyzer.

In a further technical solution, the parameters of the test system downconverter configuration include: the state of the test system downconverter, the local oscillator frequency of the test system downconverter, the intermediate frequency frequency, sideband, LO mode, External LO Control Status and External LO Power.

In a further technical solution, the parameters configured by the noise figure analyzer include: frequency type, frequency mode and number of scanning points.

In a further technical solution, the type of the device under test includes amplifiers, down converters, up converters and multi-stage cascaded converters.

In a further technical solution, the parameter configuration of different parameter configuration objects is performed according to the type of the tested part, and different noise figure test modes of different types of tested parts are formed, specifically comprising the following steps:

Step 1. Determine whether the device under test is an amplifier, if so, perform step 2, otherwise determine whether the device under test is a down-converter or an up-converter;

If it is judged that the DUT is a down-converter or an up-converter, set the corresponding measurement mode parameters and perform step 3, otherwise, judge whether the DUT is a multi-stage cascaded converter;

If it is judged that the DUT is a multi-level cascaded frequency converter, set the corresponding multi-level cascaded frequency conversion measurement mode parameters, and perform DUT port frequency conversion and link information processing of the DUT, and perform step 3, otherwise perform DUT type Illegal error handling;

Step 2. Determine the state of the frequency converter in the test system. If the state is off, perform the test according to the noise figure of the direct frequency device. Otherwise, set the spread spectrum mode parameters and perform step 4;

Step 3. Determine the status of the frequency converter in the test system. If the status is off, go to step 4; otherwise, set the current spread spectrum parameters and go to step 4;

Step 4. Automatically configure the sideband according to the set parameters, calculate the measurement frequency, set the measurement channel, and measure the noise figure.

A further technical solution is to automatically configure the sidebands according to the set parameters, specifically: based on the frequency relationship between the RF frequency and the local oscillator frequency of the DUT, the noise figure analyzer is used to automatically determine the sideband type of the DUT.

A further technical solution, before performing the noise figure test of the device under test, also includes the calibration of the noise figure test system of the frequency converter, specifically including:

Connect the noise source to the calibration reference plane input port of the noise figure test instrument or test system, perform calibration, and establish the noise calibration reference plane;

Extract the frequency range of the input frequency of the noise calibration reference plane of the noise figure test instrument or test system during calibration as the calibration frequency range;

Connect the DUT to the noise source and the calibration reference plane of the noise figure testing instrument or test system, configure the parameters of the DUT and determine the noise figure test mode of the DUT, and perform the noise figure test;

Obtain the input frequency of the calibration reference plane of the noise figure test instrument or test system in the current test mode, and judge whether the input frequency is within the calibration frequency range. If the input frequency is within the calibration frequency range, the calibration is valid; otherwise, the calibration is invalid. Recalibration.

In a second aspect, the present disclosure provides a noise figure testing system for frequency converters.

A noise figure testing system for frequency converters, comprising:

The parameter configuration model building module is used to construct the parameter configuration model of the frequency converter noise figure test system; wherein, the objects of the parameter configuration include the device under test and the noise figure test instrument;

The noise figure test mode building block is used to configure the parameters of different parameter configuration objects according to the type of the DUT to form different noise figure test modes for different types of DUTs;

The noise figure test module is used to complete the noise figure test of different types of DUTs based on different noise figure test modes.

The above technical scheme has the following beneficial effects:

1. The present invention provides a method for testing the noise figure of a frequency conversion device, which supports the noise figure test of a single frequency conversion device and a cascaded frequency conversion link with multiple frequency conversion mechanisms, integrates and simplifies the intuitive configuration of complex parameters, and expands the application range of frequency conversion calibration. Effectively reduce the complexity of the noise figure measurement of frequency conversion devices and multi-level frequency conversion systems, effectively reduce the difficulty of measurement use and the technical requirements for operators, and solve the problems of complex measurement modes, difficult configuration of parameters and low test efficiency in the noise figure test of existing frequency converter devices To solve the problem, realize the fast, reliable and effective measurement of the noise figure of various frequency converters.

2. The present invention also provides a calibration method for the noise figure test system on the basis of the noise figure test of the frequency converter. By flexibly using the input frequency range of the frequency conversion measurement calibration reference plane, the frequency converter calibration of the Y factor method noise figure measurement is simplified state, which expands the scope of application of the noise figure calibration state in various measurement modes, and improves the efficiency of the noise figure test of frequency converter devices.

Description of drawings

The accompanying drawings constituting a part of the present invention are used to provide a further understanding of the present invention, and the schematic embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute improper limitations to the present invention.

Fig. 1 is the schematic diagram of the parameter configuration model of the frequency converter device noise figure test system described in the embodiment of the present invention;

Fig. 2 is the flowchart of testing method described in the embodiment of the present invention;

Fig. 3 is a connection block diagram of the secondary frequency conversion device in the embodiment of the present invention;

Fig. 4 is the connection block diagram of the down-conversion expansion measurement of the test system in the embodiment of the present invention;

Fig. 5 is a connection block diagram of the calibration test of the frequency converter in the embodiment of the present invention.

Detailed ways

It should be noted that the following detailed description is exemplary and intended to provide further explanation of the present invention. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

It should be noted that the terminology used here is only for describing specific embodiments, and is not intended to limit exemplary embodiments according to the present invention. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and/or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and/or combinations thereof.

Embodiment one

The noise figure measurement mode of the frequency converter in the existing noise figure analyzer is relatively complicated, the measurement parameters are scattered in different setting interfaces, the test is not intuitive and operable, and the terminology of the configuration parameters of the frequency converter and the system is relatively professional. The professional requirements of personnel are high, which makes it difficult for test personnel to successfully complete the required parameter configuration, and even the measurement error of noise figure in frequency conversion mode occurs. In addition, for each different frequency conversion measurement mode, as long as the measurement parameters are changed, the calibration process of the corresponding mode parameters needs to be performed first, and the measurement efficiency is low.

In view of the above problems, this embodiment provides a noise figure testing method for frequency conversion devices, which supports noise figure testing of single frequency conversion devices and cascaded frequency conversion links with multiple frequency conversion mechanisms, integrates and simplifies complex parameter configurations, and effectively reduces noise figure measurements. It is difficult to use, and at the same time, it expands the application of noise figure calibration data in the noise figure test of frequency converter devices, improves test efficiency, and facilitates users to perform fast and accurate noise figure test of frequency converter devices.

This embodiment provides a method for testing the noise figure of a frequency converter, including the following steps:

Construct the parameter configuration model of the noise figure test system of the frequency converter; the objects of the parameter configuration include the device under test and the noise figure test instrument;

According to the type of DUT, configure the parameters of different parameter configuration objects to form different noise figure test modes for different types of DUTs;

Based on different noise figure test modes, complete the noise figure test of different types of DUTs.

The parameter configuration model of the above frequency converter device noise figure test system is shown in Figure 1, which is different from the traditional noise figure analyzer that only lists the input of frequency conversion parameters. The model described in this embodiment is based on the connection sequence of the noise figure test and is guided by the connection diagram , to group and configure all measurement parameters according to parameter configuration objects. Among them, the tester can define the object attribute parameters, and the connection example diagram changes with the definition of the measurement mode parameters. Through the input setting of each parameter in the model, the measurement of different mode noise figures of single-stage up-converter, down-converter, amplifier and multi-stage cascaded converter can be realized.

The configurable measurement connection objects (parameter configuration objects) in the above model are divided into the DUT and the noise figure test instrument, and the noise figure test instrument includes the test system down-converter and the noise figure analyzer. Each group of test parameters is specific Described as follows:

The parameters of the device under test configuration include: the type of the device under test, the number of frequency conversion stages, the sideband, the LO mode, the external LO control state, the external LO power, the RF input frequency of the device under test, and the intermediate frequency output frequency of the device under test , The local oscillator frequency of the DUT and the conversion value of the DUT local oscillator frequency.

Specifically, the type of the DUT under test includes an amplifier (Amplifier), a downconverter (Downconv), an upconverter (Upconv), and a multi-stage converter (Converter); When cascading inverters (Converter), the cascaded frequency conversion series, for example, if the input signal is output through 2 times of frequency conversion cascading, then the frequency conversion series is 2; the sideband refers to the input RF signal and DUT local oscillator signal in the converter The frequency position relationship is divided into lower sideband (LSB), upper sideband (USB) and double sideband (DSB); LO mode refers to when the DUT under test is a non-amplifier (Amplifier), or the DUT under test is an amplifier (Amplifier ) and the state of the frequency converter in the test system is on, the frequency mode of the local oscillator signal (LO) that needs to be mixed, including sweep (Swept) or fixed (Fixed); the external LO control state refers to the external signal that needs to be loaded for frequency mixing Whether the local oscillator signal is remotely controlled by the test instrument, the state includes on or off; the external LO power refers to the external local oscillator power value that needs to be remotely controlled by the test instrument when the external LO control state is open, in units of dBm, in this embodiment set to -10dBm.

The radio frequency input frequency of the DUT, that is, the DUT input (RF), refers to the radio frequency (RF) input frequency of the DUT. According to the selection of the frequency mode, it can be the start frequency and the stop frequency, or it can be a fixed frequency; The intermediate frequency output frequency of the device, that is, the DUT output (IF), refers to the intermediate frequency (IF) output frequency of the device under test. According to the selection of the frequency mode, it can be the start frequency and stop frequency, or a fixed frequency; The local oscillator frequency, that is, DUT (LO), refers to the frequency of the local oscillator signal (LO) of the DUT. When the DUT is a multi-stage cascaded inverter, set each The local oscillator frequency value; the local oscillator frequency conversion value of the DUT, that is, the DUT LO conversion value, refers to whether the local oscillator signal (LO) of the DUT is frequency multiplied or divided before being sent to the internal frequency mixer. The input terminal of the input terminal, where the numerator A represents the frequency multiplication number, and the denominator B represents the frequency division number. For example, the local oscillator signal is sent to the input terminal of the frequency mixer after being multiplied by 2, then the frequency multiplication number A is equal to 2, and the frequency division number B is equal to 1. .

The parameters of the test system downconverter configuration include: the state of the test system downconverter, the local oscillator frequency of the test system downconverter, the intermediate frequency frequency of the test system downconverter, sideband, LO mode, external LO control status and external LO power.

Specifically, the state of the test system downconverter refers to the on or off state of the test system downconverter (System DownConverter); the local oscillator frequency of the test system downconverter, that is, the system downconverter (LO), refers to the test system The local oscillator frequency value of the down converter; the intermediate frequency frequency of the test system down converter, that is, the system down converter (IF), refers to the IF frequency value of the test system down converter; the sideband refers to the input frequency of the test system down converter The frequency position relationship between the RF signal and the local oscillator signal is divided into lower sideband (LSB), upper sideband (USB) and double sideband (DSB); The frequency mode of the vibration signal, including sweep (Swept) or fixed (Fixed); the external LO control state refers to the external LO control state of the test system down-converter, which includes off or on, which determines the external local oscillator of the test system down-converter Whether the signal is input locally or remotely controlled by the instrument; the external LO power refers to the external local oscillator power value that needs to be remotely controlled by the instrument when the external LO control state is on. The unit is dBm, which is set to -10dBm in this embodiment.

The parameters configured by the noise figure analyzer include: frequency type, frequency mode and number of scanning points; frequency type refers to the type of panel input frequency, including: radio frequency input, intermediate frequency input; frequency mode refers to panel input frequency mode, including: scanning , Fixed and List; the number of sweep points refers to the number of frequency points in sweep mode.

The above-mentioned types of DUTs include amplifiers, downconverters, upconverters and multi-stage cascaded inverters. According to the types of DUTs, the parameters of different parameter configuration objects are configured to form different noise figure tests for different types of DUTs. The mode, as shown in Figure 2, specifically includes the following steps:

Step 1. Determine whether the device under test is an amplifier, if so, perform step 2, otherwise determine whether the device under test is a down-converter or an up-converter;

If it is judged that the DUT is a down-converter or an up-converter, set the corresponding measurement mode parameters and perform step 3, otherwise, judge whether the DUT is a multi-stage cascaded converter;

If it is judged that the DUT is a multi-level cascaded frequency converter, set the corresponding multi-level cascaded frequency conversion measurement mode parameters, and perform DUT port frequency conversion and link information processing of the DUT, and perform step 3, otherwise perform DUT type Illegal error handling;

Step 2. Determine the state of the frequency converter in the test system. If the state is off, perform the test according to the noise figure of the direct frequency device. Otherwise, set the spread spectrum mode parameters and perform step 4;

Step 3. Determine the status of the frequency converter in the test system. If the status is off, go to step 4; otherwise, set the current spread spectrum parameters and go to step 4;

Step 4. Automatically configure the sideband according to the set parameters, calculate the measurement frequency, set the measurement channel, and measure the noise figure.

In this embodiment, in addition to the direct tester setting of the "sideband" parameter of the DUT as in the traditional noise figure analyzer, the sideband can also be automatically configured according to the set parameters, specifically: based on the radio frequency RF of the DUT The frequency relationship with the local oscillator LO, using the noise figure analyzer to automatically determine the sideband type of the DUT as lower sideband, upper sideband or double sideband. The sideband parameters do not need to be set separately by testers, which solves the difficulty of noise figure testing caused by technical terms that are difficult for many testers to understand.

In addition to traditional amplifiers, downconverters, and upconverters, the type of DUT under test adds the type of DUT with multi-level cascaded inverters. Through the cascade parameter settings in Figure 1, the model is internally based on the setting information Directly convert the frequency measurement parameters, and check the validity of the input information, so as to realize the direct noise figure measurement of the multi-level cascaded frequency conversion link, as shown in Figure 3, a typical two-stage frequency conversion device connection block diagram.

The above model also expands the scope of use of the test system’s down-converter mode. In addition to setting the test system’s down-converter on state to the spread-spectrum measurement mode in the original amplifier mode, the DUT type of the test device is a down-converter and an up-converter. , Multi-stage cascaded frequency converters can also be referred to the spread spectrum measurement mode, as shown in Figure 4, a typical test system down-conversion expansion measurement connection.

When the type of the DUT under test is a down converter, up converter, or multi-stage cascaded converter, the local oscillator conversion value A/B of the DUT under test in the model can be set separately to determine the local oscillator signal of the DUT under test. Whether the internal frequency of the test piece is multiplied or divided and then sent to the input terminal of the internal frequency mixer, where the numerator A represents the frequency multiplication number, and the denominator B represents the frequency division number, and the values of A and B are 1 by default. In the type of multi-level cascade inverter, according to the frequency conversion cascade number, the frequency conversion link setting of up to 3 cascading levels can be set, and the frequency conversion cascade number setting range is 1 to 3. The relationship between the RF input and intermediate frequency output frequency of the system is calculated step by step according to the frequency conversion mode of each level, so it is necessary to set the input and output parameters of each level in the cascade link, and the frequency conversion mode parameter setting of each level is the same as that of a single frequency conversion The mode setting parameters of the devices are the same, and in this embodiment, each local oscillator source used in this mode can be externally programmed.

The parameter configuration model of the frequency conversion device noise figure test system provided in this embodiment, the noise figure measurement methods of various frequency conversion mechanisms can be customized by the tester, including the noise figure test of a single frequency conversion device and multi-level cascaded frequency conversion links , each DUT can not only be connected to the noise figure analyzer and noise source for direct noise figure measurement, but also can be connected with the system down converter, noise figure analyzer and noise source for direct noise figure measurement. For each frequency conversion DUT, the instrument can complete the automatic measurement of LO fixed or LO scanning mode. Through the integrated configuration interface, complex frequency converter test scenarios can be easily and simply set up, providing repeatable and reliable test results. Based on the different noise figure test modes mentioned above, the noise figure tests of different types of DUTs are completed.

Before the noise figure test of the DUT, it also includes the calibration of the noise figure test system of the frequency converter, flexibly using the noise figure analyzer to calibrate the input frequency range of the reference plane, judging whether the calibration status is valid during the measurement, and expanding the calibration data in the frequency conversion Applicable range of the device noise figure measurement mode. Performing one calibration can save test time for multiple types of frequency converter devices and improve the efficiency of noise figure testing of frequency converter devices or systems.

In the test connection of the calibration and measurement process, when the DUT type is selected as down converter or up converter, during calibration, the output port of the noise source is directly connected to the signal input port of the noise figure test instrument, and the calibration reference plane is located at the noise The signal input port of the coefficient test instrument.

As another implementation, as shown in Figure 5, when the DUT type is selected as the system down-converter on, the noise figure tester and the external system down-converter form a test system, and the signal first enters the system down-converter The signal input port of the device is output to the input port of the noise figure testing instrument through the system down converter. During calibration, the output port of the noise source is connected to the signal input port of the external system down-converter, and the calibration reference plane is located at the signal input port of the external system down-converter. At this time, press the panel calibration button of the noise figure test instrument or the calibration button in the menu to perform a calibration process. After the calibration is completed, the gain normalization display is zero.

The above calibration methods specifically include:

Connect the noise source to the input port where the calibration reference plane of the noise figure test instrument or test system is located, perform calibration, and establish the noise calibration reference plane;

Extract the frequency range of the _input frequency F of the noise calibration reference plane of the noise figure test instrument or test system during calibration as the calibration frequency range;

Connect the DUT to the noise source and the calibration reference plane of the noise figure testing instrument or test system, configure the parameters of the DUT and determine the noise figure test mode of the DUT, and perform the noise figure test;

Obtain the input frequency F _test of the calibration reference plane of the noise figure test instrument or test system in the current test mode, and judge whether the input frequency F _test is within the calibration frequency range of F _calibration . If the input frequency is within the calibration frequency range, calibrate Valid, no need to calibrate again (regardless of whether the parameters of the DUT are changed), otherwise the calibration is invalid and re-calibrated.

The above test method supports the noise figure test of single frequency conversion devices and cascaded frequency conversion links with various frequency conversion mechanisms, integrates and simplifies the intuitive configuration of complex parameters, expands the application range of frequency conversion calibration, and effectively reduces the noise figure of frequency conversion devices and multi-level frequency conversion systems The complexity of measurement can effectively reduce the difficulty of measurement and the technical requirements for operators, solve the problems of complex measurement modes, difficult configuration of parameters, and low test efficiency in the noise figure test of existing frequency converter devices, and realize the control of noise figure of various frequency converter devices Fast, reliable, and effective measurement; at the same time, on the basis of the noise figure test of the frequency converter, the calibration method of the noise figure test system is also given. Only one calibration is performed, which can save test time for various types of frequency converters and improve frequency conversion. Noise figure test efficiency of the device.

Embodiment two

This embodiment proposes a noise figure testing system for frequency converters, including:

The parameter configuration model building module is used to construct the parameter configuration model of the frequency converter noise figure test system; wherein, the objects of the parameter configuration include the device under test and the noise figure test instrument;

The noise figure test mode building block is used to configure the parameters of different parameter configuration objects according to the type of the DUT to form different noise figure test modes for different types of DUTs;

The noise figure test module is used to complete the noise figure test of different types of DUTs based on different noise figure test modes.

The steps involved in the above second embodiment correspond to the first method embodiment, and for specific implementation, please refer to the relevant description of the first embodiment.

The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and changes. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.

Although the specific implementation of the present invention has been described above in conjunction with the accompanying drawings, it is not a limitation to the protection scope of the present invention. Those skilled in the art should understand that on the basis of the technical solution of the present invention, those skilled in the art do not need to pay creative work Various modifications or variations that can be made are still within the protection scope of the present invention.

Claims (10)

1. A method for testing the noise figure of a frequency converter, characterized in that it comprises: Construct the parameter configuration model of the noise figure test system of the frequency converter; wherein, the objects of the parameter configuration include the device under test and the noise figure test instrument; According to the type of DUT, configure the parameters of different parameter configuration objects to form different noise figure test modes for different types of DUTs; Based on different noise figure test modes, complete the noise figure test of different types of DUTs. 2. The method for testing the noise figure of a frequency converter as claimed in claim 1, wherein the construction of the parameter configuration model is specifically: according to the connection sequence of the noise figure test, with the connection schematic diagram as a guide, all measurement parameters are set according to the parameters Configuration objects are configured in groups. 3. The method for testing noise figure of frequency converter devices according to claim 1, wherein the parameters of the device under test configuration include: the type of the device under test, frequency conversion stages, sideband, LO mode, external LO control state , external LO power, the RF input frequency of the DUT, the intermediate frequency output frequency of the DUT, the local oscillator frequency of the DUT and the conversion value of the local oscillator frequency of the DUT; the type of the DUT includes amplifiers, down-conversion Converters, upconverters and multi-level cascaded converters. 4. The method for testing the noise figure of a frequency converter as claimed in claim 1, wherein the noise figure test instrument comprises a test system down-converter and a noise figure analyzer. 5. the frequency converter device noise figure testing method as claimed in claim 4, is characterized in that, the parameter of described test system down-converter configuration comprises: the state of test system down-converter, the local oscillator frequency of test system down-converter, Test system downconverter IF frequency, sideband, LO mode, external LO control status and external LO power. 6. The method for testing the noise figure of a frequency converter according to claim 4, wherein the parameters configured by the noise figure analyzer include: frequency type, frequency mode, and number of sweep points. 7. The method for testing the noise figure of a frequency converter as claimed in claim 1, wherein the parameter configuration of the different parameter configuration objects is carried out according to the type of the tested piece to form different noise figure test modes of different types of tested pieces, Include the following steps: Step 1. Determine whether the device under test is an amplifier, if so, perform step 2, otherwise determine whether the device under test is a down-converter or an up-converter; If it is judged that the DUT is a down-converter or an up-converter, set the corresponding measurement mode parameters and perform step 3, otherwise, judge whether the DUT is a multi-stage cascaded converter; If it is judged that the DUT is a multi-level cascaded frequency converter, set the corresponding multi-level cascaded frequency conversion measurement mode parameters, and perform DUT port frequency conversion and link information processing of the DUT, and perform step 3, otherwise perform DUT type Illegal error handling; Step 2. Determine the state of the frequency converter in the test system. If the state is off, perform the test according to the noise figure of the direct frequency device. Otherwise, set the spread spectrum mode parameters and perform step 4; Step 3. Determine the status of the frequency converter in the test system. If the status is off, go to step 4; otherwise, set the current spread spectrum parameters and go to step 4; Step 4. Automatically configure the sideband according to the set parameters, calculate the measurement frequency, set the measurement channel, and measure the noise figure. 8. The method for testing the noise figure of a frequency converter as claimed in claim 7, wherein the sidebands are automatically configured according to the parameters set, specifically: based on the frequency relationship between the radio frequency frequency of the device under test and the local oscillator frequency, using the noise figure The analyzer automatically determines the sideband type of the DUT. 9. The method for testing the noise figure of a frequency converter as claimed in claim 1, wherein, before performing the noise figure test of the device under test, the calibration of the noise figure test system of the frequency converter is also included, specifically comprising: Connect the noise source to the calibration reference plane input port of the noise figure test instrument or test system, perform calibration, and establish the noise calibration reference plane; Extract the frequency range of the input frequency of the noise calibration reference plane of the noise figure test instrument or test system during calibration as the calibration frequency range; Connect the DUT to the noise source and the calibration reference plane of the noise figure testing instrument or test system, configure the parameters of the DUT and determine the noise figure test mode of the DUT, and perform the noise figure test; Obtain the input frequency of the calibration reference plane of the noise figure test instrument or test system in the current test mode, and judge whether the input frequency is within the calibration frequency range. If the input frequency is within the calibration frequency range, the calibration is valid; otherwise, the calibration is invalid. Recalibration. 10. A frequency converter noise figure testing system, characterized in that it comprises: The parameter configuration model building module is used to construct the parameter configuration model of the frequency converter noise figure test system; wherein, the objects of the parameter configuration include the device under test and the noise figure test instrument; The noise figure test mode building block is used to configure the parameters of different parameter configuration objects according to the type of the DUT to form different noise figure test modes for different types of DUTs; The noise figure test module is used to complete the noise figure test of different types of DUTs based on different noise figure test modes.

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