CN116203323A - Antenna testing method and testing system - Google Patents

Abstract

The present application discloses an antenna test method and a test system. The test method includes: firstly providing an antenna test system, the test system includes a plurality of probes arranged at intervals, a signal processing device, a switch unit, a first signal channel and a plurality of second signal channels , and then the signal processing device controls the switch unit to connect the first signal channel and a plurality of second signal channels to obtain the near-field data collected by the probe, and after fitting the collected near-field data, through the near-far field conversion algorithm Obtain the pattern of the antenna. In this solution, the signal processing device controls the closing of the switch unit to connect the first signal channel and the second signal channel, and the sampling data obtained by the probe can be quickly transmitted to the signal processing device by switching the switch sequence, which effectively improves the Efficiency of Antenna Pattern Tests. At the same time, for the limited-dimensional near-field information collected by the probe, the complete near-field reconstruction is performed to achieve high-precision pattern measurement.

Description

Antenna test method and test system

technical field

The embodiments of the present application relate to the technical field of antenna testing, and in particular, to an antenna testing method and a testing system.

Background technique

With the development of mobile communication technology, the requirements for system capacity and coverage are getting higher and higher. In the fields of synthetic aperture radar and 5G communication antennas, in order to meet the requirements of multi-function, multi-mode, and high adaptability, their design has also become More complex to deal with various working conditions and application scenarios. However, this also greatly increases the testing workload of the phased array antenna. Therefore, it is particularly urgent to improve the test efficiency of the antenna.

At present, the antenna pattern test generally adopts the method of far-field measurement or fully enclosed sampling near-field to test the antenna radiation characteristics. The far-field test has high requirements on the site space, and the antenna installation process also has a certain impact on the test efficiency. Although the traditional near-field test does not require a large site like the far-field test, it still requires the probe or antenna to move or rotate to scan for near-field data collection on closed surfaces. In the process of moving or rotating the probe or antenna, if the "stop and go" movement mode is used, the average speed of the probe will be reduced, resulting in a longer test time. If the "continuous operation" movement mode is used, the test time is significantly shorter than the "stop and go" mode. However, due to the acceleration and deceleration process of the probe operation, the test data will not be used directly due to the problem of test accuracy.

Contents of the invention

The present application provides an antenna testing method and a testing system, which can improve the efficiency of antenna pattern testing and realize fast automatic testing.

In the first aspect, an embodiment of the present application provides an antenna test system for testing the antenna pattern, including: a plurality of probes, arranged at intervals from the antenna, for collecting near-field data of the antenna, the multiple The probes are arranged at intervals; a signal processing device, a switch unit, a first signal channel and a plurality of second signal channels, the switch unit is electrically connected to the signal processing device through the first signal channel, and the plurality of second signal channels are electrically connected to each other. The signal channels are electrically connected between the plurality of probes and the switch unit in one-to-one correspondence; the signal processing device is used to control the switch unit according to the parameters of the antenna, so that the plurality of second The signal channels are all connected to the first signal channel, and the near-field data collected by the probe are acquired and processed to obtain a pattern of the antenna.

In this solution, multiple probes set at intervals are set in the antenna test system, and the probes are controlled by the signal processing device and the switch unit to sample the near-field data of the antenna, so that during the antenna test process, only the timing switching of the switch unit is required. It can sample the electric field data at different positions near the antenna. Compared with the method of moving the probe or antenna to different positions for sampling, it effectively improves the sampling efficiency and the accuracy of the sampling results, and the signal processing device automatically obtains the data of the antenna Direction diagram, eliminating the need for manual intervention, so that the entire testing process can be completed automatically and quickly.

In a possible implementation manner, a plurality of the probes are arranged at intervals in turn to form a ring probe array, the center of the area surrounded by the ring probe array is used to place the antenna, and the plurality of probes of the ring probe array are used for Obtain the azimuth plane sampling data of the antenna. In this solution, multiple probes are arranged at intervals to form a circular probe array, and the antenna is arranged in the central area surrounded by the circular probe array, thereby realizing the purpose of sampling the near-field data of the azimuth plane of the antenna.

In a possible implementation manner, the shortest distance between the probes of the annular probe array and the near-field sampling reference plane of the antenna is less than or equal to half of the working wavelength of the antenna. When the shortest distance between the probes of the ring probe array and the near-field sampling reference surface of the antenna is greater than half of the working wavelength of the antenna, the probes of the ring probe array are outside the working frequency band of the antenna, so effective sampling cannot be performed. In this scheme, the shortest distance between the probes of the ring probe array and the near-field sampling reference surface of the antenna is less than or equal to half of the test working wavelength of the antenna, so that multiple probes of the ring probe array can obtain the antenna's position on the azimuth plane. valid data.

In a possible implementation manner, the antenna testing system includes an annular support, on which a plurality of probes are fixed and arranged as the annular probe array. In this solution, by setting a ring bracket in the antenna test system and fixing multiple probes on the ring bracket, the purpose of arranging multiple probes in a ring probe array can be achieved. In addition, the ring bracket is used to fix the probe, so that the stability and reliability of the antenna test system are high. At the same time, by designing the radius of the ring bracket, antennas of different sizes can also be matched.

In a possible implementation manner, a plurality of the probes are arranged at intervals in turn to form a linear probe array, and the linear probe array is used to obtain axial sampling data of the antenna. In this solution, multiple probes are arranged into a linear probe array, and multiple probes on the linear probe array all sample the antenna to obtain axial sampling data of the antenna. And multiple probes are arranged at intervals to avoid signal interference between two adjacent probes.

In a possible implementation manner, the arrangement direction of the linear probe array is the first direction, and the minimum distance in the second direction between the linear probe array and the center position of the antenna is less than or equal to the half of the working wavelength of the antenna, and the second direction is perpendicular to the first direction. When the minimum distance in the second direction between the linear probe array and the central position of the antenna is greater than half of the working wavelength of the antenna, the probes arranged in the linear probe array are outside the working frequency band of the antenna, so effective sampling cannot be performed. In this solution, the minimum distance in the second direction between the linear probe array and the center position of the antenna is less than or equal to half of the working wavelength of the antenna, so that multiple probes arranged in the linear probe array can obtain the test of the antenna Valid data of the radiation signal in the first direction.

In a possible implementation manner, the antenna testing system includes a fixed rod, on which a plurality of probes are fixed and arranged as the linear probe array. In this solution, the probe is fixed by setting the fixing rod so that the probe forms a linear probe array, and the structural stability is high. At the same time, by designing the length of the fixing rod, the effect of matching the probes of the linear probe array with antennas of different sizes can be achieved.

In a possible implementation manner, the antenna testing system includes an annular support and a fixed rod, the fixed rod extends along a first direction, the fixed rod is fixedly connected to the annular support, the fixed rod and the The minimum distance between the centers of the annular supports in the second direction is equal to the inner diameter of the annular supports, the second direction is perpendicular to the first direction, and part of the probes are arranged as an annular probe array on the annular supports , some of the probes are arranged as a linear probe array on the fixed rod. In this solution, the antenna test system is equipped with a ring bracket and a fixed rod at the same time, and by connecting the fixed rod with the ring bracket, and then fixing multiple probes on the fixed rod and the ring bracket respectively, the antenna test system can be equipped with a ring at the same time. Probe array and linear probe array, and high structural stability.

In a possible implementation manner, each of the probes is provided with a corresponding first mark, and the switch unit includes a plurality of switch ports, and each of the plurality of switch ports is provided with a first mark corresponding to the first mark. Corresponding to the second flag, the main controller determines the second flag according to the first flag, so as to control the switch port to close. In this scheme, by setting one-to-one correspondence between the first mark and the second mark on the probe and the switch port, since the main controller is electrically connected to the switch port, by controlling the switch port of the corresponding mark to be closed, the corresponding mark can be achieved. The probe starts sampling purpose.

In a second aspect, the present application provides an antenna testing method for testing the antenna pattern, including: providing an antenna testing system, including a plurality of probes arranged at intervals, a signal processing device, a switch unit, a first signal channel and a plurality of The second signal channel, the switch unit is electrically connected to the signal processing device through the first signal channel, and a plurality of the second signal channels are electrically connected to a plurality of the probes and the switch unit in one-to-one correspondence between;

placing the antenna in the antenna test system, the antenna is spaced apart from the plurality of probes;

The signal processing device controls the switch unit to communicate with the first signal channel and the plurality of second signal channels, so as to acquire and process the near-field data collected by the probe, so as to obtain the pattern of the antenna.

This solution adopts the method of connecting the first signal channel and the second signal channel by controlling the closing of the switch unit through the signal processing device, and the purpose of quickly transmitting the sampling data obtained by the probe to the signal processing device can be achieved through switching the switch sequence, which is effective Greatly improve the efficiency of antenna pattern test.

In a possible implementation manner, the near-field data is azimuth plane sampling data of the antenna and axial sampling data of the antenna. By sampling the azimuth plane data and axial data of the antenna, the signal processing device can convert and obtain the antenna pattern according to the sampled data.

In a possible implementation manner, controlling the switch unit to communicate with the first signal channel and the plurality of second signal channels through the signal processing device includes:

The main controller determines the first mark of the probe according to the test parameters;

The switch unit includes a plurality of switch ports, and the main controller determines a second mark corresponding to the plurality of switch ports according to the first mark;

The main controller controls all the corresponding switch ports to close according to the second flag.

The probe and the switch port are provided with one-to-one corresponding marks, and the main controller controls the closing of the switch port according to the corresponding relationship between the first mark and the second mark, so that the main controller can accurately control the probe at the corresponding position to perform sampling.

In a possible implementation manner, the controlling by the main controller to close the corresponding plurality of switch ports according to the second flag includes:

The main controller controls the plurality of switch ports to be closed simultaneously; or,

The main controller controls the multiple switch ports to be closed in sequence.

When the main controller controls multiple switch ports to be closed sequentially, there is a certain time interval between multiple probes transmitting data, which is beneficial to ensure the stability of the test and the accuracy of data reception; when the main controller controls multiple switch ports to be closed at the same time, Multiple probes transmit the sampling data to the signal processing device at the same time, which is beneficial to shorten the sampling time and improve the test efficiency.

In a possible implementation manner, the signal processing device acquiring and processing the near-field data collected by the probe to obtain the antenna pattern includes:

Establish a three-dimensional cylindrical coordinate system;

The main controller converts the axial sampling data and the azimuth plane sampling data into three-dimensional cylindrical near-field data through a one-dimensional near-field reconstruction three-dimensional near-field algorithm;

The main controller further converts the three-dimensional cylindrical near-field data into a vertical plane pattern and a horizontal plane pattern of the far field through a cylindrical near-far field conversion algorithm.

In a possible implementation manner, the establishment of a three-dimensional cylindrical coordinate system includes:

Taking the axis center of the antenna as the coordinate origin;

The antenna includes a plurality of antenna ports, and the arrangement direction of the plurality of antenna ports is defined as the X axis;

Define mutually orthogonal directions in a plane perpendicular to the X-axis as Y-axis and Z-axis.

Establishing a three-dimensional coordinate system in the above manner is beneficial to integrating the axial sampling data and the azimuth plane sampling data into the same coordinate system, so as to achieve the purpose of obtaining the antenna pattern according to the one-dimensional sampling data.

In a possible implementation, the antenna pattern test method further includes:

The signal processing device sets the test parameters of the antenna, and determines whether to adjust the separation distance of the probes according to the test parameters. Before starting the test, the signal processing device predicts the test parameters of the antenna, and adjusts the probe in time, avoiding the problem of test failure caused by the mismatch between the antenna and the test system.

Description of drawings

FIG. 1 is a schematic structural diagram of an antenna testing system provided by the present application in some embodiments;

FIG. 2 is a schematic structural diagram of the switch unit shown in FIG. 1 in some embodiments;

Fig. 3 is a schematic structural diagram of another possible embodiment of the switch unit shown in Fig. 1;

Fig. 4 is a schematic diagram of the installation structure of the antenna test system shown in Fig. 1 in some embodiments;

FIG. 5 is a schematic structural diagram of another possible embodiment of the antenna testing system provided by the present application;

Fig. 6 is a structural schematic diagram of the antenna testing system shown in Fig. 5 at another angle;

Fig. 7 is a flowchart of the antenna testing method provided by the present application;

Fig. 8 is a one-dimensional test data diagram using the antenna test method shown in Fig. 7;

Fig. 9 is a three-dimensional test data diagram reconstructed by the antenna test method shown in Fig. 7;

Fig. 10 is a vertical plane pattern of the far field of the antenna obtained by the antenna test method shown in Fig. 7;

FIG. 11 is a horizontal plane pattern of the far field of the antenna obtained by using the antenna testing method shown in FIG. 7 .

Detailed ways

Embodiments of the present application are described below with reference to the drawings in the embodiments of the present application.

Please refer to FIGS. 1 to 3 together. FIG. 1 is a schematic structural diagram of some embodiments of the antenna test system provided by the embodiment of the present application, and FIG. 2 is a schematic structural diagram of the switch unit shown in FIG. 1 in some embodiments. Fig. 3 is a schematic structural diagram of another possible embodiment of the switch unit shown in Fig. 1 . The antenna testing system is used to test the radiation pattern of the antenna 20 . The antenna 20 includes a plurality of antenna ports 21 arranged in an array along a first direction X, each antenna port 21 is provided with at least one corresponding probe 10 , and the first direction X is the axial direction of the antenna 20 . The probe 10 can be a single-polarization probe or a dual-polarization probe. The polarization position relationship of the probe can be a horizontal + vertical polarization mode, or a ±45° polarization mode, so as to obtain the radiation near-field data near the corresponding antenna port 21. Correspondingly, the method of obtaining the near-field data can be It may be single-polarization collection or dual-polarization collection, and the radiation near-field data is the amplitude and phase data of the tangential electric field at the antenna port 21 .

The antenna test system further includes a signal processing device 30 , a switch unit 40 , a first signal channel 51 and a plurality of second signal channels 52 . The first signal channel 51 is realized by a cable, which includes opposite first ends 511 and second ends 512, the first end 511 is electrically connected to the signal processing device 30, the second end 512 is electrically connected to the switch unit 40, and the signal processing device 30 and the switch unit 40 implement signal transmission through the first signal channel 51 . Similarly, the second signal channel 52 can also be realized by cables, and each second signal channel 52 includes opposite third ends 521 and fourth ends 522, the third end 521 is electrically connected to the switch unit 40, and the fourth end 522 is correspondingly connected to one probe 10 , and the switch unit 40 communicates with the probe 10 through the second signal channel 52 . Wherein, the number of the second signal channel 52 is the same as the number of the probes 10, that is, each probe 10 is communicated with the switch unit 40 through a second signal channel 52, so that the signal transmission between the probe 10 and the switch unit 40 It can be independently controlled to avoid mutual interference of sampling signals between any two probes 10 .

The signal processing device 30 includes a main controller 31 , a signal transmitter 32 and a data processor 33 , the signal transmitter 32 is connected to the antenna 20 to provide a signal source for the antenna 20 so that the antenna 20 can transmit signals. The main controller 31 is electrically connected to the switch unit 40 to control the switch unit 40 to close. The switch unit 40 includes a plurality of switch ports K, and the plurality of probes 10 are provided with first marks corresponding to each other, and the position information of the plurality of probes 10 is stored in the main controller 31 in the form of the first marks. The plurality of switch ports K are correspondingly provided with second marks one by one, and the information of the plurality of switch ports K is stored in the main controller 31 in the form of the second marks. When the antenna test system starts testing, the signal transmitter 32 sends a signal to the antenna 20, and the main controller 31 closes the switch unit 40, thereby connecting the second signal channel 52 and the first signal channel 51 corresponding to the probe 10, and the probe 10 detects to the amplitude and phase data of the electric signal in the near field area of the antenna 20 , and transmit the sampled amplitude and phase data to the data processor 33 . The data processor 33 includes a conversion algorithm. When the signal processing device 30 receives the sampling signal, the data processor 33 processes the sampling data, and converts the sampling data into an antenna pattern through the conversion algorithm.

Referring to FIG. 2 , this embodiment is described by taking the number of probes 10 as 4 and multiple switch ports K being cascaded as an example. When the antenna test system includes four probes 10, the probes 10 are marked as probe 1, probe 2, probe 3 and probe 4 in sequence according to their arrangement order, then there are 4 switch ports K correspondingly, and the 4 switch ports K are marked respectively K1, K2, K3 and K4, wherein, the switch port K1 is connected to the main controller 31 and the probe 1, the switch port K2 is connected to the probe 1 and the probe 2, the switch port K3 is connected to the probe 2 and the probe 3, and the switch port K4 is connected to the probe 3 and the probe 3. Probe 4. When the main controller 31 controls the switch port K1 to close, the second signal channel 52 corresponding to the probe 1 communicates with the first signal channel 51 , and the probe 10 starts the sampling program and sends the sampled data to the data processor 33 . The switch program is stored in the main controller 31, and by running the switch program, the switch port K1, the switch port K2, the switch port K3 and the switch port K4 can be connected in sequence, so that the probe 1, the probe 2, the probe 3 and the probe 4 obtain The sampled data are sequentially sent to the data processor 33 . In addition, since the plurality of switch ports K of the antenna test system are all provided with the second signal channel 52 correspondingly, the control program can also control the simultaneous closing of the plurality of switch ports K, and the samples obtained by the plurality of probes 10 The data is transmitted to the data processor 33 at the same time. By making multiple probes 10 simultaneously transmit sampling data to the data processor 33 for processing, the testing efficiency of the probes 10 can be effectively improved and the testing time can be shortened.

It can be understood that when the number of probes 10 is n, the n probes 10 are marked as probe 1, probe 2 ... probe n in one-to-one correspondence, and the plurality of switch ports K are marked as switch ports K1, Switch port K2 ... switch port Kn, the control method of which is the same as the control method of the above four probes 10, until all the n probes have obtained the data near the antenna 20, the current round of testing stops sampling.

In some possible embodiments, please refer to FIG. 1 and FIG. 3 , the switch unit 40 is a single-pole multi-throw switch, which includes a knife head 41 and a plurality of switch ports K, and the plurality of switch ports K are respectively connected to a plurality of probes 10 . Similarly, in this embodiment, taking the number of probes 10 as four as an example, they are marked as probe 1, probe 2, probe 3 and probe 4 in order of arrangement, and multiple switch ports k are correspondingly marked as switch port K1 and switch port K2 , switch port K3 and switch port K4. When the antenna test system starts testing, the main controller 31 controls the cutter head 41 to contact the switch port K1, the switch port K2, the switch port K3 and the switch port K4 in turn, so as to communicate with the probe 1, the probe 2, the probe 3 and the probe 4 The second signal channel 52 in turn communicates with the first signal channel 51, so as to send the sampling data acquired by a plurality of probes 10 to the data processor 33 in sequence.

In this solution, a plurality of probes 10 arranged at intervals are set in the antenna testing system, and the probes 10 are controlled by the signal processing device 30 and the switch unit 40 to sample the near-field data of the antenna 20, so that in the antenna testing process, only through The timing switching of the switch unit 40 can sample the electric field data at different positions near the antenna 20. Compared with the method of moving the probe 10 or the antenna 20 to different positions for sampling, the sampling efficiency and the accuracy of the sampling results are effectively improved. , and the antenna pattern is automatically obtained by the signal processing device 30 , eliminating the need for manual intervention, so that the entire testing process can be automatically and quickly completed.

In some embodiments, please refer to FIG. 1, the antenna 20 includes a plurality of antenna ports 21, the plurality of antenna ports 21 are arranged along the first direction X, and the plurality of probes 10 are arranged at intervals in turn as a linear probe array L1, a linear probe array L1 and The minimum distance D2 between the center positions of the antennas 20 in the second direction Y is less than or equal to half of the working wavelength of the antennas 20 , and the linear probe array L1 is used to acquire axial sampling data of the antennas 20 . Wherein, the first direction X is defined as the axial direction of the antenna 20 , the center position of the antenna 20 is the midpoint of the antenna 20 in the axial direction, and the second direction Y is perpendicular to the first direction X. When the minimum distance D2 in the second direction Y between the linear probe array L1 and the central position of the antenna 20 is greater than half of the working wavelength of the antenna 20, the linear probe array L1 is outside the working frequency band of the antenna 20, causing the probe 10 Unable to take valid sampling. In this solution, the minimum distance D2 in the second direction Y between the linear probe array L1 and the center position of the antenna 20 is less than or equal to half of the working wavelength of the antenna 20, so that the multiple probes 10 of the linear probe array L1 Both can acquire effective data of the test radiation signal of the antenna 20 in the first direction X.

In the linear probe array L1, the intervals between a plurality of probes 10 can be the same or different. In this embodiment, the intervals between two adjacent probes 10 are D1, and D1 can be based on the size of the antenna 20, the working Frequency band and other real-time adjustments. By making the distances between adjacent two probes 10 equal, the multiple probes 10 on the linear probe array L1 can be equidistantly distributed along the axial direction of the antenna 20 in the near field area of the antenna 20, so that the near field of the antenna 20 The signals in the field area can be fully detected, which also makes the signals of each probe 10 closer, which is beneficial to improve the efficiency of the subsequent data processor 33 in processing the axial sampling data. In this solution, the plurality of probes 10 are arranged into a linear probe array L1, and the plurality of probes 10 on the linear probe array L1 all sample the antenna 20 to obtain the axial sampling data of the antenna 20. Moreover, a plurality of probes 10 are arranged at intervals to avoid signal interference between two adjacent probes 10 .

In some embodiments, please refer to FIG. 1 and FIG. 4 , and FIG. 4 is a schematic diagram of the installation structure of the antenna testing system shown in FIG. 1 in some embodiments. A plurality of probes 10 are also arranged at intervals in turn to form a circular probe array L2, the plane surrounded by the circular probe array L2 is the azimuth plane of the antenna 20, and the antenna 20 is arranged in the central area of the azimuth plane. Specifically, the ring probe array L2 encloses a circular azimuth plane, and the center of the antenna 20 coincides with the center of the circular azimuth plane. The multiple probes 10 of the ring probe array L2 are used to acquire the sampling data of the azimuth plane of the antenna 20 . Similarly, the plurality of probes 10 of the annular probe array each have a first marker probe 1', probe 2'...probe n'. When the antenna testing system starts testing, the main controller 31 controls the corresponding switch ports K to be sequentially closed, so as to sequentially send the sampling data acquired by the plurality of circularly arranged probes 10 to the data processor 33 . In this solution, a plurality of probes 10 are arranged at intervals to form a circular probe array L2, and the antenna 20 is arranged in the central area surrounded by the circular probe array L2, thereby realizing the purpose of sampling the near-field data of the azimuth plane of the antenna 20.

In addition, please refer to FIG. 6 , which is a structural diagram of the antenna testing system shown in FIG. 5 at another angle. The shortest distance D3 between the probes 10 of the annular probe array L2 and the near-field sampling reference plane of the antenna 20 is less than or equal to half of the working wavelength of the antenna 20 . Wherein, during the near-field test of the antenna 20, the sampling range needs to be determined according to actual sampling requirements. The near-field sampling reference surface of the antenna 20 in this application is a virtual cylinder obtained by mathematical analysis, and the virtual cylinder is the smallest cylinder surrounding the antenna 20 with the antenna port 21 to be detected as the center. When the shortest distance D3 between the probe 10 of the annular probe array L2 and the near-field sampling reference plane of the antenna 20 is greater than half of the operating wavelength of the antenna 20, the probe 10 of the annular probe array L2 is outside the operating frequency band of the antenna 20, thereby Unable to take valid sampling. In this scheme, the shortest distance D3 between the probe 10 of the ring probe array L2 and the near-field sampling reference surface of the antenna 20 is less than or equal to half of the working wavelength of the antenna 20, so that the plurality of probes 10 arranged in the ring probe array L2 are all Effective data of the antenna 20 on the azimuth plane can be acquired.

In some embodiments, please refer to FIG. 4 and FIG. 5 , and FIG. 5 is a schematic structural diagram of another possible embodiment of the antenna testing system provided by the present application. The antenna test system includes a fixed rod 61 , the center of the antenna 20 is aligned with the center of the fixed rod 61 , and the vertical distance between the fixed rod 61 and the antenna 20 is less than or equal to half of the working wavelength of the antenna 20 . A plurality of probes 10 are fixed on the fixed rod 61 at intervals, and form a linear probe array L1. In this solution, the probe 10 is fixed by setting the fixing rod 61, so that the probe 10 forms a linear probe array L1, which has high structural stability. At the same time, by designing the length of the fixing rod 61 , the effect of matching the probes 10 of the linear probe array L1 with the antennas 20 of different sizes can be achieved.

In some embodiments, please refer to FIG. 4 and FIG. 6 , the antenna testing system includes a ring support 62 , and the center of the antenna 20 is set at the center of the ring support 62 . On the inner surface of the ring support 62 opposite to the antenna 20 , a plurality of fixed portions 621 are arranged at intervals for mounting a plurality of probes 10 . The fixing part 621 can use fixing parts such as bolts, or can also be glue or the like to fix the probe 10 on the ring support 62 . In this embodiment, the distance between any two adjacent fixed parts 621 is equal, so that the probes 10 are evenly distributed on the azimuth plane of the antenna 20, so that the signal of the antenna 20 on the azimuth plane can be fully detected, which is beneficial Improve the efficiency of the antenna test system in processing the sampling data of the azimuth plane. In this solution, the probe 10 is installed and fixed by setting the ring bracket 62, so that a plurality of probes 10 are arranged at intervals to form a ring probe array, and the antenna 20 is arranged in the central area surrounded by the ring probe array L2, so that the azimuth plane of the antenna 20 can be realized. sampling of near-field data.

In some embodiments, please refer to Fig. 1, Fig. 4 and Fig. 5, the antenna test system not only includes a fixed rod 61, but also includes a ring support 62, and some probes 10 are arranged as a linear probe array L1 on the fixed rod 61, and the linear array probe The array L1 is used to obtain the sampling data of the azimuth plane of the antenna. Part of the probes 10 are arranged on the ring support 62 as a ring probe array L2, and the ring probe array L2 is used to acquire axial sampling data of the antenna. The fixed rod 61 extends along the first direction X and is fixedly connected to the ring bracket 62 . In this embodiment, the center of the fixing rod 61 is fixed on the ring bracket 62, so that the center of the linear probe array L1 coincides with the edge of the ring probe array L2, so that the antenna 20 is located at the geometric center of the entire antenna testing system. The minimum distance D2 between the fixed rod 61 and the center of the annular support 62 in the second direction Y is equal to the inner diameter of the annular support 62, wherein the inner diameter of the annular support 62 is usually the lower limit of the radiation test frequency of the antenna 20 in the near-field test engineering. 3 to 5 wavelengths, the second direction Y is perpendicular to the first direction X. In this solution, a fixed rod 61 and an annular bracket 62 are installed in the antenna test system at the same time, and the fixed rod 61 is fixedly connected to the annular bracket 62, and then a plurality of probes 10 are respectively fixed on the fixed rod 61 and the annular bracket 62. The antenna test system is provided with both the linear probe array L1 and the circular probe array L2, and has high structural stability.

Please refer to FIG. 1 and FIG. 7 together. FIG. 7 is a flow chart of the antenna testing method provided by the present application. The present application also provides a method for testing an antenna diagram, including:

Step S1: An antenna test system is provided, including a plurality of probes 10 arranged at intervals, a signal processing device 30, a switch unit 40, a first signal channel 51 and a plurality of second signal channels 52, and the switch unit 40 communicates with the first signal channel 51 and The signal processing device 30 is electrically connected, and a plurality of second signal channels 52 are electrically connected between the plurality of probes 10 and the switch unit 40 in a one-to-one correspondence;

Step S2: Place the antenna 20 at the geometric center of the antenna test system, where the antenna 20 is spaced from a plurality of probes 10 ; wherein the antenna test system further includes a test table 70 for placing the antenna 20 .

Step S3: The signal processing device 30 sets the test parameters of the antenna, and determines whether to adjust the distance between the probes 10 according to the test parameters of the antenna 20 .

The signal processing device 30 includes a main controller 31, the antenna 20 includes a plurality of antenna ports 21, and the main controller 31 can be realized by using a network analyzer. Because the interval between the probes 10 of the antenna test system needs to match the relevant parameters of the antenna 20 to sample normally, therefore, before starting the test program, the frequency corresponding to the antenna port 21, the length of the antenna 20 and the length of the antenna 20 need to be Test parameters such as width are input into the network analyzer, and the network analyzer judges whether the interval of the probes 10 meets the sampling requirements according to the aforementioned test parameters. When the intervals of the probes 10 do not meet the sampling requirements, the position of the probes 10 needs to be adjusted; When the interval meets the sampling requirements, the test program is started. Before starting the test, the signal processing device 30 predicts the test parameters of the antenna 20 to adjust the probe 10 in time, avoiding the problem of test failure caused by the mismatch between the antenna 20 and the test system.

Step S4: After the test program is started, the signal processing device 30 controls the switch unit 40 to connect the first signal channel 51 and a plurality of second signal channels 52 to obtain and process the near-field data collected by the probe 10, the near-field data being the antenna 20 The azimuth sampling data of the antenna 20 and the axial sampling data of the antenna 20.

Step S5: The signal processing device 30 obtains the pattern of the antenna 20 according to the azimuth sampling data and the axial sampling data of the antenna 20 .

In this solution, the signal processing device 30 controls the closing of the switch unit 40 to connect the first signal channel 51 and the second signal channel 52, and the sampling data obtained by the probe 10 can be quickly transmitted to the signal processing device by switching the switch sequence. The purpose of the device 30 is to effectively improve the efficiency of antenna pattern testing.

In some embodiments, please refer to FIG. 1 and FIG. 7 , in step S4, controlling the switch unit 40 to communicate with the first signal channel 51 and multiple second signal channels 52 through the signal processing device 30 includes:

Step S41 : the main controller 31 determines the first mark of the probe 10 . In this embodiment, determining the first mark of the probe 10 includes determining the first mark of a certain probe 10 on the linear array probe array L1, and storing the mark information in the main controller 31, and then sequentially determining the first mark of the linear array probe array L1. The first marking information of other probes 10 on L1 up to the first marking information of all probes 10 on the linear array probe array L1 are all sequentially stored in the main controller 31 . At the same time, it also includes determining the first mark of a certain probe 10 on the ring probe array L2 and storing the mark information in the main controller 31, and then sequentially determining the first marks of other probes 10 on the ring probe array L2 until the ring The first label information of all the probes 10 on the probe array L2 is stored in the main controller 31 sequentially.

Step S42: the switch unit 40 includes a plurality of switch ports 41, and the main controller 31 sequentially determines the second marks corresponding to the switch ports 41 according to the first marks.

Step S43: The main controller 31 controls all the corresponding switch ports 41 to close according to the second flag.

When sampling the axial direction of the antenna 20, the corresponding switch ports 41 are controlled to be closed sequentially or simultaneously according to the second mark corresponding to the line array probe array L1 until all the switch ports 41 corresponding to the line array probe array are all closed, so that the line All probes 10 on the array probe array L1 sample the antenna 20 to obtain axial sampling data.

When sampling the azimuth plane of the antenna 20, the corresponding switch port 41 is controlled to be closed sequentially or simultaneously according to the second mark corresponding to the annular probe array L2, until all the probes 10 arranged in a ring realize the sampling of the azimuth plane of the antenna 20, so as to Obtain azimuth sampling data. When main controller 31 controls multiple switch ports K to be closed in time sequence, there is a certain time interval between multiple probes 10 transmitting data, which is conducive to ensuring the stability of the test and the accuracy of data reception; when main controller 31 controls multiple switch ports When K is closed at the same time, multiple probes 10 transmit the sampling data to the signal processing device 30 at the same time, which is beneficial to shorten the sampling time and improve the test efficiency.

In addition, by setting the probe 10 and the switch port K with one-to-one corresponding marks, and making the main controller 31 control the closing of the switch port K according to the corresponding relationship between the first mark and the second mark, the main controller 31 can accurately control The probe 10 at the corresponding position performs sampling.

In some embodiments, please refer to FIG. 1 and FIG. 7. In step S5, the signal processing device 30 obtains the antenna pattern according to the azimuth plane sampling data and the axial sampling data of the antenna, including:

Step S51, establishing a three-dimensional cylindrical coordinate system, specifically:

Take the axis of the antenna 20 as the coordinate origin;

The antenna 20 includes a plurality of antenna ports 21, and the arrangement direction of the plurality of antenna ports 21 is defined as the X axis;

Define mutually orthogonal directions in a plane perpendicular to the X axis as the Y axis and the Z axis.

By adopting the above method to establish a three-dimensional cylindrical coordinate system, it is beneficial to integrate the axial sampling data and the azimuth sampling data into the same coordinate system, and facilitate the conversion of one-dimensional sampling data into three-dimensional data.

Step S52: The main controller 31 converts the axial sampling data and azimuth plane sampling data into three-dimensional cylindrical near-field data through a one-dimensional near-field reconstruction three-dimensional near-field algorithm;

Step S53: The main controller 31 further converts the three-dimensional cylindrical near-field data into a vertical plane pattern and a horizontal plane pattern of the far field through a cylindrical near-far field conversion algorithm.

Please refer to FIG. 8 and FIG. 9. FIG. 8 is a one-dimensional test data diagram using the antenna test method shown in FIG. 7, and FIG. 9 is a reconstructed three-dimensional test data diagram using the antenna test method shown in FIG. 7. The plane coordinate system in Fig. 8 is the rectangular surface expansion diagram of the one-dimensional sampling data in the three-dimensional cylindrical coordinate system, the abscissa of the three-dimensional cylindrical coordinate system is the axial direction of the antenna 20, and the Y axis and the Z axis constitute the azimuth plane of the antenna 20 . In this embodiment, the one-dimensional sampling is sampling along the X-axis with a fixed azimuth angle, and sampling along the azimuth plane with a fixed X-axis position for one revolution to obtain black point sampling data as shown in FIG. 7 .

The main controller 31 includes a set of algorithms for reconstructing three-dimensional data based on one-dimensional data. The algorithm uses V(φ, l) to indicate that the azimuth plane is φ (where φ∈[-180°, 179°]), and the axial position is The three-dimensional near-field measurement tangent voltage at l (where l∈[-L/2, L/2]), the one-dimensional sampling data is expressed as:

Axial sampling data is represented by V(0, l), l∈[-L/2, L/2];

Azimuth plane sampling data is represented by V(φ, 0), φ∈[-180°, 179°].

Then the formula for 3D reconstruction of cylindrical near-field data is:

V(φ,l)=V(0,l)*V(φ,0)*F(l)*H(φ,l)

where F(l) and H(φ) are weighting factors, and:

F(l)=(1-abs(sin(arc tan(l/D))))1.5; l∈[-L/2, L/2];

H(φ,l)=V(φ,0)-(V(φ,0)*(arc tan(l/D))/180);

Among them, D is the distance between the antenna under test and the axial scanning line array.

Through the above algorithm, the one-dimensional test data is reconstructed to obtain the three-dimensional cylindrical near-field data, as shown in Figure 9.

Please refer to Figure 10 and Figure 11 together, Figure 10 is the vertical plane pattern of the antenna far field obtained by using the antenna test method shown in Figure 7, and Figure 11 is the antenna far field obtained by using the antenna test method shown in Figure 7 horizontal plane diagram. In order to prove the accuracy of the antenna diagram test method provided by the present application, the same antenna 20 is respectively adopted based on a one-dimensional reconstruction three-dimensional test and a complete three-dimensional test, and the antenna far-field direction diagrams obtained by the two measurement methods are drawn, as can be seen from FIG. 10 It can be seen that the directivity diagrams of the vertical plane of the far field obtained by the two measurement methods basically coincide. It can be seen from Fig. 11 that the pattern of the horizontal plane of the far field obtained by the two measurement methods basically coincides, thus proving that the pattern obtained by the antenna pattern test method provided in this application has the same effect as the pattern obtained by the complete three-dimensional test. precision.

The above description is only the specific implementation of the application, but the scope of protection of the application is not limited thereto. Anyone familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the application, and should It falls within the protection scope of the present application; in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims (16)

1. An antenna testing method for testing a pattern of an antenna, comprising:

the antenna test system comprises a plurality of probes, a signal processing device, a switch unit, a first signal channel and a plurality of second signal channels, wherein the probes, the signal processing device, the switch unit, the first signal channels and the second signal channels are arranged at intervals, the switch unit is electrically connected with the signal processing device through the first signal channels, and the second signal channels are electrically connected between the probes and the switch unit in a one-to-one correspondence manner;

placing an antenna in the antenna test system, the antenna being spaced from the plurality of probes;

the signal processing device controls the switch unit to be communicated with the first signal channel and the plurality of second signal channels so as to acquire and process near field data acquired by the probe and obtain a directional diagram of the antenna.

2. The antenna pattern testing method of claim 1, wherein the near field data is azimuth plane sampling data of the antenna and axial sampling data of the antenna.

3. The antenna pattern testing method according to claim 1, wherein the signal processing means controlling the switching unit to communicate the first signal path and the plurality of second signal paths includes:

the main controller determines a first mark of the probe according to the test parameters;

the switch unit comprises a plurality of switch ports, and the main controller determines second marks corresponding to the switch ports according to the first marks;

and the main controller controls the corresponding switch ports to be all closed according to the second mark.

4. The antenna pattern testing method of claim 3, wherein the main controller controlling the corresponding plurality of switch ports to be closed according to the second flag comprises:

the main controller controls the switch ports to be closed simultaneously; or alternatively, the first and second heat exchangers may be,

the main controller controls the plurality of switch ports to be closed in a time-sharing sequence.

5. The antenna pattern testing method of claim 2, wherein the signal processing means obtaining a far field pattern of the antenna comprises:

establishing a three-dimensional cylindrical coordinate system;

the main controller converts the axial sampling data and the azimuth plane sampling data into three-dimensional cylindrical near field data through a one-dimensional near field reconstruction three-dimensional near field algorithm;

the main controller further converts the three-dimensional cylindrical near-field data into a vertical plane direction diagram and a horizontal plane direction diagram of a far field through a cylindrical near-far field conversion algorithm.

6. The antenna pattern testing method of claim 5, wherein said establishing a three-dimensional cylindrical coordinate system comprises: taking the axis of the antenna as a coordinate origin;

the antenna comprises a plurality of antenna ports, and the arrangement direction of the plurality of antenna ports is defined as an X axis;

the directions orthogonal to each other in a plane perpendicular to the X axis are defined as the Y axis and the Z axis.

7. The antenna pattern testing method of claim 1, further comprising:

the signal processing device sets the test parameters of the antenna and judges whether to adjust the interval distance of the probe according to the test parameters.

8. An antenna testing system, comprising:

the probes are arranged at intervals with the antenna and are used for collecting near-field data of the antenna, and the probes are arranged at intervals;

a signal processing device; and

the switch unit is electrically connected with the signal processing device through the first signal channel, and the second signal channels are electrically connected between the probes and the switch unit in a one-to-one correspondence manner;

the signal processing device is used for controlling the switch unit according to the parameters of the antenna so that a plurality of second signal channels are communicated with the first signal channels, and acquiring and processing the near-field data acquired by the probe to obtain a directional diagram of the antenna.

9. The antenna test system of claim 8, wherein a plurality of said probes are sequentially arranged at intervals in a circular probe array, a central position of an enclosed area of said circular probe array is used for placing said antenna, and a plurality of said probes arranged in a circular probe array are used for acquiring azimuth plane sampling data of said antenna.

10. The antenna test system of claim 9, wherein a shortest distance between the probe of the annular probe array and a near field sampling reference plane of the antenna is less than or equal to half an operating wavelength of the antenna.

11. The antenna testing system of claim 10, further comprising a ring support, a plurality of said probes being secured to said ring support and arranged in said ring probe array.

12. The antenna test system of any one of claims 8-11, wherein a plurality of the probes are sequentially spaced apart in a linear probe array, the linear probe array configured to acquire axial sample data of the antenna.

13. The antenna test system of claim 12, wherein the alignment direction of the linear probe array is a first direction, and a minimum distance between the linear probe array and a center position of the antenna in a second direction, the second direction being perpendicular to the first direction, is less than or equal to half an operating wavelength of the antenna.

14. The antenna testing system of claim 13, further comprising a mounting bar, a plurality of said probes being mounted on said mounting bar and arranged in said linear array of probes.

15. The antenna testing system of claim 8, wherein the antenna testing system comprises a loop-shaped support and a fixation rod extending in a first direction, the fixation rod being fixedly connected to the loop-shaped support, a distance between the fixation rod and a center of the loop-shaped support in a second direction being equal to an inner diameter of the loop-shaped support, the second direction being perpendicular to the first direction, a portion of the probes being arranged as an annular array of probes on the loop-shaped support, and a portion of the probes being arranged as a linear array of probes on the fixation rod.

16. The antenna test system of claim 8, wherein each of the probes is provided with a corresponding first mark, the switch unit comprises a plurality of switch ports, the plurality of switch ports are provided with second marks corresponding to the first marks one by one, and the signal processing device comprises a main controller, and the main controller determines the second marks according to the first marks so as to control the switch ports to be closed.

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