CN115930850B - Data processing system for detecting surface roughness of object - Google Patents
Data processing system for detecting surface roughness of object Download PDFInfo
- Publication number
- CN115930850B CN115930850B CN202310064539.2A CN202310064539A CN115930850B CN 115930850 B CN115930850 B CN 115930850B CN 202310064539 A CN202310064539 A CN 202310064539A CN 115930850 B CN115930850 B CN 115930850B
- Authority
- CN
- China
- Prior art keywords
- target
- spot area
- light spot
- roughness
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000003746 surface roughness Effects 0.000 title claims abstract description 35
- 238000012545 processing Methods 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 claims abstract description 25
- 238000004590 computer program Methods 0.000 claims abstract description 12
- 238000004891 communication Methods 0.000 claims description 10
- 101000872083 Danio rerio Delta-like protein C Proteins 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 3
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 230000002159 abnormal effect Effects 0.000 description 4
- 230000002349 favourable effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Images
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention provides a data processing system for detecting the surface roughness of an object, which comprises the following components: a mechanism for detecting surface roughness of an object, a processor and a memory storing a computer program, the mechanism for detecting surface roughness of an object comprising: the lens assembly, the target transmitter and a number of target receivers corresponding to the target transmitter, when the computer program is executed by the processor, implement the steps of: acquiring a target receiver identification list; acquiring a target light spot area list; obtaining target roughness; according to the invention, the receiver generates complete light spots, processes the light spot area, is beneficial to improving the accuracy of acquiring the roughness of the object to be detected, and meanwhile, in the process of processing the light spot area, the area where the light spot area is divided, so that whether the roughness of the object to be detected is consistent or not can be judged, and the change state of the roughness of the object to be detected can be acquired.
Description
Technical Field
The invention relates to the technical field of optical measurement equipment, in particular to a data processing system for detecting surface roughness of an object.
Background
The existing method for measuring the surface roughness of an object by utilizing laser is mostly as follows: the laser transmitter transmits laser beams, the laser beams irradiate the surface of the object through a lens, the receiver receives the beams reflected by the surface of the object and transmits signals, and the signals transmitted by the receiver are processed to obtain the roughness of the surface of the object.
However, the above method also has the following technical problems:
in the process of receiving the light beam reflected by the surface of the object by the receiver, the light beam is directly reflected to the receiver without passing through the lens, and the condition that the receiver cannot receive all the light beams exists, so that the signal sent by the receiver is incomplete, and the accuracy of the acquired surface roughness of the object is low; the signal sent by the receiver is not further analyzed and uniformly processed, so that whether the surface roughness of the object changes can not be judged.
Disclosure of Invention
Aiming at the technical problems, the invention adopts the following technical scheme:
a data processing system for detecting surface roughness of an object, comprising: a means for detecting object surface roughness, a processor and a memory storing a computer program, wherein the means for detecting object surface roughness comprises: the lens assembly, the target transmitter and m target receivers that target transmitter corresponds, the lens assembly sets up in the sender side of target transmitter, target transmitter and processor communication connection, the processor with each target receiver communication connection, when the computer program is executed by the processor, realize the following steps:
s100, acquiring a target receiver ID list A= { A 1 ，A 2 ，……，A i ，……，A m }，A i I=1, 2 … … m for the i-th target receiver ID.
S200, acquiring a target spot area list B= { B corresponding to a target receiver 1 ，B 2 ，……，B i ，……，B m }，B i =(B i1 ，B i2 )，B i1 Is A i Corresponding first target spot area, B i2 Is A i The corresponding second target light spot area is the light spot area of the target light beam reflected to the first receiving area through the surface of the object to be detected, and the second target light spot area is the light spot area of the target light beam reflected to the second receiving area through the surface of the object to be detected; the light spot area is the area corresponding to the light spot generated by the light beam reflected by the surface of the object to be detected received by the receiver.
S300, acquiring target roughness D corresponding to a target receiver according to the B, wherein the step S300 comprises the following steps of:
s301, when all B i2 When the two areas are Null, a first intermediate light spot area list C= { C is obtained 1 ，C 2 ，……，C i ，……，C m }, B is i1 As C i 。
S303, acquiring D according to the C, wherein D meets the following conditions:
D=α 1 ×(∑ m i=1 C i /m)+β 1 wherein alpha is 1 For a first preset weight for acquiring the target roughness, beta 1 Is a second preset weight for acquiring the target roughness.
S305, when all B i1 When they are Null, a second intermediate light spot area list C is obtained 0 ={C 0 1 ，C 0 2 ，……，C 0 i ，……，C 0 m }, B is i2 As C 0 i 。
S307 according to C 0 And D is obtained.
S309, when any B i2 Not Null and except B i1 When any other first target spot area is not Null, obtaining D= { D 1 ，D 2 }, wherein D 1 For a first target roughness, D 2 Is the second target roughness.
The invention has at least the following beneficial effects:
the invention provides a data processing system for detecting the surface roughness of an object, which comprises the following components: a means for detecting object surface roughness, a processor and a memory storing a computer program, wherein the means for detecting object surface roughness comprises: the lens assembly, the target transmitter and m target receivers that target transmitter corresponds, the lens assembly sets up in the sender side of target transmitter, target transmitter and processor communication connection, the processor with each target receiver communication connection, when the computer program is executed by the processor, realize the following steps: acquiring a target receiver ID list; acquiring a target light spot area list corresponding to the target receiver according to the target receiver ID list; acquiring target roughness corresponding to a target receiver according to the target light spot area list; according to the invention, on one hand, the light beam received by the receiver is the light beam which passes through the lens assembly after being reflected by the object to be detected, the receiver can generate complete light spots, the light spot area generated by the receiver is processed, the accuracy of acquiring the roughness of the object to be detected is improved, on the other hand, in the process of processing the light spot area, the area where the light spot area is divided, whether the roughness of the object to be detected is consistent or not can be judged, and the change state of the roughness of the object to be detected can be further acquired.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flowchart of a data processing system for detecting surface roughness of an object according to an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of a mechanism for detecting surface roughness of an object according to an embodiment of the present invention.
Wherein the reference numerals indicate: 1-target receiver, 2-target transmitter, 3-lens assembly, 31-first plano-convex lens, 32-second plano-convex lens, 4-object to be detected, 5-isolated diaphragm.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to fall within the scope of the invention.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present invention and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that the embodiments of the invention described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or server that comprises a list of steps or modules is not necessarily limited to those steps or modules that are expressly listed or inherent to such process, method, article, or apparatus.
The invention provides a data processing system for detecting surface roughness of an object, the system comprising: a means for detecting object surface roughness, a processor and a memory storing a computer program, wherein the means for detecting object surface roughness comprises: the lens assembly 3, the target emitter 2 and m target receivers 1 corresponding to the target emitter 2, and the isolating diaphragm 5, wherein the lens assembly 3 is arranged on one side of a transmitting end of the target emitter 2, the target emitter 2 is in communication connection with a processor, the processor is in communication connection with each target receiver 1, and when a computer program is executed by the processor, the following steps are realized, as shown in fig. 1 and 2:
s100, acquiring a target receiver ID list A= { A 1 ，A 2 ，……，A i ，……，A m }，A i I=1, 2 … … m for the i-th target receiver ID.
Specifically, the target receiver ID is a unique identity of the target receiver 1.
Specifically, the lens assembly 3 includes a first plano-convex lens and a second plano-convex lens 32, the second plano-convex lens 32 being disposed on the convex side of the first plano-convex lens, wherein the center point of the first plano-convex lens and the center point of the second plano-convex lens 32 are disposed on a straight line and the distance between the center point of the first plano-convex lens 31 and the center point of the second plano-convex lens 32 is smaller than the thickness of the first plano-convex lens 31.
Further, the lens assembly 3 is of an integrated structure.
Further, the focal length of the second plano-convex lens 32 is smaller than that of the first plano-convex lens 31.
Specifically, the isolating diaphragm 5 is configured to isolate the light beam except the light beam emitted by the target emitter 2 and the reflected light beam transmitted through the second plano-convex lens 32, where the target emitter 2 is disposed inside the isolating diaphragm 5, and one end of the isolating diaphragm 5 is connected to the junction of the first plano-convex lens 31 and the second plano-convex lens 32.
Further, the target emitter 2 is disposed on the planar side of the first plano-convex lens 31 and the target emitter 2 is in the focus of the second plano-convex lens 32.
Further, m of the target receivers 1 are on a circular ring centered on a point on the main optical axis of the first plano-convex lens 31 and a distance between the target receiver 1 and the first plano-convex lens 31 is greater than or equal to a focal length of the second plano-convex lens 32; it is known to those skilled in the art that any optional receiver in the prior art and the distance between any optional receiver and the first plano-convex lens are all within the scope of the present invention, and are not described herein.
Preferably, the target receiver 1 is a CMOS image sensor, which has the characteristics of high sensitivity and high contrast, and has a lower cost, and compared with other types of receivers, the target receiver has higher practicability for the embodiment, and the roughness is obtained by processing the area of the light spot generated by the CMOS image sensor, so that the data size is smaller, the process is simple, and the efficiency of the system operation is improved.
Specifically, the upper limit of the receiving area of the target receiver 1 is flush with the upper limit of the reflective light receiving area corresponding to the lens assembly 3, and the lower limit of the receiving area of the target receiver 1 is flush with the lower limit of the reflective light receiving area corresponding to the lens assembly 3, wherein the upper limit of the reflective light receiving area is at the intersection point of the first plano-convex lens 31 and the second plano-convex lens 32, and the upper limit of the reflective light receiving area is at the edge of the first plano-convex lens 31.
Specifically, the object to be detected 4 is disposed on one side of the convex surface of the lens assembly 3, and the distance between the object to be detected 4 and the lens assembly 3 is a fixed value, so that a person skilled in the art knows that, in the prior art, any optional vertical distance between the object to be detected and the lens assembly belongs to the protection scope of the present invention, and is not described herein.
Preferably, the distance between the object to be detected 4 and the lens assembly 3 is the focal length of the first convex lens 31, so that the situation that the distance between the object to be detected and the lens assembly is too small or too large, which results in incomplete light beam received by the receiver, inaccurate light spot generated by the target receiver, and further larger roughness with larger error is obtained.
Above-mentioned, the light beam that the receiver received is the light beam through the lens subassembly after waiting to detect the object reflection, and the receiver can produce complete facula, and in the prior art, the incomplete condition of signal that the receiver sent can not appear to only handle the facula area that the receiver produced and acquire roughness, the data volume is less, can improve system's operating efficiency, is favorable to improving the precision that acquires waiting to detect the object roughness.
In a specific embodiment, after step S100, the method includes the following steps:
s200, acquiring a first facula area list S= { S corresponding to a target receiver 1 ，S 2 ，……，S m }，S i Is A i The corresponding first light spot area is the area corresponding to the light spot generated by the light beam reflected by the surface of the object 4 to be detected received by the receiver; those skilled in the art know that any method for obtaining the area of the light spot generated by the light beam received by the receiver in the prior art belongs to the protection scope of the present invention, and is not described herein.
S300, acquiring first roughness F according to the S, wherein F meets the following conditions:
F=α 3 ×(∑ m i=1 S i /m)+β 3 wherein alpha is 3 For a preset first weight for acquiring target roughness, beta 3 In order to obtain the second weight for the target roughness, those skilled in the art know that any optional first weight and second weight in the prior art belong to the protection scope of the present invention, and are not described herein.
S400, when F is less than or equal to F 0 When the roughness of the object 4 to be detected is 0, i.e. the surface of the object 4 to be detected is smooth, otherwise, the roughness of the object 4 to be detected is F, F 0 For the preset roughness threshold, those skilled in the art know that any optional roughness threshold in the prior art belongs to the protection scope of the present invention, and is not described herein.
Above-mentioned, can handle the facula area that target receiver produced, obtain first roughness, compare first roughness, when confirming to wait to detect the object surface and be smooth, need not to obtain the roughness, otherwise, obtain the roughness of waiting to detect the object, can directly judge whether wait to detect the object and roughness is obtained to the roughness, save the processing procedure of system, improve the operating efficiency of system.
In another specific embodiment, after step S100, the method further includes the following steps:
s200, acquiring a target spot area list B= { B corresponding to a target receiver 1 ，B 2 ，……，B i ，……，B m }，B i =(B i1 ，B i2 )，B i1 Is A i Corresponding first target spot area, B i2 Is A i The corresponding second target light spot area, wherein the first target light spot area is the light spot area of the target light beam reflected to the first receiving area through the surface of the object 4 to be detected, and the second target light spot area is the light spot area of the target light beam reflected to the second receiving area through the surface of the object 4 to be detected; the light spot area is the area corresponding to the light spot generated by the light beam reflected by the surface of the object 4 to be detected received by the receiver; those skilled in the art know that any method for obtaining the area of the light spot generated by the light beam received by the receiver in the prior art belongs to the protection scope of the present invention, and is not described herein.
Specifically, the receiving area of the target receiver 1 includes a first receiving area and a second receiving area, where the first receiving area is disposed on a focal side of the target receiver 1 near the first plano-convex lens 31, and the second receiving area is disposed on a focal side of the target receiver 1 far from the first plano-convex lens 31.
Further, the target beam is a collimated beam emitted by the target emitter 2.
Further, B i1 And B i2 Satisfying the condition of not being Null at the same time can be understood as: b (B) i1 When=null and B i2 Not be Null or B i1 Not equal to Null and B i2 =Null。
Specifically, null is a Null value, which can be understood as no result.
S300, according to the B, obtaining the target roughness D corresponding to the target receiver.
Specifically, the step S300 further includes the following steps:
s301, when all B i2 When the two areas are Null, a first intermediate light spot area list C= { C is obtained 1 ，C 2 ，……，C i ，……，C m }, B is i1 As C i 。
S303, acquiring D according to the C, wherein D meets the following conditions:
D=α 1 ×(∑ m i=1 C i /m)+β 1 wherein alpha is 1 For a first preset weight for acquiring the target roughness, beta 1 In order to obtain the second preset weight for the target roughness, those skilled in the art know that any optional first preset weight and second preset weight in the prior art belong to the protection scope of the present invention, and are not described herein.
S305, when all B i1 When they are Null, a second intermediate light spot area list C is obtained 0 ={C 0 1 ，C 0 2 ，……，C 0 i ，……，C 0 m }, B is i2 As C 0 i 。
S307 according to C 0 And D is obtained.
Further, the step S307 further includes the steps of:
s3071 and traversal C 0 Obtaining C 0 max And C 0 min Wherein C 0 max Is C 0 The largest second intermediate light spot area, C 0 min Is C 0 The smallest second intermediate spot area of (c).
S3072, when DeltaC 0 When the light spot area difference threshold is less than or equal to U, D and U are obtained, wherein the light spot area difference threshold which is selected in the prior art is known by a person skilled in the art, and belongs to the inventionIs not described in detail herein.
Specifically, ΔC 0 Meets the following conditions:
ΔC 0 =C 0 max -C 0 min 。
specifically, D meets the following conditions:
D=α 2 ×(∑ m i=1 C 0 i /m)+β 2 wherein alpha is 2 For a third preset weight for acquiring the target roughness, beta 2 In order to obtain the fourth preset weight for the target roughness, those skilled in the art know that any optional third preset weight and fourth preset weight in the prior art belong to the protection scope of the present invention, and are not described herein.
S3073, when DeltaC 0 When U is greater than U, C is obtained 0 Corresponding specified spot area list g= { G 1 ，G 2 ，……，G x ，……，G p }，G x ={G x1 ，G x2 ，……，G xy ，……，G xq(x) }，G xy Is C 0 The corresponding y-th specified spot area in the x-th specified spot area, x=1, 2 … … p, p is the number of specified spot areas, y=1, 2, … …, q (x), q (x) is the specified spot area in the x-th specified spot area.
Further, sigma p x=1 (∑ q(x) y=1 G xy )=m。
Further, the specified spot area refers to a second middle spot area in the specified spot area, where the specified spot area is an area formed by receiving areas of a plurality of adjacent target receivers 1, and those skilled in the art know that the specified spot area divided according to actual requirements is not described herein.
S3074, traversal G x Acquisition of G 0x max And G 0x min Wherein G is 0x max Is G x The largest appointed light spot area G 0x min Is G x The smallest designated spot of (3)Area.
S3075, when DeltaG x When > U, G is deleted from G x Acquiring a key light spot area list G corresponding to G 0 ={G 0 1 ，G 0 2 ，……，G 0 r ，……，G 0 z }，G 0 r ={G 0 r1 ，G 0 r2 ，……，G 0 rg ，……，G 0 rs(r) }，G 0 rg Is C 0 The method comprises the steps of (1) setting a corresponding g-th key light spot area in an r-th key light spot area, wherein r=1, 2 … … z, z is the number of the key light spot areas, g=1, 2, … …, s (r), and s (r) is the key light spot area in the x-th key light spot area, and the key light spot area is any designated light spot area after deleting a designated light spot area which is not smaller than a preset light spot area difference threshold value from a designated light spot area list.
Specifically, ΔG x Meets the following conditions:
ΔG x =G 0x max -G 0x min 。
s3076 according to G 0 Obtaining D, wherein D meets the following conditions:
D=α 2 ×(∑ z r=1 ∑ s(r) g=1 G 0 rg /∑ z r=1 s(r))+β 2 。
s3077 when DeltaG x And when the U is less than or equal to U, D is acquired, wherein the D meets the following conditions:
D=α 2 ×(∑ p x=1 ∑ q(x) y=1 G xy /m)+β 2 。
the method includes the steps that the light spots generated by the target receiver are analyzed, when the first middle light spot area is obtained, the fact that the roughness of the object to be detected is consistent and the object to be detected does not have an abnormal area is indicated, when the second middle light spot area is obtained, the fact that the roughness of the object to be detected is consistent is indicated, when the difference of the light spot areas in the divided areas is not smaller than a preset light spot area difference threshold value, the area is judged to be an abnormal area, in the process of obtaining the roughness, the abnormal area is not processed, errors caused by data of the abnormal area can be reduced, the accuracy of obtaining the target roughness is improved, and the fact that the surface roughness of the object to be detected is consistent can be judged.
S309, when any B i2 Not Null and except B i1 When any other first target spot area is not Null, obtaining D= { D 1 ，D 2 }, wherein D 1 For a first target roughness, D 2 Is the second target roughness.
Further, the step S309 further includes the following steps:
s3091, when any one B i2 Not Null and except B i1 When any other first target spot area is not Null, a third intermediate spot area list H= { H is obtained 1 ，H 2 ，……，H j ，……，H n And a fourth intermediate spot area list H 0 ={H 0 1 ，H 0 2 ，……，H 0 t ，……，H 0 k }，H j J=1, 2 … … n, n is the number of third intermediate spot areas, H 0 t For the t fourth intermediate spot area, t=1, 2 … … k, k is the number of fourth intermediate spot areas, where the third intermediate spot area is a first target spot area of the target spot areas that is not Null, and the fourth intermediate spot area is a second target spot area of the target spot areas that is not Null.
Further, it can be understood that: when all B i2 Not all of Null and all of B i1 And when Null is not satisfied, namely k+n=m, and k and n are smaller than m and k and n are not equal to 0, acquiring a third intermediate light spot area list and a fourth intermediate light spot area list.
S3093 obtaining D from H 1 ，D 1 Meets the following conditions:
D 1 =α 1 ×(∑ n j=1 H j /n)+β 1 。
s3095 according to H 0 Obtaining D 2 ，D 2 Meets the following conditions:
D 2 =α 2 ×(∑ k t=1 H 0 t /k)+β 2 。
above-mentioned, when obtaining third middle facula area and fourth middle facula area, handle third middle facula area and fourth middle facula area respectively, can judge that the roughness of waiting to detect the object is inconsistent and can obtain the roughness of waiting to detect the object difference, be favorable to improving the precision of obtaining target roughness.
In another specific embodiment, after step S300, the method includes the steps of:
s400, in a preset direction, acquiring a third target roughness list W= { W corresponding to the target receiver 1 ，W 2 ，……，W v ，……，W z }，W v In order to obtain the v-th third target roughness corresponding to the target receiver in the preset direction, v=1, 2 … … z, where z is the number of third target roughness corresponding to the target receiver in the preset direction, those skilled in the art know that any optional preset direction in the prior art belongs to the protection scope of the present invention, and is not repeated herein.
Specifically, in step S400, any method for obtaining the third target roughness corresponding to the target receiver is consistent with the step of obtaining the target roughness corresponding to the target receiver in step S300, which is not described herein.
Specifically, in step S400, the method further includes the steps of determining the degree of change in the roughness of the object 4 to be detected:
s401, when W v Are all greater than W v+1 In this case, the object 4 to be detected is marked in the preset direction, so as to generate the mark of the object 4 to be detected as "0", where when W v ＝(W v1 ,W v2 ) At the time W v1 Are all greater than W (v+1)1 ，W v2 Are all greater than W (v+1)2 。
Further, the mark "0" is characterized in that the roughness of the object to be detected is in a reduced state in the preset direction.
S403, when W v Are all smaller than W v+1 In this case, the object 4 to be detected is marked in the preset direction, so as to generate the mark "1" of the object 4 to be detected, where when W v ＝(W v1 ,W v2 ) At the time W v1 Are all smaller than W (v+1)1 ，W v2 Are all smaller than W (v+1)2 。
Further, the mark "1" is characterized in that the roughness of the object to be detected is in a state of being enlarged in the preset direction.
S405, when W v Are all equal to W v+1 In this case, the object 4 to be detected is marked in the preset direction, so as to generate the mark "2" of the object 4 to be detected, where when W v ＝(W v1 ,W v2 ) At the time W v1 Are all equal to W (v+1)1 ，W v2 Are all equal to W (v+1)2 。
Further, the mark "2" is characterized in that the roughness of the object to be detected is unchanged in the preset direction.
S407, when there is W v And W is equal to v+1 Satisfied equation condition and W v+1 And W is equal to v+2 When the satisfied equality conditions are different, marking the object 4 to be detected in the preset direction, generating the mark of the object 4 to be detected as '3', wherein when W v ＝(W v1 ,W v2 ) At the time W v1 And W is equal to (v+1)1 Satisfied equation condition and W (v+1)1 And W is equal to (v+2)1 Satisfies the condition of the equation different, W v2 And W is equal to (v+1)2 Satisfied equation condition and W (v+1)2 And W is equal to (v+2)2 The equation conditions satisfied are not identical.
Further, the mark "3" is characterized in that the roughness of the object to be detected is in an irregularly changing state in the preset direction.
The third target roughness is obtained in the preset direction, and the change of the roughness of the object to be detected in the preset direction can be analyzed.
S500, obtaining the final target roughness Q according to W.
Specifically, the step S500 includes the following steps:
s501, when W v ≠(W v1 ,W v2 ) When Q is obtained, Q meets the following conditions:
Q=(Σ z v=1 W v )/z。
s503, when W v ＝(W v1 ,W v2 ) At this time, q= { Q is acquired 1 ，Q 2 Q meets the following condition:
Q 1 =(Σ z v=1 W v1 )/z；Q 2 =(Σ z v=1 W v2 )/z。
above-mentioned, obtain a plurality of third target roughness, handle third target roughness, compare in above-mentioned embodiment, carry out the multi-point position roughness detection to the object that waits to detect, can judge whether the roughness of waiting to detect the object multi-point position is unanimous, further obtain the change state of the roughness of waiting to detect the object, the multi-point position roughness is handled to the object that waits to detect more, further obtain more accurate roughness.
The invention provides a data processing system for detecting the surface roughness of an object, which comprises the following components: a means for detecting object surface roughness, a processor and a memory storing a computer program, wherein the means for detecting object surface roughness comprises: the lens assembly, the target transmitter and m target receivers that target transmitter corresponds, the lens assembly sets up in the sender side of target transmitter, target transmitter and processor communication connection, the processor with each target receiver communication connection, when the computer program is executed by the processor, realize the following steps: acquiring a target receiver ID list; acquiring a target light spot area list corresponding to the target receiver according to the target receiver ID list; acquiring target roughness corresponding to a target receiver according to the target light spot area list; according to the invention, on one hand, the light beam received by the receiver is the light beam which passes through the lens assembly after being reflected by the object to be detected, the receiver can generate complete light spots, the light spot area generated by the receiver is processed, the accuracy of acquiring the roughness of the object to be detected is improved, on the other hand, in the process of processing the light spot area, the area where the light spot area is divided, whether the roughness of the object to be detected is consistent or not can be judged, and the change state of the roughness of the object to be detected can be further acquired.
While certain specific embodiments of the present invention have been described in detail by way of example, it will be appreciated by those skilled in the art that the above examples are for illustration only and are not intended to limit the scope of the invention. Those skilled in the art will also appreciate that many modifications may be made to the embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.
Claims (9)
1. A data processing system for detecting surface roughness of an object, the system comprising: a means for detecting object surface roughness, a processor and a memory storing a computer program, wherein the means for detecting object surface roughness comprises: the lens assembly is arranged on one side of a transmitting end of the target transmitter, the target transmitter is in communication connection with a processor, the processor is in communication connection with each target receiver, and when the computer program is executed by the processor, the following steps are realized:
s100, acquiring a target receiver ID list A= { A 1 ，A 2 ，……，A i ，……，A m }，A i I=1, 2 … … m for the i-th target receiver ID;
s200, acquiring a target spot area list B= { B corresponding to a target receiver 1 ，B 2 ，……，B i ，……，B m }，B i =(B i1 ，B i2 )，B i1 Is A i Corresponding first target spot area, B i2 Is A i A corresponding second target spot area, wherein the first target spot area is a spot area in which the target beam is reflected to the first receiving area through the surface of the object to be detected, and the second target spot area is a spot area in which the target beam is reflected to the second receiving area through the surface of the object to be detectedSpot area in the field; the light spot area is the area corresponding to the light spot generated by the light beam reflected by the surface of the object to be detected received by the receiver;
s300, acquiring target roughness D corresponding to a target receiver according to the B, wherein the step S300 comprises the following steps of:
s301, when all B i2 When the two areas are Null, a first intermediate light spot area list C= { C is obtained 1 ，C 2 ，……，C i ，……，C m }, B is i1 As C i Wherein, null is a Null value;
s303, acquiring D according to the C, wherein D meets the following conditions:
D=α 1 ×(∑ m i=1 C i /m)+β 1 wherein alpha is 1 For a first preset weight for acquiring the target roughness, beta 1 A second preset weight for acquiring the target roughness;
s305, when all B i1 When they are Null, a second intermediate light spot area list C is obtained 0 ={C 0 1 ，C 0 2 ，……，C 0 i ，……，C 0 m }, B is i2 As C 0 i ；
S307 according to C 0 Obtaining D;
s309, when any B i2 Not Null and except B i1 When any other first target spot area is not Null, obtaining D= { D 1 ，D 2 }, wherein D 1 For a first target roughness, D 2 For the second target roughness, the step S309 includes the steps of:
s3091, when any one B i2 Not Null and except B i1 When any other first target spot area is not Null, a third intermediate spot area list H= { H is obtained 1 ，H 2 ，……，H j ，……，H n And a fourth intermediate spot area list H 0 ={H 0 1 ，H 0 2 ，……，H 0 t ，……，H 0 k }，H j J=1, 2 … … n, n is the number of third intermediate spot areas, H 0 t T=1, 2 … … k, k is the number of fourth intermediate spot areas, wherein the third intermediate spot area is a first target spot area which is not Null in the target spot areas, and the fourth intermediate spot area is a second target spot area which is not Null in the target spot areas;
s3093 obtaining D from H 1 ，D 1 Meets the following conditions:
D 1 =α 1 ×(∑ n j=1 H j /n)+β 1 ；
s3095 according to H 0 Obtaining D 2 ，D 2 Meets the following conditions:
D 2 =α 2 ×(∑ k t=1 H 0 t /k)+β 2 wherein alpha is 2 For a third preset weight for acquiring the target roughness, beta 2 And a fourth preset weight for acquiring the target roughness.
2. The data processing system for detecting surface roughness of an object of claim 1, wherein in step S307 comprises the steps of:
s3071 and traversal C 0 Obtaining C 0 max And C 0 min Wherein C 0 max Is C 0 The largest second intermediate light spot area, C 0 min Is C 0 A minimum second intermediate spot area;
s3072, when DeltaC 0 When the U is less than or equal to the U, D is obtained, wherein U is a preset facula area difference threshold value, and delta C 0 Meets the following conditions:
ΔC 0 =C 0 max -C 0 min ；
d meets the following conditions:
D=α 2 ×(∑ m i=1 C 0 i /m)+β 2 ；
s3073, when DeltaC 0 When U is greater than U, C is obtained 0 Corresponding specified spot area list g= { G 1 ，G 2 ，……，G x ，……，G p }，G x ={G x1 ，G x2 ，……，G xy ，……，G xq(x) }，G xy Is C 0 The method comprises the steps that corresponding y-th specified light spot areas in an x-th specified light spot area are x=1, 2 … … p, p are the number of the specified light spot areas, y=1, 2, … …, q (x), q (x) are the specified light spot areas in the x-th specified light spot area, the specified light spot areas are second middle light spot areas in the specified light spot areas, and the specified light spot areas are areas formed by receiving areas of a plurality of adjacent target receivers;
s3074, traversal G x Acquisition of G 0x max And G 0x min Wherein G is 0x max Is G x The largest appointed light spot area G 0x min Is G x The smallest designated spot area;
s3075, when DeltaG x When > U, G is deleted from G x Acquiring a key light spot area list G corresponding to G 0 ={G 0 1 ，G 0 2 ，……，G 0 r ，……，G 0 z }，G 0 r ={G 0 r1 ，G 0 r2 ，……，G 0 rg ，……，G 0 rs(r) }，G 0 rg Is C 0 The corresponding G-th key light spot area in the r-th key light spot area, r=1, 2 … … z, wherein z is the number of the key light spot areas, g=1, 2, … …, s (r), s (r) is the key light spot area in the x-th key light spot area, wherein the key light spot area is any designated light spot area after the designated light spot area is deleted from a designated light spot area list and is not smaller than a preset light spot area difference threshold value, and delta G is calculated by the method x Meets the following conditions:
ΔG x =G 0x max -G 0x min ；
s3076 according to G 0 Obtaining D, wherein D meets the following conditions:
D=α 2 ×(∑ z r=1 ∑ s(r) g=1 G 0 rg /∑ z r=1 s(r))+β 2 ；
s3077 when DeltaG x And when the U is less than or equal to U, D is acquired, wherein the D meets the following conditions:
D=α 2 ×(∑ p x=1 ∑ q(x) y=1 G xy /m)+β 2 。
3. the data processing system for detecting surface roughness of an object of claim 1, wherein said lens assembly comprises a first plano-convex lens and a second plano-convex lens.
4. A data processing system for detecting surface roughness of an object as in claim 3, wherein said second plano-convex lens is arranged on the convex side of said first plano-convex lens.
5. A data processing system for detecting surface roughness of an object as claimed in claim 3, wherein the center point of the first plano-convex lens and the center point of the second plano-convex lens are arranged on a straight line and the distance between the center point of the first plano-convex lens and the center point of the second plano-convex lens is smaller than the thickness of the first plano-convex lens.
6. A data processing system for detecting surface roughness of an object as in claim 3, wherein the focal length of the second plano-convex lens is smaller than the focal length of the first plano-convex lens.
7. A data processing system for detecting surface roughness of an object as in claim 3, wherein said target emitter is arranged on one side of the plane of said first plano-convex lens and said target emitter is in the focus of said second plano-convex lens.
8. A data processing system for detecting surface roughness of an object as claimed in claim 3, wherein m of said target receivers are on a circular ring centering on a point on the main optical axis of said first plano-convex lens and the distance between said target receivers and said first plano-convex lens is greater than or equal to the focal length of said second plano-convex lens.
9. The data processing system for detecting surface roughness of an object of claim 1, wherein the receiving area of the target receiver comprises a first receiving area and a second receiving area.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310064539.2A CN115930850B (en) | 2023-02-06 | 2023-02-06 | Data processing system for detecting surface roughness of object |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310064539.2A CN115930850B (en) | 2023-02-06 | 2023-02-06 | Data processing system for detecting surface roughness of object |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115930850A CN115930850A (en) | 2023-04-07 |
| CN115930850B true CN115930850B (en) | 2023-05-30 |
Family
ID=85833914
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310064539.2A Active CN115930850B (en) | 2023-02-06 | 2023-02-06 | Data processing system for detecting surface roughness of object |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115930850B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116336964B (en) * | 2023-05-31 | 2023-09-19 | 天津宜科自动化股份有限公司 | Object contour information acquisition system |
| CN116336965B (en) * | 2023-05-31 | 2023-09-05 | 天津宜科自动化股份有限公司 | Data processing system for acquiring object contour information |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111024006A (en) * | 2020-01-13 | 2020-04-17 | 北京智博联科技股份有限公司 | Roughness detection method and roughness detection device |
| CN113609998A (en) * | 2021-08-06 | 2021-11-05 | 云南白药集团上海健康产品有限公司 | A kind of detection method, electronic device and readable storage medium of bottom spot |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2532603C3 (en) * | 1975-07-21 | 1978-12-14 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Optical device for determining the light exit angle |
| DE3304780A1 (en) * | 1983-02-11 | 1984-08-30 | Rodenstock Optik G | DEVICE FOR DETERMINING A SURFACE STRUCTURE, ESPECIALLY THE ROUGHNESS |
| DE3427838C2 (en) * | 1984-07-27 | 1988-09-29 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Roughness probe |
| CN85204899U (en) * | 1985-11-11 | 1986-12-17 | 朱春良 | Numerical displaying, multifunctional meter for checking surface conditions |
| US20020015146A1 (en) * | 1997-09-22 | 2002-02-07 | Meeks Steven W. | Combined high speed optical profilometer and ellipsometer |
| US6891627B1 (en) * | 2000-09-20 | 2005-05-10 | Kla-Tencor Technologies Corp. | Methods and systems for determining a critical dimension and overlay of a specimen |
| CN1771456A (en) * | 2002-09-30 | 2006-05-10 | 应用材料以色列股份有限公司 | Illumination system for optical inspection |
| CN202229741U (en) * | 2011-08-11 | 2012-05-23 | 淄博职业学院 | Laser measuring device for smoothness of ceramic products |
| CN103278113B (en) * | 2013-02-27 | 2015-09-30 | 中国林业科学研究院木材工业研究所 | A kind of method of contactless Fast Measurement Wood Surface Roughness |
| CN203719638U (en) * | 2014-01-06 | 2014-07-16 | 南京信息工程大学 | Workpiece surface roughness non-contact detecting device |
| CN204555937U (en) * | 2015-04-01 | 2015-08-12 | 苏州铖钰杰机电科技有限公司 | A kind of Multifunctional hand-held measuring device for surface roughness |
| WO2017173129A1 (en) * | 2016-03-30 | 2017-10-05 | Applied Materials, Inc. | Metrology system for substrate deformation measurement |
| CN106840048B (en) * | 2016-12-17 | 2019-09-10 | 江汉大学 | Roughness measuring device and method |
| WO2018233947A1 (en) * | 2017-06-20 | 2018-12-27 | Asml Netherlands B.V. | DETERMINATION OF EDGE ROUGHNESS PARAMETERS |
| TWI636232B (en) * | 2017-08-25 | 2018-09-21 | 國立臺灣海洋大學 | Non-contact and optical measuring automation system for surface roughness value of disc cam and method thereof |
| EP3680607A1 (en) * | 2019-01-08 | 2020-07-15 | Rolls-Royce plc | Surface roughness measurement |
| CN209706766U (en) * | 2019-06-06 | 2019-11-29 | 中国计量大学 | Inverse Hartmann's optical path wafer surface roughness measuring device |
| US11300525B2 (en) * | 2019-07-31 | 2022-04-12 | Taiwan Semiconductor Manufacturing Company, Ltd. | Wafer inspection apparatus and method |
| CN210198331U (en) * | 2019-08-30 | 2020-03-27 | 四川拉姆达科技有限公司 | Surface roughness measuring instrument based on laser scattering method |
| CN111307075B (en) * | 2019-10-30 | 2022-03-25 | 桂林电子科技大学 | Roughness measuring device that can identify grain direction |
| CN114459394A (en) * | 2022-02-11 | 2022-05-10 | 南京威视科技有限公司 | Plate flatness detection system based on PSD |
-
2023
- 2023-02-06 CN CN202310064539.2A patent/CN115930850B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111024006A (en) * | 2020-01-13 | 2020-04-17 | 北京智博联科技股份有限公司 | Roughness detection method and roughness detection device |
| CN113609998A (en) * | 2021-08-06 | 2021-11-05 | 云南白药集团上海健康产品有限公司 | A kind of detection method, electronic device and readable storage medium of bottom spot |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115930850A (en) | 2023-04-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN115930850B (en) | Data processing system for detecting surface roughness of object | |
| CN108332708B (en) | Automatic detection system and detection method for laser level meter | |
| KR102134688B1 (en) | Optical distance measuring method and optical distance measuring device | |
| US4529316A (en) | Arrangement of eliminating erroneous data in three-dimensional optical sensors | |
| JP6366405B2 (en) | Laser radar equipment | |
| CN111638226B (en) | Detection method, image processor and detection system | |
| CN110940990A (en) | Laser radar system and detection method and application thereof | |
| CN108195305A (en) | A kind of binocular detecting system and its depth detection method | |
| CN115877391A (en) | Data processing system for detecting object distance | |
| De Gélis et al. | Benchmarking change detection in urban 3d point clouds | |
| CN111829443A (en) | Optical fiber spacing measuring system and measuring method thereof | |
| KR101772220B1 (en) | Calibration method to estimate relative position between a multi-beam sonar and a camera | |
| EP4038343B1 (en) | Apparatus and method for quantifying the surface flatness of three-dimensional point cloud data | |
| CN111707450A (en) | Device and method for detecting positional relationship between focal plane of optical lens and mechanical mounting surface | |
| CN113064139B (en) | Laser radar with high measurement accuracy and application method thereof | |
| CN112710343B (en) | RT-based vehicle-mounted sensor performance test method | |
| CN116203574B (en) | Data processing system for detecting object distance | |
| CN116184427B (en) | Distance detection system based on laser distance sensing technology | |
| US7821652B2 (en) | System and method for focusing discrete points on an under-measured object | |
| CN108106560B (en) | Method and device for measuring large radius of curvature of optical element by comparison method | |
| KR101896477B1 (en) | Method and Apparatus for Scanning LiDAR | |
| KR102063568B1 (en) | Apparatus for measuring sub-aperture surface profile | |
| CN115856912B (en) | Data processing system for detecting movement direction of object | |
| US7710546B2 (en) | Laser receiver and laser receiving system | |
| CN113465739A (en) | Image slicer detection device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: No.12, Saida 4th branch road, economic development zone, Xiqing District, Tianjin Patentee after: Tianjin Yike Automation Co.,Ltd. Address before: No.12, Saida 4th branch road, economic development zone, Xiqing District, Tianjin Patentee before: ELCO (TIANJIN) ELECTRONICS Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder | ||
| CP02 | Change in the address of a patent holder |
Address after: No. 12 Saida Fourth Branch Road, Xiqing Economic and Technological Development Zone, Xiqing District, Tianjin, 300385 Patentee after: Tianjin Yike Automation Co.,Ltd. Address before: No.12, Saida 4th branch road, economic development zone, Xiqing District, Tianjin Patentee before: Tianjin Yike Automation Co.,Ltd. |
|
| CP02 | Change in the address of a patent holder |