CN115904832A - A memory testing method, system, device and readable storage medium - Google Patents

Abstract

The invention belongs to the field of computers, and specifically relates to a memory testing method, system, device and medium, wherein the method includes: configuring a target machine based on a corresponding memory test strategy, and performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy; Obtain the test data output by the target machine during each round of restart test, compare the test data with the predetermined data and/or test data of other rounds, and determine the result of the memory test according to the comparison results. Through a kind of memory test method proposed by the present invention, the test efficiency of the memory RTM test in the server field can be effectively improved, and no manual participation is required in the case of no abnormality, which effectively saves test manpower and avoids multiple times of manpower test. Avoid mistakes caused by repetitive data collection and avoid omissions in manual testing. It saves time and cost, makes the test more flexible, and can effectively replace the traditional RMT test method.

Description

A memory testing method, system, device and readable storage medium

technical field

The invention belongs to the field of computers, and in particular relates to a memory testing method, system, equipment and a readable storage medium.

Background technique

The server memory test is a necessary test to verify the stability of the server platform and memory. In the traditional memory test, the current Eagle stream (server solution launched by Intel) platform memory Margin test standard has two types: 2X5X5 or 3X3X5. To collect 50 or 45 sets of data, and the current RMT BIOS needs to be manually configured. Manually collecting 50 sets of data requires an average of 25 hours of manpower input, which takes a long time and has poor flexibility; manual configuration of RMT BIOS requires complicated operation steps, and there may be omissions and hidden items; therefore, automated data collection and storage are required In order to achieve the effect of flexible testing, less trouble, and more accurate delivery of test results.

Contents of the invention

In order to solve the above problems, the present invention proposes a memory testing method, comprising:

Configuring the target machine based on the corresponding memory test strategy, and performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy;

The test data output by the target machine during each round of restart test is obtained in real time, and the test data is compared with predetermined data and/or test data of other rounds, and the result of the memory test is determined according to the comparison result.

In some embodiments of the present invention, performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy includes:

In response to the completion of any one round of restart tests, the insertion method of the corresponding memory is replaced by modifying the mapping relationship of the memory slots in the BIOS.

In some embodiments of the present invention, performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy further includes:

In response to the completion of a predetermined round of restart tests, the position of the corresponding memory in the memory slot of the target machine is replaced to perform a next round of restart tests.

In some embodiments of the present invention, performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy further includes:

In response to an abnormality in the comparison result, determine the number of the abnormal memory and the corresponding memory slot, and record the test data corresponding to the current abnormal memory;

Perform the next round of restart test by replacing the position of the corresponding memory in the memory slot of the target machine, and collect the test data corresponding to the abnormal memory and the corresponding new memory on the abnormal memory slot. Test Data;

Comparing the test data corresponding to the abnormal memory with the test data corresponding to the memory collected in the next round of restart test and the test data corresponding to the new memory on the abnormal memory slot;

Based on the comparison of the three test data, the memory switching mode for the subsequent restart test is determined.

In some implementations of the present invention, determining the memory switching mode for the subsequent restart test based on the comparison of the three test data includes:

In response to the fact that the current test data corresponding to the abnormal memory is different from the test data of the abnormal memory collected in the next round of restart testing, and the test data of the abnormal memory collected in the next round of restart testing is the same as the predetermined data , then for the subsequent restart test, the method of modifying the mapping relationship of the memory slots in the BIOS is used to replace the insertion method of the corresponding memory, and the test data of different memories are saved by the number of the memory.

In some embodiments of the present invention, determining the memory switching mode for the subsequent restart test based on the comparison of the three test data also includes:

In response to the memory slot corresponding to the abnormal memory, the test data corresponding to the new memory in the next round of testing is different from the test data corresponding to the new memory in the current round of testing, and the next The test data of the abnormal memory collected by the round restart test is different from the predetermined data, and the subsequent restart test is performed by replacing the position of the corresponding memory in the memory slot of the target machine for the subsequent restart test.

In some embodiments of the present invention, determining the memory switching mode for the subsequent restart test based on the comparison of the three test data also includes:

In response to the memory slot corresponding to the abnormal memory, the test data corresponding to the new memory in the next round of testing is the same as the test data corresponding to the new memory in the current round of testing, and the next If the test data of the abnormal memory collected by the round restart test is different from the predetermined data, then for the subsequent restart test, the method of modifying the mapping relationship of the memory slots in the BIOS is used to replace the insertion method of the corresponding memory and use the number of the memory to compare the memory slots of the different memory. Save the test data.

Another aspect of the present invention also proposes a memory testing system, comprising:

A test configuration module, the test configuration module is configured to configure the target machine based on the corresponding memory test strategy, and perform multiple rounds of restart tests on the memory on the target machine based on the memory test strategy;

A test module, the test module is configured to obtain the test data output by the target machine in each round of restart test in real time, and compare the test data with predetermined data and/or other rounds of test data, and according to the comparison Result determines the result of the memory test.

Another aspect of the present invention also proposes a computer device, comprising:

at least one processor; and

A memory, where the memory stores computer instructions that can run on the processor, and when the instructions are executed by the processor, the steps of any one of the methods described in the foregoing implementation manners are implemented.

Another aspect of the present invention also proposes a computer-readable storage medium, the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of any one of the methods described in the above-mentioned implementation modes are implemented .

Through a kind of memory test method proposed by the present invention, the test efficiency during the memory RTM test in the server field can be effectively improved, the test data can be collected in real time during the test, and the test results can be compared after each round of test is completed, and realized according to the comparison results. The flexible configuration of the test plan almost completely eliminates the need for manual participation in the absence of abnormalities, effectively saving test manpower, and avoiding mistakes caused by repeated data collection during manual testing (dozens of data collections at every turn), and avoiding manual testing. test omission. It saves time and cost, makes the test more flexible, and can effectively replace the traditional RMT test method.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. Those skilled in the art can also obtain other drawings based on these drawings without creative work.

Fig. 1 is a schematic flow chart of a memory testing method provided by an embodiment of the present invention;

FIG. 2 is a schematic structural diagram of a memory testing system provided by an embodiment of the present invention;

FIG. 3 is a schematic structural diagram of a computer device provided by an embodiment of the present invention;

FIG. 4 is a schematic structural diagram of a computer-readable storage medium provided by an embodiment of the present invention.

Detailed ways

In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

The present invention aims to solve the problem of low efficiency of RMT (Rank Margin Test) memory test in the field of memory test, RMT is a kind of memory test scheme based on BIOS, and the whole test scheme is embedded in BIOS; RankMargin in BIOS Tool option enable, the platform will automatically enter the Rank Margin test mode, the test results are output by the COM port, the test method is similar to the shmoo test on the ATE: gradually adjust the Vref voltage value, and at the same time gradually adjust the DQ-DQS Skew, at each point Read and write the memory to see if there is an error.

In the traditional implementation method, the RMT test needs to restart the server multiple times and the order of the memory in the memory slot on the server motherboard needs to be changed after a certain number of restarts, and finally repeat the above process on another server motherboard to complete the corresponding test. Due to the large size of the memory supported by the server, the common server memory slots are all 2x8 memory solutions, so each memory test takes a lot of time when performing memory tests, and the traditional implementation method is to manually open the corresponding test software, and connect to the port on the server under test through the corresponding port to collect memory test data. When one round of testing or multiple rounds of testing is completed, it is necessary to manually replace the insertion method of the corresponding memory on the server (rearrange and combine the memory and then reinsert the memory). Time, each memory test needs to manually stare at the execution status of the test machine, and it is difficult for the corresponding personnel to spend time on other work, making the work of the tester in a "mechanical" idle state (it is difficult to concentrate on other work Middle), if the test method is adopted, the RMT test time of the server will be greatly prolonged if the next round of RMT test cannot be performed in time after one round of testing is completed. May affect the subsequent development or verification process of the server. Causes the server to progress slower. Therefore, during the server RMT test, the noise generated by the server also affects the working status of the testers. If they are far away from the test environment, it is difficult to find that the corresponding round of testing is completed in time. Therefore, the testing problems caused by traditional testing methods have been urgently needed to be solved.

As shown in Figure 1, in order to solve the above problems, the present invention proposes a memory testing method, comprising:

Step S1, configure the target machine based on the corresponding memory test strategy, and perform multiple rounds of restart tests on the memory on the target machine based on the memory test strategy;

Step S2: Obtain in real time the test data output by the target machine during each round of restart test, compare the test data with predetermined data and/or test data of other rounds, and determine the result of the memory test according to the comparison result.

In the present embodiment, in step S1, the target machine refers to the equipment used to perform the RMT test. In the present invention, the server is used as the test equipment; the memory test configuration strategy refers to the RMT test strategy and the RMT test strategy is input by the user Or the specified test strategy, when the user enters the test strategy, there are usually three parameters X, Y, Z, corresponding to Borad Copies, DIMM Shifts and Repeats respectively. Among them, Borad Copies indicates the number of test motherboards, which means switching several motherboards for testing during the test, DIMM Shifts refers to the number of times the memory slots are replaced, and Repeats indicates several restart tests without changing the motherboard and memory . Take the 2x5x5 test configuration strategy as an example, 2x5x5 means BoradCopies is 2, DIMM Shifts is 5, and Repeats is 5. That is to say, two server motherboards need to be prepared for testing. First, perform 5 rounds of RMT tests on one of the motherboards by filling the memory slots with memory. After each round of RMT testing, restart the server. After 5 rounds of RMT testing, replace the server motherboards. The memory module on the server is changed once, and the memory module change is to change the memory of the memory slot on the mainboard of the server. Are not the same. That is to say, if the RMT test is completed with a 2x5x5 test configuration strategy, 50 sets of memory test data will be collected.

Further, for the server motherboard that is used for the RMT test for the first time, it is necessary to confirm whether the BIOS settings of the server motherboard meet the corresponding RMT test requirements. If the RMT test requirements are not met, the BIOS needs to be set accordingly.

Specifically, first export the bios option value to bios.txt through the SCE tool, obtain the Advanceddebug Function option value in the settings, and modify the option value to Disabled to open the BIOS hidden option. Further export the bios option value to bios.txt through the SCE tool to obtain the option value set as follows:

Serial Debug Message Level;

System Debug Level;

Sockets in parallel;

Attempt Fast Boot;

Attempt Fast Cold Boot;

Rank Maigin Tool;

RMT on Fast Cold Boot;

And detect whether the specific parameter value of the above-mentioned option (the above-mentioned option is the setting option of the corresponding function in the BIOS) is corresponding to: Mininum, Normal, 1, Disable, Disable, Enable, Disable, if there is a value of the above-mentioned option and the above-mentioned parameter value If it does not correspond, modify the value of the corresponding option in the exported bios.txt, and re-import the modified bios.txt into the BIOS through the SEC tool to make the BIOS take effect. Complete the configuration of the target machine.

In step S2, the serial port log output by the RMT test program running in the BIOS is collected by the SOL function of the BMC, and the log information output by the BIOS during the RMT test process is saved by the corresponding command of the BMC, specifically through ipmitool-Ilanplus –H IP–U username–P password sol activate command saves serial port log information.

Further, based on the stored serial port log information, after each round of testing is completed, the test data of the corresponding memory is analyzed and classified, so as to save the test results of the corresponding memory in each round of test information for use in the next round of testing. Compare the corresponding memory test results in the log information obtained during the test or compare the predetermined standard test results. That is, the test data of the current round is compared with the test data of the next round, or compared with the predetermined standard test data. If the predetermined standard test results are the same, it means that the state of all memory on the server is normal after the RMT test is passed.

If there is a difference in the comparison results between the test results obtained through multiple rounds of restart tests, that is, there is an abnormality in the corresponding memory in the test, the test result is that there is an abnormality in the memory test.

Specifically, in the embodiment of the present invention, in each round of testing, it is necessary to check the collected serial port log data at predetermined intervals, and if the serial port log data contains corresponding completion flag information, it is considered that a round is completed The RMT test. For example, when "RMT test v3.22.0.complete" is detected, "RMT test v3.22.0.complete" is the end log information output by the RMT test program with version 3.22.0 after the execution of the test is completed. After obtaining the end log information, it means that a round of memory RMT test has been completed, then the collected log information is parsed, the test data of different memory (inserted on the target machine of the current test) are classified, and The test data of different memory is used for comparison with the test data of the next round.

In addition, according to the above RMT test strategy, the corresponding BoradCopies, DIMM Shifts and Repeats test counts are increased by 1 when a round of test data is executed. For example, according to the relationship between Borad Copies, DIMM Shifts and Repeats, if the test strategy input by the user is 2x5x5, after completing 5 rounds of RMT tests on the memory, it is deemed to have completed a round of DIMM Shifts, and the memory slot on the server needs to be replaced. memory order. After completing the replacement of the memory in the memory slot for 5 rounds, it is necessary to switch the mainboard of the server for testing. That is to migrate the memory originally on the test server to another server for testing. Specifically, the control of the corresponding test strategy is realized through the test count of the corresponding parameter. Before a round of memory test is executed, the count corresponding to Repeats is increased by 1. When the count corresponding to Repeats is 5, the memory is switched and the The count corresponding to Repeats is 5, cleared and counted again, and the count corresponding to DIMM Shifts is increased by 1. Similarly, when the technology corresponding to DIMM Shifts is 5, switch the mainboard of the server. Continue the above process on the new motherboard. The test strategy is complete until the user input is satisfied.

It should be noted here that the embodiment of the present invention explains the implementation of the present invention from the perspective of the collection of the first round of test data. After the completion of the first round of RMT test, the test data of a plurality of internal memories are first Compared with the predetermined test data. After the subsequent second round of RMT test is completed, it will be compared with the second round of RMT memory test data.

In some embodiments of the present invention, the comparison of the test data is performed with the corresponding sorted test data in memory.

In some embodiments of the present invention, performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy includes:

In response to the completion of any one round of restart tests, the insertion method of the corresponding memory is replaced by modifying the mapping relationship of the memory slots in the BIOS.

In this embodiment, for the operation of switching memory in the memory test strategy, the present invention implements by changing the mapping relationship of the corresponding memory slot in the BIOS. The mapping relationship of the memory slot refers to multiple The number of slots on the BIOS software level, taking a motherboard with 16 memory slots as an example, assuming that the memory slots on the server are numbered from 1 to 16 from left to right, and each memory slot is connected to the CPU There is a fixed one-to-one connection relationship between the corresponding bus ports. In the BIOS, there is a corresponding mapping relationship, which exists in the BIOS firmware. For example, the first memory slot in the physical space is numbered 0 in the default BIOS, and the second memory slot is in the default BIOS. The corresponding number is 1. Then when the RMT test proceeds to switch the insertion sequence of the memory, it is not necessary to manually replace the memory test by the tester, but directly by modifying the memory slot number in the BIOS and the spatial mapping relationship between the corresponding physical slot. , then the RMT memory test tool can perform subsequent tests when it detects that the number of the memory module on the corresponding memory slot has changed. For example, taking the configuration strategy of 2x5x5 as an example, when it is necessary to switch the memory insertion method after 5 restart tests, the corresponding memory insertion method can be replaced by modifying the mapping relationship of the memory slot in the BIOS for the sixth memory test. .

Specifically, modifying the mapping relationship of memory slots in the BIOS is accomplished by modifying the BIOS firmware, and re-downloading the modified BIOS firmware to the BIOS and restarting to take effect. It can effectively reduce the participation and workload of operation and maintenance personnel in the RMT test process.

In some embodiments of the present invention, performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy further includes:

In response to the completion of a predetermined round of restart tests, the position of the corresponding memory in the memory slot of the target machine is replaced to perform a next round of restart tests.

In this embodiment, for the operation of switching memory in the memory test strategy, the method of manually replacing the corresponding memory interpolation method can also be used to realize physical replacement.

In some embodiments of the present invention, performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy further includes:

In response to an abnormality in the comparison result, determine the number of the abnormal memory and the corresponding memory slot, and record the test data corresponding to the current abnormal memory;

Perform the next round of restart test by replacing the position of the corresponding memory in the memory slot of the target machine, and collect the test data corresponding to the abnormal memory and the corresponding new memory on the abnormal memory slot. Test Data;

Comparing the test data corresponding to the abnormal memory with the test data corresponding to the memory collected in the next round of restart test and the test data corresponding to the new memory on the abnormal memory slot;

Based on the comparison of the three test data, the memory switching mode for the subsequent restart test is determined.

In this embodiment, if the comparison result between the current round of test data of a certain memory and the test data of the next round of restart test is abnormal during the test, or the test data of a certain memory and the predetermined standard test If the data is abnormal, it is considered that the RMT memory test is abnormal. During the next round of restart test, the tester replaces the corresponding memory insertion method to replace the position of the memory and the memory slot to pass the subsequent test data. To confirm whether it is due to the problem of the memory slot or the problem of the memory module itself.

Further, after replacing the memory insertion method, restart the server and enter the BIOS to perform the RMT memory test, and classify the test data after replacing the memory insertion method according to the memory number. The so-called memory number refers to the unique ID of the corresponding memory stick , the unique identifier stored in the SPD information by the memory manufacturer. According to the unique identifier of the memory, compare the RMT memory test data of the corresponding memory in the two rounds before and after, and verify whether the corresponding memory module has different test data in the two tests after the memory slot is replaced. At the same time, the memory test data generated by the corresponding memory of the memory slot with abnormal memory test data in the next round of RMT memory test in the current round of testing and the memory test data generated by the memory corresponding to the memory slot of the current round data for comparison.

If the memory test data of the same memory is different after the memory slot is replaced, there may be a problem with the memory, or there may be a problem with the replaced memory slot. Therefore, by comparing the test data of the same memory in the two RMT tests and the corresponding test data of the corresponding memory slot in the two RMT tests, it is confirmed what kind of test strategy is used for the subsequent test.

In some embodiments of the present invention, the way of modifying the memory slot mapping relationship in the BIOS is used to replace the insertion method of the corresponding memory and to replace the position of the corresponding memory in the memory slot of the target machine. In some cases, it is It refers to the replacement after completing the Repeats of a memory test, and in some cases, it can also refer to changing the memory after completing 5 Repeats, that is, completing one DIMM Shifts. That is, in some embodiments of the present invention, different memory replacement strategies are used according to the currently obtained test data to verify whether the cause of the problem is caused by the memory itself or the memory slot on the mainboard of the server or the mainboard.

In some implementations of the present invention, determining the memory switching mode for the subsequent restart test based on the comparison of the three test data includes:

In response to the fact that the current test data corresponding to the abnormal memory is different from the test data of the abnormal memory collected in the next round of restart testing, and the test data of the abnormal memory collected in the next round of restart testing is the same as the predetermined data , then for the subsequent restart test, the method of modifying the mapping relationship of the memory slots in the BIOS is used to replace the insertion method of the corresponding memory, and the test data of different memories are saved by the number of the memory.

In this embodiment, when there is abnormality in the test data of the current round of the corresponding memory, and the test data about the memory obtained after the next round of RMT test is different from the test data of the current round of the memory, that is, two If the test data obtained by the same memory in one RMT test is different, but the test data of the memory obtained in the next RMT test is the same as the predetermined standard data, it means that the test data of the current round of the memory is abnormal, but In the RMT test after the memory slot is replaced, the performance is normal. At this time, it is very likely that there is a problem with the corresponding memory slot. Then in the subsequent RMT test process, you can use the method of modifying the mapping relationship of the memory slots in the BIOS to replace the corresponding memory insertion method, and at the same time save the corresponding test data of the memory with different numbers in the subsequent RMT test process, and then copy each The test data of the memory is compared, and if the comparison results are inconsistent, it is compared with the predetermined standard data to analyze the number of corresponding memory exceptions and detailed exception information.

In some embodiments of the present invention, determining the memory switching mode for the subsequent restart test based on the comparison of the three test data also includes:

In response to the memory slot corresponding to the abnormal memory, the test data corresponding to the new memory in the next round of testing is different from the test data corresponding to the new memory in the current round of testing, and the next The test data of the abnormal memory collected by the round restart test is different from the predetermined data, and the subsequent restart test is performed by replacing the position of the corresponding memory in the memory slot of the target machine for the subsequent restart test.

In this embodiment, if during the current round of testing, the test data of the RTM test of the corresponding internal memory is abnormal (different from the predetermined standard data or different from the data obtained in the next round of testing), then it is determined that the internal memory the corresponding memory slot, and determine whether the test data of the memory on the corresponding memory slot in the next round of testing is the same as the test data of the memory of the current round. If the test data of the memory on the corresponding memory slot in the next round of testing is different from the test data of the memory of the current round, then the memory slot on the corresponding memory slot in the next round of testing Compare the test data with the predetermined standard data. If it is still different from the predetermined standard test data, it means that the corresponding test data is still abnormal after replacing the memory on the memory slot, but the test data obtained during the two tests It is also different, and the data obtained in the second (next round of testing) is also different from the predetermined standard test data, which means that there may be problems with the two replaced memory itself; there may also be problems with the circuit of the memory slot. In different test scenarios, due to the uncertainty of the time when the problem occurred, the abnormal Rank of the test data is different, which is difficult to confirm. Then, for subsequent multiple rounds of restart tests, the RMT test is performed by replacing the corresponding memory. In some embodiments of the present invention, determining the memory switching mode for the subsequent restart test based on the comparison of the three test data also includes:

In response to the memory slot corresponding to the abnormal memory, the test data corresponding to the new memory in the next round of testing is the same as the test data corresponding to the new memory in the current round of testing, and the next If the test data of the abnormal memory collected by the round restart test is different from the predetermined data, then for the subsequent restart test, the method of modifying the mapping relationship of the memory slots in the BIOS is used to replace the insertion method of the corresponding memory and use the number of the memory to compare the memory slots of the different memory. Save the test data.

In this embodiment, if the test data corresponding to two memories on the same memory slot are different in the test results of the current round, but the test data of the next round is the same as the predetermined standard test data, it means that the After the memory slot is replaced with the corresponding memory, the test data of the corresponding memory appears normal. It means that the test data exception is likely to be caused by the memory exception of the current round. The memory slot problem can be preliminarily ruled out. Therefore, in the subsequent RMT test, the method of modifying the mapping relationship of the memory slot in the BIOS is used to replace the insertion method of the corresponding memory for multiple rounds of restart tests. At the same time, the test data is classified and saved according to the memory number. In some embodiments of the present invention, the current round in the present invention does not simply refer to each restart, but may refer to the situation of replacing the memory each time in the test strategy, because the RTM test stipulates that the memory interpolation method is constant and Perform 5 restart tests with the motherboard unchanged. Verifies tests with the same memory placement and the same motherboard in a redundant manner. Therefore, in some embodiments, the subsequent multiple rounds of restart tests can refer to switching the corresponding memory (by modifying the BIOS or replacing the memory location) every time DIMMShifts is completed (5 times or a predetermined number of Repeats are completed), or it can be After completing a Repeats, follow the above-mentioned switching memory mechanism to test the RMT of subsequent multiple rounds of restarts.

Through a kind of memory test method proposed by the present invention, the test efficiency during the memory RTM test in the server field can be effectively improved, the test data can be collected in real time during the test, and the test results can be compared after each round of test is completed, and realized according to the comparison results. The flexible configuration of the test plan almost completely eliminates the need for manual participation in the absence of abnormalities, effectively saving test manpower, and avoiding mistakes caused by repeated data collection during manual testing (dozens of data collections at every turn), and avoiding manual testing. test omission. It saves time and cost, makes the test more flexible, and can effectively replace the traditional RMT test method.

As shown in Figure 2, another aspect of the present invention also proposes a kind of memory testing system, comprises:

Test configuration module 1, the test configuration module 1 is configured to configure the target machine based on the corresponding memory test strategy, and perform multiple rounds of restart tests on the memory on the target machine based on the memory test strategy;

Test module 2, the test module 2 is configured to obtain the test data output by the target machine in each round of restart test in real time, and compare the test data with predetermined data and/or other rounds of test data, and Determine the result of the memory test based on the comparison results.

As shown in Figure 3, another aspect of the present invention also proposes a computer device, including:

at least one processor 21; and

A memory 22, the memory 22 stores computer instructions 23 that can run on the processor 21, and when the instructions 23 are executed by the processor 21, a memory testing method is implemented.

As shown in FIG. 4 , another aspect of the present invention also proposes a computer-readable storage medium 401, the computer-readable storage medium 401 stores a computer program 402, and when the computer program 402 is executed by a processor, a Memory test method.

The above are the exemplary embodiments disclosed in the present invention, but it should be noted that various changes and modifications can be made without departing from the scope of the disclosed embodiments of the present invention defined in the claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. In addition, although the elements disclosed in the embodiments of the present invention may be described or required in an individual form, they may also be understood as a plurality unless explicitly limited to a singular number.

It should be understood that as used herein, the singular form "a" and "an" are intended to include the plural forms as well, unless the context clearly supports an exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items.

The serial numbers of the embodiments disclosed in the above-mentioned embodiments of the present invention are only for description, and do not represent the advantages and disadvantages of the embodiments.

Those of ordinary skill in the art can understand that all or part of the steps for implementing the above embodiments can be completed by hardware, and can also be completed by instructing related hardware through a program. The program can be stored in a computer-readable storage medium. The above-mentioned The storage medium mentioned may be a read-only memory, a magnetic disk or an optical disk, and the like.

Those of ordinary skill in the art should understand that: the discussion of any of the above embodiments is exemplary only, and is not intended to imply that the scope (including claims) disclosed by the embodiments of the present invention is limited to these examples; under the idea of the embodiments of the present invention , technical features in the above embodiments or in different embodiments can also be combined, and there are many other changes in different aspects of the embodiments of the present invention as described above, which are not provided in details for the sake of brevity. Therefore, within the spirit and principle of the embodiments of the present invention, any omissions, modifications, equivalent replacements, improvements, etc., shall be included in the protection scope of the embodiments of the present invention.

Claims (10)

1. A memory testing method, characterized in that, comprising: Configuring the target machine based on the corresponding memory test strategy, and performing multiple rounds of restart tests on the memory on the target machine based on the memory test strategy; The test data output by the target machine during each round of restart test is obtained in real time, and the test data is compared with predetermined data and/or test data of other rounds, and the result of the memory test is determined according to the comparison result. 2. The method according to claim 1, wherein said carrying out multiple rounds of restart tests to the memory on the target machine based on the memory test strategy comprises: In response to the completion of any one round of restart tests, the insertion method of the corresponding memory is replaced by modifying the mapping relationship of the memory slots in the BIOS. 3. The method according to claim 1, wherein said carrying out multiple rounds of restart tests to the memory on the target machine based on the memory test strategy further comprises: In response to the completion of a predetermined round of restart tests, the position of the corresponding memory in the memory slot of the target machine is replaced to perform a next round of restart tests. 4. The method according to claim 1, wherein said carrying out multiple rounds of restart tests to the memory on the target machine based on the memory test strategy further comprises: In response to an abnormality in the comparison result, determine the number of the abnormal memory and the corresponding memory slot, and record the test data corresponding to the current abnormal memory; Perform the next round of restart test by replacing the position of the corresponding memory in the memory slot of the target machine, and collect the test data corresponding to the abnormal memory and the corresponding new memory on the abnormal memory slot. Test Data; Comparing the test data corresponding to the abnormal memory with the test data corresponding to the memory collected in the next round of restart test and the test data corresponding to the new memory on the abnormal memory slot; Based on the comparison of the three test data, the memory switching mode for the subsequent restart test is determined. 5. The method according to claim 4, wherein the memory switching method for determining subsequent restart tests based on the comparison of three kinds of test data comprises: In response to the fact that the current test data corresponding to the abnormal memory is different from the test data of the abnormal memory collected in the next round of restart testing, and the test data of the abnormal memory collected in the next round of restart testing is the same as the predetermined data , then for the subsequent restart test, the method of modifying the mapping relationship of the memory slots in the BIOS is used to replace the insertion method of the corresponding memory, and the test data of different memories are saved by the number of the memory. 6. The method according to claim 4, wherein the memory switching method for determining subsequent restart tests based on the comparison of three kinds of test data also includes: In response to the memory slot corresponding to the abnormal memory, the test data corresponding to the new memory in the next round of testing is different from the test data corresponding to the new memory in the current round of testing, and the next The test data of the abnormal memory collected by the round restart test is different from the predetermined data, and the subsequent restart test is performed by replacing the position of the corresponding memory in the memory slot of the target machine for the subsequent restart test. 7. The method according to claim 4, wherein the memory switching method for determining subsequent restart tests based on the comparison of three kinds of test data also includes: In response to the memory slot corresponding to the abnormal memory, the test data corresponding to the new memory in the next round of testing is the same as the test data corresponding to the new memory in the current round of testing, and the next If the test data of the abnormal memory collected by the round restart test is different from the predetermined data, then for the subsequent restart test, the method of modifying the mapping relationship of the memory slots in the BIOS is used to replace the insertion method of the corresponding memory and use the number of the memory to compare the memory slots of the different memory. Save the test data. 8. A memory testing system, characterized in that, comprising: A test configuration module, the test configuration module is configured to configure the target machine based on the corresponding memory test strategy, and perform multiple rounds of restart tests on the memory on the target machine based on the memory test strategy; A test module, the test module is configured to obtain the test data output by the target machine in each round of restart test in real time, and compare the test data with predetermined data and/or other rounds of test data, and according to the comparison Result determines the result of the memory test. 9. A computer device, comprising: at least one processor; and A memory, the memory stores computer instructions operable on the processor, and the steps of the method according to any one of claims 1-7 are implemented when the instructions are executed by the processor. 10. A computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method according to any one of claims 1-7 are realized.

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