CN115628761B - Low-power-consumption anti-disturbance resistance type sensor and wearable equipment - Google Patents
Low-power-consumption anti-disturbance resistance type sensor and wearable equipment Download PDFInfo
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- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/16—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying resistance
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Abstract
The invention relates to the technical field of sensors, in particular to a low-power-consumption anti-disturbance resistance type sensor and wearable equipment. The resistive sensor comprises a resistive sensor array, a microcontroller and a multichannel analog-to-digital converter; the resistance type sensor array comprises a plurality of sensor units to be detected and a plurality of precise reference resistors with known resistance values, and is provided with a digital interface; the multichannel analog-to-digital converter is used for reading voltages of a plurality of cross points in the resistive sensor array and converting the voltages into digital quantities; the microcontroller is used for scanning the resistance type sensor array according to the line number to be measured through the digital interface, outputting the pre-programmed voltage combination, and calculating the resistance value of each sensor unit to be measured according to the digital quantity. The invention does not need to strictly set the power supply voltage parameter, has high scanning precision and higher accuracy and measuring range, and is more suitable for low-cost wearable equipment under various resistance values.
Description
Technical Field
The invention relates to the technical field of sensors, in particular to a low-power-consumption anti-disturbance resistance type sensor and wearable equipment.
Background
With the development of wearable devices, the requirement of using sensors for signal collection and detection is increasing, the sensor array has advantages over a single sensor unit when acquiring multidimensional data, and for a sensor array with multiple similar parameters in an n×m format, a sensor array designed by a row-column electrode format is commonly used, that is, one end of all sensor elements is connected to a column electrode, and the other end is connected to a row electrode, however, as long as a row-column electrode format is adopted, crosstalk occurs between adjacent elements, so that the data read by the sensors cannot accurately reflect a stimulation signal.
The two-dimensional sensor array is commonly used for extracting the sensing variable distribution on the sensing area, and currently, common readout methods for the sensor array include a diode insertion method, a transistor insertion method, a passive integrator method, a voltage feedback method, a zero potential method and the like. However, in order to eliminate crosstalk currents, devices such as resistors, transistors, operational amplifiers and the like are required to be introduced into the flexible fabric sensor array, and the introduction of the devices into the flexible fabric sensor array causes problems of reduced stretchability of the array, uncomfortable wearing of a user, reduced service life and reliability of the sensor array, increased circuit complexity and power consumption and the like.
Disclosure of Invention
In view of the above, a first object of the present invention is to provide a low-power-consumption anti-disturbance resistive sensor, which can eliminate the reading error caused by the current crosstalk to a certain extent by bringing the voltage value of the crossing position point of the row-column conductors in the sensor array in the row-by-row voltage scanning mode into the sensor resistance value calculation formula, and the calculation result is insensitive to the resistance change and the power supply voltage fluctuation of the sensors in the array, and has a certain elimination effect on the measurement error caused by the environmental factors such as the temperature and the humidity.
Based on the same inventive concept, a second object of the present invention is to provide a wearable device.
The first object of the invention can be achieved by the following technical scheme:
a low power consumption tamper resistant resistive sensor comprising a resistive sensor array, a microcontroller, and a multi-channel analog-to-digital converter, wherein:
the resistance type sensor array comprises a plurality of sensor units to be detected and a plurality of precise reference resistors with known resistance values, and is provided with a digital interface;
the multichannel analog-to-digital converter is used for reading voltages of a plurality of cross points in the resistive sensor array and converting the voltages into digital quantities;
the microcontroller is used for scanning the resistance type sensor array according to the line number to be detected through the digital interface, outputting a pre-programmed voltage combination, and calculating the resistance value of each sensor unit to be detected according to the digital quantity converted by the multichannel analog-to-digital converter;
the voltage at the crossing point is the voltage at the crossing point of the row and column conductors of the sensor array.
Further, the resistive sensor array comprises a resistive array of M+1 rows and N columns, which consists of N precise reference resistors with known resistance values and M multiplied by N sensor units to be detected; the first row of the resistor array is a precision reference resistor with 1 multiplied by N known resistance values, and the second row of the resistor array is a row of 2 to M+1 of M multiplied by N sensor units to be detected.
Further, each row of the resistive sensor array is provided with a digital interface, and the digital interface of each row is connected with one I/O port on the microcontroller.
Further, the microcontroller scans the resistive sensor array through the digital interface, outputs a pre-programmed voltage combination, and calculates a resistance value of each sensor unit to be measured according to the digital quantity converted by the multichannel analog-to-digital converter, comprising the following steps:
constructing a voltage combination matrix comprising a first excitation voltage vector e 1 M second excitation voltage vectors { e 21 ，e 31 ，...，e (m+1)1 M third excitation voltage vectors { e } 22 ，e 32 ，...，e (m+1)2 The first excitation voltage vector, the second excitation voltage vector and the third excitation voltage vector are all M+1-dimensional vectors, the M second excitation voltage vectors are in one-to-one correspondence with the M rows of sensor units to be detected, and the M third excitation voltage vectors are in one-to-one correspondence with the M rows of sensor units to be detected;
measuring the resistance value of a single-row sensor unit to be measured, specifically: respectively inputting a first excitation voltage vector, a second excitation voltage vector and a third excitation voltage vector in the voltage combination matrix into a resistor array, reading the voltage of the crossing point of the row to be detected through a multichannel analog-to-digital converter, solving a calculation formula obtained by a KCL equation, and calculating the resistance value of the single-row sensor unit to be detected;
and repeating the iterative measurement until the resistance of the sensor unit to be measured in each row is measured.
Further, the method for measuring the resistance value of the single-row sensor unit to be measured comprises the following steps:
vector e of the first excitation voltage 1 Outputting the voltage to M+1 rows of the resistor array, and reading the voltages of N crossing points in the row to be measured through a multichannel analog-to-digital converter to obtain a first measurement voltage set
According to the line number i to be tested, a second excitation voltage vector e corresponding to the line to be tested is obtained i1 Outputting the voltage to M+1 rows of the resistor array, and reading the voltages of N cross points in the row to be measured through a multichannel analog-to-digital converter to obtain a second measurement voltage set corresponding to the row to be measured
According to the line number i to be tested, a third excitation voltage vector e corresponding to the line to be tested is obtained i2 Outputting the voltage to M+1 rows of the resistor array, and reading the voltages of N cross points in the row to be measured through a multichannel analog-to-digital converter to obtain a third measurement voltage set corresponding to the row to be measured
According to a first set of measured voltagesSecond measurement voltage set corresponding to the line to be measured +.>Third measurement voltage set corresponding to the line to be measured +.>And solving a formula obtained by a KCL equation, and calculating to obtain the resistance value of the sensor unit to be measured in the row to be measured.
Further, a first excitation voltage vector e 1 The expression of (2) is:
e 1 ＝[0，1，...，1] T
where the s-th element represents the voltage output to the s-th row, 1 represents the output high level, and 0 represents the output low level.
Further, a second excitation voltage vector e corresponding to the ith row i1 The expression of (2) is:
e i1 ＝[1，p 2 ，...，p i ，...，p m+1 ] T
wherein the s-th element represents the voltage output to the s-th row, p i Has a value of 0, e i1 The values of other elements in the set are 1,1 represents output high level, and 0 represents output low level;
third excitation voltage vector e corresponding to ith row i2 The expression of (2) is:
e i2 ＝[0，p 2 ，...，p i ，...，p m+1 ] T
wherein the s-th element represents the voltage output to the s-th row, p i Has a value of 0, e i2 The other elements of (1) have values of 1,1 representing an output high level, and 0 representing an output low level.
Further, according to the first set of measured voltagesSecond measurement voltage set corresponding to the line to be measured +.>Third measurement voltage set corresponding to the line to be measured +.>Calculating to obtain the resistance value of the sensor unit to be measured in the row to be measured, specifically:
first set of measurement voltagesCan be expressed as:
wherein ,v11 ，v 12 ，…，v 1n Respectively reading the voltages of the 1 st, 2 nd, … th and n crossing points in the row to be tested through a multichannel analog-to-digital converter;
second measurement voltage set corresponding to line to be measuredCan be expressed as:
wherein ,vi1 ，v i2 ，…，v in Respectively reading the voltages of the 1 st, 2 nd, … th and n crossing points in the row to be tested through a multichannel analog-to-digital converter;
third measurement voltage set corresponding to line to be measuredCan be expressed as:
wherein ,respectively reading the voltages of the 1 st, 2 nd, … th and n crossing points in the row to be tested through a multichannel analog-to-digital converter;
calculating to obtain the resistance values of n sensor units to be detected in the ith row in the resistor array:
wherein ,R1j (1. Ltoreq.j.ltoreq.n) is a precision reference resistor of known resistance in the j-th column.
Further, iterative measurement is repeated until the resistance value of the sensor unit to be measured in each row is measured, and the calculation expression of the resistance value of the sensor unit to be measured is obtained as follows:
wherein ,R1j (1. Ltoreq.j.ltoreq.n) is a precision reference resistor of known resistance in the j-th column.
The second object of the invention can be achieved by the following technical scheme:
the utility model provides a wearable equipment, includes the sensor, signal transmission unit and host computer, wherein:
the sensor is the low-power-consumption anti-disturbance resistance sensor;
the signal sending unit is used for transmitting the resistance value of each sensor unit to be detected, which is calculated by the microprocessor in the low-power-consumption anti-disturbance resistance sensor, to the upper computer;
the upper computer comprises a signal receiving unit and a display unit, wherein:
the signal receiving unit is used for receiving and processing the resistance value data of each sensor unit to be detected transmitted by the signal transmitting unit;
the display unit is used for displaying the resistance value data processed by the signal receiving unit.
Compared with the prior art, the invention has the following beneficial effects:
(1) The sensor provided by the invention has no requirement on the size and the resistance value of the resistor array, can realize high-precision reading of any M multiplied by N resistor array, and effectively eliminates the interference and crosstalk error of the input resistor of the microprocessor on the basis of not improving the complexity of a circuit.
(2) The invention fully considers the application scene of the flexible wearable equipment, and can effectively ensure the extensibility of the flexible array, effectively prolong the service life of the flexible sensor, expand the use scene of the sensor array and effectively reduce the manufacturing difficulty and cost of the flexible sensor array because devices such as a diode, a transistor and the like are not needed to be implanted into the array.
(3) Compared with the traditional method for isolating crosstalk bypass by using active devices, the method has the advantages of higher reliability, lower power consumption and lower cost, the traditional method needs to supply power to the active devices such as triodes or operational amplifiers, the devices have inherent service life and additional power consumption, the method does not need the active devices, the service life of the sensor array can be effectively prolonged, and the power consumption and the cost of a sensor array reading system can be reduced.
(4) Compared with a sensor based on a KCL equation solving method, the sensor provided by the invention has the advantages that the power supply voltage parameter is not required to be set, the measurement result is more accurate for the non-ideal power supply provided by the microprocessor, and the measuring range is larger. Meanwhile, under the condition that the precision of the multichannel analog-to-digital converter is the same, the sensor provided by the invention has smaller error compared with the sensor based on other KCL equation solving methods due to the unique operation mode of the calculation expression of the invention on the voltages read in the two scanning modes.
(5) The invention adopts the mode of increasing or changing the scan voltage combination and matching with the algorithm operation, avoids adding an analog-digital converter to each row of the sensor array, and effectively reduces the calculation error and the hardware cost.
Drawings
FIG. 1 is a schematic diagram of a sensor in embodiment 1 of the present invention;
FIG. 2 is a hardware connection diagram of a resistive sensor array according to embodiment 1 of the present invention;
FIG. 3 is a diagram showing the structure of the I/O port output control of the microprocessor in embodiment 1 of the present invention;
FIG. 4 is a system architecture of a microprocessor according to an embodiment 1 of the present invention;
FIG. 5 is a graph comparing the measurement results of the sensor of example 1 of the present invention with the measurement results of the sensor based on the resistance matrix method at 16 values close to 1M;
FIG. 6 is a graph showing the comparison of the measurement results of the sensor of example 1 and the sensor based on the resistance matrix method at 16 resistance values with large differences;
fig. 7 is a graph comparing the measurement results of the sensor according to the embodiment 1 of the present invention with the sensor based on the resistance matrix method under five different resistance value arrays.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments, and all other embodiments obtained by persons of ordinary skill in the art without making any inventive effort based on the embodiments of the present invention are within the scope of protection of the present invention.
Example 1:
as shown in fig. 1, the present embodiment provides a low-power-consumption anti-disturbance resistive sensor, which includes a resistive sensor array, a microcontroller, and a multi-channel analog-to-digital converter, wherein:
as shown in fig. 2, the resistive sensor array includes a resistive array of 5 rows and 4 columns composed of 4 precision reference resistors of known resistance values and 4×4 sensor cells to be measured; the first row of the resistor array is a precision reference resistor with 1×4 known resistance values, and the second row of the resistor array is a row of 2 to 5 of the resistor array is a row of 4×4 sensor units to be tested.
The multichannel analog-to-digital converter is used for reading voltages at a plurality of specific positions in the resistive sensor array and converting the voltages into digital quantities;
as shown in fig. 3 and 4, the microcontroller is configured to scan the resistive sensor array through the digital interface, output a preprogrammed voltage combination, and calculate the resistance value of each sensor unit under test according to the digital quantity converted by the multi-channel analog-to-digital converter.
Each row of the resistive sensor array is provided with a digital interface, and the digital interface of each row is connected with one I/O port on the microcontroller. The voltage at a specific location refers to the row-column conductor cross-point voltage of the row number to be measured in the resistive sensor array.
In this embodiment, the microcontroller scans the resistive sensor array through the digital interface, outputs the pre-programmed voltage combination, and calculates the resistance value of each sensor unit to be measured according to the digital quantity converted by the multichannel analog-to-digital converter, including the following steps:
s10, constructing a voltage combination matrix.
In this embodiment, the voltage combination matrix includes a first excitation voltage vector e 1 4 second excitation voltage vectors { e 21 ，e 31 ，e 41 ，e 51 4 third excitation voltage vectors { e } 22 ，e 32 ，e 42 ，e 52 The first excitation voltage vector, the second excitation voltage vector and the third excitation voltage vector are all 5-dimensional vectors, the 4 second excitation voltage vectors are in one-to-one correspondence with the 4 rows of sensor units to be detected, and the 4 third excitation voltage vectors are in one-to-one correspondence with the 4 rows of sensor units to be detected;
in the present embodiment, the first excitation voltage vector e 1 The expression of (2) is:
e 1 ＝[0，1，1，1，1] T
where the s-th element represents the voltage output to the s-th row, 1 represents the output high level, and 0 represents the output low level.
Second excitation voltage vector e corresponding to ith row i1 The expression of (2) is:
e i1 ＝[1，p 2 ，...，p i ，...，p 5 ] T
wherein the s-th element represents the voltage output to the s-th row, p i Has a value of 0, e i1 The values of other elements in the set are 1,1 represents output high level, and 0 represents output low level;
third excitation voltage vector e corresponding to ith row i2 The expression of (2) is:
e i2 ＝[0，p 2 ，...，p i ，...，p 5 ] T
wherein the s-th element represents the voltage output to the s-th row, p i Has a value of 0, e i2 The other elements of (1) have values of 1,1 representing an output high level, and 0 representing an output low level.
S20, measuring the resistance value of a single-row sensor unit to be measured, wherein the single-row sensor unit to be measured specifically comprises the following steps:
s21, the first excitation voltage vector e 1 Outputting to 5 rows of the resistor array, and reading the voltages of 4 cross points in the row to be measured through a multichannel analog-to-digital converter to obtain a first measurement voltage setCan be expressed as:
wherein ,v11 ，v 12 ，v 13 ，v 14 Respectively reading the voltages of the 1 st, 2 nd, 3 rd and 4 th cross points in the row to be tested through a multichannel analog-to-digital converter;
s22, according to the row number i to be tested, a second excitation voltage vector e corresponding to the row to be tested is obtained i1 Outputting the voltage to M+1 rows of the resistor array, and reading the voltages of N cross points in the row to be measured through a multichannel analog-to-digital converter to obtain a second measurement voltage set corresponding to the row to be measuredCan be expressed as:
wherein ,vi1 ，v i2 ，v i3 ，v i4 Respectively reading the voltages of the 1 st, 2 nd, 3 rd and 4 th cross points in the row to be tested through a multichannel analog-to-digital converter;
s23, according to the row number i to be tested, a third excitation voltage vector e corresponding to the row to be tested is obtained i2 Outputting the voltage to M+1 rows of the resistor array, and reading the voltages of N cross points in the row to be measured through a multichannel analog-to-digital converter to obtain a third measurement voltage set corresponding to the row to be measuredCan be expressed as:
wherein ,respectively reading the voltages of the 1 st, 2 nd, 3 rd and 4 th cross points in the row to be tested through a multichannel analog-to-digital converter;
according to a first set of measured voltagesSecond measurement voltage set corresponding to the line to be measured +.>Third measurement voltage set corresponding to the line to be measured +.>Solving an arithmetic expression obtained by a KCL equation, and calculating to obtain the resistance value of the sensor unit to be measured in the line to be measured, wherein the specific expression is as follows:
wherein ,R1j (1. Ltoreq.j.ltoreq.n) is a precision reference resistor of known resistance in the j-th column.
In this step, since the sensor unit resistance value calculation expression is about the same channel, the voltages in the two scanning modes are calculated, and since the scanning interval is short, the ambient temperature and humidity of the two scanning modes can be considered to be approximately equal, and thus the calculation mode in this step can offset the error caused by the temperature and humidity, so that the calculation result is not affected by the environment.
The intersection point refers to the intersection point of the row conductors of the sensor array with the column conductors after being connected with the sensor, namely the voltage of the intersection point refers to the intersection point voltage of the row conductors of the sensor array, namely the voltage on the column conductors of the sensor array.
S30, repeating the step S20, and performing iterative measurement until the resistance of the sensor unit to be measured in each row is measured, wherein the calculation expression of the resistance of the sensor unit to be measured is:
wherein ,R1j (1. Ltoreq.j.ltoreq.n) is a precision reference resistor of known resistance in the j-th column.
In order to make the beneficial effects of the embodiment clearer, an adjustable resistor is used to replace the resistor of the sensor to be measured in the embodiment, and the low-power-consumption anti-disturbance resistive sensor of the embodiment is used respectively to compare the performance with the sensor based on the resistance matrix method, and the specific operation is as follows:
according to the present embodiment and the resistive matrix method, the configuration of the output/input mode and voltage of the GPIO port of the microprocessor is performed, the code for accessing the DMA is written in the program, the serial port baud rate of the microprocessor is configured to be 115200, then the data read from the DMA is calculated in the program of the microprocessor according to the two methods to be compared, and the data read from the DMA is calculated using "#", and-! The two symbols are used as the start and end symbols of the calculation result and are sent through a serial function.
And using python to set the baud rate and other communication protocols in the serial port packet in the upper computer, and storing the read data in a table after checking the read data according to the transmission format of the microprocessor and removing the interfered data.
The resistor array is continuously scanned to obtain 500 results, and then the results are averaged, and for the case that the difference of the resistance values in the array is smaller, as shown in fig. 5, it can be seen that the measurement result of the embodiment is very close to the real resistance value. The measurement result of the present embodiment and the sensor measurement result based on the resistance matrix method are expressed in terms of an error operation expression when calculating an error:calculating the error, wherein R in the operation expression calculate Is the calculation result obtained by the calculation method, R truth Is a resistor unconnectedThe actual resistance value measured when the circuit is in. The calculation results showed that the average calculation error of the measurement results of the resistance matrix method was 1.17793658125% for the case where the resistance value differences of the 16 adjustable resistors were small, the average calculation error of the measurement results of the present embodiment was 0.16030959375% for the 16 resistors, and the average error of the measurement results of the resistance matrix method was 11.5886100625% for the 16 resistors for the case where the resistance value differences in the array were large, as shown in fig. 6, and the average error of the measurement results of the present embodiment was 4.17841573125%.
In order to further verify that the present embodiment is applicable to sensor arrays with different resistance values and has a larger measurement range than the sensor array based on the resistance matrix method, under the same reference resistance value setting, the resistance values of 16 adjustable resistors are respectively changed to 50%, 75%, 100%, 125%, 150%, and the average measurement errors of the two sensors after the array resistance is changed are respectively counted. As a result, as shown in fig. 7, the present embodiment allows a wider range of sensor variations in the array, and is more suitable for sensor arrays with various resistances.
The sensor of the present embodiment also has superior performance compared to an RMA-based sensor. Performance verification was performed using three sets of control experiments: the first group randomly selects one from 16 resistors and changes the resistance value thereof to 30% of the original value, the second group randomly selects two from 16 resistors (positioned in different rows and columns) and changes the resistance value thereof to 30% of the original value, and the third group: two resistors (in the same row or column) are randomly selected from the 16 resistors, the resistance value of the resistors is changed to 30% of the original resistance value, each group is repeated 10 times, the errors are averaged respectively, the measurement result error of the RMA-based sensor on the adjustable resistor with the resistance value of 30% of the original resistance value is 24.38797%, and the measurement result error of the sensor of the embodiment is 5.2554475%.
After the crosstalk test, the maximum value of the variation coefficient of the embodiment is not more than 2.6% and is concentrated near 0, so that compared with the prior art, the sensor provided by the embodiment has smaller error and stronger power supply voltage disturbance resistance.
In summary, the sensor provided in this embodiment has no requirement on the size and resistance value of the resistor array, and can realize high-precision reading of any mxn resistor array, so that input resistance interference and crosstalk error of the microprocessor are effectively eliminated on the basis of not increasing circuit complexity; the application scene of the flexible wearable device is fully considered, and devices such as a diode and a transistor are not needed to be implanted into the array, so that the extensibility of the flexible array can be effectively ensured, the service life of the flexible sensor can be effectively prolonged, the use scene of the sensor array can be expanded, and the manufacturing difficulty and cost of the flexible sensor array can be effectively reduced; compared with the traditional method of using active devices to isolate crosstalk bypass, the method of the embodiment has the advantages of higher reliability, lower power consumption and lower cost, the traditional method needs to supply power to active devices such as triodes or operational amplifiers, the devices have inherent service life and additional power consumption, the method of the invention does not need the active devices, the service life of a sensor array can be effectively prolonged, and the power consumption and the cost of a sensor array reading system can be reduced; compared with a sensor based on a KCL equation solving method, the sensor provided by the embodiment has the advantages that the sensor does not need to set power supply voltage parameters, so that a measurement result is more accurate and the measuring range is larger for a non-ideal power supply provided by a microprocessor; meanwhile, under the condition that the precision of the multichannel analog-to-digital converter is the same, the sensor provided by the invention has smaller error compared with the sensor based on other KCL equation solving methods because of the unique operation mode of the calculation expression of the embodiment on the voltages read in the two scanning modes; in the embodiment, the mode of adding or changing the scan voltage combination and matching with the algorithm operation is adopted, so that the addition of an analog-to-digital converter to each row of the sensor array is avoided, and the calculation error and the hardware cost are effectively reduced.
Example 2:
the utility model provides a wearable equipment, includes the sensor, signal transmission unit and host computer, wherein:
the sensor is a low-power-consumption anti-disturbance resistance type sensor according to the embodiment 1 of the invention;
the signal sending unit is used for transmitting the resistance value of each sensor unit to be detected, which is calculated by the microprocessor in the low-power-consumption anti-disturbance resistance sensor, to the upper computer;
the upper computer comprises a signal receiving unit and a display unit, wherein:
the signal receiving unit is used for receiving and processing the resistance value data of each sensor unit to be detected transmitted by the signal transmitting unit;
the display unit is used for displaying the resistance value data processed by the signal receiving unit.
It is apparent that the above-described embodiments are only some embodiments of the present invention, but not all embodiments, and the present invention is not limited to the details of the above-described embodiments, and any appropriate changes or modifications made by those skilled in the art will be deemed to be within the scope of the present invention.
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Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4374384A (en) * | 1980-08-28 | 1983-02-15 | Westinghouse Electric Corp. | Matrix encoder for resistive sensor arrays |
| US5505072A (en) * | 1994-11-15 | 1996-04-09 | Tekscan, Inc. | Scanning circuit for pressure responsive array |
| WO2007048395A1 (en) * | 2005-10-24 | 2007-05-03 | Buestgens Burkhard | Method for reading sensor arrays, in particular fingerprint sensors |
| CN103415827A (en) * | 2011-03-02 | 2013-11-27 | 感知像素股份有限公司 | Reduction of noise in touch sensors |
| CN105424236A (en) * | 2015-11-19 | 2016-03-23 | 南京信息工程大学 | Multi-range array pressure sensing chip and detection method thereof |
| CN105675024A (en) * | 2016-01-04 | 2016-06-15 | 东南大学 | Data reading method and device for resistance sensor array |
| CN105675995A (en) * | 2016-02-01 | 2016-06-15 | 凯迈(洛阳)电子有限公司 | Embedded multi-channel automatic resistance measurement module |
| CN106813783A (en) * | 2017-01-20 | 2017-06-09 | 东南大学 | Resistive sensor array readout circuit and its reading method based on operational amplifier |
| CN106949827A (en) * | 2017-03-09 | 2017-07-14 | 华中科技大学 | A kind of array resistance strain sensor and the measurement compensation system with the sensor |
| CN107063312A (en) * | 2017-01-20 | 2017-08-18 | 东南大学 | Resistive sensor array measurement apparatus and method |
| CN207280643U (en) * | 2017-09-12 | 2018-04-27 | 芯海科技（深圳）股份有限公司 | A kind of low-power consumption sensor array processing circuit |
| CN110411483A (en) * | 2019-08-26 | 2019-11-05 | 中南大学 | Readout circuit and sensor array of new large-scale sensor array |
| CN110631610A (en) * | 2018-06-21 | 2019-12-31 | 久耀电子科技（江苏）有限公司 | Resistive sensor array test circuit based on two-wire system equipotential method |
| CN112256153A (en) * | 2020-10-29 | 2021-01-22 | 大连理工大学 | Signal acquisition, processing and display method of touch perception array |
| CN113483923A (en) * | 2021-07-06 | 2021-10-08 | 杭州电子科技大学 | Conditioning circuit and method for solving signal crosstalk and multipoint detection of flexible array piezoresistive sensor |
| CN215727856U (en) * | 2021-04-20 | 2022-02-01 | 中山大学 | A measurement system of resistive sensor array |
| CN114859129A (en) * | 2022-07-07 | 2022-08-05 | 武汉地震工程研究院有限公司 | Wireless multi-channel micro impedance measuring method and device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10006828B2 (en) * | 2015-06-24 | 2018-06-26 | Apple Inc. | Systems and methods for measuring resistive sensors |
| CN105628263A (en) * | 2016-01-01 | 2016-06-01 | 芯海科技（深圳）股份有限公司 | Signal processing circuit of pressure-sensitive sensor array and method |
| IT201700108281A1 (en) * | 2017-09-27 | 2019-03-27 | Milano Politecnico | "RESOLUTION CIRCUIT FOR MATHEMATICAL PROBLEMS INCLUDING RESISTIVE ELEMENTS." |
-
2022
- 2022-09-30 CN CN202211205847.4A patent/CN115628761B/en active Active
Patent Citations (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4374384A (en) * | 1980-08-28 | 1983-02-15 | Westinghouse Electric Corp. | Matrix encoder for resistive sensor arrays |
| US5505072A (en) * | 1994-11-15 | 1996-04-09 | Tekscan, Inc. | Scanning circuit for pressure responsive array |
| WO2007048395A1 (en) * | 2005-10-24 | 2007-05-03 | Buestgens Burkhard | Method for reading sensor arrays, in particular fingerprint sensors |
| CN103415827A (en) * | 2011-03-02 | 2013-11-27 | 感知像素股份有限公司 | Reduction of noise in touch sensors |
| CN105424236A (en) * | 2015-11-19 | 2016-03-23 | 南京信息工程大学 | Multi-range array pressure sensing chip and detection method thereof |
| CN105675024A (en) * | 2016-01-04 | 2016-06-15 | 东南大学 | Data reading method and device for resistance sensor array |
| CN105675995A (en) * | 2016-02-01 | 2016-06-15 | 凯迈(洛阳)电子有限公司 | Embedded multi-channel automatic resistance measurement module |
| CN107063312A (en) * | 2017-01-20 | 2017-08-18 | 东南大学 | Resistive sensor array measurement apparatus and method |
| CN106813783A (en) * | 2017-01-20 | 2017-06-09 | 东南大学 | Resistive sensor array readout circuit and its reading method based on operational amplifier |
| CN106949827A (en) * | 2017-03-09 | 2017-07-14 | 华中科技大学 | A kind of array resistance strain sensor and the measurement compensation system with the sensor |
| CN207280643U (en) * | 2017-09-12 | 2018-04-27 | 芯海科技（深圳）股份有限公司 | A kind of low-power consumption sensor array processing circuit |
| CN110631610A (en) * | 2018-06-21 | 2019-12-31 | 久耀电子科技（江苏）有限公司 | Resistive sensor array test circuit based on two-wire system equipotential method |
| CN110411483A (en) * | 2019-08-26 | 2019-11-05 | 中南大学 | Readout circuit and sensor array of new large-scale sensor array |
| CN112256153A (en) * | 2020-10-29 | 2021-01-22 | 大连理工大学 | Signal acquisition, processing and display method of touch perception array |
| CN215727856U (en) * | 2021-04-20 | 2022-02-01 | 中山大学 | A measurement system of resistive sensor array |
| CN113483923A (en) * | 2021-07-06 | 2021-10-08 | 杭州电子科技大学 | Conditioning circuit and method for solving signal crosstalk and multipoint detection of flexible array piezoresistive sensor |
| CN114859129A (en) * | 2022-07-07 | 2022-08-05 | 武汉地震工程研究院有限公司 | Wireless multi-channel micro impedance measuring method and device |
Non-Patent Citations (7)
| Title |
|---|
| A New Approach for Readout of Resistive Sensor Arrays for Wearable Electronic Applications;Lin Shu 等;IEEE Sensors Journal;第15卷(第1期);第442 - 452页 * |
| A wearable, wireless electronic interface for textile sensors;Lin Shu 等;2010 IEEE International Symposium on Circuits and Systems (ISCAS);全文 * |
| VF-NSE method measurement error analysis of networked resistivesensor array;JianFeng Wu 等;Sensors and Actuators A: Physical;第211卷;第45-50页 * |
| 一种机器人压阻阵列触觉数据采集的新方法;罗志增, 蒋静坪;仪器仪表学报;第20卷(第1期);全文 * |
| 低功耗高精度温度多路采集测温系统研究;周旋;师蔚;;电子科技;第33卷(第8期);全文 * |
| 阻性传感器阵列测试方法的多软件联合仿真系统;何赏赏;吴剑锋;赵新刚;汪峰;王琦;;传感技术学报;第31卷(第9期);全文 * |
| 高精度手部压力分布检测系统的设计及研究;刘正琼;唐璇;刘明周;张淼;扈静;;合肥工业大学学报(自然科学版);第40卷(第3期);全文 * |
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