CN115373962A - Method, system, storage medium and device for testing IO performance of storage device - Google Patents
Method, system, storage medium and device for testing IO performance of storage device Download PDFInfo
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- G06F11/34—Recording or statistical evaluation of computer activity, e.g. of down time, of input/output operation ; Recording or statistical evaluation of user activity, e.g. usability assessment
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Abstract
The invention provides a method, a system, a storage medium and a device for testing IO performance of a storage device, wherein the method comprises the following steps: configuring an environment required by IO performance testing for the storage equipment to be tested; operating the FIO module in the environment to test the IO performance of the storage equipment to be tested; the method comprises the steps that IO performance data generated by an FIO module in a testing process are collected through a BMC, the IO performance data are compared with theoretical performance data to determine deviation data in the IO performance data, and the deviation data are removed to obtain actual IO performance data; and analyzing and calculating the actual IO performance data to obtain a calculation result, and taking the calculation result as the IO performance value of the storage equipment to be tested. The invention can truly and effectively test the IO performance of the storage equipment facing different data requests, so that the IO test of the storage equipment can be tested based on the requests of different data types under different application scenes, objective and real test result data can be obtained, and the IO performance test efficiency of the storage equipment is improved.
Description
Technical Field
The present invention relates to the field of storage technologies, and in particular, to a method, a system, a storage medium, and a device for testing IO performance of a storage device.
Background
The performance of the stored IO (data Input/Output) is an important index for reference and attention of users, scientific researchers, operation and maintenance personnel and the like, and the test of the performance of the stored IO mainly lies in testing the read-write pressure of the storage.
For the existing testing method, the obtained testing result generally needs to refer to data developed by a storage manufacturer and provided by storage management software matched with the storage equipment through a graphical interface. In order to pursue high performance, part of manufacturers purposely improve test data by modifying parameters in a program and other methods, so that the authenticity and the objectivity of the data are greatly reduced, the pressure data of the storage IO performance in various different data scenes can not be reflected when the storage IO performance is actually applied, the current test of the storage IO performance can not be in line with the reality to a great extent, the storage IO performance can not be reflected really, but the situation that the IO performance stored in reality is faced with different data requests of different application environments is rare.
Disclosure of Invention
In view of this, an object of the present invention is to provide a method, a system, a storage medium, and a device for testing IO performance of a storage device, so as to solve the problem that in the prior art, the testing of IO performance of the storage device cannot reflect pressure data of the storage IO performance in response to various different data scenarios when the storage IO performance is actually applied, and thus cannot be in compliance with reality to a great extent.
Based on the above purpose, the present invention provides a method for testing IO performance of a storage device, comprising the following steps:
configuring an environment required for testing IO performance for the storage equipment to be tested;
operating the FIO module in the environment to test the IO performance of the storage equipment to be tested;
the method comprises the steps that IO performance data generated by an FIO module in a testing process are collected through a BMC, the IO performance data are compared with theoretical performance data to determine deviation data in the IO performance data, and the deviation data are removed to obtain actual IO performance data;
and analyzing and calculating the actual IO performance data to obtain a calculation result, and taking the calculation result as the IO performance value of the storage equipment to be tested.
In some embodiments, analyzing and calculating the actual IO performance data to obtain a calculation result, and taking the calculation result as the IO performance value of the storage device to be tested includes:
and sequentially carrying out summation operation and averaging operation on the actual IO performance data to obtain an average IO performance value, and taking the average IO performance value as the IO performance value of the storage equipment to be tested.
In some embodiments, configuring the environment required for testing IO performance for the storage device under test includes:
connecting the storage device to be tested, the BMC and the test accompanying server;
configuring an MAC address and an IP address of an accompanied measurement server and an MAC address and an IP address of a storage device to be measured; and
and configuring the service environment of the storage equipment to be tested.
In some embodiments, configuring a service environment of a storage device under test includes at least:
and configuring a storage pool and a host for the storage device to be tested, and creating a disk array group and a logic unit.
In some embodiments, running the FIO module in the environment to test IO performance of the storage device under test includes:
running the written FIO script in the environment, and performing bandwidth test and/or IOPS test on the logic unit based on the FIO script.
In some embodiments, collecting, by the BMC, IO performance data generated by the FIO module during the test includes:
and acquiring bandwidth rate information and IOPS rate information generated by the FIO module in the processes of test sequence reading, sequence writing, random reading, random writing, re-reading and re-writing through the BMC.
In some embodiments, the method further comprises:
and sequentially decompressing, configuring, compiling and installing the FIO testing tool in the FIO module in an operating system of the test accompanying server.
In another aspect of the present invention, a system for testing IO performance of a storage device is further provided, including:
the environment configuration module is used for configuring an environment required by IO performance test for the storage equipment to be tested;
the test module is configured to run the FIO module in an environment to test the IO performance of the storage device to be tested;
the data acquisition module is configured to acquire IO performance data generated by the FIO module in the test process through the BMC, compare the IO performance data with theoretical performance data to determine deviation data in the IO performance data, and remove the deviation data to obtain actual IO performance data; and
and the calculation module is configured to analyze and calculate the actual IO performance data to obtain a calculation result, and the calculation result is used as the IO performance value of the storage device to be detected.
In still another aspect of the present invention, a computer-readable storage medium is further provided, which stores computer program instructions, which when executed by a processor, implement the above-mentioned method.
In yet another aspect of the present invention, a computer device is further provided, which includes a memory and a processor, the memory storing a computer program, which when executed by the processor performs the above method.
The invention has at least the following beneficial technical effects:
according to the method, the device and the system, IO performance data generated by the FIO module in the testing process are collected through the BMC, the IO performance data are compared with theoretical performance data to determine deviation data in the IO performance data, the deviation data are removed to obtain actual IO performance data, the actual IO performance data are analyzed and calculated to obtain a calculation result, and the calculation result is used as an IO performance value of the storage device to be tested, so that IO performance of the storage device facing different data requests can be tested truly and effectively, the storage device IO testing can be tested based on different data type requests under different application scenes, objective and real test result data can be obtained, and the IO performance testing efficiency of the storage device is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other embodiments can be obtained by using the drawings without creative efforts.
FIG. 1 is a schematic diagram illustrating a method for testing IO performance of a storage device according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a system for testing IO performance of a storage device according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a computer-readable storage medium for implementing a method for testing IO performance of a storage device according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a hardware structure of a computer device for executing the method for testing IO performance of a storage device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention are described in further detail with reference to the accompanying drawings.
It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are used for distinguishing two non-identical entities with the same name or different parameters, and it is understood that "first" and "second" are only used for convenience of expression and should not be construed as limiting the embodiments of the present invention. Furthermore, the terms "comprises" and "comprising," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements does not include all of the other steps or elements inherent in the list.
In view of the foregoing, a first aspect of the embodiments of the present invention provides an embodiment of a method for testing IO performance of a storage device. Fig. 1 is a schematic diagram illustrating an embodiment of a method for testing IO performance of a storage device according to the present invention. As shown in fig. 1, the embodiment of the present invention includes the following steps:
s10, configuring an environment required by IO performance testing for the storage equipment to be tested;
step S20, operating the FIO module in the environment to test the IO performance of the storage equipment to be tested;
s30, collecting IO performance data generated by the FIO module in the test process through the BMC, comparing the IO performance data with theoretical performance data to determine deviation data in the IO performance data, and removing the deviation data to obtain actual IO performance data;
and S40, analyzing and calculating the actual IO performance data to obtain a calculation result, and taking the calculation result as the IO performance value of the storage equipment to be tested.
In the embodiment of the invention, the FIO is a mainstream third-party disk IO (Input/Output) performance testing tool, the testing result can objectively and truly reflect the IO performance of the storage device, and the FIO is mainly divided into a jobmanagement module, an ioengine module, a data collection module and the like, wherein the ioengine module is the core of the FIO. The FIO ioEngine adopts a framework similar to vfs, namely a group of common operation methods (ioengines) are defined, and the specific ioengines can be inserted into the FIO framework through realizing specified interfaces such as ioengines and the like and can be successfully executed.
The BMC (Baseboard management Controller) is mainly used for monitoring the temperature, voltage, fan, power supply, etc. of the system and performing corresponding adjustment work to ensure that the system is in a healthy state, and if the system is abnormal, the system can be restarted in a reset mode, and is also responsible for recording information and log records of various hardware and prompting a user and positioning subsequent problems.
The BMC is an independent System, and does not depend on other hardware (such as a CPU, a memory, and the like) on the System, nor on a BIOS (Basic Input Output System), an OS (Operating System), and the like, but the BMC may interact with the BIOS and the OS, so that a better platform management effect may be achieved, and System management software under the OS may cooperate with the BMC to achieve a better management effect.
According to the embodiment of the invention, the IO performance data generated by the FIO module in the test process is collected through the BMC, the IO performance data is compared with the theoretical performance data to determine deviation data in the IO performance data, the deviation data is removed to obtain actual IO performance data, the actual IO performance data is analyzed and calculated to obtain a calculation result, and the calculation result is used as the IO performance value of the storage equipment to be tested, so that the IO performance of the storage equipment facing different data requests can be really and effectively tested, the storage equipment IO test can be carried out based on different data type requests under different application scenes, objective and real test result data can be obtained, and the IO performance test efficiency of the storage equipment is improved.
In some embodiments, configuring the environment required for testing IO performance for the storage device under test includes: connecting the storage device to be tested, the BMC and the test accompanying server; configuring an MAC address and an IP address of the accompany-testing server and an MAC address and an IP address of the storage equipment to be tested; and configuring the service environment of the storage equipment to be tested.
In some embodiments, configuring a service environment of a storage device under test includes at least: and configuring a storage pool and a host for the storage device to be tested, and creating a disk array group and a logic unit.
In some embodiments, the method further comprises: and sequentially decompressing, configuring, compiling and installing the FIO testing tool in the FIO module in an operating system of the test accompanying server.
In the above embodiment, the environment required for configuring the test IO performance for the storage device to be tested mainly includes a configuration hardware environment and a configuration software environment.
Specifically, configuring the hardware environment includes: preparing a server and a switch as accompanying tests, in order to avoid performance bottleneck, requiring a CPU (central processing unit), a network card and the like to select high-performance cards as far as possible, configuring a plurality of PCIE (peripheral component interconnect Express) slots in a mainboard for a plurality of high-performance network cards to use, and allowing a plurality of accompanying test servers to be configured under the condition; and connecting the storage equipment to be tested with the accompanying test server through the switch and the network cable.
Configuring the software environment includes: MAC addresses and IP addresses of the BMC, the accompanied test server and the storage device to be tested are configured and can be communicated with each other; constructing a test environment of a test accompanying server, and configuring and operating BMC on a Linux operating system (such as Ubuntu, centOS and the like); configuring a hardware and software test environment of storage equipment to be tested, and constructing a storage service environment, wherein the storage service environment comprises establishing an RAID (redundant array of independent disks) group, configuring a storage pool, establishing an LUN (logical unit), configuring a host (iSCSI, FC and the like), establishing a mapping relation and the like; decompressing, configuring, compiling and installing a test tool FIO in a Linux operating system, compiling an FIO running script and aiming at carrying out bandwidth and IOPS test on a plurality of mapped LUNs.
The MAC Address (Media Access Control Address) translates to a MAC Address, also called a local area network Address (LAN Address), a MAC Address, an Ethernet Address or a Physical Address, which is an Address used to identify the location of the network device. In the OSI model, a third layer network layer is responsible for IP addresses and a second layer data link layer is responsible for MAC addresses. The MAC address is used to uniquely identify a network card in the network, and if one or more network cards exist in a device, each network card needs to have a unique MAC address.
The IP Address (Internet Protocol Address) refers to an Internet Protocol Address and is translated into an Internet Protocol Address. The IP address is a uniform address format provided by the IP protocol, and it allocates a logical address to each network and each host on the internet, so as to mask the difference of physical addresses.
In some embodiments, running the FIO module in the environment to test IO performance of the storage device under test includes: running the written FIO script in the environment, and performing bandwidth test and/or IOPS test on the logic unit based on the FIO script.
In this embodiment, the FIO module of the operation performance testing tool includes: and running the written FIO script, modifying the script according to the mapped LUNs (mapping a plurality of LUNs according to the actual situation, wherein the more LUNs are better in principle), and simultaneously testing the bandwidth or IOPS of the plurality of LUNs so as to obtain the actual optimal performance of the test result as storage. The IOPS (Input/Output Operations Per Second) is a measurement method for performance test of computer storage devices (such as Hard Disk Drives (HDDs), solid State Drives (SSDs), or Storage Area Networks (SANs)), and can be regarded as the number of read/write Operations Per Second.
Specific FIO scripts are as follows:
#！/bin/bash
fio-filename＝/dev/sda-direct＝1-rw＝read-bs＝1M-size＝100G-numjobs＝1-name＝job1–thread-iodepth＝32-group_reporting
fio-filename＝/dev/sdb-direct＝1-rw＝read-bs＝1M-size＝100G-numjobs＝1-name＝job1–thread-iodepth＝32-group_reporting
fio-filename＝/dev/sdc-direct＝1-rw＝read-bs＝1M-size＝100G-numjobs＝1-name＝job1–thread-iodepth＝32-group_reporting
…
in some embodiments, collecting, by the BMC, IO performance data generated by the FIO module during the test includes: and acquiring bandwidth rate information and IOPS rate information generated by the FIO module in the processes of test sequence reading, sequence writing, random reading, random writing, re-reading and re-writing through the BMC.
In some embodiments, analyzing and calculating the actual IO performance data to obtain a calculation result, and taking the calculation result as the IO performance value of the storage device to be tested includes: and sequentially carrying out summation operation and averaging operation on the actual IO performance data to obtain an average IO performance value, and taking the average IO performance value as the IO performance value of the storage equipment to be tested.
In another embodiment, the IO performance value of the storage device to be tested is also presented to the display interface of the BMC.
In a second aspect of the embodiments of the present invention, a system for testing IO performance of a storage device is further provided. FIG. 2 is a schematic diagram illustrating an embodiment of a system for testing IO performance of a storage device according to the present invention. As shown in fig. 2, a system for testing IO performance of a storage device includes: the environment configuration module 10 is configured to configure an environment required for testing IO performance for the storage device to be tested; the test module 20 is configured to run the FIO module in an environment to test the IO performance of the storage device to be tested; the data obtaining module 30 is configured to collect IO performance data generated by the FIO module in the test process through the BMC, compare the IO performance data with theoretical performance data to determine deviation data in the IO performance data, and remove the deviation data to obtain actual IO performance data; and the calculation module 40 is configured to analyze and calculate the actual IO performance data to obtain a calculation result, and the calculation result is used as an IO performance value of the storage device to be tested.
According to the system for testing the IO performance of the storage device, the BMC is used for acquiring the IO performance data generated by the FIO module in the testing process, comparing the IO performance data with the theoretical performance data to determine the deviation data in the IO performance data, removing the deviation data to obtain the actual IO performance data, analyzing and calculating the actual IO performance data to obtain the calculation result, and taking the calculation result as the IO performance value of the storage device to be tested.
In a third aspect of the embodiment of the present invention, a computer-readable storage medium is further provided, and fig. 3 is a schematic diagram of a computer-readable storage medium for implementing a method for testing IO performance of a storage device according to an embodiment of the present invention. As shown in fig. 3, the computer-readable storage medium 3 stores computer program instructions 31. The computer program instructions 31, when executed by a processor, implement the method of any of the embodiments described above.
It should be understood that all of the embodiments, features and advantages set forth above with respect to the method of testing storage device IO performance according to the present invention are equally applicable, without conflict with one another, to the system and storage medium of testing storage device IO performance according to the present invention.
In a fourth aspect of the embodiments of the present invention, there is further provided a computer device, including a memory 402 and a processor 401 as shown in fig. 4, where the memory 402 stores therein a computer program, and the computer program, when executed by the processor 401, implements the method of any one of the above embodiments.
Fig. 4 is a schematic diagram of a hardware structure of an embodiment of a computer device for executing the method for testing IO performance of a storage device according to the present invention. Taking the computer device shown in fig. 4 as an example, the computer device includes a processor 401 and a memory 402, and may further include: an input device 403 and an output device 404. The processor 401, the memory 402, the input device 403 and the output device 404 may be connected by a bus or other means, and fig. 4 illustrates an example of a connection by a bus. The input device 403 may receive input numeric or character information and generate key signal inputs related to user settings and function control of the system testing the IO performance of the storage device. The output device 404 may include a display device such as a display screen.
The memory 402, which is a non-volatile computer-readable storage medium, may be used to store non-volatile software programs, non-volatile computer-executable programs, and modules, such as program instructions/modules corresponding to the method for testing IO performance of a storage device in the embodiment of the present application. The memory 402 may include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function; the storage data area may store data created by use of a method of testing IO performance of a storage device, and the like. Further, the memory 402 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device. In some embodiments, memory 402 may optionally include memory located remotely from processor 401, which may be connected to local modules via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The processor 401 executes various functional applications and data processing of the server by running the nonvolatile software program, instructions and modules stored in the memory 402, that is, the method for testing IO performance of the storage device according to the above-described method embodiment is implemented.
Finally, it is noted that the computer-readable storage medium (e.g., memory) herein can be either volatile memory or nonvolatile memory, or can include both volatile and nonvolatile memory. By way of example, and not limitation, nonvolatile memory can include Read Only Memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM), which can act as external cache memory. By way of example and not limitation, RAM may be available in a variety of forms such as synchronous RAM (DRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchlink DRAM (SLDRAM), and Direct Rambus RAM (DRRAM). The storage devices of the disclosed aspects are intended to comprise, without being limited to, these and other suitable types of memory.
Those of skill would further appreciate that the various illustrative logical blocks, modules, circuits, and algorithm steps described in connection with the disclosure herein may be implemented as electronic hardware, computer software, or combinations of both. To clearly illustrate this interchangeability of hardware and software, various illustrative components, blocks, modules, circuits, and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as software or hardware depends upon the particular application and design constraints imposed on the overall system. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the disclosed embodiments of the present invention.
The various illustrative logical blocks, modules, and circuits described in connection with the disclosure herein may be implemented or performed with the following components designed to perform the functions herein: a general purpose processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or any combination of these components. A general purpose processor may be a microprocessor, but in the alternative, the processor may be any conventional processor, controller, microcontroller, or state machine. A processor may also be implemented as a combination of computing devices, e.g., a combination of a DSP and a microprocessor, a plurality of microprocessors, one or more microprocessors in conjunction with a DSP, and/or any other such configuration.
The foregoing is an exemplary embodiment of the present disclosure, but it should be noted that various changes and modifications could be made herein without departing from the scope of the present disclosure as defined by the appended claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. Furthermore, although elements of the disclosed embodiments of the invention may be described or claimed in the singular, the plural is contemplated unless limitation to the singular is explicitly stated.
It should be understood that, as used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly supports the exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items. The numbers of the embodiments disclosed in the above embodiments of the present invention are merely for description, and do not represent the advantages or disadvantages of the embodiments.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant only to be exemplary, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the idea of an embodiment of the invention, also technical features in the above embodiment or in different embodiments may be combined and there are many other variations of the different aspects of the embodiments of the invention as described above, which are not provided in detail for the sake of brevity. Therefore, any omissions, modifications, substitutions, improvements, and the like that may be made without departing from the spirit and principles of the embodiments of the present invention are intended to be included within the scope of the embodiments of the present invention.
Claims (10)
1. A method for testing IO performance of a storage device is characterized by comprising the following steps:
configuring an environment required for testing IO performance for the storage equipment to be tested;
operating a FIO module in the environment to test the IO performance of the storage equipment to be tested;
collecting IO performance data generated by the FIO module in the testing process through a BMC, comparing the IO performance data with theoretical performance data to determine deviation data in the IO performance data, and removing the deviation data to obtain actual IO performance data;
and analyzing and calculating the actual IO performance data to obtain a calculation result, and taking the calculation result as the IO performance value of the storage equipment to be tested.
2. The method of claim 1, wherein analyzing and calculating the actual IO performance data to obtain a calculation result, and using the calculation result as the IO performance value of the storage device under test comprises:
and sequentially carrying out summation operation and averaging operation on the actual IO performance data to obtain an average IO performance value, and taking the average IO performance value as the IO performance value of the storage equipment to be tested.
3. The method of claim 1, wherein configuring the environment required for testing IO performance for the storage device under test comprises:
the storage device to be tested, the BMC and the accompanied test server are connected with each other;
configuring the MAC address and the IP address of the server to be tested and the MAC address and the IP address of the storage device to be tested; and
and configuring the service environment of the storage equipment to be tested.
4. The method of claim 3, wherein configuring the service environment of the storage device under test comprises at least:
and configuring a storage pool and a host for the storage equipment to be tested, and creating a disk array group and a logic unit.
5. The method of claim 4, wherein operating a FIO module in the environment to test IO performance of the storage device under test comprises:
running the written FIO script in the environment, and performing bandwidth test and/or IOPS test on the logic unit based on the FIO script.
6. The method of claim 1, wherein collecting, by the BMC, IO performance data generated by the FIO module during testing comprises:
and acquiring bandwidth rate information and IOPS rate information generated by the FIO module in the processes of test sequence reading, sequence writing, random reading, random writing, re-reading and re-writing through the BMC.
7. The method of claim 1, further comprising:
and sequentially decompressing, configuring, compiling and installing the FIO testing tool in the FIO module in an operating system of the test accompanying server.
8. A system for testing IO performance of a storage device, comprising:
the environment configuration module is used for configuring an environment required by IO performance test for the storage equipment to be tested;
the test module is configured to run the FIO module in the environment so as to test the IO performance of the storage device to be tested;
the data acquisition module is configured to acquire IO performance data generated by the FIO module in the test process through a BMC (baseboard management controller), compare the IO performance data with theoretical performance data to determine deviation data in the IO performance data, and remove the deviation data to obtain actual IO performance data; and
and the calculation module is configured to analyze and calculate the actual IO performance data to obtain a calculation result, and the calculation result is used as the IO performance value of the storage device to be tested.
9. A computer-readable storage medium, characterized in that computer program instructions are stored which, when executed by a processor, implement the method according to any one of claims 1-7.
10. A computer device comprising a memory and a processor, characterized in that the memory has stored therein a computer program which, when executed by the processor, performs the method according to any one of claims 1-7.
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| CN116991641A (en) * | 2023-06-25 | 2023-11-03 | 珠海妙存科技有限公司 | FIO-based compatibility testing methods, devices, electronic equipment and storage media |
| CN117690470A (en) * | 2023-12-07 | 2024-03-12 | 湛江科技学院 | IO performance test method of storage device |
| CN118796646A (en) * | 2024-09-12 | 2024-10-18 | 苏州元脑智能科技有限公司 | A server disk performance testing method, device, equipment and storage medium |
| CN118969055A (en) * | 2024-10-12 | 2024-11-15 | 深圳市江元智造科技有限公司 | A DDR detection method, system and medium based on MTK chip |
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2022
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116991641A (en) * | 2023-06-25 | 2023-11-03 | 珠海妙存科技有限公司 | FIO-based compatibility testing methods, devices, electronic equipment and storage media |
| CN117690470A (en) * | 2023-12-07 | 2024-03-12 | 湛江科技学院 | IO performance test method of storage device |
| CN118796646A (en) * | 2024-09-12 | 2024-10-18 | 苏州元脑智能科技有限公司 | A server disk performance testing method, device, equipment and storage medium |
| CN118969055A (en) * | 2024-10-12 | 2024-11-15 | 深圳市江元智造科技有限公司 | A DDR detection method, system and medium based on MTK chip |
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