CN114883229A - Wafer boat and semiconductor device - Google Patents
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- CN114883229A CN114883229A CN202210325021.5A CN202210325021A CN114883229A CN 114883229 A CN114883229 A CN 114883229A CN 202210325021 A CN202210325021 A CN 202210325021A CN 114883229 A CN114883229 A CN 114883229A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 13
- 235000012431 wafers Nutrition 0.000 claims abstract description 54
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 17
- 229910002804 graphite Inorganic materials 0.000 claims description 17
- 239000010439 graphite Substances 0.000 claims description 17
- 238000009413 insulation Methods 0.000 claims description 13
- 239000000919 ceramic Substances 0.000 claims description 5
- 230000002596 correlated effect Effects 0.000 claims description 3
- 230000000712 assembly Effects 0.000 claims 1
- 238000000429 assembly Methods 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 30
- 238000000576 coating method Methods 0.000 abstract description 12
- 239000011248 coating agent Substances 0.000 abstract description 11
- 230000000694 effects Effects 0.000 abstract description 9
- 230000005672 electromagnetic field Effects 0.000 description 7
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 230000005284 excitation Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/673—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
- H01L21/67313—Horizontal boat type carrier whereby the substrates are vertically supported, e.g. comprising rod-shaped elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32018—Glow discharge
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/332—Coating
- H01J2237/3321—CVD [Chemical Vapor Deposition]
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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Abstract
本发明提供一种晶舟及半导体设备,晶舟多个间隔设置的舟片组,每个舟片组包括两个相对且间隔设置的舟片,相邻的两个舟片组用于与射频电源的相反电极连接,且同一个舟片组中的舟片均用于与射频电源的同一电极连接,相邻的两个舟片组之间的间隔空间用于放置晶片。本发明提供的晶舟及半导体设备,能够实现单侧放电,提高激发工艺气体发生辉光放电产生等离子体的稳定性,从而能够改善镀膜效果。
The present invention provides a wafer boat and semiconductor equipment. The wafer boat is provided with a plurality of wafer groups arranged at intervals, each wafer group includes two opposite and spaced wafer groups, and the adjacent two wafer groups are used to communicate with radio frequency Opposite electrodes of the power supply are connected, and the boats in the same boat group are used to connect with the same electrode of the radio frequency power supply, and the space between two adjacent boat groups is used for placing wafers. The wafer boat and semiconductor equipment provided by the invention can realize single-side discharge, improve the stability of exciting process gas to generate glow discharge to generate plasma, and thus can improve the coating effect.
Description
技术领域technical field
本发明涉及半导体设备技术领域,具体地,涉及一种晶舟及半导体设备。The present invention relates to the technical field of semiconductor equipment, and in particular, to a wafer boat and semiconductor equipment.
背景技术Background technique
等离子体增强化学气相沉积(Plasma Enhanced Chemical VaporDeposition,简称PECVD)设备中的管式PECVD设备通常采用石墨材质的载片舟承载晶片,载片舟包括间隔设置的多个石墨片,晶片承载于相邻的两个石墨片之间,相邻的两个石墨片分别与射频电源的正极和负电极连接,通过脉冲射频激发相邻的两个石墨片之间的工艺气体发生辉光放电产生等离子体,并通过向相邻的两个石墨片施加相反的交变电压使等离子在相邻的两个石墨片之间加速运动,从而在晶片表面进行镀膜。The tubular PECVD equipment in the plasma enhanced chemical vapor deposition (Plasma Enhanced Chemical Vapor Deposition, PECVD for short) equipment usually uses a graphite carrier boat to carry the wafer. The carrier boat includes a plurality of graphite sheets arranged at intervals. Between the two graphite sheets, the adjacent two graphite sheets are respectively connected with the positive electrode and the negative electrode of the radio frequency power supply, and the process gas between the two adjacent graphite sheets is excited by pulsed radio frequency to generate glow discharge to generate plasma, And by applying opposite alternating voltages to the two adjacent graphite sheets, the plasma is accelerated between the two adjacent graphite sheets, so as to perform coating on the surface of the wafer.
但是,随着镀膜厚度减薄的需求,传统的采用低频射频快速镀厚膜的方式已经无法满足,需要采用高频率射频,而由于高频率射频的能量衰减快,且石墨片的表面积较大,使得高频率射频在石墨片表面的能量密度偏低,无法满足石墨片的双侧放电(即,一个石墨片和与其相邻的两侧的两个石墨片之间放电),导致激发一个石墨片和与其相邻的两个石墨片之间的工艺气体发生辉光放电产生等离子体不稳定,造成晶片表面的镀膜效果变差。However, with the demand for thinning coating thickness, the traditional method of using low-frequency radio frequency to quickly thicken the film can no longer be satisfied, and high-frequency radio frequency needs to be used. Due to the fast attenuation of high-frequency radio frequency energy and the large surface area of the graphite sheet, The energy density of high-frequency radio frequency on the surface of the graphite sheet is low, which cannot satisfy the double-sided discharge of the graphite sheet (ie, the discharge between one graphite sheet and the two adjacent graphite sheets on both sides), resulting in excitation of one graphite sheet Glow discharge occurs with the process gas between the two adjacent graphite sheets, resulting in unstable plasma, resulting in poor coating effect on the surface of the wafer.
发明内容SUMMARY OF THE INVENTION
本发明旨在至少解决现有技术中存在的技术问题之一,提出了一种晶舟及半导体设备,其能够实现单侧放电,提高激发工艺气体发生辉光放电产生等离子体的稳定性,从而改善镀膜效果。The present invention aims to solve at least one of the technical problems existing in the prior art, and proposes a wafer boat and a semiconductor device, which can realize single-side discharge and improve the stability of exciting process gas to generate glow discharge to generate plasma, thereby Improve the coating effect.
为实现本发明的目的而提供一种晶舟,包括多个间隔设置的舟片组,每个所述舟片组包括两个相对且间隔设置的舟片,相邻的两个所述舟片组用于与射频电源的相反电极连接,且同一个所述舟片组中的所述舟片均用于与所述射频电源的同一电极连接,相邻的两个所述舟片组之间的间隔空间用于放置晶片。In order to realize the purpose of the present invention, a kind of crystal boat is provided, including a plurality of boat pieces arranged at intervals, and each described boat piece group includes two opposite and spaced boat pieces, and two adjacent boat pieces are provided. The group is used to connect with the opposite electrode of the radio frequency power supply, and the boat pieces in the same boat group are all used to connect with the same electrode of the radio frequency power supply, between the adjacent two boat groups. The separation space is used to place the wafer.
可选的,相邻的两个所述舟片之间的间距范围为0.5mm-100mm。Optionally, the distance between two adjacent boat pieces ranges from 0.5 mm to 100 mm.
可选的,相邻的两个所述舟片之间的间距大小与所述射频电源加载至所述舟片的射频的频率呈正相关。Optionally, the size of the distance between two adjacent boat pieces is positively correlated with the frequency of the radio frequency applied to the boat pieces by the radio frequency power supply.
可选的,所述晶舟还包括绝缘连接杆,所述舟片上设置有通孔,所述绝缘连接杆穿过所述通孔,所述舟片可拆卸地连接于所述绝缘连接杆上。Optionally, the crystal boat further includes an insulating connecting rod, the boat piece is provided with a through hole, the insulating connecting rod passes through the through hole, and the boat piece is detachably connected to the insulating connecting rod. .
可选的,所述晶舟还包括多个绝缘间距调节件,所述绝缘间距调节件设置在相邻的两个所述舟片之间,多个所述绝缘间距调节件中的部分所述绝缘间距调节件的厚度不同,所述绝缘间距调节件用于调节相邻的两个所述舟片之间的间距。Optionally, the wafer boat further includes a plurality of insulation distance adjustment pieces, the insulation distance adjustment pieces are arranged between two adjacent pieces of the boat, and some of the plurality of the insulation distance adjustment pieces are The thicknesses of the insulating spacing adjusting members are different, and the insulating spacing adjusting members are used to adjust the spacing between two adjacent boat pieces.
可选的,所述绝缘间距调节件的厚度范围为0.5mm-100mm。Optionally, the thickness of the insulating distance adjusting member ranges from 0.5mm to 100mm.
可选的,所述绝缘间距调节件为环状,所述绝缘间距调节件套设在所述绝缘连接杆上,所述绝缘间距调节件的外径大于所述通孔的孔径,且所述绝缘间距调节件的两个端面分别与相邻的两个所述舟片相抵接。Optionally, the insulating spacing adjusting member is annular, the insulating spacing adjusting member is sleeved on the insulating connecting rod, the outer diameter of the insulating spacing adjusting member is larger than the diameter of the through hole, and the The two end faces of the insulating distance adjusting member are respectively abutted with the two adjacent boat pieces.
可选的,所述舟片的材质为石墨。Optionally, the material of the boat piece is graphite.
可选的,所述绝缘连接杆和所述绝缘间距调节件的材质为陶瓷。Optionally, the insulating connecting rod and the insulating distance adjusting member are made of ceramics.
本发明还提供一种半导体设备,包括如本发明提供的所述晶舟。The present invention also provides a semiconductor device including the wafer boat provided by the present invention.
本发明具有以下有益效果:The present invention has the following beneficial effects:
本发明提供的晶舟,通过间隔设置多个舟片组,并使相邻的两个舟片组与射频电源的相反电极连接,且使同一个舟片组中的舟片均与射频电源的同一电极连接,可以使同一个舟片组中的两个舟片为同等电动势,消除同一个舟片组中的两个舟片之间的电势差,使同一个舟片组中的两个舟片之间不会形成电磁场,消除同一个舟片组中的两个舟片激发二者之间的工艺气体发生辉光放电产生等离子体的可能性,而使相邻的两个舟片组中的相邻的两个舟片可以激发二者之间的工艺气体发生辉光放电产生等离子体,从而能够实现舟片的单侧放电,提高激发工艺气体发生辉光放电产生等离子体的稳定性,进而能够改善镀膜效果。In the wafer boat provided by the present invention, a plurality of boat plate groups are arranged at intervals, and two adjacent boat plate groups are connected to the opposite electrodes of the radio frequency power supply, and the boat plates in the same boat plate group are connected to the radio frequency power supply. The same electrode connection can make the two boats in the same boat group have the same electromotive force, eliminate the potential difference between the two boats in the same boat group, make the two boats in the same boat group There will be no electromagnetic field formed between them, eliminating the possibility that the two boat plates in the same boat group excite the process gas between them to generate glow discharge to generate plasma, and make the two boat plates in the adjacent boat plate groups. Adjacent two boats can excite the process gas between them to generate glow discharge to generate plasma, so that one-side discharge of the boat can be realized, and the stability of the excited process gas to generate glow discharge to generate plasma is improved, and then Can improve the coating effect.
本发明提供的半导体设备,借助本发明提供的晶舟,能够实现单侧放电,提高激发工艺气体发生辉光放电产生等离子体的稳定性,从而能够改善镀膜效果。The semiconductor equipment provided by the present invention, with the aid of the wafer boat provided by the present invention, can realize single-side discharge, improve the stability of exciting the process gas to generate glow discharge and generate plasma, thereby improving the coating effect.
附图说明Description of drawings
图1为本发明实施例提供的晶舟的结构示意图;1 is a schematic structural diagram of a wafer boat provided by an embodiment of the present invention;
附图标记说明:Description of reference numbers:
1-晶舟;11-舟片;12-绝缘连接杆;13-绝缘间距调节件。1-crystal boat; 11-boat piece; 12-insulation connecting rod; 13-insulation spacing adjustment piece.
具体实施方式Detailed ways
为使本领域的技术人员更好地理解本发明的技术方案,下面结合附图来对本发明提供的晶舟及半导体设备进行详细描述。In order to make those skilled in the art better understand the technical solutions of the present invention, the wafer boat and semiconductor equipment provided by the present invention are described in detail below with reference to the accompanying drawings.
如图1所示,本发明实施例提供一种晶舟1,包括多个间隔设置的舟片组,每个舟片组包括两个相对且间隔设置的舟片11,相邻的两个舟片组用于与射频电源的相反电极连接,且同一个舟片组中的舟片11均用于与射频电源的同一电极连接,相邻的两个舟片组之间的间隔空间用于放置晶片。As shown in FIG. 1, an embodiment of the present invention provides a
本发明实施例提供的晶舟1,通过间隔设置多个舟片组,并使相邻的两个舟片组与射频电源的相反电极连接,且使同一个舟片组中的舟片11均与射频电源的同一电极连接,可以使同一个舟片组中的两个舟片11为同等电动势,消除同一个舟片组中的两个舟片11之间的电势差,使同一个舟片组中的两个舟片11之间不会形成电磁场,消除同一个舟片组中的两个舟片11激发二者之间的工艺气体发生辉光放电产生等离子体的可能性,而使相邻的两个舟片组中的相邻的两个舟片11可以激发二者之间的工艺气体发生辉光放电产生等离子体,从而能够实现舟片11的单侧放电,提高激发工艺气体发生辉光放电产生等离子体的稳定性,进而改善镀膜效果。In the
如图1所示,例如,晶舟1可以包括五个间隔设置的舟片组,图1的由左至右分别为第一个舟片组至第五个舟片组(本发明实施例中所说的左和右仅是图示方向,并不代表实际方向),第一个舟片组中的两个舟片11可以均用于与射频电源的负电极连接,第二个舟片组中的两个舟片11可以均用于与射频电源的正电极连接,第三个舟片组中的两个舟片11可以均用于与射频电源的负电极连接,第四个舟片组中的两个舟片11可以均用于与射频电源的正电极连接,第五个舟片组中的两个舟片11可以均用于与射频电源的负电极连接,即,同一个舟片组中的舟片11均用于与射频电源的同一电极连接,相邻的两个舟片用于与射频电源的相反电极连接。As shown in FIG. 1 , for example, the
在图1所示的五个间隔设置的舟片组中,由左至右,第一个舟片组与第二个舟片组之间的间隔空间可以用于放置晶片,第二个舟片组与第三个舟片组之间的间隔空间可以用于放置晶片,第三个舟片组与第四个舟片组之间的间隔空间可以用于放置晶片,第四个舟片组与第五个舟片组之间的间隔空间可以用于放置晶片,即,相邻的两个舟片组之间的间隔空间用于放置晶片。Among the five spaced-apart pieces shown in Figure 1, from left to right, the space between the first piece set and the second piece set can be used to place wafers, and the second piece set can be used to place wafers. The space between the third boat group and the third boat group can be used to place wafers, the space between the third boat group and the fourth boat group can be used to place wafers, and the fourth boat group and the fourth boat group can be used to place wafers. The space between the fifth boat group can be used for placing wafers, that is, the space between two adjacent boat groups is used for placing wafers.
但是,本发明实施例提供的晶舟1所包括的舟片11的数量和舟片组的数量并不以此为限。However, the number of
下面以图1的由左至右,第一个舟片组至第三个舟片组为例进行说明,由于第二个舟片组中的两个舟片11均与射频电源的正电极连接,因此,第二个舟片组中的两个舟片11的电压和相位角相同,第二个舟片组中的两个舟片11为同等电动势,消除了第二个舟片组中的两个舟片11之间的电势差,使第二个舟片组中的两个舟片11之间不会形成电磁场,消除了第二个舟片组中的两个舟片11激发二者之间的工艺气体发生辉光放电产生等离子体的可能性,而由于第一个舟片组中的两个舟片11均与射频电源的负电极连接,第三个舟片组中的两个舟片11均与射频电源的负电极连接,因此,第二个舟片组中左侧的舟片11(即,图1的由左至右第三个舟片11)与第一个舟片组中右侧的舟片11(即,图1的由左至右第二个舟片11)之间具有电势差具有电磁场,可以激发二者之间的工艺气体发生辉光放电产生等离子体,且第二个舟片组中右侧的舟片11(即,由图1的左至右第四个舟片11)与第三个舟片组中左侧的舟片11(即,由图1的左至右第五个舟片11)之间具有电势差具有电磁场,可以激发二者之间的工艺气体发生辉光放电产生等离子体,从而使得第二个舟片组中的两个舟片11均能够实现单侧放电,继而能够提高激发工艺气体发生辉光放电产生等离子体的稳定性,进而能够改善镀膜效果。In the following, from left to right in FIG. 1, the first to the third boat plate group is taken as an example for description, because the two
另外,如公开号为CN214753673U公开的一种晶舟1,在与射频电源的相反电极连接的两个舟片11之间设置绝缘件,通过绝缘件对与射频电源相反电极连接的两个舟片11之间的间隔空间进行物理阻挡的方式,来阻止与射频电源相反电极连接的两个舟片11激发二者之间的工艺气体发生辉光放电产生等离子体。由于舟片11与绝缘件是机械连接,人工装配过程会有缝隙,而此缝隙可能造成与射频电源相反电极连接的两个舟片11之间的间隔空间无法被绝缘件完全阻挡,导致与射频电源相反电极连接的两个舟片11之间的工艺气体仍然会在绝缘件的外表面形成不稳定的辉光放电区域,从而激发等离子体淀积在舟片11上,多次工艺后,会导致舟片11变脏,污染晶片。并且,常用的绝缘件为陶瓷材质,价格昂贵且难以加工,导致晶舟1的成本增加。并且,陶瓷易碎且密度较高,陶瓷的绝缘件重量较重,造成绝缘件的放置和固定困难,机械结构可靠性较差,难以大规模使用。并且,两个舟片11之间的间隔空间需要根据不同工艺的需求来进行调整,导致绝缘件的厚度也需要随之调整,而加工不同厚度的绝缘件,也会造成成本的增加。In addition, such as a kind of
而本发明实施例提供的晶舟1,是通过使同一个舟片组中的舟片11均与射频电源的同一电极连接,以使同一个舟片组中的两个舟片11为同等电动势,消除同一个舟片组中的两个舟片11之间的电势差,使同一个舟片组中的两个舟片11之间不会形成电磁场,消除同一个舟片组中的两个舟片11激发二者之间的工艺气体发生辉光放电产生等离子体的可能性,也就是说,工艺气体在同一个舟片组中的两个舟片11之间完全不会被激发发生辉光放电产生等离子体,因此,本发明实施例提供的晶舟1在多次工艺后,舟片11依然能保持干净,不会造成脏污,并且,本发明实施例提供的晶舟1,由于无需使用绝缘件,因此,自然也就不会增加成本、重量,也不会造成设计、加工及装配困难。In the
在本发明一优选实施例中,相邻的两个舟片11之间的间距范围可以为0.5mm-100mm。In a preferred embodiment of the present invention, the distance between two
在实际应用中,相邻的两个舟片11之间的间距,可以根据不同工艺的工艺需求进行调整,以能够在镀膜工艺均匀性、承载晶片数量和电磁场稳定性之间进行多重组合搭配。In practical applications, the distance between two
在本发明一优选实施例中,相邻的两个舟片11之间的间距大小可以与射频电源加载至舟片11的射频的频率呈正相关。In a preferred embodiment of the present invention, the distance between two
也就是说,射频电源加载至舟片11的射频的频率越大,相邻的两个舟片11之间的间距越大,射频电源加载至舟片11的射频的频率越小,相邻的两个舟片11之间的间距越小。That is to say, the greater the frequency of the radio frequency applied by the RF power source to the
如图1所示,在本发明一优选实施例中,晶舟1可以还包括绝缘连接杆12,舟片11上设置有通孔,绝缘连接杆12穿过通孔,舟片11可拆卸地连接于绝缘连接杆12上。As shown in FIG. 1 , in a preferred embodiment of the present invention, the
也就是说,绝缘连接杆12穿过多个舟片11上的通孔,多个舟片11通过绝缘连接杆12连接。通过使多个舟片11可拆卸地连接于绝缘连接杆12上,可以便于对相邻的两个舟片11之间的间距进行调节,并且可以便于对舟片11进行更换。That is to say, the insulating connecting
如图1所示,在本发明一优选实施例中,晶舟1可以还包括多个绝缘间距调节件13,绝缘间距调节件13设置在相邻的两个舟片11之间,多个绝缘间距调节件13中的部分绝缘间距调节件13的厚度不同,绝缘间距调节件13用于对相邻的两个舟片11之间的间距进行调节。As shown in FIG. 1 , in a preferred embodiment of the present invention, the
通过将不同厚度的绝缘间距调节件13设置在相邻的两个舟片11之间,可以改变相邻的两个舟片11之间的间距,对相邻的两个舟片11之间的间距进行调节,以使晶舟1能够适用于不同工艺。By arranging the insulating
在本发明一优选实施例中,绝缘间距调节件13的厚度范围可以为0.5mm-100mm。In a preferred embodiment of the present invention, the thickness of the insulating
这样能够实现相邻的两个舟片11之间的间距范围为0.5mm-100mm。In this way, the distance between two
在本发明一优选实施例中,绝缘间距调节件13可以为环状,绝缘间距调节件13可以套设在绝缘连接杆12上,绝缘间距调节件13的外径大于通孔的孔径,且绝缘间距调节件13的两个端面分别与相邻的两个舟片11相抵接。In a preferred embodiment of the present invention, the insulating
通过使绝缘间距调节件13以为环状,并使绝缘间距调节件13的外径大于舟片11上的通孔的孔径,这样当绝缘间距调节件13套设在绝缘连接杆12上时,可以避免绝缘间距调节件13从舟片11上的通孔穿过,以使绝缘间距调节件13的两个端面能够分别与相邻的两个舟片11相抵接,从而能够借助绝缘间距调节件13对相邻的两个舟片11之间的间距进行调节。By making the insulating
在本发明一优选实施例中,舟片11的材质可以为石墨。In a preferred embodiment of the present invention, the material of the
在本发明一优选实施例中,绝缘连接杆12和绝缘间距调节件13的材质可以为陶瓷。In a preferred embodiment of the present invention, the insulating connecting
本发明实施例还提供一种半导体设备,包括如本发明实施例提供的晶舟1。The embodiment of the present invention further provides a semiconductor device, including the
本发明实施例提供的半导体设备,借助本发明实施例提供的晶舟1,能够实现单侧放电,提高激发工艺气体发生辉光放电产生等离子体的稳定性,从而能够改善镀膜效果。The semiconductor device provided by the embodiment of the present invention, with the
综上所述,本发明实施例提供的晶舟1及半导体设备,能够实现单侧放电,提高激发工艺气体发生辉光放电产生等离子体的稳定性,从而能够改善镀膜效果。To sum up, the
可以理解的是,以上实施方式仅仅是为了说明本发明的原理而采用的示例性实施方式,然而本发明并不局限于此。对于本领域内的普通技术人员而言,在不脱离本发明的精神和实质的情况下,可以做出各种变形和改进,这些变形和改进也视为本发明的保护范围。It can be understood that the above embodiments are only exemplary embodiments adopted to illustrate the principle of the present invention, but the present invention is not limited thereto. For those skilled in the art, without departing from the spirit and essence of the present invention, various modifications and improvements can be made, and these modifications and improvements are also regarded as the protection scope of the present invention.
Claims (10)
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
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| CN202210325021.5A CN114883229A (en) | 2022-03-29 | 2022-03-29 | Wafer boat and semiconductor device |
| PCT/CN2023/082460 WO2023185524A1 (en) | 2022-03-29 | 2023-03-20 | Wafer cassette and semiconductor device |
| TW112110279A TWI872484B (en) | 2022-03-29 | 2023-03-20 | Boat and semiconductor equipment |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210325021.5A CN114883229A (en) | 2022-03-29 | 2022-03-29 | Wafer boat and semiconductor device |
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| CN (1) | CN114883229A (en) |
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| WO2023185524A1 (en) * | 2022-03-29 | 2023-10-05 | 北京北方华创微电子装备有限公司 | Wafer cassette and semiconductor device |
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| CN119581307A (en) * | 2024-11-22 | 2025-03-07 | 北京北方华创微电子装备有限公司 | Carrier boat and semiconductor process equipment |
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|---|---|---|---|---|
| KR101709336B1 (en) * | 2015-12-29 | 2017-02-24 | (주)피앤테크 | PECVD apparatus for manufacturing solar cell |
| CN214753673U (en) * | 2021-04-09 | 2021-11-16 | 深圳市捷佳伟创新能源装备股份有限公司 | Trays and slides |
| KR20210149541A (en) * | 2020-06-02 | 2021-12-09 | 주식회사 한화 | Batch Type Boat Apparatus |
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| US20050211264A1 (en) * | 2004-03-25 | 2005-09-29 | Tokyo Electron Limited Of Tbs Broadcast Center | Method and processing system for plasma-enhanced cleaning of system components |
| US7629267B2 (en) * | 2005-03-07 | 2009-12-08 | Asm International N.V. | High stress nitride film and method for formation thereof |
| KR102275905B1 (en) * | 2020-10-26 | 2021-07-12 | 주식회사 한화 | Boat Apparatus with Seperated Electrode Plate |
| CN214505457U (en) * | 2020-12-15 | 2021-10-26 | 苏州阿特斯阳光电力科技有限公司 | Coated graphite boat |
| CN114883229A (en) * | 2022-03-29 | 2022-08-09 | 北京北方华创微电子装备有限公司 | Wafer boat and semiconductor device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101709336B1 (en) * | 2015-12-29 | 2017-02-24 | (주)피앤테크 | PECVD apparatus for manufacturing solar cell |
| KR20210149541A (en) * | 2020-06-02 | 2021-12-09 | 주식회사 한화 | Batch Type Boat Apparatus |
| CN214753673U (en) * | 2021-04-09 | 2021-11-16 | 深圳市捷佳伟创新能源装备股份有限公司 | Trays and slides |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2023185524A1 (en) * | 2022-03-29 | 2023-10-05 | 北京北方华创微电子装备有限公司 | Wafer cassette and semiconductor device |
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