Space comprehensive environment in-situ and semi-in-situ test shielding device and test shielding method thereof
Technical Field
The invention relates to the technical field of space environment simulation and test, in particular to a space comprehensive environment in-situ and semi-in-situ test shielding device and a test shielding method thereof.
Background
In order to timely and accurately grasp the evolution rule of the material, the device and the system component module in the extreme comprehensive environment such as vacuum, high and low temperature, irradiation (sun, ultraviolet, charged particles and the like), the test analysis can be carried out in a position, an environment state unchanged (in situ) and a position changeable (semi-in-situ) mode. Moreover, the test on the aspect is mainly remained in a laboratory state, and instruments and equipment work in a conventional environment and cannot meet the in-situ/semi-in-situ test requirement.
Disclosure of Invention
The invention is vacuum, high and low temperature, solar radiation, ultraviolet radiation, charged particle radiation and other space extreme environmental factors facing ground simulation, and can perform in-situ and semi-in-situ test on samples in the test, so the invention provides a space comprehensive environment in-situ and semi-in-situ test shielding device and a test shielding method thereof, and the invention provides the following technical scheme:
a spatially integrated environmental in-situ and semi-in-situ test shielding apparatus, the apparatus comprising: the test device comprises test equipment, a driving mechanism and a remote control system, wherein the test equipment is carried on the driving mechanism, and the remote control system controls the driving mechanism;
the test equipment comprises a test equipment host, a test equipment probe and a test equipment cabin penetrating cable, wherein the test equipment cabin penetrating cable is connected with the test equipment host and the test equipment probe; the testing equipment host is positioned in the comprehensive cabin container, and the periphery of the testing equipment host is provided with a radiation protection structure;
the driving mechanism comprises an in-situ test equipment driving mechanism and a semi-in-situ test equipment driving mechanism; the in-situ test equipment driving mechanism is integrated on the sample table, and the semi-in-situ test equipment driving mechanism is installed in the in-situ auxiliary cabin.
Preferably, the device further comprises a test equipment driving mechanism cabin penetrating cable, wherein the test equipment driving mechanism cabin penetrating cable comprises an in-situ test equipment driving mechanism cabin penetrating cable and a semi-in-situ test equipment driving mechanism cabin penetrating cable;
the driving mechanism and the remote control system are connected by an in-situ test equipment driving mechanism cabin penetrating cable and a semi-in-situ test equipment driving mechanism cabin penetrating cable for transmission communication.
Preferably, the test equipment probes include probes of in situ test equipment and probes of semi-in situ test equipment;
the in-situ test equipment is used for tolerating particle irradiation and comprises a discharge pulse tester, and an electrical property test is carried out in the irradiation process;
the probe of the semi-in-situ test equipment is used for intolerance or weak particle irradiation tolerance, including a Raman spectrometer, a fluorescence spectrometer and an optical performance tester, and needs to be tested in an irradiation intermittent stage.
Preferably, the radiation protection structure is provided with a radiation protection door for test and equipment maintenance personnel to enter and exit.
Preferably, the in-situ test equipment driving mechanism comprises a folding assembly, a Y-direction moving assembly and an X/Z-direction moving assembly, drives the in-situ test equipment probe to move in X, Y, Z directions, has multi-point test capability, and can be folded and folded after the test is finished.
Preferably, the driving mechanism of the semi-in-situ testing equipment comprises a primary extending component, a secondary extending component and a rotating component, wherein the primary extending component is a large-stroke rough adjusting mechanism, the secondary extending component is a short-stroke fine adjusting mechanism, the number of probes can be carried on the rotating component to be not less than 3, and when a specified performance test is carried out, the probes are rotated to positions corresponding to a sample testing surface.
Preferably, the radiation protection structure comprises a framework and a shielding layer, wherein the framework adopts a steel frame structure, and the shielding layer is built by adopting an aluminum plate and a lead brick.
A space comprehensive environment in-situ and semi-in-situ test shielding method comprises the following steps:
step 1: clamping a sample to be tested on a sample table, mounting an in-situ test equipment probe on an in-situ test equipment driving mechanism, and mounting a semi-in-situ test equipment probe on a semi-in-situ test equipment driving mechanism;
step 2: a tester enters the radiation protection structure to start a test equipment host and set parameters so that the tester can acquire signals through a test equipment cabin penetrating cable; after preparation is completed, closing the cabin door to start a test;
step 3: after the test is finished, the tester enters the radiation protection structure again, and test data are exported through the test equipment host machine for subsequent processing and analysis.
Preferably, during the test, the particle irradiation dose rate in the in situ secondary chamber is typically much lower than that of the primary chamber and the temperature is near room temperature.
Preferably, the in-situ test works stably in vacuum 10-3Pa magnitude, high and low temperature 100K-473K, solar irradiation 0.5-2 solar constants, ultraviolet irradiation 0-3.5 vacuum ultraviolet constants and charged particle irradiation environment 1.2MeV electron irradiation sources.
The invention has the following beneficial effects:
the in-situ/semi-in-situ test system has an optical and electrical test function; the in-situ test system can stably and reliably work in vacuum (10-3 Pa level), high and low temperature (100K-473K), solar irradiation (0.5-2 solar constants), ultraviolet irradiation (0-3.5 vacuum ultraviolet constants), charged particle irradiation environment (1.2 MeV electron irradiation source: electron highest energy is not less than 1.2MeV, highest current intensity is not less than 10mA@1.0MeV,200keV electron irradiation source: electron highest energy is not less than 200keV, highest current intensity is not less than 50mA@200keV, proton irradiation source: terminal voltage is 0.1-2 MV, proton beam intensity is not less than 100 mu A@ total proton energy range); the test equipment driving mechanism has the capability of simultaneously carrying a plurality of probes. The tested sample is arranged on a sample table, and is subjected to space extreme environment assessment such as simulated vacuum, high and low temperature, solar irradiation, ultraviolet irradiation, charged particle irradiation and the like in the comprehensive cabin container, and in-situ/semi-in-situ test is carried out by a test system in the test process.
The invention provides a space comprehensive irradiation environment in-situ/semi-in-situ test method, which is oriented to space extreme environment factors such as vacuum, high and low temperature, solar irradiation, ultraviolet irradiation, charged particle irradiation and the like of ground simulation, can test samples in-situ and semi-in-situ during test,
drawings
FIG. 1 is a schematic diagram of the composition of an in situ/semi-in situ test system for a spatially integrated irradiation environment;
FIG. 2 is a schematic diagram of the drive mechanism of an in situ test equipment mounted on a sample stage;
FIG. 3 is a schematic diagram of the drive mechanism of the semi-in-situ test equipment mounted in the in-situ sub-bay;
fig. 4 instrument shielding diagram.
Detailed Description
The present invention will be described in detail with reference to specific examples.
First embodiment:
according to the embodiments shown in fig. 1 to 4, the specific optimization technical scheme adopted by the present invention to solve the above technical problems is as follows: the invention relates to a space comprehensive environment in-situ and semi-in-situ test shielding device and a test shielding method thereof.
A spatially integrated environmental in-situ and semi-in-situ test shielding apparatus, the apparatus comprising: test equipment, a driving mechanism and a remote control system 10, wherein the driving mechanism is provided with the test equipment, and the remote control system controls the driving mechanism;
the test equipment comprises a test equipment host machine 2, a test equipment probe 3 and a test equipment cabin penetrating cable 4, wherein the test equipment cabin penetrating cable 4 is connected with the test equipment host machine 2 and the test equipment probe 3; the testing equipment host machine 2 is positioned in the comprehensive cabin container, and the periphery of the testing equipment host machine 2 is provided with a radiation protection structure 7;
the driving mechanism comprises an in-situ test equipment driving mechanism 5 and a semi-in-situ test equipment driving mechanism 6; the in-situ test equipment driving mechanism 5 is integrated on the sample platform 1-1, and the semi-in-situ test equipment driving mechanism 6 is arranged in the in-situ auxiliary cabin 1-2.
The device also comprises a test equipment driving mechanism cabin penetrating cable, wherein the test equipment driving mechanism cabin penetrating cable comprises an in-situ test equipment driving mechanism cabin penetrating cable 8 and a semi-in-situ test equipment driving mechanism cabin penetrating cable 9;
the driving mechanism and the remote control system are connected by an in-situ test equipment driving mechanism cabin penetrating cable 8 and a semi-in-situ test equipment driving mechanism cabin penetrating cable 9 for transmission communication.
The tested sample is arranged on a sample table 1-1, and is subjected to space extreme environment examination such as simulated vacuum, high and low temperature, solar irradiation, ultraviolet irradiation, charged particle irradiation and the like in a comprehensive cabin container 1, and in-situ/semi-in-situ test is carried out by a test system in the test process.
The test equipment probe 3 comprises a probe 3-1 of in-situ test equipment and a probe 3-2 of semi-in-situ test equipment;
the in-situ test equipment is used for tolerating particle irradiation and comprises a discharge pulse tester, and an electrical property test is carried out in the irradiation process;
the probe of the semi-in-situ test equipment is used for intolerance or weak particle irradiation tolerance, including a Raman spectrometer, a fluorescence spectrometer and an optical performance tester, and needs to be tested in an irradiation intermittent stage.
The radiation protection structure 7 is provided with a radiation protection door for test and equipment maintenance personnel to enter and exit.
The in-situ test equipment driving mechanism 5 comprises a folding assembly 5-1, a Y-direction moving assembly 5-2 and an X/Z-direction moving assembly 5-3, can drive the in-situ test equipment probe to move in X, Y, Z directions, has multi-point test capability, can be folded and retracted after the test is finished, and reduces the occupied space.
The semi-in-situ test equipment driving mechanism 6 comprises a primary extending component 6-1, a secondary extending component 6-2 and a rotating component 6-3, wherein the primary extending component is a large-stroke rough adjusting mechanism, a probe (3-2) can be driven to rapidly extend out of the in-situ auxiliary cabin, the secondary extending component is a short-stroke fine adjusting mechanism and is used for finely adjusting the distance between the probe and a sample, the number of probes can be carried on the rotating component to be not less than 3, and when a specified performance test is carried out, the probe is rotated to a position corresponding to a test surface of the sample.
The radiation protection structure 7 comprises a framework 7-1 and a shielding layer 7-2, wherein the framework adopts a steel frame structure, and the shielding layer is formed by building an aluminum plate and a lead brick.
A space comprehensive environment in-situ and semi-in-situ test shielding method comprises the following steps:
step 1: clamping a sample to be tested on a sample table, mounting an in-situ test equipment probe on an in-situ test equipment driving mechanism, and mounting a semi-in-situ test equipment probe on a semi-in-situ test equipment driving mechanism;
step 2: a tester enters the radiation protection structure to start a test equipment host and set parameters so that the tester can acquire signals through a test equipment cabin penetrating cable; after preparation is completed, closing the cabin door to start a test;
step 3: after the test is finished, the tester enters the radiation protection structure again, and test data are exported through the test equipment host machine for subsequent processing and analysis.
During the test, the particle irradiation dose rate in the in-situ auxiliary cabin is usually much lower than that of the main cabin, and the temperature is close to room temperature.
The in-situ test is carried out under the conditions of vacuum of 10-3Pa magnitude, high and low temperature of 100K-473K, solar irradiation of 0.5-2 solar constants, ultraviolet irradiation of 0-3.5 vacuum ultraviolet constants and charged particle irradiation environment of 1.2MeV electron irradiation sources.
The above-mentioned embodiments are only preferred embodiments of a space integrated environment in-situ and semi-in-situ test shielding device and a test shielding method thereof, and the protection scope of a space integrated environment in-situ and semi-in-situ test shielding device and a test shielding method thereof is not limited to the above-mentioned embodiments, and all technical solutions under the concept belong to the protection scope of the invention. It should be noted that modifications and variations can be made by those skilled in the art without departing from the principles of the present invention, which is also considered to be within the scope of the present invention.