CN114840404A - Fast OTA test method and device for small and low-power IoT devices - Google Patents

Abstract

The invention discloses a fast OTA test method and device for small and low-power IoT devices, the method comprises: presetting a test grid layout; obtaining multiple random TRP or TIS test results under the test grid layout Standard deviation, as the judgment index value of test accuracy; determine the percentage reduction of the total number of test grid points of the test grid layout relative to the standard TIS test grid, and use it as the judgment index value of test duration and/or test speed; judgment Whether the test accuracy, test duration and/or test speed are within the corresponding limit values. If all are determined to be yes, determine that the current test grid layout meets the requirements for rapid OTA performance testing of small and low-power IoT devices ; otherwise, it is determined that it is not satisfied, and the grid density and layout need to be optimized. The invention optimizes and reduces the test time to the greatest extent under the premise of satisfying the test accuracy, and meets the OTA performance test requirements of small and low-power IoT devices.

Description

Fast OTA test method and device for small and low-power IoT devices

technical field

The invention relates to the technical field of OTA testing, in particular to a fast OTA testing method and device for small and low-power IoT devices.

Background technique

This section is intended to provide a background or context to the embodiments of the invention recited in the claims. The descriptions herein are not admitted to be prior art by inclusion in this section.

Mobile Internet and Internet of Things services will become the main driving force for the development of mobile communications. For IoT business scenarios, it is mainly oriented to the communication between things and things and people and things, not only involving ordinary individual users, but also covering a large number of different types of industry users. Fast, accurate and strict measurement of the over-the-air (OTA) performance of IoT devices is an important part of the overall performance evaluation of IoT devices. The continuous emergence of massive wireless communication device connections and diverse IoT business scenarios has brought new challenges to the OTA performance test accuracy, test efficiency, and test functions of the OTA system.

As a standard test method for wireless communication devices such as smartphones and notebook computers, OTA testing provides an objective basis for performance comparison between devices under test. Traditional single-input single-output (SISO) OTA testing, including total radiated power (TRP) and total isotropic sensitivity (TIS) measurements. For the traditional OTA performance test method of wireless communication equipment, the current standard specifies a uniform test grid, and the TRP/TIS test grid resolution is 15°/30°, respectively. During the complete TRP/TIS test process, the device under test is required to be configured in the maximum power transmitting state. For 4G smartphones, the typical TRP/TIS test durations are 45 minutes and over 60 minutes, respectively; for 5G smartphones, the typical test durations are 60 and 120 minutes, respectively.

On the other hand, IoT business scenarios are rich, diverse and emerging one after another, with huge differences in business characteristics. Massive business scenario requirements and access device types not only promote technological progress in the field of wireless testing, but also bring new technical challenges and opportunities. For a large number of small and low-power IoT devices, including smart watches, smart meters, parking meters, pet tracking devices, etc., there is no need to be in the maximum power transmission state for a long time, but only at the maximum power for a short period of time at certain times. duty cycle transmitter. Such devices typically have very little power amplifier heat dissipation and low capacity batteries. If the traditional (15°/30°) test grid layout and related test methods are used, the device under test will be automatically shut down due to limited battery capacity during the test process, or even deformed and damaged due to overheating. Therefore, the traditional OTA test method and test grid layout are not suitable for the OTA performance test of a large number of small and low-power IoT devices due to the long test time. At present, there is no OTA test method in the industry for such low duty cycle transmitting devices.

SUMMARY OF THE INVENTION

Embodiments of the present invention provide a fast OTA test method for small and low-power IoT devices, so as to solve the problem that the traditional OTA test method and test grid layout are not suitable for OTA performance testing of a large number of small and low-power IoT devices technical issues, the method includes:

Preset test grid layout;

Obtain the standard deviation of multiple random TRP or TIS test results under the preset test grid layout, and use the standard deviation as the judgment index value of the test accuracy;

Determine the percentage reduction of the total number of test grid points of the test grid layout relative to the standard TIS test grid, and use the percentage reduction of the total number of test grid points as a judgment index value of test duration and/or test speed;

Determine whether the determination index value of the test accuracy and the determination index value of the test duration and/or test speed are respectively within the corresponding limit value range, when both are determined to be yes, determine that the current test grid layout meets the requirements of small Requirements for rapid OTA performance testing of low-power IoT devices; when the determination is no, it is determined that the current test grid layout cannot meet the requirements for rapid OTA performance testing of small low-power IoT devices.

Embodiments of the present invention also provide a fast OTA test device for small and low-power IoT devices, so as to solve the problem that the traditional OTA test method and test grid layout are not suitable for the OTA performance of a large number of small and low-power IoT devices Testing for technical issues, the device includes:

Test grid layout setting module, used to preset test grid layout;

Judgment index determination module, used to obtain the standard deviation of multiple random TRP or TIS test results under the preset test grid layout, and use the standard deviation as the judgment index value of test accuracy; determine the test The percentage reduction of the grid layout relative to the total number of test grid points of the standard TIS test grid, and the percentage reduction of the total number of test grid points is used as the judgment index value of the test duration and/or test speed;

The judgment module is used to judge whether the judgment index value of the test accuracy and the judgment index value of the test duration and/or the test speed are respectively within the corresponding limited value range, and when both are judged to be yes, determine the current test The grid layout meets the requirements for the rapid test of the OTA performance of the small and low-power IoT devices; when the determination is negative, it is determined that the current test grid layout cannot meet the requirements for the rapid test of the OTA performance of the small and low-power IoT devices.

An embodiment of the present invention further provides a computer device, including a memory, a processor, and a computer program stored in the memory and running on the processor, when the processor executes the computer program, the above-mentioned small-sized and low-power consumption-oriented object is implemented Fast OTA testing method for connected devices.

Embodiments of the present invention further provide a computer-readable storage medium, where the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, implements the above-mentioned fast OTA testing method for small and low-power IoT devices .

An embodiment of the present invention further provides a computer program product, the computer program product includes a computer program, and when the computer program is executed by a processor, implements the above-mentioned fast OTA testing method for small and low-power IoT devices.

In the embodiment of the present invention, in contrast to the traditional OTA test method and test grid layout in the prior art, the technical solution is not applicable to the OTA performance test of a large number of small and low-power IoT devices due to the excessively long test time. By comparison, through the preset test grid layout; obtain the standard deviation of multiple random TRP or TIS test results under the preset test grid layout, and use the standard deviation as the judgment index value of the test accuracy; Determine the percentage reduction of the total number of test grid points of the test grid layout relative to the standard TIS test grid, and use the percentage reduction of the total number of test grid points as the judgment index value of the test duration and/or test speed; Whether the judgment index value of the test accuracy and the judgment index value of the test duration and/or the test speed are respectively within the corresponding limit value range, when both are judged to be yes, it is determined that the current test grid layout meets the requirements of small and low power consumption Requirements for rapid testing of OTA performance of IoT devices; when the determination is no, it is determined that the current test grid layout cannot meet the requirements for rapid testing of OTA performance of small and low-power IoT devices. Using the present invention to replace the traditional standard TIS test method can optimize and reduce the test time to the greatest extent on the premise of satisfying the test accuracy, thereby meeting the OTA performance test requirements of small and low-power IoT devices.

Description of drawings

In order to explain the embodiments of the present invention or the technical solutions in the prior art more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. For those of ordinary skill in the art, other drawings can also be obtained according to these drawings without creative efforts. In the attached image:

FIG. 1 is a flowchart 1 of a fast OTA test method for small and low-power IoT devices in an embodiment of the present invention;

FIG. 2 is a flowchart 2 of a fast OTA test method for small and low-power IoT devices in an embodiment of the present invention;

FIG. 3 is a flowchart 3 of a fast OTA test method for small and low-power IoT devices in an embodiment of the present invention;

FIG. 4 is a structural block diagram of a fast OTA test apparatus for small and low-power IoT devices in an embodiment of the present invention.

Detailed ways

In order to make the purposes, technical solutions and advantages of the embodiments of the present invention more clearly understood, the embodiments of the present invention will be further described in detail below with reference to the accompanying drawings. Here, the exemplary embodiments of the present invention and their descriptions are used to explain the present invention, but not to limit the present invention.

FIG. 1 is a flowchart of a fast OTA test method for small and low-power IoT devices in an embodiment of the present invention. As shown in FIG. 1 , the fast OTA test method for small and low-power IoT devices includes:

Step 101: preset test grid layout;

Step 102: Obtain the standard deviation of multiple random TRP or TIS test results under the preset test grid layout, and use the standard deviation as the judgment index value of the test accuracy;

Step 103: Determine the percentage reduction of the test grid layout relative to the total number of test grid points of the standard TIS test grid (referring to 30°/30° uniform distribution, 62 test grid points). The percentage reduction of the total number of grid points is used as a judgment index value for the test duration and/or test speed;

Step 104: Determine whether the judgment index value of the test accuracy and the judgment index value of the test duration and/or the test speed are respectively within the corresponding limited value ranges:

Step 105: when both are determined to be yes, determine that the current test grid layout meets the requirements of the OTA performance rapid test of small and low-power IoT devices;

Step 106 : when the determination is no, it is determined that the current test grid layout cannot meet the requirements of the rapid test of the OTA performance of the small and low-power IoT device. At this point, the grid density and layout need to be optimized.

In the embodiment of the present invention, as shown in Figure 2, it also includes:

Step 201: Cross-distribute the test grid points on the adjacent azimuth planes (phi planes) in the test grid to improve the test accuracy.

In the embodiment of the present invention, the standard deviation of the TRP or TIS test result is determined as follows:

Taking the coordinate origin of the test system as the center, rotate the small low-power IoT device randomly for many times, and calculate the standard deviation of the TRP or TIS test results of the small low-power IoT device obtained by multiple random rotations.

Specifically, it is necessary to perform a large number of random rotations to obtain a large number of TRP or TIS test results, and then calculate the standard deviation of the large number of random TRP or TIS test results. The random rotation here is to change the relative angular relationship between the small low-power IoT device and the set test grid layout, so as to obtain the corresponding TRP value or TIS value.

In the embodiment of the present invention, the limit value corresponding to the determination index value of the test accuracy is preferably 0.5dB, and the limit value range is less than or equal to 0.5dB.

In the embodiment of the present invention, the limit value corresponding to the determination index value of the test duration and/or test speed is preferably 50%, and the limit value range is greater than or equal to 50%.

In the embodiment of the present invention, after it is determined that the requirements of the limited value range are met, a plurality of test grid layouts that meet the requirements of the limited value range may be obtained. In this case, the method may further include:

As shown in FIG. 3, step 301: compare the standard deviations of multiple random TRP test results under multiple test grid layouts. If the difference between the standard deviations of the two TRP test results is within the preset Within the threshold, select a test grid layout with fewer test grid points in total. This allows the optimal test grid layout to be obtained from multiple test grid layouts that satisfy the bounded value range requirements.

Specifically, under similar TRP standard deviations, a grid layout with fewer test grid points is selected; wherein, similar TRP standard deviations refer to the difference between the TRP standard deviations of 0.1 for different test grid layouts Within dB, that is, the preset threshold value is 0.1 dB.

In the embodiment of the present invention, after it is determined that the requirements of the limited value range are met, a plurality of test grid layouts that meet the requirements of the limited value range may be obtained. In this case, the method may further include:

The standard deviations of multiple random TRP test results under the test grid layout with the same total number of test grid points are compared, and the test grid layout with the smallest standard deviation of the TRP test results is selected.

In the embodiment of the present invention, the test grid layout preferably has a grid step of 45° on the elevation plane, a grid step of 36° on the azimuth plane, and a test grid with grids on adjacent azimuth planes that are cross-distributed. layout. That is, the test grid layout is preferably 45/36 (theta/phi), and the grids on the adjacent azimuth planes (phi planes) are cross-distributed.

In the embodiment of the present invention, the same test grid layout is selected for the TRP test and the TIS test.

The results of the analysis of different test grid layouts are illustrated below with tabular data (Table 1, Table 2, and Table 3).

Table 1 Analysis results of different test grid layouts using the method of the present invention

Table 2 Cross grid layout proposed by the present invention

Table 3 Standard grids specified by current standards

Tables 2 and 3 compare the standard grid specified by the current standard and the cross grid layout proposed by the present invention.

The embodiments of the present invention also provide a fast OTA testing device for small and low-power IoT devices, as described in the following embodiments. Since the principle of the device to solve the problem is similar to the fast OTA test method for small low-power IoT devices, the implementation of this device can refer to the implementation of the fast OTA test method for small low-power IoT devices. Repeat.

FIG. 4 is a structural block diagram of a fast OTA test device for small and low-power IoT devices in an embodiment of the present invention. As shown in FIG. 4 , the device includes:

Test grid layout setting module 02, used for preset test grid layout;

The judgment index determination module 04 is used to obtain the standard deviation of multiple random TRP or TIS test results under the preset test grid layout, and use the standard deviation as the judgment index value of the test accuracy; determine the The percentage reduction of the test grid layout relative to the total number of test grid points of the standard TIS test grid, and the percentage reduction of the total number of test grid points is used as the judgment index value of the test duration and/or test speed;

Judgment module 06, for judging whether the judgment index value of the test accuracy and the judgment index value of the test duration and/or the test speed are respectively within the corresponding limit value range, when both are judged to be yes, determine the current The test grid layout meets the requirements for rapid OTA performance testing of small low-power IoT devices; when the determination is negative, it is determined that the current test grid layout cannot meet the requirements for rapid OTA performance testing of small low-power IoT devices.

In this embodiment of the present invention, the test grid layout setting module is further used for:

Cross-distribute test grid points on adjacent azimuth planes in the test grid.

In the embodiment of the present invention, the standard deviation of the TRP or TIS test result is determined as follows:

Taking the coordinate origin of the test system as the center, rotate the small low-power IoT device randomly for many times, and calculate the standard deviation of the TRP or TIS test results of the small low-power IoT device obtained by multiple random rotations.

In the embodiment of the present invention, the limit value corresponding to the determination index value of the test accuracy is 0.5dB, and the limit value range is less than or equal to 0.5dB.

In the embodiment of the present invention, the limit value corresponding to the determination index value of the test duration and/or the test speed is 50%, and the limit value range is greater than or equal to 50%.

In this embodiment of the present invention, the test grid layouts that meet the requirements of the limited value range include multiple;

The judgment module is also used to:

Compare the standard deviations of multiple random TRP test results under multiple test grid layouts that meet the requirements of the limited value range. If the difference between the standard deviations of the two TRP test results is within the preset threshold , select a test grid layout with fewer test grid points.

In this embodiment of the present invention, the preset threshold is 0.1 dB.

In the embodiment of the present invention, the judgment module is further used for:

The standard deviations of multiple random TRP test results under the test grid layout with the same total number of test grid points are compared, and the test grid layout with the smallest standard deviation of the TRP test results is selected.

In the embodiment of the present invention, the test grid layout preferably has a grid step of 45° on the elevation plane, a grid step of 36° on the azimuth plane, and a test grid with grids on adjacent azimuth planes that are cross-distributed. layout.

In the embodiment of the present invention, the same test grid layout is selected for the TRP test and the TIS test.

An embodiment of the present invention further provides a computer device, including a memory, a processor, and a computer program stored in the memory and running on the processor, when the processor executes the computer program, the above-mentioned small-sized and low-power consumption-oriented object is implemented Fast OTA testing method for connected devices.

Embodiments of the present invention further provide a computer-readable storage medium, where the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, implements the above-mentioned fast OTA testing method for small and low-power IoT devices .

An embodiment of the present invention further provides a computer program product, the computer program product includes a computer program, and when the computer program is executed by a processor, implements the above-mentioned fast OTA testing method for small and low-power IoT devices.

In the embodiment of the present invention, in contrast to the traditional OTA test method and test grid layout in the prior art, the technical solution is not applicable to the OTA performance test of a large number of small and low-power IoT devices due to the excessively long test time. By comparison, through the preset test grid layout; obtain the standard deviation of multiple random TRP or TIS test results under the preset test grid layout, and use the standard deviation as the judgment index value of the test accuracy; Determine the percentage reduction of the total number of test grid points of the test grid layout relative to the standard TIS test grid, and use the percentage reduction of the total number of test grid points as the judgment index value of the test duration and/or test speed; Whether the judgment index value of the test accuracy and the judgment index value of the test duration and/or the test speed are respectively within the corresponding limit value range, when both are judged to be yes, it is determined that the current test grid layout meets the requirements of small and low power consumption Requirements for rapid testing of OTA performance of IoT devices; when it is determined to be no, it is determined that the current test grid layout cannot meet the requirements for rapid testing of OTA performance of small and low-power IoT devices, and the present invention can replace the traditional standard TIS test method , Under the premise of meeting the test accuracy, the test time is optimized to the greatest extent, so as to meet the OTA test requirements of small and low-power IoT devices. By reducing the density of OTA test grid points and optimizing the test grid distribution, the OTA performance of small low-power IoT devices can be quickly measured.

As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) having computer-usable program code embodied therein.

The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block in the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to the processor of a general purpose computer, special purpose computer, embedded processor or other programmable data processing device to produce a machine such that the instructions executed by the processor of the computer or other programmable data processing device produce Means for implementing the functions specified in a flow or flow of a flowchart and/or a block or blocks of a block diagram.

These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory result in an article of manufacture comprising instruction means, the instructions The apparatus implements the functions specified in the flow or flow of the flowcharts and/or the block or blocks of the block diagrams.

These computer program instructions can also be loaded on a computer or other programmable data processing device to cause a series of operational steps to be performed on the computer or other programmable device to produce a computer-implemented process such that The instructions provide steps for implementing the functions specified in the flow or blocks of the flowcharts and/or the block or blocks of the block diagrams.

The specific embodiments described above further describe the purpose, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above-mentioned specific embodiments are only specific embodiments of the present invention, and are not intended to limit the scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included within the protection scope of the present invention.

Claims (23)

1. A rapid OTA test method for small-sized low-power-consumption Internet of things equipment is characterized by comprising the following steps:

presetting a test grid layout;

obtaining the standard deviation of a plurality of times of random TRP or TIS test results under the preset test grid layout, and taking the standard deviation as a judgment index value of the test precision;

determining the reduction percentage of the total number of the test grid points of the test grid layout relative to the standard TIS test grid, and taking the reduction percentage of the total number of the test grid points as a judgment index value of the test duration and/or the test speed;

judging whether the judgment index values of the test precision and the test duration and/or the test speed are within the corresponding limit value ranges respectively, and if so, determining that the current test grid layout meets the requirement of the rapid test of the OTA performance of the small-sized low-power-consumption Internet of things equipment; and when the judgment result is negative, determining that the current test grid layout cannot meet the requirement of the rapid test of the OTA performance of the small-sized low-power-consumption Internet of things equipment.

2. The small-sized low-power-consumption internet-of-things-oriented device rapid OTA test method as claimed in claim 1, further comprising:

and carrying out cross distribution on the test grid points on the adjacent azimuth planes in the test grid.

3. The small low-power-consumption internet of things (OTA) test method for the small OTA, according to claim 1, is characterized in that the standard deviation of the TRP or TIS test result is determined as follows:

and taking the coordinate origin of the test system as the center, randomly rotating the small-sized low-power-consumption Internet of things equipment for multiple times, and calculating the standard deviation of the TRP or TIS test result of the small-sized low-power-consumption Internet of things equipment obtained by multiple random rotations.

4. The fast OTA test method for the small-sized low-power consumption Internet of things device as claimed in claim 1, wherein the limit value corresponding to the determination index value of the test precision is 0.5dB, and the limit value range is less than or equal to 0.5 dB.

5. The fast OTA test method for the small-sized low-power consumption Internet of things device according to claim 1, wherein the limit value corresponding to the judgment index value of the test duration and/or the test speed is 50%, and the limit value range is greater than or equal to 50%.

6. The small-sized low-power consumption rapid OTA test method for the internet of things equipment as claimed in claim 1, wherein the test grid layout meeting the requirement of the limit value range comprises a plurality of test grids;

further comprising:

and comparing the standard deviations of the plurality of times of random TRP test results under the plurality of test grid layouts meeting the requirement of the limit value range pairwise, and if the difference value between the standard deviations of the two TRP test results is within a preset threshold value, selecting the test grid layout with less total number of test grid points.

7. The small low-power-consumption internet-of-things-oriented device-oriented fast OTA test method as claimed in claim 6, wherein the preset threshold is 0.1 dB.

8. The small-sized low-power-consumption internet-of-things-oriented device rapid OTA test method as claimed in claim 1, further comprising:

and comparing the standard deviations of the TRP test results under the test grid layouts with the same total number of the test grid points, and selecting the test grid layout with the minimum standard deviation of the TRP test results.

9. The small-sized low-power consumption rapid OTA test method for the internet of things equipment as claimed in claim 1, wherein the test grid layout is preferably a test grid layout with grid stepping on a pitch plane of 45 degrees, grid stepping on an azimuth plane of 36 degrees and grid cross distribution on adjacent azimuth planes.

10. The small form factor low power internet of things device oriented fast OTA testing method of claim 1 wherein the TRP test and the TIS test select the same test grid layout.

11. The utility model provides a quick OTA testing arrangement towards small-size low-power consumption thing allies oneself with equipment which characterized in that includes:

the test grid layout setting module is used for presetting a test grid layout;

the judgment index determining module is used for obtaining the standard deviation of a plurality of times of random TRP or TIS test results under the preset test grid layout and taking the standard deviation as a judgment index value of the test precision; determining the reduction percentage of the total number of the test grid points of the test grid layout relative to the standard TIS test grid, and taking the reduction percentage of the total number of the test grid points as a judgment index value of the test duration and/or the test speed;

the judging module is used for judging whether the judgment index value of the test precision and the judgment index value of the test duration and/or the test speed are/is within the corresponding limit value ranges respectively, and when the judgment results are yes, the current test grid layout is determined to meet the requirement of the rapid test of the OTA performance of the small-sized low-power-consumption Internet of things equipment; and when the judgment result is no, determining that the current test grid layout cannot meet the requirement of the OTA performance rapid test of the small-sized low-power-consumption Internet of things equipment.

12. The small form factor low power internet of things device oriented fast OTA testing apparatus of claim 11 wherein the test grid layout setting module is further configured to:

and carrying out cross distribution on the test grid points on the adjacent azimuth planes in the test grid.

13. The small form factor low power internet of things (OTA) test setup for fast OTA test equipment as claimed in claim 11 wherein the standard deviation of the TRP or TIS test results is determined as follows:

and taking the coordinate origin of the test system as the center, randomly rotating the small-sized low-power-consumption Internet of things equipment for multiple times, and calculating the standard deviation of the TRP or TIS test result of the small-sized low-power-consumption Internet of things equipment obtained by multiple random rotations.

14. The fast OTA testing apparatus for small-sized low power consumption internet of things devices as claimed in claim 11, wherein the determination index value of the testing precision is defined to be 0.5dB, and the defined value range is less than or equal to 0.5 dB.

15. The small-sized low-power consumption fast OTA testing apparatus oriented to internet of things equipment as claimed in claim 11, wherein the limit value corresponding to the determination index value of the testing duration and/or the testing speed is 50%, and the limit value range is greater than or equal to 50%.

16. The small form factor low power internet of things device oriented fast OTA testing apparatus of claim 11 wherein the test grid layout meeting the limit value range requirement comprises a plurality;

the judging module is also used for:

and comparing the standard deviations of the plurality of times of random TRP test results under the plurality of test grid layouts meeting the requirement of the limit value range pairwise, and if the difference value between the standard deviations of the two TRP test results is within a preset threshold value, selecting the test grid layout with less total number of test grid points.

17. The small low-power internet of things device-oriented fast OTA testing apparatus of claim 16 wherein the preset threshold is 0.1 dB.

18. The small-scale low-power consumption rapid OTA testing apparatus oriented to the internet of things device of claim 11, wherein: the judging module is also used for:

and comparing the standard deviations of the TRP test results of multiple times under the test grid layout with the same total number of the test grid points, and selecting the test grid layout with the minimum standard deviation of the TRP test results.

19. The small form factor low power internet of things (lod) oriented fast OTA testing apparatus of claim 11 wherein the test grid layout is preferably a 45 grid step in the elevation plane, a 36 grid step in the azimuth plane, a test grid layout with grid cross distribution in adjacent azimuth planes.

20. The small form factor low power internet of things device oriented fast OTA testing apparatus of claim 11 wherein the TRP test and the TIS test select the same test grid layout.

21. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method for fast OTA testing with respect to small and low power internet of things of any of claims 1 to 10 when executing the computer program.

22. A computer-readable storage medium, storing a computer program, which when executed by a processor implements the method for fast OTA testing with respect to small and low power internet of things as claimed in any one of claims 1 to 10.

23. A computer program product comprising a computer program which, when executed by a processor, implements the method for fast OTA testing with respect to small, low power, internet of things device of any of claims 1 to 10.

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