CN114814524A

CN114814524A - Detection card, detection system and detection method

Info

Publication number: CN114814524A
Application number: CN202210270792.9A
Authority: CN
Inventors: 邬刚; 陈永
Original assignee: Hangzhou Acceleration Technology Co ltd
Current assignee: Hangzhou Acceleration Technology Co ltd
Priority date: 2022-03-18
Filing date: 2022-03-18
Publication date: 2022-07-29

Abstract

The invention provides a detection card, a detection system and a detection method. The detection card includes a circuit board, and the circuit board is provided with several pin sets, and the pin sets each include a first pin and a second pin. A pin is connected to the first port, the circuit board is connected to the second port through the second pin, the first port is used to connect the ATE equipment to obtain the signal output by the ATE equipment; the second port is used to connect the sorter to obtain the Select the signal output by the machine. The invention solves the problem of introduction of flying wires when the ATE equipment is connected to the sorting machine, and can collect communication data during the test process. The data acquisition system collects the results, judges whether there is a mechanical failure or uncoordinated action, and optimizes the ATE equipment test chip to reduce the overall time-consuming of the system.

Description

Detection card, detection system and detection method

Technical Field

The invention belongs to the technical field of ATE (automatic test equipment), and particularly relates to a detection card, a detection system and a detection method.

Background

Ate (automatic Test equipment) is automatic Test equipment, which is a system for automatically testing integrated circuits through computers and special equipment. The sorting machine is an automatic device of the last procedure of chip manufacturing, the packaged chip is placed in various environments to test the electrical characteristics of the chip, such as power consumption, running speed, voltage endurance and the like, and the chip tested by the automatic testing device is divided into different grades according to the electrical characteristics of the chip.

After the IC chips are processed and manufactured, the chips are tested and classified one by one to collectively place the good chips and place the bad chips in a classified manner according to the type of the test problem. In the process, the sorting machine is required to transmit the chip to a designated position, the TTL signals inform the ATE to load a test program to test the chip, after the function test of the IC chip is completed, the ATE informs the sorting machine of the test result through the TTL signals, and the sorting machine sorts the test result according to the ATE. The TTL signals are required to be stable in the testing process, and the ATE and the sorting machine can mutually identify the TTL signals of the other side and can not generate errors.

In the case of communication errors between ATE and a sorting machine, the following solutions are currently mainstream:

when the test is stopped, an oscilloscope is used for measuring communication lines of the ATE and the sorting machine, the sorting machine is generally 2site or 4site, 20 or 40 effective communication lines exist, but the corresponding relation of each line needs to be determined in each measurement, only a small number of communication lines can be tested in each measurement, meanwhile, the two sides of the ATE and the sorting machine need to be tested, the test lines are doubled, errors easily occur, and time and labor are consumed;

the test is carried out by using a flying wire mode, generally, an ATE and a sorting machine adopt a first port and a second port mode, direct flying wire test cannot be carried out at a connection part, and if the flying wires at the two sides of the first port and the second port possibly cause the problems of open circuit, short circuit and the like;

data monitoring is carried out in the test process, but the number of channels of a conventional oscilloscope is limited, a plurality of oscilloscopes are needed for detecting the condition of each line, and if more channels of oscilloscopes are adopted, the cost is high.

At present, the test duration of an ATE test chip is recorded, and ATE software only records the test time of each chip. In order to record a received test signal and send a test result, a log needs to be additionally added, but the test performance is influenced by adding the log, the sorting machine adopts various different development technologies, the working flows are different, and the sent TTL signal and the recognizable TTL signal are different. Therefore, a method for quickly and conveniently examining, measuring communication signals and stability is needed.

Disclosure of Invention

In order to overcome the defects of the prior art, the invention provides the detection card, which solves the problem of flying lead when the ATE equipment is connected with the sorting machine, can respectively test the signals of each communication line of the ATE and the sorting machine, does not cause interference to the ATE system and the system of the sorting machine, and can also collect communication data in the test process.

The detection card comprises a circuit board, wherein the circuit board is provided with a plurality of pin sets, each pin set comprises a first pin and a second pin, the circuit board is connected with a first port through the first pin, and the circuit board is connected with a second port through the second pin;

the first port is used for connecting an ATE device to acquire a signal output by the ATE device;

the second port is used for connecting a sorting machine so as to obtain a signal output by the sorting machine.

Specifically, the pin set comprises 1 GND signal pin, 1 EOT signal pin, 1 SOT signal pin and 8 BIN signal pins;

the EOT signal pin is used for collecting an EOT signal, and the EOT signal is a signal for informing the ATE equipment that the sorting machine starts to read the test result;

the SOT signal pin is used for collecting SOT signals, and the SOT signals are test signals sent to the ATE by the sorting machine;

the BIN signal pin is used for collecting BIN signals, and the BIN signals are signals containing the test result information.

The invention further provides a detection system which comprises a data acquisition system and the detection card, wherein the detection card is connected with the data acquisition system through the pin.

The present invention also proposes a detection method applied to the detection system as described above, the method including:

the data acquisition system acquires signals from the pin set based on configuration information;

the data acquisition system processes the signals to obtain high and low level signal data;

and the data acquisition system judges whether a fault occurs according to the time in the high and low level signals.

Specifically, the configuration information includes a scanning period and pin set information;

the data acquisition system acquires signals from the pin set, including:

the data acquisition system determines a pin set corresponding to the pin set information in the configuration information;

and the data acquisition system scans the determined pin set according to the scanning period in the configuration information to acquire signals of the pins in the determined pin set.

Specifically, the high-low level signal data includes: time in high level signal data, low level signal data, and the high and low level signals;

the data acquisition system processes the signal to obtain high and low level signal data, and the method comprises the following steps:

the data acquisition system determining the level of the signal;

if the level of the signal is higher than a preset first level, determining that the signal is a high-level signal, and generating high-level signal data based on the signal;

and if the level of the signal is lower than a preset second level, determining that the signal is a low-level signal, and generating low-level signal data based on the signal.

Specifically, the data acquisition system judges whether a fault occurs according to the time in the high and low level signals;

if the data acquisition system determines that the time in the high and low level signals is greater than the preset time, determining that a fault occurs;

and if the data acquisition system determines that the time in the high-low level signal is not greater than the preset time, determining that no fault is generated.

Further, the time in the high and low signals includes a maximum time for the ATE device to issue the BIN signal based on the received SOT signal from receiving the SOT signal.

Further, the time in the high-low level signal includes a time from the time the sorter receives the BIN signal to the time the SOT signal is issued based on the BIN signal received.

Preferably, the signal is a signal that triggers a high-level triggering edge and a low-level triggering edge.

Therefore, the invention provides the detection card, the detection system and the detection method, solves the problem of flying lead when ATE equipment is connected with a sorting machine, can acquire communication data in the test process, has small volume, convenient carrying, convenient use and low cost, can judge whether mechanical faults or inconsistent actions occur or not according to the acquisition result of the data acquisition system by connecting the data acquisition system, optimizes the test chip of the ATE equipment and reduces the overall time consumption of the system.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

Fig. 1 is a schematic view of an overall structure of a detection card provided in embodiment 1;

FIG. 2 is a high and low level visual data diagram of a pin;

FIG. 3 is a visual data diagram of the high and low levels of the pins related at any time;

FIG. 4 is a time-pin high and low level data diagram;

FIG. 5 is a flowchart of a detection method according to embodiment 3;

FIG. 6 is a statistical plot of the time difference data between the reception of the SOT signal by the ATE device and the issuance of the BIN signal at the end of the test;

FIG. 7 is a statistical plot of the time difference data between the receipt of a BIN signal and the transmission of an SOT signal based on the received BIN signal for the second pin set.

Reference numerals:

1-a circuit board; 2-a first port; 3-a second port; 11-a first set of pins; 12-a second set of pins; 13-a third pin set; 14-fourth pin set.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Example 1

The invention provides a detection card, which solves the problem of flying lead introduction when an ATE device is connected with a sorting machine, can respectively test signals of each communication line of the ATE and the sorting machine, does not cause interference to an ATE system and a system of the sorting machine, and can also collect communication data in the test process.

Referring to fig. 1, the detection card provided by the present invention includes a circuit board 1, where the circuit board 1 is provided with a plurality of pin sets, each of the pin sets includes a first pin and a second pin, and the circuit board 1 is connected to ATE equipment through the first port 1 to obtain a signal output by the ATE equipment; the circuit board 1 is connected with the sorting machine through the second port 3 so as to obtain signals output by the sorting machine. The detection card has the advantages of small size, convenience in carrying and use and low cost. Specifically, the first port 2 is connected with the ATE equipment, and the second port 3 is connected with the sorting machine in a plug-in type.

Specifically, each of the pin sets includes a plurality of first pins and second pins, and in this embodiment, each of the pin sets is provided with 1 GND signal pin, 1 EOT signal pin, 1 SOT signal pin, and 8 BIN signal pins;

In this embodiment, the circuit board 1 includes four pin sets, i.e., a site0, a site1, a site2, and a site3, the site0 is a first pin set 11, the site1 is a second pin set 12, the site2 is a third pin set 13, and the site3 is a fourth pin set 14.

Example 2

The invention also provides a detection system, which does not have the problem of flying lead when the ATE equipment is connected with the sorting machine, can respectively test the signals of each communication line of the ATE and the sorting machine, does not cause interference to the ATE system and the system of the sorting machine, and can also collect the communication number in the test process. The system includes data acquisition system and the detection card that embodiment 1 provided, first port 2 is connected ATE equipment, second port 3 is connected the sorter, the detection card passes through the pin is connected data acquisition system, data acquisition system is used for gathering the signal data of the pin of connecting.

It should be noted that the data acquisition system selects the pins of the connected test card according to the requirement of the test, and can simultaneously connect and test the pins of a plurality of pin sets.

Specifically, the data acquisition system presets a scanning period and triggers high and low level conditions, and the high and low level of each connected pin is scanned according to a certain frequency according to the preset scanning period.

In this embodiment, the EOT signal, the SOT signal, and the BIN signal are all triggered by a level, the data acquisition system is provided with a scanning period, and the data acquisition system acquires level data of the connected pins according to the scanning period.

It should be noted that the level trigger is divided into a high level trigger and a low level trigger, and in this embodiment, the high level and the low level of the EOT signal, the SOT signal, and the BIN signal are determined by setting an effective level parameter by the data acquisition system. In this embodiment, the high level is represented by 1, the low level is represented by 0, and the high-low level data records the high-low level signal and the duration of the pin in the acquisition period. In the scheme, the level signal is converted into a digital signal.

The invention determines that the current signal is an effective signal by setting the high level effective or low level effective and the level duration, and the EOT signal, the SOT signal and the BIN signal can respectively set whether the self pin is the high level effective or the low level effective.

Specifically, a first preset level and a second preset level are set in the data acquisition system, the first preset level is higher than the second preset level, and the level of the signal is higher than the preset first level, the signal is determined to be a high-level signal, and high-level signal data are generated based on the signal; and when the level of the signal of the pin is lower than the second preset level, determining that the signal is a low-level signal, and generating low-level signal data based on the signal.

Furthermore, an edge triggering mechanism for judging the BIN signal is also preset in the data acquisition system, and an identifiable signal is added after the signal triggers a high-level triggering edge and a low-level triggering edge for one time.

After the high and low level data of the EOT signal, the SOT signal, and the BIN signal are collected, the EOT signal, the SOT signal, and the BIN signal may be converted into visual image data as shown in fig. 2 and 3, where pins 0, 3, 6, and 9 are EOT signals of a first pin set 11, a second pin set 12, a third pin set 13, and a fourth pin set 14, pins 1, 4, 7, and 10 are SOT signals of the first pin set 11, the second pin set 12, the third pin set 13, and the fourth pin set 14, respectively, and pins 2, 5, 8, and 11 are BIN signals of the first pin set 11, the second pin set 12, the third pin set 13, and the fourth pin set 14, respectively, and the time-pin high and low level data is converted after the high and low level of each pin is changed.

Refer to FIG. 4 for a timing-pin high-low data diagram.

Example 3

Based on the detection system provided in embodiment 2, the present invention further provides a corresponding detection method, which does not use flying leads to measure signals, thereby avoiding the problem of flying leads, can test signals of each communication line of ATE and the sorting machine, can obtain communication data in real time without affecting normal chip test, and is convenient for troubleshooting communication problems that cannot be reproduced or are not easily reproduced during the test process, and please refer to fig. 5, where the method includes:

s400: the data acquisition system obtains signals from the pin set based on the configuration information and proceeds to step S410.

Specifically, the configuration information includes a scanning period and pin set information, and the data acquisition system determines a pin set corresponding to the pin set information in the configuration information and scans the determined pin set with the scanning period in the configuration information to acquire signals of pins in the determined pin set.

S410: the data acquisition system processes the signal to obtain high and low level signal data, and then the step S420 is performed.

In this embodiment, the EOT signal, the SOT signal, and the BIN signal are all triggered by a level, and the high-low level signal data includes: high level signal data, low level signal data, and time in the high-low level signal. In this embodiment, the high level and the low level of the EOT signal, the SOT signal, and the BIN signal are determined by setting an effective level parameter by the data acquisition system, and the time in the high-low level signal includes the level duration.

In this embodiment, the high level is represented by 1, the low level is represented by 0, and the high-low level data records the high-low level signal and the duration of the pin in the sampling period.

Specifically, the data acquisition system is provided with a preset first level and a preset second level, the data acquisition system determines the level of the signal, if the level of the signal is greater than the preset first level, the signal is determined to be a high-level signal, and high-level signal data are generated based on the signal; and if the level of the signal is lower than the preset second level, determining that the signal is a low-level signal, and generating low-level signal data based on the signal.

Furthermore, after the signal triggers a high-level triggering edge and a low-level triggering edge, an identifiable signal is counted.

In this embodiment, the acquired signal data is visualized, and visualized image data is shown in fig. 2 and 3.

S420: and the data acquisition system judges whether a fault occurs according to the time in the high and low level signals.

and if the data acquisition system determines that the time in the high and low level signals is not more than the preset time, determining that no fault is generated.

Specifically, the time in the high-low level signal includes the maximum time from when the ATE device receives the SOT signal to when the BIN signal is sent out based on the received SOT signal, and the communication data of each pin set is detected in real time to determine whether the communication data of each pin set has a problem.

It should be noted that the time length from the time when the ATE device receives the SOT signal to the time when the BIN signal is sent based on the received SOT signal is composed of three parts, namely, the signal receiving time length, the maximum test time length, and the signal sending time length, the signal sending and receiving time length is usually short, the test time length is the time length of the test pass, and the time length for testing fail is usually shorter than the time length of the test pass.

The maximum time required to be configured by the detection method provided by the invention is the duration of the test pass plus the communication duration, and if an abnormality occurs in the test process, the test time is greater than the duration of the test pass. Then, the increased test duration caused by the abnormality is the abnormality information that needs to be recorded in the detection method provided by the present invention.

Referring to fig. 6, fig. 6 is a data statistical diagram of the time difference between the reception of the SOT signal by the ATE device and the emission of the BIN signal after the test is finished, wherein the abscissa represents the number of tests and the ordinate represents the time difference between the SOT signal and the BIN signal. The function of the ATE equipment test chip is optimized through high-low level data acquired by the data acquisition system, so that the overall time consumption of the system is reduced, the time of the ATE equipment test chip is matched, the time difference between the fact that the ATE equipment receives the SOT signal and the fact that the ATE equipment sends the BIN signal based on the received SOT signal is obtained, and the ATE equipment is correspondingly optimized when each step of the system is counted.

According to the method, the time consumed by each step of the system is obtained through the time of testing the chip by the ATE equipment and the time difference between the time when the ATE equipment receives the SOT signal and the time when the ATE equipment sends the BIN signal, and the chip testing function is optimized. In this embodiment, the optimization objects are a chip test function of the ATE device, an ATE device system, and a communication module of the ATE device.

Specifically, the time in the high-low level signal further includes the time from the time when the sorter receives the BIN signal to the time when the sorter sends the SOT signal based on the received BIN signal, and whether a fault occurs is judged according to the time from the time when the sorter receives the BIN signal to the time when the sorter sends the SOT signal.

The data acquisition system sets a preset time, and if the time difference from the time that the sorting machine of the same pin set receives the BIN signal to the time that the sorting machine sends out the SOT signal based on the received BIN signal is greater than the preset time, the data acquisition system judges that a fault occurs, namely a communication flow has a problem; and if the time difference from the time when the sorting machine of the same pin set receives the BIN signal to the time when the sorting machine sends out the SOT signal based on the received BIN signal is not more than the preset time, judging that no fault is generated.

It should be noted that, under the condition that the chip testing time is fixed, the ATE equipment system time consumption and the communication time consumption are fixed, and if a large time variation occurs, a mechanical failure such as material jamming generally occurs, or a mechanical action is not coordinated.

Referring to fig. 7, fig. 7 is a data statistical graph of the time difference between the BIN signal received by the second pin set 12 and the SOT signal sent based on the received BIN signal, wherein the abscissa is the serial number of the test, and the ordinate is the time difference between the BIN signal and the SOT signal, and the time unit is millisecond. In the figure, the ordinate value is far larger than the average time difference, mechanical faults such as material blocking and the like can occur, mechanical actions are not consistent due to certain configuration parameters of a machine, and the fault of the sorting machine needs to be further checked.

And if the communication flow has problems, adjusting the time of each step of the sorting machine.

In summary, the invention provides a detection card, a detection system and a detection method, which solve the problem of flying lead when an ATE device is connected with a sorting machine, can collect communication data in a test process, have small volume, convenient carrying, convenient use and low cost, and can judge whether a mechanical fault or an uncoordinated action occurs or not according to the collection result of a data collection system by connecting the data collection system, optimize an ATE device test chip and reduce the overall time consumption of the system.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims

1. A detection card is characterized by comprising a circuit board, wherein the circuit board is provided with a plurality of pin sets, each pin set comprises a first pin and a second pin, the circuit board is connected with a first port through the first pin, and the circuit board is connected with a second port through the second pin;

2. The probe card of claim 1, wherein the pin set comprises 1 GND signal pin, 1 EOT signal pin, 1 SOT signal pin and 8 BIN signal pins;

3. A test system comprising a data acquisition system and a test card according to any of claims 1 or 2, said test card being connected to said data acquisition system via said pins.

4. A detection method applied to the detection system of claim 3, the method comprising:

5. The method according to claim 4, wherein the configuration information includes a scan period and pin set information;

the data acquisition system acquires signals from the pin set, including:

6. The detection method according to claim 4, wherein the high-low level signal data comprises: time in high level signal data, low level signal data, and the high and low level signals;

the data acquisition system determining the level of the signal;

7. The detection method according to claim 4, wherein the data acquisition system determines whether a fault occurs according to the time in the high and low level signals;

8. A method as claimed in claim 4 or 7, wherein the time in the high and low signals comprises a maximum time from when the ATE device receives the SOT signal to when the BIN signal is issued based on the received SOT signal.

9. A test method according to claim 4 or 7, wherein the time in the high and low signals comprises the time from the time the sorter receives the BIN signal to the time the SOT signal is issued based on the received BIN signal.

10. A method according to claim 6, wherein the signal is a signal that triggers a high-level triggering edge and a low-level triggering edge.