CN114355253B - Branch short-circuit test method for ultra-high voltage transformers - Google Patents
Branch short-circuit test method for ultra-high voltage transformersInfo
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- CN114355253B CN114355253B CN202111641503.3A CN202111641503A CN114355253B CN 114355253 B CN114355253 B CN 114355253B CN 202111641503 A CN202111641503 A CN 202111641503A CN 114355253 B CN114355253 B CN 114355253B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/62—Testing of transformers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Relating To Insulation (AREA)
Abstract
本发明公开特高压变压器的分柱短路试验方法，具体包括以下步骤：结合试验系统情况，对待试验变压器多个并联的柱进行处理，形成n个待试验部分；对待试验变压器的每个待试验部分分别进行高中短路试验、高低短路试验和中低短路试验。采用本发明公开的并网方法可以快速、有效、准确的对特高压变压器进行高中短路试验、高低短路试验和中低短路试验。
This invention discloses a method for conducting column-based short-circuit tests on ultra-high voltage (UHV) transformers, specifically including the following steps: Based on the test system conditions, multiple parallel columns of the transformer under test are processed to form n test sections; each test section of the transformer under test is subjected to high-medium short-circuit tests, high-low short-circuit tests, and medium-low short-circuit tests. Using the grid connection method disclosed in this invention, high-medium short-circuit tests, high-low short-circuit tests, and medium-low short-circuit tests can be performed on UHV transformers quickly, effectively, and accurately.
Description
Technical Field
The invention belongs to the technical field of transformer tests, and particularly relates to a split-column short-circuit test method of an extra-high voltage transformer.
Background
The extra-high voltage refers to a power transmission technology with the voltage class of 1000 kilovolts or more in alternating current and 800 kilovolts or more in direct current, and has the technical advantages of large transmission capacity, long distance, high efficiency, low loss and the like. The extra-high voltage transmission plays an important role in guaranteeing power supply, promoting clean energy development, improving environment, improving the safety level of a power grid and the like.
The extra-high voltage transformer is core equipment in an extra-high voltage power transmission network, the transformer inevitably suffers from the impact of short-circuit current when running in the power transmission network, and whether the transformer can withstand the impact of the short-circuit current or not can not directly influence the running safety of a power transmission line without damage. Whether the transformer can withstand the impact of short-circuit current or not is the most effective and direct method is verified through a test.
However, the direct test of the extra-high voltage transformer is difficult, so that a method for testing the split column short circuit of the extra-high voltage transformer is needed to be proposed.
Disclosure of Invention
In order to solve the technical problems, the invention provides a split-column short circuit test method of an extra-high voltage transformer.
In order to achieve the above purpose, the technical scheme of the invention is as follows:
The invention discloses a column-separating short circuit test method of an extra-high voltage transformer, which comprises the following steps:
STEP1, combining the conditions of a test system, and processing a plurality of parallel columns of the transformer to be tested to form n parts to be tested;
STEP2, respectively carrying out a high-medium short circuit test, a high-low short circuit test and a medium-low short circuit test on each part to be tested of the transformer to be tested.
On the basis of the technical scheme, the following improvement can be made:
preferably, STEP1 specifically includes the following:
Disconnecting a medium voltage A m lead of the transformer to be tested from the parallel connection position of adjacent column windings in the transformer to be tested, dividing the lead into an A m1 end to an A mn end, dividing the lead into n medium voltage terminals for leading out, wherein n is more than or equal to 2, and n is an integer;
Or the low-voltage X end of the transformer to be tested is divided into an X 1 end to an X k end and is divided into k low-voltage terminals to be led out, wherein k is more than or equal to 2, and k is an integer.
When the lead wire of the medium voltage A m is divided into n medium voltage terminals, the method for high-medium short circuit test is as follows, the A end of the transformer to be tested is connected with a high voltage system, the X end and the medium voltage A mi end of the ith part to be tested are short-circuited and then connected with a low voltage system, the low voltage a end and the low voltage X end are open-circuited, and i E [1, n ].
When the lead wire of the medium voltage A m is divided into n medium voltage terminals, the method for testing the high and low short circuits is as follows, the A end of the transformer to be tested is connected with a high voltage system, the X end of the transformer to be tested is connected with a low voltage system, the medium voltage A mi end of the ith part to be tested is open-circuited, the low voltage a end and the low voltage X end are short-circuited, and i is E [1, n ].
When the lead wire of the medium voltage A m is divided into n medium voltage terminals, the method for medium and low short circuit test is as follows, the A end of the transformer to be tested is opened, the X end of the transformer to be tested is connected with a low voltage system, the medium voltage A mi of the ith part to be tested is connected with a high voltage system, the low voltage a end and the low voltage X end are short-circuited, and i is E [1, n ].
When the low-voltage X end is divided into k low-voltage terminals, the method for high-medium short circuit test is as follows, the A end of the transformer to be tested is connected with a high-voltage system, the X j end and the A m end of the j-th part to be tested are short-circuited and then connected with the low-voltage system, the low-voltage a end and the low-voltage X end are open-circuited, and j E is 1, k.
When the low-voltage X end is divided into k low-voltage terminals, the method for high-low short circuit test is as follows, A of the transformer to be tested is connected with a high-voltage system, X j of the j-th part to be tested is connected with the low-voltage system, A m is connected with an open circuit, the low-voltage a end and the low-voltage X end are in short circuit, and j E [1, k ].
When the low-voltage X end is divided into k low-voltage terminals, the method for middle-low short circuit test is as follows, the A end of the transformer to be tested is opened, X j of the j th part to be tested is connected with a low-voltage system, A m is connected with a high-voltage system, the low-voltage a end and the low-voltage X end are in short circuit, and j E [1, k ].
The invention discloses a column-separating short-circuit test method of an extra-high voltage transformer, which can be used for rapidly, effectively and accurately carrying out high-voltage and medium-voltage short-circuit tests, high-voltage and low-voltage short-circuit tests and medium-voltage and low-voltage short-circuit tests on the extra-high voltage transformer, and solves the problems that the conventional test system has small capacity and cannot be used for directly carrying out short-circuit tests on the extra-high voltage transformer.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a flow chart of a method for testing a split-column short circuit of an extra-high voltage transformer according to an embodiment of the present invention.
Fig. 2 is a schematic diagram of a high-middle-level short circuit test wiring provided by the embodiment of the invention.
Fig. 3 is a schematic diagram of a high-low short circuit test wiring provided in an embodiment of the present invention.
Fig. 4 is a schematic diagram of a medium-low short circuit test wiring provided in an embodiment of the present invention.
Fig. 5 is a schematic diagram of a three-winding transformer according to an embodiment of the present invention.
Fig. 6 is a circuit diagram of a testing system for short-circuit bearing capacity of an extra-high voltage transformer according to an embodiment of the present invention.
Detailed Description
Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The use of ordinal terms "first," "second," "third," etc., to describe a generic object merely denotes different instances of like objects, and is not intended to imply that the objects so described must have a given order, either temporally, spatially, in ranking, or in any other manner.
In addition, the expression "comprising" an element is an "open" expression which merely means that the corresponding component is present and should not be interpreted as excluding the additional component.
In order to achieve the object of the present invention, in some embodiments of a method for testing a split-column short circuit of an extra-high voltage transformer, as shown in fig. 1, the method for testing a split-column short circuit of an extra-high voltage transformer comprises the following steps:
STEP1, combining the test system condition, processing 2 parallel columns of the transformer to be tested to form 2 parts to be tested, wherein 1 column is one part to be tested.
STEP2, respectively carrying out a high-medium short circuit test, a high-low short circuit test and a medium-low short circuit test on each column of the transformer to be tested.
It is noted that this example takes a 1000MVA/1000kV transformer to be tested of 2 poles as an example, but the scope of the invention is not limited to a 2 pole transformer to be tested, with a capacity of 500MVA per pole.
The short circuit bearing capacity test mainly checks the bearing capacity of the electromotive force between the high winding, the middle winding and the low winding of the single column, so that the 1000MVA transformer 2 columns are respectively subjected to the short circuit test.
STEP1 specifically comprises the following STEPs of disconnecting a medium voltage a m lead wire of the transformer to be tested from the parallel connection position of adjacent column windings in the transformer to be tested, and dividing the lead wire into a medium voltage a m1 end and a medium voltage a m2 end.
Further, as shown in FIG. 2, the method for testing the high-medium short circuit of the 1 st column of the transformer to be tested comprises the steps of connecting the A end of the transformer to be tested with a high-voltage system, connecting the X end with the medium-voltage A m1 end of the 1 st column with a low-voltage system after short-circuiting, and opening the low-voltage a end and the low-voltage X end.
Further, as shown in FIG. 3, the method for testing the high and low short circuits of the 1 st column of the transformer to be tested comprises the steps of connecting the A end of the transformer to be tested with a high-voltage system, connecting the X end of the transformer to be tested with a low-voltage system, opening the medium-voltage A m1 end of the 1 st column, and shorting the low-voltage a end and the low-voltage X end.
Further, as shown in FIG. 4, the method for testing the middle and low short circuit of the 1 st column of the transformer to be tested is that the A end of the transformer to be tested is opened, the X end of the transformer to be tested is connected with a low-voltage system, the middle voltage A m1 of the 1 st column is connected with a high-voltage system, and the low-voltage a end and the low-voltage X end are in short circuit.
Similarly, the short circuit test method for the 2 nd column of the transformer to be tested is as follows:
The method for testing the high-medium short circuit of the 2 nd column of the transformer to be tested comprises the steps of connecting the A end of the transformer to be tested with a high-voltage system, connecting the X end with the medium-voltage A m2 end of the 2 nd column in a short circuit mode, connecting the short circuit with a low-voltage system, and opening the low-voltage a end and the low-voltage X end.
The method for testing the high-low short circuit of the 2 nd column of the transformer to be tested comprises the steps of connecting the A end of the transformer to be tested with a high-voltage system, connecting the X end of the transformer to be tested with a low-voltage system, opening the middle-voltage A m2 end of the 2 nd column, and short-circuiting the low-voltage a end and the low-voltage X end.
The method for testing the middle and low short circuit of the 2 nd column of the transformer to be tested comprises the steps of opening an A end of the transformer to be tested, connecting an X end of the transformer to be tested with a low-voltage system, connecting a middle voltage A m2 of the 2 nd column with a high-voltage system, and connecting a low-voltage a end and a low-voltage X end in a short circuit mode.
As shown in fig. 5, the three-winding power transformer is operated on a network, typically with high-side grid connection, medium-side grid connection, and low-side load. In making a selection of test conditions for a three-winding transformer, there are typically the following.
If the short-circuit fault occurs at the middle-voltage side outlet end, short-circuit current is generated in the high-and-medium-voltage winding, if the short-circuit fault occurs at the high-voltage side outlet end, the power is supplied by the middle voltage, the short-circuit current is also generated in the high-and-medium-voltage winding, and the two fault conditions can be simulated and verified by the working condition of a high-and-medium short-circuit test.
If the low-voltage side wire outlet end has short-circuit fault, the high-voltage winding and the medium-voltage winding simultaneously supply power to the low-voltage winding, and the high-to-low short-circuit impedance of the transformer is larger than the medium-to-low short-circuit impedance, so that short-circuit current is mainly generated in the medium-voltage winding and the low-voltage winding, and the fault condition can be simulated and verified by the medium-to-low short-circuit test working condition.
The specific short-circuit current calculation also determines the apparent capacity of the system of the medium-voltage network, whether the system is connected with a grid or the parallel operation of several transformers with the same type is carried out, and the selection of the operation mode has great influence on the short-circuit current.
Notably, in other embodiments.
STEP1 specifically includes dividing the low voltage X terminal of the transformer to be tested into a low voltage X 1 terminal and a low voltage X 2 terminal.
The method for testing the high-medium short circuit of the 1 st column of the transformer to be tested comprises the steps of connecting the A end of the transformer to be tested with a high-voltage system, connecting the X 1 end and the A m end of the 1 st column with a low-voltage system after short-circuiting, and opening the low-voltage a end and the low-voltage X end.
Further, the method for testing the high-low short circuit of the 1 st column of the transformer to be tested comprises the following steps of connecting the A end of the transformer to be tested with a high-voltage system, connecting the X 1 end of the 1 st column with a low-voltage system, opening the A m end, and shorting the low-voltage a end and the low-voltage X end.
Further, the method for testing the middle-low short circuit of the 1 st column of the transformer to be tested comprises the steps of opening an A end of the transformer to be tested, enabling X 1 of the 1 st column to be connected with a low-voltage system, enabling A m to be connected with a high-voltage system, and enabling a low-voltage end a and a low-voltage end X to be in short circuit.
The short-circuit test method of the 2 nd column of the transformer to be tested is as follows:
The method for testing the high-medium short circuit of the 2 nd column of the transformer to be tested comprises the steps of connecting the A end of the transformer to be tested with a high-voltage system, connecting the X 2 end and the A m end of the 2 nd column with a low-voltage system after short circuit, and opening the low-voltage a end and the low-voltage X end.
The method for testing the high-low short circuit of the 2 nd column of the transformer to be tested comprises the following steps of connecting A end of the transformer to be tested with a high-voltage system, connecting X 2 end of the 2 nd column with a low-voltage system, opening the A m end, and shorting the low-voltage a end and the low-voltage X end.
The method for testing the middle and low short circuit of the 2 nd column of the transformer to be tested comprises the steps of opening an A end of the transformer to be tested, enabling X 2 of the 2 nd column to be connected with a low-voltage system, enabling A m to be connected with a high-voltage system, and enabling a low-voltage end a and a low-voltage end X to be in short circuit.
In order to facilitate the understanding of the invention, a test system for the short-circuit bearing capacity of an extra-high voltage transformer is introduced below, and the test is performed by adopting the split-column short-circuit test method disclosed by the invention.
As shown in fig. 6, the extra-high voltage transformer short circuit bearing capacity test system comprises a group of power supply modules, a group of first boosting modules and two groups of second boosting modules.
The power supply module comprises a generator G 1 to a generator G 5, a current limiting reactor CLR and a closing phase-selecting switch HQ, wherein the 5 generators are connected in parallel.
The first boost module includes a first boost transformer DA 1 to a first boost transformer DA 6;
The primary sides of the first step-up transformers DA 1 and DA 6 are connected in parallel and electrically connected with the power supply module, the secondary sides of the first step-up transformers DA 1 and DA 6 are connected in reverse cascade in sequence, and the secondary side of the first step-up transformer DA 1 is electrically connected with the first test end of the transformer to be tested. The first test terminal may be, but is not limited to, the x-terminal of the transformer to be tested.
The second boosting modules comprise second boosting transformers DB 1 -DB 2 and isolation boosting transformers DC 1 -DC 2;
The primary sides of the isolation step-up transformers DC 1 and DC 2 are connected in parallel and are electrically connected with the power supply module, the secondary sides of the isolation step-up transformers DC 1 and DC 2 are connected in parallel, and the primary sides of the second step-up transformers DB 1 and DB 2 are powered after the parallel connection;
The primary sides of the second step-up transformers DB 1 to DB 2 are connected in series, the secondary sides of the second step-up transformers DB 1 to DB 2 are connected in series, the second step-up transformer DB 1 is electrically connected to the secondary side of the first step-up transformer DA 6, and the secondary side of the second step-up transformer DB 2 is electrically connected to the secondary side of the second step-up transformer DB 3 in another set of second step-up modules.
Another set of second boost modules includes second boost transformer DB 3 -second boost transformer DB 4 and isolation boost transformer DC 3 -isolation boost transformer DC 4;
The primary sides of the isolation step-up transformers DC 3 and DC 4 are connected in parallel and are electrically connected with the power supply module, the secondary sides of the isolation step-up transformers DC 3 and DC 4 are connected in parallel, and the primary sides of the second step-up transformers DB 3 and DB 4 are powered after the parallel connection;
The primary sides of the second step-up transformers DB 3 to DB 4 are connected in series, the secondary sides of the second step-up transformers DB 3 to DB 4 are connected in series, the second step-up transformer DB 3 is electrically connected to the secondary side of the second step-up transformer DB 2 in the previous group of second step-up modules, and the secondary side of the second step-up transformer DB 4 is electrically connected to the second test terminal of the transformer to be tested. The second test terminal may be, but is not limited to, the a terminal of the transformer to be tested.
The transformer to be tested is a 1000MVA/1000kV extra-high voltage transformer.
The generator is a DSF-6500 impulse generator, 5 6500MVA impulse generators are connected in parallel, and a short-time three-phase 32500MVA and two-phase 18500MVA test power supply is provided.
The first step-up transformer DA 1 to the first step-up transformer DA 6 and the isolation step-up transformer DC 1 to the isolation step-up transformer DC 4 are YD-120000/220 impulse transformers, in particular to test transformers with short-time capacity of 1500 MVA;
The second step-up transformer DB 1 to the second step-up transformer DB 4 are YLD-120000/750 impact transformers, specifically test transformers with a short-time capacity of 1200 MVA.
The series point between the secondary side of the first boost transformer DA 1 and the secondary side of the first boost transformer DA 2 is electrically connected to the transformer tank enclosure to be tested. The series point between the secondary side of the first boost transformer DA 3 and the secondary side of the first boost transformer DA 4 is grounded. The transformer to be tested is arranged on the insulation platform IP. The second step-up transformer DB 3 and the second step-up transformer DB 4 are disposed on the insulation stage IP.
And a second test end of the transformer to be tested is electrically connected with a second boosting transformer DB 4 in the second boosting module through a breaking circuit breaker FQ 1 and a breaking circuit breaker FQ 2.
An arrester ARR is provided at a suitable position of the circuit.
The steps when the high-level test is performed on the 1 st column of the transformer to be tested by adopting the test system are specifically described below.
S1, placing a transformer S to be tested on an insulation platform IP, shorting a medium voltage A m1 terminal and an X terminal of a1 st column of the transformer S to be tested through a wire with a sufficient section, and opening a low voltage terminal a and the X;
S2, a second step-up transformer DB 3 and a second step-up transformer DB 4 are arranged on an insulation platform IP, the oil tanks of the outer shells of the second step-up transformer DB 3 and the second step-up transformer DB 4 are insulated to the ground, and can bear 175kV voltage;
S3, outputting an X terminal of the first step-up transformer DA 1 to be connected with an X terminal of the test transformer, outputting an A terminal of the first step-up transformer DA 1 to be connected with an S oil tank shell of the test transformer, and outputting an A terminal of the second step-up transformer DB 4 to be connected with an A terminal of the test transformer through a split brake breaker FQ 1 and a split brake breaker FQ 2;
S4, starting the generators G 1 to G 5 to rated revolution, pre-closing the protection circuit breaker BD and the parallel operation breaker PD, and balancing 5 generators through the parallel operation reactor PR to reach the same voltage and the same revolution;
S5, adjusting the CLR value of the current limiting reactor, controlling the accident current of the generator to be 80kA, switching on the switching-off circuit breaker FQ 1 and the switching-off circuit breaker FQ 2, switching on the switching-on phase-selecting switch HQ, and adjusting the forced excitation input multiple and input time of the generator, the generator switching-on time and the de-excitation time;
S6, measuring the reactance value of a1 st column of the transformer to be tested before the test;
S7, boosting the generator to a first preset value, closing a closing phase selection switch HQ, opening a brake by a brake opening breaker FQ 1 and a brake opening breaker FQ 2 after 250ms, and completing an adjustment test of 50% current;
S8, a brake-separating breaker FQ 1 and a brake-separating breaker FQ 2 are switched on, and a switch-on phase-selecting switch HQ is switched off;
S9, boosting the generator to a second preset value, closing a closing phase selection switch HQ, and opening a brake by a brake opening breaker FQ 1 and a brake opening breaker FQ 2 after 250ms to complete a formal test of the first 100% current;
S10, a breaking circuit breaker FQ 1 and a breaking circuit breaker FQ 2 are switched on, and a switching-on phase-selection switch HQ is switched off;
s11, measuring the reactance value of the transformer S to be tested, comparing the measured reactance value of the 1 st column of the transformer S to be tested before the test, and judging whether the measured reactance value meets the standard requirement;
if yes, entering S12;
if not, stopping the test;
S12, the first column of the transformer S to be tested is in conversion tapping, and the reactance value of the first column of the transformer S to be tested before the next test is measured;
s13, repeating the steps S7-S12 to finish the formal test of the second 100% current;
and S14, repeating the steps S7-S12 to finish the formal test of the third 100% current.
By adopting the method for the column separation test of the 1000MVA extra-high voltage transformer, the problem of the test power supply capacity is solved, and the 1500MVA extra-high voltage transformer with the maximum capacity in the existing extra-high voltage transmission system can also be verified by adopting the column separation test method.
The invention makes the short circuit bearing capability test of the extra-high voltage transformer possible, and protects the driving for the safe operation of the extra-high voltage network.
The invention discloses a column-separating short-circuit test method for an extra-high voltage transformer, which can be used for rapidly, effectively and accurately carrying out high-medium short-circuit test, high-low short-circuit test and medium-low short-circuit test on a transformer to be tested, and solves the problems that the existing test system has small capacity and cannot directly carry out short-circuit test on the extra-high voltage transformer.
The above embodiments are only for illustrating the technical concept and features of the present invention, and are intended to enable those skilled in the art to understand the content of the present invention and implement the same, but not limit the scope of the present invention, and all equivalent changes or modifications made according to the spirit of the present invention should be included in the scope of the present invention.
Claims (1)
1. The column-separating short circuit test method of the extra-high voltage transformer is characterized by comprising the following steps of:
STEP1, combining the conditions of a test system, and processing a plurality of parallel columns of the transformer to be tested to form n parts to be tested;
STEP2, respectively carrying out a high-medium short circuit test, a high-low short circuit test and a medium-low short circuit test on each part to be tested of the transformer to be tested;
STEP1 specifically includes the following:
Disconnecting a medium voltage A m lead of the transformer to be tested from the parallel connection position of adjacent column windings in the transformer to be tested, dividing the lead into an A m1 end to an A mn end, dividing the lead into n medium voltage terminals for leading out, wherein n is more than or equal to 2, and n is an integer;
Or dividing the low-voltage X end of the transformer to be tested into an X 1 end to an X k end, and dividing the low-voltage X end into k low-voltage terminals for leading out, wherein k is more than or equal to 2, and k is an integer;
When the lead wire of the medium voltage A m is divided into n medium voltage terminals, the method of the high-medium short circuit test is as follows, the A end of the transformer to be tested is connected with a high voltage system, the X end and the medium voltage A mi end of the ith part to be tested are connected with a low voltage system after short circuit, the low voltage a end and the low voltage X end are open circuit, i is E [1, n ],
When the lead wire of the medium voltage A m is divided into n medium voltage terminals, the method for testing the high and low short circuits comprises the steps of connecting the A end of the transformer to be tested with a high voltage system, connecting the X end of the transformer to be tested with a low voltage system, opening the A mi end of the i-th part to be tested, shorting the a end of the low voltage with the X end of the low voltage, and ensuring that i is E [1, n ],
When the lead wire of the medium voltage A m is divided into n medium voltage terminals, the method for testing the medium and low short circuits comprises the steps of opening the A end of a transformer to be tested, connecting X with a low voltage system, connecting the medium voltage A mi of the ith part to be tested with a high voltage system, shorting the low voltage a end and the low voltage X end, and ensuring that i is E [1, n ],
When the low voltage X end is divided into k low voltage terminals, the method for high-middle short circuit test is as follows, the A end of the transformer to be tested is connected with a high voltage system, the X j end and the A m end of the j th part to be tested are short-circuited and then connected with the low voltage system, the low voltage a end and the low voltage X end are open-circuited, j is E [1, k ],
When the low voltage X end is divided into k low voltage terminals, the method of high and low short circuit test is that A end of the transformer to be tested is connected with a high voltage system, X j of the j th part to be tested is connected with a low voltage system, A m end is open-circuited, low voltage a end and low voltage X end are short-circuited, j is 1, k,
When the low-voltage X end is divided into k low-voltage terminals, the method for medium-low short circuit test is that the A end of the transformer to be tested is opened, the X j of the j th part to be tested is connected with a low-voltage system, the A m is connected with a high-voltage system, the low-voltage a end and the low-voltage X end are in short circuit, and j is as large as [1, k ].
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| CN101871960B (en) * | 2009-04-23 | 2012-02-15 | 特变电工股份有限公司 | Test method of transformer |
| DE102011079461A1 (en) * | 2011-07-20 | 2013-01-24 | Siemens Ag | Switch with a testable current transformer and method for testing a current transformer of a switch |
| ES2749449T3 (en) * | 2013-04-05 | 2020-03-20 | Omicron Electronics Gmbh | Method and device for testing a transformer |
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| CN113484797A (en) * | 2021-06-15 | 2021-10-08 | 中电电气(江苏)变压器制造有限公司 | Short-circuit bearing capacity test method for single-phase three-winding traction transformer for AT power supply |
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