CN114062406B - Time-resolved polycrystalline X-ray diffraction target device - Google Patents
Time-resolved polycrystalline X-ray diffraction target device Download PDFInfo
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- CN114062406B CN114062406B CN202210000527.9A CN202210000527A CN114062406B CN 114062406 B CN114062406 B CN 114062406B CN 202210000527 A CN202210000527 A CN 202210000527A CN 114062406 B CN114062406 B CN 114062406B
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Abstract
The invention relates to the technical field of powder crystal X-ray diffraction diagnosis, and discloses a time-resolved polycrystalline X-ray diffraction target device, which comprises: the backlight X-ray target assembly is used for generating pulse X-rays for performing transient X-ray diffraction diagnosis on the polycrystalline target at different time sequences; the laser driving loading target assembly is used for simulating an impact compression process generated in a high-speed impact or detonation process of the polycrystalline target, and at least provided with a diffraction hole; the X-ray shielding assembly is used for shielding pulse X-rays which do not enter the diffraction hole and pulse X-rays which enter the diffraction hole from directly passing through light; the X-ray imaging assembly is used for pulse X-ray imaging entering the diffraction hole and is provided with an optical imaging passage; and the focusing and aiming assembly is used for optically imaging the polycrystalline target through the optical imaging passage and the diffraction hole. The invention has the characteristics of high time sequence synchronization precision and good time resolution and is sensitive to microstructure change of atomic scale.
Description
Technical Field
The invention relates to the technical field of powder crystal X-ray diffraction diagnosis, in particular to a time-resolved polycrystalline X-ray diffraction target device.
Background
In the process of high-speed impact or detonation, the internal microscopic atomic structures of some powder crystal materials are rearranged, that is, structural phase change occurs, so that the physical (such as mechanical properties such as strength, optical properties such as transparency, electrical properties such as conductivity and the like) and chemical properties of the powder crystal (metal or ceramic) materials are changed sharply, and the development of subsequent impact or detonation processes is further influenced.
For example, in the fields of explosion mechanics, armor protection and the like, the determination of the physical moment of powder crystal phase change and the microstructure characteristics of powder crystal materials before and after the moment is particularly important, which needs to be realized by a method or a device for diagnosing the microstructure phase change of powder crystal under the extreme conditions of impact and the like, but no better technology is available for realizing process diagnosis at present, and the defects of low diagnosis precision, insensitivity to structure change, need of multiple measurements, low time sequence synchronization precision, poor time resolution and the like generally exist. Therefore, a technology for diagnosing microstructure phase change of powder crystal under extreme conditions such as impact in situ in real time is urgently needed to overcome the defects.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide a time-resolved polycrystalline X-ray diffraction target device, which can realize the time-resolved X-ray diffraction diagnosis of powder crystal materials in the process of impact compression or subsequent unloading driven by laser, determine the microstructure of powder crystals at the diagnosis time through a transient X-ray diffraction spectrum and obtain the microstructure of powder crystals with different delays.
The purpose of the invention is mainly realized by the following technical scheme: a time-resolved polycrystalline X-ray diffraction target apparatus, comprising:
the backlight X-ray target assembly is used for generating pulse X-rays for performing transient X-ray diffraction diagnosis on the polycrystalline target at different time sequences;
the laser driving loading target assembly is connected with the backlight X-ray target assembly and is used for simulating an impact compression process generated in a high-speed impact or detonation process of the polycrystalline target, and the laser driving loading target assembly is at least provided with a diffraction hole which is used as an optical passage of pulse X-rays or an optical imaging pore passage of the polycrystalline target;
the X-ray shielding assembly is connected with the laser driving loading target assembly and is used for shielding pulse X-rays which do not enter the diffraction hole and pulse X-rays which enter the diffraction hole from directly passing through light;
the X-ray imaging assembly is connected with the X-ray shielding assembly and used for pulse X-ray imaging entering the diffraction hole, and the X-ray imaging assembly is provided with an optical imaging passage;
and a process for the preparation of a coating,
and the focusing and aiming assembly is connected with the X-ray imaging assembly and used for closing the optical imaging passage and optically imaging the polycrystalline target through the optical imaging passage and the diffraction hole.
Based on the technical scheme, the backlight X-ray target assembly comprises a backlight X-ray target and a backlight X-ray target bracket which connects the backlight X-ray target with the laser drive loading target assembly.
Based on the technical scheme, the backlight X-ray target is made of metal foil, and a hollow marker is arranged on the metal foil and used for marking the center of the diagnosis light aiming target.
Based on the technical scheme, the backlight X-ray target bracket is provided with a dislocation part for staggering an external laser light path acting on the backlight X-ray target.
Based on above technical scheme, laser drive loading target subassembly includes the laser drive loading target support of being connected with the X ray target subassembly in a poor light, and laser drive loading target support is connected with spacing support, and spacing support swing joint has the locating piece, forms on the locating piece the diffraction hole, form between laser drive loading target support and the locating piece with the diffraction hole intercommunication the space of placing of polycrystal target, still be provided with the laser incidence hole with the diffraction hole intercommunication on the laser drive loading target support.
Based on the technical scheme, the laser driving loading target bracket, the limiting bracket and the positioning block are all made of tantalum or tantalum-tungsten alloy.
Based on the technical scheme, the laser incident hole is a conical square hole, and the small end of the square hole is coaxially communicated with the diffraction hole.
Based on the technical scheme, the X-ray shielding assembly comprises a front shielding plate which is connected with the laser driving loading target assembly and the X-ray imaging assembly, at least the part where the diffraction hole is located in the laser driving loading target assembly is sealed inside the X-ray imaging assembly by the front shielding plate, and the front shielding plate is further connected with a wedge-shaped shielding block and an X-ray direct-penetration light shielding cylinder which are sealed on the inner side of the X-ray imaging assembly.
Based on the technical scheme, the X-ray imaging assembly comprises an upper plate assembly, a lower plate assembly and a peripheral side plate assembly, wherein the upper plate assembly, the lower plate assembly and the peripheral side plate assembly are mutually sealed and enclosed to form a disc-shaped structure with an inner cavity and an opening, and the opening is connected with the X-ray shielding assembly in a sealing manner to seal the inner cavity;
the upper plate assembly, the lower plate assembly and the peripheral side plate assemblies respectively comprise a cover plate, an X-ray imaging plate and an X-ray imaging filter disc which are sequentially arranged from outside to inside;
and a through hole is radially and penetratingly arranged in the middle of the peripheral side plate assembly and is used as an optical imaging passage.
Based on above technical scheme, the inboard interval of apron of week side board subassembly is provided with a plurality of draw-in grooves, and a plurality of draw-in grooves joint upper strata board subassembly, lower floor's board subassembly and week side board subassembly respectively correspond the X ray imaging board, the X ray imaging filter element is laminated respectively in the X ray imaging inboard that corresponds.
Based on the technical scheme, the X-ray imaging filter disc comprises a hydrocarbon polymer layer and a metal foil layer which are arranged in a stacked mode, and the hydrocarbon polymer layer and the metal foil layer are polished on two sides.
Based on the technical scheme, the focusing and aiming assembly comprises an optical lens support connected with the X-ray imaging assembly, an optical lens for closing the optical imaging passage is connected onto the optical lens support, an optical fiber interface is connected onto the optical lens in a closed mode, and the central axes of the optical fiber interface and the optical imaging passage are both located on the optical axis of the optical lens.
Based on the technical scheme, the focusing and aiming assembly further comprises a lens adjusting mechanism arranged on the optical lens bracket, and the optical lens and the optical fiber interface are movably connected to the lens adjusting mechanism;
the lens adjusting mechanism is provided with an X-axis fine adjustment screw and a Y-axis fine adjustment screw which are perpendicular to the optical axis of the optical lens, and the X-axis fine adjustment screw and the Y-axis fine adjustment screw are used for adjusting the transverse position and the longitudinal position of the optical lens;
the lens adjusting mechanism is also provided with at least three Z-axis fine adjustment screws, and the at least three Z-axis fine adjustment screws are used for adjusting the direction of the optical lens or the distance between the optical lens and the end face of the optical fiber interface.
Based on the technical scheme, the X-ray imaging device further comprises an air path system communicated with the inside of the X-ray imaging assembly, and the air path system is used for air suction or air injection inside the X-ray imaging assembly.
Based on the technical scheme, the air path system is a ventilation bent pipe communicated with the optical imaging passage.
Compared with the prior art, the invention has the following beneficial effects: the method has the characteristics of high time sequence synchronization precision and good time resolution, is sensitive to microstructure change of atomic scale, can achieve the measurement precision of 0.01 nanometer aiming at the lattice constant or the interplanar spacing, can directly obtain an X-ray diffraction spectrum through single measurement, does not need to improve the signal to noise ratio through repeated measurement for many times, greatly saves powder crystal samples and experimental times, and can give consideration to laser interference speed measurement diagnosis and interface radiation temperature diagnosis of the interface after powder crystal while not hindering the implementation of time resolution X-ray diffraction diagnosis aiming at the powder crystal.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic cross-sectional view of the device of FIG. 1 with the mounting bracket removed;
FIG. 3 is a schematic structural diagram of a backlight X-ray target holder and a backlight X-ray target according to the present invention;
FIG. 4 is a schematic diagram of the laser driven loading target and its holder according to the present invention;
FIG. 5 is a schematic view of the structure of section A-A in FIG. 4;
FIG. 6 is a partial structural cross-sectional view of an X-ray imaging assembly of the present invention;
FIG. 7 is a schematic view of a partial structure of a lens adjustment mechanism according to the present invention;
the names corresponding to the reference numbers in the drawings are as follows: 1. a backlight X-ray target assembly, 2, a laser-driven loading target assembly, 3, an X-ray shielding assembly, 4, an X-ray imaging assembly, 5, a focusing aiming assembly, 6, an air channel system, 7, a device fixing support, 8, a backlight X-ray target support, 9, a backlight X-ray target, 10, a laser-driven loading target support, 11, a limiting support, 12, a diffraction hole, 13, a front shielding plate, 14, a wedge-shaped shielding block, 15, an X-ray direct-penetrating light shielding cylinder, 16, a peripheral plate assembly cover plate, 17, a cylindrical surface rotating plane interface, 18, a lens adjusting mechanism, 19, an optical fiber interface, 20, an optical lens, 21, an optical lens support, 22, a lower plate assembly cover plate, 23, a clamping groove B, 24, a clamping groove C, 25, an X-axis fine-adjusting screw, 26, a Y-axis fine-adjusting screw, 27-1, a first Z-axis fine-adjusting screw, 27-2 and a second Z-axis fine-adjusting screw, 27-3 and a third Z-axis fine adjustment screw.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
As shown in fig. 1 and 2, the present embodiment provides a time-resolved polycrystalline X-ray diffraction target device including: a backlight X-ray target assembly 1 for generating pulsed X-rays for performing transient X-ray diffraction diagnosis on a polycrystalline target at different timings; the laser driving loading target assembly 2 is connected with the backlight X-ray target assembly 1 and is used for simulating an impact compression process generated in a high-speed impact or detonation process of the polycrystalline target, the laser driving loading target assembly 2 is at least provided with a diffraction hole 12, and the diffraction hole 12 is used as an optical path of pulse X-rays or an optical imaging pore channel of the polycrystalline target; the X-ray shielding assembly 3 is connected with the laser driving loading target assembly 2 and is used for shielding pulse X-rays which do not enter the diffraction hole 12 and pulse X-rays which enter the diffraction hole 12 from directly penetrating light; the X-ray imaging assembly 4 is connected with the X-ray shielding assembly 3 and used for pulse X-ray imaging entering the diffraction hole 12, and an optical imaging passage is arranged in the X-ray imaging assembly 4; and a focusing and aiming assembly 5 connected with the X-ray imaging assembly 4 and closing the optical imaging path for optically imaging the polycrystalline target through the optical imaging path and the diffraction hole 12.
An external light path system provides two groups of high-power pulse lasers with synchronous time sequences, one group of pulse lasers are used as diagnostic lights, one group of pulse lasers are used as loading lights, when the device is used, the loading lights act on a powder crystal target through a beam smoothing lens and a laser driving loading target component 2 to generate an impact compression process generated by a simulation high-speed impact or detonation process, the diagnostic lights act with a backlight X-ray target component 1 through synchronous focusing to generate pulse X-rays, part of the pulse X-rays enter an X-ray imaging component 4 to be imaged and are used for carrying out transient X-ray diffraction diagnosis on the powder crystal target at a specific delay time, an X-ray shielding component 3 shields the pulse X-rays which do not enter a diffraction hole 12 and the pulse X-ray direct-penetrating light which enters the diffraction hole 12, the X-ray imaging component 4 images an X-ray diffraction spectrum of the pulse X-rays, and a focusing aiming component 5 optically images the rear surface or interface of the powder crystal target, the method is used for laser interference speed measurement diagnosis and interface radiation temperature diagnosis of the interface after powder crystal.
As a specific mode of the external optical path system, the external optical path system may select a magic light II upgrading device, and eight paths of pulse lasers thereof are used as the diagnostic light, and a ninth path of light pulse laser of a ninth path device is used as the loading light. When the laser is used, the wavelength of loaded light is 351 nm, the pulse waveform is within 11 ns of pulse width and is adjustable, and the laser energy is output by more than 1000J; the diagnostic light generates pulse X-rays through the action of synchronous focusing and the backlight X-ray target assembly 1, and is used for performing transient X-ray diffraction diagnosis on the powder crystal target at a specific delay time, the wavelength of the diagnostic light is 351 nm, the pulse width is 1 ns, the energy of each path of diagnostic light is about 800J, and the total energy of eight paths of diagnostic light is about 6400J.
It should be noted that the time-resolved polycrystalline X-ray diffraction target device may be placed in a vacuum environment such as a vacuum target chamber during use, reducing the influence of air and external light, and may be positioned in a vacuum environment by a supporting means such as a device fixing holder 7, providing a stable working environment. The powder crystal target mainly comprises an ablation layer and a powder crystal sample, wherein the ablation layer mainly comprises a hydrocarbon polymer material or a hydrocarbon polymer material mixed with medium and high Z elements, such as Polyimide (PI) or polyethylene terephthalate (PET), and the typical thickness is about 20 microns; the ablation layer and the powder crystal sample can be bonded by an instant adhesive or an epoxy resin adhesive, and the typical thickness of the powder crystal sample is about 10 microns.
As shown in fig. 3, the backlight X-ray target assembly 1 is mainly used for generating pulsed X-rays for performing transient X-ray diffraction diagnosis on a polycrystalline target at different timings under the action of external diagnostic light.
As a possible configuration, the backlit X-ray target assembly 1 includes a backlit X-ray target 9 and a backlit X-ray target mount 8 that connects the backlit X-ray target 9 with the laser driven loading target assembly 2. The backlight X-ray target support 8 is used for connecting the backlight X-ray target 9 and then integrally connecting the backlight X-ray target 9 with the laser driving loading target assembly 2, and pulse X-rays are generated after external diagnostic light is irradiated on the backlight X-ray target 9.
For a particular application, the backlit X-ray target 9 is made of metal foil. The thickness of the metal foil is controlled to be about 10 microns, and the metal material adopted by the metal foil determines the photon energy of the pulse X-ray generated by the backlight X-ray target 9 during laser targeting, so the metal foil material can be selected according to specific conditions. For example, the backlight X-ray photons generated by using copper foil mainly come from the characteristic X-ray generated by transition of copper helium ions from an excited state to a ground state, and the energy is about 8.4 keV; if the backlight X-ray photons generated by the iron foil mainly come from the characteristic X-rays generated by transition of the iron helium ions from an excited state to a ground state, the energy is about 6.7 keV, so that the metal foil made of specific materials can be selected according to the photon energy required by the pulse X-ray, different pulse X-ray requirements are met, and the practicability of the pulse X-ray is improved.
In order to ensure the accuracy of the diagnostic light of the backlight X-ray target 9 during laser targeting, the metal foil is hollowed and engraved with a marker for marking the center of the diagnostic light aiming target, so that the position of the diagnostic light aiming target can be determined through the marked center of the diagnostic light aiming target. Further, the hollowed-out carved marker is four hollowed-out regular triangles arranged at intervals, the four hollowed-out regular triangles are uniformly distributed in a mirror image mode, and the middle positions of the four hollowed-out regular triangles can be used as the center position of the diagnosis light aiming target and used for diagnosis light positioning.
The backlight X-ray target bracket 8 is used as a support of the backlight X-ray target 9 and can be made of polymer materials such as plastics, rubber, fibers and the like, and the backlight X-ray target bracket 8 is also provided with a dislocation part in a region close to the center of the laser aiming target and used for staggering an external laser light path acting on the backlight X-ray target 9 so as to ensure that diagnostic light from the external light path is not blocked or partially blocked by the backlight X-ray target bracket 8. Specifically, the dislocation part can be a hollow structure or a notch formed after hollowing, for example, the dislocation part can be a tapered hole which is dug.
As shown in fig. 2, 4 and 5, the laser driven loading target assembly 2 is mainly used for positioning a polycrystalline target position and simulating an impact compression process generated by a high-speed impact or detonation process of loading light on the polycrystalline target, and meanwhile, the laser driven loading target assembly 2 is provided with at least one diffraction hole 12 as an optical path of pulsed X-rays or as an optical imaging pore path of the polycrystalline target.
During specific application, the laser driving loading target assembly 2 comprises a laser driving loading target support 10 connected with the backlight X-ray target assembly 1, the laser driving loading target support 10 is connected with a limiting support 11, the limiting support 11 is movably connected with a positioning block, the diffraction holes 12 are formed in the positioning block, a polycrystalline target placing space communicated with the diffraction holes is formed between the laser driving loading target support 10 and the positioning block, and laser incidence holes communicated with the diffraction holes 12 are further formed in the laser driving loading target support 10. Spacing support 11 is injectd the locating piece on laser drive loading target support 10 to can place the polycrystal target in placing the space or take out and place the space through getting to put the locating piece, when applicable outside loading light beats on the polycrystal target through laser drive loading target support 10, loading light through with ablation layer interact produce compression wave, this compression wave compresses the simulation that realizes striking or detonation process at a high speed to the powder crystal target.
The diffraction apertures 12 serve as optical pathways for the pulsed X-rays or as optical imaging channels for the polycrystalline target, which are preferably tapered apertures to facilitate pulsed X-ray diffraction. Specifically, the aperture of the communication between the diffraction hole 12 and the placing space is smaller than the diameter of the other end of the communication, which is arranged inwards, so that a tapered hole expanding structure with a small outside and a small inside is formed, the minimum diameter of the tapered hole expanding structure is about 300 micrometers, and the typical value of the aperture angle of the tapered hole is 140 degrees, so that the measurement range of the X-ray diffraction angle is limited.
The laser incident hole is arranged on the laser driving loading target support 10 and is communicated with the diffraction hole 12 through a placing space, the central axes of the two holes are preferably overlapped to obtain a better pulse X-ray incident effect and a better diffraction effect, the laser incident hole is connected with the backlight X-ray target support 8 to fix the incident direction of pulse X-rays generated by the interaction of diagnostic light and the backlight X-ray target 8, and the collimated light path for powder crystal diffraction is provided for the pulse X-rays from the diagnostic light target point of the backlight X-ray target 9 to the laser incident hole and then to the diffraction conical hole 12, so that the incident direction and the collimated light path of the pulse X-rays can be changed by reasonably designing the shape and the position of the laser incident hole and adjusting the positions of the backlight X-ray target 8 and the laser incident hole, and the setting and selection can be further carried out according to specific requirements during use. Further, in order to meet the requirement for measuring the diffraction angle of the X-ray, the laser incident hole may be a tapered square hole, a small opening end of the square hole is coaxially communicated with the diffraction hole 12, and the pulse X-ray incident angle is limited by the square hole with a gradually reduced diameter.
In order to ensure long-term use and no influence on diagnosis, the laser-driven loading target holder 10, the spacing holder 11 and the positioning block are all made of tantalum or tantalum-tungsten alloy. Specifically, all three of them can be made of Ta10W alloy.
With continued reference to fig. 2, the X-ray shielding assembly 3 is mainly used to shield the pulse X-rays not entering the diffraction hole 12 and the pulse X-rays entering the diffraction hole 12 from direct light and other external visible light, so as to avoid affecting the diagnostic quality.
In the specific application, the X-ray shielding assembly 3 comprises a front shielding plate 13 which is connected with the laser driving loading target assembly 2 and the X-ray imaging assembly 4, at least the part of the diffraction hole 12 in the laser driving loading target assembly 2 is sealed inside the X-ray imaging assembly 4 by the front shielding plate 13, and the front shielding plate 13 is further connected with a wedge-shaped shielding block 14 and an X-ray direct-penetration light shielding cylinder 15 which are sealed inside the X-ray imaging assembly 4.
When the device is used, the pulse X-ray generated by the interaction of diagnostic light and a backlight X-ray target 9 is collimated through a diffraction hole 12, while the pulse X-ray which is not incident into the diffraction hole 12 is shielded through a front shielding plate 13 and a wedge-shaped shielding block 14, so that the collection of an X-ray diffraction signal by an X-ray imaging plate is prevented from being directly influenced, and in order to improve the shielding effect, the front shielding plate 13 and the wedge-shaped shielding block 14 can be made of tantalum or tantalum-tungsten alloy materials, such as Ta10W alloy. Meanwhile, the part of the pulse X-ray direct-transmission light incident into the diffraction hole 12 is partially shielded by the X-ray direct-transmission light shielding cylinder 15, so that the attenuated pulse X-ray direct-transmission light is imaged on the X-ray imaging plate.
It should be noted that, during shielding, the laser-driven loading target holder 9 and the limiting holder 11 may also shield the pulsed X-ray that is not incident into the diffraction hole 12, and both of them may also be regarded as a common component of the X-ray shielding component 3.
The X-ray direct-transmission light shielding cylinder 15, which is one of the shielding structures of the X-ray shielding assembly 3, may be a cylindrical structure connected to the front shielding plate 13, and a cylinder opening of the cylindrical structure is disposed toward the diffraction hole 12, so that the incoming pulsed X-ray direct-transmission part can be shielded. Specifically, the material of the X-ray direct light shielding cylinder 15 may be 304 stainless steel, and the thickness may be 2 mm.
As shown in FIGS. 2 and 6, the X-ray imaging assembly 4 is used for pulse X-ray imaging entering the diffraction hole 12, and the X-ray imaging assembly 4 is provided with at least one optical imaging path so as to ensure that the focusing and aiming assembly 5 can optically image the rear surface or the interface of the polycrystalline target through the optical imaging path.
When the X-ray imaging assembly 4 is used specifically, the X-ray imaging assembly comprises an upper plate assembly, a lower plate assembly and a peripheral plate assembly, the upper plate assembly, the lower plate assembly and the peripheral plate assembly are mutually sealed and enclosed to form a disc-shaped structure with an inner cavity and an opening, and the opening is connected with the X-ray shielding assembly in a sealing manner to seal the inner cavity; the upper plate assembly, the lower plate assembly and the peripheral side plate assembly comprise a cover plate, an X-ray imaging plate and an X-ray imaging filter disc which are sequentially arranged from outside to inside; and a through hole is radially arranged in the middle of the peripheral side plate component in a penetrating manner and is used as an optical imaging passage. The upper plate assembly, the lower plate assembly and the peripheral side plate assembly are mutually sealed and enclosed and are connected with the X-ray shielding assembly in a sealing mode, so that the inner cavity is sealed to form a sealed imaging cavity, the X-ray imaging plate is prevented from being directly irradiated by external stray light, and the X-ray imaging plate in the upper plate assembly, the lower plate assembly and the peripheral side plate assembly can well image the X-ray diffraction spectrum.
The optical imaging path, which is an imaging channel, may be a through hole penetrating through the peripheral side plate assembly (i.e., through the cover plate, the X-ray imaging plate and the X-ray imaging filter of the peripheral side plate assembly), and the diameter of the through hole is about 7 mm, so that the actively detected reflected light or the spontaneously emitted light from the diffraction holes 12 can enter the focusing and aiming assembly 5 through the peripheral side plate assembly.
In order to facilitate connection and use, a plurality of clamping grooves are arranged on the inner side of the cover plate of the circumferential side plate component at intervals, the plurality of clamping grooves are respectively clamped with the upper layer plate component, the lower layer plate component and the X-ray imaging plate corresponding to the circumferential side plate component, and the X-ray imaging filter disc is respectively attached to the inner sides of the corresponding X-ray imaging plates, so that when the X-ray imaging filter disc is used, the cover plate, the X-ray imaging plate and the X-ray imaging filter disc of each component can be conveniently installed and taken and placed.
As shown in fig. 6, the partial structure diagram of the peripheral side plate assembly is shown, the peripheral side plate assembly cover plate 16 is a semi-arc plate structure, the inner side of the cover plate is provided with a clamping groove a (not shown in the figure) for clamping the X-ray imaging plate of the upper plate assembly, a clamping groove B23 for clamping the X-ray imaging plate of the lower plate assembly, and a clamping groove C24 for clamping the X-ray imaging plate of the peripheral side plate assembly, the clamping groove C24 is located between the clamping groove a and the clamping groove B23, upward from the lower plate assembly cover plate 22, the clamping groove B23 clamps the X-ray imaging plate of the lower plate assembly, the clamping groove C24 clamps the X-ray imaging plate of the peripheral side plate assembly, the clamping groove a clamps the X-ray imaging plate of the upper plate assembly, and finally, the cover plate of the upper plate assembly is sealed above the X-ray imaging plate of the upper plate assembly, so as to form the above-mentioned clamping structure.
It should be noted that fig. 6 is a partial structural view of the peripheral side plate assembly, and a part of the structure in the figure cannot be labeled, but because of the above description, the structure which is not labeled can be used to restore the whole X-ray imaging assembly 4 by combining the structural description with the figure, so there is no clear place, and this is only used to show the structural integrity of this document.
On the basis, in the X-ray imaging assembly 4, the X-ray imaging filter sheet comprises a hydrocarbon polymer layer and a metal foil layer which are arranged in a stacked mode, and the hydrocarbon polymer layer and the metal foil layer are polished on both sides. The hydrocarbon polymer material is mainly used for filtering beta rays in X rays and the like, the thickness of the hydrocarbon polymer material can be about 100-300 microns, and the thickness of the metal foil can be about 10-30 microns. Specifically, the material of the metal foil may be the same as that of the metal foil used for the backlight X-ray target 9, and may be determined according to the photon energy of the pulsed X-ray. Specifically, the surface of the metal foil layer can be provided with a layer of aluminum foil, so that the signal enhancement effect is achieved.
As shown in fig. 2 and 7, the focus-aiming assembly 5 is primarily used for optically imaging a polycrystalline target through an optical imaging path and a diffraction aperture 12.
In specific application, the focusing and aiming assembly 5 comprises an optical lens support 21 connected with the X-ray imaging assembly 4, an optical lens 20 for closing an optical imaging passage is connected on the optical lens support 21, an optical fiber interface 19 is connected on the optical lens 20 in a closed manner, and the central axes of the optical fiber interface 19 and the optical imaging passage are both located on the optical axis of the optical lens 20. The optical fiber interface 19, the optical lens 20 and the optical imaging path form a complete optical path to perform optical imaging on the rear surface or interface of the polycrystalline target, so as to perform laser interference speed measurement diagnosis and interface radiation temperature diagnosis on the interface behind the powder crystal through an imaging result. Specifically, the distance between the end face of the optical fiber interface 19 and the optical lens 20 is slightly larger than the focal length of the optical lens 20, so as to ensure that the optical fiber end face and the rear surface or interface of the powder crystal target viewed through the tapered hole 12 satisfy the optical imaging relationship through the optical lens 20. Further, the fiber connector 19 may employ a standard FC/APC fiber interface or an SMA interface. Furthermore, the outer circumferential surface of the circumferential plate assembly cover plate 16 can be connected with a cylindrical surface-to-plane interface 17, and the optical lens bracket 21 can be well positioned and fixedly connected with the circumferential plate assembly cover plate 16 through the cylindrical surface-to-plane interface 17.
As shown in fig. 7, the focusing and aiming assembly 5 further includes a lens adjusting mechanism 18 disposed on the optical lens support 21, and both the optical lens 20 and the optical fiber interface 19 are movably connected to the lens adjusting mechanism 18; the lens adjusting mechanism 18 is provided with an X-axis fine adjustment screw 25 and a Y-axis fine adjustment screw 26 which are perpendicular to the optical axis of the optical lens 20, and the X-axis fine adjustment screw 25 and the Y-axis fine adjustment screw 26 are used for adjusting the transverse position and the longitudinal position of the optical lens 20; the lens adjusting mechanism 18 is further provided with at least three first Z-axis fine adjustment screws 27-1, second Z-axis fine adjustment screws 27-2, and third Z-axis fine adjustment screws 27-3, wherein the at least three first Z-axis fine adjustment screws 27-1, second Z-axis fine adjustment screws 27-2, and third Z-axis fine adjustment screws 27-3 are used for adjusting the pointing direction of the optical lens 20 or the distance between the optical lens 20 and the end face of the optical fiber interface 19.
The lens adjusting mechanism 18 is mainly used for correspondingly adjusting the optical lens 20 and the optical fiber interface 19, and specifically, on the basis of meeting the imaging relationship, the optical lens 20 is subjected to two-dimensional fine adjustment in the transverse direction and the longitudinal direction through the X-axis fine adjustment screw 25 and the Y-axis fine adjustment screw 26, the transverse direction and the longitudinal direction are respectively perpendicular to the optical axis of the optical lens 20, so that the position of the optical lens 20 can be adjusted in a vertical plane to meet different imaging position requirements, any two of the three first Z-axis fine adjustment screw 27-1, the second Z-axis fine adjustment screw 27-2 and the third Z-axis fine adjustment screw 27-3 are fixed as needed, the remaining one of the first Z-axis fine adjustment screw 27-1, the second Z-axis fine adjustment screw 27-2 and the third Z-axis fine adjustment screw 27-3 is adjusted along the optical axis direction of the optical lens 20, the optical axis direction of the optical lens 20 can be finely adjusted, and when the three first Z-axis fine adjustment screws 27-1, the second Z-axis fine adjustment screws 27-2 and the third Z-axis fine adjustment screws 27-3 are synchronously adjusted, the distance between the optical lens 20 and the end face of the optical fiber interface 19 can be adjusted, so that the imaging effect is changed, and the optical lens can be adjusted and used according to specific conditions.
It should be noted that the lens adjusting mechanism 18 is used as an adjusting mechanism for adjusting the position or relative position of the optical lens 20 and the optical fiber interface 19, and the implementation manners in the prior art are various, such as that in patent No. CN200962162Y and the publication entitled five-dimensional adjusting mechanism, and the embodiment will not be further described with respect to the specific operation principle and the specific structure thereof.
With continuing reference to fig. 1, the time-resolved polycrystalline X-ray diffraction target apparatus of the present invention further includes an air path system 6 communicated with the inside of the X-ray imaging assembly 4, wherein the air path system 6 is used for air extraction or air injection inside the X-ray imaging assembly 4, so as to ensure the balance of the internal and external air pressures during air extraction or air injection of the cavity of the X-ray imaging assembly 4.
Specifically, the air path system is a ventilation elbow communicated with the optical imaging passage. When the X-ray imaging component 4 is used specifically, the ventilation bent pipe cannot be replaced by the straight pipe, and the phenomenon that external stray light directly irradiates an X-ray imaging plate in the X-ray imaging component 4 to influence the imaging effect of the X-ray imaging plate is avoided.
In summary, the time-resolved polycrystalline X-ray diffraction target device of the present invention has the following beneficial effects: 1) the time sequence synchronization precision is high, and the time sequence control precision between the driving light and the pulse X-ray can be controlled within hundred picoseconds; 2) the time resolution is good, and the pulse width of the X-ray can reach the nanosecond or even subnanosecond scale; 3) the method is sensitive to microstructure change of atomic scale, and the measurement precision aiming at the lattice constant or the crystal face spacing can reach 0.01 nanometer; 4) the X-ray diffraction spectrum can be directly obtained through single measurement, the signal-to-noise ratio is improved without repeated measurement for many times, and a large amount of powder crystal samples and experiment times are saved; 5) the method can give consideration to both laser interference speed measurement diagnosis and interface radiation temperature diagnosis of the interface behind the powder crystal while not hindering implementation of time-resolved X-ray diffraction diagnosis on the powder crystal.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (7)
1. A time resolved polycrystalline X-ray diffraction target apparatus, comprising:
the backlight X-ray target assembly is used for generating pulse X-rays for performing transient X-ray diffraction diagnosis on the polycrystalline target at different time sequences;
the laser driving loading target assembly is connected with the backlight X-ray target assembly and is used for simulating an impact compression process generated in a high-speed impact or detonation process of the polycrystalline target, and the laser driving loading target assembly is at least provided with a diffraction hole which is used as an optical passage of pulse X-rays or an optical imaging pore passage of the polycrystalline target;
the X-ray shielding assembly is connected with the laser driving loading target assembly and is used for shielding pulse X-rays which do not enter the diffraction hole and pulse X-rays which enter the diffraction hole from directly passing through light;
the X-ray imaging assembly is connected with the X-ray shielding assembly and used for pulse X-ray imaging entering the diffraction hole, and the X-ray imaging assembly is provided with an optical imaging passage;
and a process for the preparation of a coating,
the focusing and aiming assembly is connected with the X-ray imaging assembly and used for closing the optical imaging passage and optically imaging the polycrystalline target through the optical imaging passage and the diffraction hole;
the laser driving loading target assembly comprises a laser driving loading target support connected with the backlight X-ray target assembly, the laser driving loading target support is connected with a limiting support, the limiting support is movably connected with a positioning block, the diffraction hole is formed in the positioning block, a polycrystalline target placing space communicated with the diffraction hole is formed between the laser driving loading target support and the positioning block, and a laser incidence hole communicated with the diffraction hole is further formed in the laser driving loading target support;
the X-ray imaging assembly comprises an upper plate assembly, a lower plate assembly and a peripheral side plate assembly, wherein the upper plate assembly, the lower plate assembly and the peripheral side plate assembly are mutually sealed and enclosed to form a disc-shaped structure with an inner cavity and an opening, and the opening is connected with the X-ray shielding assembly in a sealing manner to seal the inner cavity; the upper plate assembly, the lower plate assembly and the peripheral side plate assemblies respectively comprise a cover plate, an X-ray imaging plate and an X-ray imaging filter disc which are sequentially arranged from outside to inside; a through hole is formed in the middle of the peripheral side plate assembly in a radial penetrating mode and used as an optical imaging passage;
the focusing and aiming assembly comprises an optical lens support connected with the X-ray imaging assembly, an optical lens for sealing the optical imaging passage is connected onto the optical lens support, an optical fiber interface is connected onto the optical lens in a sealing mode, and the optical fiber interface and the central shaft of the optical imaging passage are both located on the optical axis of the optical lens.
2. The time-resolved polycrystalline X-ray diffraction target apparatus of claim 1, wherein the backlit X-ray target assembly comprises a backlit X-ray target and a backlit X-ray target mount connecting the backlit X-ray target to the laser-driven loading target assembly.
3. The time-resolved polycrystalline X-ray diffraction target device of claim 2, wherein the back-lit X-ray target holder is provided with a staggering portion for staggering an optical path of an external laser applied to the back-lit X-ray target.
4. The time-resolved polycrystalline X-ray diffraction target device of claim 1, wherein the laser-driven loading target holder, the limiting holder, and the positioning block are made of tantalum or tantalum-tungsten alloy.
5. The time-resolved polycrystalline X-ray diffraction target apparatus of claim 1, wherein the X-ray shielding assembly comprises a front shielding plate connected to both the laser-driven loading target assembly and the X-ray imaging assembly, the front shielding plate encloses at least a portion of the laser-driven loading target assembly where the diffraction aperture is located within the X-ray imaging assembly, the front shielding plate is further connected to a wedge-shaped shielding block enclosed inside the X-ray imaging assembly and an X-ray direct-passing light shielding cylinder.
6. The time-resolved polycrystalline X-ray diffraction target device of claim 1, wherein the X-ray imaging filter comprises a hydrocarbon polymer layer and a metal foil layer in a stacked arrangement, both the hydrocarbon polymer layer and the metal foil layer being double-side polished.
7. The time-resolved polycrystalline X-ray diffraction target apparatus of claim 1, further comprising a gas path system in communication with the interior of the X-ray imaging assembly, the gas path system being configured to pump gas or inject gas into the interior of the X-ray imaging assembly; the gas path system is a ventilation bent pipe communicated with the optical imaging passage.
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