CN103824817A - Vacuum ceramic packaging structure of sensor - Google Patents
Vacuum ceramic packaging structure of sensor Download PDFInfo
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- CN103824817A CN103824817A CN201310712996.4A CN201310712996A CN103824817A CN 103824817 A CN103824817 A CN 103824817A CN 201310712996 A CN201310712996 A CN 201310712996A CN 103824817 A CN103824817 A CN 103824817A
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Abstract
本发明涉及一种传感器的真空陶瓷封装结构,包括管壳、吸气剂、芯片及锗窗,所述锗窗固定在所述管壳的顶部,所述吸气剂及所述芯片位于所述管壳内;所述吸气剂与所述芯片分别通过吸气剂凸台与芯片凸台固定在所述管壳的底部,并且所述芯片位于所述吸气剂的上方。本发明将吸气剂放置在芯片的下方,可极大地减少封装体积,从而降低器件的成本。
The invention relates to a vacuum ceramic packaging structure of a sensor, comprising a tube shell, a getter, a chip and a germanium window, the germanium window is fixed on the top of the tube shell, the getter and the chip are located on the Inside the tube case; the getter and the chip are respectively fixed on the bottom of the tube case through the getter boss and the chip boss, and the chip is located above the getter. The invention places the getter under the chip, which can greatly reduce the packaging volume, thereby reducing the cost of the device.
Description
技术领域 technical field
本发明涉及红外光传感器及其它电子传感器,具体地说是一种传感器的真空陶瓷封装结构。 The invention relates to an infrared light sensor and other electronic sensors, in particular to a vacuum ceramic package structure of the sensor. the
背景技术 Background technique
很多电子器件和传感器需要在真空或者其它低压惰性气体中工作。其中,红外光传感器的红外焦平面阵列需要在真空环境下工作。红外光传感器的基本原理是传感器吸收目标物体发出的红外光,使器件温度发生变化,传感器敏感单元的阻值随着温度而发生变化,最终输出一个可以检测的电信号。 Many electronic devices and sensors need to work in vacuum or other low-pressure inert gases. Among them, the infrared focal plane array of the infrared light sensor needs to work in a vacuum environment. The basic principle of the infrared light sensor is that the sensor absorbs the infrared light emitted by the target object, so that the temperature of the device changes, the resistance of the sensor sensitive unit changes with the temperature, and finally outputs a detectable electrical signal. the
红外焦平面阵列需要一个真空密封环境,实现热量的隔离。目前,红外焦平面阵列常用的封装形式有金属封装、陶瓷封装等。由于金属封装成本较高,越来越多的民用市场开始采用陶瓷封装。成本对于红外焦平面阵列市场的成长将起到决定性的作用。 Infrared focal plane arrays require a vacuum-sealed environment for thermal isolation. At present, the commonly used packaging forms of infrared focal plane arrays include metal packaging and ceramic packaging. Due to the high cost of metal packaging, more and more civilian markets have begun to adopt ceramic packaging. Cost will play a decisive role in the growth of the infrared focal plane array market. the
红外焦平面阵列在封装初期真空度可以达到较好水平(十几毫托甚至更高),但是由于封装材料自身的放气及管壳封装的漏率,器件真空度将很快下降,从而使器件丧失工作能力。这样就大大降低了器件的使用寿命,提高了使用成本,限制了市场发展。因此,能够找到一种使器件真空度长期维持在较高水平的方法将极大降低器件的使用成本。 The vacuum degree of infrared focal plane array can reach a good level (a dozen millitorr or even higher) at the initial stage of packaging, but due to the outgassing of the packaging material itself and the leakage rate of the package package, the vacuum degree of the device will drop quickly, so that The device is incapacitated. This greatly reduces the service life of the device, increases the cost of use, and limits market development. Therefore, finding a method to maintain the vacuum degree of the device at a high level for a long time will greatly reduce the cost of using the device. the
现有技术中,维持器件真空度的方法是在器件真空室内放置一颗吸气剂,当器件真空度下降到一定程度时,激活吸气剂从而使器件的真空度继续满足器件的使用要求,从而延长器件的使用寿命,降低使用成本。 In the prior art, the method for maintaining the vacuum degree of the device is to place a getter in the vacuum chamber of the device. When the vacuum degree of the device drops to a certain level, activate the getter so that the vacuum degree of the device continues to meet the use requirements of the device. Thereby prolonging the service life of the device and reducing the cost of use. the
目前,吸气剂一般和芯片并列放置在封装管壳内,这种结构增加了真空腔室的体积,使封装管壳和锗窗及其他封装耗材的体积和用量增加,同时更大的腔室导致更大的真空保持难度。 At present, the getter is generally placed side by side with the chip in the package shell. This structure increases the volume of the vacuum chamber, which increases the volume and consumption of the package shell, germanium window and other packaging consumables. At the same time, a larger chamber Resulting in greater vacuum maintenance difficulty. the
发明内容 Contents of the invention
本发明针对上述问题,提供一种传感器的真空陶瓷封装结构,该封装结构可减少封装体积,从而降低器件的成本。 Aiming at the above problems, the present invention provides a sensor vacuum ceramic packaging structure, which can reduce the packaging volume, thereby reducing the cost of the device. the
按照本发明的技术方案:一种传感器的真空陶瓷封装结构,包括管壳、吸气剂、芯片及锗窗,所述锗窗固定在所述管壳的顶部,所述吸气剂及所述芯片位于所述管壳内;所述吸气剂与所述芯片分别通过吸气剂凸台与芯片凸台固定在所述管壳的底部,并且所述芯片位于所述吸气剂的上方。 According to the technical solution of the present invention: a vacuum ceramic packaging structure of a sensor, comprising a tube shell, a getter, a chip and a germanium window, the germanium window is fixed on the top of the tube shell, the getter and the The chip is located in the tube case; the getter and the chip are respectively fixed on the bottom of the tube case through the getter protrusion and the chip protrusion, and the chip is located above the getter. the
所述吸气剂凸台有两个,所述吸气剂的两端分别固定在所述两个吸气剂凸台上。 There are two getter bosses, and the two ends of the getter are respectively fixed on the two getter bosses. the
所述吸气剂的两端分别设置有定位台阶。 The two ends of the getter are respectively provided with positioning steps. the
所述芯片凸台有两个,所述芯片的两端分别固定在所述两个芯片凸台上。 There are two chip bosses, and the two ends of the chip are respectively fixed on the two chip bosses. the
所述芯片与所述吸气剂俯视为十字交叉结构。 The chip and the getter are viewed as a cross structure. the
所述管壳为陶瓷材料,所述吸气剂凸台为可伐合金材料,所述芯片凸台为可伐合金材料。 The shell is made of ceramic material, the boss of the getter is made of Kovar alloy, and the boss of the chip is made of Kovar alloy. the
所述管壳上设置有排气管,所述排气管的外端安装有密封胶。 An exhaust pipe is arranged on the casing, and a sealant is installed on the outer end of the exhaust pipe. the
所述管壳的两侧分别布置有管壳引脚,每侧所述管壳引脚分别通过键合金属引线与所述芯片相连。 Both sides of the tube shell are respectively arranged with pins of the tube shell, and the pins of the tube shell on each side are respectively connected with the chip through bonding metal leads. the
本发明的技术效果在于:本发明将吸气剂放置在芯片的下方,可极大地减少封装体积,从而降低器件的成本。 The technical effect of the present invention is that: the present invention places the getter under the chip, which can greatly reduce the packaging volume, thereby reducing the cost of the device. the
附图说明 Description of drawings
图1为本发明的结构俯视图,其中去掉了锗窗、吸气剂与芯片。 Fig. 1 is a top view of the structure of the present invention, wherein the germanium window, getter and chip are removed. the
图2为本发明的结构俯视图,其中去掉了锗窗。 Fig. 2 is a top view of the structure of the present invention, wherein the germanium window is removed. the
图3为本发明的结构俯视图。 Fig. 3 is a top view of the structure of the present invention. the
图4为本发明的结构主视剖视图。 Fig. 4 is a front sectional view of the structure of the present invention. the
具体实施方式Detailed ways
下面结合附图对本发明的具体实施方式作进一步的说明。 The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings. the
图1~图3中,包括管壳1、吸气剂凸台2、芯片凸台3、吸气剂4、芯片5、排气管6、管壳引脚7、键合金属引线8、锗窗9、密封胶10、定位台阶11等。
In Fig. 1 to Fig. 3, it includes the shell 1, the getter boss 2, the
如图1~图3所示,本发明是一种传感器的真空陶瓷封装结构,包括管壳1、吸气剂4、芯片5及锗窗9。管壳1为陶瓷材料,管壳1上设置有排气管6,排气管6的外端安装有密封胶10。
As shown in FIGS. 1 to 3 , the present invention is a vacuum ceramic packaging structure of a sensor, including a tube shell 1 , a getter 4 , a chip 5 and a germanium window 9 . The casing 1 is made of ceramic material, and the casing 1 is provided with an
锗窗9固定在管壳1的顶部,锗窗9采用回流焊的方式进行焊接,焊料的选择可以根据需要进行选取。 The germanium window 9 is fixed on the top of the tube case 1 , and the germanium window 9 is soldered by reflow soldering, and the solder can be selected according to requirements. the
吸气剂4及芯片5位于管壳1内。吸气剂4与芯片5分别通过吸气剂凸台2与芯片凸台3固定在管壳1的底部,并且芯片5位于吸气剂4的上方。芯片5与吸气剂4俯视为十字交叉结构。
The getter 4 and the chip 5 are located in the package 1 . The getter 4 and the chip 5 are respectively fixed on the bottom of the package 1 through the getter boss 2 and the
吸气剂凸台2有两个,吸气剂4的两端分别固定在两个吸气剂凸台2上。吸气剂凸台2为可伐合金材料,吸气剂4的两端分别设置有定位台阶11。 There are two getter bosses 2, and the two ends of the getter 4 are respectively fixed on the two getter bosses 2. The getter boss 2 is made of Kovar alloy material, and the two ends of the getter 4 are respectively provided with positioning steps 11 . the
芯片凸台3有两个,芯片5的两端分别固定在两个芯片凸台3上。芯片凸台3为可伐合金材料。
There are two
管壳1的两侧分别布置有管壳引脚7,每侧管壳引脚7分别通过键合金属引线8与芯片5相连。
Both sides of the package 1 are respectively arranged with
本发明的制作工艺流程描述如下: The production process of the present invention is described as follows:
1.吸气剂4安装 1. Getter 4 Installation
如图1所示,首先进行吸气剂凸台2和芯片凸台3的焊接。凸台的材料采用可伐合金,焊接工艺可以根据需要进行选择,比如进行钎焊或烧结工艺。吸气剂凸台2和芯片凸台3要有一定的高度差,以便能够容下吸气剂4和芯片5的安装。
As shown in FIG. 1 , the getter pad 2 and the
然后进行吸气剂4的安装,将吸气剂4焊接到吸气剂凸台2。吸气剂的焊接工艺采用点焊工艺,如图3所示。 The installation of the getter 4 is then carried out, and the getter 4 is welded to the getter boss 2 . The welding process of the getter adopts the spot welding process, as shown in Figure 3. the
2.芯片5安装 2. Chip 5 installation
芯片5的贴片工艺选择银浆黏贴。贴片后在150℃下进行两个小时固化。 The placement process of chip 5 is pasted with silver paste. Curing is carried out at 150°C for two hours after mounting. the
吸气剂4和芯片5安装完成后,分别进行引线8键合,如图2所示。
After the getter 4 and the chip 5 are installed,
3.锗窗9焊接 3. Germanium window 9 welding
锗窗9的焊接,采用回流焊的方式进行焊接,焊料的选择可以根据需要进行选取。 The germanium window 9 is welded by reflow soldering, and the solder can be selected according to requirements. the
4.检漏 4. Leak detection
锗窗9安装完成后,用检漏仪对器件进行检漏。漏率检测如果不能达到既定指标,意味着锗窗焊接工艺未能达到要求,器件报废处理。 After the germanium window 9 is installed, use a leak detector to detect leaks on the device. If the leak rate detection fails to meet the established targets, it means that the germanium window welding process fails to meet the requirements, and the device will be scrapped. the
5.排气 5. Exhaust
器件检漏通过后,上排气台进行排气。排气工艺温度在150℃、48小时。排气完成后截断排气管6进行下料。排气管6截断采用钳封工艺进行密封。
After the leak detection of the device is passed, the upper exhaust table is exhausted. The exhaust process temperature is 150°C for 48 hours. After the exhaust is completed, the
本发明将吸气剂4放置在芯片5的下方,可极大地减少封装体积,从而降低器件的成本。 In the present invention, the getter 4 is placed under the chip 5, which can greatly reduce the packaging volume, thereby reducing the cost of the device. the
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Cited By (10)
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| CN104934380A (en) * | 2015-05-11 | 2015-09-23 | 清华大学 | Chip packaging structure |
| CN105651406A (en) * | 2016-02-23 | 2016-06-08 | 西安交通大学 | Encapsulation structure of tungsten-rhenium film thermocouple sensor chip and production method thereof |
| CN105731357A (en) * | 2016-04-29 | 2016-07-06 | 合肥芯福传感器技术有限公司 | Integrated air-suction type ceramic packaging tube shell |
| CN105731356A (en) * | 2016-04-29 | 2016-07-06 | 合肥芯福传感器技术有限公司 | Integrated temperature measurement type ceramic packaging tube shell |
| CN105731355A (en) * | 2016-04-29 | 2016-07-06 | 合肥芯福传感器技术有限公司 | Integrated multifunctional ceramic packaging tube shell |
| CN105758531A (en) * | 2015-12-01 | 2016-07-13 | 中国科学院上海技术物理研究所 | Vacuum packaging assembly for non-refrigeration infrared detector |
| CN107246889A (en) * | 2017-06-22 | 2017-10-13 | 江苏物联网研究发展中心 | Shell structure and infrared sensor encapsulating structure for non-refrigerating infrared sensor Vacuum Package |
| CN112518166A (en) * | 2021-02-10 | 2021-03-19 | 北京中科同志科技股份有限公司 | Packaging method for chip reliability vacuum packaging welding equipment |
| CN114012754A (en) * | 2021-11-23 | 2022-02-08 | 安徽蓝格利通新材应用股份有限公司 | VIP board and intelligent material loading robot is used in production thereof |
| CN119178461A (en) * | 2024-11-22 | 2024-12-24 | 山西创芯光电科技有限公司 | Anti-interference infrared detection chip packaging structure |
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| CN112518166A (en) * | 2021-02-10 | 2021-03-19 | 北京中科同志科技股份有限公司 | Packaging method for chip reliability vacuum packaging welding equipment |
| WO2022170764A1 (en) * | 2021-02-10 | 2022-08-18 | 北京中科同志科技股份有限公司 | Packaging method for vacuum packaging and soldering device for chip reliability |
| CN114012754A (en) * | 2021-11-23 | 2022-02-08 | 安徽蓝格利通新材应用股份有限公司 | VIP board and intelligent material loading robot is used in production thereof |
| CN119178461A (en) * | 2024-11-22 | 2024-12-24 | 山西创芯光电科技有限公司 | Anti-interference infrared detection chip packaging structure |
| CN119178461B (en) * | 2024-11-22 | 2025-03-07 | 山西创芯光电科技有限公司 | Anti-interference infrared detection chip packaging structure |
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Application publication date: 20140528 |