CN103817600A - 一种双面抛光用抛光布的修整工艺 - Google Patents
一种双面抛光用抛光布的修整工艺 Download PDFInfo
- Publication number
- CN103817600A CN103817600A CN201210465591.0A CN201210465591A CN103817600A CN 103817600 A CN103817600 A CN 103817600A CN 201210465591 A CN201210465591 A CN 201210465591A CN 103817600 A CN103817600 A CN 103817600A
- Authority
- CN
- China
- Prior art keywords
- polishing
- polishing cloth
- skive
- cloth
- trim process
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 91
- 239000004744 fabric Substances 0.000 title claims abstract description 62
- 238000007730 finishing process Methods 0.000 title abstract 3
- 238000000034 method Methods 0.000 claims abstract description 44
- 230000008569 process Effects 0.000 claims abstract description 41
- 230000008439 repair process Effects 0.000 claims description 23
- 239000012530 fluid Substances 0.000 claims description 2
- 230000009467 reduction Effects 0.000 claims description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 19
- 229910052710 silicon Inorganic materials 0.000 abstract description 18
- 239000010703 silicon Substances 0.000 abstract description 18
- 238000012545 processing Methods 0.000 abstract description 4
- 229910003460 diamond Inorganic materials 0.000 abstract 6
- 239000010432 diamond Substances 0.000 abstract 6
- 235000012431 wafers Nutrition 0.000 abstract 2
- 230000001680 brushing effect Effects 0.000 abstract 1
- 238000012360 testing method Methods 0.000 description 6
- 238000009966 trimming Methods 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 4
- 238000007517 polishing process Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000012797 qualification Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000003139 buffering effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 229910001651 emery Inorganic materials 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Description
| 压力 | 下盘转速 | 上盘转速 | 边缘轮转速 | 太阳轮转速 | 修整时间 |
| 240kg | 15转/分钟 | 5转/分钟 | 5转/分钟 | -5转/分钟 | 15分钟 |
| 位置 | 边缘点1 | 1/2半径点1 | 中心点1 | 中心点2 | 1/2半径点2 | 边缘点2 |
| 测试结果 | <15微米 | ≈15微米 | 15~20微米 | 15~20微米 | ≈15微米 | <15微米 |
| 压力 | 下盘转速 | 上盘转速 | 边缘轮转速 | 太阳轮转速 | 修整时间 |
| 240kg | 15转/分钟 | 5转/分钟 | 5转/分钟 | 15转/分钟 | 15分钟 |
| 位置 | 边缘点1 | 1/2半径点1 | 中心点1 | 中心点2 | 1/2半径点2 | 边缘点2 |
| 测试结果 | 15~20微米 | ≈15微米 | <15微米 | <15微米 | ≈15微米 | 15~20微米 |
| 步骤 | 压力 | 下盘转速 | 上盘转速 | 边缘轮转速 | 太阳轮转速 | 修整时间 |
| 1 | 240kg | 15转/分钟 | 5转/分钟 | 5转/分钟 | -5转/分钟 | 7.5分钟 |
| 2 | 240kg | 15转/分钟 | 5转/分钟 | 5转/分钟 | 0转/分钟 | 5秒 |
| 3 | 240kg | 15转/分钟 | 5转/分钟 | 5转/分钟 | 5转/分钟 | 5秒 |
| 4 | 240kg | 15转/分钟 | 5转/分钟 | 5转/分钟 | 15转/分钟 | 7.5分钟 |
| 位置 | 边缘点1 | 1/2半径点1 | 中心点1 | 中心点2 | 1/2半径点2 | 边缘点2 |
| 测试结果 | <15微米 | <15微米 | <15微米 | <15微米 | <15微米 | <15微米 |
Claims (7)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210465591.0A CN103817600B (zh) | 2012-11-16 | 2012-11-16 | 一种双面抛光用抛光布的修整工艺 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210465591.0A CN103817600B (zh) | 2012-11-16 | 2012-11-16 | 一种双面抛光用抛光布的修整工艺 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103817600A true CN103817600A (zh) | 2014-05-28 |
| CN103817600B CN103817600B (zh) | 2016-05-18 |
Family
ID=50753040
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210465591.0A Active CN103817600B (zh) | 2012-11-16 | 2012-11-16 | 一种双面抛光用抛光布的修整工艺 |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103817600B (zh) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106141894A (zh) * | 2015-04-23 | 2016-11-23 | 中芯国际集成电路制造(上海)有限公司 | 研磨垫整理方法及研磨机台 |
| CN106312818A (zh) * | 2016-09-23 | 2017-01-11 | 江苏吉星新材料有限公司 | 一种研磨用陶瓷盘的修整方法 |
| CN107030607A (zh) * | 2016-03-21 | 2017-08-11 | 浙江森永光电设备有限公司 | 抛光机中抛光皮的修复方法 |
| CN111318964A (zh) * | 2018-12-13 | 2020-06-23 | 有研半导体材料有限公司 | 一种延长抛光布使用寿命的处理方法 |
| CN115609480A (zh) * | 2022-10-08 | 2023-01-17 | 杭州中欣晶圆半导体股份有限公司 | 双面抛光的修布工艺 |
| CN115781518A (zh) * | 2022-10-08 | 2023-03-14 | 杭州中欣晶圆半导体股份有限公司 | 抛光布修整工艺 |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5643067A (en) * | 1994-12-16 | 1997-07-01 | Ebara Corporation | Dressing apparatus and method |
| JPH10550A (ja) * | 1996-06-11 | 1998-01-06 | Toshiba Mach Co Ltd | 研磨布ドレッシング方法およびその装置 |
| JPH10217102A (ja) * | 1997-01-30 | 1998-08-18 | Toshiba Mach Co Ltd | 研磨布のドレッシング方法およびその装置 |
| CN1209471A (zh) * | 1997-06-13 | 1999-03-03 | 日本电气株式会社 | 砂布表面整修工具及其生产方法 |
| JP2000153446A (ja) * | 1998-11-19 | 2000-06-06 | Seiko Epson Corp | 研磨布作用面の調整方法 |
| JP2001030156A (ja) * | 1999-07-23 | 2001-02-06 | Toshiba Corp | ドレッシング装置、研磨装置および研磨方法 |
| JP2004098264A (ja) * | 2002-09-12 | 2004-04-02 | Shin Etsu Handotai Co Ltd | 研磨布のドレッシング方法及びワークの研磨方法 |
| CN201211643Y (zh) * | 2007-09-29 | 2009-03-25 | 北京有色金属研究总院 | 一种新型的修布砂轮装置 |
| CN201287294Y (zh) * | 2008-11-04 | 2009-08-12 | 北京有色金属研究总院 | 一种刷抛光大盘用的刷子 |
-
2012
- 2012-11-16 CN CN201210465591.0A patent/CN103817600B/zh active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5643067A (en) * | 1994-12-16 | 1997-07-01 | Ebara Corporation | Dressing apparatus and method |
| JPH10550A (ja) * | 1996-06-11 | 1998-01-06 | Toshiba Mach Co Ltd | 研磨布ドレッシング方法およびその装置 |
| JPH10217102A (ja) * | 1997-01-30 | 1998-08-18 | Toshiba Mach Co Ltd | 研磨布のドレッシング方法およびその装置 |
| CN1209471A (zh) * | 1997-06-13 | 1999-03-03 | 日本电气株式会社 | 砂布表面整修工具及其生产方法 |
| JP2000153446A (ja) * | 1998-11-19 | 2000-06-06 | Seiko Epson Corp | 研磨布作用面の調整方法 |
| JP2001030156A (ja) * | 1999-07-23 | 2001-02-06 | Toshiba Corp | ドレッシング装置、研磨装置および研磨方法 |
| JP2004098264A (ja) * | 2002-09-12 | 2004-04-02 | Shin Etsu Handotai Co Ltd | 研磨布のドレッシング方法及びワークの研磨方法 |
| CN201211643Y (zh) * | 2007-09-29 | 2009-03-25 | 北京有色金属研究总院 | 一种新型的修布砂轮装置 |
| CN201287294Y (zh) * | 2008-11-04 | 2009-08-12 | 北京有色金属研究总院 | 一种刷抛光大盘用的刷子 |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106141894A (zh) * | 2015-04-23 | 2016-11-23 | 中芯国际集成电路制造(上海)有限公司 | 研磨垫整理方法及研磨机台 |
| CN107030607A (zh) * | 2016-03-21 | 2017-08-11 | 浙江森永光电设备有限公司 | 抛光机中抛光皮的修复方法 |
| CN106312818A (zh) * | 2016-09-23 | 2017-01-11 | 江苏吉星新材料有限公司 | 一种研磨用陶瓷盘的修整方法 |
| CN111318964A (zh) * | 2018-12-13 | 2020-06-23 | 有研半导体材料有限公司 | 一种延长抛光布使用寿命的处理方法 |
| CN115609480A (zh) * | 2022-10-08 | 2023-01-17 | 杭州中欣晶圆半导体股份有限公司 | 双面抛光的修布工艺 |
| CN115781518A (zh) * | 2022-10-08 | 2023-03-14 | 杭州中欣晶圆半导体股份有限公司 | 抛光布修整工艺 |
| CN115781518B (zh) * | 2022-10-08 | 2024-10-29 | 杭州中欣晶圆半导体股份有限公司 | 抛光布修整工艺 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103817600B (zh) | 2016-05-18 |
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Address after: 100088 Beijing city Xicheng District Xinjiekou Avenue No. 2 Applicant after: GRINM ADVANCED MATERIALS CO.,LTD. Address before: 100088 Beijing city Xicheng District Xinjiekou Avenue No. 2 Applicant before: GRINM SEMICONDUCTOR MATERIALS Co.,Ltd. |
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Effective date of registration: 20150611 Address after: 101300 Beijing city Shunyi District Shuanghe Linhe Industrial Development Zone on the south side of the road Applicant after: GRINM SEMICONDUCTOR MATERIALS Co.,Ltd. Address before: 100088 Beijing city Xicheng District Xinjiekou Avenue No. 2 Applicant before: GRINM ADVANCED MATERIALS CO.,LTD. |
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Address after: 101300 south side of Shuanghe Road, Linhe Industrial Development Zone, Shunyi District, Beijing Patentee after: Youyan semiconductor silicon materials Co.,Ltd. Address before: 101300 south side of Shuanghe Road, Linhe Industrial Development Zone, Shunyi District, Beijing Patentee before: GRINM SEMICONDUCTOR MATERIALS Co.,Ltd. |
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