CN103458447B - A kind of base station Temperature compensation for gain, calibration and verification method and compensation device - Google Patents

Abstract

The invention discloses a base station gain temperature compensation, calibration and verification method and a compensation device. The gain temperature compensation method can solve the problem that the traditional method cannot accurately compensate the gain temperature characteristics of each area of a multi-transmit and multi-receive base station, including: according to different areas of the base station Call the gain temperature compensation table corresponding to each area at the current working temperature to obtain the initial gain temperature compensation value corresponding to each area; call the gain temperature compensation table corresponding to each area according to the reference temperature of each area of the base station corresponding to the current frequency point to obtain each area The base gain temperature compensation value corresponding to the area; calculate the difference between the initial gain temperature compensation value of each area of the base station and the base gain temperature compensation value of the area, as the gain temperature compensation value of each area; the gain temperature compensation value of each area of the base station The gain temperature compensation value of the entire base station is obtained by adding the values, and the gain temperature compensation value of the base station is used to compensate the gain temperature characteristic of the base station.

Description

A base station gain temperature compensation, calibration and verification method and compensation device

technical field

The invention relates to the field of mobile communication, in particular to a base station gain temperature compensation, calibration and verification method and compensation device.

Background technique

The gain of the radio frequency device of the base station will change with the change of the temperature. In the case of the same circuit structure, the greater the temperature change, the greater the change of the gain. After the gain is changed, for the downlink of the base station, the output power accuracy will decrease, which will affect the coverage area; for the uplink of the base station, the power detection accuracy will decrease, which will affect the rate of the user's uplink data service. Therefore, in order to control the uplink and downlink gains of the base station within a certain range, it is necessary to perform gain temperature characteristic compensation, so that when the base station works at different temperatures, the gain of each channel remains basically constant. Before the gain temperature characteristic compensation of the base station, it is necessary to ensure the accuracy of the gain of the base station at room temperature, which is achieved by calibrating each base station in the production line.

Calibration is to test the power of each channel of the base station at room temperature at different frequencies during the production process of the base station, obtain a set of calibration values, and write them into the memory of the base station for later recall. When the ambient temperature changes, the gain characteristics of the base station also change, making the calibration table in the base station no longer applicable. Due to limited conditions, we cannot perform frequency calibration for each base station at all ambient temperatures. Therefore, in order to ensure the accuracy of the frequency calibration value, it is necessary to additionally compensate the gain temperature characteristics of the base station, and obtain the applicable frequency calibration table together with the The compensation value at different temperatures ensures constant gain.

The existing temperature compensation technology is to change the uplink power reading and downlink gain of the base station by detecting the temperature change of a certain point in the base station, so as to achieve the balance of gain and power reading under different temperatures. And based on the gain at normal temperature, change the downlink gain or uplink power reading of the base station. The problem is that it cannot accurately reflect the gain temperature characteristics of different regions in the multi-transmit and multi-receive base station, and it is impossible to obtain the real temperature compensation value based on the normal temperature gain. At the same time, due to production cost reasons, high and low temperature tests are not performed on each base station. Generally, the temperature gain characteristics are obtained from sample base stations and applied to all base stations of the same type. In the long-term production process, due to the batch difference of devices, the gain temperature characteristics of the base station will change, resulting in inaccurate temperature compensation of the base station.

For the above problems, no effective solution has been proposed yet.

Contents of the invention

The technical problem to be solved by the present invention is to provide a method for verifying the gain temperature of the base station, so as to solve the problem that the traditional method cannot detect the change of the gain temperature characteristic of the radio frequency device in each module of the base station.

In order to solve the above technical problems, the present invention provides a method for verifying the gain temperature of a base station, including:

Obtaining the temperature variation relationship of the first gain of the sample base station in the high and low temperature environment;

Obtaining the temperature change relationship of the second gain of each base station in the high-temperature aging environment;

Determine whether the difference between the gain of each base station in the high temperature aging environment and the gain of the sample base station in the high and low temperature environment under the same temperature conditions is within the preset range, if yes, the gain temperature characteristics of the base station have not changed; if If not, the gain-temperature characteristic of the base station changes.

Another technical problem to be solved by the present invention is to provide a method for calibrating the gain temperature of the base station, including:

Obtain the gain temperature change relationship corresponding to different areas of the sample base station in the high and low temperature environment;

Obtain the gain-temperature variation relationship of each base station in a high-temperature aging environment;

The base stations whose gain in the high-temperature aging environment and the gain of the sample base station in the high-low temperature environment have a difference within a preset range are selected, that is, the base stations whose gain temperature characteristics do not change are selected for calibration.

Another technical problem to be solved by the present invention is to provide a base station gain temperature compensation method to solve the problem that the traditional method cannot accurately compensate the gain temperature characteristics of each area of the multi-transmit and multi-receive base station.

In order to solve the above technical problems, the present invention provides a gain temperature compensation method for a base station, including:

Call the gain temperature compensation table corresponding to each area according to the current working temperature in different areas of the base station, and obtain the initial gain temperature compensation value corresponding to each area;

Call the gain temperature compensation table corresponding to each area according to the reference temperature of each area of the base station corresponding to the current frequency point, and obtain the reference gain temperature compensation value corresponding to each area;

Calculate the difference between the initial gain temperature compensation value of each area of the base station and the reference gain temperature compensation value of the area, as the gain temperature compensation value of each area;

The gain temperature compensation value of each area of the base station is added to obtain the gain temperature compensation value of the entire base station, and the gain temperature compensation value of the base station is used to compensate the gain temperature characteristic of the base station.

In order to solve the above technical problems, the present invention also provides a device for realizing base station gain temperature compensation, including an initial gain temperature compensation value acquisition module, a reference gain temperature compensation value acquisition module, a gain temperature compensation value calculation module and a compensation module, wherein :

The initial gain temperature compensation value acquisition module is used to call the gain temperature compensation table corresponding to each area according to the current operating temperature in different areas of the base station, and respectively obtain the initial gain temperature compensation value corresponding to each area;

The reference gain temperature compensation value acquisition module is used to call the gain temperature compensation table corresponding to each area according to the reference temperature of each area of the base station corresponding to the current frequency point, and respectively obtain the reference gain temperature compensation value corresponding to each area;

The gain temperature compensation value calculation module is used to calculate the difference between the initial gain temperature compensation value of each area of the base station and the reference gain temperature compensation value of the area, as the gain temperature compensation value of each area;

The compensation module is used to add the gain temperature compensation value of each area of the base station to obtain the gain temperature compensation value of the entire base station, and use the gain temperature compensation value of the base station to perform gain temperature characteristic compensation of the base station.

The example of the present invention proposes a temperature compensation data acquisition method for the base station, without adding a hardware temperature compensation device, using the pre-collected sub-regional temperature compensation data to perform sub-regional gain temperature compensation according to the characteristics of the base station, and also provides a high-temperature aging environment. Detect the temperature compensation verification measures of the base station gain, improve the temperature compensation accuracy of the base station, and avoid compensation deviation. The multi-transmit and multi-receive base station has a better effect using the invention.

Description of drawings

Fig. 1 is embodiment 1 flowchart;

Figure 2 is a schematic diagram of downlink temperature compensation data acquisition of the whole machine;

Figure 3 is a flow chart for verifying the temperature compensation characteristics of the gain;

Fig. 4 is embodiment 2 flowchart;

FIG. 5 is a diagram of the corresponding relationship between a single board and a power amplifier of a multi-transmit and multi-receive base station;

Fig. 6 is a schematic diagram of data acquisition of uplink temperature compensation of the whole machine;

Fig. 7 is a schematic diagram of single-board downlink temperature compensation data acquisition;

Fig. 8 is a schematic diagram of data acquisition of uplink temperature compensation on a single board;

Fig. 9 is a flow chart of gain temperature characteristic compensation value acquisition;

Fig. 10 is the flowchart of embodiment 3;

Fig. 11 is a flow chart of gain temperature characteristic compensation;

Figure 12 is a schematic diagram of the device structure.

Detailed ways

In order to make the purpose, technical solution and advantages of the present invention more clear, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.

Example 1

This embodiment introduces a method for verifying the gain temperature characteristics of a base station, so as to solve the problem that the change in the gain temperature characteristics of radio frequency devices in each module of the base station cannot be found in the traditional technology. The temperature compensation value generally uses the data acquired by a small number of sample base stations as the compensation data of all base stations of the same type. However, as the production continues, changes in the batches of radio frequency components in the base station will cause changes in the overall gain temperature characteristics of the base station. In order to detect this change in time and deal with it, this embodiment uses the high-temperature aging environment of the base station to collect The uplink and downlink power detection values obtain the temperature characteristics of the base station from normal temperature to high temperature range, and compare the normal temperature to high temperature range of the high and low temperature data collected by the base station. If there is a large change, it means that the gain temperature characteristics of this batch of base stations have changed. Re-sampling is required to obtain new compensation data; if there is no change, the original temperature compensation data will continue to be used. As shown in Figure 1, including steps 110-130:

Step 110, obtaining the temperature variation relationship of the first gain of the sample base station in the high and low temperature environment;

First, set up the data collection environment of the whole machine: as shown in Figure 2, the computer, the sample base station and the power meter are connected separately. The computer is connected to the network port of the sample base station, and the power meter is connected to the transceiver interface of the sample base station. The sample base station is placed in a high and low temperature environment ( high and low temperature box);

Then, the sample base station starts to transmit power, and the high and low temperature box starts to cycle the temperature. Every preset time (the first preset time), the computer (base station control software in the computer) reads the detected power _P1 of the sample base station. , the detected power P ₂ of the base station measured by the power meter, and the temperature value T _B of the single board inside the sample base station;

After a period of cycle (for example, 24 hours), P ₁ and P ₂ corresponding to different _TB temperature values are obtained, and P ₁ -P ₂ corresponding to different _TB temperature values are calculated. The P ₁ -P ₂ represents the sample base station The downlink power detection channel gain fluctuates with temperature (only the detection channel is used as an example for illustration), hereinafter referred to as the base station gain or the overall gain, and subtracting P ₂ from P ₁ is to consider that the actual power transmitted by the base station itself is also Fluctuations, and P ₁ -P ₂ can offset this part of the fluctuations. The first temperature change relationship of the gain of the base station includes different temperature values T _B and the base station gain (P ₁ -P ₂ ) corresponding to the temperature.

Considering the same hardware circuit design, the gain temperature compensation characteristics are not much different. Therefore, the high and low temperature gains of individual base stations are collected, and the obtained gain temperature characteristics can be applied to the same type of base stations. The collected base stations are sample base stations. The base stations mentioned in the subsequent steps are base stations with the same hardware circuit structure as the sample base station.

Step 120, obtaining the second gain temperature change relationship of each base station in a high-temperature aging environment;

In the high-temperature aging environment of production, it is not realistic to connect the instrument to each base station, so only the load is connected. After the base station sends out power, in the process of normal temperature to high temperature, every once in a while (the second preset time) Collect and record the current temperature of each base station and the corresponding uplink noise floor and downlink power detection value corresponding to the temperature. The second gain temperature change relationship includes the temperature and the uplink noise floor and downlink power detection value corresponding to the temperature. The second gain of each base station The gain-temperature variation relationship is stored in the memory of the respective base station.

Step 130, judging whether the difference between the gain of each base station in the high-temperature aging environment and the gain of the sample base station in the high-low temperature environment under the same temperature condition is within the preset range, if yes, the temperature characteristic of the gain of the base station has not occurred change; if not, the gain-temperature characteristic of the base station has changed.

For base stations where the gain-temperature characteristics have not changed, proceed to subsequent steps such as calibration. For a base station whose gain temperature characteristic changes, it is necessary to return to step 110 and re-sample in a high and low temperature environment to obtain a new gain temperature change relationship of the base station. If the gain change of the base station is still not within the preset range after multiple judgments, then the base station is an unqualified base station.

The following describes step 130 in detail, how to determine whether the difference between the gain of the base station in the high temperature aging environment and the gain in the high and low temperature environment under the same temperature condition is within the preset range:

As shown in Figure 3, the gain change of the whole machine obtained during the high-temperature aging process of each base station is compared with the gain change obtained in the high-low temperature environment of the sample base station under the same temperature conditions, and the uplink and downlink are compared separately (the uplink uses the background noise for comparison) ), if it is found that the gain difference exceeds the preset threshold (for example, 0.5dB), it is considered that the gain temperature characteristics of this batch of base stations have changed, and re-sampling is required to collect temperature compensation data; if there is no change, continue to follow-up operate. Specifically, gain changes at different temperatures are compared separately, and as long as the gain change at one temperature exceeds a threshold, it is considered that the gain temperature characteristic has changed.

Example 2

This embodiment introduces a method for calibrating the gain temperature of a base station, as shown in FIG. 4 , including steps 210-230:

Step 210, obtaining the gain temperature change relationship corresponding to different areas of the sample base station in the high and low temperature environment;

Taking the multi-transmit and multi-receive base station as an example, the TRX (receiver board) and multiple PAs (power amplifiers) of the multi-transmit and multi-receive base station are shown in Figure 5. The temperature of each area is different (the temperature difference near the PA is large), and the corresponding gain There are also differences in temperature characteristics. For example, for a 2T2R (two transmit and two receive) base station, there is one TRX (or two) and two PAs (referred to as PA1 and PA2). The temperature characteristics of the device gain within the device will also have a large difference. The specific description of step 210 is as follows.

Step 220 is the same as Step 120 in Embodiment 1;

Step 230: Screen the base stations whose gain in the high-temperature aging environment and the gain of the sample base station in the high-low temperature environment have a difference within a preset range, that is, screen the base stations whose gain temperature characteristics have not changed, and perform calibration.

For the specific screening operation, refer to step 130 of Embodiment 1;

The calibration operation includes: when calibrating each frequency point at room temperature, record the temperature values of the current single board and power amplifier respectively, as the reference temperature for calibration, and write them in the calibration table of the base station. The format of the frequency calibration table used is shown in Table 1.

Table 1 Example of Gain Frequency Calibration Table Format

frequency frequency calibration value Board temperature Amplifier 1 temperature ... Amplifier temperature … … … … … … … … … … … …

With the same hardware circuit design and the same gain temperature compensation characteristics, the gain temperature change relationship of the sample base station can be collected as temperature compensation data and used as the overall temperature compensation. The overall gain of each base station is different due to the fluctuation of the reference gain of the device, so it needs to be calibrated in the production line.

Step 210 is described in detail below by taking the single board and power amplifier of the base station as an example, that is, how to obtain the temperature variation relationship between the single board of the base station and the power amplifier gain in a high and low temperature environment.

First, according to the devices shown in Figures 2, 6, 7, and 8, the temperature compensation data of the whole machine and single board are collected under high and low temperature environments. Different base stations have different tolerances to temperature. Taking macro base stations as an example, the temperature range of the high and low temperature environment is -40°C~50°C. Fig. 2 is a schematic diagram of device connection for collecting downlink gain changes of the whole machine, and Fig. 6 is a schematic connection diagram of devices for collecting uplink gain changes of the whole machine. FIG. 7 is a schematic connection diagram of devices for collecting downlink gain changes of a single board, and FIG. 8 is a schematic connection diagram of devices for collecting uplink gain changes of a single board. The collected data can be processed to obtain the gain change corresponding to each temperature point of the single board, that is, the gain temperature change relationship of the single board, and the gain change corresponding to each temperature point of the whole machine, that is, the gain temperature change relationship of the whole machine.

Then, the gain data at each temperature point of the whole machine is subtracted from the gain data at the same temperature point in the single board to obtain the temperature variation relationship of the gain of the power amplifier. Considering that the gain change of the whole machine is equal to the gain change of the single board plus the power amplifier, and the gain change of the power amplifier is inconvenient to collect, so the gain change of the power amplifier is obtained by subtracting the gain of the single board from the gain of the whole machine. Finally, two gain temperature compensation tables for single board and power amplifier are obtained.

Figure 9 describes the method for obtaining the downlink gain temperature compensation table, and the same method is used for the uplink. The compensation value acquisition method for each channel is the same. Taking the downlink power detection channel of the base station as an example, the specific compensation value acquisition process is as follows:

Step 1. Set up the data collection environment of the whole machine: as shown in Figure 2, the computer, the sample base station and the power meter are connected separately, wherein the computer is connected to the network port of the sample base station, and the power meter is connected to the transceiver interface of the channel to be tested in the sample base station. Corresponding to the power amplifier to be tested, this embodiment takes the detection channel and the corresponding power amplifier as an example to illustrate, and the sample base station is placed in a high and low temperature environment (high and low temperature box);

Step 2, sample base station transmit power, the high and low temperature chamber starts temperature cycle, and every once in a while, obtain the detected power P ₁ of the sample base station read by the computer, the detected power P ₂ of the base station measured by the power meter, and the internal board of the base station temperature value T _B , and the temperature value T _P of the power amplifier at the same moment;

Step 3, after a period of cycle (for example, 24 hours), obtain P ₁ and P ₂ corresponding to different _TB temperature values, and calculate the fluctuation P ₁ -P ₂ of the downlink power detection channel gain of the sample base station with temperature;

Step 4. Disassemble the whole machine to build a single board data collection environment. Since the power of the single board is small, in order to ensure the accuracy of readings, replace the power meter with a spectrum analyzer. As shown in Figure 7, the computer, single board and spectrum The computer is connected to the network port of the single board, the spectrum analyzer is connected to the transceiver interface of the single board, and the single board is placed in a high and low temperature environment;

Step 5: Carry out a temperature cycle, and obtain the board power detection value P ₃ read by the computer, the board power detection value P ₄ measured by the spectrum analyzer, and the temperature value of the board at regular intervals (the third preset time) T _B ;

Step 6, use P ₃ -P ₄ to obtain the fluctuation value (single board gain) of the detected power of the board with temperature, the fluctuation value and the corresponding board temperature value T _B are the gain temperature variation relationship of the board area, which can be Recorded as the gain temperature compensation table of the single board;

Step 7: Use the P ₁ -P ₂ (integral gain) obtained in step 3 to subtract the corresponding P ₃ -P ₄ (single board gain) at the same board temperature T _B to obtain the fluctuation of the gain of the power amplifier with temperature value, the fluctuation value and the corresponding temperature value T _P of the power amplifier (the T _P is the temperature value of the power amplifier at the same time as the single board temperature T _B corresponding to the above fluctuation value) is the gain temperature change relationship of the power amplifier area, which is recorded as the gain of the power amplifier The temperature compensation table, combined with the gain temperature compensation table of the single board, serves as the overall temperature compensation value of the base station.

When the base station has multiple power amplifiers, use the above method to obtain the gain temperature variation relationship corresponding to different power amplifier regions. In step 1, it is necessary to connect the power meter to the transceiver interface corresponding to the power amplifier to be tested. In step 2, measure the power amplifier corresponding to temperature.

By separately collecting the gain temperature variation in each area of the base station, and using the temperature compensation value of each area when compensating, the temperature characteristic difference of each can be compensated separately.

Example 3

This embodiment introduces a gain temperature compensation method for a base station, as shown in FIG. 10 , including steps 310-340:

Step 310, call the gain temperature compensation table corresponding to each area according to the current working temperature in different areas of the base station, and obtain the initial gain temperature compensation value corresponding to each area;

Step 320, call the gain temperature compensation table corresponding to each area according to the reference temperature of each area of the base station corresponding to the current frequency point, and obtain the reference gain temperature compensation value corresponding to each area;

Step 330, calculating the difference between the initial gain temperature compensation value of each area of the base station and the reference gain temperature compensation value of the area, as the gain temperature compensation value of each area;

Step 340: Add the gain temperature compensation values of each area of the base station to obtain the gain temperature compensation value of the entire base station, and use the gain temperature compensation value of the base station to perform gain temperature characteristic compensation on the base station.

The following takes the base station board and power amplifier as an example to describe the above process in detail, as shown in Figure 11, including the following steps:

Step 1, start the periodic gain temperature compensation task after the base station is powered on;

Step 2. Detect the temperature values of the single board and the power amplifier module to be compensated at regular intervals (for example, 8s), and count them as CurTrxTemp (current board temperature) and CurPaTemp (current power amplifier temperature);

If there are multiple power amplifier modules to be compensated, the temperatures of the multiple power amplifier modules are detected respectively.

Step 3. Find the gain temperature compensation values CurTrxGain (current board gain temperature compensation value) and CurPaGain (power amplifier current gain temperature compensation value) corresponding to each current temperature in the board gain temperature compensation table and power amplifier gain temperature compensation table respectively;

If there are multiple power amplifier modules to be compensated, the current gain temperature compensation value of each power amplifier is searched according to the power amplifier gain temperature compensation table of each power amplifier.

Step 4. Find the corresponding board reference temperature CalTrxTemp and power amplifier reference temperature CalPaTemp in the gain frequency calibration table according to the current frequency point;

Step 5: Use the reference temperature of the board and the power amplifier to obtain the reference gain temperature compensation values CalTrxGain (single board reference gain temperature compensation value) and CalPaGain ( power amplifier reference gain temperature compensation value);

Step 6. Calculate the gain temperature compensation value of the board and the power amplifier respectively. The gain temperature compensation value of the board is A=CurTrxGain-CalTrxGain, and the gain temperature compensation value of the power amplifier is B=CurPaGain-CalPaGain. Then the overall gain temperature compensation value of the base station is A +B;

If there are multiple power amplifier modules to be compensated, the gain temperature compensation value of each power amplifier is calculated separately.

Step 7: Perform temperature gain compensation on the base station by using the gain temperature compensation value A+B of the base station.

If there are multiple power amplifier modules to be compensated, the corresponding base station channel is compensated by adding the temperature compensation value of the gain of each power amplifier module and the gain temperature compensation value of the single board.

In order to improve the accuracy of base station temperature compensation, the present invention records the calibration temperatures of the single board and power amplifier in the base station respectively when the base station is calibrated at normal temperature, and writes them in the calibration table as the reference temperature for base station calibration. When performing gain temperature compensation on the base station, the difference between the temperature value of the base station single board and each power amplifier area and the reference temperature is used for compensation, which can solve the error caused by the different calibration temperatures of different base stations.

Example 4

This embodiment introduces a device for achieving gain temperature compensation, as shown in Figure 12, including an initial gain temperature compensation value acquisition module, a reference gain temperature compensation value acquisition module, a gain temperature compensation value calculation module, and a compensation module, wherein:

The initial gain temperature compensation value acquisition module is used to call the gain temperature compensation table corresponding to each area according to the current operating temperature in different areas of the base station, and respectively obtain the initial gain temperature compensation value corresponding to each area;

The reference gain temperature compensation value acquisition module is used to call the gain temperature compensation table corresponding to each area according to the reference temperature of each area of the base station corresponding to the current frequency point, and respectively obtain the reference gain temperature compensation value corresponding to each area;

The gain temperature compensation value calculation module is used to calculate the difference between the initial gain temperature compensation value of each area of the base station and the reference gain temperature compensation value of the area, as the gain temperature compensation value of each area;

The compensation module is used to add the gain temperature compensation value of each area of the base station to obtain the gain temperature compensation value of the whole base station, and use the gain temperature compensation value of the base station to perform gain temperature characteristic compensation of the base station.

Different areas of the base station include the board area and the power amplifier area.

The gain temperature compensation table corresponding to each area stores the gain temperature change relationship corresponding to each area. For the specific acquisition method, refer to the foregoing embodiments.

Those skilled in the art can understand that all or part of the steps in the above method can be completed by instructing relevant hardware through a program, and the program can be stored in a computer-readable storage medium, such as a read-only memory, a magnetic disk or an optical disk, and the like. Optionally, all or part of the steps in the foregoing embodiments may also be implemented using one or more integrated circuits. Correspondingly, each module/unit in the foregoing embodiments may be implemented in the form of hardware, or may be implemented in the form of software function modules. The present invention is not limited to any specific combination of hardware and software.

Of course, the present invention can also have other various embodiments, and those skilled in the art can make various corresponding changes and deformations according to the present invention without departing from the spirit and essence of the present invention, but these corresponding Changes and deformations should belong to the scope of protection of the appended claims of the present invention.

For example, if the base station has multiple temperature change areas, the above method can be used to obtain the gain temperature compensation table and calibration table for each area, and perform compensation, not limited to single boards and power amplifiers.

Claims (16)

1. A gain temperature verification method of a base station, comprising: Obtaining the temperature variation relationship of the first gain of the sample base station in the high and low temperature environment; Obtaining the temperature change relationship of the second gain of each base station in the high-temperature aging environment; Determine whether the difference between the gain of each base station in the high temperature aging environment and the gain of the sample base station in the high and low temperature environment under the same temperature conditions is within the preset range, if yes, the gain temperature characteristics of the base station have not changed; if If not, the gain temperature characteristic of the base station changes; in: The acquisition of the first gain temperature change relationship of the sample base station in a high and low temperature environment includes: Place the sample base station in a high and low temperature environment for temperature cycling, and every first preset time, obtain the first detection power of the base station read by the computer connected to the network port of the sample base station, and the base station measured by the power meter connected to the transceiver interface of the sample base station. The second detection power, and the temperature value of the internal single board of the sample base station, the base station gain is the difference between the first detection power of the base station and the second detection power of the base station, and the temperature variation relationship of the first gain includes the temperature of the internal single board of the sample base station value and the base station gain corresponding to each temperature value; The acquisition of the second gain temperature change relationship of each base station in a high-temperature aging environment includes: Place the base station in a high-temperature aging environment. From normal temperature to high temperature, collect and record the current temperature of each base station and the detected values of uplink noise floor and downlink power corresponding to the temperature every second preset time. The temperature change relationship of the two gains includes the temperature and the uplink noise floor and downlink power detection value corresponding to the temperature. 2. The method of claim 1, wherein: For a macro base station, the high and low temperature environment refers to an environment of -40°C to 50°C. 3. The method of claim 1, wherein: Determine whether the difference between the gain of each base station in a high temperature aging environment and the gain of a sample base station in a high and low temperature environment under the same temperature conditions is within the preset range, including: For the uplink and downlink gains, judge separately whether the difference between the base station gain of each base station in a high-temperature aging environment and the base station gain of a sample base station in a high-low temperature environment at the same temperature is within the preset range, as long as the difference at one temperature is not Within the preset range, it is considered that the gain temperature characteristic of the base station has changed; The hardware circuit of each base station is the same as that of the sample base station. 4. A gain temperature calibration method of a base station, comprising: Obtain the gain temperature change relationship corresponding to different areas of the sample base station in the high and low temperature environment; Obtain the gain-temperature variation relationship of each base station in a high-temperature aging environment; Screen the base stations whose gain in the high-temperature aging environment and the gain of the sample base station in the high-low temperature environment have a difference within a preset range, that is, screen the base stations whose gain temperature characteristics have not changed, and perform calibration; in: Different areas of the base station include a single board area and a power amplifier area, and the gain data of the power amplifier area at a certain temperature is the gain data of the base station at the temperature minus the gain data of the single board at the temperature; The acquisition of the gain temperature change relationship corresponding to different areas of the sample base station in the high and low temperature environment includes: Place the sample base station in a high and low temperature environment for temperature cycling, and every first preset time, obtain the first detection power of the base station read by the computer connected to the network port of the sample base station, and the base station measured by the power meter connected to the transceiver interface of the sample base station. The second detection power, and the temperature value of the single board inside the sample base station, the temperature value of the power amplifier, and the base station gain are the difference between the first detection power of the base station and the second detection power of the base station; Place the single board in the sample base station in a high and low temperature environment for temperature cycling, obtain the temperature value of the single board every third preset time, connect the first detection power of the single board read by the computer connected to the network port of the single board, connect The second detection power of the single board measured by the spectrum analyzer of the transceiver interface of the single board, the gain of the single board is the difference between the first detection power of the single board and the second detection power of the single board; The gain temperature change relationship of the veneer area includes the veneer temperature value and the veneer gain corresponding to each temperature value; the gain of the power amplifier area at a certain temperature is the difference between the base station gain and the veneer gain at the temperature, and the power amplifier area The temperature change relationship of the gain includes the power amplifier temperature value and the power amplifier gain corresponding to each temperature value; The acquisition of the gain-temperature variation relationship of each base station in a high-temperature aging environment includes: Place the base station in a high-temperature aging environment. From normal temperature to high temperature, collect and record the current temperature of each base station and the detected values of uplink noise floor and downlink power corresponding to the temperature every second preset time, and the gain of each base station. The temperature change relationship includes the temperature and the uplink noise floor and downlink power detection value corresponding to the temperature. 5. The method of claim 4, wherein: For a macro base station, the high and low temperature environment refers to an environment of -40°C to 50°C. 6. The method of claim 4, wherein: The screening of the base stations whose gain in the high temperature aging environment and the gain of the sample base station in the high and low temperature environment have a difference within a preset range includes: For the uplink and downlink gains, judge separately whether the difference between the base station gain of each base station in a high-temperature aging environment and the base station gain of a sample base station in a high-low temperature environment at the same temperature is within the preset range, as long as there is a difference calculated at a temperature If it is not within the preset range, it is considered that the gain temperature characteristic of the base station has changed; The hardware circuit of each base station is the same as that of the sample base station. 7. The method of claim 4, wherein: The calibration includes: when calibrating each frequency point at normal temperature, record the temperature values of different areas of the base station, and use the temperature values as the reference temperature of each area. 8. A gain temperature compensation method for a base station, comprising: Call the gain temperature compensation table corresponding to each area according to the current working temperature in different areas of the base station, and obtain the initial gain temperature compensation value corresponding to each area; Call the gain temperature compensation table corresponding to each area according to the reference temperature of each area of the base station corresponding to the current frequency point, and obtain the reference gain temperature compensation value corresponding to each area; Calculate the difference between the initial gain temperature compensation value of each area of the base station and the reference gain temperature compensation value of the area, as the gain temperature compensation value of each area; The gain temperature compensation value of each area of the base station is added to obtain the gain temperature compensation value of the entire base station, and the gain temperature compensation value of the base station is used to compensate the gain temperature characteristic of the base station; The reference temperature of each area of the base station is the temperature value of each area of the base station recorded when the frequency point is calibrated at room temperature, and the base station is a base station whose gain temperature characteristics have not changed, that is, the gain in the high temperature aging environment is the same as that of the sample base station at high temperature. A base station whose gain difference in a low temperature environment is within a preset range. 9. The method of claim 8, wherein: Different areas of the base station include the board area and the power amplifier area. 10. The method of claim 9, wherein: The gain temperature compensation table corresponding to each area stores the gain temperature change relationship corresponding to each area. 11. The method of claim 10, wherein: The corresponding gain temperature change relationship of each region is obtained in the following ways, including: Place the sample base station in a high and low temperature environment for temperature cycling, and every first preset time, obtain the first detection power of the base station read by the computer connected to the network port of the sample base station, and the base station measured by the power meter connected to the transceiver interface of the sample base station. The second detection power, and the temperature value of the single board inside the sample base station, the temperature value of the power amplifier, and the base station gain are the difference between the first detection power of the base station and the second detection power of the base station; Place the single board in the sample base station in a high and low temperature environment for temperature cycling, obtain the temperature value of the single board every third preset time, connect the first detection power of the single board read by the computer connected to the network port of the single board, connect The second detection power of the single board measured by the spectrum analyzer of the transceiver interface of the single board, the gain of the single board is the difference between the first detection power of the single board and the second detection power of the single board; The gain temperature change relationship of the veneer area includes the veneer temperature value and the veneer gain corresponding to each temperature value; the gain of the power amplifier area at a certain temperature is the difference between the base station gain and the veneer gain at the temperature, and the power amplifier area The temperature change relationship of the gain includes the power amplifier temperature value and the power amplifier gain corresponding to each temperature value. 12. The method of claim 8, wherein: The methods for judging whether the gain temperature characteristic has changed include: For the uplink and downlink gains, judge separately whether the difference between the base station gain of each base station in a high-temperature aging environment and the base station gain of a sample base station in a high-low temperature environment at the same temperature is within the preset range, as long as there is a difference calculated at a temperature If it is not within the preset range, it is considered that the gain temperature characteristic of the base station has changed; The hardware circuit of each base station is the same as that of the sample base station. 13. The method of claim 8, wherein: The gain temperature compensation method is performed periodically. 14. A device for achieving gain temperature compensation, comprising an initial gain temperature compensation value acquisition module, a reference gain temperature compensation value acquisition module, a gain temperature compensation value calculation module, and a compensation module, wherein: The initial gain temperature compensation value acquisition module is used to call the gain temperature compensation table corresponding to each area according to the current operating temperature in different areas of the base station, and respectively obtain the initial gain temperature compensation value corresponding to each area; The reference gain temperature compensation value acquisition module is used to call the gain temperature compensation table corresponding to each area according to the reference temperature of each area of the base station corresponding to the current frequency point, and respectively obtain the reference gain temperature compensation value corresponding to each area; The gain temperature compensation value calculation module is used to calculate the difference between the initial gain temperature compensation value of each area of the base station and the reference gain temperature compensation value of the area, as the gain temperature compensation value of each area; The compensation module is used to add the gain temperature compensation value of each area of the base station to obtain the gain temperature compensation value of the entire base station, and use the gain temperature compensation value of the base station to perform gain temperature characteristic compensation on the base station; The reference temperature of each area of the base station is the temperature value of each area of the base station recorded when the frequency point is calibrated at room temperature, and the base station is a base station whose gain temperature characteristics have not changed, that is, the gain in the high temperature aging environment is the same as that of the sample base station at high temperature. A base station whose gain difference in a low temperature environment is within a preset range. 15. The apparatus of claim 14, wherein: Different areas of the base station include the board area and the power amplifier area. 16. The apparatus of claim 15, wherein: The gain temperature compensation table corresponding to each area stores the gain temperature change relationship corresponding to each area.