CN1029135C - Apparatus for Vapor Deposition Diamond - Google Patents
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本发明是关于一种汽相淀积金刚石的方法及装置。更确切地说,本发明涉及一种均匀汽相淀积金刚石的高效方法及装置,特别是一种在薄膜高的淀积速率下得到的具有足够厚度、优良膜质量的金刚石膜。The invention relates to a method and device for vapor deposition diamond. More precisely, the present invention relates to a high-efficiency method and device for uniform vapor deposition of diamond, especially a diamond film with sufficient thickness and excellent film quality obtained at a high film deposition rate.
金刚石是一种碳的同素异形体,它显示出金刚石结构,具有高的莫氏硬度,其值为10;与其它材料相比,它具有优越的热导值,其值为2000W/MK。Diamond is an allotrope of carbon, which shows a diamond structure and has a high Mohs hardness with a value of 10; compared with other materials, it has superior thermal conductivity with a value of 2000W/MK.
金刚石状的碳也是公知的,它是同种元素的同素异形体。它虽然是非晶形,但透明且绝缘。这种产品还显示出高的热导值和硬度值,尽管其值低于金刚石的,这些因素使得这种物质以多种方式使用成为可能。Diamond-like carbon is also known, which is an allotrope of the same element. Although it is amorphous, it is transparent and insulating. This product also exhibits high thermal conductivity and hardness values, although lower than those of diamond, factors that make it possible to use this substance in a variety of ways.
更确切地说,这种物质引人注目之处在于利用其高热导值作为安装半导体集成电路的基片材料;利用其高硬度值作为工具等的涂覆层。还有,金刚石状的碳当涂覆在钛金属板的表面上时,可用扬声器的振动板。More precisely, what makes this substance attractive is that it uses its high thermal conductivity value as a substrate material for mounting semiconductor integrated circuits; it uses its high hardness value as a coating layer for tools and the like. Also, diamond-like carbon, when coated on the surface of a titanium metal plate, can be used as a vibration plate of a speaker.
尤其是金刚石的热导值为2000W/MK,这相当于高出铜的四倍,而且它还具有优良的硬度和绝缘性能,因此,是半导体元件散热器的理想物质,并用作电路基片的材料。而且,在很宽的波长范围内,金刚石具有优良的光传递性,因此它还是一种优良的光学材料。此外,由于金刚石的频带很宽(为5.45ev),而且是一种具有高的载体迁移率的半导体,所以当它用于高功效装置,例如高温晶体管,高速晶体管等便引人注目了。In particular, the thermal conductivity of diamond is 2000W/MK, which is equivalent to four times higher than that of copper, and it also has excellent hardness and insulation properties, so it is an ideal material for heat sinks for semiconductor components and used as a substrate for circuit substrates Material. Moreover, in a wide range of wavelengths, diamond has excellent light transmission, so it is also an excellent optical material. In addition, since diamond has a wide frequency band (5.45 eV) and is a semiconductor with high carrier mobility, it is attractive when used in high-efficiency devices such as high-temperature transistors, high-speed transistors, etc.
对于人造金刚石或金刚石状的碳的汽相法来说,已提出并研究了这样的方法,例如化学汽相淀积法(CVD法)、离子电镀法,离子化汽相淀积法、溅射法等等。在它们当中,显示出批量生产最有可能性的是CVD法。根据反应气的激发方法,这种方法可分类为热丝极CVD法,微波等离子体CVD法,以及电子加速CVD法等等。For the vapor phase method of synthetic diamond or diamond-like carbon, methods such as chemical vapor deposition (CVD), ion plating, ionization vapor deposition, sputtering, etc. have been proposed and studied. Law and so on. Among them, the CVD method shows the most possibility of mass production. According to the excitation method of the reactant gas, this method can be classified into a hot filament CVD method, a microwave plasma CVD method, an electron accelerated CVD method, and the like.
更确切地说,对具有高质量的汽相合成金刚石的方法而言,已经知道化学汽相淀积法(CVD法)例如热丝极法(S.Matsumoto et al,Japan, J.Appl.Phys,21(1981)L183),微波等离子体CVD法(M.Kamo et al.,J.Cryst,Growth.62(1983)642),电子加速CVD法(A.Sawbe et al.,Appl.Phys Lett.46(1985)1467等等。More precisely, chemical vapor deposition (CVD) such as the hot filament method (S.Matsumoto et al, Japan, J.Appl.Phys, 21 (1981) L183), microwave plasma CVD method (M.Kamo et al., J.Cryst, Growth.62 (1983) 642), electron accelerated CVD method (A.Sawbe et al. , Appl. Phys Lett. 46 (1985) 1467 and so on.
然而按照这些制备方法,金刚石膜的淀积率低至nμm/h或更低,而且尽管使用了廉价的装置和原料,由于生产率低,成本也较高,因此,从实用的角度看并不切实可行。还有,高频热等离子体CVD法(Society of Applied Physics,Spring Season Lecture Mareh 1987)也有缺点,即在30μm或更高的膜厚下,表面被石墨化,所以,虽然可达到1μm/min的高的膜淀积速率,但可能制备厚膜。高频产生的热等离子体的速率很低,因此,必须将基片放在与热等离子体接触的地方,所以,基片表面的温度升高,因而可以制备厚膜。另外,由于形成了体积很大的热等离子体,所以热等离子体的流速很低,对水冷基片不能提供足够高的冷却速度,从而不可能得到一层均匀的金刚石膜。However, according to these preparation methods, the deposition rate of the diamond film is as low as nµm/h or less, and although inexpensive equipment and raw materials are used, the production rate is low and the cost is high, so it is not practical from a practical point of view. feasible. In addition, the high-frequency thermal plasma CVD method (Society of Applied Physics, Spring Season Lecture Mareh 1987) also has disadvantages, that is, the surface is graphitized at a film thickness of 30 μm or higher, so although it can reach 1 μm/min High film deposition rate, but possible to produce thick films. The speed of the thermal plasma generated by high frequency is very low, therefore, the substrate must be placed in contact with the thermal plasma, so the temperature of the substrate surface rises, so thick films can be prepared. In addition, due to the formation of a large volume of thermal plasma, the flow rate of the thermal plasma is very low, which cannot provide a high enough cooling rate for the water-cooled substrate, so that it is impossible to obtain a uniform diamond film.
因此,虽然已有多种淀积法可以利用,而且通过每一种所述方法都可实现淀积金刚石,但具有高质量的膜的淀积速率仅为1μ/h或更低,其质量只能根据喇曼光谱法测金刚石的波峰来测出。另外,就金刚石状的碳而言,淀积速度很低,仅约为10μm/h,这对批量生产来说的是个问题。Therefore, although a variety of deposition methods are available, and deposition of diamond can be realized by each of said methods, the deposition rate of a film with high quality is only 1 μ/h or less, and its quality is only 1 μ/h. It can be detected by measuring the peak of diamond by Raman spectroscopy. In addition, in the case of diamond-like carbon, the deposition rate is very low, only about 10 µm/h, which is a problem for mass production.
综上所述,需要开发出一种快速淀积膜的淀积法。In summary, it is necessary to develop a deposition method for rapidly depositing films.
如上所述,就金刚石膜的淀积法来说,已提出并研究了不同的方法,但是即使在最佳的CVD法中,金刚石的淀积速率仅为1μm/h或更低,因此,开发快速淀积膜的CVD法必须有待于实现。As described above, in terms of the deposition method of the diamond film, various methods have been proposed and studied, but even in the best CVD method, the deposition rate of diamond is only 1 μm/h or less, therefore, the development A CVD method for rapidly depositing films must yet be realized.
因此,本发明的目的是消除上述先有技术的缺点,提供一种用于在基片上汽相淀积金刚石并在比较高的膜淀积速率下具有足够的膜厚和良好的膜质量的方法及装置。Therefore, the object of the present invention is to eliminate the above-mentioned shortcoming of prior art, provide a kind of method for vapor depositing diamond on substrate and have sufficient film thickness and good film quality under relatively high film deposition rate and devices.
从下面的说明中可以看到本发明的其它目的和优点。Other objects and advantages of the invention will appear from the following description.
按照本发明,提供了一种汽相淀积金刚石的方法,该方法包括如下步骤:According to the present invention, a kind of method of vapor deposition diamond is provided, the method comprises the steps:
在一个热等离子化学汽相淀积装置的阴阳极之间通入放电气体的同时进行电弧放电,Arc discharge is performed while passing discharge gas between the cathode and anode of a thermal plasma chemical vapor deposition device,
通过向生成的等离子流中通入气体使气态碳化合物自由基化,以及free radicalization of gaseous carbon compounds by passing gas into the resulting plasma stream, and
使自由基化的等离子流碰撞待处理的基片,从而在基片上形成了一层金刚石膜。The radicalized plasma stream hits the substrate to be treated, thus forming a diamond film on the substrate.
按照本发明,还提供了一种金刚石的汽相淀积法,该方法包括如下步骤:According to the present invention, also provide a kind of vapor phase deposition method of diamond, this method comprises the steps:
将一种含氢气体和一种气态碳化合物通入一个具有阳极和阴极的热等离子体发生装置中;passing a hydrogen-containing gas and a gaseous carbon compound into a thermal plasma generating device having an anode and a cathode;
通过电极间的直流电弧放电使气体自由基化;Free radicalization of gases by direct current arc discharge between electrodes;
向一个减压室射入呈等离子流的热等离子体;以及injecting hot plasma in a plasma stream into a decompression chamber; and
通过使热等离子流碰撞冷却的基片骤冷等离子流,从而在基片上淀积一层金刚石膜。A diamond film is deposited on the substrate by quenching the plasma stream by impinging the hot plasma stream on a cooled substrate.
按照本发明,进一步提供了一种汽相淀积金刚石的方法,该方法包括如下步骤:According to the present invention, further provide a kind of method of vapor deposition diamond, this method comprises the steps:
通过在封闭体系中开启的多个喷嘴的内壁形成一个一种极性电极和与其极性相反的多个电极间施加直流电,进行电弧放电,从而自由基化或活化氢气和含气态碳化合物的气体,形成一种热等离子体;By applying direct current between one electrode of one polarity and multiple electrodes of opposite polarity formed on the inner wall of multiple nozzles opened in a closed system, arc discharge is performed, thereby free radicalizing or activating hydrogen and gas containing gaseous carbon compounds , forming a thermal plasma;
向减压室射入等离子流;Inject plasma flow into the decompression chamber;
通过使热等离子流碰撞冷却的基片,骤冷等离子流,从而在基片上淀积一层金刚石膜。A diamond film is deposited on the substrate by quenching the plasma stream by impinging the hot plasma stream on a cooled substrate.
按照本发明,还提供了一种形成等离子装置,该装置是一种形成等离子流的装置,包括一个配有放电气输气管、原料气或输送固体颗粒的气体的输气管及直流电源和电线的封闭体,并且其中具有开启的喷射等离子流的喷嘴,该装置的特征在于,其中多个喷嘴开启,各喷嘴的内壁形成了分别具有同样极性的电极,并且多个具有相反极性的电极设置在封闭体系内,以使它们对着各喷嘴的内壁。According to the present invention, there is also provided a device for forming a plasma, which is a device for forming a plasma flow, including a device that is equipped with a discharge gas pipeline, a gas pipeline for raw material gas or a gas that transports solid particles, a DC power supply, and electric wires. A closed body, and therein are opened nozzles for spraying plasma streams, the device is characterized in that a plurality of nozzles are opened, the inner walls of each nozzle form electrodes with the same polarity respectively, and a plurality of electrodes with opposite polarities are arranged In a closed system so that they face the inner wall of each nozzle.
按照本发明,还提供了一种汽相淀积金刚石的方法,该方法包括如下步骤:According to the present invention, also provide a kind of method of vapor deposition diamond, this method comprises the steps:
将气体通入到吹管形式的具有阳极和阴极的热等离子体发生装置中;passing the gas into a thermal plasma generating device in the form of a torch having an anode and a cathode;
通过在电极之间进行直流电弧放电使气体自由基化,以形成一种热等离子体;radicalization of the gas by direct current arc discharge between electrodes to form a hot plasma;
通过在吹管尖端的喷嘴射出呈等离子流的热等离子体。The hot plasma is projected as a plasma jet through a nozzle at the tip of the torch.
向等离子流中喷入冷却气,以使等离子体骤冷并形成一种至少含有通过加入到等离子流中的碳化合物自由基化而形成的自由基产物并具有很高的自由基浓度的活性非平衡等离子体;以及,Injecting cooling gas into the plasma stream to quench the plasma and form an active non-active non Equilibrium plasma; and,
使基片与非平衡等离子体接触,从而在基片上 淀积一层金刚石膜。exposing the substrate to a non-equilibrium plasma, whereby on the substrate Deposit a layer of diamond film.
按照本发明,进一步提供了一种汽相淀积金刚石的方法,该方法是通过一个具有阴极和阳极的直流等离子吹管进行电弧放电,与此同时,在阴阳两极之间通入放电气体,并向待处理的基片上辐射形成的等离子体,以在其上形成一层金刚石膜,该方法包括使用至少两个等离子体吹管,在一个吹管中将一种较高放电电压的气体制成等离子体,剩下的吹管中将较低放电电压的反应性气态碳的化合物制成等离子体,并使这两种等离子体以射流形式碰撞基片,从而形成一层金刚石膜。According to the present invention, there is further provided a method for vapor-phase deposition of diamond, the method is to carry out arc discharge through a DC plasma torch with a cathode and an anode, at the same time, a discharge gas is introduced between the cathode and anode, and the radiating the formed plasma on the substrate to be treated to form a diamond film thereon, the method comprising using at least two plasma torches, making a gas of a higher discharge voltage into a plasma in one of the torches, In the remaining torch, a reactive gaseous carbon compound with a lower discharge voltage is made into a plasma, and the two plasmas collide with the substrate in the form of a jet, thereby forming a diamond film.
按照本发明,还提供了一种汽相淀积金刚石的方法,该方法包括如下步骤:According to the present invention, also provide a kind of method of vapor deposition diamond, this method comprises the steps:
使用多个等离子体吹管,Using multiple plasma torches,
使多个等离子流相互碰撞,在这些等离子流中将碳源制成等离子体以形成金刚石膜。A plurality of plasma streams in which a carbon source is made into plasma to form a diamond film are caused to collide with each other.
按照本发明,进一步提供了一种汽相淀积金刚石的方法,该方法包括如下步骤:According to the present invention, further provide a kind of method of vapor deposition diamond, this method comprises the steps:
将一种通过电弧放电形成的放电气体和一种至少含有一气态碳化合物的原料制成等离子体;making a plasma of a discharge gas formed by arc discharge and a material containing at least one gaseous carbon compound;
射入作为呈等离子流的热等离子体,以及Injection of hot plasma as a plasma stream, and
使等离子骤冷以在基片上淀积一层金刚石膜,其中使电弧放电不稳定的至少部分原料加入到等离子流引发端的中心,而不通过电弧放电部分。The plasma is quenched to deposit a diamond film on the substrate, wherein at least a portion of the material destabilizing the arc discharge is fed into the center of the plasma stream initiation end and not through the arc discharge portion.
参考下面的附图说明,将更好地理解本发明,其中:The invention will be better understood with reference to the following description of the drawings, in which:
图1说明了按照本发明实施的热等离子体CVD方法的原理。Figure 1 illustrates the principle of the thermal plasma CVD method practiced in accordance with the present invention.
图2示意说明了一个用于实施本发明的热等离子体CVD装置;Fig. 2 schematically illustrates a thermal plasma CVD apparatus for practicing the present invention;
图3说明了热等离子体汽相合成法的一个实施方案;Figure 3 illustrates an embodiment of the thermal plasma vapor phase synthesis method;
图4说明了热等离子体汽相合成法的另一个实施方案;Figure 4 illustrates another embodiment of thermal plasma vapor phase synthesis;
图5是氢分子分解反应平衡常数的温度变化图。Fig. 5 is a graph showing the temperature change of the equilibrium constant of hydrogen molecular decomposition reaction.
图6是本发明的一个热等离子流发生装置的剖视图;Fig. 6 is a sectional view of a thermal plasma flow generating device of the present invention;
图7是本发明的一个热等离子发生装置的底视图;Fig. 7 is a bottom view of a thermal plasma generating device of the present invention;
图8是本发明另一个热等离子流发生装置的剖视图;Figure 8 is a sectional view of another thermal plasma flow generating device of the present invention;
图9是采用本发明等离子流发生装置的汽相合成装置的图例。Fig. 9 is a schematic diagram of a vapor phase synthesis device using the plasma flow generating device of the present invention.
图10(a)说明了本发明DC等离子体汽相合成的原理,图10(b),图10(c)是等离子体吹管的剖视图;Figure 10 (a) illustrates the principle of DC plasma vapor phase synthesis of the present invention, Figure 10 (b), Figure 10 (c) is a cross-sectional view of the plasma torch;
图11(a)和(b)分别是图和照片,表明了按照本发明实施方案的DC等离子流的状态;11(a) and (b) are diagrams and photographs, respectively, showing the state of DC plasma flow according to an embodiment of the present invention;
图12(a)和(b)分别是图和照片,表明了按照本发明另一个实施方案的DC等离子体汽相合成的等离子流的状态;Fig. 12 (a) and (b) are figure and photograph respectively, have shown the state of the plasma flow of the DC plasma vapor phase synthesis according to another embodiment of the present invention;
图13示意说明了按照等离子体CVD法在基片上金刚石的形成。Figure 13 schematically illustrates the formation of diamond on a substrate according to the plasma CVD method.
图14示意说明了用于实施本发明的热等离子体CVD装置;Figure 14 schematically illustrates a thermal plasma CVD apparatus for practicing the present invention;
图15说明了本发明等离子流CVD法的原理;Fig. 15 illustrates the principle of the plasma flow CVD method of the present invention;
图16是用于实施本发明等离子流CVD法装置的总体图;Fig. 16 is a general diagram for implementing the plasma flow CVD method device of the present invention;
图17表明了按照本发明的金刚石膜的晶体结构;Figure 17 has shown the crystal structure according to the diamond film of the present invention;
图18表明了按照本发明另一实施方案的金刚石膜的晶体结构;Figure 18 shows the crystal structure of a diamond film according to another embodiment of the present invention;
图19说明了本发明等离子流喷射装置的原理;Figure 19 illustrates the principle of the plasma jet device of the present invention;
图20是扫描电子显微照片,表明了金刚石膜的表面;Figure 20 is a scanning electron micrograph showing the surface of the diamond film;
图21是扫描电子显微照片,表明了金刚石膜的表面和截面;Figure 21 is a scanning electron micrograph showing the surface and cross-section of the diamond film;
图22表明了金刚石膜的X-射线衍射结果;Figure 22 has shown the X-ray diffraction result of diamond film;
图23表明了金刚石膜的Raman谱;Figure 23 shows the Raman spectrum of the diamond film;
图24表明了本发明的气冷直流等离子流汽相合成装置;Fig. 24 has shown the gas-cooled direct current plasma flow vapor-phase synthesis device of the present invention;
图25是扫描电子显微镜照片,表明了金刚石膜的表面;Figure 25 is a scanning electron micrograph showing the surface of the diamond film;
图26是扫描电子显微镜照片,表明了金刚石膜的表面和截面;Figure 26 is a scanning electron micrograph showing the surface and cross-section of the diamond film;
图27表明了金刚石膜的X-射线衍射结果;Figure 27 has shown the X-ray diffraction result of diamond film;
图28表明了金刚石膜的喇曼光谱;以及Figure 28 shows the Raman spectrum of the diamond film; and
图29表明了按照本发明DC等离子流和传统的微波等离子体的发射光谱。Figure 29 shows the emission spectra of a DC plasma stream according to the present invention and a conventional microwave plasma.
按照本发明,通过应用一种热等离子体CVD装置(已用于合成陶瓷细粉),使金刚石淀积在待 处理的基片上。According to the present invention, diamond is deposited on the processed substrate.
图1表明了用于本发明CVD的热等离子体法的原理,其中,在放电气体3通过阳极1和阴极2之间的同时,施加电压进行电弧放电,从而产生温度为5000℃或更高的电弧等离子体。Fig. 1 shows the principle of the thermal plasma method used for the CVD of the present invention, in which, while the
通过设置在阳极1上的入口,原料气4通入到电弧等离子体形成部分,迅速被加热到高温并被活化,从而形成高密度的自由基,同时待喷射的体积膨胀,以超高速等离子流6通过喷嘴5。Through the inlet set on the
采用上述方法,已试图合成高熔点化合物粉,例如碳化硅(SiC)或氮化硅(Si3N4)。更具体地说,已做了实验,其中对生产SiC来说,硅烷(SiH4)和甲烷(CH4)作为原料气加入到电弧等离子体中;对于生产SiN来说,加入SiN4和氨(NH3),进行活化并通过使自由基反应发生来制备粉末。Using the methods described above, attempts have been made to synthesize powders of high melting point compounds such as silicon carbide (SiC) or silicon nitride (Si 3 N 4 ). More specifically, experiments have been done in which silane (SiH 4 ) and methane (CH 4 ) were fed as raw material gases into an arc plasma for the production of SiC; and SiN 4 and ammonia ( NH 3 ), undergo activation and prepare the powder by allowing free radical reactions to occur.
本发明发展了这种方法,旨在通过使等离子流6碰撞待处理的基片7,从而在寿命短的自由基消失之前在基片上进行有效的CVD反应,由此成膜。此外,在基片上进行反应的过程中,施加电弧放电和等离子体碰撞过程中产生的紫外线辐射造成的光激发而得到的能量。The present invention develops this method for the purpose of forming a film by causing the
所以,本发明产生了远高于通过高温电弧(高于5000℃)活化的先有技术所得到自由基的密度,同时,向待处理基片输送自由基并通过从上述光激发和碰撞得到的能量使自由基反应发生,从而有效的进行金刚石淀积。Therefore, the present invention produces a density of free radicals much higher than that obtained by the prior art activated by high-temperature electric arc (above 5000°C), and at the same time, transports free radicals to the substrate to be processed and obtains by the excitation and collision from the above-mentioned The energy causes free radical reactions to occur for efficient diamond deposition.
在按照本发明CVD法的第二个实施方案合成金刚石的过程中,一种碳化合物(如甲烷、乙炔、醇、丙醇、甲胺、二氯乙烷等)与氢的混合气被分解以活化,并在适宜汽相淀积金刚石的温度下(即400~1500℃金刚石淀积在基片上。在金刚石的合成中,考虑到活性物种(如氢原子和烃基)在汽相中起着重要作用,为了提高金刚石的淀积速率,可制备高密度的这样的活性物种的等离子体并输送到基片表面上。In the process of synthesizing diamond according to the second embodiment of the CVD method of the present invention, a mixture of carbon compounds (such as methane, acetylene, alcohol, propanol, methylamine, dichloroethane, etc.) and hydrogen is decomposed to Activate and deposit diamond on the substrate at a suitable temperature for vapor deposition of diamond (that is, 400-1500°C). In the synthesis of diamond, it is considered that active species (such as hydrogen atoms and hydrocarbon groups) play an important role in the vapor phase. In order to increase the deposition rate of diamond, a high density plasma of such active species can be prepared and delivered to the surface of the substrate.
关于分子具有较高的活性和高的离解度的等离子体,已经知道一种热等离子体,其中不同的化学物种,例如离子、电子、中性颗粒在等离子体中的温度基本上相同,其温度为5000K或更高。图5表明了氢分子的离解反应平衡常数随温度的变化,但在500K时可以看出,几乎全部氢分子离解成氢原子。然而,当该温度下的热等离子体与基片接触时,基片的温度升得太高,很难合成金刚石。Regarding the plasma with high activity and high degree of dissociation of molecules, a thermal plasma is known, in which different chemical species, such as ions, electrons, and neutral particles, have basically the same temperature in the plasma, and the temperature 5000K or higher. Figure 5 shows the dissociation reaction of molecular hydrogen The equilibrium constant varies with temperature, but at 500K it can be seen that almost all hydrogen molecules dissociate into hydrogen atoms. However, when hot plasma at this temperature comes into contact with the substrate, the temperature of the substrate rises too high, making it difficult to synthesize diamond.
图3是按照本发明直流放电热等离子流(Ⅵ)法合成金刚石的举例说明。Fig. 3 is an illustration for synthesizing diamond according to the DC discharge thermal plasma flow (VI) method of the present invention.
在输送含氢气体17和气态碳化物18的同时,在阳极15和阴极16之间施加直流电压进行电弧19放电,此时,气体在狭窄的电极之间突然被加热,在喷嘴20的周围变成温度为5000℃或更高的热等离子体。在这种情况下,由于温度骤然上升,使体积膨胀,从而使热等离子体成为一种超声的等离子流21并通过喷嘴20射入室22。While transporting the hydrogen-containing
图29表明了按照本发明的DC等离子流和传统微波等离子体的发射光谱。两条谱线取准于H2峰。在微波等离子体中,测定出氢分子线宽和强发射峰(<480nm,560~620nm)。但在DC等离子流中,由于氢分子,发射很弱。这些结果意味着,与传统的微波等离子体相比,对于DC等离子流来说氢的离解度很高。Figure 29 shows the emission spectra of a DC plasma stream according to the present invention and a conventional microwave plasma. The two spectral lines are based on the H2 peak. In microwave plasma, the hydrogen molecular line width and strong emission peak (<480nm, 560~620nm) were measured. But in a DC plasma flow, the emission is weak due to hydrogen molecules. These results imply that the degree of hydrogen dissociation is high for DC plasma flows compared to conventional microwave plasmas.
通过使等离子流21碰撞基片24骤冷等离子流(其中进行高效冷却),活性物种,例如短寿命的氢在消失前在基片上反应,从而合成出金刚石膜25。The
此外,在基片上的反应中,所施加的动能是通过电弧放电产生的强紫外线光激发和超声粒子碰撞得到的。In addition, in the reaction on the substrate, the applied kinetic energy is obtained by intense ultraviolet photoexcitation and ultrasonic particle collisions generated by the arc discharge.
因此,与先有技术的方法相比,在本发明中化学反应可以高得多的效率进行,因此可在高的淀积速度下合成金刚石。Therefore, in the present invention, chemical reactions can be performed with much higher efficiency than in the prior art methods, so that diamond can be synthesized at high deposition rates.
在本发明中,任何碳的化合物都可用作原料气,但最好使用一种烃,或一种分子中含氧、氮或卤素的烃或卤代烃。In the present invention, any carbon compound can be used as the raw material gas, but it is preferable to use a hydrocarbon, or a hydrocarbon or halogenated hydrocarbon containing oxygen, nitrogen or halogen in its molecule.
除了氢原料气和碳化合物的原料气以外,混合一种惰性气体(如氩、氮等)可改善电弧放电的稳定性。在这种情况下,虽然可能会降低膜的淀积速率,但从中可获得好处,即可提高膜表面的均匀性。In addition to hydrogen feed gas and carbon compound feed gas, mixing an inert gas (such as argon, nitrogen, etc.) can improve the stability of arc discharge. In this case, although the deposition rate of the film may be lowered, there is a benefit of improving the uniformity of the film surface.
还有,通过混合少量的一种氧化性气体,例如氧、水、过氧化氢、一氧化碳等,可加强蚀刻非金刚石的碳的效果。Also, the effect of etching non-diamond carbon can be enhanced by mixing a small amount of an oxidizing gas such as oxygen, water, hydrogen peroxide, carbon monoxide, and the like.
原料气18可与电极间的氢放电气17一起加入,但如图4所示,也可以加入到从电极间射出的
等离子流21中。然而,在这种情况下,必须将原料气均匀地加入到热等离子流中。The
由于氢用作放电气,而它如图5所示,具有高的电离势难于放电,所以电极材料最好应具有高的耐热性。其中有一种稀土元素氧化物(如氧化镧,氧化钇,氧化铈等)加入的钨是一种优良的电极材料。另外,为了防止电极中挟带杂质,最好用高纯度的碳电极。Since hydrogen is used as the discharge gas, which, as shown in Fig. 5, has a high ionization potential and is difficult to discharge, the electrode material should preferably have high heat resistance. Among them, tungsten added with a rare earth element oxide (such as lanthanum oxide, yttrium oxide, cerium oxide, etc.) is an excellent electrode material. In addition, in order to prevent impurities from being entrained in the electrodes, it is best to use high-purity carbon electrodes.
按照本发明的第三个实施方案,由于形成的热等离子体被加热到约5000℃,它骤然膨胀并通过喷嘴射出。由于喷嘴孔径窄小,仅为1~2mm,因此从一喷嘴射出碰撞到冷却基片的面积约为25mm2。在本发明中,等离子流通过多个喷嘴射出,因此,膜淀积面积可以扩大。According to the third embodiment of the present invention, since the formed thermal plasma is heated to about 5000°C, it expands suddenly and is ejected through the nozzle. Since the nozzle hole diameter is narrow, only 1-2mm, the area where the spray from a nozzle collides with the cooling substrate is about 25mm 2 . In the present invention, plasma streams are emitted through a plurality of nozzles, and therefore, the film deposition area can be enlarged.
还有,淀积过程中膜的均匀性可通过下述方法得到提高:将一种惰性气体(例如氢气或氦气)混入氢放电气或碳化合物的原料气、或二者之中,或者可将一种氧化性气体(如氧气,过氧化氢或水)混入,以除去混在蚀刻形成的膜中的非金刚石的碳。Also, the uniformity of the film during deposition can be improved by mixing an inert gas such as hydrogen or helium into the hydrogen discharge gas or the carbon compound feed gas, or both, or by An oxidizing gas such as oxygen, hydrogen peroxide or water is mixed in to remove non-diamond carbon mixed in the etched film.
如图6所示等离子发生装置包括一个封闭体,其内部形成了阳极26和通过绝缘元件支撑的阴极27,等等。放电气输气管28与封闭体相通,原料气或输送固体颗粒的气体的输气管29相通于电极26上设置的多个喷嘴31的内部。通过导线30向电极施加直流电压,以在电极之间产生连续的放电电弧,从而使放电气和原料气活化,形成高温的等离子流33。As shown in FIG. 6, the plasma generating device includes a closed body in which an
如图9所示,对于按照本发明化学汽相淀积金刚石,热等离子体发生装置设置在减压室37中,室37配有水冷基片座36,用来支撑与喷嘴31相对的基片35。如图7所示,四个喷嘴31的孔径各为2mm,喷嘴中心距最小为5mm,基片35(20mm2)置于喷嘴31以下10mm。室内压力减至100乇,氢气以1000SCCm的流速由放电气输气管28加入,甲烷以100SCCm的流速从原料气输气管29引入喷嘴31。在电极之间施加2KW的直流电,电弧放电产生的等离子流33通过连续碰撞基片1小时而被骤冷,从而形成了膜厚约为80μm、面积约为4cm2的金刚石膜。该膜的面积是只用一个喷嘴时获得的面积的16倍,如图8所示,原料气输管29也可以在喷嘴31的外部开启,以使气体吹入等离子流。As shown in Figure 9, for chemical vapor deposition of diamond according to the present invention, the thermal plasma generating device is arranged in the
按照本发明,在直流电等离子流化学淀积金刚石的方法中,高速度成膜是可能的,并且成膜面积可大幅度地提高,因而实现了成本和生产的改善。According to the present invention, in the method of direct current plasma flow chemical deposition of diamond, high-speed film formation is possible, and the film formation area can be greatly increased, thereby achieving improvement in cost and production.
在上面的实例中,采用等离子流进行金刚石的化学汽相淀积,但也可以将含有一种无机物或金属物质的粉末与一种气体(如氢气)一起通过原料气、或载有液体或细固颗粒的气体的输气管输送到喷嘴31的内部,并用等离子流熔融无机物或金属物质,从而在基片上形成一层等离子体喷涂层。In the above example, the chemical vapor deposition of diamond was carried out using a plasma flow, but it is also possible to pass a powder containing an inorganic or metallic substance together with a gas (such as hydrogen) through a raw material gas, or a liquid or The gas delivery pipe of the fine solid particles is delivered to the inside of the
如图8所示,通过原料气或输送液体或细固颗粒的气体的输气管29(在喷嘴31的外部开启)无机物或金属物质的细粉颗粒可由氢气等输送并吹入等离子流中。就金属物质可言,可使用高熔点金属、超合金、金属陶瓷等。就无机物而言,可使用Y-Ba-Cu-O体系、Bi-Sr-Ca-O体系的超导材料、陶瓷、石墨、玻璃等。关于无机物,一种粉末诸如Y-Ba-Cu-O体系超导陶瓷粉末,通过气体输气管输入,以形成一层厚度约为100μm、面积为4cm2的等离子体喷涂。经实测,这种等离子喷涂层在液氮温度时显示出超导性,在88.5K绝对温度下电阻值为零。As shown in FIG. 8 , the fine powder particles of inorganic or metal substances can be transported by hydrogen gas or the like and blown into the plasma flow through the raw material gas or the gas delivery pipe 29 (opened outside the nozzle 31 ) for transporting liquid or fine solid particles. As the metal substance, refractory metals, superalloys, cermets, and the like can be used. As inorganic substances, Y-Ba-Cu-O system, Bi-Sr-Ca-O system superconducting material, ceramics, graphite, glass, etc. can be used. Regarding the inorganic matter, a powder such as Y-Ba-Cu-O system superconducting ceramic powder is fed through a gas delivery pipe to form a plasma spray with a thickness of about 100 μm and an area of 4 cm 2 . According to the actual measurement, this plasma sprayed coating shows superconductivity at the temperature of liquid nitrogen, and the resistance value is zero at the absolute temperature of 88.5K.
按照本发明的第四个实施方案,取代通过碰撞被冷却的基片而使热等离子体骤冷的方法,而采用向等离子流中吹气(气冷法)的方法。According to the fourth embodiment of the present invention, instead of the method of quenching the thermal plasma by colliding with the substrate to be cooled, a method of blowing gas into the plasma stream (air cooling method) is employed.
按照本发明,这种方法可产生一种与基片无关的非平衡等离子体,因为通过约在室温下迫使等离子流与气体混合致使热等离子体瞬间被冷却。因此,在能够形成金刚石的温度下,通过将待处理的材料保持在非平衡等离子体中,在基片上可高速度地合成金刚石。推荐基片的温度为800℃~1300℃。According to the present invention, this method produces a non-equilibrium plasma independent of the substrate because the hot plasma is instantaneously cooled by forcing the plasma stream to mix with the gas at about room temperature. Thus, diamond can be synthesized at a high rate on a substrate by maintaining the material to be processed in a non-equilibrium plasma at a temperature capable of forming diamond. The recommended substrate temperature is 800°C to 1300°C.
图10(a)表明了按照本发明气冷的DC等离子流CVD法合成金刚石的原理,其中38是阴极,39是阳极,40是放电气,41是喷嘴,42是等离子流,43是冷却气喷口,44是冷却气,45是基片,46是金刚石膜,47是电弧电源,48是电弧,49是非平衡等离子体。就等离子体吹管50可言,可采用图10(b)所示的单一电极的吹管,或图10(c)所示的多电极吹管。Figure 10 (a) shows the principle of diamond synthesis according to the air-cooled DC plasma flow CVD method of the present invention, wherein 38 is the cathode, 39 is the anode, 40 is the discharge gas, 41 is the nozzle, 42 is the plasma flow, and 43 is the cooling gas Nozzle, 44 is a cooling gas, 45 is a substrate, 46 is a diamond film, 47 is an arc power supply, 48 is an electric arc, and 49 is an unbalanced plasma. As far as the
当通入含有氢气和气态碳化合物的放电气40时,在阴极38和阳极39之间施加直流电压以激
发电弧48放电,从而使放电气骤然升温,成为一种在喷嘴41周围温度为5000℃或更高的热等离子体。在这一操作过程中,由于温度骤然升高致使体积膨胀,从而使热等离子体变成一种超声等离子流42并通过喷嘴41喷出。When passing through the
氢气作为冷却气44吹向等离子流42,强迫进行混合,借此使热等离子体骤冷,产生非平衡等离子体49。通过把基片45置于非平衡等离子49中,活性物种(如短寿命的氢原子)在消失前与基片反应,在其表面上生长出金刚石膜46。Hydrogen gas is blown into the
图11(a)、(b)和图12(a)(b)示出了当有或无冷却气通过时等离子流的状况。就图12(a)和(b)来说,当用气冷却时,显然等离子流的长度要极短以使热等离子体骤冷。Fig. 11(a), (b) and Fig. 12(a)(b) show the state of plasma flow with or without cooling gas passing through. With regard to Fig. 12(a) and (b), it is clear that the length of the plasma stream must be extremely short to quench the hot plasma when gas cooling is used.
因此本发明与不通过冷却气流的直流等离子流CVD法相比,由于热等离子流能被骤冷,与基片无关,因此对使用的基片类型没有限制,并使金刚石可在任何基片上以高速生长。Therefore, compared with the direct current plasma flow CVD method that does not pass through the cooling air flow, the present invention has nothing to do with the substrate because the hot plasma flow can be quenched, so there is no limit to the type of substrate used, and the diamond can be placed on any substrate at a high speed. grow.
在本发明中,任何烃都可用作原料气,但最好使用分子中含氧、氮和卤素的烃或卤代烃。In the present invention, any hydrocarbon can be used as the raw material gas, but it is preferable to use a hydrocarbon or a halogenated hydrocarbon containing oxygen, nitrogen and halogen in the molecule.
除了氢之外,通过使一种惰性气体(如氢气、氦气)与一种碳化合物的原料放电气混合,电弧放电的稳定性可得到改善。在这种情况下,尽管薄膜淀积速率可能降低,但得到了好处,即提高了膜面的均匀性。The stability of the arc discharge can be improved by mixing an inert gas (such as hydrogen, helium) with a carbon compound starting discharge gas in addition to hydrogen. In this case, although the film deposition rate may be reduced, the benefit is obtained that the uniformity of the film surface is improved.
还有,通过混合少量氧化性气体,如水、过氧化氢和一氧化碳,也会提高用蚀刻去除非金刚石碳的效果。Also, by mixing small amounts of oxidizing gases such as water, hydrogen peroxide and carbon monoxide, the effect of removing non-diamond carbon by etching is also enhanced.
由于使用了具有高电离势的氢气作为放电气,电极材料最好具有高的耐热性。其中具有一稀土元素氧化物(如氧化镧,氧化镱,氧化硒等)加入的钨是一种极好的电极材料。此外,为防止电极挟带杂质,最好使用高纯度碳电极。Since hydrogen gas having a high ionization potential is used as the discharge gas, the electrode material preferably has high heat resistance. Tungsten which has a rare earth element oxide (such as lanthanum oxide, ytterbium oxide, selenium oxide, etc.) added is an excellent electrode material. In addition, in order to prevent impurities from being entrained in the electrodes, it is best to use high-purity carbon electrodes.
如前所述,先有技术合成金刚石膜的方法并没有满足工业化的要求,按照本发明第五个实施方案,创立了一种利用等离子火焰喷射的原理合成金刚石膜的新方法,从而使基片上工业化合成金刚石膜成为可能。As previously mentioned, prior art methods for synthesizing diamond films do not meet the requirements of industrialization. According to the fifth embodiment of the present invention, a new method for synthesizing diamond films using the principle of plasma flame spraying has been created, so that on the substrate It is possible to synthesize diamond film industrially.
然而,在这种方法中,举例来说,氢和气态碳的化合物如甲烷的气体混合物用作气体,并采用热等离子流CVD装置汽相淀积以形成一层金刚石膜,但问题产生了,这是由于,例如:However, in this method, for example, a gas mixture of hydrogen and a compound of gaseous carbon such as methane is used as a gas, and vapor deposition is performed using a thermal plasma flow CVD apparatus to form a diamond film, but a problem arises, This is due to, for example:
(1)氢气放电电压极高。(1) The hydrogen discharge voltage is extremely high.
(2)由于甲烷裂解产生热和体积膨胀。(2) Heat and volume expansion due to methane cracking.
(3)由附在焰喷装置上的甲烷裂解引起碳与电极反应等。(3) The carbon and electrode reaction caused by the cracking of methane attached to the flame spraying device.
由此基片温度和等离子体流量改变,不能合成均匀金刚石膜。As a result, the substrate temperature and the plasma flow rate are changed, and a uniform diamond film cannot be synthesized.
图13说明上述热等离子体CVD法的原理,此方法通过直流电源56施加一电压激发电弧放电,同时在阳极53和阴极54之间通入放电气(H2+CH4)55,产生5000℃或更高温度的电弧等离子体。Figure 13 illustrates the principle of the above-mentioned thermal plasma CVD method. In this method, a voltage is applied through a
通入等离子体吹管中的电弧等离子体形成部分的原料气55被急剧加热到高温而被活化,并产生高密度自由基,从而体积膨胀并作为等离子流58以超音速度从喷嘴喷出。The raw material gas 55 of the arc plasma forming part passed into the plasma torch is rapidly heated to a high temperature to be activated and generate high-density free radicals, thereby expanding in volume and ejected from the nozzle as a
根据该方法,使等离子流58碰撞待处理的基片,在短寿命的自由基消失前,实现基片上高效率CVD反应,由此形成金刚石膜60。用于上述目的的基片59置于一水冷基片座61上,被加入到水冷基片座61中的冷却水62冷却到温度为例如400~1500℃,最好是800~1300℃。According to this method, the
然而,如上所述,尽管金刚石膜能有效地汽相沉积到基片上,但由于上述的原因还是不能获得稳定的等离子流,由此引起不能合成均匀金刚石膜的问题。相反,根据本发明,如图14所示,制备两个等离子吹管64和65,H2气(或按传统法制备的氢气与惰性气的混合气)引入一个吹管,而甲烷(CH4)气(或甲烷和惰性气体如Ar的混合气)引入另一个吹管。由直流电源70和71分别在阳极66,67和阴极68,69之间施以电压激发电弧放电,由此喷射出等离子流72和73。在置于水冷却基片座上的基片75上,这些等离子流淀积成均匀的金刚石膜76。However, as described above, although a diamond film can be effectively vapor-deposited on a substrate, a stable plasma flow cannot be obtained for the above-mentioned reasons, thereby causing a problem that a uniform diamond film cannot be synthesized. In contrast, according to the present invention, as shown in Fig. 14, two
考虑到通过允许大量等离子体相互碰撞,使含碳化合物在等离子流中制成等离子体及骤冷化合物,形成了大量微细的金刚石核。因此,根据本发明的第六实施例可制备出均匀性优良的平滑的金刚石膜,这与仅用一个等离子体吹管制备,只生长少量金刚石核且得到的金刚石膜表面不平滑是不同的。Considering that by allowing a large number of plasmas to collide with each other, the carbon-containing compound is made into a plasma and quenches the compound in the plasma flow, forming a large number of fine diamond nuclei. Therefore, according to the sixth embodiment of the present invention, a smooth diamond film with excellent uniformity can be prepared, which is different from the case where only a small number of diamond nuclei are grown and the surface of the resulting diamond film is not smooth.
图15说明了另外一种产生等离子流吹管安装在热等离子体VCD装置原理。其中78是阳极, 79是阴极,80是放电气或含原料气的放电气,81是冷却气或含原料气的冷却气,82是电弧,83是喷嘴,84是等离子流,85是真空室,86是基片座,87是基片,88是金刚石膜。Figure 15 illustrates another principle of generating a plasma flow torch installed in a thermal plasma VCD device. 78 of which are anodes, 79 is cathode, 80 is discharge gas or discharge gas containing raw material gas, 81 is cooling gas or cooling gas containing raw material gas, 82 is electric arc, 83 is nozzle, 84 is plasma flow, 85 is vacuum chamber, 86 is substrate seat, 87 is a substrate, and 88 is a diamond film.
图16是实施本发明的装置总体图,图中89是第一个等离子吹管,90是第二个等离子吹管,91和92是供给各吹管的电弧电源,93,94是各吹管的冷却水装置,95是基片控制器,96是吹管控制器,97是抽真空系统,98是弹状气瓶,99是流量计,100是放电气或含原料气的放电气输气管,101是原料气和(或)冷却气输气管,102是冷却气喷管。Fig. 16 is the overall view of the device implementing the present invention, among which 89 is the first plasma torch, 90 is the second plasma torch, 91 and 92 are arc power supplies for each torch, and 93 and 94 are cooling water devices for each torch , 95 is a substrate controller, 96 is a blowpipe controller, 97 is a vacuum system, 98 is a bullet-shaped gas cylinder, 99 is a flow meter, 100 is a discharge gas or a discharge gas pipeline containing raw material gas, 101 is a raw material gas And (or) cooling air delivery pipe, 102 is the cooling air nozzle.
5cm2的硅基片87被放在吹管87下面100mm处,用旋转泵抽真空到1×10乇后,在3KW放电功率和100乇的系统压力下,将放电气体H2以50SCCm、原料气CH4以500SCCm加入到吹管89中。与此同时,在放电功率为1KW的条件下,20SLM的放电气和100SCCm的原料气输入吹管90。并在距基片35cm及与基片成60角的吹管处成膜。历时1小时。用X射线衍射并用喇曼光谱分析发现,制成了显示出金刚石波峰的膜。图17示出了按照本发明用两个等离子体吹管制备的金刚石膜,该膜厚度为35μm,其中成膜速度为每小时100μm/hr。图18示出了按对比方法只用一个等离子体吹管制成的金刚石膜。按照本发明,具有光滑和均匀表面的金刚石膜能以高速制成。A
在上述例子中,氢气从放电气管100、甲烷气从原料气输气管101分别输入到等离子体吹管89和90中,但也可在放电气输气管100中既输入氢气又输入甲烷气,或在原料气输气管中和(或)冷却气输气管101中既输入冷却气H2又输入甲烷气。也可进行各种变形,例如,将放电气和原料气只输入到其中一个吹管中。并且只把放电气输入到另外一个吹管中等等。其本质就是发射出大量的等离子流,和在等离子流中将碳源制成等离子体以在基片上形成金刚石。还有,对于淀积速度来说,多个等离子流的角度最好应垂直于基片;但也可以按要求预先确定一个最佳角度。In the above-mentioned example, hydrogen is input into the plasma torches 89 and 90 respectively from the
作为上述多个等离子流,已经提到用直流电弧放电产生直流等离子体,但是也可以使用各种各样的多个等离子体,例如高频放电的RF等离子流,用激光光电弧放电产生的光电弧等离子流,用微波放电法进行微波等离子流交流放电产生的等离子流等。至于产生等离子体的气氛,最好在减压气氛下,但是在大气压或增压的情况下也能用于形成金刚石。此外这种方法也可用合成金刚石粉。As the above-mentioned plurality of plasma streams, DC plasma generation by DC arc discharge has been mentioned, but various multiple plasmas such as RF plasma streams of high-frequency discharge, light generated by laser photoelectric arc discharge, etc. can also be used. Arc plasma flow, plasma flow generated by microwave plasma flow AC discharge by microwave discharge method, etc. As for the atmosphere for generating plasma, it is preferably under reduced pressure, but atmospheric pressure or elevated pressure can also be used for diamond formation. In addition, this method can also be used to synthesize diamond powder.
按照本发明第六个实施方案,用直流等离子流CVD法,能以高速制备出金刚石膜且其表面光滑均匀,因此涂层的应用范围可扩大到很宽的范围,而且半导体装置用的散热片或金刚石电路基片能很容易的完成。According to the sixth embodiment of the present invention, the diamond film can be prepared at a high speed and its surface is smooth and even with the direct current plasma flow CVD method, so the application range of the coating can be expanded to a very wide range, and the heat sink used for semiconductor devices Or diamond circuit substrates can be easily completed.
本发明第七个实施方案的金刚石膜外延生长法,包括通过骤冷热等离子体使含碳源的原料喷入到等离体中和生长金刚石。The diamond film epitaxial growth method of the seventh embodiment of the present invention includes injecting a raw material containing a carbon source into the plasma by quenching hot plasma and growing diamond.
在金刚石生长法中,氢通常用作放电气,而且任何碳的化合物都可用作碳源的原料气,但最好用碳氢化合物或分子中含有O、N、卤素等元素的一种烃或有机物。一种象Ar、He等惰性气体也可以混在放电气或原料气中。在这种情况下,等离子体的稳定性可进一步得到改善,但膜淀积率降低了。还有,为了增强非金刚石碳(如非晶碳)的蚀刻效果,少量的一种氧化气体如O2、H2O、CO等也可混于原料气中。In the diamond growth method, hydrogen is usually used as the discharge gas, and any carbon compound can be used as the raw material gas of the carbon source, but it is best to use a hydrocarbon or a hydrocarbon containing elements such as O, N, and halogen in the molecule. or organic matter. An inert gas such as Ar, He, etc. can also be mixed in the discharge gas or the raw material gas. In this case, the stability of the plasma can be further improved, but the film deposition rate is lowered. Also, in order to enhance the etching effect of non-diamond carbon (such as amorphous carbon), a small amount of an oxidizing gas such as O 2 , H 2 O, CO, etc. may also be mixed in the raw material gas.
此外,通过把微量气体象B2H2,NH3,PH3等混于原料气中或把这些微量气体单独输入等离子流中也能得到半导体金刚石。In addition, semiconductor diamond can also be obtained by mixing trace gases such as B 2 H 2 , NH 3 , PH 3 etc. into the raw material gas or feeding these trace gases into the plasma flow alone.
不经过电弧放电部分把原料气输入到等离子流的引发端中心。为此最好使用下述本发明等离子流喷射装置。当本发明的等离子流喷射装置用于高温超导氧化物(Ba-Y-Ca-O系统,Bi-Sr-Ca-Cu-O系统等)的等离子火焰喷涂时,超导氧化物的细粉末与一种载气一起输入到如图19所示的109中,在等离子流中熔化并在基体上形成一层有效膜。当然在这种情况下也可以使用等离子体气氛、氧化气氛、氧气氛、空气气氛等。The raw material gas is input to the center of the initiation end of the plasma flow without passing through the arc discharge part. For this purpose, it is preferable to use the plasma jet spraying device of the present invention described below. When the plasma jet device of the present invention is used for plasma flame spraying of high-temperature superconducting oxides (Ba-Y-Ca-O system, Bi-Sr-Ca-Cu-O system, etc.), the fine powder of superconducting oxides Together with a carrier gas, it is fed into 109 as shown in Fig. 19, melted in the plasma flow and forms an effective film on the substrate. Of course, a plasma atmosphere, an oxidation atmosphere, an oxygen atmosphere, an air atmosphere, etc. may also be used in this case.
本发明的等离子流喷射装置如图19所示有一个原料气(或含原料粉的气体)的输气孔109,它沿着内电极103的中心轴线伸展并有一个位于外电极104的喷嘴106中心的喷嘴108。电弧113在外电极104和电极103之间放电,但是原料气(或原料粉气体)109将不与电弧113接触。这样,妨碍不了形成均匀的电弧113。此外,由于原料气109(或含原料粉的气体)释放到等离子流107引发端中心部位,使得在等离子流107中形成
的等离子体分布均匀,对于汽相淀积或热等离子体,利用这种等离子流有利于淀积产品的形成和生长,由此能生成一个均匀光滑的膜。As shown in Figure 19, the plasma jet device of the present invention has a
注意,通过使用生成金刚石的这种装置和除金刚石之外的一种原料作为基片,能够在其表面合成多晶金刚石。Note that by using such an apparatus for generating diamond and a raw material other than diamond as a substrate, polycrystalline diamond can be synthesized on its surface.
图19说明了利用本发明装置生成金刚石膜的原理。Fig. 19 illustrates the principle of forming a diamond film using the device of the present invention.
这种装置适用于把原料气通过装在阴板中心的喷嘴输入到等离子流中以便把原料气均匀地输入到等离子流中,由此可提高膜厚度的均匀性,或在当原料气是碳的化合物的情况下能抑止石墨的产生。图中。103是阴极,104是阳极,105是放电气,106是喷嘴,107是等离子流,108是原料气喷出口,109是原料气,110是基片,111是金刚石膜,112是电弧电源,113是电弧。This device is suitable for feeding the raw material gas into the plasma flow through the nozzle installed in the center of the negative plate so that the raw material gas can be uniformly input into the plasma flow, thereby improving the uniformity of the film thickness, or when the raw material gas is carbon In the case of the compound, the generation of graphite can be suppressed. in the figure. 103 is the cathode, 104 is the anode, 105 is the discharge gas, 106 is the nozzle, 107 is the plasma flow, 108 is the raw material gas outlet, 109 is the raw material gas, 110 is the substrate, 111 is the diamond film, 112 is the arc power supply, 113 is the arc.
当氢气作为放电气从20升/分钟的流速和甲烷气作为原料气以0.2升/分钟流速流动时,在阴阳极之间施加直流电压90V、电流10A,用于激光电弧113放电,从而在喷嘴106周围的放电气被加热成为5000℃或高于5000℃的热等离子流。在这种情况下,由于温度急剧升高引起体积膨胀,热等离子流变成超声等离子流107,该超声等离子流是通过喷嘴106喷出的。原料气不经过放电部分而直接输入到等离子流中,从而被分解和活化。等离子流通过与5×5×0.5mm的钼基片碰撞后骤冷,结果生成金刚石膜,因此在1小时内就得到厚度为200μm多晶金刚石膜。测量表面粗度时发现Rmax为10μm,与按照原料气与放电气同时输入的方法制备的(Rmax为50μm)相比较得到了大大的改善。When hydrogen as the discharge gas flows from a flow rate of 20 liters per minute and methane gas flows as a raw material gas at a flow rate of 0.2 liters per minute, a DC voltage of 90V and a current of 10A are applied between the cathode and anode for
在这种装置中,由于电弧中不含原料气,因此得到稳定的放电。还有,由于把所有原料气输入等离子流中,可抑制石墨的产生。In this device, since the arc does not contain raw material gas, a stable discharge is obtained. Also, since all the raw material gas is fed into the plasma flow, the generation of graphite can be suppressed.
就金刚石生长来说,由于使用氢气是有利的,仅是因高电离势可能造成放电困难,所以最好使用具有高耐热性,能稳定放电的电极材料。其中具有氧化镧、氧化钇、氧化铈等加入的钨是优良的电极材料。还有为了避免电极有杂质挟带,最好使用高纯度的碳电极。As far as diamond growth is concerned, since the use of hydrogen is advantageous, only because the high ionization potential may cause discharge difficulties, it is best to use electrode materials with high heat resistance and stable discharge. Among them, tungsten added with lanthanum oxide, yttrium oxide, cerium oxide, etc. is an excellent electrode material. Also, in order to avoid impurity entrainment in the electrode, it is best to use a high-purity carbon electrode.
本发明的等离子流喷射装置宜用于如前所述的金刚石合成,但是,当然也可用于其它目的。The plasma jet apparatus of the present invention is advantageously used for diamond synthesis as previously described, but can of course be used for other purposes as well.
实施例Example
本发明现由下面的实施例做进一步的说明,但并不受这些实施例的限制,其中所有份数和百分比都以重量计,除非特别注出。The present invention is now further illustrated by, but not limited to, the following examples in which all parts and percentages are by weight unless otherwise noted.
实施例1Example 1
图2是用于实施本发明的热等离子体装置的示意图,图1中示出的等离子流发生部分表示为等离子体吹管8。FIG. 2 is a schematic diagram of a thermal plasma device for implementing the present invention, and the plasma flow generation part shown in FIG. 1 is represented as a
在装置里放置了一个正对等离子体吹管8的基片座9,基片座是水冷的,待处理的基片7放在其上。A
还有,此装置连接一抽真空系统10。Also, this device is connected to a
其次,等离子体吹管8连接放电气输气管11,用于放电电极1和2之间通入放电气,及原料气输气管12,用于向电弧等离子体输送原料气。还提供电弧电源13以给放电电极提供电源,和偏压电源14以使自由基集中到待处理的基片7上。Secondly, the
接着,作为实施例,处理一块30mm2的硅基片,基片与等离子体吹管8间距保持300mm。Next, as an example, a 30 mm 2 silicon substrate is processed, and the distance between the substrate and the
首先,用抽真空系统10将装置内部抽真空到1×10-3乇后,通过放电气输气管11以1000SCCM流速通入氢气(H2),通过原料输气管12以100SCCM流速加入甲烷气(CH4),用抽真空系统10使室内的真空度保持在100乇,其后,电弧电源供电2KW,偏压供电300V。First, use the
然后,在进行热等离子体CVD后,1小时内形成的金刚石膜厚度约为10μm,用X射线衍射和喇曼光谱测定分析表明仅有金刚石波峰。Then, after thermal plasma CVD, the thickness of the diamond film formed within 1 hour was about 10 μm, and analysis by X-ray diffraction and Raman spectroscopy showed only diamond peaks.
与先有技术CVD相比(其淀积率为1μm或更低)淀积速度要高出一个数量级或更高。The deposition rate is an order of magnitude higher or higher compared to prior art CVD, which has a deposition rate of 1 µm or less.
根据本发明,由于可产生极高密度的自由基,与先有技术比较,形成金刚石膜的速度要高一个数量级,从而可满足对大规模集成电路基片的要求。According to the present invention, since extremely high-density free radicals can be generated, compared with the prior art, the speed of forming the diamond film is an order of magnitude higher, thereby meeting the requirements for large-scale integrated circuit substrates.
实施例2Example 2
图3中阳极15和阴极16都由其中加入了2%(重量)氧化钇的钨制成,等离子体吹管为水冷却结果,吹管被固定在室22内的控制器(未标出)之上,并带有可变方向的喷嘴20。The
水冷基片座23可垂直或水平移动,喷嘴与基片的距离也可变化。The water-cooled
5mm2,0.2mm厚的硅片固定在基片座23
上,室22抽真空2×10-3乇后,如图3所示,氢气在1kg/cm2的压力下以20升/分的流速,以及作为原料气18的甲烷气在1kg/cm2的压力下以40cc/分的流率在电极之间流过,同时室22内压力保持在100乇。从一恒流电弧电源,10A的恒流经电极之间,并保持约5分钟直至电压恒定。这时电压为72V。5mm 2 , 0.2mm thick silicon wafer is fixed on the
水冷基片座23缓缓地靠近喷嘴20,喷嘴与基片间的距离固定在5mm,在这种状态下合成金刚石,历时一小时。通过扫描电子显微镜照片(SEM),X-射线衍射,喇曼光谱和硬度测量来评价合成的金刚石。The water-cooled
如图20所示,金刚石膜的表面由规则排列聚集在一起的金刚石晶体结构成。图21的SEM示出了金刚石膜截面图的中部,硅基片截面图的下部以及金刚石膜表面的上部。因此可看出均匀地形成了略有不平的金刚石表面。图22示出了金刚石膜的X-射线衍射图形,金刚石晶面(111)、(220)、(331)显得极清晰,(331)和(440)仍可辩出。图23代表了金刚石膜喇曼光谱,图中仍在波数1333cm可辩出金刚石的固有峰,还可容易看出无其它碳质物质如石墨出现。As shown in FIG. 20, the surface of the diamond film is composed of diamond crystals that are regularly arranged and gathered together. The SEM of Fig. 21 shows the middle part of the cross-sectional view of the diamond film, the lower part of the cross-sectional view of the silicon substrate and the upper part of the surface of the diamond film. Therefore, it can be seen that a slightly uneven diamond surface is uniformly formed. Figure 22 shows the X-ray diffraction pattern of the diamond film, the diamond crystal planes (111), (220), (331) are very clear, and (331) and (440) can still be distinguished. Figure 23 represents the Raman spectrum of the diamond film. In the figure, the intrinsic peak of diamond can still be distinguished at a wave number of 1333 cm, and it is also easy to see that no other carbonaceous substances such as graphite appear.
关于HV500维氏硬度,由于样品硬度高,很难判别压痕,但经实测,压力达8000kg/cm2或更高。由上面数据可知,合成的金刚石为优质多晶膜。而且测得膜厚为80μm,合成的高质量金刚石的速率高于先有技术80μm/h的10倍或更高。Regarding HV500 Vickers hardness, due to the high hardness of the sample, it is difficult to distinguish the indentation, but the actual measurement shows that the pressure reaches 8000kg/cm 2 or higher. It can be seen from the above data that the synthesized diamond is a high-quality polycrystalline film. Moreover, the measured film thickness is 80 μm, and the rate of synthesizing high-quality diamond is 10 times or higher than that of the
此外,在该条件下,当合成10小时,基片中央部位的膜厚变成1mm,其周边部分为0.6mm。同样,即使用X-射线衍射,喇曼光谱分析,还是只获得金刚石波峰,未测出存在石墨。In addition, under this condition, when the synthesis took 10 hours, the film thickness at the central part of the substrate became 1 mm, and the film thickness at the peripheral part thereof became 0.6 mm. Likewise, even with X-ray diffraction and Raman spectroscopy, only diamond peaks were obtained, and the presence of graphite was not detected.
实施例3(图4)Example 3 (Figure 4)
用一块10×10×0.2mm的钼板作为基片,如图4所示,作为放电气17的氢气以20升/分、氢气以20升/分通入,作为原料气18的含2%丙酮的氢气以2升/分加入到等离子流中,在电弧电流20A、电压60V、喷嘴一基片间距10mm的情况下,合成金刚石一小时。膜厚60μm,并且膜质量与实施例2相似。Use a molybdenum plate of 10 × 10 × 0.2mm as the substrate, as shown in Figure 4, as the hydrogen of the
实施例4-9(图3和图4)Embodiment 4-9 (Fig. 3 and Fig. 4)
此外,当反应条件改变时,例如改变电极间的加料气或将气体输入到电极之间形成的热等离子流中,金刚石成膜速度归纳在下表中。获得的金刚石膜的质量与实施例2近似。(表见文后)In addition, when the reaction conditions are changed, such as changing the feed gas between the electrodes or inputting the gas into the thermal plasma flow formed between the electrodes, the diamond film formation speed is summarized in the table below. The quality of the obtained diamond film is similar to Example 2. (See the text after the table)
按照本发明的等离子流CVD法,高质量的金刚石能以80μm/h的速度淀积,这一速度远高于先有技术的速度,由此,通过汽相合成法使廉价金刚石的实际应用取得了很大进展。当根据本方法合成的金刚石用于半导体的散热器或电路基片时,可使成本大幅度下降及性能改善。According to the plasma flow CVD method of the present invention, high-quality diamond can be deposited at a speed of 80 μm/h, which is much higher than the speed of the prior art, thereby enabling the practical application of cheap diamond by vapor phase synthesis. made great progress. When the diamond synthesized according to the method is used in semiconductor radiators or circuit substrates, the cost can be greatly reduced and the performance can be improved.
实施例10(图24)Example 10 (Figure 24)
图24说明了根据本发明实施的气冷DC等离子流CVD法的金刚石合成装置,其中115是等离子体吹管,116是放电气输气管,117是冷却气输气管,114是电弧电源,118是吹管冷却水管线,119是基片座,120是基片,121是真空室,122是抽真空系统,123是吹管控制器,124是流量计,125是贮气钢瓶,126是冷却气喷射口,以及127是基片控制器。Fig. 24 illustrates the diamond synthesis device of the air-cooled DC plasma flow CVD method implemented according to the present invention, wherein 115 is a plasma torch, 116 is a discharge gas delivery pipe, 117 is a cooling gas delivery pipe, 114 is an arc power supply, and 118 is a blowpipe Cooling water pipeline, 119 is the substrate seat, 120 is the substrate, 121 is the vacuum chamber, 122 is the vacuum system, 123 is the blowpipe controller, 124 is the flow meter, 125 is the gas cylinder, 126 is the cooling gas injection port, And 127 is a substrate controller.
等离子体吹管有水冷结构,是由其中加入2%(重量)氧化钇的钨与阴极和阳极38一起制成。等离子体吹管115和基片座119的各自位置和方向可由控制器控制,结果在大面积基片上或具有复杂表明形状而需处理的材料上金刚石膜能均匀地增长。而且尽管在图24中没示出,基片座119也可以装有用于加热基片的加热器或用于控制基片温度的水冷装置。The plasma torch has a water-cooled construction and is made of tungsten to which 2% by weight yttrium oxide has been added together with the cathode and
实施例11(图24)Example 11 (Figure 24)
使用一块5×5×0.2mm的硅片作为基片,真空室内抽真空至2×10-3乇,作为放电气的氢气在压力1kg/cm2下以20升/分,甲烷气在压力1kg/cm2下以80毫升/分流量在电极间流过,氢气作为冷却气在压力1kg/cm2下以20升/分流动以保持真空室压力在200乇。通过置于吹管喷嘴下方3mm处的四只冷却气喷口126,图24所示的由冷却气源管117供给冷却气喷向等离子流。由恒流电弧电源114供给的10A恒流在等离子吹管115的电极间流过,保持5分钟直至电压稳定。这时电压为65V。通过将基片座119慢慢移向吹管115的喷嘴,使喷嘴一基片面的距离固定在5mm,在这种条件下成膜10分钟。根据扫描电子显微照片(SEM),X-射线衍射,喇曼光谱分析和硬度测量来评价所制备的金刚石。Use a 5×5×0.2mm silicon wafer as the substrate, evacuate the vacuum chamber to 2×10 -3 Torr, use hydrogen as the discharge gas at a pressure of 1kg/cm 2 at a rate of 20 liters/min, and methane gas at a pressure of 1kg /cm 2 flowed between the electrodes at a flow rate of 80 ml/min, and hydrogen as a cooling gas flowed at a pressure of 1 kg/cm 2 at a rate of 20 liters/min to maintain the vacuum chamber pressure at 200 Torr. Through the four
图25所示的SEM表明,金刚石表面具有金 刚石晶体,它们规则排列聚集在一起。The SEM shown in Figure 25 shows that the diamond surface has gold Corundum crystals, which are regularly arranged and clustered together.
另一方面,图26中SEM表明,中部为金刚石截面,下部为硅基片截面,上部为金刚石膜表面,还可看出均匀形成了略有不平的金刚石膜的表面。On the other hand, the SEM in Fig. 26 shows that the middle part is the diamond cross section, the lower part is the silicon substrate cross section, and the upper part is the surface of the diamond film. It can also be seen that a slightly uneven diamond film surface is uniformly formed.
还可看出合成的金刚石是具有清晰同一形状的致密多晶体,膜厚为15μm。It can also be seen that the synthesized diamond is a dense polycrystal with a clear uniform shape and a film thickness of 15 μm.
图27表明,金刚石膜X-射线衍射图形有一条CuKα1线,极其明显的金刚石晶面(111),(220),(331),而且(331)和(400)仍可辨出。所以只测出了立方晶体的金刚石尖峰。图28表明金刚石膜的喇曼光谱,从图中可辨出也是在波数1333cm-1处的金刚石内的固有峰,并可看出有其它的碳质材料,如石墨的波峰。Figure 27 shows that the X-ray diffraction pattern of the diamond film has a CuKα 1 line, and the extremely obvious diamond crystal planes (111), (220), (331), and (331) and (400) are still discernible. So only the diamond spikes of the cubic crystals were measured. Figure 28 shows the Raman spectrum of the diamond film. From the figure, it can be seen that there is also an inherent peak in diamond at a wave number of 1333 cm -1 , and it can be seen that there are other carbonaceous materials, such as graphite peaks.
经实测,维氏硬度值与天然金刚石的值相同,500克负荷下,约为10000kg/cm2。According to actual measurement, the Vickers hardness value is the same as that of natural diamond, about 10000kg/cm 2 under a load of 500 grams.
由上述结果可以看出,合成的金刚石是高质量的多晶膜。还可看出膜淀积速率高达100μm/h。It can be seen from the above results that the synthesized diamond is a high-quality polycrystalline film. It can also be seen that the film deposition rate is as high as 100 μm/h.
实施例12(图24)Example 12 (Figure 24)
在实施例11的成膜条件下,用一块10×10×1mm的铂板作为基片,并且使等离子体吹管对铂板以2mm/h的速度扫描,铂基片上形成厚0.4mm的金刚石膜。将金刚石膜从基片上剥离掉,成为10×10×0.4mm的金刚石板。Under the film-forming condition of
实施例13~17和18(图24)和比较1-4Examples 13-17 and 18 (Figure 24) and Comparisons 1-4
下面示出了在不同条件下多次合成金刚石的结果。(表见文后)The results of multiple diamond synthesis under different conditions are shown below. (See the text after the table)
实施例19Example 19
在上述的实施例中,未采用气体冷却:In the above examples, no gas cooling was used:
用5×5×0.2mm的硅片作为基片,真空室内部抽空到2×10-3乇后,在1kg/cm2的压力下,氢气作为放电气以2升/分的流速流动,在1kg/cm2压力下甲烷气以400毫升/分的流速在电极之间流动,从而把真空室压力维持在100乇,由恒流电弧电源吹管通以10A的电流并维持5分钟直到电压恒定,此时电压为6.5V,使图24中的基片座119缓缓地靠近吹管,使喷嘴与基片的距离固定在15mm,在这种状态下完成了膜的淀积,历时一小时,并得到了厚度为60μm的优质金刚石膜。Use a 5×5×0.2mm silicon wafer as a substrate, and after the vacuum chamber is evacuated to 2×10 -3 Torr, under a pressure of 1kg/cm 2 , hydrogen gas flows as a discharge gas at a flow rate of 2 liters/min. Under the pressure of 1kg/ cm2 , methane gas flows between the electrodes at a flow rate of 400ml/min, thereby maintaining the pressure of the vacuum chamber at 100 Torr, and passing a current of 10A through the torch of the constant current arc power supply and maintaining it for 5 minutes until the voltage is constant. Now the voltage is 6.5V, and the
在上述例子中,作为通过骤冷形成具有高自由浓度的活性非平衡等离子体的方法,在所示的例子中冷却气体碰撞从等离子体的四个气体冷却喷口中喷出的等离子体,但冷却气体也可向等离子体轴心喷射。也可只朝一个方向对着等离子流喷射冷却气体,以形成温度分布或可形成自由基浓度分布。In the above example, as a method of forming an active non-equilibrium plasma with a high free concentration by quenching, in the example shown the cooling gas collides with the plasma ejected from the four gas cooling nozzles of the plasma, but the cooling Gas can also be injected towards the plasma axis. The cooling gas can also be sprayed against the plasma stream in only one direction to create a temperature profile or a free radical concentration profile can be created.
按照本发明的气体冷却直流等离子流的CVD法,与不使用气冷的直流等离子流CVD方法相比,由于热等离子体可骤冷,而与基片无关,所以金刚石可在任何基片上生长。不用对基片冷却,优质的金刚石能以大约100μm/小时的高膜淀积速度生成。由此大大加宽了金刚石涂层的应用范围。According to the CVD method of the gas-cooled direct-current plasma flow of the present invention, compared with the direct-current plasma flow CVD method not using air cooling, since the hot plasma can be quenched, it has nothing to do with the substrate, so diamond can be grown on any substrate. High-quality diamond can be produced at a high film deposition rate of about 100 µm/hour without cooling the substrate. This greatly widens the application range of the diamond coating.
通过汽相合成法,使得价格低廉的金刚石的实际应用大大前进了一步,并且当用于散热片或半导体电路基片时,用这种方法合成的金刚石将使成本大大降低,并使性能得到改善,因此金刚石散热片或用于半导体的金刚石电路基片易于实现。Through the vapor phase synthesis method, the practical application of low-cost diamond has been greatly advanced, and when used in heat sinks or semiconductor circuit substrates, the diamond synthesized by this method will greatly reduce the cost and improve the performance , so diamond heat sinks or diamond circuit substrates for semiconductors are easy to implement.
实施例20和21(图14)Examples 20 and 21 (Figure 14)
利用图13(实施例)和图14(实施例20)所示的装置,10×10×0.5mm厚度的硅基片放置在用冷却水冷却的基片座上,并通过用钨作为电极的等离子吹管使金刚石膜淀积在基片上。Utilize the apparatus shown in Fig. 13 (embodiment) and Fig. 14 (embodiment 20), the silicon substrate of 10 * 10 * 0.5mm thickness is placed on the substrate seat that cools with cooling water, and by using tungsten as electrode A plasma torch deposits a diamond film on the substrate.
在图14所示的装置中,当引入氢气(流速20升/分)和甲烷(流速0.2升/分)的混合气体进行放电时,中心值为90V的放电电压在±20V之间波动,并且等离子流的形状大大改变了,而厚度为180μm的金刚石膜在一小时内就淀积完毕。当用X-射线衍射和喇曼光谱进行分析时该膜只有唯一的金刚石波峰。In the device shown in Figure 14, when a mixed gas of hydrogen (flow rate 20 L/min) and methane (flow rate 0.2 L/min) is introduced for discharge, the discharge voltage with a central value of 90 V fluctuates between ±20 V, and The shape of the plasma stream was greatly changed, and a diamond film with a thickness of 180 μm was deposited within one hour. The film had only unique diamond peaks when analyzed by X-ray diffraction and Raman spectroscopy.
另一方面,图14所示的装置中,当氢气和甲烷气各以20升/分(氢气)和0.2升/分(甲烷气)的速率分别输入各吹管中进行放电时,氢气吹管的放电电压非常稳定,其值为100V±2V,甲烷吹管的放电电压为30V±2V,等离子流的形状稳定,得到了膜厚约为150μm的均匀的金刚石膜。On the other hand, in the device shown in Figure 14, when hydrogen and methane are respectively fed into each torch for discharge at a rate of 20 liters/minute (hydrogen) and 0.2 liters/minute (methane), the discharge of the hydrogen torch The voltage is very stable, its value is 100V±2V, the discharge voltage of the methane torch is 30V±2V, the shape of the plasma flow is stable, and a uniform diamond film with a film thickness of about 150 μm is obtained.
如上所述,按照本发明,由于氢气和碳化合物气(如甲烷)以单独的等离子流输入,与引入氢气和甲烷气的气体混合物进行放电的方法相比,能形成非常稳定而高效率的金刚石膜,因此能满足大规模集成电路对基片的要求。同样地,按照本发明也能利用旁热灯丝,微波放电、和RF放电而不是用直流电弧放电。As described above, according to the present invention, since hydrogen gas and carbon compound gas (such as methane) are input as separate plasma streams, diamonds can be formed very stably and efficiently as compared with the method of introducing a gas mixture of hydrogen gas and methane gas for discharge. Therefore, it can meet the requirements of large-scale integrated circuits for substrates. Likewise, bypass heated filaments, microwave discharges, and RF discharges can also be utilized in accordance with the present invention rather than DC arc discharges.
实施例22(图19)Example 22 (Figure 19)
图19和图24示意说明在本发明的方法实施 中使用的一种等离子流CVD装置,图中115是等离子体吹管,116是放电气输入管,114是电弧电源,118是吹管的冷却水管线,119是基片座,120是金刚石基片,121是真空室,122是抽真空系统,123是吹管控制器,124是流量计,125是贮气钢瓶,126是原料气输入管,127是基片控制器。Figure 19 and Figure 24 schematically illustrate the implementation of the method of the present invention A plasma flow CVD device used in the figure, 115 is the plasma torch, 116 is the discharge gas input pipe, 114 is the arc power supply, 118 is the cooling water pipeline of the torch, 119 is the substrate seat, 120 is the diamond substrate, 121 is a vacuum chamber, 122 is a vacuum system, 123 is a blowpipe controller, 124 is a flow meter, 125 is a gas storage cylinder, 126 is a raw material gas input pipe, and 127 is a substrate controller.
等离子体吹管115为水冷结构,由加入2%(治疗)氧化钇的钨与阴极和阳极一起制成。等离子体吹管115和基片座119的位置和方向分别由控制器124,127来控制,它们都能相对于等离子流和基片移动,从而甚至可在基片大面积上均匀地生长金刚石膜或在表面形状复杂的材料上形成金刚石膜。虽然在示意图中未表示出,但是为了控制基片的温度,还可以要安装加热基片的加热器或水冷却机构。The
用Ⅱa型2×2×0.5mm人造金刚石基片,在真空室抽直空至2×10-3乇后,在1kg/cm2的压力下,氢气作为放电气以20升/分的流速而原料气甲烷以0.1升/分的流速流动,可使真空室的压力保持在120乇。Use
20A的电流从恒流电弧电源通入吹管并维持5分钟直到电压恒定,此时的电压为50V,当基片被慢慢地使基片接近吹管时,把喷嘴一基片的间距固定在15mm,在此状态下成膜,历时一小时。The current of 20A is passed into the torch from the constant current arc power supply and maintained for 5 minutes until the voltage is constant. At this time, the voltage is 50V. When the substrate is slowly brought close to the torch, the distance between the nozzle and the substrate is fixed at 15mm , forming a film in this state for one hour.
当制成的金刚石用喇曼光谱和硬度测量进行分析时,喇曼光谱分析出唯一的金刚石峰值,而维氏硬度等于天然金刚石的硬度,即在载荷500克时为10000。金刚石膜厚为150μm,成膜速率为150μm/小时。When the manufactured diamond is analyzed by Raman spectroscopy and hardness measurement, Raman spectroscopy analyzes the only diamond peak, and the Vickers hardness is equal to the hardness of natural diamond, which is 10000 when the load is 500 grams. The diamond film thickness is 150 μm, and the film formation rate is 150 μm/hour.
同样,按劳厄方法进行X-射线衍射,及低能量电子衍射(LEED)证实单晶金刚石膜是底基金刚石基片上外延生长的。Likewise, X-ray diffraction according to Laue's method, and low energy electron diffraction (LEED) confirmed that the single crystal diamond film was grown epitaxially on the underlying diamond substrate.
在该实施例中发现,电弧电压的波动约为10%。因此与引入氢气和甲烷气的气体混合物进行放电(如图13所示)的方法相比电压波动为20%,电弧的稳定性也改善了。In this example it was found that the arc voltage fluctuated by about 10%. Therefore, the voltage fluctuation was 20% compared with the method of introducing a gas mixture of hydrogen and methane for discharge (as shown in Fig. 13), and the stability of the arc was also improved.
在这一实施例中,仍没发现有石墨的产生。In this example, no generation of graphite was found yet.
实施例23Example 23
此外,在实施例22成膜条件下,以0.1毫升/分的流速将B2H6作为掺杂气体混入原料气中,成膜需进行10分钟,得到的是一种具有10-2Ω·m电阻率的P型半导体金刚石。In addition, under the film-forming conditions of Example 22, B 2 H 6 was mixed into the raw material gas as a dopant gas at a flow rate of 0.1 ml/min, and the film-forming took 10 minutes to obtain a film with 10 -2 Ω· P-type semiconductor diamond with m resistivity.
实施例24Example 24
用硅片(5×5×0.2mm)作为基片,将真空室抽真空为2×10-3乇后,在1kg/cm2的压力下,氢放电气以20升/分的流速,甲烷原料气以0.5升/分的流速流经真空室,使真空室压力维持在100乇。Use a silicon wafer (5×5×0.2 mm) as the substrate, vacuumize the vacuum chamber to 2×10 -3 Torr, and under the pressure of 1 kg/cm 2 , discharge the hydrogen at a flow rate of 20 liters/min, methane The raw material gas was flowed through the vacuum chamber at a flow rate of 0.5 liter/minute so that the pressure of the vacuum chamber was maintained at 100 Torr.
20A的电流从恒流电弧电源通入吹管中并维持大约5分钟直至电压恒定,此时电压为50V。使基片缓缓把靠近吹管,喷嘴至基片的距离固定为20mm,在这种状态下进行成膜,历时一小时。A current of 20A is passed into the torch from a constant current arc power supply and maintained for about 5 minutes until the voltage is constant, and the voltage is 50V at this time. The substrate was slowly brought close to the blowpipe, and the distance from the nozzle to the substrate was fixed at 20 mm, and the film was formed in this state for one hour.
所制成的金刚石膜用X-射线衍射,喇曼光谱及硬度测量进行评价。结果,通过X射线衍射,喇曼光谱分析仅有唯一的金刚石波峰,其维纸硬度值与天然金刚石硬度值相等,既在500g载荷下约为10000,金刚石膜厚为200μm/小时。The prepared diamond films were evaluated by X-ray diffraction, Raman spectroscopy and hardness measurement. As a result, through X-ray diffraction, there is only a unique diamond peak in Raman spectrum analysis. The hardness value of the paper-dimensional paper is equal to the hardness value of natural diamond, which is about 10000 under a load of 500g, and the diamond film thickness is 200μm/hour.
当对合成的金刚石膜表面粗度进行测量时,发现Rmax大约为10μm,这与原料气中含有放电气输入后得到的Rmax为50μm相比大大地改善了。When the surface roughness of the as-synthesized diamond film was measured, it was found that the Rmax was about 10 μm, which was greatly improved compared with the Rmax of 50 μm obtained after the feed gas contained the discharge gas input.
在此实施例中,在合成金刚石的过程中发现电弧电压的波动为10%与引入氢气和甲烷气的气体混合物进行放电的方法中电弧电压波动为20%相比,电弧的稳定性也得到了改善。In this example, the arc voltage fluctuation of 10% was found in the process of synthesizing diamond, compared with the arc voltage fluctuation of 20% in the method of introducing a gas mixture of hydrogen and methane gas for discharge, and the stability of the arc was also improved. improve.
此外,在此实施例中,基片周围部位没有石墨产生。In addition, in this embodiment, no graphite was generated at the peripheral portion of the substrate.
实施例25Example 25
用5×5×0.5mm的钼片作为基片,甲烷作为原料气以0.2升/分的流速输入,使阴阳电极上的电压为90V,电流为10A,在实施例26的成膜条件下,可以得到类似的结果。With the molybdenum sheet of 5 * 5 * 0.5mm as substrate, methane is input with the flow velocity of 0.2 liters/min as raw material gas, makes the voltage on the positive and negative electrode be 90V, and electric current is 10A, under the film-forming condition of
图19示出了等离子流喷射装置的剖视图,但阴极103和阳极104可以是对称分布的,阴极103的原料气喷口及喷嘴106可以是多边形(矩形等)或是椭圆的,但要产生不均匀的放电特性。还有,若需要电极上可装有梳状牙形耐热绝缘材料,这将不影响放电,有利于大面积地涂覆。Figure 19 shows a cross-sectional view of the plasma jet device, but the
就基片而言,除金刚石外,石英玻璃、钨、钼等不对表面进行处理也能用于膜的生成。As far as the substrate is concerned, in addition to diamond, quartz glass, tungsten, molybdenum, etc. can also be used for film formation without surface treatment.
就放电气氛而言,为了电弧的稳定性最好在减压的情况下使用放电气氛,但在常压及增压情况下也可使用。在上述实施例中示出了金刚石膜生成的一个例子,但方法也能用于合成金刚石粉末。As for the discharge atmosphere, it is preferable to use the discharge atmosphere under reduced pressure for the stability of the arc, but it can also be used under normal pressure and increased pressure. An example of diamond film formation was shown in the above-mentioned embodiment, but the method can also be used for synthesizing diamond powder.
同样,如上所述,本发明的等离子流喷射装置也可用于如Ba-Y-Cu-O系统等高温超导氧化物的等离子火焰喷涂。Also, as mentioned above, the plasma jet apparatus of the present invention can also be used for plasma flame spraying of high temperature superconducting oxides such as Ba-Y-Cu-O system.
当利用本发明改进型直流等离子流CVD装置生成金刚石膜时,以其淀积率大约为200μm/小时能迅速合成非常光滑的表面、优良的金刚石膜。因此能使金刚石膜的应用范围大大地扩展。When using the improved DC plasma flow CVD device of the present invention to generate the diamond film, the deposition rate is about 200 μm/hour, and a very smooth surface and excellent diamond film can be rapidly synthesized. Therefore, the application range of the diamond film can be greatly expanded.
按照直流等离子流CVD方法进行外延膜生长,以150μm/小时极高的成膜速度获得的外延膜厚度为150μm。The epitaxial film growth is carried out according to the DC plasma flow CVD method, and the thickness of the epitaxial film obtained at a very high film forming speed of 150 μm/hour is 150 μm.
能够很容易的获得用于半导体装置的金刚石散热片及金刚石半导体电路基片,此外,能合成半导体金刚石,也可用于象高温超导氧化物等的无机物的等离子火焰喷涂。Diamond heat sinks and diamond semiconductor circuit substrates for semiconductor devices can be easily obtained. In addition, semiconductor diamonds can be synthesized, and can also be used for plasma flame spraying of inorganic substances such as high-temperature superconducting oxides.
实施例 4 5 6 7 8 9Example 4 5 6 7 8 9
电极间加料气 H220 H220 H220 H220 H220 H220Feed gas between electrodes H 2 20 H 2 20 H 2 20 H 2 20 H 2 20
(1/min) CH41 CH3OH0.5 Ar10 CH41 CH3C10.04 CH3F0.04(1/min)
H201H 2 01
加入到射流中料气 三乙胺0.1 Ar2Added to the jet flow Triethylamine 0.1 Ar2
(1/min) H22 H2O20.5(1/min) H 2 2 H 2 O 2 0.5
基片厚度(μm) Si200 Si200 Mo200 Si200 Si200 Si200Substrate thickness (μm) Si200 Si200 Mo200 Si200 Si200 Si200
压力(托) 120 120 200 130 120 120Pressure (Torr) 120 120 200 130 120 120
电弧电流(A) 10 10 10 10 10 10Arc current (A) 10 10 10 10 10 10
喷嘴-基片间距 5 5 5 5 5 5Nozzle-
(mm)(mm)
膜淀积速率 80 45 70 60 60 30
(μm/h)(μm/h)
高速制备优质金刚石实例Example of high-speed preparation of high-quality diamond
实施例 13 14 15 16 17 18Example 13 14 15 16 17 18
放电气 H220 H210 H220 H220 H220 H220Discharge gas H 2 20 H 2 10 H 2 20 H 2 20 H 2 20
(1/min) Ar10 CH40.2(1/min) Ar10CH4 0.2
CH40.06 H2O0.1 CH40.06H2O0.1 _
冷却气 H220 H220 H220 H220 H220 H220Cooling air H 2 20 H 2 20 H 2 20 H 2 20 H 2 20
(1/min) CH40.5 丙酮2 CH3C10.5 丙酮2(1/min) CH 4 0.5
基片厚度 Si2 Si2 Si2 Si2 Si2 Si2Substrate Thickness Si2 Si2 Si2 Si2 Si2 Si2
(mm)(mm)
压力(托) 200 200 200 200 200 200Pressure (Torr) 200 200 200 200 200 200
电流(A) 10 10 10 10 10 10Current (A) 10 10 10 10 10 10
喷嘴-基片 5 5 5 5 5 5Nozzle-
间距(mm)Pitch (mm)
膜淀积率 100 70 80 100 60 10
(μm/小时)(μm/hour)
非优质金刚石实例Examples of non-premium diamonds
比较例 1 2 3 4Comparative example 1 2 3 4
放电气 H220 H210 H220 H220Discharge gas H 2 20 H 2 10 H 2 20
(1/min) Ar10 CH40.5 CH40.08(1/min) Ar10 CH 4 0.5 CH 4 0.08
CH40.06 H2O0.1 CH40.06H2O0.1 _
冷却气 H220 H220 H220 H220Cooling air H 2 20 H 2 20 H 2 20
(1/min) CH40.5(1/min) CH 4 0.5
基片厚度 Si2 Si2 Si2 Si2Substrate Thickness Si2 Si2 Si2 Si2
(mm)(mm)
压力(托) 200 200 200 200Pressure (Torr) 200 200 200 200
电弧电流(A) 10 10 10 10Arc current (A) 10 10 10 10
喷嘴-基片 20 5 5 5Nozzle-
间距(mm)Pitch (mm)
膜淀积率 300Film deposition rate 300
(μm/小时)(μm/hour)
产品 无 基片熔融 无定形碳 无Product None Substrate Fusion Amorphous Carbon None
Claims (4)
Applications Claiming Priority (12)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8331887 | 1987-04-03 | ||
| JP083318/87 | 1987-04-03 | ||
| JP220437/87 | 1987-09-04 | ||
| JP245853/87 | 1987-10-01 | ||
| JP250598/87 | 1987-10-06 | ||
| JP257632/87 | 1987-10-13 | ||
| JP257635/87 | 1987-10-13 | ||
| JP320142/87 | 1987-12-19 | ||
| JP330130/87 | 1987-12-28 | ||
| JP003043/88 | 1988-01-12 | ||
| JP63003043A JPH01179789A (en) | 1988-01-12 | 1988-01-12 | Vapor growth method for diamond and thermal plasma deposition method and plasma injection device |
| CN 88101737 CN1028772C (en) | 1987-04-03 | 1988-04-02 | VAPOR DEPOSITION OF DIAMOND |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 88101737 Division CN1028772C (en) | 1987-04-03 | 1988-04-02 | VAPOR DEPOSITION OF DIAMOND |
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| CN1060316A CN1060316A (en) | 1992-04-15 |
| CN1029135C true CN1029135C (en) | 1995-06-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 91109955 Expired - Fee Related CN1029135C (en) | 1987-04-03 | 1991-10-19 | Apparatus for Vapor Deposition Diamond |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1313198C (en) * | 2002-02-12 | 2007-05-02 | 燃料元素开放式股份公司 | Method for carrying out homogeneous and heterogeneous chemical reactions using plasma |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5941647A (en) * | 1996-08-19 | 1999-08-24 | Citizen Watch Co., Ltd. | Guide bush and method of forming hard carbon film over the inner surface of the guide bush |
| CN100395378C (en) * | 2005-10-10 | 2008-06-18 | 北京科技大学 | Preparation Method of Large-grain Single Crystal Diamond by DC Plasma Deposition |
| CN100447294C (en) * | 2006-03-27 | 2008-12-31 | 南京航空航天大学 | A method of growing thick nano-diamond film |
| CN101483968B (en) * | 2008-01-08 | 2012-01-11 | 财团法人工业技术研究院 | Jet plasma gun and plasma treatment equipment using it |
| CN101591775B (en) * | 2009-06-18 | 2010-12-08 | 天津理工大学 | Thin film deposition system device suitable for diamond heat sinking diaphragm |
| CN107012444B (en) * | 2017-05-05 | 2023-09-15 | 宁波工程学院 | A blowing device for chemical vapor deposition diamond film plating equipment |
| CN107267952B (en) * | 2017-05-05 | 2023-05-23 | 宁波工程学院 | Method for plating diamond film by chemical vapor deposition |
| CN107881485B (en) * | 2017-11-01 | 2019-10-01 | 深圳市华星光电半导体显示技术有限公司 | The packaging method of plasma enhanced chemical vapor deposition equipment and oled panel |
| CN108914088B (en) * | 2018-09-29 | 2023-07-28 | 北京科技大学 | Gas circulation system for preparing high-quality diamond and application method thereof |
| CN110042361B (en) * | 2019-04-19 | 2021-03-23 | 河北省激光研究所 | Method and device for depositing diamond coating on drawing die |
-
1991
- 1991-10-19 CN CN 91109955 patent/CN1029135C/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN1313198C (en) * | 2002-02-12 | 2007-05-02 | 燃料元素开放式股份公司 | Method for carrying out homogeneous and heterogeneous chemical reactions using plasma |
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| CN1060316A (en) | 1992-04-15 |
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