CN102842803A - Test connector capable of quickly disassembling and assembling electric connection module - Google Patents

Abstract

The invention is a test connector of the electric connection module that can be disassembled and assembled fast, it mainly assembles a group of electric connection modules that can be disassembled and assembled directly in the pilot hole of a base, the said electric connection module includes a component guide frame and an electric connection member, the said electric connection member is assembled on the bottom of the component guide frame detachably, the test connector can be installed in manual or automatic test equipment, provide the electronic component to be tested to put into it with the component guide frame, make the electronic component connect the test equipment to carry on the functional detection through the electric connection member electric connection, the invention is when the electric connection member of the test connector is out of order or needs to be cleaned, through the combined structure design that the electric connection module is disassembled and assembled from the base directly, and can disassemble the electric connection module or its electric connection member fast, continue the detection operation immediately, reduce the halt or standby time of IC test machine because of replacing or cleaning the electric connection member, the production operation state approaching the non-stop state is achieved.

Description

Test connector for quick disassembly of electrical connection modules

technical field

The invention relates to a testing electrical connector, especially a testing electrical connector with the function of quickly replacing an electrical connection module.

Background technique

The detection connector currently used in manual detection devices or automatic detection equipment is used to provide a device for placing and positioning the integrated circuit components to be tested, and uses the electrical connection components (such as: conductive film, probes, etc.) of the detection device as the device to be tested. Measuring the medium of electrical contact between the integrated circuit element and the test carrier board, the electrical connection member is installed on the bottom of the test seat, and the test seat is locked on the circuit carrier board of the testing equipment by screws, so that the signal of the electrical connection member The input and output terminals respectively electrically contact the corresponding contact pads on the surface of the circuit carrier board. When the integrated circuit component to be tested is placed in the component positioning groove of the test socket, the operator manually or by using a machine exerts a force on the integrated circuit component to be tested, so that each input and output terminal (such as a pin, lead, etc.) on the bottom surface of the integrated circuit component Pads, ball pads, etc.) are respectively connected to the corresponding contact pads on the circuit carrier board through the corresponding signal input and output terminals in the conductive member, and then the functional detection is carried out by the detection device or detection system of the detection equipment to judge the integrated circuit component to be tested function is correct.

When the aforementioned test connectors are used in the detection of integrated circuit components for a long time, the electrical connection members in the test connectors will lose their original properties (such as stretching elasticity or electrical characteristics, etc.) due to repeated test pressures. Or dirty due to multiple test pressurization, so in order to ensure the correctness of the test, the electrical connection components must be replaced or cleaned and maintained after being used for a period of time. However, since the electrical connection components are fixed by the test sockets locked on the circuit board, every time the electrical connection components are replaced, the detection equipment needs to be shut down, and then the test sockets are disassembled, the electrical connection components are replaced, and the test sockets are reassembled. Generally speaking, every time the electrical connection components are replaced, it must be shut down for tens of minutes, which has a great impact on the efficiency of the detection operation. Therefore, how to make the replacement of the electrical connection components faster and easier is a test Problems that need to be improved in the field of connector design.

Contents of the invention

The main purpose of the present invention is to provide a test connector that can quickly disassemble the electrical connection module. It is hoped that the replacement of the electrical connection components of the existing test connector will be time-consuming and labor-intensive, and will cause the detection equipment to stop for a long time. Affect the detection efficiency and other issues.

In order to achieve the purpose of the foregoing disclosure, the test connector designed by the present invention to quickly disassemble the electrical connection module includes:

a base, in which at least one assembly hole is formed through from top to bottom; and

At least one electrical connection module, the electrical connection module can be disassembled and installed in the assembly hole of the base, the electrical connection module includes a component guide frame and an electrical connection member, the component guide frame is formed A component insertion hole penetrating from top to bottom, the electrical connection member can be disassembled and installed at the bottom of the component guide frame, and can be disassembled and positioned in the assembly hole of the base through the component guide frame. The electrical connecting member is located at the bottom of the mounting hole of the base.

In a preferred embodiment, the electrical connection member and the bottom of the component guiding frame form a combined structure in which corresponding positioning recesses and positioning protrusions cooperate.

In a preferred embodiment, the electrical connection member is combined with the bottom of the element guiding frame through snap-fitting.

In a preferred embodiment, the electrical connection member and the bottom of the component guiding frame are locked by screws.

In a preferred embodiment, the bottom of the component guiding frame resists and fixes the electrical connection member through elastic force of an elastic body.

In a preferred embodiment, the electrical connection member and the bottom of the component guiding frame are inserted and fixed by positioning pins.

In a preferred embodiment, the element guide frame and the base are locked by screws.

In a preferred embodiment, the element guide frame and the base are combined by clamping.

In a preferred embodiment, the component guide frame and the base are fixed by magnetic attraction with magnets.

In a preferred embodiment, the element guide frame and the base are inserted and fixed through positioning pins and positioning holes.

The characteristics and advantages of the test connector of the electrical connection module that can be quickly disassembled according to the present invention are: the design of the test connector of the electrical connection module can be quickly disassembled, so that it can be installed in manual or automatic test equipment, and can be guided by components. The lead frame provides the electronic components to be tested to be placed therein, so that the electronic components are electrically connected to the test equipment through the electrical connection components for functional testing. When the electrical connection components of the test connector are faulty or dirty, the electrical connection module directly automatically The combined structure design of disassembly in the base allows the user to quickly disassemble and replace the electrical connection module or its electrical connection components, and immediately continue the detection operation, effectively shortening the downtime and achieving a nearly non-stop detection operation state.

Description of drawings

FIG. 1 is an exploded perspective view showing a preferred embodiment of the test connector of the present invention.

FIG. 2 to FIG. 5 disclose combined cross-sectional schematic diagrams of other preferred embodiments of the test connector of the present invention using different electrical connection components.

6 is a schematic bottom plan view showing another preferred embodiment in which the electrical connection module of the test connector of the present invention uses an elastic body to fix the electrical connection member on the bottom surface of the component guide frame.

FIG. 7 is a schematic perspective view of a preferred embodiment of the test connector shown in FIG. 1 combined with a test carrier board and a manual test cover.

FIG. 8 is a three-dimensional schematic view of a preferred embodiment of the test connector shown in FIG. 1 combined with a test carrier board and a positioning board of an automatic testing device.

FIG. 9 is a reference diagram of the use state of the integrated circuit component to be tested inserted into the test connector.

FIG. 10 is a schematic diagram of the operation of the preferred embodiment of the test connector shown in FIG. 1 when replacing the electrical connection module.

Description of component symbols

1...Test Connector 2...Base

20...Assembly hole 201...Hole wall

21...Positioning hole 22...Positioning post

23...Location pin 3...Electric connection module

30...Component guide frame 301...Component insertion hole

302...Positioning hole 303...Positioning recess

304...Positioning convex part 305...Hook

31...Electrical connection member 311...Positioning convex part

312...Positioning recess 32...Elastic body

34...Magnet 35...Screw

4...Test carrier board 5...Test cover

6...Positioning plate 60...Positioning hole

7...Integrated Circuit Components

Detailed ways

As shown in FIG. 1 , it discloses a preferred embodiment of the test connector of the present invention that can quickly disassemble the electrical connection module. The composition of the test connector 1 includes a base 2 and at least one electrical connection module 3, wherein :

The base 2 is formed with at least one assembly hole 20 penetrating from top to bottom. As shown in FIG. 21 can be threaded therein by screws to fix the base 2 on the circuit board. In addition, positioning bosses 22 can also be provided on the top surface of the base 2 for aligning and assembling the base 2 .

The electrical connection module 3 can be directly disassembled and installed in the assembly hole 20 of the base 2. The electrical connection module 3 includes a component guide frame 30 and an electrical connection member 31. The component guide frame A component insertion hole 301 penetrating from top to bottom is formed in 30. The component insertion hole 301 is designed according to the external dimensions of the integrated circuit component to be tested. The electrical connection member 31 is detachably mounted on the component The bottom of the guide frame 30 provides a plurality of signal input and output terminals, and is detachably fixed in the assembly hole 20 of the base 2 through the component guide frame 30, and the electrical connection member 31 is located at the bottom of the assembly hole 20 of the base 2; The electrical connection member 31 can be a conductive film with many wires (as shown in Figure 3), or a combination of a carrier board and a plurality of conductive rubber strips (or conductive rubber blocks) (as shown in Figures 1 and 2) , or a conductive sheet with multiple columnar conductive particles (as shown in Figure 4), or a probe matrix with multiple telescopic probes (as shown in Figure 5), or other with a specific direction from top to bottom Conductive members with conductive function, etc., and use the wires, conductive particles, conductive blocks, probes, etc. as signal input and output terminals.

The combination structure design between the component guide frame 30 and the base 2 can be screw locking, clamping combination positioning, magnet magnetic attraction positioning, elastic body resisting and fixing with elastic force, positioning pin and positioning hole insertion and fixing and other combination structures to achieve. In the preferred embodiment shown in Figure 1, the assembly hole 20 of the base 2 forms a stepped hole with an upper aperture larger than the lower aperture. 1. Set at least one positioning pin 23 at the peripheral hole wall 201 of the lower joint, and set a positioning hole 302 corresponding to the positioning pin 23 in the component guide frame 30, so that the component guide frame 30 is inserted into the upper section of the assembly hole 20 of the base 2 Among them, the electrical connection member 31 is located in the lower section of the assembly hole 20 of the base 2, and the positioning pin 23 is passed through the corresponding positioning hole 302, so that the component guide frame 30 is fixed in the base 2 and can be directly disassembled from the base 2. Group elements guide frame 30 . In the preferred example shown in Figure 1, the positioning pin 23 can also be made of iron material, and a magnet 34 is set above the positioning hole 302 of the component guide frame 30, so that the positioning pin 23 can be a magnet. 34 be fixed by magnetic suction.

The electrical connection member 31 is detachably mounted on the bottom of the component guide frame 30, and the electrical connection member 31 and the bottom of the component guide frame 30 can cooperate with the positioning protrusions 311, 304 through the corresponding positioning recesses 303, 312 The combined structure (as shown in Figure 2 and Figure 3), or, between the electrical connection member 31 and the element guide frame 30 can also use the snap-fit combination method, the screw locking method, and the elastic body 32 to resist with elastic force. Fixed (as shown in Figure 6), the insertion and fixing of positioning pins and positioning holes and other combined structures to achieve. The electrical connection member 31 is based on the selected conductive film (a preferred embodiment as shown in Figure 3), the combination of a carrier board and a plurality of conductive rubber strips (or conductive rubber blocks) (as shown in Figure 1 and Figure 2 preferred embodiment), a conductive sheet with multiple columnar conductive particles (the preferred embodiment shown in Figure 4), or a probe matrix with multiple telescopic probes (the preferred embodiment shown in Figure 5 embodiment), or other types of conductive members with a specific direction of conduction from top to bottom, and choose a suitable combination of electrical connection members and component guide frames.

The preferred embodiment shown in Figure 1 and Figure 5 discloses the combined structure that the electrical connection member 31 is fixed to the bottom of the component guide frame 30 by screws 35 (or positioning pins); the preferred embodiment shown in Figure 4, It is disclosed that the component guide frame 30 fixes the electrical connection member 31 in a clamping manner through its bottom hook 305; the preferred embodiment shown in FIG. 5 discloses that the electrical connection member 31 is fixed to the bottom of the component guide frame 30 by screws Structure; the preferred embodiment shown in FIG. 6 discloses a combined structure in which the electrical connection member 31 is resisted and positioned by elastic force through the elastic body 32 provided at the bottom of the component guide frame 30 .

When the test connector of the present invention is applied to the detection of integrated circuit components, as shown in FIG. 7 , it discloses an embodiment in which the test connector is applied to a manual detection device, wherein the test connector 1 is installed on a test carrier board 4 with lines, The bottom ends of the multiple signal input and output terminals of the electrical connection member 31 in the test connector 1 are electrically contacted with the corresponding contact pads on the test carrier board 4, and then the operator manually places the integrated circuit component to be tested on the component lead. Insert the components of the lead frame 30 into the hole 301, then cover the test connector 1 with the test cover 5 by hand, and apply a force to the integrated circuit component to be tested, so that each input-output terminal ( Such as pins, lead pads, ball pads, etc.) respectively electrically contact the signal input and output terminals on the electrical connection member 31 , and then electrically connect the test system through the test carrier board 4 for functional testing.

As shown in FIG. 8 , an embodiment in which a plurality of test connectors 1 are applied to a positioning board of an automated testing device is disclosed, wherein the test connectors 1 are fixed on the test carrier board 4 respectively, so that each test connector The signal input and output ends of the electrical connection member 31 of 1 electrically contact the corresponding contact pads on the test carrier board 4, and then each group is respectively installed on the bottom of a positioning board 6, wherein the base 2 is combined with the positioning board 6, and each The detachable electrical connection module 3 in a test connector 1 corresponds to the positioning hole 60, and is installed on the machine platform of the test equipment through the positioning plate 6, and each test connector 1 is connected to the test carrier board 4 electrical connections respectively. Connectivity testing system. During testing, as shown in FIG. 9 , it uses the motion mechanism in the automatic testing equipment to absorb a plurality of integrated circuit components 7 to be tested and shift them to the positioning plate 6, so that each integrated circuit component to be tested is inserted into the corresponding test connector. The component of the component guide frame 30 of 1 is placed in the hole 301, so that each input and output terminal (such as pins, lead pads, ball pads, etc.) at the bottom of the integrated circuit component to be tested electrically contacts the signal on the electrical connection member 31 The input and output terminals are electrically connected to the test system through the test carrier board 4 for functional testing.

After the test connector of the present invention is applied to the detection of integrated circuit components, the electrical connection member 31 will be worn or dirty due to the force applied for a long time, so in order to ensure the correctness of the detection operation, it must be replaced. When replacing, as shown in Figure 10 As shown, it uses a hand-held tool to directly take out the electrical connection module 3 from the base 2, and puts the spare electrical connection module 3 into the base 2; or, after the electrical connection module 3 is taken out of the base 2 , remove the electrical connection member 31 in the electrical connection module 3 from the bottom of the component guide frame 30, replace it with a spare replacement electrical connection member 31, and then re-insert it into the assembly hole 20 of the base 2, that is, it can be continued Testing of integrated circuit components.

As can be seen from the above description, the present invention uses the combined structure design in which the electrical connection module 3 can be directly disassembled from the base 2, so that the user can quickly disassemble the electrical connection module 3 or its electrical connection member 31, and immediately continue the detection operation. Therefore, the downtime can be effectively shortened, and a detection operation state close to non-stop can be achieved.

The above description only discloses the preferred embodiments of the present invention, and is not intended to limit the present invention in any form. Any skilled person with common knowledge in the technical field will not depart from the scope of the technical characteristics proposed in the present invention. Equivalent embodiments made with partial changes or modifications utilizing the technical content disclosed in the present invention still fall within the scope of the technical features of the present invention.

Claims (10)

1. the test connector that can tear the group electrical connection module fast open is characterized in that, comprises:

One pedestal forms at least one pilot hole that from top to bottom connects in the said pedestal; And

At least one electrical connection module; Said electrical connection module can be put in order the pilot hole that is installed on pedestal that assembling and dismantling are changed; Said electrical connection module comprises an element guiding frame and an electrical connecting member, and the element that formation one from top to bottom connects in the said element guiding frame is inserted the hole, and said electrical connecting member can be torn the element that is installed in of group open and guide frame bottom; And guide frame through element and can tear open in the pilot hole that is positioned pedestal of group, said electrical connecting member is positioned at the pilot hole bottom of pedestal.

2. the test connector that can tear the group electrical connection module fast open as claimed in claim 1 is characterized in that, said electrical connecting member is guided with element and formed the composite construction that corresponding location indentations cooperates with positioning convex portion between the frame bottom.

3. the test connector that can tear the group electrical connection module fast open as claimed in claim 1 is characterized in that, makes up through snap fit between said electrical connecting member and the element guiding frame bottom.

4. the test connector that can tear the group electrical connection module fast open as claimed in claim 1 is characterized in that, passes through screws between said electrical connecting member and the element guiding frame bottom.

5. the test connector that can tear the group electrical connection module fast open as claimed in claim 1 is characterized in that, said element guiding frame bottom supports through elastomer elastic force and ends fixing said electrical connecting member.

6. the test connector that can tear the group electrical connection module fast open as claimed in claim 1 is characterized in that, plugs fixing between said electrical connecting member and the element guiding frame bottom through alignment pin.

7. like each the described test connector that can tear the group electrical connection module fast open of claim 1 to 6, it is characterized in that, pass through screws between said element guiding frame and the pedestal.

8. like each the described test connector that can tear the group electrical connection module fast open of claim 1 to 6, it is characterized in that, make up through clamping between said element guiding frame and the pedestal.

9. like each the described test connector that can tear the group electrical connection module fast open of claim 1 to 6, it is characterized in that, fix through the magnet magnetic between said element guiding frame and the pedestal.

10. like each the described test connector that can tear the group electrical connection module fast open of claim 1 to 6, it is characterized in that, peg graft fixing through alignment pin and location hole between said element guiding frame and the pedestal.

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