[go: up one dir, main page]

CN102590234B - Dual-energy under-sampling substance identification system and method based on linear track scanning - Google Patents

Dual-energy under-sampling substance identification system and method based on linear track scanning Download PDF

Info

Publication number
CN102590234B
CN102590234B CN201110391895.2A CN201110391895A CN102590234B CN 102590234 B CN102590234 B CN 102590234B CN 201110391895 A CN201110391895 A CN 201110391895A CN 102590234 B CN102590234 B CN 102590234B
Authority
CN
China
Prior art keywords
dual
energy
coefficient
detector array
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201110391895.2A
Other languages
Chinese (zh)
Other versions
CN102590234A (en
Inventor
肖永顺
陈志强
张丽
刘圆圆
邢宇翔
赵自然
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsinghua University
Nuctech Co Ltd
Original Assignee
Tsinghua University
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Co Ltd filed Critical Tsinghua University
Priority to CN201110391895.2A priority Critical patent/CN102590234B/en
Publication of CN102590234A publication Critical patent/CN102590234A/en
Application granted granted Critical
Publication of CN102590234B publication Critical patent/CN102590234B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

公开了一种基于直线轨迹扫描的双能欠采样物质识别系统和方法。利用直线轨迹扫描过程中由整层的低能探测器阵列获得的低能投影数据对被检测物体进行CT重建,在CT重建图像中运用区域图像分割方法按照衰减系数对此断层图像进行区域分割并进行标记。同时,利用设置在部分低能探测器后的少数几个高能探测器得到的投影数据实现双能量物质识别成像。由于利用直线轨迹,不需要旋转,因此机械设计简单,检查通关率高;由于仅使用少量几个的双能探测器,系统成本低。

Figure 201110391895

Disclosed are a dual-energy undersampling substance identification system and method based on linear trajectory scanning. Use the low-energy projection data obtained by the whole layer of low-energy detector array during the straight-line trajectory scanning process to perform CT reconstruction of the detected object, and use the regional image segmentation method in the CT reconstruction image to segment and mark the tomographic image according to the attenuation coefficient . At the same time, dual-energy material identification imaging is realized by using the projection data obtained by a few high-energy detectors arranged behind some low-energy detectors. Due to the use of a straight line trajectory, no rotation is required, so the mechanical design is simple and the inspection clearance rate is high; since only a few dual-energy detectors are used, the system cost is low.

Figure 201110391895

Description

基于直线轨迹扫描的双能欠采样物质识别系统和方法System and method for dual-energy undersampling substance identification based on linear trajectory scanning

本申请是于2009年5月27日提交的名称为“基于直线轨迹扫描的双能欠采样物质识别系统和方法”的发明专利申请200910085923.0的分案申请。This application is a divisional application of the invention patent application 200910085923.0 filed on May 27, 2009, entitled "Dual Energy Undersampling Substance Identification System and Method Based on Linear Trajectory Scanning".

技术领域 technical field

本发明涉及辐射成像技术,具体涉及一种基于直线轨迹扫描的双能欠采样物质识别系统和方法,它允许对物体进行快速的安全检查。The invention relates to radiation imaging technology, in particular to a dual-energy undersampling material identification system and method based on linear trajectory scanning, which allows fast security inspection of objects.

背景技术 Background technique

近年来,由于毒品,爆炸物,武器等危险品走私现象的日益严重,使得能够低成本,快速度进行物质识别的安全检查系统在打击违禁品走私等安全领域有着十分重要的意义。In recent years, due to the increasingly serious smuggling of dangerous goods such as drugs, explosives, and weapons, a security inspection system that can identify substances at low cost and quickly is of great significance in the field of combating contraband smuggling and other security fields.

目前能够进行物质识别的安全检查系统以双能成像系统为主流,主要分为两类。一类是双能透视成像系统,但由于该系统重建的是前后物体相互重叠的图像,所以容易误报或漏报走私的违禁品。另一类是基于圆或螺旋轨迹的双能CT成像系统,此系统虽然能够解决物体重叠问题,但由于系统设计复杂,扫描时间长,成本高等因素使其不能够大范围被使用。At present, the dual-energy imaging system is the mainstream of the security inspection system capable of material identification, which is mainly divided into two categories. One type is a dual-energy perspective imaging system, but since the system reconstructs overlapping images of front and rear objects, it is easy to misreport or miss smuggled contraband. The other is a dual-energy CT imaging system based on circular or helical trajectories. Although this system can solve the problem of overlapping objects, it cannot be widely used due to complex system design, long scanning time, and high cost.

如图1所示,专利文献1(CN1971620A)提出了一种直线轨迹CT成像系统,使得CT成像技术用于快速安全检查成为可能。但由于CT系统自身的局限性,该专利文献所提出的方法只能够重建物体的形状信息而不能进行物质鉴别,所以在对行李箱中违禁品的物质识别问题上是无能为力的。如果将用于直线扫描轨迹的全部探测器均换成双能探测器,则系统成本将大大提高,不被接受。As shown in FIG. 1 , Patent Document 1 (CN1971620A) proposes a linear trajectory CT imaging system, which makes it possible for CT imaging technology to be used for rapid security inspection. However, due to the limitations of the CT system itself, the method proposed in this patent document can only reconstruct the shape information of the object and cannot perform material identification, so it is powerless on the issue of material identification of contraband in the suitcase. If all the detectors used for the straight-line scanning trajectory are replaced with dual-energy detectors, the system cost will be greatly increased, which is not acceptable.

发明内容 Contents of the invention

本发明的目的在于提出一种基于直线轨迹扫描的双能欠采样物质识别方法和系统,以低成本,快速度进行双能物质识别。The object of the present invention is to propose a dual-energy under-sampling material identification method and system based on linear trajectory scanning, which can perform dual-energy material identification at low cost and fast speed.

在本发明的一个方面,提出了一种基于直线轨迹扫描的双能欠采样物质识别方法,包括:对被检查物体进行直线轨迹CT扫描,通过第一层阵列探测器获得第一投影数据以重建被检测物体的CT图像,以及通过设置在部分第一层阵列探测器后的第二层探测器阵列获得第二投影数据;组合第一投影数据和第二投影数据,以获得部分角度下的双能欠采样数据;根据双能欠采样数据采用查表的方法获得光电系数积分值和康普顿系数积分值;对被检测物体的CT图像进行区域分割,得到分割后的多个区域并且计算双能射线穿过各个区域的长度;根据双能射线穿过各个区域的长度,光电系数积分值和康普顿系数积分值,利用双能前处理双效应分解重建方法求解康普顿系数和光电系数;基于康普顿系数和光电系数至少计算各分割的区域中物质的原子序数;至少基于原子序数对被检查物体的物质进行识别。In one aspect of the present invention, a dual-energy undersampling material identification method based on straight-line trajectory scanning is proposed, including: performing a straight-line trajectory CT scan on the inspected object, and obtaining the first projection data through the first layer of array detectors to reconstruct The CT image of the object to be detected, and the second projection data obtained through the second layer of detector arrays arranged behind part of the first layer of array detectors; combining the first projection data and the second projection data to obtain dual can under-sampling data; according to the dual-energy under-sampling data, use the table look-up method to obtain the integral value of photoelectric coefficient and Compton coefficient; perform region segmentation on the CT image of the detected object, obtain multiple regions after segmentation and calculate the dual The length of the energy rays passing through each region; according to the length of the dual energy rays passing through each region, the integral value of the photoelectric coefficient and the integral value of the Compton coefficient, the Compton coefficient and the photoelectric coefficient are solved by using the dual-energy pre-processing double-effect decomposition and reconstruction method ; at least calculating the atomic number of the substance in each divided area based on the Compton coefficient and the photoelectric coefficient; and identifying the substance of the inspected object based on at least the atomic number.

在本发明的另一方面,提出了一种基于直线轨迹扫描的双能欠采样物质识别系统,包括:射线发生装置,产生要穿透被检查物体的射线束;机械传动控制部分,包括传动装置和控制系统,用于实现对被检查物体的直线轨迹扫描;数据采集分系统,包括阵列探测器,用于获取穿透被检查物体的射线束的透射投影数据;主控制及数据处理计算机,控制上述射线发生装置,机械传动控制部分和数据采集分系统,对被检查物体进行直线轨迹CT扫描,通过第一层阵列探测器获得第一投影数据以重建被检测物体的CT图像,以及通过设置在部分第一层阵列探测器后的第二层探测器阵列获得第二投影数据;其中所述主控制及数据处理计算机包括:组合第一投影数据和第二投影数据,以获得部分角度下的双能欠采样数据的装置;根据双能欠采样数据采用查表的方法获得光电系数积分值和康普顿系数积分值的装置;对被检测物体的CT图像进行区域分割,得到分割后的多个区域并且计算双能射线穿过各个区域的长度的装置;根据双能射线穿过各个区域的长度,光电系数积分值和康普顿系数积分值,利用双能前处理双效应分解重建方法求解康普顿系数和光电系数的装置;基于康普顿系数和光电系数至少计算各分割的区域中物质的原子序数的装置;至少基于原子序数对被检查物体的物质进行识别的装置。In another aspect of the present invention, a dual-energy undersampling material identification system based on linear trajectory scanning is proposed, including: a ray generating device, which generates a ray beam to penetrate the object to be inspected; a mechanical transmission control part, including a transmission device And the control system is used to realize the linear trajectory scanning of the inspected object; the data acquisition subsystem, including the array detector, is used to obtain the transmission projection data of the ray beam penetrating the inspected object; the main control and data processing computer control The above-mentioned ray generating device, the mechanical transmission control part and the data acquisition subsystem perform straight-line trajectory CT scanning on the object to be inspected, obtain the first projection data through the first layer of array detectors to reconstruct the CT image of the object to be inspected, and set in Part of the second-layer detector array behind the first-layer array detectors obtains second projection data; wherein the main control and data processing computer includes: combining the first projection data and the second projection data to obtain dual projection data under partial angles A device capable of undersampling data; a device for obtaining the integrated value of the photoelectric coefficient and the integrated value of the Compton coefficient by using a table look-up method according to the dual-energy undersampled data; performing regional segmentation on the CT image of the detected object to obtain multiple segments after segmentation region and calculate the length of the dual-energy ray passing through each region; according to the length of the dual-energy ray passing through each region, the integral value of the photoelectric coefficient and the integral value of the Compton coefficient, the dual-energy pre-processing double-effect decomposition and reconstruction method is used to solve the Kang A device for Compton coefficient and photoelectric coefficient; a device for calculating at least the atomic number of a substance in each divided area based on the Compton coefficient and a photoelectric coefficient; a device for identifying the substance of an object under inspection based at least on the atomic number.

和传统双能透视成像系统相比,本发明实施例的方法和系统解决了透视成像中物体重叠问题。Compared with the traditional dual-energy perspective imaging system, the method and system of the embodiments of the present invention solve the problem of overlapping objects in perspective imaging.

和传统的圆或螺旋轨迹双能CT成像系统相比,本发明实施例的方法和系统利用直线轨迹扫描并仅在直线轨迹扫描的低能探测器后面增加了少量几个高能探测器进行双能数据采样即可实现对被测物体进行低成本,快速度的双能物质识别。Compared with the traditional circular or helical trajectory dual-energy CT imaging system, the method and system of the embodiment of the present invention utilizes straight-line trajectory scanning and only adds a small number of high-energy detectors behind the low-energy detectors for linear trajectory scanning to perform dual-energy data Sampling can realize low-cost and fast dual-energy material identification of the measured object.

同时,本系统也可以应用于无损检测领域。At the same time, the system can also be applied in the field of non-destructive testing.

附图说明 Description of drawings

从下面结合附图的详细描述中,本发明的上述特征和优点将更明显,其中:From the following detailed description in conjunction with the accompanying drawings, the above-mentioned features and advantages of the present invention will be more apparent, wherein:

图1是描述根据现有技术的直线轨迹扫描过程的示意图;Fig. 1 is a schematic diagram describing a linear trajectory scanning process according to the prior art;

图2是描述根据本发明实施例的基于直线轨迹的双能欠采样物质识别过程的平面示意图;FIG. 2 is a schematic plan view describing the identification process of dual-energy undersampling substances based on linear trajectories according to an embodiment of the present invention;

图3A是根据本发明实施例的双能欠采样物质识别系统的结构示意图;3A is a schematic structural diagram of a dual-energy undersampling substance identification system according to an embodiment of the present invention;

图3B是根据本发明实施例的双能欠采样物质识别系统中的主控制和数据处理计算机的结构示意图;3B is a schematic structural diagram of the main control and data processing computer in the dual-energy undersampling substance identification system according to an embodiment of the present invention;

图4是根据本发明实施例的基于直线轨迹扫描的双能欠采样物质识别方法的详细流程图;4 is a detailed flow chart of a dual-energy undersampling substance identification method based on linear trajectory scanning according to an embodiment of the present invention;

图5示出了光电系数积分和康普顿系数积分的查找表;以及Figure 5 shows a look-up table for the integral of the photoelectric coefficient and the integral of the Compton coefficient; and

图6是描述计算穿过分割的区域的射线长度的示意图。FIG. 6 is a schematic diagram describing calculation of ray lengths passing through segmented regions.

具体实施方式 Detailed ways

下面,参考附图详细说明本发明的优选实施方式。在附图中,虽然示于不同的附图中,但相同的附图标记用于表示相同的或相似的组件。为了清楚和简明,包含在这里的已知的功能和结构的详细描述将被省略,否则它们将使本发明的主题不清楚。Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the drawings, the same reference numerals are used to designate the same or similar components, although shown in different drawings. For clarity and conciseness, detailed descriptions of known functions and constructions incorporated herein will be omitted since they would otherwise obscure the subject matter of the present invention.

图2是描述根据本发明实施例的基于直线轨迹的双能欠采样物质识别过程的平面示意图。如图2所示,根据本发明实施例的双能欠采样物质识别成像系统采用基于CT图像的双能投影欠采样物质识别方法。在本发明实施例的系统中,在数据采集分系统13中,在整层的低能探测器阵列后,设置了少数几个高能探测器单元。被检查物体在射线源11和探测器阵列之间直线运动。Fig. 2 is a schematic plan view describing the process of dual-energy undersampling substance identification based on straight-line trajectories according to an embodiment of the present invention. As shown in FIG. 2 , the dual-energy undersampling substance identification imaging system according to the embodiment of the present invention adopts a CT image-based dual-energy projection undersampling substance identification method. In the system of the embodiment of the present invention, in the data acquisition subsystem 13, a few high-energy detector units are arranged behind the entire layer of low-energy detector arrays. The inspected object moves linearly between the ray source 11 and the detector array.

这样,利用直线轨迹扫描过程中由整层的低能探测器阵列获得的低能投影数据对被检测物体进行CT重建,在CT重建图像中运用区域图像分割方法按照衰减系数对此断层图像进行区域分割并进行标记。同时,利用设置在部分低能探测器后的少数几个高能探测器得到的投影数据实现双能欠采样物质识别成像。In this way, the low-energy projection data obtained by the entire layer of low-energy detector arrays during the straight-line trajectory scanning process is used to perform CT reconstruction on the detected object, and the regional image segmentation method is used in the CT reconstruction image to segment the tomographic image according to the attenuation coefficient. to mark. At the same time, the projection data obtained by a few high-energy detectors arranged behind some low-energy detectors are used to realize dual-energy undersampling material identification imaging.

图3A是根据本发明实施例的双能欠采样物质识别系统的结构示意图。如图3A所示,本发明实施例的双能欠采样物质识别系统主要由如下几个部分组成。Fig. 3A is a schematic structural diagram of a dual-energy undersampling substance identification system according to an embodiment of the present invention. As shown in FIG. 3A , the dual-energy undersampling substance identification system of the embodiment of the present invention mainly consists of the following parts.

射线发生装置11,包括X射线加速器、X光机或者放射性同位素,以及相应的辅助设备。The ray generating device 11 includes an X-ray accelerator, an X-ray machine or a radioactive isotope, and corresponding auxiliary equipment.

机械传动控制部分12,该部分包括一个传输被检查物体(或者源和探测器)的传动装置和控制系统,物体运动与源和探测器运动属于相对运动,是等价的。The mechanical transmission control part 12 includes a transmission device and a control system for transmitting the object to be inspected (or the source and the detector). The motion of the object and the motion of the source and the detector are relative motions and are equivalent.

数据采集分系统13,主要包括两层高低能探测器(一般是等距排列,也可以是等角排列)用于获取低能透射投影数据。其中中间的几个低能探测器的后方对应的安置几个高能探测器,获得双能投影数据。该分系统13还包括探测器上投影数据的读出电路和逻辑控制单元等。探测器可以是固体探测器,也可以是气体探测器,还可以是半导体探测器。The data acquisition subsystem 13 mainly includes two layers of high and low energy detectors (usually arranged equidistantly, or equiangularly arranged) for acquiring low energy transmission projection data. Several high-energy detectors are placed behind the middle low-energy detectors to obtain dual-energy projection data. The subsystem 13 also includes a readout circuit and logic control unit for projection data on the detector. The detector can be a solid detector, a gas detector, or a semiconductor detector.

两层高低能探测器(由整层低能探测器单元和少数高能探测器单元组成)位于射线源对面,平行于传送带。探测器在水平方向与射线源张角尽可能大,在竖直方向覆盖物体。例如,探测器阵列放置在源的对边,要求射线水平张角θ在90度以上。Two layers of high- and low-energy detectors (consisting of a whole layer of low-energy detector units and a few high-energy detector units) are located opposite to the ray source and parallel to the conveyor belt. The detector should have as large an angle as possible with the ray source in the horizontal direction, and cover the object in the vertical direction. For example, the detector array is placed on the opposite side of the source, and the horizontal angle θ of the rays is required to be above 90 degrees.

数据采集时,要求采样间隔在时间轴上是均匀的,被检查物体也要是匀速运动,并要求所有阵列探测器同步采集。During data collection, the sampling interval is required to be uniform on the time axis, the object to be inspected must also move at a uniform speed, and all array detectors are required to collect synchronously.

主控制及数据处理计算机14通过控制信号及数据传输线15发送和接收信号,负责CT系统运行过程的主控制,包括机械控制,电气控制,安全连锁控制等,并对由数据采集分系统13获得的投影数据进行处理,用直线滤波反投影方法重建出待测物体断层图像,分割图像以及各分块区域的原子序数和电子密度图像,并通过显示器显示出来。计算机可以是高性能的单个PC,也可以是工作站或机群。显示器可以是CRT传统显示器也可以是液晶显示器。The main control and data processing computer 14 sends and receives signals through the control signal and the data transmission line 15, and is responsible for the main control of the CT system operation process, including mechanical control, electrical control, safety chain control, etc., and the information obtained by the data acquisition subsystem 13 The projection data is processed, and the tomographic image of the object to be measured is reconstructed by the linear filter back projection method, the image is segmented, and the atomic number and electron density images of each block area are displayed on the display. Computers can be high-performance individual PCs, or workstations or clusters. The display can be either a CRT traditional display or a liquid crystal display.

图3B示出了如图3A所示的主控制及数据处理计算机14的结构框图。如图3B所示,数据采集分系统13所采集的数据存储在存储器141中。只读存储器(ROM)142中存储有计算机数据处理器的配置信息和程序。随机存取存储器(RAM)143用于在处理器146工作过程中暂存各种数据。另外,存储器141中还存储有用于进行数据处理的计算机程序和预先编制的数据库,该数据库存储有各种已知物体的相关信息,光电系数积分和康普顿系数积分查找表,原子序数查找表或者原子序数分类曲线,以及物质的电子密度等信息,用于与处理器146所计算出的被检查物体中各个区域的诸如原子序数和电子密度之类的属性进行比较。内部总线144连接上述的存储器141、只读存储器142、随机存取存储器143、输入装置145、处理器146和显示装置147。FIG. 3B shows a block diagram of the main control and data processing computer 14 shown in FIG. 3A. As shown in FIG. 3B , the data collected by the data collection subsystem 13 is stored in the memory 141 . A read only memory (ROM) 142 stores configuration information and programs for the computer data processor. A random access memory (RAM) 143 is used for temporarily storing various data during the working process of the processor 146 . In addition, the memory 141 also stores computer programs for data processing and a pre-programmed database, the database stores relevant information of various known objects, photoelectric coefficient integral and Compton coefficient integral lookup table, atomic number lookup table Or the atomic number classification curve, and information such as the electron density of the substance are used for comparison with the attributes such as atomic number and electron density of each region in the inspected object calculated by the processor 146 . The internal bus 144 connects the above-mentioned memory 141 , read-only memory 142 , random access memory 143 , input device 145 , processor 146 and display device 147 .

在用户通过诸如键盘和鼠标之类的输入装置145输入的操作命令后,该计算机程序中的处理器146执行预定的数据处理算法,在得到数据处理结果之后,将其显示在诸如LCD显示器之类的显示装置147上,或者直接以硬拷贝的形式输出处理结果。After the operation command input by the user through the input device 145 such as keyboard and mouse, the processor 146 in the computer program executes a predetermined data processing algorithm, and after obtaining the data processing result, it is displayed on a display such as an LCD display. on the display device 147, or directly output the processing results in the form of hard copy.

下面参照附图4详细描述本发明实施例的方法的执行过程。图4是根据本发明实施例的基于直线轨迹扫描的双能欠采样物质识别方法的详细流程图。The execution process of the method in the embodiment of the present invention will be described in detail below with reference to FIG. 4 . Fig. 4 is a detailed flow chart of a dual-energy undersampling substance identification method based on linear trajectory scanning according to an embodiment of the present invention.

在步骤S11,主控制及数据处理计算机14控制射线发生装置11、机械传动控制部分12、和数据采集分系统13,利用直线滤波反投影方法将在第一层探测阵列获得的投影数据采样进行CT重建,得到被检测物体的CT断层图像。同时,利用第二层少量几个探测器获得的投影数据实现双能量投影数据欠采样,进而可查表求出每对高低能投影对应的光电系数积分和康普顿系数积分值A。In step S11, the main control and data processing computer 14 controls the ray generating device 11, the mechanical transmission control part 12, and the data acquisition subsystem 13, and uses the linear filter back projection method to sample the projection data obtained in the first layer of the detection array for CT Reconstruct to obtain a CT tomographic image of the detected object. At the same time, the projection data obtained by a small number of detectors in the second layer is used to realize undersampling of dual-energy projection data, and then the table can be looked up to obtain the photoelectric coefficient integral and Compton coefficient integral value A corresponding to each pair of high and low energy projections.

如图5所示,横纵坐标P1,P2分别表示高低能情况下得到的投影,在表中的每一个坐标点处都存有与此时高低能投影数据对应的光电系数积分和康普顿系数积分A的取值。即当已知高低能投影数据时,就可通过查找此表得到与之对应的光电系数积分和康普顿系数积分A的取值。在现有文献(“A Volumetric Object Detection Framework withDual-Energy CT”IEEE NSS/MIC 2008)中公开了上述的查找表。As shown in Figure 5, the horizontal and vertical coordinates P1 and P2 respectively represent the projections obtained under high and low energy conditions, and at each coordinate point in the table there are photoelectric coefficient integrals and Compton values corresponding to the high and low energy projection data at this time. The value of the coefficient integral A. That is, when the high and low energy projection data are known, the values of the corresponding photoelectric coefficient integral and Compton coefficient integral A can be obtained by looking up this table. The above-mentioned lookup table is disclosed in existing literature (“A Volumetric Object Detection Framework with Dual-Energy CT” IEEE NSS/MIC 2008).

在步骤S12,主控制及数据处理计算机14采用基于区域分割的方法将CT重建图像根据灰度的差异分割成不同几区域并进行标记。例如,上述基于区域分割的方法是改进的单程分裂合并的分割方法。In step S12, the main control and data processing computer 14 divides the CT reconstructed image into different regions according to the difference in gray level by using a method based on region segmentation and marks them. For example, the above region segmentation-based methods are improved one-way split-merge segmentation methods.

如图6所示,lj(i)表示第i条射线穿过第j割区域的长度;T(i)表示投影数据。这样,在步骤S13,根据步骤S11中获得的双能投影采样信息计算出第i组投影数据所对应的射束经过第j块区域的平面长度lj(i)(如果是螺旋轨迹应计算第i组投影数据所对应的射束经过第j块区域的空间长度lj(i))。As shown in Figure 6, l j (i) represents the length of the i-th ray passing through the j-th cut area; T(i) represents the projection data. In this way, in step S13, according to the dual-energy projection sampling information obtained in step S11, calculate the plane length l j (i) of the beam corresponding to the i-th group of projection data passing through the j-th block area (if it is a spiral trajectory, the first The spatial length l j (i)) of the beam corresponding to the i group of projection data passing through the jth block area.

在步骤S14,主控制及数据处理计算机14利用双能前处理双效应分解重建方法建立方程组A=∑a·l,其中a表示康普顿系数和光电系数。令在第二周扫描视角下共获得了M组DR双能透射数据,将CT图像共分割成N块标记区域并用TH(i)和TL(i)表示第i组高、低能投影数据。通过公式(1)对线性衰减系数进行双效应分解:In step S14, the main control and data processing computer 14 establishes a system of equations A=∑a·l by using the dual-energy pre-processing double-effect decomposition and reconstruction method, where a represents the Compton coefficient and the photoelectric coefficient. Let a total of M sets of DR dual-energy transmission data be obtained from the scanning angle of the second week, and the CT image is divided into N blocks of marked areas, and T H (i) and T L (i) are used to represent the i-th group of high-energy and low-energy projection data . The double-effect decomposition of the linear attenuation coefficient is carried out by formula (1):

μ(E)=a1fph(E)+a2fKN(E)……(1)μ(E)=a 1 f ph (E)+a 2 f KN (E)...(1)

进而,可以将高、低能透明度用下面的公式(2)和(3)来表示:Furthermore, the high and low energy transparency can be expressed by the following formulas (2) and (3):

TT Hh == ∫∫ EE. Hh DD. Hh (( EE. )) expexp (( -- ∫∫ μμ (( EE. )) dldl )) dEE == ∫∫ EE. Hh DD. Hh (( EE. )) expexp (( -- AA 11 ff phpH (( EE. )) -- AA 22 ff KNKN (( EE. )) )) dEE ·&Center Dot; ·&Center Dot; ·&Center Dot; ·&Center Dot; ·&Center Dot; ·&Center Dot; (( 22 ))

TT LL == ∫∫ EE. LL DD. LL (( EE. )) expexp (( -- ∫∫ μμ (( EE. )) dldl )) dEE == ∫∫ EE. LL DD. LL (( EE. )) expexp (( -- AA 11 ff phpH (( EE. )) -- AA 22 ff KNKN (( EE. )) )) dEE ·&Center Dot; ·· ·&Center Dot; ·&Center Dot; ·&Center Dot; ·&Center Dot; (( 22 ))

其中fph(E)表示光电截面对射线能量E的依赖关系;fKN(E)刻画康普顿界截面和光子能量的关系;DH(E)表示高能探测器测量到的X光机射线能谱;DL(E)表示低能探测器测量到的X光机射线能谱;a1表示光电系数;a2表示康普顿系数;A1表示光电系数积分;A2表示康普顿系数积分,即如下公式(4)所示:Among them, f ph (E) represents the dependence of the photoelectric cross-section on the ray energy E; f KN (E) describes the relationship between the Compton boundary cross-section and the photon energy; D H (E) represents the X-ray machine ray measured by the high-energy detector Energy spectrum; D L (E) represents the X-ray energy spectrum measured by the low-energy detector; a 1 represents the photoelectric coefficient; a 2 represents the Compton coefficient; A 1 represents the integral of the photoelectric coefficient; A 2 represents the Compton coefficient Integral, as shown in the following formula (4):

A=∫adl……(4)A=∫adl...(4)

从而构建线性方程组:Thus constructing the system of linear equations:

A=∑a·l    ……(5)A=∑a·l……(5)

具体而言,用下面的方程组(6)和(7)对a1,a2进行求解:Specifically, solve a 1 and a 2 with the following equations (6) and (7):

ll 11 (( 11 )) ll 22 (( 11 )) .. .. ll NN (( 11 )) ll 11 (( 22 )) .. .. .. .. .. .. .. .. ll 11 (( Mm )) .. .. .. ll NN (( Mm )) aa 1,11,1 aa 1,21,2 .. .. aa 11 ,, NN == AA 11 (( 11 )) AA 11 (( 22 )) .. .. AA 11 (( Mm )) ·· ·· ·· ·· ·· ·· (( 66 ))

ll 11 (( 11 )) ll 22 (( 11 )) .. .. ll NN (( 11 )) ll 11 (( 22 )) .. .. .. .. .. .. .. .. ll 11 (( Mm )) .. .. .. ll NN (( Mm )) aa 22 ,, 11 aa 2,22,2 .. .. aa 22 ,, NN == AA 22 (( 11 )) AA 22 (( 22 )) .. .. AA 22 (( Mm )) ·· ·&Center Dot; ·· ·· ·· ·· (( 77 ))

在步骤S15利用最小二乘的方法求解步骤S14中构建的方程组,计算得到a,即光电系数X1和康普顿系数a2。然后,在步骤S16,通过公式(8)和(9)求原子序数和电子密度:In step S15, the least square method is used to solve the equation system constructed in step S14, and a is calculated, namely, the photoelectric coefficient X 1 and the Compton coefficient a 2 . Then, in step S16, calculate atomic number and electron density by formula (8) and (9):

aa 11 ≈≈ KK 11 NN AA 22 ρZρZ nno (( nno ≈≈ 33 )) ·&Center Dot; ·· ·· ·· ·· ·· (( 88 ))

aa 22 ≈≈ KK 22 NN AA 22 ρρ ·· ·· ·&Center Dot; ·· ·· ·&Center Dot; (( 99 ))

其中Z表示原子序数,ρ表示电子密度,NA表示阿伏加德罗常数,K1为常数即包含其它所有与射线能量和物质参数无关的系数,K2为常数即包含其它所有与射线能量和物质参数无关的系数。这样即可求出分块区域物质的原子序数和电子密度,从而有效的对物质进行识别。例如,基于查找表方法或者分类曲线的方法利用原子序数来对被检查物体的各个区域中的物质进行识别。根据另一实施方式,可以同时使用计算的原子序数和电子密度来对物质进行识别。Among them, Z represents atomic number, ρ represents electron density, N A represents Avogadro’s constant, K 1 is a constant that includes all other coefficients that have nothing to do with ray energy and material parameters, and K 2 is a constant that includes all other coefficients that are not related to ray energy Coefficients independent of material parameters. In this way, the atomic number and electron density of the substance in the block area can be obtained, so as to effectively identify the substance. For example, methods based on look-up tables or classification curves use atomic numbers to identify substances in various regions of the inspected object. According to another embodiment, the calculated atomic number and electron density can be used simultaneously to identify the substance.

如上所述,本发明实施例的基于直线轨迹的双能欠采样物质识别成像系统采用基于CT图像的双能投影欠采样物质识别方法,利用直线轨迹扫描,并仅使用少量几个的双能探测器即可实现对被检测物体进行物质识别。由于利用直线轨迹,不需要旋转,因此机械设计简单,检查通关率高;由于仅使用少量几个的双能探测器,系统成本低。As mentioned above, the dual-energy undersampling material identification imaging system based on straight-line trajectory in the embodiment of the present invention adopts the dual-energy projection under-sampling material identification method based on CT images, uses straight-line trajectory scanning, and uses only a few dual-energy detection The device can realize the material identification of the detected object. Since the linear trajectory is used and no rotation is required, the mechanical design is simple and the inspection pass rate is high; since only a few dual-energy detectors are used, the system cost is low.

上面的描述仅用于实现本发明的实施方式,本领域的技术人员应该理解,在不脱离本发明的范围的任何修改或局部替换,均应该属于本发明的权利要求来限定的范围,因此,本发明的保护范围应该以权利要求书的保护范围为准。The above description is only used to realize the embodiment of the present invention, and those skilled in the art should understand that any modification or partial replacement that does not depart from the scope of the present invention should belong to the scope defined by the claims of the present invention. Therefore, The protection scope of the present invention should be based on the protection scope of the claims.

Claims (6)

1. the Dual-energy under-sampled matter identification method based on straight path scanning, comprising:
Inspected object is carried out to straight path CT scan, by ground floor detector array, obtain the first data for projection to rebuild the CT image of object to be detected, and obtain the second data for projection by the second layer detector array being arranged on after part ground floor detector array, wherein, ground floor detector array is low energy detector array, and second layer detector array is high energy array detector; Object to be detected between radiographic source and detector array along a direction rectilinear motion;
Combine the first data for projection and the second data for projection, to obtain the dual-energy under-sampling data under Partial angle;
According to dual-energy under-sampling data acquisition, by the method for tabling look-up, obtain photoelectric coefficient integrated value and Compton Coefficient Integrals value;
Deployment area dividing method carries out Region Segmentation and mark is carried out in the region of cutting apart the CT image of object to be detected according to the difference of attenuation coefficient or gray scale, and a plurality of regions after being cut apart and calculating dual intensity ray are through the length of regional;
Length according to dual intensity ray through regional, photoelectric coefficient integrated value and Compton Coefficient Integrals value, utilize dual intensity pre-treatment economic benefits and social benefits should decompose method for reconstructing and solve Compton coefficient and photoelectric coefficient;
Based on Compton coefficient and photoelectric coefficient, at least calculate the atomic number of material in the region of respectively cutting apart;
At least based on atomic number, the material of inspected object is identified.
2. the method for claim 1, utilizes look-up table to determine the material in each cut zone of inspected object.
3. the method for claim 1, utilizes the classification curve creating in advance to determine the material in each cut zone of inspected object.
4. the dual-energy under-sampling substance recognition system based on straight path scanning, comprising:
Ray generating device, generation will penetrate the beam of inspected object;
Mechanical drive control section, comprises gearing and control system, for realizing the straight path scanning to inspected object;
Data acquisition subsystem, comprises detector array, for obtaining the transmission projection data of the beam that penetrates inspected object;
Main control and data handling machine, control above-mentioned ray generating device, mechanical drive control section and data acquisition subsystem, inspected object is carried out to straight path CT scan, by ground floor detector array, obtain the first data for projection to rebuild the CT image of object to be detected, and obtain the second data for projection by the second layer detector array being arranged on after part ground floor detector array, wherein, ground floor detector array is low energy detector array, and second layer detector array is high energy array detector; Object to be detected between radiographic source and detector array along a direction rectilinear motion;
Wherein said main control and data handling machine comprise:
Combine the first data for projection and the second data for projection, to obtain the device of the dual-energy under-sampling data under Partial angle;
According to dual-energy under-sampling data acquisition, by the method for tabling look-up, obtain the device of photoelectric coefficient integrated value and Compton Coefficient Integrals value;
Deployment area dividing method carries out Region Segmentation and mark is carried out in the region of cutting apart the CT image of object to be detected according to the difference of attenuation coefficient or gray scale, and a plurality of regions after being cut apart and calculating dual intensity ray are through the device of the length of regional;
Length according to dual intensity ray through regional, photoelectric coefficient integrated value and Compton Coefficient Integrals value, utilize dual intensity pre-treatment economic benefits and social benefits should decompose the device that method for reconstructing solves Compton coefficient and photoelectric coefficient;
Based on Compton coefficient and photoelectric coefficient, at least calculate the device of the atomic number of material in the region of respectively cutting apart;
The device of at least based on atomic number, the material of inspected object being identified.
5. system as claimed in claim 4, wherein utilizes look-up table to determine the material in each cut zone of inspected object.
6. system as claimed in claim 4, utilizes the classification curve creating in advance to determine the material in each cut zone of inspected object.
CN201110391895.2A 2009-05-27 2009-05-27 Dual-energy under-sampling substance identification system and method based on linear track scanning Active CN102590234B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201110391895.2A CN102590234B (en) 2009-05-27 2009-05-27 Dual-energy under-sampling substance identification system and method based on linear track scanning

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201110391895.2A CN102590234B (en) 2009-05-27 2009-05-27 Dual-energy under-sampling substance identification system and method based on linear track scanning

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN2009100859230A Division CN101900694B (en) 2009-05-27 2009-05-27 System and method for dual-energy undersampling substance identification based on linear trajectory scanning

Publications (2)

Publication Number Publication Date
CN102590234A CN102590234A (en) 2012-07-18
CN102590234B true CN102590234B (en) 2014-04-09

Family

ID=46479173

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201110391895.2A Active CN102590234B (en) 2009-05-27 2009-05-27 Dual-energy under-sampling substance identification system and method based on linear track scanning

Country Status (1)

Country Link
CN (1) CN102590234B (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106353828B (en) * 2015-07-22 2018-09-21 清华大学 The method and apparatus that checked property body weight is estimated in safe examination system
CN106932414A (en) * 2015-12-29 2017-07-07 同方威视技术股份有限公司 Inspection and quarantine inspection system and its method
CN105527654B (en) 2015-12-29 2019-05-03 中检科威(北京)科技有限公司 An inspection device for inspection and quarantine
CN107356615B (en) * 2016-05-10 2020-01-21 清华大学 Method and system for dual-energy X-ray CT
CN109632844B (en) * 2019-01-09 2021-08-17 中国人民解放军战略支援部队信息工程大学 Dual-energy CT imaging system and method based on linear scanning trajectory
CN111157556B (en) * 2019-12-20 2020-12-25 北京航星机器制造有限公司 Low-energy sparse CT detector, CT detection system and detection method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999008132A1 (en) * 1997-08-06 1999-02-18 Eg & G Astrophysics Side-by-side detector array for dual energy x-ray imaging system
CN2860349Y (en) * 2005-09-16 2007-01-24 北京大学 Processing System for 3D Cone Beam CT Image Reconstruction
CN1971620A (en) * 2005-11-21 2007-05-30 清华大学 Image rebuilding system and method using straight track scanning
CN201021923Y (en) * 2007-01-24 2008-02-13 清华大学 Dual-source 3D Stereo Imaging System
CN101387610A (en) * 2008-10-14 2009-03-18 重庆大学 Dual-source dual-energy linear security inspection CT device and its detection method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7606347B2 (en) * 2004-09-13 2009-10-20 General Electric Company Photon counting x-ray detector with overrange logic control

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999008132A1 (en) * 1997-08-06 1999-02-18 Eg & G Astrophysics Side-by-side detector array for dual energy x-ray imaging system
CN2860349Y (en) * 2005-09-16 2007-01-24 北京大学 Processing System for 3D Cone Beam CT Image Reconstruction
CN1971620A (en) * 2005-11-21 2007-05-30 清华大学 Image rebuilding system and method using straight track scanning
CN201021923Y (en) * 2007-01-24 2008-02-13 清华大学 Dual-source 3D Stereo Imaging System
CN101387610A (en) * 2008-10-14 2009-03-18 重庆大学 Dual-source dual-energy linear security inspection CT device and its detection method

Non-Patent Citations (8)

* Cited by examiner, † Cited by third party
Title
A J Coleman ,et al.A beam-hardening correction using dual-energy computed tomography.《Phys.Med.Biol.》.1985,第30卷(第11期),全文.
A J Coleman,et al.A beam-hardening correction using dual-energy computed tomography.《Phys.Med.Biol.》.1985,第30卷(第11期),全文. *
A volumetric Object Dectection Framework with Dual-energy CT;Wenyuan Bi,et al;《Nuclear Science Symposium Conference Record》;20081231;全文 *
Wenyuan Bi,et al.A volumetric Object Dectection Framework with Dual-energy CT.《Nuclear Science Symposium Conference Record》.2008,全文.
基于单程分裂与归并图像分割的集装箱号识别;王志明等;《中国图象图形学报》;20070331;第12卷(第3期);全文 *
张丽等.直线轨迹扫描断层成像中的图像重建与恢复方法.《中国体视觉与图像分析》.2008,第13卷(第4期),全文.
王志明等.基于单程分裂与归并图像分割的集装箱号识别.《中国图象图形学报》.2007,第12卷(第3期),全文.
直线轨迹扫描断层成像中的图像重建与恢复方法;张丽等;《中国体视觉与图像分析》;20080430;第13卷(第4期);全文 *

Also Published As

Publication number Publication date
CN102590234A (en) 2012-07-18

Similar Documents

Publication Publication Date Title
CN101900694B (en) System and method for dual-energy undersampling substance identification based on linear trajectory scanning
CN101900695B (en) Pseudo-dual-energy under-sampling substance identification system and method
CN101900696B (en) Dual-energy undersampling substance identification method and system
AU2007202058B2 (en) Cargo Security Inspection System
CN101561405B (en) A linear trajectory scanning imaging system and method
CN105806856B (en) Dual Energy Ray Imaging Method and System
KR101751196B1 (en) Ct system and detection device for ct system
CN102590234B (en) Dual-energy under-sampling substance identification system and method based on linear track scanning
CN201242531Y (en) Scanning imagery system for straight-line track
EP1875276B1 (en) Energy distribution reconstruction in ct
CN105759318A (en) Safety detection apparatus and detection method thereof
CN105807329A (en) X-ray detection device and method for identifying hazardous liquid in parcels
CN201666881U (en) Pseudo-dual energy undersampling substance identification system
CN102162798B (en) Method and equipment for inspecting liquid article
JP5177633B2 (en) Material identification inspection apparatus and method
CN102435621B (en) Dual-energy under-sampled matter identification method and system
WO2025098079A1 (en) Ct scanning imaging system and method based on single linear scanning channel
CN102519989B (en) Method and system for recognizing pseudo-dual-energy under-sampling substance
US20140169520A1 (en) Systems and methods for dual energy imaging
US20090232277A1 (en) System and method for inspection of items of interest in objects
CN201043954Y (en) A Cargo Security Inspection System Based on Multi-segment Linear Trajectory Imaging
CN102095666A (en) Liquid article inspection method and equipment
HK1150074A (en) Dual-energy under-sampling material discriminating method and system
Arunachalam et al. Tomographic imaging for border security applications
HK1115444B (en) Multi-segment linear trace imaging cargo safety inspection system

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant