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CN102566102A - Method for repairing line defects of liquid crystal panels - Google Patents

Method for repairing line defects of liquid crystal panels Download PDF

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Publication number
CN102566102A
CN102566102A CN2012100492026A CN201210049202A CN102566102A CN 102566102 A CN102566102 A CN 102566102A CN 2012100492026 A CN2012100492026 A CN 2012100492026A CN 201210049202 A CN201210049202 A CN 201210049202A CN 102566102 A CN102566102 A CN 102566102A
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line
signals
short circuit
liquid crystal
data line
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CN102566102B (en
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周刘飞
洪孟锋
许建中
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Nanjing CEC Panda LCD Technology Co Ltd
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Nanjing CEC Panda LCD Technology Co Ltd
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Abstract

The invention discloses a method for repairing line defects of liquid crystal panels. A data line of an array substrate side of a liquid crystal panel is stacked with a common line, signals of the data line are direct-current black screen voltage signals during light-on detection of the liquid crystal panel, signals of a scanning line are high-level pulse voltage signals which are sequentially opened, at least parts of signals of the common line are low-level pulse voltage signals when the signals of the scanning line are high-level signals, the signals of the common line are high-level voltage signals when the signals of the scanning line are low-level signals, bright trace is positioned at locations around short circuit of the data line and the common line, and is the brightest at a short circuit location, and the brightest location is the short circuit location of the data line and the common line, and the signals of the common line at the short circuit location are disconnected. The short circuit location of the data line and the common line can be accurately determined by the aid of the method.

Description

一种液晶面板的线缺陷修复方法A method for repairing line defects of liquid crystal panels

技术领域 technical field

本发明涉及一种液晶面板的线缺陷修复方法。The invention relates to a method for repairing line defects of a liquid crystal panel.

背景技术 Background technique

为降低LCD(液晶显示器)的背光成本,液晶面板的阵列基板侧的数据线与公共线重叠的设计成为像素高开口率的主流设计,但这样的设计增加了数据线与公共线短路的风险,且两者短路的精确位置很难确定。In order to reduce the backlight cost of LCD (Liquid Crystal Display), the overlapping design of the data line and the common line on the array substrate side of the liquid crystal panel has become the mainstream design for high pixel aperture ratio, but this design increases the risk of short circuit between the data line and the common line. And the precise location of the short circuit between the two is difficult to determine.

发明内容 Contents of the invention

发明目的:针对上述现有技术存在的问题和不足,本发明的目的是提供一种液晶面板的线缺陷修复方法,能够精确确定数据线与公共线短路的位置。Purpose of the invention: In view of the problems and deficiencies in the above-mentioned prior art, the purpose of the present invention is to provide a method for repairing line defects of liquid crystal panels, which can accurately determine the position of the short circuit between the data line and the common line.

技术方案:为实现上述发明目的,本发明采用的技术方案为一种液晶面板的线缺陷修复方法,液晶面板的阵列基板侧的数据线与公共线重叠,在所述液晶面板点灯检测的过程中,数据线信号为直流黑画面电压,扫描线信号为依次打开的高电平脉冲电压,公共线信号在扫描线信号为高电平的至少部分时间为低电平脉冲电压,公共线信号在扫描线信号为低电平的时间为高电平电压;在数据线与公共线短路的位置出现亮线,且短路的位置为最亮,则该最亮处即为数据线与公共线短路的位置;最后断开短路处的公共线信号。Technical solution: In order to achieve the purpose of the above invention, the technical solution adopted in the present invention is a method for repairing line defects of a liquid crystal panel. The data line on the array substrate side of the liquid crystal panel overlaps with the common line. During the lighting detection process of the liquid crystal panel , the data line signal is a DC black screen voltage, the scan line signal is a high-level pulse voltage that is turned on sequentially, the common line signal is a low-level pulse voltage at least part of the time when the scan line signal is high, and the common line signal is When the line signal is low level, it is a high level voltage; a bright line appears at the position where the data line and the common line are short-circuited, and the short-circuit position is the brightest, then the brightest position is the position where the data line and the common line are short-circuited ;Finally disconnect the common line signal at the short circuit.

所述公共线的横向部分与纵向部分的相交处,位于相应的数据线的两侧可设有凹槽。Grooves may be provided on both sides of the corresponding data line at intersections of the transverse portion and the longitudinal portion of the common line.

有益效果:本发明利用特殊的检测信号,精确确定阵列基板侧的数据线与公共线的短路位置,并能在不引起其它故障的前提下进行修复。Beneficial effects: the present invention uses a special detection signal to accurately determine the short-circuit position between the data line and the common line on the array substrate side, and can repair it without causing other faults.

附图说明 Description of drawings

图1为现有高开口设计的像素平面示意图;Figure 1 is a schematic diagram of a pixel plane of an existing high-aperture design;

图2为图1中A-A’的剖视示意图;Fig. 2 is the sectional schematic diagram of A-A' among Fig. 1;

图3为本发明的信号时序示意图;Fig. 3 is a schematic diagram of signal timing of the present invention;

图4为本发明的检测结果示意图;Fig. 4 is the schematic diagram of detection result of the present invention;

图5为本发明中像素的局部平面结构示意图。FIG. 5 is a schematic diagram of a local planar structure of a pixel in the present invention.

具体实施方式 Detailed ways

下面结合附图和具体实施例,进一步阐明本发明,应理解这些实施例仅用于说明本发明而不用于限制本发明的范围,在阅读了本发明之后,本领域技术人员对本发明的各种等价形式的修改均落于本申请所附权利要求所限定的范围。Below in conjunction with accompanying drawing and specific embodiment, further illustrate the present invention, should be understood that these embodiments are only for illustrating the present invention and are not intended to limit the scope of the present invention, after having read the present invention, those skilled in the art will understand various aspects of the present invention Modifications in equivalent forms all fall within the scope defined by the appended claims of this application.

如图1所示,数据线与公共线完全重叠,可降低彩膜基板(Color Filter,CF)侧黑色矩阵(Black Matrix,BM)的宽度,以提高开口率。如图2所示,由下往上依次为公共线、第一绝缘层、数据线、第二绝缘层和像素电极,从图2中可以看出,由于数据线与公共线完全重叠,只要绝缘层稍有破裂,数据线与公共线即可能发生短路,风险增加,且短路的位置很难确定。As shown in Figure 1, the data line and the common line completely overlap, which can reduce the width of the black matrix (Black Matrix, BM) on the side of the color filter substrate (Color Filter, CF) to increase the aperture ratio. As shown in Figure 2, from bottom to top are the common line, the first insulating layer, the data line, the second insulating layer and the pixel electrode. It can be seen from Figure 2 that since the data line and the common line completely If the layer is slightly broken, the data line and the common line may be short-circuited, and the risk increases, and the location of the short-circuit is difficult to determine.

如图3所示,一个帧(Frame)分为ON/OFF期。在ON期扫描线信号(即Gate信号,图中为G1、G2、G3、……、G12)依次打开,分为12个区域(也可以分为其它数量的区域),相邻的两个扫描线脉冲(Gate Pulse)间设置输出使能(OE,Output Enable)时间;另外,CF侧的公共电极电压Vcom=0V;提供给数据线的源极(Source)电压为5V,输出黑画面;阵列基板侧的公共线电压Cs为5V/0V方波,且公共线的脉冲时序与扫描线的脉冲时序相对应,具体为,每根扫描线的高电平脉冲电压的持续时间为16us,当扫描线为高电平时,公共线在第9us从高电平拉到低电平,然后,在扫描线由高电平变为低电平时,公共线同步拉到高电平。即本实施例中,公共线低电平脉冲的时间为扫描线高电平脉冲时间的一半,实际上公共线低电平脉冲的时间具体为扫描线高电平脉冲时间的几分之一,这里并不作严格限定,按实际显示效果调节。As shown in FIG. 3 , one frame (Frame) is divided into ON/OFF periods. In the ON period, the scan line signals (that is, Gate signals, G1, G2, G3, ..., G12 in the figure) are turned on sequentially, and are divided into 12 areas (can also be divided into other number of areas), and two adjacent scan lines Set the output enable (OE, Output Enable) time between line pulses (Gate Pulse); in addition, the common electrode voltage Vcom on the CF side = 0V; the source (Source) voltage provided to the data line is 5V, and a black screen is output; the array The common line voltage Cs on the substrate side is a 5V/0V square wave, and the pulse timing of the common line corresponds to the pulse timing of the scanning lines. Specifically, the duration of the high-level pulse voltage of each scanning line is 16us. When scanning When the line is at high level, the common line is pulled from high level to low level at 9us, and then, when the scanning line changes from high level to low level, the common line is pulled to high level synchronously. That is, in this embodiment, the time of the low-level pulse of the common line is half of the time of the high-level pulse of the scanning line. In fact, the time of the low-level pulse of the common line is specifically a fraction of the time of the high-level pulse of the scanning line. There is no strict limitation here, and it is adjusted according to the actual display effect.

在进行如前一段所述的点灯检测过程中,如图4所示,正常的液晶面板显示黑画面,但数据线与公共线短路的位置会出现亮线,且短路位置为最亮,往上下两侧逐渐变暗,可用人眼观察哪个点最亮,也可在液晶面板点亮的情况下,用显微镜查看,判断是哪个点最亮,最亮的点即为短路位置。分析原因如下:在数据线与公共线短路(S-Cs short)位置的上方区域,由于Source电压为5V,且受Cs电压影响小(因为数据线为稳定的直流电压,不易被Cs脉冲电压拉动,且Cs电压绝大部分时间与Source电压同样为5V),所以为黑画面;在S-Cs short位置的下方区域,Source电压受Cs影响也不大,所以也接近于黑画面;在S-Csshort位置的区域,Source电压受Cs电压影响会被拉到白画面,但由于Source存在电阻电容延迟,所以在short点的像素为最亮,离short点越远的像素越暗,呈渐进式,因此可判断最亮的那个像素点发生了S-Cs short。在知道了发生短路的数据线和公共线的具体位置,那么在修复时,用激光切断短路处位于数据线两侧的公共线,使得短路处的公共线本身没有信号(由于公共线的信号从公共线横向部分的两端输入(图中未示出),因此须切断数据线两侧的公共线)即可,如图5所示,公共线的横向部分与纵向部分的相交处,位于相应的数据线的两侧设有凹槽,这样在用激光切断的时候,就不会切到像素电极,避免了因修复公共线与数据线的短路而导致公共线与像素电极短路的问题(图5中虚线所示即为激光切断的位置)。During the lighting detection process as described in the previous paragraph, as shown in Figure 4, the normal LCD panel displays a black screen, but bright lines appear at the position where the data line and the common line are short-circuited, and the short-circuit position is the brightest, up and down The two sides gradually become darker. You can observe which point is the brightest with human eyes, or use a microscope to judge which point is the brightest when the LCD panel is lit. The brightest point is the short circuit position. The reason for the analysis is as follows: In the upper area of the short circuit between the data line and the common line (S-Cs short), since the Source voltage is 5V, and is less affected by the Cs voltage (because the data line is a stable DC voltage, it is not easy to be pulled by the Cs pulse voltage , and the Cs voltage is the same as the Source voltage at 5V most of the time), so it is a black screen; in the area below the S-Cs short position, the Source voltage is not greatly affected by Cs, so it is also close to the black screen; In the area of the Csshort position, the Source voltage is affected by the Cs voltage and will be pulled to a white screen. However, due to the resistance and capacitance delay of the Source, the pixels at the short point are the brightest, and the pixels farther away from the short point are darker, showing a gradual pattern. Therefore, it can be judged that S-Cs short occurred in the brightest pixel. After knowing the specific location of the data line and the common line where the short circuit occurs, then when repairing, use a laser to cut off the common line on both sides of the data line at the short circuit, so that the common line at the short circuit itself has no signal (because the signal of the common line comes from The two ends of the horizontal part of the common line are input (not shown in the figure), so the common lines on both sides of the data line must be cut off), as shown in Figure 5, the intersection of the horizontal part and the vertical part of the common line is located at the corresponding There are grooves on both sides of the data line, so that when cutting with a laser, the pixel electrode will not be cut, and the problem of short circuit between the common line and the pixel electrode caused by repairing the short circuit between the common line and the data line is avoided (Fig. The dotted line in 5 is the laser cutting position).

Claims (2)

1. the line defect restorative procedure of a liquid crystal panel; It is characterized in that: the data line and the concentric line of the array base palte side of liquid crystal panel are overlapping; In said liquid crystal panel was lit a lamp the process that detects, data line signal was the black picture voltage of direct current, the high level pulse voltage of scanning-line signal for opening successively; The concentric line signal is that the part-time at least of high level is a low level pulse voltage at scanning-line signal, and the concentric line signal is that low level time is a high level voltage at scanning-line signal; Bright line appears in the position in data line and concentric line short circuit, and the position of short circuit is for the brightest, and then this high light is the position of data line and concentric line short circuit; Break off the concentric line signal of short circuit place at last.
2. according to the line defect restorative procedure of the said a kind of liquid crystal panel of claim 1, it is characterized in that: the lateral part of said concentric line and the intersection of longitudinal component, the both sides that are positioned at corresponding data line are provided with groove.
CN201210049202.6A 2012-02-29 2012-02-29 Method for repairing line defects of liquid crystal panels Expired - Fee Related CN102566102B (en)

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Cited By (5)

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CN103617772A (en) * 2013-11-12 2014-03-05 华映视讯(吴江)有限公司 Display panel and testing method thereof
CN104183206A (en) * 2014-09-10 2014-12-03 南京中电熊猫液晶显示科技有限公司 Display panel detecting method
CN107610663A (en) * 2017-09-25 2018-01-19 武汉华星光电技术有限公司 The virtual circuit and drive circuit of panel display apparatus
CN108469694A (en) * 2018-02-07 2018-08-31 深圳市华星光电半导体显示技术有限公司 A method of positioning TFT LCD display panels generate horizontal brightness bad position
CN109493769A (en) * 2018-11-12 2019-03-19 成都中电熊猫显示科技有限公司 Test method, device and storage medium

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CN201097400Y (en) * 2007-04-28 2008-08-06 上海广电光电子有限公司 Thin film transistor array base plate
CN101286468A (en) * 2007-04-12 2008-10-15 索尼株式会社 Substrate manufacturing method, substrate manufacturing system, and display manufacturing method
CN101324727B (en) * 2007-06-13 2011-12-07 群康科技(深圳)有限公司 LCD and drive method thereof

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Publication number Priority date Publication date Assignee Title
CN1987571A (en) * 2005-12-19 2007-06-27 统宝光电股份有限公司 Display unit, display panel, display device, electronic device, and repair method
CN101286468A (en) * 2007-04-12 2008-10-15 索尼株式会社 Substrate manufacturing method, substrate manufacturing system, and display manufacturing method
CN201097400Y (en) * 2007-04-28 2008-08-06 上海广电光电子有限公司 Thin film transistor array base plate
CN101324727B (en) * 2007-06-13 2011-12-07 群康科技(深圳)有限公司 LCD and drive method thereof

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103617772A (en) * 2013-11-12 2014-03-05 华映视讯(吴江)有限公司 Display panel and testing method thereof
CN103617772B (en) * 2013-11-12 2016-02-03 华映视讯(吴江)有限公司 Display panel and method of testing thereof
CN104183206A (en) * 2014-09-10 2014-12-03 南京中电熊猫液晶显示科技有限公司 Display panel detecting method
CN107610663A (en) * 2017-09-25 2018-01-19 武汉华星光电技术有限公司 The virtual circuit and drive circuit of panel display apparatus
CN108469694A (en) * 2018-02-07 2018-08-31 深圳市华星光电半导体显示技术有限公司 A method of positioning TFT LCD display panels generate horizontal brightness bad position
CN108469694B (en) * 2018-02-07 2020-12-25 深圳市华星光电半导体显示技术有限公司 Method for positioning poor position of horizontal bright line generated by TFT LCD display panel
CN109493769A (en) * 2018-11-12 2019-03-19 成都中电熊猫显示科技有限公司 Test method, device and storage medium
CN109493769B (en) * 2018-11-12 2022-03-01 成都中电熊猫显示科技有限公司 Test method, device and storage medium

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