CN101413986B - Method for testing reliability of smart card - Google Patents
Method for testing reliability of smart card Download PDFInfo
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- CN101413986B CN101413986B CN2007101636584A CN200710163658A CN101413986B CN 101413986 B CN101413986 B CN 101413986B CN 2007101636584 A CN2007101636584 A CN 2007101636584A CN 200710163658 A CN200710163658 A CN 200710163658A CN 101413986 B CN101413986 B CN 101413986B
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- 238000012360 testing method Methods 0.000 title claims abstract description 85
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Abstract
The invention provides a method for testing reliability of smart cards by aiming at the phenomenon of abnormal data loss or functional failure during production, manufacturing and application of the smart cards. The method comprises the following testing procedures: (1) generating a test card; (2) testing the card with an accelerated ageing testing method; and (3) checking the function of the test card after the test is finished, and checking the data stored in a memory, if the function of the test card fails or the data in the memory changes, the test fails, and if the function is normal and the data in the memory does not change, then the test is successful. The testing method of the smart cards can be used for strictly checking the reliability of the smart cards, find in advance the problem of yield decrease during the manufacturing process caused by the design defect of a chip system, and overcome the defects that the data of the smart cards are easily lost in the service environment and the like.
Description
Technical field
The present invention relates to a kind of method of testing reliability of smart card.
Background technology
Along with the continuous development of computer software technology and integrated circuit, the application of smart card more and more widely, bank card from the personal mobile phone SIM card to financial circles and authentication, smart card is being brought into play important effect.In the application of smart card, particularly financial circles are more and more higher with the requirement of stability to the confidentiality of its data, while is along with the development of semiconductor fine process technology, increasing emerging manufacturing technology and device application are in the intelligent card chip system, and therefore stability and the reliability testing to smart card system become a very important job.
Existing measuring technology and method, mostly be to power in the intelligent card chip system to test after stable, such as test of memory data retentivity and erasing and writing life test, but in manufacture process test and on-the-spot use, the environment more complicated of smart card work.Because existing method of testing can not cover the non-steady state of smart card working environment, can not find to consider that because of the stability of chip system or to the safeguard procedures of abnormal conditions the card that does not comprehensively cause lost efficacy, but the operation lack of standardization in the test of actual manufacture process or the user's use causes the smart card rate that manufactures a finished product to reduce or the problem of the interior loss of data of storer happens occasionally.
Summary of the invention
Not enough and actual test at above-mentioned existing measuring technology needs, and the present invention proposes a kind of method of testing reliability of smart card, can improve the coverage rate of test, avoids product that potential quality problems take place owing to test is not enough.
In order to address the above problem, the present invention proposes a kind of method of testing of smart card, comprising:
(1) generates test card;
(2) by implementing ageing testing method card is tested.
(3) after test is finished, the electrical property of verification test card and function, and the data of preserving in the checksum memory, if the disabler of test card or memory data change, test crash then is if function is normal, and memory data is not rewritten, and then tests successfully.
As preferably, in order to enlarge test coverage to guarantee product reliability, according to method of testing disclosed in this invention smart card is carried out burn-in test, verifying smart be stuck in unusual on/disabler or data are rewritten the stability of verifying smart card performance and function in the process of electricity down.
As preferably; described step (1) is specially: choose electrical property and normally functioning scale; by read write line write data or according to file structure, data structure and the related software safeguard measure of the required smart card of user in the nonvolatile memory space of test scale; set up the card structure, generate test card.
As preferably, described step (2) is specially: smart card product and being connected from the connected mode that meets ISO7816 agreement regulation of card-reading apparatus are converted to off-gauge connected mode, and promptly signal pins such as VCC, RST, CLK, I/O and GND are connected with card-reading apparatus with random sequence.
As preferably, described step (2) is specially: make test card and card-reading apparatus carry out intermittent communication, be in when seeking the card state signal pin of plug card at card-reading apparatus always.In the process of above-mentioned test, five useful signal pins of smart card at random carry out off-gauge the contact with card-reading apparatus, thereby reach needed test purpose.
The smart card method of testing that the present invention proposes, make the more practical analog subscriber of test use scene and manufacture process, can find smart card in advance owing to the inefficacy in advance that the chip system integrity problem causes, avoid owing to the reduction of the not enough manufacture process yield rate that causes of test coverage and the appearance that data exception is lost problem.
Description of drawings
Fig. 1 is the preferred implementing procedure figure of method of testing of the smart card that proposes of the present invention.
Embodiment
The present invention is described in further detail below in conjunction with accompanying drawing.
The preferred implementing procedure figure of the present invention comprises following content as shown in the figure:
(1) generates test card;
(2) card is carried out the accelerated deterioration test;
(3) after test is finished, the electrical property of verification test card and function, and the data of preserving in the checksum memory, if the disabler of test card or memory data change, test crash then is if function is normal, and memory data is not rewritten, and then tests successfully.
As preferably; described step (1) is specially: choose electrical property and normally functioning scale; by read write line write data (for example full sexadecimal number " 55AA " is write in the zone except user program) or according to file structure, data structure and the related software safeguard measure of the required smart card of user in the nonvolatile memory space of test scale; set up the card structure, generate test card.For the ease of confirming that test card finishes whether data change in the burn-in test background storage space, by total data in the card-reading apparatus readout memory space, comprises the user program data, and backs up; Perhaps realize the exclusive or check function to memory data in user program, the memory data to test card before burn-in test carries out verification and writes down proof test value.
As preferably, accelerated deterioration in the described step (2) test for verifying smart is stuck in unusual on/disabler or memory data are rewritten in the electric down process, the stability of examination smartcard performance and function, enlarged test coverage like this to guarantee product reliability, avoided the phenomenon that data exception is lost occurring in the actual use that is stuck in the user through test.
As preferably, described step (2) is specially uses existing test card to communicate by letter with card-reading apparatus, and the connected mode of test card and card-reading apparatus is converted to the non-standard mode that does not meet the ISO7816 agreement.
As preferably, in the described step (2) smart card product and being connected from the mode that meets ISO7816 agreement regulation of card-reading apparatus are converted to off-gauge connected mode, be that signal pins such as VCC, RST, CLK, I/O and GND are connected with card-reading apparatus with random sequence, for example the signalling contacts such as VCC, RST, CLK, I/O and GND with card and card-reading apparatus are converted into the DIP form, signal pins such as the VCC of card and card-reading apparatus, RST, CLK, I/O and GND form parallel contact like this, have changed the contact mode of original ISO7816 agreement regulation.Thereby the plug card is when converting the signal pins such as VCC, RST, CLK, I/O and GND of DIP form to, and these pins contact with the signalling contact of card-reading apparatus with random sequence,
As preferably, make test card and card-reading apparatus carry out intermittent communication in the described step (2), card-reading apparatus is in when seeking the card state always, the signal pin of plug card.For example the contact of card and card-reading apparatus is converted to the DIP form, will directly plug the DIP socket.
As preferably, described step (3) is specially: after test is finished, and the integrality of the electrical property of verification test card, function and memory data.At first test card is resetted, check whether the reset answer of card is correct by card-reading apparatus; All data of readout memory then compare with backed up data before the test, if test card reset answer mistake or memory data change, and test crash then; If the test card reset answer is correct, and memory data integrity is good, then tests successfully.
The method of the testing reliability of smart card that provides in according to the present invention, can strictly examine reliability of smart card, can find the problem that product reduces owing to the not enough manufacture process yield rate that causes of chip system design in advance, and the data that overcome smart card in environment for use such as easily lose at defective.
For a person skilled in the art, under the situation that does not break away from the spirit and scope of the present invention, can also make various conversion or variation, so all technical schemes that are equal to also should belong to category of the present invention, all within protection scope of the present invention.
Claims (5)
1. the method for a testing reliability of smart card is characterized in that described method, may further comprise the steps:
(1) generates test card;
(2) by implementing ageing testing method card is tested;
(3) after test is finished, the electrical property of verification test card and function, and the data of preserving in the checksum memory, if the disabler of test card or memory data change, test crash then is if function is normal, and memory data is not rewritten, and then tests successfully.
2. the method for a kind of testing reliability of smart card according to claim 1, it is characterized in that test card is carried out burn-in test, verification test be stuck in unusual on/disabler or data are rewritten the stability of examination test card performance and function in the process of electricity down.
3. the method for a kind of testing reliability of smart card according to claim 1 and 2; it is characterized in that; described step (1) is specially: choose electrical property and normally functioning scale; by read write line write data or according to file structure, data structure and the related software safeguard measure of the required smart card of user in the nonvolatile memory space of test scale; set up the card structure, generate test card.
4. the method for a kind of testing reliability of smart card according to claim 1 and 2, it is characterized in that, described step (2) is specially: test card and being connected from the connected mode that meets ISO7816 agreement regulation of card-reading apparatus are converted to off-gauge connected mode, and promptly VCC, RST, CLK, I/O and GND signal pin are connected with card-reading apparatus with random sequence.
5. the method for a kind of testing reliability of smart card according to claim 1 and 2, it is characterized in that, described step (2) is specially: make test card and card-reading apparatus carry out intermittent communication, be in when seeking the card state at card-reading apparatus always, the signal pin of plug card.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101636584A CN101413986B (en) | 2007-10-17 | 2007-10-17 | Method for testing reliability of smart card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101636584A CN101413986B (en) | 2007-10-17 | 2007-10-17 | Method for testing reliability of smart card |
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| Publication Number | Publication Date |
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| CN101413986A CN101413986A (en) | 2009-04-22 |
| CN101413986B true CN101413986B (en) | 2010-08-18 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2007101636584A Expired - Fee Related CN101413986B (en) | 2007-10-17 | 2007-10-17 | Method for testing reliability of smart card |
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Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102394111B (en) * | 2011-08-03 | 2016-07-20 | 珠海天威技术开发有限公司 | The method of testing of consumable chip |
| CN102316192B (en) * | 2011-09-02 | 2014-01-01 | 广东欧珀移动通信有限公司 | An automatic verification method for the reliability of mobile phone memory |
| CN106294181B (en) * | 2016-08-24 | 2019-02-01 | 成都三零嘉微电子有限公司 | Smart card software service life test method |
| CN107025156B (en) * | 2017-04-14 | 2020-02-21 | 苏州浪潮智能科技有限公司 | A Computer Aging Method Based on Windows System |
| CN110716125A (en) * | 2019-10-08 | 2020-01-21 | 东信和平科技股份有限公司 | Service life testing method and system of smart card supporting CRC (Cyclic redundancy check) |
| CN110568346A (en) * | 2019-10-08 | 2019-12-13 | 东信和平科技股份有限公司 | Aging test method and system for smart card |
| CN114236187A (en) * | 2021-11-07 | 2022-03-25 | 上海仪电智能电子有限公司 | A mobile phone smart card module reliability test fixture device and method |
| CN117929973A (en) * | 2024-03-21 | 2024-04-26 | 星汉智能科技股份有限公司 | A smart card aging test method, device and storage medium |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6466007B1 (en) * | 2000-08-14 | 2002-10-15 | Teradyne, Inc. | Test system for smart card and indentification devices and the like |
| CN1793991A (en) * | 2005-10-31 | 2006-06-28 | 李博航 | Testing system of IC card interface electric characteristics |
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- 2007-10-17 CN CN2007101636584A patent/CN101413986B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6466007B1 (en) * | 2000-08-14 | 2002-10-15 | Teradyne, Inc. | Test system for smart card and indentification devices and the like |
| CN1793991A (en) * | 2005-10-31 | 2006-06-28 | 李博航 | Testing system of IC card interface electric characteristics |
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| CN101413986A (en) | 2009-04-22 |
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Address after: 102209 Beijing, Beiqijia, the future of science and technology in the south area of China electronic network security and information technology industry base C building, Patentee after: Beijing CEC Huada Electronic Design Co., Ltd. Address before: 100102 Beijing City, Chaoyang District Lize two Road No. 2, Wangjing science and Technology Park A block five layer Patentee before: Beijing CEC Huada Electronic Design Co., Ltd. |
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