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CN1097305C - 包含助焊剂的选择填充粘附膜 - Google Patents

包含助焊剂的选择填充粘附膜 Download PDF

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CN1097305C
CN1097305C CN98103715A CN98103715A CN1097305C CN 1097305 C CN1097305 C CN 1097305C CN 98103715 A CN98103715 A CN 98103715A CN 98103715 A CN98103715 A CN 98103715A CN 1097305 C CN1097305 C CN 1097305C
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flux
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CN1190253A (zh
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丹尼尔·R·噶莫塔
罗伯特·W·佩尼斯
辛谢·M·迈尔顿
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Abstract

选择填充热可固化粘附膜(10)包含用来把电子器件回流焊接到基板上的助焊剂。该粘附膜具有中心区域(12)及包围着该中心区域的边界区域(14)。该中心区域由填充了用于减小该粘结剂的热膨胀系数的惰性填料的粘结剂组成。该边界区域由未填充粘结剂及助焊剂组成。该粘附膜可以用于把倒装芯片半导体管芯(20)粘结固定到基板(21)。当管芯上的焊料突点(22)被回流时,该助焊剂的作用是清除基板或管芯的可焊接表面上存在的任何氧化物。

Description

包含助焊剂的选择填充粘附膜
技术领域
本发明一般涉及电子电路,特别涉及电气互连方法,尤其涉及用于倒装芯片安装的粘接剂。
背景技术
焊料突点互连的发展淘汰了昂贵、不可靠、低生产率的手工引线焊接。用于倒装芯片集成电路的焊料突点互连技术已经以各种形式应用约二十年了。早期的复杂程度低的集成电路一般都有外部触点,随着倒装芯片突点技术发展为全区域阵列,使互连密度显著增加。控制熔塌芯片连接(C4)利用淀积在管芯可浸润金属端上的焊料突点,以及利用基板上焊料可浸润端的匹配印痕(footprint)。面朝下的集成电路(倒装芯片)与基板对准,通过焊料回流同时完成所有的连接。在控制熔塌芯片连接法中,焊料突点淀积在集成电路的端子上,用可焊接的焊块的尺寸来限制集成电路上的焊料流动,该焊块是通过用化学气相淀积在集成电路上的玻璃钝化层的窗口形成的。
焊料合金的选择由熔点确定。当把集成电路焊接到氧化铝陶瓷基板上时,一直使用高铅焊料,由于该合金的熔点高,允许对该组合电路作进一步加工。连接到诸如环氧树脂或聚酰亚胺电路板的有机载体要求低熔点焊料合金。例如一直使用易熔的锡/铅焊料(熔点为183℃)或铅/铟焊料(熔点为220℃)等焊料。
为了把集成电路连接到基板,助焊剂,不论是无色透明的松香还是水溶性的助焊剂都被放到基板上作为临时粘接剂把集成电路保持到位。把该组件放到烘箱或炉子中进行回流热循环,使管芯连接到基板上。焊料的表面张力使管芯对准基板端子。回流后必须清除掉助焊剂残渣,避免腐蚀管芯。用氯化溶剂,氟化溶剂或烃类溶剂去除松香,或用含有表面活性剂的水去除水溶性的助焊剂。由于管芯非常靠近基板(一般0.02-0.1mm),因此从管芯下方去除助焊剂残渣的操作很困难,要用复杂的清除方法及消耗大量的时间。工业生产中为了完全清除所有助焊剂残渣作了大量努力。
清除掉助焊剂残渣后,对组件进行电测试,并进一步加上封装以提供环境保护。常用的方法是钝化,密封或加盖。在密封的情况中,在管芯的周围及管芯下面加上液态聚合物。通过在管芯周围淀积有机树脂使管芯与基板间很小的间隙被填充,毛细管现象的作用将树脂吸入间隙。随着管芯尺寸的增加,毛细管作用的限制效应到达临界点,会留下未被保护的管芯区域。由于环氧树脂对陶瓷基板优越的粘接性能,历史上一直选择使用的有机树脂有硅酮树脂和环氧树脂。环氧树脂的热膨胀系数远高于倒装芯片管芯的热膨胀系数,在基板,管芯和封装之间产生热应力。固化的环氧树脂很硬,不具备硅酮树脂的柔韧性,早期的器件失效来自于管芯中产生的裂纹。无机填料的使用也影响热导率及离子污染程度。改进的倒装芯片集成电路封装方法必须提供倒装芯片与基板间较好的兼容性。
发明内容
本发明就是为克服上述问题而提出的。
本发明提出了一种包含用于把电子器件回流焊接到基板上的助焊剂的选择填充热可固化粘附膜,包括:具有中心区域及边界区域的无载体的粘附膜,所述边界区域包围该中心区域;该边界区域由环氧树脂、助焊剂及加速剂组成的粘接剂组成;该中心区域由环氧树脂、助焊剂、加速剂及惰性填料组成的粘接剂组成,所述惰性填料把中心区域粘接剂的热膨胀系数减小到小于边界区域粘接剂的热膨胀系数的二分之一以下。
本发明还提出了一种电子元件组件,由以下组成:电子器件,在其外围部分有多个焊料突点;具有多个与焊料突点相应的电气端子的电路安装基板;该电子器件的焊料突点被焊接到电路安装基板的电气端子上,填充了二氧化硅的热固化粘接材料选择性地分布在该电子器件和该电路安装基板之间该电子器件的中心部分;以及包含助焊剂的未填充二氧化硅的固化的粘接材料选择性地分布在该电子器件与该电路安装基板之间的该电子器件的周边区域,所述未填充固化的粘接材料密封了焊料突点,其热膨胀系数大于填充了二氧化硅的热固化的粘接材料。
通过本发明,使清除助焊剂残渣的操作变得更加容易,避免了管芯的腐蚀,节省了时间并降低了成本。
附图说明
图1是根据本发明选择填充粘附膜的平面图。
图2是根据本发明具有选择填充粘附膜的安装在基板上的倒装芯片的截面图。
具体实施方式
选择填充热可固化粘附膜包含用于把电子器件回流焊接到基板的助焊剂。该粘附膜包括中心区域,内部区域及包围着中心区域的边界区域。中心区域由填充了隋性填料以降低粘接剂的热膨胀系数的粘接剂组成。边界区域由没填充的粘接剂及助焊剂组成。用该粘附膜可以把倒装芯片半导体管芯粘接固定到基板。当管芯上的焊料突点回流时,助焊剂的作用是除掉基板或管芯可焊接表面上存在的任何氧化物,因此不再需要其它助焊剂。粘附膜的中心区域位于没有焊料突点的管芯中心的下方,因此在把管芯焊接到基板后,起着稳定管芯的作用。这里使用的“电子器件”一词包括但不限于单片半导体集成电路管芯、位于或连接到互连基板上的一个或多个管芯组成的模块、或用倒装法或其它方法固定到另一个同样芯片或模块上的这种管芯或模块的组合。
尽管说明书以限定被认为是新颖的本发明的特点的权利要求书结束,然而相信通过对下面结合附图的描述会更好地理解本发明。现在参考图1,该平面图表示选择填充的热可固化粘附膜10。这里使用的“粘附膜”一词包括(但是不仅仅限于)实际基本是二维的无载体的粘附膜。一般来说,这些粘附膜由固态或很容易处理的半固态B级环氧树脂或其它类型的粘接剂组成。然而,“粘附膜”一词也可以包括形状不太稳定的其它粘附膜。即可流动的或凝胶状稠度的粘接剂。选择填充粘附膜10一般由二部分组成。由中心区域12组成的第一部分位于该粘附膜的内部。该中心区域12被边界区域14包围着,边界区域14一般形成环绕中心区域周界的边界。中心区域12中的粘接剂包含惰性填料,例如二氧化硅,用于减小粘接剂的热膨胀系数。也可以使用其它惰性填料,例如二氧化钛,氧化铝,氧化钡等,效果相同。用惰性填料填充中心区域12中的粘接剂的目的是减小粘接剂的热膨胀系数,故会实现这个目的的粘接剂与填料的结合,在本发明中得到应用。
与中心区域12不同的是,边界区域14的粘接剂中没有填充惰性填料,而是包含助焊剂。用于粘接材料的配方包含助焊剂及用于使粘接剂在室温下不会立即固化的固化剂。适宜的粘接剂材料的一个例子是从双酚(bisphenol)和表氯醇(epichlorihydrin)制成的环氧树脂。这种情况下一般使用的固化剂或硬化剂是胺(amine)或酐(anhydride)。也可以使用其它的二部分树脂系统,例如含有适当的固化剂的聚酯树脂。助焊剂的目的是为后续的焊接操作提供助焊作用。粘接材料中助焊剂的量的范围可以为0.1-16重量百分比,取决于具体助焊剂的活性、选择的焊料合金以及基板金属化系统。
根据本发明制成的可回流的、选择填充密封膜的一个例子是厚约0.075mm、由以下两个区域组成的膜:
中心区域
54%Min-Sil二氧化硅(Min-Sil Silica)
27%汽巴-嘉基爱劳达牌GT6084环氧树脂(Ciba Geigy AralditeGT6084 epoxy)
9%汽巴-嘉基爱劳达牌PY322环氧树脂(Ciba Geigy AralditePY322 epoxy)
9%甲基六氢化邻苯二甲酸酐(Methylhexahydrophthalicanhydride)
1%Lindride摧进剂(Lindride Accelerator)
边界区域
80%汽巴-嘉基爱劳达牌GT6084环氧树脂(Ciba Geigy AralditeGT6084 epoxy)
.5%汽巴-嘉基爱劳达牌PY322环氧树脂(Ciba Geigy AralditePY322 epoxy)
19%甲基六氢化邻苯二甲酸酐(Methylhexahydrophthalicanhydride)
.5%Lindride加速剂(Lindride Accelerator)
以上给出的所有百分比都是重量百分比。甲基六氢化邻苯二甲酸酐既作为助焊剂以减少或清除金属氧化物,也作为交联剂以固化环氧树脂。很明显,本发明也可以使用其它助焊剂,这取决于具体选择什么树脂系统作为粘附膜。然而,本系统的一个突出的优点是同一种材料或化学成分既可以作助焊剂也可以作为交联剂来固化树脂。虽然本例包含重量占54%二氧化硅,可以想象,所用填料的重量比在20%-80%也有效。
参见图2,它表示用本发明的选择填充粘附膜安装到基板的一个倒装芯片的截面图。应该认识到,尽管该图表示的是连接到基板的一个倒装芯片集成电路管芯的电子器件,采用其它类型的具有焊料突点的表面安装元件都属于本发明的范畴。包含焊料突点22的器件20被如此放置,使得焊料突点及该器件的工作表面25面对着基板21,并与基板上的金属化图形27对准。粘附膜粘接到该电子器件上,或粘接到基板上,使包含助焊剂的粘附膜的边界区域14直接位于该电子器件的焊料突点上方,或位于基板上互连焊块上方。包含加入了填料的粘接剂的粘附膜的中心区域12同该电子器件没有焊料突点的中心部分对齐。然后使该电子器件与基板上的金属化图形紧密接触,因此边界区域14包含助焊剂的未填充粘接剂浸润该器件的焊料突点22及基板上的金属化图形27。粘接剂除了提供助焊作用外,还提供“定位”力,在回流操作前把该电子器件固定到位。由于粘接剂没有完全固化,因此有一些定位作用,能帮助表面安装器件在基板上的定位。此外,可以看出,当粘接剂完全固化后,该粘接剂也对该电子器件的有源表面形成未充满密封,保护了表面的环境。
然后用常规的方法对该组件进行回流,使助焊剂活化,减少焊料及基板的金属化表面上的任何氧化物,使焊料与金属化图形合金。回流过程中,粘接剂可以固化成固态。(取决于该粘接剂系统的化学特性,可以再选择使用后固化操作,使粘接剂完全固化。)在该回流/固化步骤中,粘接剂把该电子器件的一侧密封。边界区域的未填充粘接剂围绕周边流出一些,形成新月形状,这样在该电子器件的周围形成连续的密封,使其有源表面免受环境污染。这样不再需要进一步的清理或密封操作。
为了测试本发明的功效,把倒装芯片半导体管芯固定到用浸灌了聚酰亚胺树脂的编织玻璃布制成的常规印刷电路板上。回流后,对已焊接的倒装芯片组件进行-55℃至+125℃的热循环处理。直到600个周期后,使用本发明的选择填充膜的组件没出现焊接失效,其平均失效周期数为2300。相反,使用不包含选择填充部分的未充满粘接剂做成的倒装芯片组件仅在200个周期后就发生第一次失效,其平均失效周期数为400。一般用于这类应用的合金系统是:突点合金包含97%的铅,3%的锡;管芯突点组装到印刷电路板基板的焊块上,焊块上包含63%的锡,37%的铅的易熔焊料。
总之,选择填充粘附膜包含用于把电子器件安装到基板的助焊剂。粘附膜的中心部分填有填料,以把热膨胀系数减少到未填充粘接剂的热膨胀系数的二分之一以下。围绕该填充粘接剂的边界区域包含助焊剂,以减少焊接操作中的氧化物。填料的量的重量比为20%-85%,一般将二氧化硅与环氧树脂一起使用,以制造能承受大量热循环幅度的电子元件组。
以上说明和描述了本发明的优选实施方式,很明显本发明不受此限制。对于熟练的技术人员来说,可以作大量的修改、改变、变化、替代及对等,都不违反附加的权利要求中说明的本发明的精神和范围。

Claims (7)

1.一种包含用于把电子器件回流焊接到基板上的助焊剂的选择填充热可固化粘附膜,包括:
具有中心区域及边界区域的无载体的粘附膜,所述边界区域包围该中心区域;
该边界区域由环氧树脂、助焊剂及加速剂组成的粘接剂组成;
该中心区域由环氧树脂、助焊剂、加速剂及惰性填料组成的粘接剂组成,所述惰性填料把中心区域粘接剂的热膨胀系数减小到小于边界区域粘接剂的热膨胀系数的二分之一以下。
2.权利要求1所述的粘附膜,其中助焊剂也可作为粘接剂的固化剂,该助焊剂或固化剂是甲基六氢化邻苯二甲酸酐。
3.权利要求1所述的粘附膜,其中边界区域粘接剂是胶粘状态,用于在热固化该粘附膜前把该电子器件暂时固定到基板上,其中当把该电子器件回流焊接到该基板上时,粘附膜被热固化。
4.权利要求1所述的粘附膜,其中助焊剂为酐助焊剂,惰性填料为二氧化硅,所含二氧化硅的重量在20%-85%之间。
5.权利要求4所述的粘附膜,其中酐助焊剂也用作粘接剂的固化剂,或酐助焊剂是甲基六氢化邻苯二甲酸酐。
6.权利要求4所述的粘附膜,其中未填充二氧化硅的环氧树脂粘接剂是胶粘状态,用于在粘附膜热固化之前把该电子器件暂时固定到基板上。
7.一种电子元件组件,由以下组成:
电子器件,在其外围部分有多个焊料突点;
具有多个与焊料突点相应的电气端子的电路安装基板;
该电子器件的焊料突点被焊接到电路安装基板的电气端子上;
其特征在于,该电子元件组件还包括:
填充了二氧化硅的热固化粘接材料选择性地分布在该电子器件和该电路安装基板之间该电子器件的中心部分;以及
包含助焊剂的未填充二氧化硅的固化的粘接材料选择性地分布在该电子器件与该电路安装基板之间的该电子器件的周边区域,所述未填充固化的粘接材料密封了焊料突点,其热膨胀系数大于填充了二氧化硅的热固化的粘接材料。
CN98103715A 1997-02-04 1998-01-26 包含助焊剂的选择填充粘附膜 Expired - Lifetime CN1097305C (zh)

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