CN109031683A - The active focus adjustment method of structured light projection mould group - Google Patents
The active focus adjustment method of structured light projection mould group Download PDFInfo
- Publication number
- CN109031683A CN109031683A CN201810922256.6A CN201810922256A CN109031683A CN 109031683 A CN109031683 A CN 109031683A CN 201810922256 A CN201810922256 A CN 201810922256A CN 109031683 A CN109031683 A CN 109031683A
- Authority
- CN
- China
- Prior art keywords
- structured light
- projection
- mould group
- axis
- parameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4205—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive optical element [DOE] contributing to image formation, e.g. whereby modulation transfer function MTF or optical aberrations are relevant
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention belongs to image projection techniques fields, more particularly to a kind of active focus adjustment method of structured light projection mould group, the active focus adjustment method of structured light projection mould group of the invention, judge whether need to be corrected between light source and projection optical device by projection pattern detection system, if desired further correction, it can be adjusted by the deviation between the parameter and standard parameter of the structured light patterns that structured light projection mould group regulating system is detected according to projection pattern detection system, so that the relative position between light source and projection optical device adjust it is consistent with standard parameter to parameter, it can relatively easily realize to correct the relative position between light source and projection optical device to the parameter of pattern and standard parameter one and show the yield for improving product, and then reduce production cost；It is consistent with standard parameter that relative position between light source and projection optical device is corrected into the parameter to pattern, so that the pattern effect that structured light projection mould group is projected out is best, so that user experience is preferable.
Description
Technical field
The invention belongs to image projection techniques field more particularly to a kind of active focus adjustment methods of structured light projection mould group.
Background technique
3D imaging technique is the core of human-computer interaction technology of new generation, as mobile terminal device is to the hard of 3D imaging technique
Property demand, depth camera will be widely used in mobile terminal device, this but also depth camera just towards low-power consumption, height
Performance, small size direction develop.Structured light projection mould group is the core equipment in the depth camera based on structured light technique,
Chief component is light source and projection optical device.Projection optical device has the function of being modulated light beam, will enter
Penetrate the outgoing beam that light generates particular structured pattern.In structured light projection mould group production process, light source and projection optical device
Assembly precision will affect the focal position and projection surface of the structure light cast out, the perspective view of structure light will be directly affected
Case effect, and then influence depth and the direction of structured light patterns.
Summary of the invention
The purpose of the present invention is to provide a kind of active focus adjustment methods of structured light projection mould group, it is intended to solve the prior art
In light source and projection optical device assembly precision so that influence the depth of structured light patterns and the technical issues of direction.
To achieve the above object, the technical solution adopted by the present invention is that: a kind of active focusing side of structured light projection mould group
Method, comprising the following steps:
Preparation includes the structured light projection mould of light source with the projection optical device that can be used to form specific structured light patterns
Group, projection pattern detection system and structured light projection mould group regulating system, the structured light projection mould group have about described
The depth of structured light patterns and the standard parameter in direction；
By the projection pattern detection system detect the structured light patterns parameter and standard parameter it is whether consistent, if
It is then to be not required to correct；
If it is not, the deviation of the parameter and the standard parameter is fed back to the knot by the projection pattern detection system
Structure light projective module group regulating system, the structured light projection mould group regulating system according to the deviation by the light source with it is described
Relative position between projection optical device adjusts consistent with the standard parameter to the parameter.
Further, the structured light projection mould group regulating system is by the phase between the light source and the projection optical device
To position adjust to the parameter and the standard parameter it is consistent during, projection pattern detection system real-time monitoring institute
State parameter and the standard parameter.
Further, the projection pattern monitoring system includes the knot for the structured light patterns to be carried out with image developing
Structure light pattern loading end and the image information acquisition structure for obtaining the parameter, described image acquisition of information structure are located at described
Structured light patterns loading end side.
Further, the light source, the projection optical device, the structured light patterns loading end and described image letter
Breath obtains structure and is successively arranged side by side.
Further, the projection optics structure includes lens and diffraction optical element, and the lens spread out with described
Penetrate the optical axis coincidence of optical element.
Further, the light source, the projection optical device and the structured light patterns loading end are successively set side by side
It sets, described image acquisition of information structure is set to the close light source side of the structured light patterns loading end, and described image
Acquisition of information structure obtains the parameter by the described image of the reflection of the structured light patterns loading end.
Further, the projection optics structure includes the exposure mask, object lens and projecting lens being arranged successively, and the object
The optical axis coincidence of mirror and the projecting lens.
Further, using plane where the structured light patterns loading end as benchmark face, the datum level, which has, mutually to hang down
Straight X-axis, Y-axis, are Z axis perpendicular to the datum level, and the structured light projection mould group regulating system can drive the light source point
It is not moved along X-axis, and/or Y-axis, and/or Z axis and/or the structured light projection mould group regulating system can drive the light source point
It is not rotated along X-axis, and/or Y-axis, and/or Z axis.
Further, using plane where the structured light patterns loading end as benchmark face, the datum level, which has, mutually to hang down
Straight X-axis, Y-axis, are Z axis perpendicular to the datum level, and the structured light projection mould group regulating system can drive the projected light
Device moves respectively along X-axis, and/or Y-axis, and/or Z axis and/or the structured light projection mould group regulating system can drive institute
Projection optical device is stated to rotate along X-axis, and/or Y-axis, and/or Z axis respectively.
Further, the light source is multiple vertical cavity surface emitting lasers.
Beneficial effects of the present invention: the active focus adjustment method of structured light projection mould group of the invention is examined by projection pattern
Examining system judges whether need to be corrected parameter and standard so that the pattern detected between light source and projection optical device
Parameter is consistent, if desired further correction, can be examined by structured light projection mould group regulating system according to projection pattern detection system
Deviation between the parameter and standard parameter of the pattern measured is adjusted, so that the opposite position between light source and projection optical device
Set adjust it is consistent with standard parameter to parameter, thus it is possible, on the one hand, can relatively easily realize the phase between light source and projection optical device
Show between the parameter and standard parameter of position correction to pattern one the yield for improving product, and then reduces production cost；It is another
Aspect corrects the relative position between light source and projection optical device to consistent between the parameter of pattern and standard parameter, so that knot
The pattern effect that structure light projective module group is projected out is best, so that user experience is preferable.
Detailed description of the invention
It to describe the technical solutions in the embodiments of the present invention more clearly, below will be to embodiment or description of the prior art
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description is only of the invention some
Embodiment for those of ordinary skill in the art without any creative labor, can also be according to these
Attached drawing obtains other attached drawings.
Fig. 1 is the flow diagram of the active focus adjustment method of structured light projection mould group provided in an embodiment of the present invention；
Fig. 2 is rotation and/or the moving direction of projection optical device provided in an embodiment of the present invention；
Fig. 3 is rotation and/or the moving direction of light source provided in an embodiment of the present invention；
Fig. 4 is the embodiment one of projection pattern detection system detection image parameter provided in an embodiment of the present invention；
Fig. 5 is the embodiment two of projection pattern detection system detection image parameter provided in an embodiment of the present invention.
Wherein, each appended drawing reference in figure:
10-light sources；20-projection optical devices；30-structured light patterns loading ends；
40-image information acquisition structures.
Specific embodiment
The embodiment of the present invention is described below in detail, examples of the embodiments are shown in the accompanying drawings, wherein from beginning to end
Same or similar label indicates same or similar element or element with the same or similar functions.Below with reference to attached
The embodiment that Fig. 1~5 is described is exemplary, it is intended to is used to explain the present invention, and is not considered as limiting the invention.
In the description of the present invention, it is to be understood that, term " length ", " width ", "upper", "lower", "front", "rear",
The orientation or positional relationship of the instructions such as "left", "right", "vertical", "horizontal", "top", "bottom" "inner", "outside" is based on attached drawing institute
The orientation or positional relationship shown, is merely for convenience of description of the present invention and simplification of the description, rather than the dress of indication or suggestion meaning
It sets or element must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as to limit of the invention
System.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include one or more of the features.In the description of the present invention, the meaning of " plurality " is two or more,
Unless otherwise specifically defined.
In the present invention unless specifically defined or limited otherwise, term " installation ", " connected ", " connection ", " fixation " etc.
Term shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integral；It can be mechanical connect
It connects, is also possible to be electrically connected；It can be directly connected, can also can be in two elements indirectly connected through an intermediary
The interaction relationship of the connection in portion or two elements.It for the ordinary skill in the art, can be according to specific feelings
Condition understands the concrete meaning of above-mentioned term in the present invention.
Embodiment one
As shown in Fig. 1~5, the embodiment of the present invention provides a kind of active focus adjustment method of structured light projection mould group, including with
Lower step:
Preparation includes that light source 10 and the structure light for the projection optical device 20 that can be used to form specific structured light patterns are thrown
Shadow mould group, projection pattern detection system (in diagram a-quadrant be projection pattern detection system detection range) and structure light throw
Shadow mould group regulating system, structured light projection mould group have about the depth of structured light patterns and the standard parameter in direction；
It is whether consistent by the parameter and standard parameter of projection pattern detection system detection pattern, if being, do not correct；
It is adjusted if it is not, the deviation of parameter and standard parameter is fed back to structured light projection mould group by projection pattern detection system
System, structured light projection mould group regulating system adjust the relative position between light source 10 and projection optical device 20 according to deviation
It is consistent with standard parameter to parameter.
The active focus adjustment method of the structured light projection mould group of the embodiment of the present invention, judges light by projection pattern detection system
Whether need to be corrected between source 10 and projection optical device 20 so that the parameter and standard of the structured light patterns detected are joined
Number is consistent, if desired further correction, can be detected by structured light projection mould group regulating system according to projection pattern detection system
To structured light patterns parameter and standard parameter between deviation be adjusted so that between light source 10 and projection optical device 20
Relative position adjust it is consistent with standard parameter to parameter, thus it is possible, on the one hand, can relatively easily realize light source 10 and projection optics
Relative position between device 20, which is corrected between the parameter of pattern and standard parameter one, shows the yield for improving product, and then reduces life
Produce cost；On the other hand, by the relative position between light source 10 and projection optical device 20 correct parameter to structured light patterns with
It is consistent between standard parameter, so that the structured light patterns effect that structured light projection mould group is projected out is best, so that user experience is preferable.
Specifically, in the present embodiment, standard parameter can be a design parameter, can also be that may make structured light projection mould group
In the parameter section of non-defective unit, when the knot that structured light projection mould group regulating system is arrived according to structured light projection pattern detection system detection
The parameter of structure light pattern be located at parameter region it is interior when, structured light projection mould group is just non-defective unit.
Further, in the present embodiment, structured light projection mould group regulating system is by light source 10 and projection optical device 20
Between relative position adjust to parameter and standard parameter it is consistent during, projection pattern detection system real-time monitoring parameter until
Relative position between light source 10 and projection optical device 20 is adjusted consistent with standard parameter to parameter.Projection pattern detection system
The parameter of real-time monitoring structured light patterns, and parameter and standard parameter that data processing obtains pattern are carried out with standard parameter simultaneously
Between deviation and Real-time Feedback to structured light projection mould group regulating system, structured light projection mould group regulating system according to this partially
Difference calculates the position that should adjust of light source 10 or angle, or the position that should adjust of adjustment projection optical device 20 or angle to tie
The parameter and standard parameter one of structure light pattern show the yields for improving product.
Further, in the present embodiment, projection pattern monitoring system includes aobvious for carrying out image to structured light patterns
The image information acquisition structure 40 of the parameter of the structured light patterns loading end 30 and acquisition structured light patterns of shadow, image information obtains
Structure 40 is taken to be located at 30 side of structured light patterns loading end.By 30 pairs of structured light patterns loading end through projection optical device 20 at
The light managed further is developed, and image information acquisition structure 40 is formed after development can carry out the image of parameter acquisition, so that
Projection pattern monitoring system can more accurately obtain the parameter of structured light patterns.
Further, in the present embodiment, light source 10, projection optical device 20, structured light patterns loading end 30 and figure
As acquisition of information structure 40 is successively arranged side by side, it is that field range is completely covered on structured light patterns that image at this time, which obtains structure,
The camera visual structure of the structured light patterns formed on loading end 30.By by light source 10, projection optical device 20, structure light figure
Case loading end 30 and image information acquisition structure 40 are successively arranged side by side, so that image obtains structure and can get in structure light
The information of the pattern to develop on pattern loading end 30, and then by the information processing at the parameter of structured light patterns, and join with standard
Number is compared with the deviation with standard parameter that gets parms.
Specifically, in the present embodiment, image information acquisition structure 40 is acquired the information in the predetermined position of image,
And the parameter by the way that the information processing to be obtained to structured light patterns.
Further, in the present embodiment, projection optics structure includes lens and diffraction optical element, and lens and diffraction
The optical axis coincidence of optical element, it is relatively fixed between lens and diffraction optical element.Specifically, lens are collimation lens, are passed through
Light source 10 launches single beam, after the collimated lens of single beam and diffraction optical element, to 30 side of structured light patterns loading end
To transmission laser speckle patterns, which is acquired through image information acquisition structure 40 to obtain the ginseng of structured light patterns
Number.It is understood that various projection optics structures include various types of lens and the group of other optical elements
It closes, and can be used cooperatively with light source 10.The projection optics structure of different matched combineds may be suitble to the demand of different scenes simultaneously
And projection optics structure can be selected according to specific demand.The parameter of used actual lens is according to angular field, ideal
Resolution ratio and the depth of field limitation specification determine.
Further, as shown in figure 3, in the present embodiment, using 30 plane of structured light patterns loading end as benchmark face, benchmark
Face has orthogonal X-axis, Y-axis, is Z axis perpendicular to datum level, and structured light projection mould group regulating system can drive light source 10
It is moved respectively along X-axis, and/or Y-axis, and/or Z axis and/or structured light projection mould group regulating system can drive the edge respectively of light source 10
X-axis, and/or Y-axis, and/or Z axis rotation.Projection optics structure is fixed, then passes through structured light projection mould group regulating system for light
Source 10 is mobile and/or rotates, so that the structure being projected out by the structured light projection mould group of light source 10 and projection optics structure composition
The parameter of light pattern is consistent with standard parameter, in this way, the quality for the pattern that structured light projection mould group is projected out can be improved.
Further, as shown in Fig. 2, in the present embodiment, using 30 plane of structured light patterns loading end as benchmark face, benchmark
Face has orthogonal X-axis, Y-axis, is Z axis perpendicular to datum level, and structured light projection mould group regulating system can drive projected light
Device 20 moves respectively along X-axis, and/or Y-axis, and/or Z axis and/or structured light projection mould group regulating system can drive projection
Optical device 20 is rotated along X-axis, and/or Y-axis, and/or Z axis respectively.Light source 10 is fixed, then pass through structured light projection mould group tune
Section system is mobile by projection optics structure and/or rotates, so that by the structured light projection of light source 10 and projection optics structure composition
The parameter for the pattern that mould group is projected out is consistent with standard parameter, in this way, the pattern that structured light projection mould group is projected out can be improved
Quality.
Further, in the present embodiment, light source 10 is multiple vertical cavity surface emitting lasers.Due to vertical-cavity surface-emitting
Laser in the operating condition can when keeping the operation of efficient laser the intracavitary lower characteristic of loss so that vertical cavity surface
The waste of emitting laser when in use is smaller, so can effective guarantee structured light projection mould group service life.
Embodiment two
Further, the present embodiment and embodiment one the difference is that: in the present embodiment, light source 10, projected light
It learns device 20, structured light patterns loading end 30 and image information acquisition structure 40 and image information acquisition structure is successively arranged side by side
40 structured light patterns loading end, 30 light source 10, and image information acquisition structure 40 is to the knot of the transmission of structured light patterns loading end 30
Structure light pattern gets parms.Specifically, structured light patterns loading end 30 is used as transmission plane at this time, and structured light projection mould group is projected
At light transmission out to image information acquisition structure 40, so that image obtains structure and can get in structured light patterns loading end 30
On structured light patterns information, and then by the information processing at the parameter of structured light patterns, and be compared with standard parameter
To obtain the parameter of structured light patterns and the deviation of standard parameter.
Specifically, in the present embodiment, light source 10, projection optical device 20 and structured light patterns loading end 30 be successively simultaneously
Row's setting, image information acquisition structure 40 leans on 10 side of close to sources set on structured light patterns loading end 30, and image information obtains
Take the image acquisition parameters of reflection of the structure 40 to structured light patterns loading end 30.
Further, in the present embodiment, projection optics structure includes that the exposure mask being arranged successively, object lens and projection are saturating
Mirror, and the optical axis coincidence of object lens and projecting lens.Specifically, after multiple light sources 10 launch the light beam of specific distribution, the light velocity
It sequentially passes through exposure mask, object lens and projecting lens and the light beam of the specific distribution is formed into pattern, reflected through pattern loading end or thoroughly
After penetrating, the information that structure obtains the pattern is obtained by image, which forms the parameter of pattern after processing.
The rest part of the present embodiment is the same as example 1, in the present embodiment unaccounted feature, is all made of implementation
The explanation of example one, is not discussed here.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (10)
1. a kind of active focus adjustment method of structured light projection mould group, it is characterised in that: the following steps are included:
Preparation includes the structured light projection mould group of light source and the projection optical device that can be used to form specific structured light patterns, throws
Shadow pattern detection system and structured light projection mould group regulating system, the structured light projection mould group have about the structure light
The depth of pattern and the standard parameter in direction；
By the projection pattern detection system detect the structured light patterns parameter and standard parameter it is whether consistent, if
It is not correct then；
If it is not, the deviation of the parameter and the standard parameter is fed back to the structure light by the projection pattern detection system
Projective module group regulating system, the structured light projection mould group regulating system is according to the deviation by the light source and the projection
Relative position between optical device adjusts consistent with the standard parameter to the parameter.
2. the active focus adjustment method of structured light projection mould group according to claim 1, it is characterised in that: the structure light is thrown
Shadow mould group regulating system adjusts the relative position between the light source and the projection optical device to the parameter and the mark
During quasi- parameter is consistent, parameter described in the projection pattern detection system real-time monitoring and the standard parameter.
3. the active focus adjustment method of structured light projection mould group according to claim 2, it is characterised in that: the projection pattern
Monitoring system includes the structured light patterns loading end and the acquisition ginseng for the structured light patterns to be carried out with image developing
Several image information acquisition structures, described image acquisition of information structure are located at structured light patterns loading end side.
4. the active focus adjustment method of structured light projection mould group according to claim 3, it is characterised in that: the light source, institute
Projection optical device, the structured light patterns loading end and described image acquisition of information structure is stated successively to be arranged side by side.
5. the active focus adjustment method of structured light projection mould group according to claim 4, it is characterised in that: the projection optics
Structure includes lens and diffraction optical element, and the optical axis coincidence of the lens and the diffraction optical element.
6. the active focus adjustment method of structured light projection mould group according to claim 3, it is characterised in that: the light source, institute
It states projection optical device, the structured light patterns loading end and described image acquisition of information structure to be successively arranged side by side, and institute
The described image of transmission of the image information acquisition structure by the structured light patterns loading end is stated to obtain the parameter.
7. the active focus adjustment method of structured light projection mould group according to claim 6, it is characterised in that: the projection optics
Structure includes the exposure mask, object lens and projecting lens being arranged successively, and the optical axis coincidence of the object lens and the projecting lens.
8. the active focus adjustment method of structured light projection mould group according to claim 4 or 6, it is characterised in that: with the knot
Plane where structure light pattern loading end is benchmark face, and the datum level has orthogonal X-axis, Y-axis, perpendicular to the benchmark
Face is Z axis, and the structured light projection mould group regulating system can drive the light source to move respectively along X-axis, and/or Y-axis, and/or Z axis
The dynamic and/or described structured light projection mould group regulating system can drive the light source to turn respectively along X-axis, and/or Y-axis, and/or Z axis
It is dynamic.
9. the active focus adjustment method of structured light projection mould group according to claim 4 or 6, it is characterised in that: with the knot
Plane where structure light pattern loading end is benchmark face, and the datum level has orthogonal X-axis, Y-axis, perpendicular to the benchmark
Face is Z axis, the structured light projection mould group regulating system can drive the projection optical device respectively along X-axis, and/or Y-axis,
And/or Z axis is mobile and/or the structured light projection mould group regulating system can drive the projection optical device respectively along X-axis,
And/or Y-axis, and/or Z axis rotate.
10. the active focus adjustment method of described in any item structured light projection mould groups according to claim 1~7, it is characterised in that: institute
Stating light source is multiple vertical cavity surface emitting lasers.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810922256.6A CN109031683A (en) | 2018-08-14 | 2018-08-14 | The active focus adjustment method of structured light projection mould group |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810922256.6A CN109031683A (en) | 2018-08-14 | 2018-08-14 | The active focus adjustment method of structured light projection mould group |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109031683A true CN109031683A (en) | 2018-12-18 |
Family
ID=64634090
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810922256.6A Pending CN109031683A (en) | 2018-08-14 | 2018-08-14 | The active focus adjustment method of structured light projection mould group |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109031683A (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109543660A (en) * | 2018-12-20 | 2019-03-29 | 深圳奥比中光科技有限公司 | A kind of focus control and focus adjustment method |
| CN110174075A (en) * | 2019-04-08 | 2019-08-27 | 深圳奥比中光科技有限公司 | A kind of list Zoom structure optical depth camera and Zooming method |
| CN111045285A (en) * | 2019-12-25 | 2020-04-21 | 上海星迅电气有限公司 | Projection lamp focusing mechanism and projection lamp |
| CN111175867A (en) * | 2020-01-14 | 2020-05-19 | 深圳睿晟自动化技术有限公司 | Diffusion film and structured light projection module correction device |
| CN111818315A (en) * | 2020-06-22 | 2020-10-23 | 上海丹诺西诚智能科技有限公司 | A projection image detection device and method |
| CN111935468A (en) * | 2020-09-24 | 2020-11-13 | 歌尔股份有限公司 | Method and device for detecting deviation of projection center and computer readable storage medium |
| CN112379570A (en) * | 2020-11-25 | 2021-02-19 | 东莞埃科思科技有限公司 | Projector assembling and adjusting method and device |
| CN112945520A (en) * | 2019-12-11 | 2021-06-11 | 余姚舜宇智能光学技术有限公司 | Projector assembling apparatus and assembling method thereof |
| CN113554962A (en) * | 2021-07-19 | 2021-10-26 | 苏州智瞳道和显示技术有限公司 | Dynamic adjusting and testing method, device and system of projector |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103309137A (en) * | 2012-03-15 | 2013-09-18 | 普莱姆森斯有限公司 | structured light projector |
| WO2013151342A1 (en) * | 2012-04-05 | 2013-10-10 | 단국대학교 산학협력단 | Radiation phase difference imaging apparatus |
| CN105987805A (en) * | 2015-02-02 | 2016-10-05 | 宁波舜宇光电信息有限公司 | Projection structured light system detection method |
| CN108036742A (en) * | 2017-12-21 | 2018-05-15 | 北京驭光科技发展有限公司 | New lines structural light three-dimensional method for sensing and device |
| CN108332082A (en) * | 2018-01-15 | 2018-07-27 | 深圳奥比中光科技有限公司 | Illumination module |
| CN108333859A (en) * | 2018-02-08 | 2018-07-27 | 宁波舜宇光电信息有限公司 | Project structured light device, depth camera are with the depth image imaging method based on depth camera |
-
2018
- 2018-08-14 CN CN201810922256.6A patent/CN109031683A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103309137A (en) * | 2012-03-15 | 2013-09-18 | 普莱姆森斯有限公司 | structured light projector |
| WO2013151342A1 (en) * | 2012-04-05 | 2013-10-10 | 단국대학교 산학협력단 | Radiation phase difference imaging apparatus |
| CN105987805A (en) * | 2015-02-02 | 2016-10-05 | 宁波舜宇光电信息有限公司 | Projection structured light system detection method |
| CN108036742A (en) * | 2017-12-21 | 2018-05-15 | 北京驭光科技发展有限公司 | New lines structural light three-dimensional method for sensing and device |
| CN108332082A (en) * | 2018-01-15 | 2018-07-27 | 深圳奥比中光科技有限公司 | Illumination module |
| CN108333859A (en) * | 2018-02-08 | 2018-07-27 | 宁波舜宇光电信息有限公司 | Project structured light device, depth camera are with the depth image imaging method based on depth camera |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109543660A (en) * | 2018-12-20 | 2019-03-29 | 深圳奥比中光科技有限公司 | A kind of focus control and focus adjustment method |
| CN109543660B (en) * | 2018-12-20 | 2020-06-30 | 深圳奥比中光科技有限公司 | Focusing device and focusing method |
| CN110174075A (en) * | 2019-04-08 | 2019-08-27 | 深圳奥比中光科技有限公司 | A kind of list Zoom structure optical depth camera and Zooming method |
| CN112945520A (en) * | 2019-12-11 | 2021-06-11 | 余姚舜宇智能光学技术有限公司 | Projector assembling apparatus and assembling method thereof |
| CN111045285A (en) * | 2019-12-25 | 2020-04-21 | 上海星迅电气有限公司 | Projection lamp focusing mechanism and projection lamp |
| CN111175867A (en) * | 2020-01-14 | 2020-05-19 | 深圳睿晟自动化技术有限公司 | Diffusion film and structured light projection module correction device |
| CN111818315A (en) * | 2020-06-22 | 2020-10-23 | 上海丹诺西诚智能科技有限公司 | A projection image detection device and method |
| CN111935468A (en) * | 2020-09-24 | 2020-11-13 | 歌尔股份有限公司 | Method and device for detecting deviation of projection center and computer readable storage medium |
| CN111935468B (en) * | 2020-09-24 | 2021-01-22 | 歌尔股份有限公司 | Method and device for detecting deviation of projection center and computer readable storage medium |
| CN112379570A (en) * | 2020-11-25 | 2021-02-19 | 东莞埃科思科技有限公司 | Projector assembling and adjusting method and device |
| CN112379570B (en) * | 2020-11-25 | 2022-05-03 | 东莞埃科思科技有限公司 | Projector assembling and adjusting method |
| CN113554962A (en) * | 2021-07-19 | 2021-10-26 | 苏州智瞳道和显示技术有限公司 | Dynamic adjusting and testing method, device and system of projector |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109031683A (en) | The active focus adjustment method of structured light projection mould group | |
| US10429183B2 (en) | Non-contact coordinate measuring machine using hybrid cyclic binary code structured light | |
| US8562150B2 (en) | Optical axis adjustment device, method for adjusting optical axis and projection-type display apparatus | |
| US7454265B2 (en) | Laser and Photogrammetry merged process | |
| US20150070468A1 (en) | Use of a three-dimensional imager's point cloud data to set the scale for photogrammetry | |
| US11490068B2 (en) | Adaptive 3D-scanner with variable measuring range | |
| CN108463300A (en) | Module for increasing material manufacturing device and method | |
| CN105352514B (en) | A kind of the alignment deviation correcting device and method of the demarcation of space navigation seeker ground | |
| JP2000262550A (en) | Disposable contact lens to be used for ophthalmic laser system | |
| CN103250232A (en) | Surface inspection device and method thereof | |
| CN112198624B (en) | Method and system for assembling and adjusting optical despun K-mirror assembly | |
| JP2001100145A (en) | Laser marker | |
| CN104950592B (en) | Method for calibrating projection lens focal plane and camera focal plane positions in DMD photolithographic system | |
| US11409199B2 (en) | Pattern drawing device | |
| CN210666151U (en) | Optical lens and camera module | |
| US10297044B2 (en) | Method for calibrating an optical scanner and devices thereof | |
| CN109188836A (en) | The central point of calibration light source pattern to projection optical device central axis method | |
| JP6935498B2 (en) | Equipment and methods for exposing photosensitive layers | |
| US4655599A (en) | Mask aligner having a photo-mask setting device | |
| JP3749152B2 (en) | Lens meter | |
| US20080151191A1 (en) | Corneal Measurement Apparatus Having a Segmented Aperture and a Method of Using the Same | |
| CN106198397A (en) | A kind of photoelectric detection system, method and photoresist coating equipment | |
| US20200240770A1 (en) | Device and Method for Calibrating a Measuring Apparatus Using Projected Patterns and a Virtual Plane | |
| CN104950593B (en) | For positioning the graticle of camera focal plane position in DMD etching systems | |
| CN106896497A (en) | The calculation method of adjustable storehouse moral mirror pilot angle in high precision |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20181218 |
|
| RJ01 | Rejection of invention patent application after publication |