CN108957201A - Electronic component testing device - Google Patents

Abstract

The invention relates to an electronic element testing device, which comprises a machine body, a testing module, a bearing table and a lifting guide piece. The test module is arranged on the machine body. The bearing table can be arranged on the machine body along a first direction in a displacement mode relative to the test module, and the bearing table is provided with a matching part. The lifting guide piece can be movably arranged on the machine body along a second direction perpendicular to the first direction, the lifting guide piece is provided with a guide part, the guide part is provided with a first end and a second end, the first end and the second end are positioned on different positions of the first direction, and when the guide part is overlapped with the matching part in the second direction, the matching part is matched with and guided by the guide part and moves along the first direction.

Description

Electronic component testing device

technical field

The present invention relates to electronic component testing devices.

Background technique

Press, in the manufacturing process of electronic components in the semiconductor industry, electronic components must go through testing procedures to confirm their normal functions before leaving the factory. A general test machine has a test module, a pick-and-place module, a carrying fixture and a driving source. The pick-and-place module can pick and place the electronic components on the carrying jig, which is used for placing the electronic components, and the test module tests the electronic components. During the test, the driving source drives the carrying fixture to lift up vertically and move towards the test module so as to contact the test terminal of the test module for testing. However, the load-carrying fixture of a general test module can only place a single electronic component of a single type, and the pick-and-place module can only pick and place a single electronic component each time, so the test efficiency is not good. In addition, when different electronic components need to be tested, different carrying fixtures must be replaced to carry different types of electronic components, and the convenience in use needs to be improved.

In addition, the test module must have a specific contact force when in contact with the electronic components to ensure the stability of the test. Therefore, a general test machine is mostly configured with a vertically extending driving source, which applies a vertical driving force to the carrying fixture, causing the carrying fixture to produce a vertical displacement action. The driving force of the driving source drives the carrying fixture to contact the test module in the same direction as the driving force. It can be seen that, under this configuration, the driving source is to drive the carrying jig up and down, so it must extend along the vertical direction. As a result, the volume of the test machine in the vertical direction cannot be reduced, making it difficult to stack the test machines in the vertical direction, thus making it impossible to configure multiple test areas, making it difficult to effectively improve the test efficiency.

Contents of the invention

An embodiment of the present invention provides an electronic component testing device, the main purpose of which is to improve the lack of common testing machines that are difficult to meet the configuration of multiple testing areas and cannot effectively improve testing efficiency.

To achieve the aforementioned purpose, an embodiment of the present invention is an electronic component testing device, which includes a body, a testing module, a carrying platform, and a lifting guide. The test module is arranged on the body. The bearing platform can be displaceably arranged on the body relative to the test module along the first direction, and the bearing platform has a matching part. The lifting guide is arranged on the machine body so as to be movable along a second direction perpendicular to the first direction. The lifting guide has a guide portion, the guide portion has a first end and a second end, and the first end and the second end are located at At different positions in the first direction, when the guide part overlaps with the matching part in the second direction, the matching part is guided relative to the guide part and displaced along the first direction.

In this embodiment, the lifting guide that moves along the second direction drives the loading table to move along the first direction, and there is no need to increase the space in the first direction to install components that drive the loading table displacement, thereby greatly reducing the time required for the electronic component testing device. The volume occupied in the first direction enables the electronic component testing device to be overlapped and used in the first direction, satisfying the configuration of multiple test areas, and greatly improving the test efficiency in the same space.

Description of drawings

FIG. 1 is a three-dimensional appearance view of an embodiment of an electronic component testing device of the present invention.

FIG. 2 is another perspective perspective view of an embodiment of the electronic component testing device of the present invention.

3 is a three-dimensional cross-sectional view of an embodiment of the electronic component testing device of the present invention.

FIG. 4 is a schematic diagram of operations following the example in FIG. 3 .

FIG. 5 is a three-dimensional appearance view of the changing position of the carrying platform of an embodiment of the electronic component testing device of the present invention.

Fig. 6 is a side view of the example in Fig. 5 .

FIG. 7 is a perspective cross-sectional view of the example in FIG. 5 .

FIG. 8 is a schematic diagram of operations continued from FIG. 7 .

Fig. 9 is a three-dimensional appearance view of the state of the embodiment in Fig. 8 .

Fig. 10 is a side view of the appearance of the example in Fig. 9 .

Wherein reference sign is:

10 body 11 first support frame

12 second support frame 20 test host

21 control panel 30 test module

31 test surface 40 carrying platform

41 Substrate 411 Guide post

42 lifting plate 43 side plate

44 Fitting part 44A First fitting part

44B Second matching part 50 Lifting guide

51 guide part 51A first guide part

51B second guide part 511 translation section

511A first translation section 511B second translation section

512 jacking section 512A first jacking section

512B second jacking section 60 first translation guide unit

61 The first slide rail 62 The first slider

63 The first driving source 631 The first cylinder block

632 the first telescopic rod 70 the second translation guide unit

71 Second slide rail 72 Second slider

73 The second drive source 731 The second cylinder block

732 Second telescopic rod D1 First direction

D2 second direction T tray

E1 first end E2 second end

C connecting plate θ jacking angle

θ1 first jacking angle θ2 second jacking angle

Detailed ways

Please refer to FIG. 1 . FIG. 1 is a three-dimensional appearance view of an embodiment of an electronic component testing device of the present invention. In one embodiment, the electronic component testing device includes a body 10 , a testing module 30 , a carrying platform 40 and a lifting guide 50 . The test module 30 , the carrying platform 40 and the lifting guide 50 are disposed on the machine body 10 . The carrying platform 40 is used for carrying the tray (Tray) T and can be displaced along the first direction D1 relative to the testing module 30 . The lifting guide 50 moves along the second direction D2 perpendicular to the first direction D1, and drives the carrier table 40 to displace the tray T along the first direction D1 so as to be close to the test module 30 and be tested by the test module 30 . Thereby, the height of the whole device in the first direction D1 is reduced by disposing the lifting guide 50 and the carrying table 40 in different displacement directions, thereby reducing the overall volume occupation and improving the space utilization rate for disposing the electronic component testing device.

Referring to FIG. 1 , in one embodiment, the machine body 10 has a first bracket 11 and a second bracket 12 , and the first bracket 11 and the second bracket 12 are located at different positions in the second direction D2.

1 and 2, in one embodiment, the electronic component testing device further includes a test host 20, the test host 20 can be arranged on the first bracket 11 of the body 10 and electrically connected with the test module 30, or can be It is independent from the body 10 and is electrically connected to the test module 30 . The test host 20 can further include a control panel 21 , which is disposed on the end of the first rack 11 away from the second rack 12 for the operator to control the test host 20 .

Please refer to Fig. 1 and Fig. 3 again, the test module 30 has a test surface 31 and is arranged on the second support frame 12 of the body 10, the test module 30 is electrically connected with the test host 20, so that the test host 20 can control the test Module 30 conducts the test and receives the test results. The test surface 31 of the test module 30 has a plurality of test terminals, and a plurality of electronic components are housed in the tray T, and the test module 30 is tested with the test terminals of the test surface 31 contacting the electronic components in the tray T, and the electronic components can be placed after the test. The test results are sent to the test host 20.

Next, please refer to FIG. 3 , the carrying platform 40 is used to carry the tray T to be displaced along the first direction D1 to approach the testing module 30 to be tested by the testing module 30 . Moreover, the carrying platform 40 can also be displaceably disposed on the body 10 along the second direction D2 at the same time. In this way, the carrying platform 40 can be displaced to a position different from that of the testing module 30 in the second direction D2. In this way, the carrying platform 40 can be moved to a position where the position of the tray T is completely separated from the testing module 30 , so that the tray T can be removed and placed.

And when the test is to be performed, the carrying platform 40 is moved to the same position as the test module 30 in the second direction D2, as shown in FIGS. 4 to 6 . Here, the carrying platform 40 has a matching portion 44 . The lifting guide 50 is movably disposed on the machine body 10 along the second direction D2 perpendicular to the first direction D1 , and the lifting guide 50 has a guiding portion 51 . When the lifting guide 50 is displaced along the second direction D2 , the matching portion 44 of the carrying platform 40 is guided by the guiding portion 51 to be displaced along the first direction D1 .

In one embodiment, referring to FIG. 4 to FIG. 6 , the carrying platform 40 is disposed at the same position in the second direction D2 as the testing module 30 , but not limited thereto. The carrying platform 40 includes a base plate 41 , a lifting plate 42 , two side plates 43 and a matching portion 44 . A guide post 411 is disposed on the substrate 41 , and the guide post 411 extends along the first direction D1. The lifting plate 42 is movably sheathed on the guide post 411 and can slide along the first direction D1. The two side plates 43 are respectively fixed on the two sides of the lifting plate 42 to be lifted and lowered synchronously with the lifting plate 42 . The matching portion 44 is disposed on the side plate 43 to act synchronously with the side plate 43 . In one embodiment, the matching portion 44 is a cam. Here, the lifting plate 42 of the loading platform 40 is displaced along the first direction D1 with respect to the testing module 30 synchronously with the side plate 43 and the matching portion 44 . In one embodiment, the matching portions 44 are disposed on the two side plates 43 .

Please refer to FIG. 6 again, the lifting guide 50 is arranged on the machine body 10 so as to be movable along the second direction D2, and the lifting guide 50 moves along the second direction D2 to guide the carrier platform 40 to move close to or along the first direction D1. away from the test module 30 . In one embodiment, the lifting guide 50 has a guide portion 51 , and the guide portion 51 is a continuously extending guide groove. Further, the guide part 51 has a first end E1 and a second end E2, the first end E1 and the second end E2 are located at different positions in the first direction D1, and the first end E1 and the second end E2 are also located at different positions. on the position of the second direction D2. When the lifting guide 50 is displaced along the second direction D2, and is displaced to the position where the guiding portion 51 of the lifting guide 50 overlaps with the matching portion 44 in the second direction D2, the guiding portion of the lifting guide 50 51 first contacts the matching portion 44 from the first end E1 , so that the matching portion 44 is accommodated into the guiding portion 51 to be guided by the guiding portion 51 .

Here, with reference to FIG. 8 to FIG. 10 , when the lifting guide 50 continues to move along the second direction D2, the guiding portion 51 of the lifting guide 50 continues to change its position relative to the matching portion 44, and the guiding portion 51 The position of the relative matching portion 44 gradually changes from the first end E1 to the second end E2. When the guide portion 51 changes from the position of the first end E1 relative to the mating portion 44 to the position of the second end E2 relative to the mating portion 44, the mating portion 44 is supported by the first end E1 and the second end E2 in the first direction D1. The position is changed correspondingly, and the matching portion 44 together with the side plate 43 and the lifting plate 42 changes its position in the first direction D1 and gradually approaches the testing module 30 so that the tested module 30 can be tested.

Referring to Fig. 6 and Fig. 10, further, in one embodiment, the guide part 51 includes at least a jacking section 512, the two ends of the jacking section 512 are located at different positions in the first direction D1, and the jacking section 512 and There is a jacking angle θ between the second directions D2. The guide part 51 may also include a plurality of jacking sections 512 connected in sequence. When the guide part 51 includes a plurality of jacking sections 512, each jacking section 512 has a jacking angle θ with the second direction D2 respectively, And the closer the position of the test module 30 in the first direction D1 is to the smaller the jacking angle θ of the jacking section 512 is. In this way, the carrying platform 40 can contact the testing module 30 at a low-speed and high-thrust state.

In an embodiment, referring to FIG. 6 and FIG. 10 , the guide part 51 may further include a translation section 511 , and the guide part 51 may be composed of a translation section 511 and a jacking section 512 in combination. Here, the guiding part 51 includes a first translation section 511A, a first jacking section 512A, a second jacking section 512B, and a second translation section 511B connected in sequence. The first translation section 511A extends along the second direction D2, the first jacking section 512A has a first jacking angle θ1 with the second direction D2, and the second jacking section 512B has a second jacking angle θ2 with the second direction D2, The second translation segment 511B extends along the second direction D2. The first jacking angle θ1 is greater than the second jacking angle θ2. The first translation section 511A, the first lifting section 512A, the second lifting section 512B and the second translation section 511B do not overlap in the second direction D2.

Thus, referring to FIG. 6 and FIG. 10 , the matching portion 44 is correspondingly accommodated in the first translation section 511A, and when a force in the second direction D2 is applied to the lifting guide 50 , due to the force applied to the lifting guide 50 The direction coincides with the extension direction of the first translation section 511A, and the first translation section 511A produces the least resistance to the lifting guide 50, that is, the force in the second direction D2 applied to the lifting guide 50 consumes less energy, so The lifting guide 50 can be quickly and reliably driven to move along the second direction D2, and accordingly the carrying platform 40 can be quickly aligned at the correct guided position.

Next, when the matching portion 44 enters the first jacking section 512A from the translation section 511, the first jacking section 512A and the second direction D2 have a jacking angle θ so that the matching section 44 is guided to change to the first jacking section 512A. A position on D1 in one direction. And because the first jacking section 512A has a larger jacking angle θ with the second direction D2 than the second jacking section 512B and the second translation section 511B, therefore, in comparison, the lifting guide 50 Under the premise of the same displacement along the second direction D2, the matching portion 44 can be guided in the first lifting section 512A to generate a larger lifting distance in the first direction D1. Therefore, within the guiding range of the first lifting section 512A, the matching portion 44 of the carrying platform 40 can quickly drive the carrying platform 40 to be lifted close to the testing module 30 .

Next, when the matching portion 44 enters the second lifting section 512B from the first lifting section 512A, since the second lifting angle θ2 is smaller than the first lifting angle θ1, the second lifting section 512B drives the carrying platform 40 to The speed at which the test module 30 is displaced is reduced. In this way, the speed of the tray T on the loading platform 40 is reduced to contact the test module 30. At the same time, due to the reduction of the second jacking angle θ2, the force applied to the lifting guide 50 is located at the first position relative to the matching portion 44. The resistance suffered by the first lifting section 512A is reduced, so the thrust force when the bearing platform 40 contacts the test module 30 can be increased, so that the bearing platform 40 contacts the test module 30 at a slow speed and with a high thrust, so as to ensure that the inner space of the tray T is stable. The electronic components can be reliably tested in contact with the test terminals of the test module 30, which improves the stability of the test.

Next, referring to Fig. 8 to Fig. 10, the matching part 44 enters the second translation section 511B from the second jacking section 512B, when the matching part 44 enters the second translation section 511B, the second translation section 511B extends along the second direction D1 The structure keeps the carrying platform 40 at the same height, while the matching portion 44 can be kept away from the second jacking section 51B, ensuring that the matching portion 44 will not easily return to the second jacking section 51B, so that the carrying platform 40 can be positioned more stably. Tested location.

As can be seen from the above description, in one embodiment of the electronic component testing device of the present invention, the mechanism that drives the carrier platform 40 carrying the tray T to move along the first direction D1 does not need to be extended in the first direction D1, but can be arranged along the vertical second direction. The one direction D1 is arranged in the second direction D2. In this way, the overall mechanism of this embodiment is not limited to the displacement action of the carrying platform 40 and the height of the overall mechanism in the first direction D1 is increased. In this way, the degree of freedom in spatial configuration and use of the electronic component testing device of this embodiment is improved.

Further, in order to facilitate the picking and placing of the tray T on the carrier platform 40 , please refer to FIG. 3 and FIG. 4 , which further includes a first translation guiding unit 60 . The first translation guiding unit 60 is disposed on the machine body 10 , and the carrying platform 40 is connected to the first translation guiding unit 60 and can be displaced along the second direction D2 . In one embodiment, the first translation guiding unit 60 includes a first slide rail 61 and a first slide block 62, the first slide rail 61 is fixedly arranged on the carrying platform 40 and extends along the second direction D2, the first slide rail 61 is movably fitted on the first sliding block 62 , and the first sliding block 62 is fixed on the machine body 10 .

Thereby, the supporting platform 40 can be displaced along the second direction D2 to a position not overlapping with the testing module 30 in the second direction D2 through the cooperative guidance of the first sliding rail 61 and the first sliding block 62 . In this way, the carrying platform 40 does not overlap with the test module 30 in the first direction D1, and the carrying platform 40 becomes an open state in the first direction D1, and the tray T can be placed on the carrying platform 40 from the first direction D1. Therefore, the convenience of taking and placing the tray T on the carrier platform 40 is improved accordingly.

Furthermore, please refer to FIG. 3 and FIG. 4 together. In order to improve the displacement accuracy and efficiency of the carrying platform 40 to meet high-efficiency testing, the first translation guide unit 60 may further include a first driving source 63, the first The driving source 63 may be a cylinder, but not limited thereto. When the first driving source 63 is a cylinder, the first driving source 63 includes a first cylinder body 631 and a first telescopic rod 632 . The first cylinder body 631 is fixedly arranged on the machine body 10, and the first telescopic rod 632 is arranged in the first cylinder body 631 so as to be telescopically displaceable along the second direction D2. One end of the first telescopic rod 632 extends out of the first cylinder body 631 and is fixed. on the substrate 41 . In this way, when the first cylinder 631 is in operation, the first telescopic rod 632 of the first cylinder 631 moves and expands along the second direction D2. Here, the first telescopic rod 632 can drive the base plate 41 and the lifting plate on it. 42. The side plate 43 and the matching portion 44 move along the second direction D2. In addition, the first driving source 63 can be controlled and connected to the test host 20, so that the test host 20 can control the first drive source 63 to achieve precise and automatic operation.

The first driving source 63 can be extended on the body 10 along the second direction D2, whereby the space occupied by the first driving source 63 for driving the first translation guide unit 60 in the first direction D1 will not be larger than that of the carrying platform. 40 space occupied by itself. That is, the space occupied by the first translation guiding unit 60 in the first direction D1 is not increased due to the arrangement of the first driving source 63 .

In addition, in order to improve the convenience and smoothness of the operation of the lifting guide 50 , please refer to FIG. 7 and FIG. 8 , which further includes a second translation guide unit 70 . The second translation guiding unit 70 is disposed on the machine body 10 , and the lifting guide 50 is connected to the second translation guiding unit 70 and can be displaced along the second direction D2. In one embodiment, the second translation guiding unit 70 includes a second sliding rail 71 and a second sliding block 72, the second sliding rail 71 extends along the second direction D2, and the second sliding block 72 is movably covered on the second sliding block 72. Two sliding rails 71 , and the lifting guide 50 is connected to the second sliding block 72 .

Thereby, the lifting guide 50 can be displaced along the second direction D2 through the cooperation of the second sliding block 72 and the second sliding rail 71 , thereby improving the smoothness and efficiency of the displacement of the lifting guide 50 . Furthermore, the second translation guiding unit 70 may further include a second driving source 73, and the second driving source 73 may be a cylinder, but not limited thereto.

With reference to Fig. 7 and Fig. 8, when the second driving source 73 is a pressure cylinder, the second driving source 73 can be connected with the control of the test host 20, so that the test host 20 can control the second drive source 73 to achieve precise and accurate Automated operation. When the second driving source 73 is a cylinder, the second driving source 73 includes a second cylinder body 731 and a second telescopic rod 732 . And in order to cooperate with the matching portion 44 of the two side plates 43 of the carrying platform 40, the two sides of the carrying platform 40 are respectively provided with lifting guides 50, and the two lifting guides 50 are connected by a connecting plate C. Here, the second cylinder body 731 is fixedly arranged on the machine body 10, and the second telescopic rod 732 is disposed in the second cylinder body 731 so as to be telescopically displaceable along the second direction D2, and one end of the second telescopic rod 732 extends out of the second cylinder body 731 and fixed on the connecting plate C. In this way, when the second cylinder 731 is in operation, the second telescopic rod 732 of the second cylinder 731 moves and expands along the second direction D2. Here, the second telescopic rod 732 can drive the connecting plate C and the two lifting guides The member 50 moves along the second direction D2.

Similarly, referring to FIG. 7 and FIG. 8 , the second driving source 73 is disposed on the machine body 10 extending along the second direction D2 . Thereby, the space occupied by the second driving source 73 driving the second translation guiding unit 70 in the first direction D1 will not be larger than the space occupied by the carrying platform 40 itself. That is, the space occupied by the second translation guiding unit 70 in the first direction D1 is not increased due to the arrangement of the driving source 73 . In this way, the electronic component testing device of this embodiment can reduce the space occupied in the first direction D1 as much as possible, so that when multiple electronic component testing devices are used at the same time, the electronic component testing device can be placed on the The overlapping arrangement in the first direction D1 can provide more electronic component testing devices under the premise of minimum space requirement, and improve the testing efficiency.

Further, neither the first driving source 63 nor the second driving source 73 is limited to the cylinder. Driven through the cooperation of gears and racks, through the cooperation of screws and nuts, or through the cooperation of belts and motors, are all other implementations that can be expected by those skilled in the art.

Please refer to FIG. 6 and FIG. 10 , in one embodiment, a first matching portion 44A and a second matching portion 44B are respectively provided on each side plate 43 of the carrying platform 40, and the first matching portion 44A and the second matching portion 44B are placed on Neither the first direction D1 nor the second direction D2 overlap. Here, the lifting guide 50 has a first guide portion 51A and a second guide portion 51B, and the range of the translation section 511 of the second guide portion 51B is in the second direction D2 with the whole of the first guide portion 51A. overlapping. In this way, there is a time difference between the time point when the first matching portion 44A enters the first guiding portion 51A and the time point when the second matching portion 44B enters the second guiding portion 51B. In this example, before the first matching portion 44A enters the first guiding portion 51A, the second matching portion 44B first enters the translation section 511 of the second guiding portion 51B. In this way, the second matching part 44B can cooperate with the translation section 511 of the second guiding part 51B to make the carrying platform 40 be located at the correct guided position, and can ensure that the second matching part 44B is in the condition of continuous displacement of the lifting guide part 50 . A fitting part 44A can enter the first guiding part 51A smoothly and correctly, and finally, the first fitting part 44A and the second fitting part 44B are accommodated in the first guiding part 51A and the second guiding part 51B respectively, and It can definitely drive the displacement of the carrying platform 40 .

Based on the above, in the embodiment of the above-mentioned electronic component testing device, the carrying platform 40 is carrying the tray T to drive the displacement of the tray T to the tested position for testing. Each displacement of the carrying platform 40 is to carry a plurality of electronic components in the tray T, The electronic component testing device can test multiple electronic components at one time in each test work, which can greatly improve the test efficiency.

In addition, when the types of electronic components are different, there is no need to replace the carrying platform 40, but as long as the electronic components are loaded on the tray T with the same appearance, the carrying platform 40 can successfully carry the tray T to drive the tray T to complete the test, thereby Improve the convenience of use.

Furthermore, in the electronic component testing device, the driving displacement direction for driving the carrying table 40 to displace along the first direction D1 is along the second direction D2 perpendicular to the first direction D1, so that the electronic component testing device can be reduced in the first direction D1 The volume allows the electronic component testing devices to be stacked in the first direction D1, increasing the number of electronic component testing devices that can be configured in the same space, and further increasing the testing capacity per unit space.

In addition, in terms of operational stability, since the bearing platform 40 contacts the testing module 30 in a displacement manner along the first direction D1 to be tested by the testing module 30, when the bearing platform 40 is in contact with the testing module 30, it must bear the first The force in one direction D1, instead of the guide part 51 extending along the first direction D1, can provide support and cushioning force when the carrying platform 40 is subjected to the force in the first direction D1, so as to ensure that the carrying platform 40 can be tested keep it steady.

Although the present invention has been disclosed above with the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field can make some modifications and changes without departing from the spirit and scope of the present invention. Therefore, as long as these modifications and changes are within the scope of the appended patent application and its equivalent scope, the present invention will also cover these modifications and changes.

Claims (11)

1. An electronic component testing device, characterized in that, comprising: a body; A test module is set on the body; a bearing platform, which can be displaceably arranged on the machine body along a first direction relative to the test module, and the bearing platform has a matching portion; and An elevating guide part is arranged on the machine body so as to move along a second direction perpendicular to the first direction, the elevating guide part has a guide part, and the guide part has a first end and a second end end, the first end and the second end are located at different positions in the first direction, when the guide part overlaps with the matching part in the second direction, the matching part guides with respect to the guide part. resulting in a displacement along the first direction. 2 . The electronic component testing device as claimed in claim 1 , further comprising a test host disposed on the body, and the test host is electrically connected to the test module. 3 . 3. The electronic component testing device according to claim 1, further comprising a first translation guide unit disposed on the body, the carrying platform is connected to the first translation guide unit and can move along the first translation guide unit displacement in two directions. 4. The electronic component testing device according to claim 1, further comprising a second translation guide unit disposed on the body, the lifting guide connected to the second translation guide unit and capable of moving along the The second direction is displaced. 5. The electronic component testing device as claimed in claim 4, further comprising a second driving source disposed on the body, the second driving source connected to the second translation guide unit to drive the second The translation guiding unit drives the lifting guide to displace along the second direction. 6. The electronic component testing device according to claim 1, wherein the matching portion is a cam, and the guiding portion is a groove guide. 7 . The electronic component testing device as claimed in claim 1 , wherein the guiding part comprises a jacking section, and the jacking section extends obliquely and has a jacking angle with the second direction. 8. The electronic component testing device according to claim 7, wherein the guide part comprises a plurality of jacking sections, the plurality of jacking sections are located at different positions in the first direction, and the plurality of jacking sections The segments respectively have a jacking angle with the second direction, and the jacking angles of the jacking segments closer to the position of the test module in the first direction are smaller. 9. The electronic component testing device according to claim 7, wherein the guiding part further comprises a translation section, the translation section is connected to the jacking section, the translation section extends along the second direction, and the translation section The segment and the jacking segment are located at different positions in the second direction, the first end is located at the translation segment, and the second end is located at the jacking segment. 10. The electronic component testing device according to claim 9, wherein the matching portion includes a first matching portion and a second matching portion, and the lifting guide includes a first guiding portion and a second guiding portion guide part, when the lifting guide overlaps with the carrying platform in the second direction, the first matching part is accommodated in the first guiding part, and the second matching part is accommodated in the second guiding part In the Ministry of Citation. 11 . The electronic component testing device as claimed in claim 10 , wherein the range of the translation section of the second guiding part overlaps with the whole of the first guiding part in the second direction.