CN108546937A - 低温镀镍液、镀镍工艺、柔性镀镍层及柔性印制电路板 - Google Patents
低温镀镍液、镀镍工艺、柔性镀镍层及柔性印制电路板 Download PDFInfo
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- CN108546937A CN108546937A CN201810342245.0A CN201810342245A CN108546937A CN 108546937 A CN108546937 A CN 108546937A CN 201810342245 A CN201810342245 A CN 201810342245A CN 108546937 A CN108546937 A CN 108546937A
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- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 title claims abstract description 162
- 238000007747 plating Methods 0.000 title claims abstract description 93
- 229910052759 nickel Inorganic materials 0.000 title claims abstract description 80
- 238000000576 coating method Methods 0.000 title claims abstract description 50
- 239000011248 coating agent Substances 0.000 title claims abstract description 48
- 239000007788 liquid Substances 0.000 title claims abstract description 41
- 238000005516 engineering process Methods 0.000 title claims abstract description 21
- 239000003795 chemical substances by application Substances 0.000 claims abstract description 9
- 239000008139 complexing agent Substances 0.000 claims abstract description 9
- 239000000203 mixture Substances 0.000 claims abstract description 8
- 239000003638 chemical reducing agent Substances 0.000 claims abstract description 7
- 150000002815 nickel Chemical class 0.000 claims abstract description 7
- 239000003381 stabilizer Substances 0.000 claims abstract description 7
- 238000004364 calculation method Methods 0.000 claims abstract description 3
- 239000000654 additive Substances 0.000 claims description 15
- 230000000996 additive effect Effects 0.000 claims description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 11
- 229910052802 copper Inorganic materials 0.000 claims description 11
- 239000010949 copper Substances 0.000 claims description 11
- 241001424392 Lucia limbaria Species 0.000 claims description 9
- DHMQDGOQFOQNFH-UHFFFAOYSA-N Glycine Chemical compound NCC(O)=O DHMQDGOQFOQNFH-UHFFFAOYSA-N 0.000 claims description 8
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 claims description 6
- -1 glycolic Substances 0.000 claims description 5
- BJEPYKJPYRNKOW-REOHCLBHSA-N (S)-malic acid Chemical compound OC(=O)[C@@H](O)CC(O)=O BJEPYKJPYRNKOW-REOHCLBHSA-N 0.000 claims description 4
- PQMOXTJVIYEOQL-UHFFFAOYSA-N Cumarin Natural products CC(C)=CCC1=C(O)C(C(=O)C(C)CC)=C(O)C2=C1OC(=O)C=C2CCC PQMOXTJVIYEOQL-UHFFFAOYSA-N 0.000 claims description 4
- 239000004471 Glycine Substances 0.000 claims description 4
- OAKJQQAXSVQMHS-UHFFFAOYSA-N Hydrazine Chemical compound NN OAKJQQAXSVQMHS-UHFFFAOYSA-N 0.000 claims description 4
- FSOGIJPGPZWNGO-UHFFFAOYSA-N Meomammein Natural products CCC(C)C(=O)C1=C(O)C(CC=C(C)C)=C(O)C2=C1OC(=O)C=C2CCC FSOGIJPGPZWNGO-UHFFFAOYSA-N 0.000 claims description 4
- BJEPYKJPYRNKOW-UHFFFAOYSA-N alpha-hydroxysuccinic acid Natural products OC(=O)C(O)CC(O)=O BJEPYKJPYRNKOW-UHFFFAOYSA-N 0.000 claims description 4
- ZYGHJZDHTFUPRJ-UHFFFAOYSA-N coumarin Chemical compound C1=CC=C2OC(=O)C=CC2=C1 ZYGHJZDHTFUPRJ-UHFFFAOYSA-N 0.000 claims description 4
- 239000001630 malic acid Substances 0.000 claims description 4
- 235000011090 malic acid Nutrition 0.000 claims description 4
- 150000002894 organic compounds Chemical class 0.000 claims description 4
- KDYFGRWQOYBRFD-UHFFFAOYSA-N Succinic acid Natural products OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 claims description 3
- KDYFGRWQOYBRFD-NUQCWPJISA-N butanedioic acid Chemical compound O[14C](=O)CC[14C](O)=O KDYFGRWQOYBRFD-NUQCWPJISA-N 0.000 claims description 3
- ACVYVLVWPXVTIT-UHFFFAOYSA-M phosphinate Chemical compound [O-][PH2]=O ACVYVLVWPXVTIT-UHFFFAOYSA-M 0.000 claims description 3
- 235000019260 propionic acid Nutrition 0.000 claims description 3
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 claims description 3
- JJJOZVFVARQUJV-UHFFFAOYSA-N 2-ethylhexylphosphonic acid Chemical compound CCCCC(CC)CP(O)(O)=O JJJOZVFVARQUJV-UHFFFAOYSA-N 0.000 claims description 2
- 108010010803 Gelatin Proteins 0.000 claims description 2
- 150000001412 amines Chemical class 0.000 claims description 2
- 229910000085 borane Inorganic materials 0.000 claims description 2
- 229920000159 gelatin Polymers 0.000 claims description 2
- 239000008273 gelatin Substances 0.000 claims description 2
- 235000019322 gelatine Nutrition 0.000 claims description 2
- 235000011852 gelatine desserts Nutrition 0.000 claims description 2
- 238000006197 hydroboration reaction Methods 0.000 claims description 2
- 125000001434 methanylylidene group Chemical group [H]C#[*] 0.000 claims description 2
- YZMHQCWXYHARLS-UHFFFAOYSA-N naphthalene-1,2-disulfonic acid Chemical group C1=CC=CC2=C(S(O)(=O)=O)C(S(=O)(=O)O)=CC=C21 YZMHQCWXYHARLS-UHFFFAOYSA-N 0.000 claims description 2
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical group [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 claims description 2
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 claims description 2
- 229940081974 saccharin Drugs 0.000 claims description 2
- CVHZOJJKTDOEJC-UHFFFAOYSA-N saccharin Chemical compound C1=CC=C2C(=O)NS(=O)(=O)C2=C1 CVHZOJJKTDOEJC-UHFFFAOYSA-N 0.000 claims description 2
- 235000019204 saccharin Nutrition 0.000 claims description 2
- 239000000901 saccharin and its Na,K and Ca salt Substances 0.000 claims description 2
- UORVGPXVDQYIDP-UHFFFAOYSA-N trihydridoboron Substances B UORVGPXVDQYIDP-UHFFFAOYSA-N 0.000 claims description 2
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 claims 3
- RGHNJXZEOKUKBD-SQOUGZDYSA-N D-gluconic acid Chemical group OC[C@@H](O)[C@@H](O)[C@H](O)[C@@H](O)C(O)=O RGHNJXZEOKUKBD-SQOUGZDYSA-N 0.000 claims 2
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 claims 2
- RGHNJXZEOKUKBD-UHFFFAOYSA-N D-gluconic acid Natural products OCC(O)C(O)C(O)C(O)C(O)=O RGHNJXZEOKUKBD-UHFFFAOYSA-N 0.000 claims 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 claims 1
- 229910021586 Nickel(II) chloride Inorganic materials 0.000 claims 1
- YDONNITUKPKTIG-UHFFFAOYSA-N [Nitrilotris(methylene)]trisphosphonic acid Chemical compound OP(O)(=O)CN(CP(O)(O)=O)CP(O)(O)=O YDONNITUKPKTIG-UHFFFAOYSA-N 0.000 claims 1
- IKHGUXGNUITLKF-XPULMUKRSA-N acetaldehyde Chemical compound [14CH]([14CH3])=O IKHGUXGNUITLKF-XPULMUKRSA-N 0.000 claims 1
- MQRWBMAEBQOWAF-UHFFFAOYSA-N acetic acid;nickel Chemical compound [Ni].CC(O)=O.CC(O)=O MQRWBMAEBQOWAF-UHFFFAOYSA-N 0.000 claims 1
- 239000002253 acid Substances 0.000 claims 1
- 210000000481 breast Anatomy 0.000 claims 1
- 239000000174 gluconic acid Substances 0.000 claims 1
- 235000012208 gluconic acid Nutrition 0.000 claims 1
- ICIWUVCWSCSTAQ-UHFFFAOYSA-M iodate Chemical compound [O-]I(=O)=O ICIWUVCWSCSTAQ-UHFFFAOYSA-M 0.000 claims 1
- 229940078494 nickel acetate Drugs 0.000 claims 1
- QMMRZOWCJAIUJA-UHFFFAOYSA-L nickel dichloride Chemical compound Cl[Ni]Cl QMMRZOWCJAIUJA-UHFFFAOYSA-L 0.000 claims 1
- LVIYYTJTOKJJOC-UHFFFAOYSA-N nickel phthalocyanine Chemical compound [Ni+2].C12=CC=CC=C2C(N=C2[N-]C(C3=CC=CC=C32)=N2)=NC1=NC([C]1C=CC=CC1=1)=NC=1N=C1[C]3C=CC=CC3=C2[N-]1 LVIYYTJTOKJJOC-UHFFFAOYSA-N 0.000 claims 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 claims 1
- 229910052708 sodium Inorganic materials 0.000 claims 1
- 239000011734 sodium Substances 0.000 claims 1
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 11
- 230000004075 alteration Effects 0.000 abstract description 5
- 230000015572 biosynthetic process Effects 0.000 abstract description 3
- 229910021645 metal ion Inorganic materials 0.000 abstract description 2
- 239000000126 substance Substances 0.000 description 14
- 238000012360 testing method Methods 0.000 description 10
- 238000010586 diagram Methods 0.000 description 7
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 7
- JVTAAEKCZFNVCJ-UHFFFAOYSA-N lactic acid Chemical compound CC(O)C(O)=O JVTAAEKCZFNVCJ-UHFFFAOYSA-N 0.000 description 6
- NLKNQRATVPKPDG-UHFFFAOYSA-M potassium iodide Chemical compound [K+].[I-] NLKNQRATVPKPDG-UHFFFAOYSA-M 0.000 description 6
- 238000005452 bending Methods 0.000 description 5
- KWSLGOVYXMQPPX-UHFFFAOYSA-N 5-[3-(trifluoromethyl)phenyl]-2h-tetrazole Chemical compound FC(F)(F)C1=CC=CC(C2=NNN=N2)=C1 KWSLGOVYXMQPPX-UHFFFAOYSA-N 0.000 description 4
- IKHGUXGNUITLKF-UHFFFAOYSA-N Acetaldehyde Chemical compound CC=O IKHGUXGNUITLKF-UHFFFAOYSA-N 0.000 description 4
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical class O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 4
- MSNOMDLPLDYDME-UHFFFAOYSA-N gold nickel Chemical compound [Ni].[Au] MSNOMDLPLDYDME-UHFFFAOYSA-N 0.000 description 4
- 229910001379 sodium hypophosphite Inorganic materials 0.000 description 4
- UMGDCJDMYOKAJW-UHFFFAOYSA-N thiourea Chemical compound NC(N)=S UMGDCJDMYOKAJW-UHFFFAOYSA-N 0.000 description 4
- FTLYMKDSHNWQKD-UHFFFAOYSA-N (2,4,5-trichlorophenyl)boronic acid Chemical compound OB(O)C1=CC(Cl)=C(Cl)C=C1Cl FTLYMKDSHNWQKD-UHFFFAOYSA-N 0.000 description 3
- 208000037656 Respiratory Sounds Diseases 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 239000004310 lactic acid Substances 0.000 description 3
- 235000014655 lactic acid Nutrition 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229940085605 saccharin sodium Drugs 0.000 description 3
- 239000004094 surface-active agent Substances 0.000 description 3
- 229910000990 Ni alloy Inorganic materials 0.000 description 2
- 239000008118 PEG 6000 Substances 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 229920002584 Polyethylene Glycol 6000 Polymers 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 229910001385 heavy metal Inorganic materials 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 239000000080 wetting agent Substances 0.000 description 2
- NAOLWIGVYRIGTP-UHFFFAOYSA-N 1,3,5-trihydroxyanthracene-9,10-dione Chemical compound C1=CC(O)=C2C(=O)C3=CC(O)=CC(O)=C3C(=O)C2=C1 NAOLWIGVYRIGTP-UHFFFAOYSA-N 0.000 description 1
- KXDHJXZQYSOELW-UHFFFAOYSA-N Carbamic acid Chemical compound NC(O)=O KXDHJXZQYSOELW-UHFFFAOYSA-N 0.000 description 1
- 229910018828 PO3H2 Inorganic materials 0.000 description 1
- 239000005864 Sulphur Substances 0.000 description 1
- 235000009754 Vitis X bourquina Nutrition 0.000 description 1
- 235000012333 Vitis X labruscana Nutrition 0.000 description 1
- 235000014787 Vitis vinifera Nutrition 0.000 description 1
- 240000006365 Vitis vinifera Species 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 150000007933 aliphatic carboxylic acids Chemical class 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 229910001451 bismuth ion Inorganic materials 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 238000006555 catalytic reaction Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000008367 deionised water Substances 0.000 description 1
- 229910021641 deionized water Inorganic materials 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 150000002171 ethylene diamines Chemical class 0.000 description 1
- 125000002485 formyl group Chemical class [H]C(*)=O 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 150000002484 inorganic compounds Chemical class 0.000 description 1
- 150000002497 iodine compounds Chemical class 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910001453 nickel ion Inorganic materials 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- JRKICGRDRMAZLK-UHFFFAOYSA-L peroxydisulfate Chemical compound [O-]S(=O)(=O)OOS([O-])(=O)=O JRKICGRDRMAZLK-UHFFFAOYSA-L 0.000 description 1
- 150000003009 phosphonic acids Chemical class 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- MZSDGDXXBZSFTG-UHFFFAOYSA-M sodium;benzenesulfonate Chemical compound [Na+].[O-]S(=O)(=O)C1=CC=CC=C1 MZSDGDXXBZSFTG-UHFFFAOYSA-M 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 241000894007 species Species 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/32—Coating with nickel, cobalt or mixtures thereof with phosphorus or boron
- C23C18/34—Coating with nickel, cobalt or mixtures thereof with phosphorus or boron using reducing agents
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/32—Coating with nickel, cobalt or mixtures thereof with phosphorus or boron
- C23C18/34—Coating with nickel, cobalt or mixtures thereof with phosphorus or boron using reducing agents
- C23C18/36—Coating with nickel, cobalt or mixtures thereof with phosphorus or boron using reducing agents using hypophosphites
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Chemically Coating (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
本发明提供一种低温镀镍液,由镍盐和仅含非金属元素的组合物组成,所述镍盐的含量为:以Ni2+的含量计算为4.0‑8.0g/L,所述仅含非金属元素的组合物包含的各组份及含量为:还原剂,10‑50g/L;络合剂,20‑100g/L;稳定剂,0.0001‑0.5g/L;促进剂,0.001‑1g/L。该镀镍液只含有镍一种金属离子,环保低能耗;通过该低温镀镍液,可以对柔性电路基板在低于80℃以下进行施镀,形成的柔性镀镍层呈柱状,耐挠折性能好,且很好地改善了渗镀、漏镀及色差现象。本发明还提供基于上述低温镀镍液的一种低温镀镍工艺、由该工艺制得的柔性镀镍层及包含该柔性镀镍层的柔性印制电路板。
Description
技术领域
本发明涉及化学镀镍技术领域,尤其是涉及柔性印制电路板的低温镀镍工艺、低温镀镍工艺用的低温镀镍液及采用上述镀镍工艺完成的柔性镀镍层,及包含该柔性镀镍层的柔性印制电路板。
背景技术
随着智能穿戴柔性电子的迅猛发展,柔性印制电路板(Flexible PrintedCircuit(FPC),以下简称柔性板)的需求及应用日趋广泛。特别是由于其轻薄、可弯曲、低电压、低消耗功率等特性,被广泛应用于笔记本电脑、液晶显示器、硬盘、打印机等电子产品中。然而,随着产品的不断升级,对柔性板的耐弯曲性能的要求也更加严苛。
化学镍金工艺是印制电路板生产的最终制程之一。传统的表面处理化学镍金工艺,由于得到的镍合金镀层呈层状结构(图1),具有较大的应力,在表面贴装过程中容易产生裂纹,从而不能满足现代智能穿戴柔性电子对其耐弯曲性能的要求。
由于柱状化学镍层(图2)应力相对低,具有相对好的延展性,对于解决挠曲弯折引起的镀层裂纹是比较有希望的。为了使化学镀镍柱状生长,往往加入柱状生长的添加剂,使镍合金镀层在铜基体上柱状生长。
三星公司在CN101760731A/US20100155108A1利用铊离子、铋离子来作为柱状生长诱发剂形成具有柱状结构的镍镀层。CN105018904A采用乙二胺类来作为柱状镍添加剂,含硫化合物做为加速剂,得到耐弯折的镀镍层。这些柱状镀镍层的施镀温度在80-90℃。
安美特公司的JANSSEN BORIS ALEXANDER在专利TW201341588A/EP2628824A1中,公开了用重金属铅作为稳定剂,甲醛及甲醛的衍生物作为添加剂,诱导生成延展性好的柱状镀镍层。2006年,日本上村公司的TADAMASANORI和KUZUHAZAAKIRA用一种氨基羧酸盐做络合剂,生成了柱状镀镍层。这些镀镍层容易出现过厚或过,使得在大与小铜面上的厚度差别最多能达到25%以上。
除此之外,传统的镀镍工艺还易造成渗镀、漏镀及色差(如图3所示)。
综上所述,现有的方法存在以下缺陷:1、大部分形成的镀镍层呈层状、应力较大、抗折弯能力差;2、很多的镀镍液中含有多种重金属离子,污染较大;3、施镀温度需要在高温下进行,即温度需要在80℃以上;4、采用现有方法所得到的镍镀层厚度在大与小铜面上的差别最多能达到25%以上,镀镍层容易出现过厚或过薄;5、所形成的镀镍层易造成渗镀、漏镀及色差。
发明内容
本发明旨在解决现有技术中存在的至少一个技术问题,为此,本发明提供了一种低温镀镍液,由镍盐和仅含非金属元素的组合物组成,所述镍盐的含量为:以Ni2+的含量计算为4.0-8.0g/L,所述仅含非金属元素的组合物包含的各组份及含量为:还原剂,10-50g/L;络合剂,20-100g/L;稳定剂,0.0001-0.5g/L;促进剂,0.001-1g/L;柔性添加剂,0.0001-0.1g/L。该镀镍液只含有镍一种金属离子,环保低能耗;通过该低温镀镍液,可以对柔性电路基板在低于80℃以下进行施镀,形成的柔性镀镍层呈柱状,耐挠折性能好,且很好地改善了渗镀,漏镀及色差现象。
本发明还提供一种低温镀镍工艺,具体步骤为:配制上述的低温镀镍液,将柔性电路基板放入所述低温镀镍液中,控制所述低温镀镍液的温度为40-70℃、pH值为4.0-7.0,化学镀镍时间为10-50分钟。
本发明还提供一种柔性镀镍层,所述柔性镀镍层经上述的低温镀镍工艺制得,所述柔性镀镍层呈柱状结构。
本发明再提供一种柔性印制电路板,包括柔性电路基板、上述柔性镀镍层,所述柔性电路基板上设有大铜面和小铜面,所述柔性镀镍层设置于所述大铜面和小铜面上,大、小铜面上的所述柔性镀镍层的厚度差别小于10%。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动性的前提下,还可以根据这些附图获得其他的附图。
图1为经过传统的化学镍金工艺得到的镀镍层呈层状结构的示意图;
图2为经过传统的化学镍金工艺得到的镀镍层断裂的示意图;
图3为经过传统的化学镍金工艺得到的镀镍层发生渗镀的示意图;
图4为经过本发明的低温镀镍工艺得到的柔性镀镍层呈柱状结构的示意图;
图5为本发明提供的柔性印制电路板的柔性镀镍层进行厚度测试时测试点的分布示意图;
图6为经过本发明的低温镀镍工艺得到的柔性镀镍层分布均匀的示意图;
图7为本发明提供的实施例1-3中所获得的柔性印制电路板的柔性镀镍层对对比示意图。
具体实施方式
下面将结合本发明的附图,对本发明的技术方案进行清楚、完整地描述,显然,所描述的实施例仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有作出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。
实施例1
本实施例提供一种低温镀镍液,包含的组份及含量如下:
硫酸镍:以Ni2+的含量计算为5.5g/L;
次亚磷酸钠:30g/L;
甘氨酸:5g/L;
乳酸:15g/L;
苹果酸:10g/L;
碘化钾:0.01g/L;
硫脲:0.003g/L;
香豆素:0.02g/L;
乙醛:0.005g/L;
其余为去离子水。
其中,次亚磷酸钠作为还原剂,甘氨酸、乳酸、苹果酸作为络合剂,碘化钾作为稳定剂,硫脲作为促进剂,香豆素、乙醛作为柔性添加剂。
本发明的还原剂,可选用现有化学镀镍液常用的还原剂,包括次亚磷酸盐、硼氢化物、胺硼烷、联氨的一种或多种。由于次亚磷酸钠的价格低、镀液容易控制,而且合金镀层性能良好,优选为次亚磷酸钠。
本发明的络合剂,可选用现有化学镀镍液常用的络合剂,其要求具有较大的溶解度并存在一定的反应活性,一般含有羟基、羧基或氨基,主要是一些脂肪族羧酸及其取代衍生物或其盐类。络合剂的作用是增加镀液稳定性、延长使用寿命并提高沉积速度。优选为葡萄糖酸、甘氨酸、乳酸、乙醇酸、丙酸、丁二酸、苹果酸、甲叉二膦酸(CH2(PO3H2)2)、氨基三甲叉膦酸(ATMP)的一种或多种。络合剂含量过低,槽液易出现浑浊,不稳定;含量过高,会影响到镍的沉积速度,并且增加成本。
本发明的稳定剂,可选用现有化学镀镍液常用的稳定剂。在镀液中加入一定量的吸附性强的无机或有机化合物,它们能优先吸附在有催化效应的活性微粒表面抑制催化反应从而稳定镀液,使镍离子的还原只发生在被镀件表面上,使施镀过程在控制下有序进行。优选为含硫有机物、含碘化合物中的一种或多种的混合物。含量过高,会降低镀速甚至使反应停止,而过低,则会使化学镀镍槽液不稳定。
本发明的促进剂,可选用现有化学镀镍液常用的促进剂,作用是使化学镀镍液既有高稳定性又有较快的沉积速度。
本发明的柔性添加剂,作用是使镍镀层结构从粗柱状结构变成细柱状结构。经过研究分析与实验验证,发现柔性添加剂为萘二磺酸钠、苯磺酸钠、糖精、明胶、丁炔二醇、乙醛、香豆素中的一种或多种。柔性添加剂的添加,使得镍镀层的柱状微观结构生长得更加细密,从而缓冲了弯折时给镍镀层施加的应力,提高镍镀层的耐弯折性。
按照上述各组分及含量配制好低温镀镍液后,将之用于柔性印制板的化学镀镍。低温镀镍工艺为:1,除油处理;2,微蚀处理:5%硫酸加6-10%的过硫酸盐;3,离子钯活化;4,镀镍处理:将柔性电路基板放入上述低温镀镍液中,控制上述低温镀镍液的温度为60-65℃,低温镀镍液的pH值为6.0-6.5,低温镀镍时间为20分钟。镀镍完成后获得柔性印制电路板A,如图5所示。
对获得的柔性印制电路板进行测试,包括镀镍层的形状测试、镀层表面状况测试、厚度测试及耐挠折性能。
通过扫描电子显微镜对镀镍层的截面进行观察,结果如图4所示,可见本实施例中的镀镍层呈柱状,且柱状的直径在0.01-0.1微米之间,故属于超细柱状结构。
通过扫描电子显微镜对镀镍层的表面状况进行观察,结果如图6所示,可知其成色较均匀,且很好地改善了渗镀、漏镀及色差现象。
厚度测试的具体方法为:如图5所示,对柔性印制电路板上的大铜面(测试点为3、4)、小铜面(测试点为1、2)上的镀镍层进行厚度测量,得到的测试结果如表1,可见所得到的镀镍层厚度在大铜面与小铜面上的差别在10%以下。
表1
耐挠折性能测试的主要方法为:将上述柔性印制电路板进行MIT挠折测试,测试条件为:测试板的一端负重500克,弯折处使用一根半径R=0.3厘米的细金属棒、左右各为135度,挠折次数为5000次。
实施例2
与实施例1不同的是,将上述低温镀镍液中的柔性添加剂的含量改为0.04g/L。
低温镀镍工艺参见实施例1,镀镍完成后获得柔性印制电路板B。
实施例3
与实施例1不同的是,将上述低温镀镍液中的柔性添加剂的含量改为0.08g/L。
低温镀镍工艺参见实施例1,镀镍完成后获得柔性印制电路板C。
对实施例1-3中的柔性印制电路板A、B、C上的镀镍层的柱状结构进行比对,结果如图7所示。
将实施例1-3中的柔性印制电路板A、B、C进行MIT挠折测试的结果如下表:
表2
| 测试项目 | 原铜材 | A | B | C |
| 挠折次数 | 1414 | 5000 | 5000 | 5000 |
| 阻值 | N/A | 4.8 | 0.89 | 0.86 |
从表2中可看出,原铜材经过1414次挠折后的阻值非常大,即裂纹明显、柔性较差;而将原铜材经过本发明提供的低温镀镍液及镀镍工艺处理,得到的实施例1-3中的电路板经过5000次挠折后的阻值不超过5,可见本发明提供的柔性印制电路板的柔性较好;而且从实施例1-3中可看出,柔性添加剂的含量越高,柔性印制电路板的柔性越好。
实施例4
与实施例1不同的是,在实施例1中的镀镍液中加入表面活性剂与糖精钠混合液,所述表面活性剂为PEG6000,其具体含量为:PEG6000:20mg/L;糖精钠混和液:2ml/L。
表面活性剂和糖精钠的加入用以提高镀镍层的光亮度和致密性。此外,本发明的低温化学镀镍液不排除还含有其他现有的化学镀镍液常用的添加剂,如润湿剂、光亮剂、缓冲剂等。其中,润湿剂、光亮剂可用于提高镀层的光亮度和致密性;缓冲剂能有效地控制溶液的pH值。这些常用添加剂可根据镀层的具体性能要求来灵活添加。以上所述,仅为本发明的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉本技术领域的技术人员在本发明揭露的技术范围内,可轻易想到变化或替换,都应涵盖在本发明的保护范围之内。因此,本发明的保护范围应以所述权利要求的保护范围为准。
Claims (10)
1.一种低温镀镍液,其特征在于,由镍盐和仅含非金属元素的组合物组成,所述镍盐的含量为:以Ni2+的含量计算为4.0-8.0g/L,所述仅含非金属元素的组合物包含的各组份及含量为:
还原剂,10-50g/L;
络合剂,20-100g/L;
稳定剂,0.0001-0.5g/L;
促进剂,0.001-1g/L;
柔性添加剂,0.0001-0.1g/L。
2.根据权利要求1所述的低温镀镍液,其特征在于,所述镍盐为硫酸镍、乙酸镍、氯化镍或次磷酸镍中的一种或多种。
3.根据权利要求1所述的低温镀镍液,其特征在于,所述还原剂为次亚磷酸盐、硼氢化物、胺硼烷、联氨中的一种或多种。
4.根据权利要求1所述的低温镀镍液,其特征在于,所述络合剂为葡萄糖酸、甘氨酸、乳酸、乙醇酸、丙酸、丁二酸、苹果酸、甲叉二膦酸、氨基三甲叉膦酸中的一种或多种。
5.根据权利要求1所述的低温镀镍液,其特征在于,所述稳定剂为含硫有机物、含碘化合物的一种或多种。
6.根据权利要求1所述的低温镀镍液,其特征在于,所述促进剂为含硫有机物、含氮有机物、丙二酸、丁二酸、氨基乙酸、丙酸中的一种或多种。
7.根据权利要求1所述的低温镀镍液,其特征在于,所述柔性添加剂为萘二磺酸钠、苯磺酸钠、糖精、明胶、丁炔二醇、乙醛、香豆素中的一种或多种。
8.一种低温镀镍工艺,其特征在于,具体步骤为:
配制权利要求1-7任一项所述的低温镀镍液,将柔性电路基板放入所述低温镀镍液中,控制所述低温镀镍液的温度为40-70℃、pH值为4.0-7.0,镀镍时间为10-50分钟。
9.一种柔性镀镍层,其特征在于,所述柔性镀镍层经由权利要求8所述的低温镀镍工艺制得,所述镀镍层呈柱状结构,所述柱状结构的直径范围为0.01-0.1微米。
10.一种柔性印制电路板,其特征在于,包括柔性电路基板、权利要求9所述的柔性镀镍层,所述柔性电路基板上设有大铜面和小铜面,所述大铜面与小铜面上均设有所述柔性镀镍层,大、小铜面上的所述柔性镀镍层的厚度差别小于10%。
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Application publication date: 20180918 |