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CN108028530A - 应用于数字集成电路的esd检测装置、集成电路及方法 - Google Patents

应用于数字集成电路的esd检测装置、集成电路及方法 Download PDF

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Publication number
CN108028530A
CN108028530A CN201680000576.5A CN201680000576A CN108028530A CN 108028530 A CN108028530 A CN 108028530A CN 201680000576 A CN201680000576 A CN 201680000576A CN 108028530 A CN108028530 A CN 108028530A
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Prior art keywords
esd
verification
module
trigger
read
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CN201680000576.5A
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CN108028530B (zh
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王光耀
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Shenzhen Goodix Technology Co Ltd
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Shenzhen Goodix Technology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
    • G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785—Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G11C2029/5002—Characteristic

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Computational Mathematics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Electromagnetism (AREA)
  • Probability & Statistics with Applications (AREA)
  • Operations Research (AREA)
  • Evolutionary Biology (AREA)
  • Algebra (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Debugging And Monitoring (AREA)
  • Detection And Correction Of Errors (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

本发明实施例提供一种应用于数字集成电路的ESD检测装置、集成电路及方法。本申请装置，包括：校验读控制模块，配置为发起对触发器集合模块的读操作；校验运算模块，配置为接收所述触发器集合模块根据所述读操作所传输的触发器值，根据所述触发器值进行校验计算，并根据所述校验计算结果与历史校验计算结果的比较确定是否存在ESD超限。本申请采用简单的电路结构对ESD超限进行检测，无需占用外部主控制器的资源，从而不会影响其他操作，且提高效率，能够实时的发现ESD超限。

Description

PCT国内申请，说明书已公开。

Claims (30)

  1. PCT国内申请，权利要求书已公开。
CN201680000576.5A 2016-07-12 2016-07-12 应用于数字集成电路的esd检测装置、集成电路及方法 Expired - Fee Related CN108028530B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2016/089755 WO2018010084A1 (zh) 2016-07-12 2016-07-12 应用于数字集成电路的esd检测装置、集成电路及方法

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CN108028530A true CN108028530A (zh) 2018-05-11
CN108028530B CN108028530B (zh) 2019-09-27

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US (1) US10359460B2 (zh)
EP (1) EP3288136B1 (zh)
KR (1) KR101925237B1 (zh)
CN (1) CN108028530B (zh)
WO (1) WO2018010084A1 (zh)

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CN117706260A (zh) * 2024-02-06 2024-03-15 禹创半导体(深圳)有限公司 Esd事件检测方法

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KR102079748B1 (ko) 2019-08-13 2020-02-20 정의한 Ｅｏｓ 예방을 위한 모니터링 시스템
CN115112979B (zh) * 2022-06-27 2025-02-18 集睿致远(厦门)科技有限公司 Esd事件的检测方法、装置、电子设备及存储介质
TWI854864B (zh) 2023-10-20 2024-09-01 敦泰電子股份有限公司 具靜電放電保護的車用觸控電路裝置
KR20250148445A (ko) 2024-03-29 2025-10-14 김호 Esd/eos 모니터링 시스템

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CN101373199A (zh) * 2007-08-23 2009-02-25 半导体元件工业有限责任公司 形成esd检测器的方法及其结构
CN101938118A (zh) * 2009-06-29 2011-01-05 智原科技股份有限公司 具有多重电源区域集成电路的静电放电防护电路
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US8730624B2 (en) * 2011-03-31 2014-05-20 International Business Machines Corporation Electrostatic discharge power clamp with a JFET based RC trigger circuit
CN102368171A (zh) * 2011-09-19 2012-03-07 惠州Tcl移动通信有限公司 一种触摸屏控制器的自动恢复系统
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117706260A (zh) * 2024-02-06 2024-03-15 禹创半导体(深圳)有限公司 Esd事件检测方法

Also Published As

Publication number Publication date
KR20180116122A (ko) 2018-10-24
CN108028530B (zh) 2019-09-27
WO2018010084A1 (zh) 2018-01-18
KR101925237B1 (ko) 2019-02-08
EP3288136A4 (en) 2019-04-17
EP3288136B1 (en) 2019-11-27
US20180017606A1 (en) 2018-01-18
US10359460B2 (en) 2019-07-23
EP3288136A1 (en) 2018-02-28

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