CN108011004B - Light emitting diode with combined type back silver-plated reflecting layer - Google Patents
Light emitting diode with combined type back silver-plated reflecting layer Download PDFInfo
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- 229910052594 sapphire Inorganic materials 0.000 claims abstract description 31
- 239000010980 sapphire Substances 0.000 claims abstract description 31
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims abstract description 29
- 229910010271 silicon carbide Inorganic materials 0.000 claims abstract description 29
- 239000000758 substrate Substances 0.000 claims abstract description 27
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims abstract description 22
- 239000002131 composite material Substances 0.000 claims description 23
- 229910052709 silver Inorganic materials 0.000 claims description 20
- 239000004332 silver Substances 0.000 claims description 20
- 239000004065 semiconductor Substances 0.000 claims description 18
- 238000005289 physical deposition Methods 0.000 claims description 4
- 238000005234 chemical deposition Methods 0.000 claims 1
- 229910002601 GaN Inorganic materials 0.000 abstract description 33
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 abstract description 11
- 238000000137 annealing Methods 0.000 abstract description 5
- 238000007747 plating Methods 0.000 abstract description 5
- 238000005275 alloying Methods 0.000 abstract 1
- 238000010276 construction Methods 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 96
- 238000002310 reflectometry Methods 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 241000409201 Luina Species 0.000 description 1
- 239000012790 adhesive layer Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000001451 molecular beam epitaxy Methods 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000004408 titanium dioxide Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/84—Coatings, e.g. passivation layers or antireflective coatings
- H10H20/841—Reflective coatings, e.g. dielectric Bragg reflectors
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Abstract
Description
技术领域technical field
本发明涉及一种发光二极管,更为具体地,涉及一种具有复合式背镀反射层的发光二极管。The invention relates to a light-emitting diode, more specifically, to a light-emitting diode with a composite back-plated reflective layer.
背景技术Background technique
进入二十一世纪以来,照明产业正式迎来第三代—半导体照明时代,而基于氮化镓基材料的发光二极管已经是当今半导体照明产业的主流。这其中以蓝宝石为生长衬底的正装结构氮化镓基发光二极管芯片最为普遍,为业界广泛采用。对于正装结构的氮化镓基发光二极管,为了提升出光效率,通常在蓝宝石衬底背面加镀一反射镜。背镀反射镜的结构可以是金属,也可以是透明介质堆(如分布式布拉格反射镜,简称DBR),或者是二者组合。蓝宝石背镀金属材料一般用铝,因为银反射率虽然更高,但银与蓝宝石的黏附极差,不能直接用作背镀反射层。如果要用银作为反射镜,则必须在蓝宝石与银之间引入一透明黏附层。中国专利ZL201210074327.4通过引入氮化镓作为黏附层实现了含银的背镀反射镜结构。如附图1为一典型的采用现有背镀层技术的发光二极管结构示意图,其包括蓝宝石衬底100、缓冲层101、n型氮化镓基外延层102、发光层103、p型氮化镓基外延层104、透明导电层110、P电极111、N电极112、氮化镓基黏附层120和银反射层130。在实际制作过程中,需要通过400℃以上的高温退火使得黏附层120的氮化镓与反射层130的银熔合形成合金以增强黏附性能,退火的温度越高越有利于增强黏附性,然而对于已经形成的金属电极接触再经过高温则容易发生接触性能劣化从而导致操作电压升高。Since the beginning of the 21st century, the lighting industry has officially ushered in the third generation—the era of semiconductor lighting, and light-emitting diodes based on gallium nitride-based materials have become the mainstream of today's semiconductor lighting industry. Among them, the front-loaded gallium nitride-based light-emitting diode chip with sapphire as the growth substrate is the most common and widely used in the industry. For gallium nitride-based light-emitting diodes with a front-mount structure, in order to improve light extraction efficiency, a reflector is usually added to the back of the sapphire substrate. The structure of the back-plated reflector can be metal, or a transparent dielectric stack (such as a distributed Bragg reflector, DBR for short), or a combination of the two. Aluminum is generally used as the metal material for the back plating of sapphire, because although the reflectivity of silver is higher, the adhesion between silver and sapphire is extremely poor, so it cannot be directly used as the reflective layer of back plating. If silver is to be used as a mirror, a transparent adhesive layer must be introduced between the sapphire and silver. Chinese patent ZL201210074327.4 achieves a silver-containing back-plated reflector structure by introducing gallium nitride as an adhesion layer. As shown in Figure 1, it is a typical light-emitting diode structure diagram using the existing back-plating technology, which includes a sapphire substrate 100, a buffer layer 101, an n-type gallium nitride-based epitaxial layer 102, a light-emitting layer 103, and a p-type gallium nitride base epitaxial layer 104 , transparent conductive layer 110 , P electrode 111 , N electrode 112 , GaN-based adhesion layer 120 and silver reflective layer 130 . In the actual production process, high temperature annealing above 400°C is required to fuse the gallium nitride in the adhesion layer 120 and the silver in the reflective layer 130 to form an alloy to enhance the adhesion performance. The higher the annealing temperature is, the better the adhesion is. However, for If the formed metal electrode contacts are subjected to high temperature, the contact performance will be deteriorated easily, resulting in an increase in the operating voltage.
因此,需要改进上述背镀反射层方案,以解决现有技术的局限性。Therefore, it is necessary to improve the above-mentioned back-plating reflective layer solution to solve the limitations of the prior art.
发明内容Contents of the invention
本发明的主要目的是提供一种具有复合式背镀反射层的发光二极管,通过在蓝宝石衬底与银反射层之间插入一碳化硅层,以解决二者无法黏附之问题并形成含银反射镜结构。碳化硅与银互相黏附性佳,且相较于氮化镓,不需要通过高温退火合金化增强黏附,同时碳化硅对于可见光波段也具极高透明度,所以采用碳化硅层作为黏附层可以构造具备高反射率的含银背镀反射镜结构。The main purpose of the present invention is to provide a light-emitting diode with a composite back-plated reflective layer. By inserting a silicon carbide layer between the sapphire substrate and the silver reflective layer, the problem that the two cannot be adhered is solved and a silver-containing reflective layer is formed. mirror structure. Silicon carbide and silver have good adhesion to each other, and compared with gallium nitride, it does not need to be alloyed by high temperature annealing to enhance the adhesion. At the same time, silicon carbide has a very high transparency for the visible light band, so the use of silicon carbide layer as the adhesion layer can be constructed with High reflectivity silver back plated mirror structure.
根据实现上述目的的具有复合式背镀反射层的发光二极管,其结构包括:According to the light-emitting diode with a composite back-plated reflective layer for achieving the above object, its structure includes:
蓝宝石衬底;Sapphire substrate;
氮化镓基半导体叠层,形成于该蓝宝石衬底的第一表面,该氮化镓基半导体叠层包含第一导电性半导体层、第二导电性半导体层以及介于前述两者之间的发光层;GaN-based semiconductor stacks, formed on the first surface of the sapphire substrate, the GaN-based semiconductor stacks include a first conductive semiconductor layer, a second conductive semiconductor layer, and a layer between the two luminous layer;
复合式背镀反射层形成于相对于所述第一表面的所述透明衬底的第二表面,自该第二表面起,该复合式背镀反射层依次包含碳化硅黏附层和银金属反射层。A composite back-plate reflective layer is formed on the second surface of the transparent substrate opposite to the first surface, and from the second surface, the composite back-plate reflective layer sequentially includes a silicon carbide adhesion layer and a silver metal reflector Floor.
本发明中,碳化硅黏附层的形成方式可以采用化学方式外延生长,例如金属有机化学气相沉积(MOCVD)、分子束外延(MBE)等;也可以采用物理方式进行沉积。碳化硅的厚度方面,控制在100纳米以内即可获得稳定的反射镜结构。In the present invention, the silicon carbide adhesion layer can be formed by chemical epitaxial growth, such as metal organic chemical vapor deposition (MOCVD), molecular beam epitaxy (MBE), etc.; physical deposition can also be used. In terms of the thickness of silicon carbide, a stable mirror structure can be obtained by controlling it within 100 nanometers.
当然,为了更进一步提升反射率,可以在上述基础上再加入诸如分布式布拉格反射器(DBR)的透明介质层堆。根据实现上述目的的具有复合式背镀反射层的发光二极管,其结构包括:Of course, in order to further improve the reflectivity, a transparent medium layer stack such as a distributed Bragg reflector (DBR) can be added on the above basis. According to the light-emitting diode with a composite back-plated reflective layer for achieving the above object, its structure includes:
蓝宝石衬底;Sapphire substrate;
氮化镓基半导体叠层,形成于该蓝宝石衬底的第一表面,该氮化镓基半导体叠层包含第一导电性半导体层、第二导电性半导体层以及介于前述两者之间的发光层;GaN-based semiconductor stacks, formed on the first surface of the sapphire substrate, the GaN-based semiconductor stacks include a first conductive semiconductor layer, a second conductive semiconductor layer, and a layer between the two luminous layer;
复合式背镀反射层形成于相对于所述第一表面的所述蓝宝石衬底的第二表面,自该第二表面起,该复合式背镀反射层依次包含折射率呈高低周期性交替变化的复数层透光介电层堆、碳化硅黏附层和金属银反射层。The composite back-plate reflective layer is formed on the second surface of the sapphire substrate opposite to the first surface, and from the second surface, the composite back-plate reflective layer sequentially includes a refractive index that alternates between high and low periodically. The multiple layers of light-transmitting dielectric layer stack, silicon carbide adhesion layer and metallic silver reflective layer.
在上述发明中,碳化硅黏附层的形成方式须采用物理方式沉积,比如蒸发或者溅射。In the above invention, the silicon carbide adhesion layer must be formed by physical deposition, such as evaporation or sputtering.
附图说明Description of drawings
图1是现有技术的具有背镀反射层发光二极管芯片结构示意图;Fig. 1 is a schematic structural view of a light-emitting diode chip with a back-plated reflective layer in the prior art;
图2是本发明实施例的具有复合式背镀反射层的发光二极管芯片结构示意图;Fig. 2 is a schematic structural view of a light-emitting diode chip with a composite back-plated reflective layer according to an embodiment of the present invention;
图3是本发明另一实施例的具有复合式背镀反射层的发光二极管芯片结构示意图。FIG. 3 is a schematic structural view of a light emitting diode chip with a composite back-plated reflective layer according to another embodiment of the present invention.
图中部件符号说明:Explanation of component symbols in the figure:
100:蓝宝石衬底100: sapphire substrate
101:缓冲层101: buffer layer
102:n型氮化镓基外延层102: n-type GaN-based epitaxial layer
103:发光层103: Luminous layer
104:p型氮化镓基外延层104: p-type GaN-based epitaxial layer
110:ITO透明导电层110: ITO transparent conductive layer
111:P电极111: P electrode
112:N电极112: N electrode
120:氮化镓黏附层120: Gallium Nitride Adhesion Layer
130:银反射层130: silver reflective layer
200:蓝宝石衬底200: Sapphire substrate
201:缓冲层201: buffer layer
202:n-GaN层202: n-GaN layer
203:多量子阱层203: Multiple Quantum Well Layers
204:p-GaN层204: p-GaN layer
210:ITO透明导电层210: ITO transparent conductive layer
211:P电极211: P electrode
212:N电极212: N electrode
220:DBR220: DBR
230:碳化硅黏附层230: Silicon carbide adhesion layer
240:银反射镜240: silver reflector
具体实施方式Detailed ways
下面结合附图与具体实施方式对本发明作进一步详细描述。The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
如附图2所示的一种具有复合式背镀反射层的发光二极管芯片结构,包括蓝宝石衬底200、缓冲层201、n-GaN层202、多量子阱有源层203、p-GaN层204、ITO透明导电层210、P电极211、N电极212、碳化硅黏附层230、银反射镜240。其中,蓝宝石衬底200具有两个主表面,正表面和背表面;缓冲层201形成于蓝宝石衬底200的正表面之上;n-GaN层202形成于缓冲层201之上;多量子阱有源层203形成于n-GaN层202之上;p-GaN层204形成于多量子阱有源层203之上;ITO层210形成于p-GaN层204之上;P电极211形成于ITO层210之上;N电极212形成于n-GaN层202之上;碳化硅黏附层230形成于蓝宝石衬底200的背表面,其厚度为500埃;银反射镜240形成于碳化硅黏附层230之上。A light-emitting diode chip structure with a composite back-plated reflective layer as shown in Figure 2, including a sapphire substrate 200, a buffer layer 201, an n-GaN layer 202, a multi-quantum well active layer 203, and a p-GaN layer 204 , ITO transparent conductive layer 210 , P electrode 211 , N electrode 212 , silicon carbide adhesion layer 230 , and silver mirror 240 . Wherein, the sapphire substrate 200 has two main surfaces, a front surface and a back surface; the buffer layer 201 is formed on the front surface of the sapphire substrate 200; the n-GaN layer 202 is formed on the buffer layer 201; the multiple quantum wells have The source layer 203 is formed on the n-GaN layer 202; the p-GaN layer 204 is formed on the multi-quantum well active layer 203; the ITO layer 210 is formed on the p-GaN layer 204; the p-electrode 211 is formed on the ITO layer 210; the N electrode 212 is formed on the n-GaN layer 202; the silicon carbide adhesion layer 230 is formed on the back surface of the sapphire substrate 200, and its thickness is 500 angstroms; the silver mirror 240 is formed on the silicon carbide adhesion layer 230 superior.
为了进一步提升背镀结构的反射率,我们还可以在上述实施例结构基础上引入一分布式布拉格反射器(DBR),如图3所示的本案的另一种具有复合式背镀反射层的发光二极管芯片结构,包括蓝宝石衬底200、缓冲层201、n-GaN层202、多量子阱有源层203、p-GaN层204、ITO透明导电层210、P电极211、N电极212、DBR220、碳化硅黏附层230、银反射镜240。其中,蓝宝石衬底200具有两个主表面,正表面和背表面;缓冲层201形成于蓝宝石衬底200的正表面之上;n-GaN层202形成于缓冲层201之上;多量子阱有源层203形成于n-GaN层202之上;p-GaN层204形成于多量子阱有源层203之上;ITO层210形成于p-GaN层204之上;P电极211形成于ITO层210之上;N电极212形成于n-GaN层202之上;DBR形成于蓝宝石衬底200的背表面,其结构为6对1/4主波长厚度的二氧化硅和二氧化钛;碳化硅黏附层230形成于DBR220之上,其厚度为500埃;银反射镜240形成于碳化硅黏附层230之上。In order to further improve the reflectivity of the back-plated structure, we can also introduce a distributed Bragg reflector (DBR) on the basis of the structure of the above-mentioned embodiment, as shown in Figure 3. LED chip structure, including sapphire substrate 200, buffer layer 201, n-GaN layer 202, multi-quantum well active layer 203, p-GaN layer 204, ITO transparent conductive layer 210, P electrode 211, N electrode 212, DBR220 , a silicon carbide adhesion layer 230 , and a silver mirror 240 . Wherein, the sapphire substrate 200 has two main surfaces, a front surface and a back surface; the buffer layer 201 is formed on the front surface of the sapphire substrate 200; the n-GaN layer 202 is formed on the buffer layer 201; the multiple quantum wells have The source layer 203 is formed on the n-GaN layer 202; the p-GaN layer 204 is formed on the multi-quantum well active layer 203; the ITO layer 210 is formed on the p-GaN layer 204; the p-electrode 211 is formed on the ITO layer 210; the N electrode 212 is formed on the n-GaN layer 202; the DBR is formed on the back surface of the sapphire substrate 200, and its structure is 6 pairs of silicon dioxide and titanium dioxide with a thickness of 1/4 dominant wavelength; the silicon carbide adhesion layer 230 is formed on DBR 220 with a thickness of 500 Angstroms; silver mirror 240 is formed on SiC adhesion layer 230 .
采用上述结构的发光二极管具有“蓝宝石/碳化硅/银”的背镀反射层结构,该结构相比于“蓝宝石/氮化镓/银”结构既保留了极高反射率,又避免对器件会造成不良影响的退火工序,较之更具生产的可行性和优越性。The light-emitting diode with the above structure has a "sapphire/silicon carbide/silver" back-plated reflective layer structure. Compared with the "sapphire/gallium nitride/silver" structure, this structure not only retains a very high reflectivity, but also avoids damage to the device. Compared with the annealing process that causes adverse effects, it is more feasible and superior in production.
以上所述仅为本发明的较佳实施例而已,并不用以限制本发明,凡在本发明的精神和原则之内,所做的任何修改、等同替换、改进等,均应包含在本发明保护的范围之内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included in the present invention. within the scope of protection.
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| CN102610720A (en) * | 2012-03-21 | 2012-07-25 | 厦门市三安光电科技有限公司 | Light-emitting diode (LED) with omnidirectional reflector and manufacturing method of LED |
| CN102610728A (en) * | 2012-03-21 | 2012-07-25 | 厦门市三安光电科技有限公司 | Light-emitting diode (LED) with back silver-plated reflecting layer and manufacturing method of LED |
| CN203721754U (en) * | 2014-01-15 | 2014-07-16 | 华灿光电(苏州)有限公司 | Light emitting diode possessing omni-directional reflecting mirror |
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| CN102610720A (en) * | 2012-03-21 | 2012-07-25 | 厦门市三安光电科技有限公司 | Light-emitting diode (LED) with omnidirectional reflector and manufacturing method of LED |
| CN102610728A (en) * | 2012-03-21 | 2012-07-25 | 厦门市三安光电科技有限公司 | Light-emitting diode (LED) with back silver-plated reflecting layer and manufacturing method of LED |
| CN203721754U (en) * | 2014-01-15 | 2014-07-16 | 华灿光电(苏州)有限公司 | Light emitting diode possessing omni-directional reflecting mirror |
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