CN107870834A - A kind of measurement jig of hard disk backboard - Google Patents
A kind of measurement jig of hard disk backboard Download PDFInfo
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- CN107870834A CN107870834A CN201610859249.7A CN201610859249A CN107870834A CN 107870834 A CN107870834 A CN 107870834A CN 201610859249 A CN201610859249 A CN 201610859249A CN 107870834 A CN107870834 A CN 107870834A
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- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
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Abstract
The invention provides a kind of measurement jig of hard disk backboard, including interface unit and the single-chip microcomputer, multiple ports-Extending units and the multiple switch units that are arranged inside measurement jig；Interface unit includes multiple interface groups and the first communication interface；Wherein, interface group connection corresponding with the interface group of a hard disk on hard disk backboard to be measured；Switch unit is corresponding with interface group：One end of switch unit connects with corresponding interface group, and the other end connects with single-chip microcomputer and corresponding ports-Extending unit respectively；Ports-Extending unit is connected with single-chip microcomputer, for will be converted to single-pass data from the multichannel data that switch unit receives and export to single-chip microcomputer；Single-chip microcomputer is connected by the first communication interface with peripheral hardware electronic equipment, for controlling the switching between multiple switch units according to test program, so as to realize the test to the different hard disks on hard disk backboard to be measured.Cost of the present invention is low, and the testing time is short, and test coverage is high, and test risk is low.
Description
Technical Field
The invention relates to the technical field of server function testing, in particular to a testing jig applied to a hard disk backboard of a server.
Background
With the rapid development of society and economy, individuals and enterprises use computers more and more. In recent years, with the development of new technologies such as cloud storage and big data, enterprises have come to have more and more demands on the data storage function of computers. Correspondingly, computer manufacturers increase the number of hard disks storing data in the computer according to the actual requirements of users. Because the middle bridge connecting the hard disk and the main board is the hard disk back board, the corresponding multi-interface hard disk back board is produced. The hard disk back plate with multiple interfaces is corrected to simultaneously access a plurality of hard disks, so that simultaneous access of data of the plurality of hard disks in a computer is realized, and the requirements of enterprises are met. Before the hard disk backboard leaves a factory, the hard disk backboard needs to be inspected so as to ensure that the produced hard disk backboard meets the factory standard.
At present, computer manufacturers use a server motherboard to plug in a corresponding number of CPUs, memories and hard disks, and then run corresponding test programs by matching with dedicated power supplies, displays, keyboards and other matching devices, thereby realizing the test of the multi-interface hard disk backplane. However, the hard disk backboard testing method has the following defects:
1) the jig for testing is too high in cost: because the existing testing method needs to be matched with a series of devices, such as: a server mainboard, a CPU, a memory, a hard disk, a power supply and the like; in general, if a hard disk backplane capable of plugging 24 SAS (serial attached SCSI) hard disks is tested, the cost of the devices required for testing is about 12 ten thousand yuan; if a hard disk backboard capable of being plugged with 10 solid state disks is tested, the cost of devices required by the test is about 15 ten thousand yuan;
2) the testing time is long: in general, if a hard disk backplane capable of being plugged with 24 SAS hard disks is tested, the test takes 13 minutes; if a hard disk backboard capable of being plugged with 10 solid state disks is tested, the test takes 18 minutes;
3) the test coverage rate is low: the test coverage rate of the existing test method is about 85%, and the empty welding of the PIN PINs with the same function, such as power supply and grounding, can not be covered, and the empty welding of the PIN PINs can seriously influence the long-term stable operation of the server;
4) the risk of false and missed measurements is high: after the test is started, the tester is still required to participate in judgment, so that the possibility of misdetection exists, such as judgment of the working state of the LED lamp. In addition, in the testing process, the information of the hard disk backboard to be tested needs to be manually brushed, so that the possibility of brushing A to test B exists, and the test is missed.
Disclosure of Invention
In view of the above disadvantages of the prior art, an object of the present invention is to provide a testing fixture for a hard disk backplane of a server, which is used to solve the problems of low testing efficiency, high cost and incomplete coverage of the hard disk backplane with multiple interfaces of the server in the prior art.
In order to achieve the above and other related objects, the present invention provides a testing fixture for a hard disk backplane, comprising: the interface unit, the single chip microcomputer, the plurality of port expansion units and the plurality of switching units are arranged in the test fixture; the interface unit comprises a plurality of interface groups and a first communication interface; the interface group is correspondingly connected with an interface group of a hard disk on the hard disk backboard to be tested; the switching unit corresponds to the interface group: one end of the switching unit is connected with the corresponding interface group, and the other end of the switching unit is respectively connected with the single chip microcomputer and the corresponding port expansion unit; the port expansion unit is connected with the single chip microcomputer and used for converting the multi-channel data received from the switching unit into single-channel data and outputting the single-channel data to the single chip microcomputer; the single chip microcomputer is connected with peripheral electronic equipment through the first communication interface and used for controlling switching among the plurality of switching units according to a test program, and therefore testing of different hard disks on the hard disk backboard to be tested is achieved.
In an embodiment of the invention, the plurality of interface groups are disposed at the upper panel of the test fixture, and the first communication interface is disposed at the side panel of the test fixture.
In an embodiment of the present invention, the peripheral electronic device includes a PC or a raspberry pi, and data interaction is implemented between the peripheral electronic device and the single chip microcomputer through the first communication interface, where the interaction data includes the test program and the test data.
In an embodiment of the present invention, the single chip microcomputer includes a test circuit for testing the hard disk backplane to be tested; the test circuit and the test program are adjustable according to the actual test requirements.
In an embodiment of the invention, the interface unit further includes a power interface and a second communication interface set disposed at a side plate of the test fixture; the power interface and the hard disk backboard to be tested are used for supplying power to the hard disk backboard to be tested; the second communication interface group is connected with the communication interface group of the hard disk backboard to be tested, and the second communication interface group comprises: I2C interface, SPI interface, SGPIO interface, USB interface, and network interface.
In an embodiment of the present invention, the single chip microcomputer is further connected to the second communication interface group, and is configured to implement a test on the communication interface group of the hard disk backplane to be tested.
In an embodiment of the present invention, the interface group includes a hard disk interface group, an LED interface group, and a data read/write interface group; the hard disk interface group is connected with the hard disk interface group of the corresponding hard disk on the hard disk backboard to be tested; the LED interface group is connected with the LED test signal interface group of the corresponding hard disk on the back plate of the hard disk to be tested; the data read-write interface group is connected with the digital read-write interface group of the corresponding hard disk on the hard disk backboard to be tested.
In an embodiment of the present invention, in the switching unit, the data from the LED interface set is directly transmitted to the single chip microcomputer; the data groups from the data read-write interfaces are transmitted to the corresponding port expansion units; and the data from the hard disk interface group are respectively transmitted to the single chip microcomputer and the corresponding port expansion unit.
In an embodiment of the invention, the port expansion unit is integrated on the corresponding switching unit.
In an embodiment of the invention, the test fixture further includes a power socket and a power switch, which are disposed at the side plate of the test fixture, and the power socket is used for providing power for the test fixture; the power switch is used for controlling the on and/or off of the power supply of the test fixture.
As described above, the test fixture applied to the hard disk backplane of the server of the invention is intended to test the hard disk backplane by using the single chip microcomputer, and since the test program of the single chip microcomputer is designed according to the actual test requirements, the test fixture of the invention is more flexible in testing the hard disk backplane, is not limited by the type of the hard disk backplane, and is more widely applied; in addition, the switching unit and the port expansion unit are used in a matched mode, the problem that the number of I/O interfaces of the single chip microcomputer is limited is solved, and the single chip microcomputer can test different hard disk backboards. The invention also has the following beneficial technical effects:
1) the invention greatly reduces the cost of the test fixture: testing a hard disk backboard capable of being plugged with 24 SAS hard disks, wherein the cost of a testing jig is reduced from 12 ten thousand yuan to about 5 ten thousand yuan; testing a hard disk backboard capable of being inserted with 10 solid state disks, wherein the cost of a testing jig is reduced from 15 ten thousand yuan to about 8 ten thousand yuan;
2) the test time is reduced: the test time of one test backboard is not more than 5 minutes;
3) test coverage is promoted: the test coverage rate reaches 100 percent;
4) the test risk is reduced: after the test is started, the test personnel is not required to participate in judgment, so that the misdetection is avoided; and the novel test back plate is automatically brushed in, so that the possibility of missing test is greatly reduced.
Drawings
Fig. 1 is a schematic structural diagram of a test fixture for a hard disk backplane according to an embodiment of the present invention.
Fig. 2 is a schematic layout view of an upper panel of a test fixture for a hard disk backplane according to an embodiment of the present invention.
Fig. 3 is a schematic layout view of a front side plate of a test fixture for a hard disk backplane according to an embodiment of the present invention.
Fig. 4 is a schematic layout view of a rear side plate of a test fixture for a hard disk backplane according to an embodiment of the present invention.
Fig. 5 is a schematic structural diagram of an interior of a test fixture for a hard disk backplane according to an embodiment of the present invention.
Description of the element reference numerals
100 interface unit
110 interface group
111 hard disk interface group
112 LED interface group
113 data read-write interface group
120 first communication interface
130 power supply interface
140 second communication interface group
200 single chip microcomputer
300 switching unit
400 port expansion unit
510 electric outlet
520 power switch
Detailed Description
The following description of the embodiments of the present invention is provided for illustrative purposes, and other advantages and effects of the present invention will become apparent to those skilled in the art from the present disclosure.
Please refer to the attached drawings. It should be understood that the structures, ratios, sizes, and the like shown in the drawings and described in the specification are only used for matching with the disclosure of the specification, so as to be understood and read by those skilled in the art, and are not used to limit the conditions under which the present invention can be implemented, so that the present invention has no technical significance, and any structural modification, ratio relationship change, or size adjustment should still fall within the scope of the present invention without affecting the efficacy and the achievable purpose of the present invention. In addition, the terms "upper", "lower", "left", "right", "middle" and "one" used in the present specification are for clarity of description, and are not intended to limit the scope of the present invention, and the relative relationship between the terms and the terms is not to be construed as a scope of the present invention.
The test fixture applied to the hard disk backboard of the server provided by the invention adopts the single chip microcomputer to test the hard disk backboard of the server, and is more flexible and lower in cost. However, because the I/O (Input/Output) interface of the single chip is limited, the requirement of the hard disk backplane test cannot be met. Therefore, the test fixture of the hard disk backboard of the invention also adds the switching unit and the port expansion unit, and the switching unit and the port expansion unit are used in a matching way, so that the I/O interface is expanded, and the test of the hard disk backboard by the singlechip is realized.
Examples
The embodiment discloses a test fixture for a hard disk backboard, which is applied to a server, that is, the hard disk backboard is a multi-interface hard disk backboard and supports simultaneous access to a plurality of hard disks.
As shown in fig. 1, the test fixture for a hard disk backplane of the present embodiment includes: the interface unit 100, the single chip microcomputer 200, a plurality of switching units 300 and a plurality of port expansion units 400.
The interface unit 100 is disposed on a panel or a side plate of the test fixture.
In this embodiment, for convenience of testing, a placement area 500 for placing a hard disk backplane is disposed on an upper panel of the test fixture, wherein the arrangement of the upper panel of the test fixture is as shown in fig. 2.
As shown in fig. 1 and 2, the interface unit 100 includes a plurality of interface groups 110, a first communication interface 120, a power supply interface 130, and a second communication interface group 140.
The number of the interface groups 110 is also related to the hard disk backplane to be tested, that is, the number of the interface groups 110 is the same as the number of the hard disks supported by the hard disk backplane to be tested and accessed simultaneously. In this embodiment, an example that the backplane of the hard disk to be tested supports simultaneous access to 24 hard disks is taken as an example for explanation. That is, the number of the interface groups 110 of the present embodiment is 24. Of course, the hard disk backplane detectable by the test fixture of the invention is not limited to this, and the test fixture of the invention can realize the test of the hard disk backplane as long as the hard disk backplane supports the simultaneous access of a plurality of hard disks.
One interface group 110 is correspondingly connected with an interface group of one hard disk of the hard disk backboard to be tested. Moreover, since the hard disk backplane to be tested is placed in the placement area 500 of the top panel of the test fixture, 24 interface groups 110 are also disposed on the top panel of the test fixture for the convenience of wiring.
Further, the interface group of a hard disk of the hard disk backplane to be tested includes, but is not limited to, a hard disk interface group, an LED test signal interface group, and a digital read-write interface group. And the hard disk interface group, the LED test signal interface group and the digital read-write interface group can adopt a PIN foot form and a golden finger form.
Correspondingly, an interface set 110 includes, but is not limited to: a hard disk interface group 111, an LED interface group 112 and a data read-write interface group 113; wherein,
the hard disk interface group 111 is used for being connected with a hard disk interface group of a corresponding hard disk of the hard disk backboard to be tested;
the LED interface group 112 is used for being connected with an LED test signal interface group of a corresponding hard disk of the hard disk backboard to be tested;
and the data reading and writing interface group 113 is used for being connected with the data reading and writing interface group of the corresponding hard disk of the hard disk backboard to be tested.
In addition, regardless of the interface form of the interface group of the hard disk backplane to be tested, each interface of the interface group 110 and each interface of the interface group of the corresponding hard disk of the hard disk backplane to be tested are connected by a transfer circuit board or a wire. As shown in fig. 2, there are 24 interface groups 110 of the interface unit 100, and each interface group 110 corresponds to a hard disk interface group 111, an LED interface group 112, and a data read/write interface group 113.
The first communication interface 120 is in communication connection with peripheral electronic equipment, and is used for realizing data interaction with the single chip microcomputer 200. The method specifically comprises the following steps: writing a test program into the single chip microcomputer 200; the singlechip 200 is used for controlling data switching among the plurality of switching units 300, so that the singlechip 200 can test the hard disk backboard to be tested; test data is obtained from the single chip microcomputer 200. The peripheral electronic devices connected to the first communication interface 120 include, but are not limited to, a PC, a laptop, and/or a raspberry. In this embodiment, the first communication interface 120 preferably adopts an MCU-ISP (Microcontroller Unit-Internet service provider) interface.
The power interface 130 is connected to a power interface of the hard disk backplane to be tested, and is used for supplying power to the hard disk backplane to be tested.
The second communication interface group 140 is connected to the communication interface group of the hard disk backplane to be tested. The second communication interface group 140 includes, but is not limited to: I2C (Inter-Integrated Circuit) Interface, SPI (Serial Peripheral Interface) Interface, SGPIO (Serial General Purpose Input/Output) Interface, USB Interface, and network Interface, and the like. When the hard disk backboard to be tested is tested, the interface of the second communication interface group 140 is connected with the corresponding communication interface of the hard disk backboard to be tested.
In addition, in the present embodiment, the first communication interface 120 and the power interface 130 are disposed on the front side plate of the test fixture; the plurality of interfaces of the second communication interface group 140 are respectively disposed on the front side plate and the rear side plate of the test fixture. The arrangement of the front side plate of the test fixture is shown in fig. 3, and the arrangement of the rear side plate of the test fixture is shown in fig. 4.
Further, as shown in fig. 3 and 4, in order to solve the problem of power supply of the test fixture, the test fixture is further provided with a power socket 510 and a power switch 520. The power socket 510 is connected with an external direct current power supply or an alternating current power supply and is used for providing power for the test fixture; the power switch 520 is used for controlling the on/off of the power supply of the test fixture, supplying power to the single chip microcomputer 200 in the test fixture, and supplying power to the hard disk backboard to be tested through the power interface 130. In addition, for the convenience of testing, the power socket 510 is disposed on the rear side plate of the testing fixture, and the power switch 520 is disposed on the front side plate of the testing fixture.
The single chip microcomputer 200, the plurality of switching units 300 and the plurality of port extension units 400 are disposed inside the test fixture.
In this embodiment, the test of the hard disk backplane is completed by using the single chip microcomputer 200. However, since the number of terminals of the single chip microcomputer 200 is limited, and access to all data of the hard disk backplane cannot be simultaneously achieved, the present embodiment utilizes a plurality of switching units 300 and a plurality of port extension units 400 to solve the problem of data access of the single chip microcomputer 200.
The switching unit 300 and the port expansion unit 400 are used cooperatively, and the number of the switching unit 300 and the port expansion unit 400 is related to the hard disk backplane to be tested, that is, the number of the switching unit 300 and the port expansion unit 400 is the same as the number of the hard disks supported by the hard disk backplane to be tested and accessed simultaneously. That is, the number of the switching units 300 and the port expansion units 400 of the present embodiment is 24. For convenience of explanation, fig. 5 shows a schematic structure diagram among only one set of interface group 110, switching unit 300, port expansion unit 400 and the single chip microcomputer 200, and the schematic structures among the remaining 23 sets of interface group 110, switching unit 300, port expansion unit 400 and the single chip microcomputer 200 are the same as those shown in fig. 5.
The switching unit 300 is configured to integrate data of the hard disk backplane to be tested, which is accessed by the interface unit 100, according to each hard disk of the hard disk backplane to be tested, and finally transmit the integrated data to the single chip microcomputer 200 and the corresponding port extension unit 400 respectively; the port expansion unit 400 is also connected to the single chip microcomputer 200, and is configured to convert multiple paths of data into single path of data and output the single path of data to the single chip microcomputer 200 for testing, thereby solving the problem of data access of the single chip microcomputer 200. The data transmitted to the single chip microcomputer 200 and the port expansion unit 400 by the switching unit 300 is determined according to a data interface of a hard disk of the hard disk backplane to be tested.
As shown in fig. 5, in this embodiment, the data interface of one hard disk of the hard disk backplane to be tested includes: the interface device comprises a hard disk interface group, an LED test signal interface group and a data read-write interface group (not marked in the attached drawing), wherein a hard disk interface 111 group of the interface group 110 is connected with a hard disk interface group of one hard disk of the hard disk backboard to be tested, the LED interface group is connected with an LED test signal interface group of one hard disk of the hard disk backboard to be tested, and the data read-write interface group is connected with a data read-write interface group of one hard disk of the hard disk backboard to be tested. Because the data from the hard disk interface group 111 of the interface group 110 is more, the switching unit 300 divides the data into two parts, and one part is directly transmitted to the single chip microcomputer 200 for testing, wherein the test contents include but are not limited to: assignment and/or reading of circuit level states, reading of voltages, etc.; the other part is transmitted to the corresponding port expansion unit 400, and the part of data is converted into single-channel data through the port expansion unit 400 and then transmitted to the single chip microcomputer 200 for testing. Compared with the data from the hard disk interface group 111 and the data read-write interface group 113, the data from the LED interface 112 of the interface group 110 is less, so the switching unit 300 directly transmits the data to the single chip microcomputer 200 to perform the light sensitivity test and the color sensitivity test on the LED of the corresponding hard disk on the hard disk backplane to be tested. The data from the data read/write interface group 113 of the interface group 110 is the most data, so the switching unit 300 transmits the data to the corresponding port expansion unit 400, and the data is converted into single-channel data by the port expansion unit 400 and then transmitted to the single chip microcomputer 200 for the signal channel test of the corresponding hard disk on the hard disk backplane to be tested.
The port expansion unit 400 is configured to convert the received multi-channel data into single-channel data, and finally output the single-channel data to the single chip microcomputer 200. In this embodiment, the port expansion unit 400 preferably uses an I2C bus to expand the I/O port. Generally, one I2C bus extends 64I/O ports, and in the present embodiment, the I/O port of one I2C bus is extended by more than ten thousand via the I2C bus extension I/O port.
Further, the port expansion unit 400 and the corresponding switching unit 300 of the present embodiment are integratable.
The single chip microcomputer 200 is used for testing the hard disk backboard to be tested. In this embodiment, the single chip microcomputer 200 is connected to an external electronic device through the first communication interface 120 in the interface unit 100, so as to implement data interaction between the single chip microcomputer 200 and the external electronic device. The single chip microcomputer 200 is connected to the communication interface group of the hard disk backplane to be tested through the second communication interface group 140 in the interface unit 100, and is used for testing the communication interface group of the hard disk backplane to be tested. The single chip microcomputer 200 is further connected to each switching unit 300 and each port expansion unit 400, and is configured to control data switching between the multiple switching units 300 and the multiple port expansion units 400 according to the test program, so as to implement corresponding testing on each hard disk of the hard disk backplane to be tested.
Further, the single chip microcomputer 200 of this embodiment employs an 8-bit or 32-bit MCU (Microcontroller Unit) and a test circuit, in which a test program is written, and the test of the hard disk backplane to be tested is implemented through the test program and the test circuit. In this embodiment, the test of the hard disk backplane that can be implemented by the single chip microcomputer 200 includes but is not limited to: testing the open short circuit and the digital logic circuit of the hard disk backboard by using the level; testing a capacitive coupling circuit and a filter circuit of the hard disk backboard by using the charging and discharging characteristics of a capacitor; testing the IC with a communication interface of the corresponding hard disk backboard by using a singlechip communication port (such as I2C, SPI, SGPIO, UART and the like); for example, EEPROM for I2C communication, FLASH for SPI communication, MG9094 for SGPIO communication; testing the capacitance/resistance parameters of the hard disk backboard through a test circuit; testing the color of the light emitted by the LED by using a color sensor; the brightness of the light emitted by the LED is measured with a light sensor.
In addition, in order to highlight the innovative part of the present invention, a unit which is not so closely related to solve the technical problem proposed by the present invention is not introduced in the present embodiment, but this does not indicate that there is no other unit in the present embodiment.
In summary, the test fixture applied to the hard disk backplane of the server of the invention is intended to test the hard disk backplane by using the single chip microcomputer, and since the test program of the single chip microcomputer is designed according to the actual test requirements, the test fixture of the invention is more flexible in testing the hard disk backplane, is not limited by the type of the hard disk backplane, and is more widely applied; in addition, the switching unit and the port expansion unit are used in a matched mode, the problem that the number of I/O interfaces of the single chip microcomputer is limited is solved, and the single chip microcomputer can test different hard disk backboards. In addition, the test fixture reduces the test cost, the test time and the test risk, and improves the test coverage rate. Therefore, the invention effectively overcomes various defects in the prior art and has high industrial utilization value.
The foregoing embodiments are merely illustrative of the principles and utilities of the present invention and are not intended to limit the invention. Any person skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical spirit of the present invention be covered by the claims of the present invention.
Claims (10)
1. The utility model provides a test fixture of hard disk backplate which characterized in that includes: the interface unit, the single chip microcomputer, the plurality of port expansion units and the plurality of switching units are arranged in the test fixture;
the interface unit comprises a plurality of interface groups and a first communication interface; the interface group is correspondingly connected with an interface group of a hard disk on the hard disk backboard to be tested;
the switching unit corresponds to the interface group: one end of the switching unit is connected with the corresponding interface group, and the other end of the switching unit is respectively connected with the single chip microcomputer and the corresponding port expansion unit;
the port expansion unit is connected with the single chip microcomputer and used for converting the multi-channel data received from the switching unit into single-channel data and outputting the single-channel data to the single chip microcomputer;
the single chip microcomputer is connected with peripheral electronic equipment through the first communication interface and used for controlling switching among the plurality of switching units according to a test program, and therefore testing of different hard disks on the hard disk backboard to be tested is achieved.
2. The test fixture of hard disk backboard of claim 1, characterized in that: the plurality of interface groups are arranged on the upper panel of the test fixture, and the first communication interface is arranged on the side panel of the test fixture.
3. The test fixture of hard disk backboard of claim 1, characterized in that: the peripheral electronic equipment comprises a PC or a raspberry pi, data interaction is achieved between the peripheral electronic equipment and the single chip microcomputer through the first communication interface, and the interaction data comprise the test program and the test data.
4. The test fixture of hard disk backboard of claim 1, characterized in that: the single chip microcomputer comprises a test circuit for testing the hard disk backboard to be tested; the test circuit and the test program are adjustable according to the actual test requirements.
5. The test fixture of hard disk backboard of claim 1, characterized in that: the interface unit also comprises a power interface and a second communication interface group which are arranged on the side plate of the test fixture; wherein,
the power interface and the hard disk backboard to be tested are used for supplying power to the hard disk backboard to be tested;
the second communication interface group is connected with the communication interface group of the hard disk backboard to be tested, and the second communication interface group comprises: I2C interface, SPI interface, SGPIO interface, USB interface, and network interface.
6. The test fixture of hard disk backboard of claim 5, wherein: the single chip microcomputer is also connected with the second communication interface group and used for testing the communication interface group of the hard disk backboard to be tested.
7. The test fixture of hard disk backboard of claim 1, characterized in that: the interface group comprises a hard disk interface group, an LED interface group and a data read-write interface group;
the hard disk interface group is connected with the hard disk interface group of the corresponding hard disk on the hard disk backboard to be tested;
the LED interface group is connected with the LED test signal interface group of the corresponding hard disk on the back plate of the hard disk to be tested;
the data read-write interface group is connected with the digital read-write interface group of the corresponding hard disk on the hard disk backboard to be tested.
8. The test fixture of hard disk backboard of claim 7, wherein: in the switching unit, the switching unit is provided with a switching unit,
the data from the LED interface group is directly transmitted to the single chip microcomputer;
the data groups from the data read-write interfaces are transmitted to the corresponding port expansion units;
and the data from the hard disk interface group are respectively transmitted to the single chip microcomputer and the corresponding port expansion unit.
9. The test fixture of hard disk backboard of claim 1, characterized in that: the port expansion unit is integrated on the corresponding switching unit.
10. The test fixture of hard disk backboard of claim 1, characterized in that: the test fixture also comprises a power socket and a power switch which are arranged at the side plate of the test fixture,
the power socket is used for providing power for the test fixture;
the power switch is used for controlling the on and/or off of the power supply of the test fixture.
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115602240A (en) * | 2021-06-28 | 2023-01-13 | 慧荣科技股份有限公司（Tw） | Computer readable storage medium and debugging method and device of solid state disk device |
| CN115686969A (en) * | 2022-11-10 | 2023-02-03 | 宁畅信息产业(北京)有限公司 | A hard disk backplane testing method, device, equipment and medium |
| CN116225846A (en) * | 2023-01-19 | 2023-06-06 | 苏州浪潮智能科技有限公司 | Test method, device and electronic equipment for hard disk backplane communication interface |
Citations (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040003328A1 (en) * | 2002-06-28 | 2004-01-01 | Dominic Viens | Instrument initiated communication for automatic test equipment |
| US20040102917A1 (en) * | 2002-11-21 | 2004-05-27 | Zhiguo Chen | Apparatus for testing I/O ports of a computer motherboard |
| JP3121365U (en) * | 2006-02-20 | 2006-05-18 | 亞旭電腦股▲分▼有限公司 | Peripheral device connecting device with boundary scan test function |
| CN1838306A (en) * | 2005-12-29 | 2006-09-27 | 深圳易拓科技有限公司 | Integrated testing system for hard disk |
| CN201751895U (en) * | 2009-10-13 | 2011-02-23 | 深圳和而泰智能控制股份有限公司 | Port expansion detection circuit and port expansion detection device |
| CN102063357A (en) * | 2009-11-13 | 2011-05-18 | 鸿富锦精密工业（深圳）有限公司 | Sas interface testing device |
| CN102135931A (en) * | 2010-01-25 | 2011-07-27 | 英业达股份有限公司 | Test module of passive backboard and method for testing passive backboard |
| CN102331963A (en) * | 2010-07-13 | 2012-01-25 | 研祥智能科技股份有限公司 | Digital input and output interface test tool and test method |
| CN102419722A (en) * | 2010-09-27 | 2012-04-18 | 鸿富锦精密工业（深圳）有限公司 | Hard disk test system |
| CN102567156A (en) * | 2010-12-31 | 2012-07-11 | 鸿富锦精密工业（深圳）有限公司 | Test set for server hard disk backplane |
| CN102841633A (en) * | 2011-06-23 | 2012-12-26 | 鸿富锦精密工业（深圳）有限公司 | Hard disk expansion device and expansion module |
| CN103002473A (en) * | 2012-11-27 | 2013-03-27 | 上海创远仪器技术股份有限公司 | Method, device and system for testing wireless terminal |
| CN203039918U (en) * | 2012-11-27 | 2013-07-03 | 上海创远仪器技术股份有限公司 | Wireless terminal testing device and wireless terminal testing system |
| CN103530257A (en) * | 2013-10-18 | 2014-01-22 | 浪潮电子信息产业股份有限公司 | SAS signal quality optimization method of dynamic self-adapting transmission route |
| US20150026526A1 (en) * | 2013-07-16 | 2015-01-22 | American Megatrends, Inc. | Techniques for testing enclosure management controller using backplane initiator |
| CN104375923A (en) * | 2014-11-24 | 2015-02-25 | 英业达科技有限公司 | Hard disk drive (HDD) running state detection system |
| CN104461800A (en) * | 2014-11-24 | 2015-03-25 | 英业达科技有限公司 | Hard disk running state detection system |
| CN105529045A (en) * | 2015-12-02 | 2016-04-27 | 英业达科技有限公司 | Lamp signal control system for nonvolatile memory solid state disk |
-
2016
- 2016-09-28 CN CN201610859249.7A patent/CN107870834B/en active Active
Patent Citations (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040003328A1 (en) * | 2002-06-28 | 2004-01-01 | Dominic Viens | Instrument initiated communication for automatic test equipment |
| US20040102917A1 (en) * | 2002-11-21 | 2004-05-27 | Zhiguo Chen | Apparatus for testing I/O ports of a computer motherboard |
| CN1838306A (en) * | 2005-12-29 | 2006-09-27 | 深圳易拓科技有限公司 | Integrated testing system for hard disk |
| JP3121365U (en) * | 2006-02-20 | 2006-05-18 | 亞旭電腦股▲分▼有限公司 | Peripheral device connecting device with boundary scan test function |
| CN201751895U (en) * | 2009-10-13 | 2011-02-23 | 深圳和而泰智能控制股份有限公司 | Port expansion detection circuit and port expansion detection device |
| CN102063357A (en) * | 2009-11-13 | 2011-05-18 | 鸿富锦精密工业（深圳）有限公司 | Sas interface testing device |
| CN102135931A (en) * | 2010-01-25 | 2011-07-27 | 英业达股份有限公司 | Test module of passive backboard and method for testing passive backboard |
| CN102331963A (en) * | 2010-07-13 | 2012-01-25 | 研祥智能科技股份有限公司 | Digital input and output interface test tool and test method |
| CN102419722A (en) * | 2010-09-27 | 2012-04-18 | 鸿富锦精密工业（深圳）有限公司 | Hard disk test system |
| CN102567156A (en) * | 2010-12-31 | 2012-07-11 | 鸿富锦精密工业（深圳）有限公司 | Test set for server hard disk backplane |
| CN102841633A (en) * | 2011-06-23 | 2012-12-26 | 鸿富锦精密工业（深圳）有限公司 | Hard disk expansion device and expansion module |
| CN103002473A (en) * | 2012-11-27 | 2013-03-27 | 上海创远仪器技术股份有限公司 | Method, device and system for testing wireless terminal |
| CN203039918U (en) * | 2012-11-27 | 2013-07-03 | 上海创远仪器技术股份有限公司 | Wireless terminal testing device and wireless terminal testing system |
| US20150026526A1 (en) * | 2013-07-16 | 2015-01-22 | American Megatrends, Inc. | Techniques for testing enclosure management controller using backplane initiator |
| CN103530257A (en) * | 2013-10-18 | 2014-01-22 | 浪潮电子信息产业股份有限公司 | SAS signal quality optimization method of dynamic self-adapting transmission route |
| CN104375923A (en) * | 2014-11-24 | 2015-02-25 | 英业达科技有限公司 | Hard disk drive (HDD) running state detection system |
| CN104461800A (en) * | 2014-11-24 | 2015-03-25 | 英业达科技有限公司 | Hard disk running state detection system |
| CN105529045A (en) * | 2015-12-02 | 2016-04-27 | 英业达科技有限公司 | Lamp signal control system for nonvolatile memory solid state disk |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115602240A (en) * | 2021-06-28 | 2023-01-13 | 慧荣科技股份有限公司（Tw） | Computer readable storage medium and debugging method and device of solid state disk device |
| CN115602240B (en) * | 2021-06-28 | 2026-02-06 | 慧荣科技股份有限公司 | Computer readable storage medium and debugging method and device of solid state disk device |
| CN115686969A (en) * | 2022-11-10 | 2023-02-03 | 宁畅信息产业(北京)有限公司 | A hard disk backplane testing method, device, equipment and medium |
| CN116225846A (en) * | 2023-01-19 | 2023-06-06 | 苏州浪潮智能科技有限公司 | Test method, device and electronic equipment for hard disk backplane communication interface |
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