CN107817862A - A kind of multiplier for improving band gap reference precision trims compensation technique - Google Patents
A kind of multiplier for improving band gap reference precision trims compensation technique Download PDFInfo
- Publication number
- CN107817862A CN107817862A CN201711316170.0A CN201711316170A CN107817862A CN 107817862 A CN107817862 A CN 107817862A CN 201711316170 A CN201711316170 A CN 201711316170A CN 107817862 A CN107817862 A CN 107817862A
- Authority
- CN
- China
- Prior art keywords
- multiplier
- curve
- temperature
- band gap
- gap reference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is DC
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices
- G05F1/565—Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
- G05F1/567—Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor for temperature compensation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Manipulation Of Pulses (AREA)
Abstract
本发明提出了一种提高带隙基准源精度的乘数修调补偿技术,归属于微电子学和传感技术等领域,其特征在于采用乘数修调曲线与带隙基准源温度特性曲线相乘的方法,并合理设计乘数修调曲线在不同温度区间内的函数值,对带隙基准源的温度特性曲线进行曲率修调;乘数修调曲线是一种函数值随温度变化且最大值为1的曲线,在带隙基准源温漂较小的温度区间,乘数修调曲线的函数值较大,在带隙基准源温漂较大的温度区间,乘数修调曲线的函数值较小;本发明的优越性在于易于实现,简便通用,并极大提升带隙基准源的整体精度,保证高精度电路系统的稳定性;本发明提出的乘数修调补偿技术适用于提高各种带隙基准源的精度。
The present invention proposes a multiplier trim compensation technology for improving the accuracy of the bandgap reference source, which belongs to the fields of microelectronics and sensing technology, and is characterized in that the multiplier trimming curve is used to match the temperature characteristic curve of the bandgap reference source. Multiply method, and rationally design the function value of the multiplier trimming curve in different temperature ranges, and adjust the curvature of the temperature characteristic curve of the bandgap reference source; the multiplier trimming curve is a function value that changes with temperature and the maximum For the curve with a value of 1, the function value of the multiplier trimming curve is larger in the temperature range where the temperature drift of the bandgap reference source is small, and the function value of the multiplier trimming curve is larger in the temperature range where the temperature drift of the bandgap reference source is larger. The value is small; the advantage of the present invention is that it is easy to implement, simple and universal, and greatly improves the overall accuracy of the bandgap reference source, ensuring the stability of the high-precision circuit system; the multiplier trim compensation technology proposed by the present invention is suitable for improving Accuracy of various bandgap reference sources.
Description
技术领域technical field
本发明提出了一种提高带隙基准源精度的乘数修调补偿技术,归属于微电子学和传感技术等领域。The invention proposes a multiplier trimming and compensation technology for improving the accuracy of a bandgap reference source, which belongs to the fields of microelectronics and sensing technology.
背景技术Background technique
带隙基准源作为精密电路系统的电源,参考电压等部分,其精度对系统的稳定性有着重要作用;为提高带隙基准源的精度,人们提出了多种对带隙基准源温度特性曲线进行曲率补偿的技术,但是这些技术基本是基于加减法实现,即使用原来的带隙基准源温度特性曲线与所用的曲率补偿曲线相加减,实现曲率补偿,这类基于加减法的曲率补偿方法一方面精度提高的程度还不够高,另一方面往往需要增加电路来实现补偿,导致电路复杂度,芯片面积,成本,功耗的增加。The bandgap reference source is used as the power supply and reference voltage of the precision circuit system, and its accuracy plays an important role in the stability of the system; in order to improve the accuracy of the bandgap reference source, people have proposed a variety of curves for the temperature characteristic curve of the bandgap reference source However, these technologies are basically implemented based on addition and subtraction, that is, using the original bandgap reference source temperature characteristic curve to add and subtract the curvature compensation curve used to achieve curvature compensation. This type of curvature compensation based on addition and subtraction On the one hand, the degree of accuracy improvement is not high enough, on the other hand, it is often necessary to add circuits to achieve compensation, resulting in increased circuit complexity, chip area, cost, and power consumption.
发明内容Contents of the invention
本发明的目的是提出一种简便高效的提高带隙基准源精度的乘数修调补偿技术,该技术以乘法的方式改善带隙基准源温漂小的温度区间内的温度特性曲线,并极大改善带隙基准源温漂大的温度区间内的温度特性曲线,从而简便高效的提高带隙基准源在整体温度范围内的精度,以克服现有技术的不足。The purpose of the present invention is to propose a simple and efficient multiplier trimming and compensation technology for improving the accuracy of the bandgap reference source. This technology improves the temperature characteristic curve in the temperature range with small temperature drift of the bandgap reference source by means of multiplication, and is extremely efficient. Greatly improve the temperature characteristic curve of the bandgap reference source in the temperature range with large temperature drift, thereby simply and efficiently improving the accuracy of the bandgap reference source in the overall temperature range, so as to overcome the shortcomings of the prior art.
为了达到上述目的,本发明提出了一种提高带隙基准源精度的乘数修调补偿技术,采用乘数修调曲线与带隙基准源温度特性曲线相乘的方法,该发明中乘数修调曲线作为带隙基准源温度曲线的乘法系数,合理设计其在不同温度区间内的函数值,对带隙基准源的温度特性曲线进行曲率修调,简便高效地得到精度高的修调后带隙基准源的温度特性曲线。In order to achieve the above-mentioned purpose, the present invention proposes a multiplier trimming and compensation technology for improving the accuracy of the bandgap reference source, and adopts the method of multiplying the multiplier trimming curve with the temperature characteristic curve of the bandgap reference source. In this invention, the multiplier trimming The adjustment curve is used as the multiplication coefficient of the temperature curve of the bandgap reference source, and its function value in different temperature ranges is reasonably designed to adjust the curvature of the temperature characteristic curve of the bandgap reference source to obtain the adjusted band with high precision simply and efficiently. The temperature characteristic curve of the gap reference source.
所述乘数修调曲线是一种函数值随温度变化且最大值为1的曲线,在带隙基准源温漂较小的温度区间,乘数修调曲线的函数值较大,在带隙基准源温漂较大的温度区间,乘数修调曲线的函数值较小。The multiplier trimming curve is a curve whose function value changes with temperature and has a maximum value of 1. In the temperature range where the temperature drift of the bandgap reference source is small, the function value of the multiplier trimming curve is relatively large. In the temperature range where the temperature drift of the reference source is large, the function value of the multiplier trimming curve is small.
所述提高带隙基准源精度的乘数修调补偿技术使用所述乘数修调曲线与所述带隙基准源的温度特性曲线相乘,当乘数修调曲线的函数值接近1时,可改善带隙基准源温漂较小的温度区间内的温度特性曲线,当乘数修调曲线的函数值较小时,可极大改善带隙基准源温漂大的温度区间内的温度特性曲线,从而极大提高带隙基准源的精度。The multiplier trimming compensation technology for improving the accuracy of the bandgap reference source uses the multiplier trimming curve to multiply the temperature characteristic curve of the bandgap reference source. When the function value of the multiplier trimming curve is close to 1, It can improve the temperature characteristic curve in the temperature range with small temperature drift of the bandgap reference source. When the function value of the multiplier trimming curve is small, it can greatly improve the temperature characteristic curve in the temperature range with large temperature drift of the bandgap reference source , thus greatly improving the accuracy of the bandgap reference source.
所述带隙基准源的温度特性曲线是由各种带隙基准电路产生的基准源随温度变化的曲线,从其形状上分类,主要有下开口的类抛物曲线,上开口的类抛物曲线和类正弦曲线。The temperature characteristic curve of the bandgap reference source is the curve of the reference source changing with temperature produced by various bandgap reference circuits. It is classified from its shape, mainly including a parabolic curve with a lower opening, a parabolic curve with an upper opening and sinusoidal like.
本发明具有的优点在于简便高效,易于实现,灵活通用;可大幅度提高带隙基准源的精度;可通过不增加电路复杂度的方式实现,减小芯片面积,节约成本,降低功耗。The invention has the advantages of being simple and efficient, easy to implement, and flexible and universal; it can greatly improve the accuracy of the bandgap reference source; it can be realized without increasing the complexity of the circuit, reducing the chip area, saving costs, and reducing power consumption.
附图说明Description of drawings
图1是本发明所提出的一种提高带隙基准源精度的乘数修调补偿技术的原理图;Fig. 1 is the schematic diagram of a kind of multiplier trim compensation technology that improves the precision of bandgap reference source that the present invention proposes;
图2是本发明在修调具有下开口类抛物温度特性曲线的带隙基准源时的乘数修调原理图;Fig. 2 is the schematic diagram of multiplier trimming when the present invention is trimming the bandgap reference source with the lower opening parabolic temperature characteristic curve;
图3是本发明在修调具有上开口类抛物温度特性曲线的带隙基准源时的乘数修调原理图。Fig. 3 is a multiplier trimming schematic diagram of the present invention when trimming a bandgap reference source with an upper-opening parabolic temperature characteristic curve.
具体实施方式Detailed ways
下面结合附图和实施方式;Below in conjunction with accompanying drawing and embodiment;
请参阅图1,为本发明所提出的一种提高带隙基准源精度的乘数修调补偿技术的原理图;本发明提出的一种提高带隙基准源精度的乘数修调补偿技术,采用乘数修调曲线与带隙基准源温度特性曲线相乘的方法,本发明中乘数修调曲线作为带隙基准源温度曲线的乘法系数,合理设计其在不同温度区间内的函数值,对带隙基准源的温度特性曲线进行曲率修调,得到精度高的修调后带隙基准源的温度特性曲线。Please refer to Fig. 1, which is a schematic diagram of a multiplier trimming compensation technology for improving the accuracy of the bandgap reference source proposed by the present invention; a multiplier trimming compensation technology for improving the accuracy of the bandgap reference source proposed by the present invention, Adopt the method of multiplying the multiplier trimming curve and the bandgap reference source temperature characteristic curve, the multiplier trimming curve is used as the multiplication coefficient of the bandgap reference source temperature curve in the present invention, rationally design its function value in different temperature intervals, Curvature trimming is performed on the temperature characteristic curve of the bandgap reference source to obtain the temperature characteristic curve of the trimmed bandgap reference source with high precision.
所述带隙基准源的温度特性曲线是由各种带隙基准电路产生的基准源随温度变化的曲线,从其形状上分类,主要有下开口的类抛物曲线,上开口的类抛物曲线和类正弦曲线。The temperature characteristic curve of the bandgap reference source is the curve of the reference source changing with temperature produced by various bandgap reference circuits. It is classified from its shape, mainly including a parabolic curve with a lower opening, a parabolic curve with an upper opening and sinusoidal like.
所述乘数修调曲线是一种函数值随温度变化且最大值为1的曲线,在带隙基准源温漂较小的温度区间,乘数修调曲线的函数值较大,在带隙基准源温漂较大的温度区间,乘数修调曲线的函数值较小。The multiplier trimming curve is a curve whose function value changes with temperature and has a maximum value of 1. In the temperature range where the temperature drift of the bandgap reference source is small, the function value of the multiplier trimming curve is relatively large. In the temperature range where the temperature drift of the reference source is large, the function value of the multiplier trimming curve is small.
所述乘数修调补偿技术使用所述乘数修调曲线与所述带隙基准源的温度特性曲线相乘,当乘数修调曲线的函数值接近1时,可改善带隙基准源温漂较小的温度区间内的温度特性曲线,当乘数修调曲线的函数值较小时,可极大改善带隙基准源温漂大的温度区间内的温度特性曲线,从而极大提高带隙基准源的精度。The multiplier trimming compensation technology uses the multiplier trimming curve to multiply the temperature characteristic curve of the bandgap reference source. When the function value of the multiplier trimming curve is close to 1, the temperature of the bandgap reference source can be improved. The temperature characteristic curve in the temperature range with small drift, when the function value of the multiplier trimming curve is small, the temperature characteristic curve in the temperature range with large temperature drift of the bandgap reference source can be greatly improved, thereby greatly improving the bandgap The precision of the reference source.
请参阅图2,为本发明在修调具有下开口温度特性曲线的带隙基准源时的修调原理图,其乘数修调补偿原理与图1中相同。Please refer to FIG. 2 , which is a schematic diagram of trimming when trimming a bandgap reference source with a lower opening temperature characteristic curve according to the present invention, and its multiplier trimming compensation principle is the same as that in FIG. 1 .
请参阅图3,为本发明在修调具有上开口温度特性曲线的带隙基准源时的修调原理图,其乘数修调补偿原理与图1中相同。Please refer to FIG. 3 , which is a schematic diagram of trimming when trimming a bandgap reference source with an upper opening temperature characteristic curve according to the present invention, and its multiplier trimming compensation principle is the same as that in FIG. 1 .
以上所述内容仅为本发明的较佳实施例,不能被认为用于限定本发明的实施范围;凡依本发明申请范围所作的均等变化与改进等,均应仍归属于本发明的专利涵盖范围之内。The above-mentioned contents are only preferred embodiments of the present invention, and cannot be considered as limiting the implementation scope of the present invention; all equal changes and improvements made according to the scope of application of the present invention should still belong to the scope of the patent of the present invention. within range.
Claims (4)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711316170.0A CN107817862A (en) | 2017-12-06 | 2017-12-06 | A kind of multiplier for improving band gap reference precision trims compensation technique |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711316170.0A CN107817862A (en) | 2017-12-06 | 2017-12-06 | A kind of multiplier for improving band gap reference precision trims compensation technique |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107817862A true CN107817862A (en) | 2018-03-20 |
Family
ID=61605526
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711316170.0A Pending CN107817862A (en) | 2017-12-06 | 2017-12-06 | A kind of multiplier for improving band gap reference precision trims compensation technique |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107817862A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109375697A (en) * | 2018-12-24 | 2019-02-22 | 中国电子科技集团公司第五十八研究所 | A Temperature Drift Trimming Circuit for Second-Order Curvature Compensation Reference Source |
| CN109738784A (en) * | 2018-12-17 | 2019-05-10 | 矽力杰半导体技术(杭州)有限公司 | The temperature curve acquisition methods of circuit |
| CN115877908A (en) * | 2023-03-02 | 2023-03-31 | 盈力半导体(上海)有限公司 | Band gap voltage reference circuit and second-order nonlinear correction circuit and chip thereof |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080106326A1 (en) * | 2006-11-06 | 2008-05-08 | Richard Gaggl | Reference voltage circuit and method for providing a reference voltage |
| CN102246115A (en) * | 2008-11-25 | 2011-11-16 | 凌力尔特有限公司 | Circuitry, trim and layout for temperature compensation of metal resistors in semiconductor chips |
| CN102707760A (en) * | 2012-06-26 | 2012-10-03 | 天津大学 | Device for achieving low temperature drift of band-gap reference circuit |
-
2017
- 2017-12-06 CN CN201711316170.0A patent/CN107817862A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080106326A1 (en) * | 2006-11-06 | 2008-05-08 | Richard Gaggl | Reference voltage circuit and method for providing a reference voltage |
| CN102246115A (en) * | 2008-11-25 | 2011-11-16 | 凌力尔特有限公司 | Circuitry, trim and layout for temperature compensation of metal resistors in semiconductor chips |
| CN102707760A (en) * | 2012-06-26 | 2012-10-03 | 天津大学 | Device for achieving low temperature drift of band-gap reference circuit |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109738784A (en) * | 2018-12-17 | 2019-05-10 | 矽力杰半导体技术(杭州)有限公司 | The temperature curve acquisition methods of circuit |
| CN109738784B (en) * | 2018-12-17 | 2021-03-30 | 矽力杰半导体技术(杭州)有限公司 | Temperature curve acquisition method of circuit |
| CN109375697A (en) * | 2018-12-24 | 2019-02-22 | 中国电子科技集团公司第五十八研究所 | A Temperature Drift Trimming Circuit for Second-Order Curvature Compensation Reference Source |
| CN109375697B (en) * | 2018-12-24 | 2023-10-20 | 中国电子科技集团公司第五十八研究所 | Temperature drift trimming circuit |
| CN115877908A (en) * | 2023-03-02 | 2023-03-31 | 盈力半导体(上海)有限公司 | Band gap voltage reference circuit and second-order nonlinear correction circuit and chip thereof |
| CN115877908B (en) * | 2023-03-02 | 2023-04-28 | 盈力半导体(上海)有限公司 | Band gap voltage reference circuit, second-order nonlinear correction circuit and chip thereof |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107817862A (en) | A kind of multiplier for improving band gap reference precision trims compensation technique | |
| TW200728950A (en) | Perfectly curvature correted bandgap reference | |
| TWD211240S (en) | Connector | |
| TW200629033A (en) | Low voltage bandgap reference (BGR) circuit | |
| TW200641337A (en) | A precise temperature sensor with smart programmable calibration | |
| CN105892548B (en) | Reference voltage generation circuit with temperature compensating function | |
| CN107943192A (en) | A kind of band-gap reference source circuit of superhigh precision | |
| Mukherjee et al. | Transient stability constrained optimal power flow using oppositional krill herd algorithm | |
| CN104793689A (en) | Reference voltage source circuit | |
| TW200717880A (en) | Opto-electronic semiconductor component with current expansion layer | |
| Sun et al. | Stochastic symplectic methods based on the Padé approximations for linear stochastic Hamiltonian systems | |
| TWD187375S (en) | Electrical connector | |
| TANG et al. | A Comparative Study of Aesthetic Differences between Guangxi Folk Dance and ASEAN Dance | |
| CN205656575U (en) | Computer constant voltage power supply circuit | |
| CN101131593A (en) | Current source | |
| TWD220565S (en) | Wearable smart device | |
| CN203720355U (en) | FPGA and ARM architecture-based satellite navigation interference-resisting circuit | |
| CN205246715U (en) | Multichannel high accuracy phase difference base mark signal generator based on AD9959 | |
| CN204808101U (en) | Band gap reference circuit of low pressure low -power consumption | |
| CN204515583U (en) | A kind of current generating circuit of negative temperature coefficient | |
| Hael et al. | Correction to: Dynamic clustering of spatial–temporal rainfall and temperature data over multi‑sites in Yemen using multivariate functional approach | |
| Boisson de Chazournes | One Swallow Does Not a Summer Make, but Might the Paris Agreement on Climate Change a Better Future Create? | |
| Kaur | Dumbo, Brooklyn | |
| CN204904124U (en) | Controllable miniwatt high accuracy direct current source of computer | |
| CN107153441A (en) | A kind of reference voltage generating circuit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20180320 |