CN107622007A - Application testing method and device - Google Patents

Abstract

The application discloses application testing methods and devices. A specific implementation manner of the method includes: obtaining a set of candidate test cases for testing an application, wherein the application includes at least one application sub-function, and each application sub-function corresponds to a test case for testing the application sub-function. Corresponding; determining a set of application sub-functions to be used for testing from at least one application sub-function, wherein the set of application sub-functions includes at least one of the following: a predetermined number of Application sub-function; the application sub-function with the maximum expected loss value, the maximum expected loss value is obtained by analyzing the historical defect data of the application sub-function; obtain the test case set corresponding to the application sub-function set from the candidate test case set; use A collection of test cases tests the application. This embodiment realizes pertinent application testing.

Description

Applied Test Methods and Apparatus

technical field

The present application relates to the field of computer technology, in particular to the field of testing technology, in particular to an application testing method and an application testing device.

Background technique

After completing the basic functions of an application, new functions will be added to the application. After the new function code is merged into the original code, it will generally have an impact on the original function, with acceptable impact and serious impact on the original function. In order to ensure the normal use of the original function and minimize the impact of the new function on the original function, after the new function code is incorporated, the application must be regression tested.

However, in the existing application testing methods, the testers usually select the test cases corresponding to the main functions of the application or the test cases corresponding to all functions to test the application according to the experience and the characteristics of the test object. Therefore, there are historical defects in the functions. Insufficient data utilization and lack of targeted application testing.

Contents of the invention

The purpose of this application is to propose an improved application testing method and device to solve the technical problems mentioned in the background technology section above.

In a first aspect, the present application provides an application testing method, the method comprising: obtaining a set of candidate test cases for testing an application, wherein the application includes at least one application sub-function, and each application sub-function is related to the Corresponding to the test case for testing the application sub-function; determining a set of application sub-functions to be used for testing from the at least one application sub-function, wherein the set of application sub-functions includes at least one of the following: according to the application sub-function A predetermined number of application sub-functions selected in descending order of the defect number of the function; the application sub-function with the largest loss expectation value, the maximum loss expectation value is obtained by analyzing the historical defect data of the application sub-function; from the Obtain a test case set corresponding to the application sub-function set from the candidate test case set; use the test case set to test the application.

In some embodiments, after the determination of the set of application sub-functions to be used for testing from the at least one application sub-function, the method further includes: performing deduplication processing on the set of application sub-functions to generate each A set of application sub-functions with non-repetitive application sub-functions; a set of test cases corresponding to the non-repetitive set of application sub-functions is obtained from the set of candidate test cases.

In some embodiments, after obtaining the test case set corresponding to the non-repetitive application sub-function set from the candidate test case set, the method further includes: deduplicating the test case set processing, generating a non-repetitive test case set for each test case; using the non-repetitive test case set to test the application.

In some embodiments, the set of candidate test cases includes at least one of the following: a set of candidate test cases stored locally in advance, and the set of candidate test cases is written on the set of candidate test cases stored on the terminal.

In some embodiments, the testing the application by using the non-repetitive set of test cases includes: sending the non-repetitive set of test cases to the terminal on which the application is installed for use by the terminal The unique set of test cases tests the application.

In a second aspect, the present application provides an application testing device, the device comprising: a first acquiring unit configured to acquire a set of candidate test cases for testing an application, wherein the application includes at least one application sub-function, Each application subfunction corresponds to a test case for testing the application subfunction; the determining unit is configured to determine a set of application subfunctions to be used for testing from the at least one application subfunction, wherein the The set of application sub-functions includes at least one of the following: a predetermined number of application sub-functions selected in descending order of the number of defects in the application sub-functions; The historical defect data of the sub-function is analyzed; the second acquisition unit is configured to obtain the test case set corresponding to the application sub-function set from the candidate test case set; the test unit is configured to use the set of test cases. The above test case set is used to test the application.

In some embodiments, the device further includes: a first generating unit configured to perform deduplication processing on the set of application sub-functions, and generate a set of application sub-functions in which each application sub-function does not repeat; and the second The obtaining unit is further configured to obtain a test case set corresponding to the non-repeated application sub-function set from the candidate test case set.

In some embodiments, the apparatus further includes: a second generation unit configured to perform deduplication processing on the set of test cases, and generate a set of test cases in which each test case is not repeated; and the test unit is further configured for The application is tested by using the non-repetitive test case set.

In some embodiments, the set of candidate test cases includes at least one of the following: a set of candidate test cases stored locally in advance, and the set of candidate test cases is written on the set of candidate test cases stored on the terminal.

In some embodiments, the testing unit is further configured to: send the non-repetitive test case set to the terminal on which the application is installed, so that the terminal can use the non-repetitive test case set to test all The above application is tested.

The application testing method and device provided by the present application determine the application sub-function with the largest number of defects of the application sub-function and the application sub-function with the largest expected loss value as the application sub-function to be tested from at least one application sub-function of the application Then obtain the test case set corresponding to the application sub-function set to be used for testing from the obtained candidate test case set for testing the application, and finally use the test case set to test the application, thereby effectively utilizing the application sub-function Historical defect data enables targeted application testing.

Description of drawings

Other characteristics, objects and advantages of the present application will become more apparent by reading the detailed description of non-limiting embodiments made with reference to the following drawings:

FIG. 1 is an exemplary system architecture diagram to which the present application can be applied;

Fig. 2 is a flow chart according to an embodiment of the application testing method of the present application;

Fig. 3 is a flow chart according to yet another embodiment of the application testing method of the present application;

Fig. 4 is a schematic structural view of an embodiment of an application testing device according to the present application;

Fig. 5 is a schematic structural diagram of a computer system suitable for implementing the server of the embodiment of the present application.

detailed description

The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. It should also be noted that, for the convenience of description, only the parts related to the related invention are shown in the drawings.

It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

FIG. 1 shows an exemplary system architecture 100 to which embodiments of the application testing method or application testing device of the present application can be applied.

As shown in FIG. 1 , a system architecture 100 may include terminal devices 101 , 102 , 103 , a network 104 and a server 105 . The network 104 is used as a medium for providing communication links between the terminal devices 101 , 102 , 103 and the server 105 . Network 104 may include various connection types, such as wires, wireless communication links, or fiber optic cables, among others.

Users can use terminal devices 101 , 102 , 103 to interact with server 105 via network 104 to receive or send messages and the like. Various communication client applications may be installed on the terminal devices 101, 102, 103, such as terminal device security applications, shopping applications, search applications, code editing tools, and the like.

Terminal devices 101, 102, 103 can be various electronic devices that have a display screen and support code editing, including but not limited to smart phones, tablet computers, e-book readers, MP3 players (Moving Picture Experts Group Audio Layer III, dynamic image Expert Compression Standard Audio Layer 3), MP4 (Moving PictureExperts Group Audio Layer IV, Moving Picture Experts Compression Standard Audio Layer 4) Players, Laptop Portable Computers and Desktop Computers, etc.

The server 105 may be a server that provides various services, such as a background test server that provides support for test cases written on the terminal devices 101 , 102 , and 103 . The background test server can analyze and process the obtained test case set, etc., and use the processing result (for example, the filtered test case set) to test the application.

It should be noted that the application testing method provided in the embodiment of the present application is generally executed by the server 105 , and correspondingly, the application testing device is generally set in the server 105 .

It should be understood that the numbers of terminal devices, networks and servers in Fig. 1 are only illustrative. According to the implementation needs, there can be any number of terminal devices, networks and servers.

Continuing to refer to FIG. 2 , a flow 200 of an embodiment of the application testing method according to the present application is shown. The described application testing method comprises the following steps:

Step 201, acquiring a set of candidate test cases for testing an application.

In this embodiment, the electronic device on which the application testing method runs (such as the server shown in FIG. 1 ) can obtain a set of candidate test cases for testing the application, wherein the above-mentioned application can include at least one application sub-function, each An application sub-function corresponds to a test case used to test the application sub-function. The above-mentioned test case is a set of test inputs, execution conditions and expected results compiled for a specific target in order to test a program path or Verify that a specific requirement is met. As an example, the above-mentioned application may include multiple functions, such as: user management function, commodity settlement function, etc., and the above-mentioned commodity settlement function may contain multiple application sub-functions, such as the function of calculating the price of commodities in the shopping cart, payment function, etc., then , the function of calculating the price of goods in the shopping cart corresponds to the test case used to test the function of calculating the price of goods in the shopping cart, and the payment function corresponds to the test case used to test the payment function.

In some optional implementations of this embodiment, the above-mentioned set of candidate test cases may be pre-stored in the above-mentioned electronic device, and when the above-mentioned application is tested, the above-mentioned electronic device may directly obtain the candidate test case for testing the application locally. A collection of use cases; the above-mentioned candidate test cases can also be stored in the terminal equipment on which the above-mentioned candidate test cases are written, and when the above-mentioned application is tested, the above-mentioned electronic equipment can be used by testers to perform tests through a wired connection or a wireless connection The terminal device for use case writing obtains a set of candidate test cases for testing the application. It should be pointed out that the above wireless connection methods may include but not limited to 3G/4G connection, WiFi connection, Bluetooth connection, WiMAX connection, Zigbee connection, UWB (ultra wideband) connection, and other wireless connection methods known or developed in the future .

Step 202, determining a set of application sub-functions to be used for testing from at least one application sub-function.

In this embodiment, the above-mentioned electronic device may determine a set of application sub-functions to be used for testing the above-mentioned application from at least one application sub-function contained in the above-mentioned application, wherein the application sub-functions in the above-mentioned application sub-function set may be A predetermined number of application sub-functions selected in descending order of the number of defects in the application sub-functions within a predetermined period of time, the number of defects is recorded in the defect management system of the above-mentioned application; the application sub-functions in the above-mentioned application sub-function set It may also be an application sub-function with a maximum loss expectation, wherein the maximum loss expectation may be obtained by analyzing historical defect data recorded in the defect management system of the above application.

In this embodiment, the above-mentioned electronic device can first obtain the historical defect data of each application sub-function of the above-mentioned application from the defect management system of the above-mentioned application; after that, it can analyze the above-mentioned historical defect data to determine the potential defect data of each application sub-function , wherein the above-mentioned potential defect data may include the number of serious potential defects and the number of non-serious potential defects, and the above-mentioned defect management system may pre-classify potential defects into serious potential defects and non-serious potential defects according to the degree of impact of defects on application sub-functions, The above-mentioned serious potential defects may be defects that prevent the above-mentioned application sub-functions from realizing their functions. For example, in shopping applications, the defects that cannot add products to the shopping cart can be classified as serious potential defects; then, each application sub-function may be obtained and implemented The total number of steps of the function and the number of key steps. The application sub-function includes at least one step. The above-mentioned key step may be a step that determines the function realization of the application sub-function; after that, subtract the number of the above-mentioned key steps from the total number of the above-mentioned steps , to obtain the number of non-critical steps, and then divide the above-mentioned number of critical steps by the total number of the above-mentioned steps to determine the probability of serious defects in each application sub-function, and then divide the above-mentioned number of non-critical steps by the total number of the above-mentioned steps, Determine the probability of non-serious defects in each application sub-function; then, calculate the sum of the above-mentioned number of serious potential defects multiplied by the above-mentioned probability of serious defects and the number of non-serious potential defects multiplied by the above-mentioned probability of non-serious defects to determine each application The expected loss of the subfunction; finally, the applied subfunction with the largest expected loss is chosen.

As an example, the electronic device determines that the number of serious potential defects of the first application sub-function is 1 and the number of non-serious potential defects is 2, the number of serious potential defects of the second application sub-function is 2, and the number of non-serious potential defects is 5. The number of serious potential defects of the three application sub-functions is 4, and the number of non-serious potential defects is 2; after that, the total number of steps to realize the first application sub-function is 5, and the number of key steps is 1, then the first application sub-function The probability of serious defects is 0.2, the probability of non-serious defects is 0.8, the total number of steps to achieve the second application sub-function is 2, and the number of key steps is 1, then the probability of serious defects in the first application sub-function is 0.5, the probability of non-serious defects is 0.5, the total number of steps to achieve the third application sub-function is 10, and the number of key steps is 3, then the probability of serious defects in the first application sub-function is 0.3, and non-serious defects occur. The probability of serious defects is 0.7; then, calculate the sum of the number of serious potential defects of the first application sub-function multiplied by the probability of serious defects 0.2 and the number of non-serious potential defects 2 times the probability of non-serious defects 0.8, and determine the first The loss expectation value of an application sub-function is 1.8, calculate the sum of the number of serious potential defects of the second application sub-function multiplied by the probability of serious defects 0.5 and the number of non-serious potential defects 5 multiplied by the probability of non-serious defects 0.5, and determine The loss expectation value of the first application sub-function is 3.5, calculate the sum of the number of serious potential defects of the third application sub-function multiplied by 0.3, the number of serious potential defects, and the number of non-serious potential defects, multiplied by the probability of non-serious defects 0.7, The expected loss value of the third application sub-function is determined to be 2.6; finally, the second application sub-function with the largest expected loss value of 3.5 is selected.

In this embodiment, after the above-mentioned application adds a function, the above-mentioned electronic device can first obtain the degree of influence of the added application sub-function on the above-mentioned original application sub-function of the above-mentioned application; after that, it can obtain the above-mentioned The historical defect data of each application sub-function of the application; then, the above-mentioned historical defect data and the above-mentioned degree of influence may be analyzed to determine the potential defect data of each application sub-function.

Step 203, obtaining a test case set corresponding to the application sub-function set from the candidate test case set.

In this embodiment, the above-mentioned electronic device may acquire a set of test cases corresponding to the set of application sub-functions determined in step 202 from the set of candidate test cases acquired in step 201 .

Step 204, using the set of test cases to test the application.

In this embodiment, the above-mentioned electronic device may use the test case set acquired in step 203 to test the above-mentioned application.

In some optional implementation manners of this embodiment, the above-mentioned electronic device may send the above-mentioned test case set to the terminal device on which the above-mentioned application is installed, so that the above-mentioned terminal device uses the above-mentioned test case set to test the above-mentioned application.

Further referring to FIG. 3 , a flow 300 of yet another embodiment of the application testing method is shown. The flow 300 of the application testing method includes the following steps:

Step 301, acquiring a set of candidate test cases for testing an application.

In this embodiment, the electronic device on which the application testing method runs (such as the server shown in FIG. 1 ) can obtain a set of candidate test cases for testing the application, wherein the above-mentioned application can include at least one application sub-function, each An application sub-function corresponds to a test case used to test the application sub-function. The above-mentioned test case is a set of test inputs, execution conditions and expected results compiled for a specific target in order to test a program path or Verify that a specific requirement is met.

In some optional implementations of this embodiment, the above-mentioned set of candidate test cases may be pre-stored in the above-mentioned electronic device, and when the above-mentioned application is tested, the above-mentioned electronic device may directly obtain the candidate test case for testing the application locally. A collection of use cases; the above-mentioned candidate test cases can also be stored in the terminal equipment on which the above-mentioned candidate test cases are written, and when the above-mentioned application is tested, the above-mentioned electronic equipment can be used by testers to perform tests through a wired connection or a wireless connection The terminal device for use case writing obtains a set of candidate test cases for testing the application.

Step 302, determining a set of application sub-functions to be used for testing from at least one application sub-function.

In this embodiment, the above-mentioned electronic device may determine a set of application sub-functions to be used for testing the above-mentioned application from the above-mentioned at least one application sub-function, wherein, the application sub-functions in the above-mentioned application sub-function set may be based on historical A predetermined number of application sub-functions are selected in descending order of the number of defects in application sub-functions within a time period. The above-mentioned historical time period can be the past month, and the above-mentioned number of defects is recorded in the defect management system of the above-mentioned application; the above-mentioned application sub-function The application sub-function in the function set may also be the application sub-function with the maximum expected loss value, wherein the maximum expected loss value may be obtained by analyzing historical defect data recorded in the defect management system of the above-mentioned application.

Step 303, deduplication processing is performed on the application sub-function set to generate an application sub-function set in which each application sub-function does not overlap.

In this embodiment, the above-mentioned electronic device may first obtain repeated application sub-functions in the above-mentioned set of application sub-functions; then, at least one of the above-mentioned repeated application sub-functions may be deleted until there is only one application sub-function left; finally, It is possible to generate a set of application sub-functions in which each application sub-function does not repeat.

As an example, the predetermined number of application sub-functions selected in descending order of the number of defects in the application sub-functions are the first application sub-function, the third application sub-function, the sixth application sub-function, the seventh application sub-function and the seventh application sub-function. Ten application sub-functions, the application sub-functions with the largest expected value of loss are the second application sub-function, the third application sub-function, the fifth application sub-function, the eighth application sub-function and the tenth application sub-function, the composition of the above application sub-functions The first application sub-function, the third application sub-function, the sixth application sub-function, the seventh application sub-function, the tenth application sub-function, the second application sub-function, the third application sub-function, the fifth application sub-function The sub-functions, the eighth application sub-function and the tenth application sub-function are de-duplicated, and a set of application sub-functions with no repetition of each application sub-function is generated as the first application sub-function, the second application sub-function, the third application sub-function, The fifth application sub-function, the sixth application sub-function, the seventh application sub-function, the eighth application sub-function and the tenth application sub-function.

Step 304, obtaining a test case set corresponding to a non-repeated application sub-function set from the candidate test case set.

In this embodiment, the above-mentioned electronic device may obtain a test case set corresponding to the non-repeated application sub-function set generated in step 303 from the candidate test case set obtained in step 301 .

Step 305 , deduplicating the test case set to generate a test case set in which each test case does not repeat.

In this embodiment, the above-mentioned electronic device may obtain repeated test cases in the test case set obtained in step 304; afterward, at least one of the above-mentioned repeated test cases may be deleted until there is one remaining test case; finally, it may be Generate a set of test cases that do not repeat each test case.

In step 306, the application is tested using a set of non-repetitive test cases.

In this embodiment, the above-mentioned electronic device may use the non-repetitive test case set generated in step 305 to test the above-mentioned application.

In some optional implementations of this embodiment, the above-mentioned electronic device may also send the above-mentioned non-repetitive test case set to the terminal device on which the above-mentioned application is installed, so that the above-mentioned terminal device can use the above-mentioned non-repetitive test case set to pair The above application was tested.

It can be seen from FIG. 3 that, compared with the embodiment corresponding to FIG. 2 , the process 300 of the application testing method in this embodiment highlights the step of deduplicating the application sub-function set and the test case set. Therefore, the solution described in this embodiment can make the test cases for testing the application more streamlined, thereby realizing more targeted application testing.

Further referring to FIG. 4, as an implementation of the methods shown in the above figures, the present application provides an embodiment of an application testing device, which corresponds to the method embodiment shown in FIG. 2, and the device can specifically Used in various electronic equipment.

As shown in FIG. 4 , the application testing device 400 in this embodiment includes: a first acquiring unit 401 , a determining unit 402 , a second acquiring unit 403 and a testing unit 404 . Wherein, the first obtaining unit 401 is configured to obtain a set of candidate test cases for testing the application, wherein the application includes at least one application sub-function, and each application sub-function is related to a test case used for testing the application sub-function. Corresponding to the use case; the determining unit 402 is configured to determine a set of application sub-functions to be used for testing from the at least one application sub-function, wherein the set of application sub-functions includes at least one of the following: defects according to the application sub-functions A predetermined number of application sub-functions are selected in descending order; the application sub-function with the largest loss expectation value is obtained by analyzing the historical defect data of the application sub-function; the second acquisition unit 403 It is configured to obtain a test case set corresponding to the application sub-function set from the candidate test case set; the testing unit 404 is configured to use the test case set to test the application.

In this embodiment, the first acquiring unit 401 of the application testing device 400 can acquire a set of candidate test cases for testing the application, wherein the above-mentioned application can include at least one application sub-function, and each application sub-function is related to the Corresponding to the test case for testing the application sub-function, the above test case is a set of test inputs, execution conditions and expected results compiled for a special purpose, in order to test a program path or verify whether a specific requirement is met.

In this embodiment, the determining unit 402 may determine a set of application sub-functions to be used for testing the above-mentioned application from at least one application sub-function included in the above-mentioned application, wherein the application sub-functions in the above-mentioned set of application sub-functions may be It is a predetermined number of application sub-functions selected in descending order of the number of defects in the application sub-functions within a predetermined period of time. The above-mentioned number of defects is recorded in the defect management system of the above-mentioned application; The function may also be an application sub-function with a maximum expected loss value, wherein the expected maximum loss value may be obtained by analyzing historical defect data recorded in the defect management system of the above-mentioned application.

In this embodiment, the second acquiring unit 403 may acquire a test case set corresponding to the application sub-function set determined in the determining unit 402 from the candidate test case set acquired in the first acquiring unit 401 .

In this embodiment, the testing unit 404 may use the test case set acquired in the second acquiring unit 403 to test the application.

In some optional implementations of this embodiment, the above-mentioned application testing device 400 may further include a first generation unit (not shown in the figure), and the above-mentioned first generation unit may first acquire the repeated applications in the above-mentioned application sub-function set sub-functions; afterward, at least one of the above repeated application sub-functions may be deleted until there is only one application sub-function left; finally, a set of application sub-functions in which each application sub-function is not repeated may be generated. The second obtaining unit 403 may also obtain, from the candidate test case sets obtained by the first obtaining unit 401 , a test case set corresponding to the non-duplicated application sub-function set generated in the first generating unit.

In some optional implementations of this embodiment, the above-mentioned application testing device 400 may further include a second generation unit (not shown in the figure), and the above-mentioned second generation unit may obtain the test cases obtained by the above-mentioned second obtaining unit 403 Repeated test cases in the collection; then, at least one of the above repeated test cases can be deleted until each test case has one remaining; finally, a test case set in which each test case is not repeated can be generated. The testing unit 404 may use the non-repetitive test case set generated in the second generating unit to test the application.

In some optional implementations of this embodiment, the above-mentioned set of candidate test cases may be pre-stored in the above-mentioned electronic device, and when the above-mentioned application is tested, the above-mentioned electronic device may directly obtain the candidate test case for testing the application locally. A collection of use cases; the above-mentioned candidate test cases can also be stored in the terminal equipment on which the above-mentioned candidate test cases are written, and when the above-mentioned application is tested, the above-mentioned electronic equipment can be used by testers to perform tests through a wired connection or a wireless connection The terminal device for use case writing obtains a set of candidate test cases for testing the application.

In some optional implementations of this embodiment, the test unit 404 may also send the non-repetitive test case set to the terminal device on which the above-mentioned application is installed, so that the above-mentioned terminal device can use the above-mentioned non-repetitive test case set Test the application above.

Referring now to FIG. 5 , it shows a schematic structural diagram of a computer system 500 suitable for implementing the server of the embodiment of the present application.

As shown in FIG. 5 , a computer system 500 includes a central processing unit (CPU) 501 that can be programmed according to a program stored in a read-only memory (ROM) 502 or a program loaded from a storage section 508 into a random-access memory (RAM) 503 Instead, various appropriate actions and processes are performed. In the RAM 503, various programs and data necessary for the operation of the system 500 are also stored. The CPU 501 , ROM 502 , and RAM 503 are connected to each other via a bus 504 . An input/output (I/O) interface 505 is also connected to the bus 504 .

The following components are connected to the I/O interface 505: an input section 506 including a keyboard, a mouse, etc.; an output section 507 including a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker; a storage section 508 including a hard disk, etc. and a communication section 509 including a network interface card such as a LAN card, a modem, or the like. The communication section 509 performs communication processing via a network such as the Internet. A drive 510 is also connected to the I/O interface 505 as needed. A removable medium 511, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is mounted on the drive 510 as necessary so that a computer program read therefrom is installed into the storage section 508 as necessary.

In particular, according to an embodiment of the present disclosure, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product including a computer program tangibly embodied on a machine-readable medium, the computer program including program code for performing the methods shown in the flowcharts. In such an embodiment, the computer program may be downloaded and installed from a network via communication portion 509 and/or installed from removable media 511 .

The flowchart and block diagrams in the Figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present application. In this regard, each block in a flowchart or block diagram may represent a module, program segment, or portion of code that includes one or more logical functions for implementing specified executable instructions. It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or they may sometimes be executed in the reverse order, depending upon the functionality involved. It should also be noted that each block of the block diagrams and/or flowchart illustrations, and combinations of blocks in the block diagrams and/or flowchart illustrations, can be implemented by a dedicated hardware-based system that performs the specified functions or operations , or may be implemented by a combination of dedicated hardware and computer instructions.

The units involved in the embodiments described in the present application may be implemented by means of software or by means of hardware. The described units may also be set in a processor. For example, it may be described as: a processor includes a first acquiring unit, a determining unit, a second acquiring unit, and a testing unit. Wherein, the names of these units do not constitute a limitation of the unit itself under certain circumstances. For example, the first obtaining unit may also be described as "a unit for obtaining a set of candidate test cases".

As another aspect, the present application also provides a non-volatile computer storage medium, which may be the non-volatile computer storage medium contained in the above-mentioned device in the above-mentioned embodiment; It is a non-volatile computer storage medium that exists independently and is not assembled into a terminal. The above-mentioned non-volatile computer storage medium stores one or more programs, and when the above-mentioned one or more programs are executed by a device, the above-mentioned device: acquires a set of candidate test cases for testing the application, wherein the application includes At least one application sub-function, each application sub-function corresponds to a test case for testing the application sub-function; a set of application sub-functions to be used for testing is determined from the at least one application sub-function, wherein the The set of application sub-functions includes at least one of the following: a predetermined number of application sub-functions selected in descending order of the number of defects in the application sub-functions; The test case set corresponding to the application sub-function set is obtained from the candidate test case set; and the application is tested by using the test case set.

The above description is only a preferred embodiment of the present application and an illustration of the applied technical principle. Those skilled in the art should understand that the scope of the invention involved in this application is not limited to the technical solution formed by the specific combination of the above-mentioned technical features, but should also cover the technical solutions made by the above-mentioned technical features without departing from the inventive concept. Other technical solutions formed by any combination of or equivalent features thereof. For example, a technical solution formed by replacing the above-mentioned features with technical features with similar functions disclosed in (but not limited to) this application.

Claims (10)

1. An application testing method, characterized in that, the testing method comprises: Acquiring a set of candidate test cases for testing an application, wherein the application includes at least one application sub-function, and each application sub-function corresponds to a test case for testing the application sub-function; A set of application sub-functions to be used for testing is determined from the at least one application sub-function, wherein the set of application sub-functions includes at least one of the following: a predetermined number of defects selected in descending order of the application sub-functions a number of application sub-functions; the application sub-function with the largest loss expectation value obtained by analyzing historical defect data of the application sub-function; Acquiring a set of test cases corresponding to the set of application sub-functions from the set of candidate test cases; The application is tested by using the set of test cases. 2. The method according to claim 1, characterized in that, after determining the set of application sub-functions to be used for testing from the at least one application sub-function, the method further comprises: Deduplicating the set of application sub-functions to generate a set of application sub-functions in which each application sub-function is not repeated; A test case set corresponding to the non-repetitive application sub-function set is obtained from the candidate test case set. 3. The method according to claim 2, wherein, after obtaining the test case set corresponding to the non-repetitive application sub-function set from the candidate test case set, the method further comprises: Deduplicating the test case set to generate a test case set in which each test case is not repeated; The application is tested by using the non-repetitive test case set. 4. The method according to claim 3, wherein the set of candidate test cases comprises at least one of the following: A set of candidate test cases stored locally in advance, and the set of candidate test cases is written on the set of candidate test cases stored on the terminal thereon. 5. The method according to claim 4, wherein said testing said application using said non-repetitive test case set comprises: sending the non-repetitive set of test cases to the terminal on which the application is installed so that the terminal can use the non-repetitive set of test cases to test the application. 6. An application testing device, characterized in that the device comprises: The first acquisition unit is configured to acquire a set of candidate test cases for testing the application, wherein the application includes at least one application sub-function, and each application sub-function is related to a test case for testing the application sub-function correspond; The determination unit is configured to determine a set of application sub-functions to be used for testing from the at least one application sub-function, wherein the set of application sub-functions includes at least one of the following: the number of defects according to the application sub-functions ranges from many to A predetermined number of application sub-functions selected in the order of the fewest; the application sub-function with the largest loss expectation value, the maximum loss expectation value is obtained by analyzing the historical defect data of the application sub-function; The second acquisition unit is configured to acquire a test case set corresponding to the application sub-function set from the candidate test case set; A test unit configured to use the set of test cases to test the application. 7. The device according to claim 6, further comprising: The first generating unit is configured to perform deduplication processing on the set of application sub-functions, and generate a set of application sub-functions in which each application sub-function is not repeated; and The second obtaining unit is further configured to obtain a test case set corresponding to the non-repeated application sub-function set from the candidate test case set. 8. The device according to claim 7, further comprising: The second generating unit is configured to perform deduplication processing on the test case set, and generate a test case set in which each test case is not repeated; and The testing unit is further configured to test the application using the non-repetitive set of test cases. 9. The device according to claim 8, wherein the set of candidate test cases comprises at least one of the following: A set of candidate test cases stored locally in advance, and the set of candidate test cases is written on the set of candidate test cases stored on the terminal thereon. 10. The device according to claim 9, wherein the test unit is further configured to: sending the non-repetitive set of test cases to the terminal on which the application is installed so that the terminal can use the non-repetitive set of test cases to test the application.