CN107579009A - A kind of multi-chip laminated packaging structure and preparation method thereof - Google Patents
A kind of multi-chip laminated packaging structure and preparation method thereof Download PDFInfo
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Abstract
本发明公开了一种多芯片叠层封装结构及其制作方法,该封装结构叠层包括由下至上依次堆叠的至少二个双芯片叠层封装体,双芯片叠层封装体包括引线键合芯片、倒装焊芯片、钝化层、再布线层、键合丝和垂直阵列引线,倒装焊芯片粘接于引线键合芯片上且二者注塑集成在一起形成塑封体,塑封体的上表面和下表面上还设有钝化层,再布线层设置于塑封体和钝化层之间且通过键合丝和垂直阵列引线实现引线键合芯片和倒装焊芯片的电互连。本发明减小多芯片封装的总体积,减小封装厚度,上下互联通过垂直阵列引线完成,制造加工流程简单,成本低。
The invention discloses a multi-chip stacked packaging structure and a manufacturing method thereof. The stacked packaging structure includes at least two double-chip stacked packages stacked sequentially from bottom to top, and the double-chip stacked package includes a wire-bonded chip. , flip chip, passivation layer, rewiring layer, bonding wire and vertical array leads, the flip chip is bonded to the wire bonded chip and the two are injection molded together to form a plastic package, the upper surface of the plastic package A passivation layer is also provided on the lower surface and the rewiring layer is arranged between the plastic package and the passivation layer, and the electrical interconnection of the wire bonded chip and the flip chip is realized through the bonding wire and the vertical array lead. The invention reduces the total volume of the multi-chip package, reduces the thickness of the package, the upper and lower interconnections are completed through vertical array leads, the manufacturing process is simple, and the cost is low.
Description
技术领域technical field
本发明属于集成电路封装技术领域,具体涉及一种多芯片叠层封装结构及其制作方法。The invention belongs to the technical field of integrated circuit packaging, and in particular relates to a multi-chip stacked packaging structure and a manufacturing method thereof.
背景技术Background technique
随着半导体集成电路的快速发展,集成电路的功能要求越来越多,多芯片互联提高集成度的需求愈发凸显,同时为了满足小型化、轻量化的需要,三维叠层封装顺应了上述需求快速发展起来。With the rapid development of semiconductor integrated circuits, the functional requirements of integrated circuits are increasing, and the demand for multi-chip interconnection to improve integration is becoming more and more prominent. At the same time, in order to meet the needs of miniaturization and light weight, three-dimensional stacked packaging meets the above needs. develop quickly.
三维叠层封装可以提高封装密度,减小芯片之间的互联长度,是提高集成电路运行性能,另外可以通过多芯片的组合实现功能多样化。目前三维叠层封装为了完成垂直方向的互联,一般是利用硅通孔(TSV)实现三维的垂直互联,堆叠密度最大,外形尺寸最小,但是工艺成本相对较高。另外,如何在三维结构中完成引线键合芯片和倒装焊芯片的垂直堆叠并没有很好的解决方法。Three-dimensional stack packaging can increase the packaging density, reduce the interconnection length between chips, improve the operation performance of integrated circuits, and realize functional diversification through the combination of multiple chips. At present, in order to complete the vertical interconnection in the three-dimensional stacked package, through-silicon vias (TSVs) are generally used to realize the three-dimensional vertical interconnection. The stacking density is the largest and the external dimension is the smallest, but the process cost is relatively high. In addition, there is no good solution on how to accomplish the vertical stacking of wire-bonded chips and flip-chip chips in a three-dimensional structure.
发明内容Contents of the invention
为了解决上述技术问题,本发明提供了一种多芯片叠层封装结构及其制作方法。In order to solve the above technical problems, the present invention provides a multi-chip stacked packaging structure and a manufacturing method thereof.
为了达到上述目的,本发明的技术方案如下:In order to achieve the above object, technical scheme of the present invention is as follows:
本发明提供一种多芯片叠层封装结构,包括由下至上依次堆叠的至少二个双芯片叠层封装体,双芯片叠层封装体包括引线键合芯片、倒装焊芯片、钝化层、再布线层、键合丝和垂直阵列引线,倒装焊芯片粘接于引线键合芯片上且二者注塑集成在一起形成塑封体,塑封体的上表面和下表面上还设有钝化层,再布线层设置于塑封体和钝化层之间且通过键合丝和垂直阵列引线实现引线键合芯片和倒装焊芯片的电互连。The present invention provides a multi-chip stacked package structure, which includes at least two double-chip stacked packages stacked sequentially from bottom to top. The double-chip stacked package includes a wire-bonded chip, a flip-chip chip, a passivation layer, Rewiring layer, bonding wire and vertical array leads, flip chip bonding on the wire bonding chip and the two are injection molded together to form a plastic package, and the upper and lower surfaces of the plastic package are also provided with a passivation layer The rewiring layer is arranged between the plastic package and the passivation layer, and realizes the electrical interconnection of the wire bonding chip and the flip chip through the bonding wire and the vertical array wire.
优选的,钝化层包括第一钝化层和第二钝化层,第一钝化层设置于塑封体的下表面,第二钝化层设置于塑封体的上表面;再布线层包括第一再布线层和第二再布线层,第一再布线层设置于塑封体的下表面和第一钝化层之间,第二再布线层设置于塑封体的上表面和第二钝化层之间,键合丝电连接于引线键合芯片和第一再布线层之间,垂直阵列引线电连接于第一再布线层和第二再布线层之间。Preferably, the passivation layer includes a first passivation layer and a second passivation layer, the first passivation layer is arranged on the lower surface of the plastic package, and the second passivation layer is arranged on the upper surface of the plastic package; the rewiring layer includes the second A rewiring layer and a second rewiring layer, the first rewiring layer is arranged between the lower surface of the plastic package and the first passivation layer, and the second rewiring layer is arranged on the upper surface of the plastic package and the second passivation layer Between them, the bonding wire is electrically connected between the wire bonding chip and the first rewiring layer, and the vertical array wires are electrically connected between the first rewiring layer and the second rewiring layer.
优选的,第一再布线层、第二再布线层上还设有焊盘,位于第二再布线层上的焊盘上还设有阵列凸点。Preferably, solder pads are further provided on the first redistribution layer and the second redistribution layer, and array bumps are further provided on the solder pads on the second redistribution layer.
优选的,焊盘为圆形或方形,阵列凸点为柱形或球形。Preferably, the pads are circular or square, and the array bumps are columnar or spherical.
优选的,引线键合芯片的尺寸大于倒装焊芯片的尺寸。Preferably, the size of the wire bonded chip is larger than the size of the flip chip.
优选的,引线键合芯片和倒装焊芯片通过绝缘胶粘接在一起。Preferably, the wire bonded chip and the flip chip are bonded together by insulating glue.
本发明还提供一种多芯片叠层封装结构的制作方法,包括以下步骤:The present invention also provides a method for manufacturing a multi-chip stacked packaging structure, comprising the following steps:
S1、选取第一载体圆片,在第一载体圆片的上表面制作或贴装一层临时键合模;S1. Select the first carrier wafer, and make or mount a layer of temporary bonding mold on the upper surface of the first carrier wafer;
S2、制作钝化层和再布线层;S2, making a passivation layer and a rewiring layer;
S3、将引线键合芯片的背面贴装在钝化层上,然后用绝缘胶将倒装焊芯片的背面贴装在引线键合芯片的正面;S3. Mount the back of the wire-bonded chip on the passivation layer, and then mount the back of the flip-chip on the front of the wire-bonded chip with insulating glue;
S4、用键合丝进行引线键合芯片的键合,然后在再布线层上阵列位置进行垂直打线形成垂直阵列引线,引线高度高于倒装焊芯片的最高水平高度;S4. Use bonding wires to bond wire-bonded chips, and then perform vertical bonding at the array position on the rewiring layer to form vertical array leads, and the height of the leads is higher than the highest level of the flip chip;
S5、采用注塑工艺将引线键合芯片、倒装焊芯片和所有引线固定形成塑封体;S5. Using an injection molding process to fix the wire-bonded chip, the flip-chip chip and all the leads to form a plastic package;
S6、将塑封体外多余焊球和垂直阵列引线打磨平整,并在塑封体的上表面制作再布线层和钝化层,完成两芯片的电互连,然后再通过电镀工艺制作阵列式焊盘,最后形成双芯片叠层封装体;S6. Polish the excess solder balls and vertical array leads outside the plastic package to make it smooth, and make a rewiring layer and a passivation layer on the upper surface of the plastic package to complete the electrical interconnection of the two chips, and then make an array pad by electroplating. Finally, a two-chip stacked package is formed;
S7、采用倒装焊工艺,将多个独立的双芯片叠层封装体由下至上依次堆叠在一起,完成多芯片叠层封装结构。S7. A flip-chip bonding process is used to sequentially stack multiple independent double-chip stacked packages together from bottom to top to complete a multi-chip stacked package structure.
优选的,步骤S4中的垂直阵列引线材料为铜线。Preferably, the vertical array lead material in step S4 is copper wire.
优选的,步骤S2中采用晶圆级再布线制作工艺,步骤S5中的注塑工艺为粉末注塑的方式。Preferably, the wafer-level rewiring process is used in step S2, and the injection molding process in step S5 is powder injection molding.
优选的,步骤S6中制作阵列式焊盘之后采用晶圆级植球技术或电镀技术在位于塑封体上表面的焊盘上制作球形或柱形阵列凸点,形成完整的双芯片叠层封装体;接着采用解键合方法将双芯片叠层封装体和临时键合膜剥离,然后通过圆片的划切形成多个独立的双芯片叠层封装体。Preferably, after making the array pads in step S6, wafer-level ball planting technology or electroplating technology is used to make spherical or columnar array bumps on the pads on the upper surface of the plastic package to form a complete two-chip stacked package ; Then use a debonding method to peel off the two-chip stacked package and the temporary bonding film, and then form a plurality of independent double-chip stacked packages by scribing the wafer.
本发明具有以下有益效果:The present invention has the following beneficial effects:
1、每个双芯片叠层封装体的上、下表面通过垂直阵列引线完成互连,相比较硅通孔(TSV)工艺成本较低;1. The upper and lower surfaces of each two-chip stacked package are interconnected through vertical array leads, which is relatively low in cost compared with the through-silicon via (TSV) process;
2、每个双芯片叠层封装体内引线键合芯片的尺寸比倒装焊芯片的尺寸大,可实现多倒装焊芯片和引线键合芯片同时集成在一个封装体内;2. The size of the wire-bonded chip in each double-chip stacked package is larger than that of the flip-chip, which can realize the simultaneous integration of multiple flip-chips and wire-bonded chips in one package;
3、引线键合芯片的正面和倒装焊芯片的背面粘接在一起,垂直方向节省了键合丝弧高超出芯片的高度空间;3. The front side of the wire-bonded chip and the back side of the flip-chip chip are bonded together, and the vertical direction saves the space where the arc height of the bonding wire exceeds the height of the chip;
4、每个双芯片叠层封装体通过晶圆级工艺制作正反两面的再布线层,整个圆片同时加工,生产效率高,有效降低封装成本;4. The rewiring layers on both sides of each two-chip stacked package are manufactured through wafer-level technology, and the entire wafer is processed at the same time, which has high production efficiency and effectively reduces packaging costs;
5、第一再布线层上制作的焊盘,第二再布线层上制作的阵列凸点,可以实现多个同样结构的封装体三维堆叠。5. The pads made on the first rewiring layer and the array bumps made on the second rewiring layer can realize three-dimensional stacking of multiple packages with the same structure.
附图说明Description of drawings
图1 是本发明一种多芯片叠层封装结构的圆片上临时制作键合膜后的结构示意图。Fig. 1 is a structural schematic diagram of a multi-chip stacked packaging structure of the present invention after temporarily manufacturing a bonding film on a wafer.
图2 是本发明一种多芯片叠层封装结构的临时键合膜上制作第一再布线层和第一钝化层后的结构示意图。FIG. 2 is a schematic structural view of a multi-chip stacked package structure of the present invention after the first rewiring layer and the first passivation layer are fabricated on the temporary bonding film.
图3 是本发明一种多芯片叠层封装结构的第一钝化层上贴装引线键合芯片和倒装焊芯片后的结构示意图。Fig. 3 is a structural schematic diagram of a multi-chip stacked packaging structure of the present invention after mounting wire-bonded chips and flip-chips on the first passivation layer.
图4 是本发明一种多芯片叠层封装结构上增加键合丝和垂直阵列引线后的结构示意图。FIG. 4 is a structural schematic view of a multi-chip stacked package structure after adding bonding wires and vertical array leads according to the present invention.
图5 是本发明一种多芯片叠层封装结构上注塑形成塑封体的结构示意图。FIG. 5 is a structural schematic diagram of a plastic package formed by injection molding on a multi-chip stacked package structure according to the present invention.
图6 是本发明一种多芯片叠层封装结构上制作第二再布线层、第二钝化层和焊盘后的结构示意图。FIG. 6 is a structural schematic view of a multi-chip stacked package structure after fabrication of a second rewiring layer, a second passivation layer and pads according to the present invention.
图7是本发明一种多芯片叠层封装结构上阵列凸点制作完成后单个双芯片叠层封装体的结构示意图。FIG. 7 is a schematic structural view of a single double-chip stacked package after the array bumps on the multi-chip stacked package structure of the present invention are fabricated.
图8 是本发明一种多芯片叠层封装结构的双芯片叠层封装体叠层结构示意图。FIG. 8 is a schematic diagram of a stacked structure of a double-chip stacked package of a multi-chip stacked package structure according to the present invention.
其中,1、第一钝化层1,2、第一再布线层,3、引线键合芯片,4-倒装焊芯片,5、键合丝,6、垂直阵列引线,7、塑封体,8、第二再布线层,9、第二钝化层,10、焊盘,11、阵列凸点,100、第一双芯片叠层封装体,200、第二双芯片叠层封装体,300、第三双芯片叠层封装体。Among them, 1. The first passivation layer 1, 2. The first rewiring layer, 3. Wire-bonded chip, 4-flip chip, 5. Bonding wire, 6. Vertical array leads, 7. Plastic package, 8. Second rewiring layer, 9. Second passivation layer, 10. Pad, 11. Array bump, 100. First double-chip stacked package, 200. Second double-chip stacked package, 300 , A third double-chip stacked package.
具体实施方式detailed description
下面结合附图详细说明本发明的优选实施方式。Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.
为了达到本发明的目的,如图8所示,在本发明的其中一种实施方式中提供一种多芯片叠层封装结构,包括由下至上依次堆叠的第三双芯片叠层封装体300、第二双芯片叠层封装体200和第一双芯片叠层封装体100,每个双芯片叠层封装体包括引线键合芯片3、倒装焊芯片4、钝化层、再布线层、键合丝5和垂直阵列引线6,倒装焊芯片4粘接于引线键合芯片3上且二者注塑集成在一起形成塑封体7,塑封体7的上表面和下表面上还设有钝化层,再布线层设置于塑封体7和钝化层之间且通过键合丝5和垂直阵列引线6实现引线键合芯片3和倒装焊芯片4的电互连。In order to achieve the purpose of the present invention, as shown in FIG. 8 , in one embodiment of the present invention, a multi-chip stack package structure is provided, which includes a third double-chip stack package 300 stacked sequentially from bottom to top, The second two-chip stack package body 200 and the first two-chip stack package body 100, each two-chip stack package body includes a wire-bonded chip 3, a flip-chip chip 4, a passivation layer, a rewiring layer, a bond The wire 5 and the vertical array lead 6, the flip-chip chip 4 is bonded to the wire-bonded chip 3 and the two are injection-molded together to form a plastic package 7, and passivation is also provided on the upper surface and the lower surface of the plastic package 7. The rewiring layer is arranged between the plastic package 7 and the passivation layer, and the electrical interconnection between the wire bonded chip 3 and the flip chip 4 is realized through the bonding wire 5 and the vertical array wire 6 .
其中,钝化层包括第一钝化层1和第二钝化层9,第一钝化层1设置于塑封体7的下表面,第二钝化层9设置于塑封体7的上表面;再布线层包括第一再布线层2和第二再布线层8,第一再布线层2设置于塑封体7的下表面和第一钝化层1之间,第二再布线层8设置于塑封体7的上表面和第二钝化层9之间,键合丝5电连接于引线键合芯片3和第一再布线层2之间,垂直阵列引线6电连接于第一再布线层2和第二再布线层8之间。第一再布线层2、第二再布线层8上还设有焊盘10,位于第二再布线层8上的焊盘10上还设有阵列凸点11,焊盘10为圆形或方形,阵列凸点11为柱形或球形。Wherein, the passivation layer includes a first passivation layer 1 and a second passivation layer 9, the first passivation layer 1 is arranged on the lower surface of the plastic package 7, and the second passivation layer 9 is arranged on the upper surface of the plastic package 7; The rewiring layer includes a first rewiring layer 2 and a second rewiring layer 8, the first rewiring layer 2 is arranged between the lower surface of the plastic package 7 and the first passivation layer 1, and the second rewiring layer 8 is arranged on Between the upper surface of the plastic package 7 and the second passivation layer 9, the bonding wire 5 is electrically connected between the wire bonding chip 3 and the first rewiring layer 2, and the vertical array leads 6 are electrically connected to the first rewiring layer 2 and the second rewiring layer 8. The first rewiring layer 2 and the second rewiring layer 8 are also provided with pads 10, and the pads 10 on the second rewiring layer 8 are also provided with array bumps 11, and the pads 10 are circular or square. , the array bumps 11 are cylindrical or spherical.
另外,引线键合芯片3的尺寸大于倒装焊芯片4的尺寸,引线键合芯片3和倒装焊芯片4通过绝缘胶粘接在一起。In addition, the size of the wire-bonded chip 3 is larger than that of the flip-chip chip 4 , and the wire-bonded chip 3 and the flip-chip chip 4 are bonded together by insulating glue.
如图1-8所示,本发明还提供一种多芯片叠层封装结构的制作方法,包括以下步骤:As shown in Figures 1-8, the present invention also provides a method for manufacturing a multi-chip stacked packaging structure, including the following steps:
S1、选取第一载体圆片13,在第一载体圆片13的上表面制作或贴装一层临时键合模12;S1, select the first carrier wafer 13, make or attach a layer of temporary bonding mold 12 on the upper surface of the first carrier wafer 13;
S2、采用晶圆级再布线制作工艺,制作第一钝化层1和第一再布线层2;S2. Manufacturing a first passivation layer 1 and a first rewiring layer 2 by using a wafer-level rewiring process;
S3、将引线键合芯片3的背面贴装在第一钝化层1上,然后用绝缘胶将倒装焊芯片4的背面贴装在引线键合芯片3的正面;S3. Mount the back of the wire-bonded chip 3 on the first passivation layer 1, and then mount the back of the flip-chip 4 on the front of the wire-bonded chip 3 with insulating glue;
S4、用键合丝5进行引线键合芯片3的键合,然后在第一再布线层2上阵列位置进行垂直打线形成垂直阵列引线6,引线高度高于倒装焊芯片的最高水平高度;其中,垂直阵列引线6材料为铜线;S4. Use the bonding wire 5 to bond the wire-bonded chip 3, and then perform vertical bonding at the array position on the first rewiring layer 2 to form a vertical array lead 6, and the height of the lead is higher than the highest level of the flip chip. ; Wherein, the material of vertical array lead 6 is copper wire;
S5、采用注塑工艺将引线键合芯片3、倒装焊芯片4和所有引线固定形成塑封体7;其中,注塑工艺为粉末注塑的方式;S5. Fix the wire-bonded chip 3, the flip-chip chip 4 and all the leads to form a plastic package 7 by using an injection molding process; wherein, the injection molding process is a powder injection molding method;
S6、将塑封体7外多余焊球和垂直阵列引线6打磨平整,并在塑封体7的上表面制作第二再布线层8和第二钝化层9,完成两芯片的电互连,然后再通过电镀工艺制作阵列式焊盘,之后采用晶圆级植球技术或电镀技术在位于塑封体7上表面的焊盘上制作球形或柱形阵列凸点,形成完整的双芯片叠层封装体;接着采用解键合方法将双芯片叠层封装体和临时键合膜剥离,然后通过圆片的划切形成多个独立的双芯片叠层封装体;S6, polishing the excess solder balls outside the plastic package 7 and the vertical array leads 6, and making a second rewiring layer 8 and a second passivation layer 9 on the upper surface of the plastic package 7 to complete the electrical interconnection of the two chips, and then Then the array pads are made by electroplating process, and then the spherical or columnar array bumps are made on the pads located on the upper surface of the plastic package 7 by wafer-level ball planting technology or electroplating technology to form a complete two-chip stacked package ; Then use the debonding method to peel off the two-chip stacked package and the temporary bonding film, and then form a plurality of independent double-chip stacked packages by scribing the wafer;
S7、采用倒装焊工艺,将多个独立的双芯片叠层封装体由下至上依次堆叠在一起,完成多芯片叠层封装结构。S7. A flip-chip bonding process is used to sequentially stack multiple independent double-chip stacked packages together from bottom to top to complete a multi-chip stacked package structure.
以上所述的仅是本发明的优选实施方式,应当指出,对于本领域的普通技术人员来说,在不脱离本发明创造构思的前提下,还可以做出若干变形和改进,这些都属于本发明的保护范围。The above is only the preferred embodiment of the present invention, it should be pointed out that for those skilled in the art, without departing from the inventive concept of the present invention, some modifications and improvements can also be made, and these all belong to the present invention. protection scope of the invention.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108417556A (en) * | 2018-05-23 | 2018-08-17 | 奥肯思(北京)科技有限公司 | Multichip stacking encapsulation structure |
| CN109326580A (en) * | 2018-11-20 | 2019-02-12 | 中国科学院苏州纳米技术与纳米仿生研究所南昌研究院 | A kind of multi-chip package interconnection structure and multi-chip package interconnection method |
| CN111384018A (en) * | 2018-12-28 | 2020-07-07 | 海太半导体(无锡)有限公司 | A semiconductor stacking package wire bonding and pressure bonding structure |
| CN111900155A (en) * | 2020-08-19 | 2020-11-06 | 上海先方半导体有限公司 | Modular packaging structure and method |
| CN112770495A (en) * | 2019-10-21 | 2021-05-07 | 宏启胜精密电子(秦皇岛)有限公司 | Omnidirectional embedded module and manufacturing method thereof, packaging structure and manufacturing method thereof |
| CN113725153A (en) * | 2021-08-31 | 2021-11-30 | 中国电子科技集团公司第五十八研究所 | Multilayer multi-chip fan-out type three-dimensional integrated packaging method and structure |
| CN114242624A (en) * | 2021-12-17 | 2022-03-25 | 上海功成半导体科技有限公司 | Ultrasonic bonding wire bonder, semiconductor device packaging method and structure |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040070083A1 (en) * | 2002-10-15 | 2004-04-15 | Huan-Ping Su | Stacked flip-chip package |
| US20090008762A1 (en) * | 2007-07-02 | 2009-01-08 | Nepes Corporation | Ultra slim semiconductor package and method of fabricating the same |
| CN103582946A (en) * | 2011-05-03 | 2014-02-12 | 泰塞拉公司 | Package-on-package assembly with wire bond to encapsulation surface |
| CN106558573A (en) * | 2015-09-23 | 2017-04-05 | 联发科技股份有限公司 | Semiconductor package structure and method for forming the same |
-
2017
- 2017-09-02 CN CN201710781927.7A patent/CN107579009A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20040070083A1 (en) * | 2002-10-15 | 2004-04-15 | Huan-Ping Su | Stacked flip-chip package |
| US20090008762A1 (en) * | 2007-07-02 | 2009-01-08 | Nepes Corporation | Ultra slim semiconductor package and method of fabricating the same |
| CN103582946A (en) * | 2011-05-03 | 2014-02-12 | 泰塞拉公司 | Package-on-package assembly with wire bond to encapsulation surface |
| CN106558573A (en) * | 2015-09-23 | 2017-04-05 | 联发科技股份有限公司 | Semiconductor package structure and method for forming the same |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108417556A (en) * | 2018-05-23 | 2018-08-17 | 奥肯思(北京)科技有限公司 | Multichip stacking encapsulation structure |
| CN109326580A (en) * | 2018-11-20 | 2019-02-12 | 中国科学院苏州纳米技术与纳米仿生研究所南昌研究院 | A kind of multi-chip package interconnection structure and multi-chip package interconnection method |
| CN111384018A (en) * | 2018-12-28 | 2020-07-07 | 海太半导体(无锡)有限公司 | A semiconductor stacking package wire bonding and pressure bonding structure |
| CN112770495A (en) * | 2019-10-21 | 2021-05-07 | 宏启胜精密电子(秦皇岛)有限公司 | Omnidirectional embedded module and manufacturing method thereof, packaging structure and manufacturing method thereof |
| CN112770495B (en) * | 2019-10-21 | 2022-05-27 | 宏启胜精密电子(秦皇岛)有限公司 | Omnidirectional embedded module and manufacturing method thereof, and packaging structure and manufacturing method thereof |
| US11483931B2 (en) | 2019-10-21 | 2022-10-25 | Hongqisheng Precision Electronics (Qinhuangdao) Co., Ltd. | All-directions embeded module, method for manufacturing the all-directions embeded module, and all-directions packaging structure |
| CN111900155A (en) * | 2020-08-19 | 2020-11-06 | 上海先方半导体有限公司 | Modular packaging structure and method |
| CN113725153A (en) * | 2021-08-31 | 2021-11-30 | 中国电子科技集团公司第五十八研究所 | Multilayer multi-chip fan-out type three-dimensional integrated packaging method and structure |
| CN113725153B (en) * | 2021-08-31 | 2023-10-27 | 中国电子科技集团公司第五十八研究所 | Multi-layer multi-chip fan-out three-dimensional integrated packaging method and structure |
| CN114242624A (en) * | 2021-12-17 | 2022-03-25 | 上海功成半导体科技有限公司 | Ultrasonic bonding wire bonder, semiconductor device packaging method and structure |
| CN114242624B (en) * | 2021-12-17 | 2025-07-29 | 上海功成半导体科技有限公司 | Ultrasonic bonding wire bonding machine, semiconductor device packaging method and structure |
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