CN107391330B - A computer performance testing method and system under Itanium platform - Google Patents

Abstract

The invention relates to the technical field of computer testing, and provides a method and system for testing computer performance under an Itanium platform. The method includes the following steps: installing a software testing package program, and updating the HPL.Dat generated in the process of installing the software testing package program file; according to the installed software test package program and the generated HPL.Dat file, test the device under test, and extract the maximum CPU peak value of the device under test; compare the extracted maximum CPU peak value of the device under test with the pre-calculated theoretical CPU The peak value is compared, the performance test results of the device under test are generated and displayed, so as to realize the test of the CPU performance under the Itanium platform, with a high degree of automation, avoiding human-computer interaction, and improving the test efficiency and accuracy.

Description

A computer performance testing method and system under Itanium platform

technical field

The invention belongs to the technical field of computer testing, and in particular relates to a computer performance testing method and system under the Itanium platform.

Background technique

With the continuous development of technology in the IT field, traditional information services and increasingly powerful cloud computing services have higher and higher requirements on the performance and stability of servers, and the performance and stability testing of computing subsystems is an important part of server testing. component. There are more and more types of server research and development. Among them, the production and shipment of servers based on the Itanium platform are also increasing, but the automation and efficiency of stress testing related to testing tools based on the Itanium platform are low.

At present, there are two ways to carry out stress testing of multiple server products and batch server products at the same time. One is to add testers to test server products separately, and the other is to write automated test tools and use the automated test tools to test servers. product testing. In comparison, automated testing tools have great advantages in resources such as manpower, time, and cost. However, in the past, the stress test of the CPU on the Itanium platform often required testers to manually install the compiler environment and configure the mpich2 environment, which required many human-computer interaction operations. And other problems, reduce the test efficiency, but also reduce the test accuracy.

SUMMARY OF THE INVENTION

The object of the present invention is to provide a computer performance testing method under the Itanium platform, aiming to solve the problem that the stress test of the CPU on the Itanium platform in the prior art often requires testers to manually install the compiler environment and configure the mpich2 environment, which requires man-machine There are many interactive operations. Once the operator participates in more testing processes, it may cause problems such as manual misoperation, reduce the test efficiency, and also reduce the test accuracy.

The present invention is achieved in this way, a computer performance testing method under an Itanium platform, the method comprising the following steps:

Install the software test package program and update the HPL.Dat file generated during the installation of the software test package program;

Test the device under test according to the installed software test package program and the generated HPL.Dat file, and extract the maximum CPU peak value of the device under test;

The extracted maximum CPU peak value of the device under test is compared with the pre-calculated theoretical CPU peak value, and a performance test result of the device under test is generated and displayed.

As an improved solution, the step of installing the software test package program specifically includes the following steps:

Install the C compiler;

Install the mpich software;

Add environment variables to the installation path of the mpich software.

As an improved solution, after the step of installing the mpich software, the following steps are also included:

When the mpich software is installed, the HPL.Dat file is generated.

As an improved solution, the step of updating the HPL.Dat file generated in the process of installing the software test package program specifically includes the following steps:

After the device under test starts running, obtain the number of CPU cores and memory size of the device under test;

Calculate the P and Q values according to the obtained number of CPU cores of the device under test;

Calculate the NS value according to the acquired memory size of the device under test;

According to the calculated P, Q and NS values, modify the P, Q and NS values in the generated HPL.Dat file.

As an improved solution, the extracted maximum CPU peak value of the device under test is compared with the pre-calculated theoretical CPU peak value, and the step of generating the performance test result of the device under test specifically includes the following steps:

Pre-calculate the theoretical CPU peak value and test threshold of the device under test;

Compare the extracted maximum CPU peak value of the device under test with the pre-calculated theoretical CPU peak value, and determine the ratio parameter of the maximum CPU peak value to the pre-calculated theoretical CPU peak value;

When the ratio parameter is greater than or equal to the test threshold, generating a performance test result including a passing test;

When the ratio parameter is less than the test threshold, a performance test result including a test failure is generated.

Another object of the present invention is to provide a computer performance testing system under the Itanium platform, the system comprising:

The test package program installation module is used to install the software test package program;

The file update module is used to update the HPL.Dat file generated during the installation of the software test package program;

The test module is used to test the device under test according to the installed software test package program and the generated HPL.Dat file;

The maximum CPU peak value extraction module is used to extract the maximum CPU peak value of the device under test;

A performance test result generation module, configured to compare the extracted maximum CPU peak value of the device under test with a pre-calculated theoretical CPU peak value, and generate a performance test result of the device under test;

A test result display module, configured to display the performance test result of the device under test generated by the performance test result generation module.

As an improved solution, the test package program installation module specifically includes:

The compiler installation module is used to install the C compiler;

The mpich software installation module is used to install the mpich software;

The environment variable adding module is used to add environment variables to the installation path of the mpich software.

As an improved solution, the system further includes:

The file generation module is used to generate the HPL.Dat file when the mpich software is installed.

As an improved solution, the file update module specifically includes:

The device under test information acquisition module is used to obtain the number of CPU cores and memory size of the device under test after the device under test starts running;

The first calculation module is used to calculate the P and Q values according to the obtained CPU core number of the device under test;

The second calculation module is used to calculate the NS value according to the acquired memory size of the device under test;

The file parameter modification module is used for modifying the P, Q and NS values in the generated HPL.Dat file according to the calculated P, Q and NS values.

As an improved solution, the performance test result generation module specifically includes:

The pre-calculation module is used to pre-calculate the theoretical CPU peak value and test threshold of the device under test;

The comparison and judgment module is used to compare the extracted maximum CPU peak value of the device under test with the pre-calculated theoretical CPU peak value, and judge the ratio parameter of the maximum CPU peak value to the pre-calculated theoretical CPU peak value;

a first generation module, configured to generate a performance test result including a passing test when the ratio parameter is greater than or equal to the test threshold;

The second generating module is configured to generate a performance test result including a test failure when the ratio parameter is smaller than the test threshold.

In the present invention, the software test package program is installed, and the HPL.Dat file generated in the process of installing the software test package program is updated; according to the installed software test package program and the generated HPL.Dat file, the device to be tested is tested and extracted The maximum CPU peak value of the device under test; compare the extracted maximum CPU peak value of the device under test with the pre-calculated theoretical CPU peak value, generate the performance test result of the device under test, and display it, so as to realize the implementation under the Itanium platform The test of CPU performance has a high degree of automation, avoids human-computer interaction, and improves test efficiency and accuracy.

Description of drawings

Fig. 1 is the realization flow chart of computer performance testing method under Itanium platform provided by the invention;

Fig. 2 is the realization flow chart of the installation software test package program provided by the present invention;

Fig. 3 is the realization flow chart of the HPL.Dat file generated in the update installation software test package program process provided by the present invention;

4 is a flow chart of the implementation provided by the present invention to compare the extracted maximum CPU peak value of the device under test with a pre-calculated theoretical CPU peak value to generate the performance test result of the device under test;

FIG. 5 is a structural block diagram of the computer performance testing system under the Itanium platform provided by the present invention.

Detailed ways

In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

Fig. 1 shows the realization flow chart of the computer performance testing method under the Itanium platform provided by the present invention, and it specifically comprises the following steps:

In step S101, the software test package program is installed, and the HPL.Dat file generated in the process of installing the software test package program is updated.

In step S102, the device under test is tested according to the installed software test package program and the generated HPL.Dat file, and the maximum CPU peak value of the device under test is extracted.

In this step, according to the installed software test package program and the generated HPL.Dat file, the device under test is tested for a long period of time, and the CPU peak value of each time period is obtained respectively, and then the CPU peak value of each time period is counted to extract The CPU peak value with the largest value is obtained as a reference value for detecting and judging the performance of the CPU. Of course, other methods may also be used, which will not be repeated here.

In step S103, the extracted maximum CPU peak value of the device under test is compared with the pre-calculated theoretical CPU peak value, and a performance test result of the device under test is generated and displayed.

Among them, the display of the performance test results can be visually displayed on the display screen, such as the interface display of "test qualified" and "test unqualified", of course, it can also be accompanied by a voice reminder, and save the information of the performance test results, and continue the follow-up batch testing.

Wherein, as shown in Figure 2, the step of installing the software test package program specifically includes the following steps:

In step S201, the C compiler is installed.

In step S202, the mpich software is installed.

In step S203, an environment variable is added to the installation path of the mpich software.

In this step, the environment variable generally refers to some parameters used in the operating system to specify the operating environment of the operating system, such as the location of the temporary folder and the location of the system folder. It is similar to the default path in the DOS period. When running some programs, in addition to searching in the current folder, it will also search in the default path set.

In this embodiment, the above-mentioned mpich software is mpich2, and the program installed by this mpich2 is:

In this embodiment of the present invention, after performing the above step S202, the following steps are further included:

When the mpich software is installed, the HPL.Dat file is generated.

In this embodiment, as shown in Figure 3, the above-mentioned step of updating the HPL.Dat file generated in the process of installing the software test package program specifically includes the following steps:

In step S301, after the device to be tested is started to run, the number of CPU cores and the memory size of the device to be tested are acquired.

In this step, the device to be tested is the server that needs performance testing. After the server is turned on and running, the basic information of the server is obtained. The basic information includes information such as the number of CPU cores and memory size. Of course, other tests can also be performed according to the needs of the test. The acquisition of basic information will not be repeated here.

In step S302, the P and Q values are calculated according to the acquired number of CPU cores of the device under test.

In this step, the P and Q values are calculated by running the program instructions of the server system itself, which will not be repeated here.

In step S303, the NS value is calculated according to the acquired memory size of the device under test.

In this step, the NS value is calculated by running the program instructions of the server system itself, which will not be repeated here.

In step S304, the P, Q and NS values in the generated HPL.Dat file are modified according to the calculated P, Q and NS values.

According to the calculated P, Q and NS values, modifying the P, Q and NS values in the HPL.Dat file can be automatically modified according to the program instructions that come with the system to complete the update of the HPL.Dat file, thereby realizing automated testing. One-click test.

In the embodiment of the present invention, as shown in FIG. 4 , the above step S103 is a step of generating the performance test result of the device under test by comparing the extracted maximum CPU peak value of the device under test with the pre-calculated theoretical CPU peak value Specifically include the following steps:

In step S401, the theoretical CPU peak value and test threshold of the device under test are pre-calculated.

In this step, the above theoretical CPU peak value can be calculated according to the actual configuration of the device under test, and the test threshold value can be calculated according to the requirements of the test standard, such as 90%, etc., which are not repeated here, but are not intended to limit the present invention.

In step S402, the extracted maximum CPU peak value of the device under test is compared with the pre-calculated theoretical CPU peak value, and a ratio parameter of the maximum CPU peak value to the pre-calculated theoretical CPU peak value is determined.

In step S403, when the ratio parameter is greater than or equal to the test threshold, a performance test result including the test passing is generated.

In step S404, when the ratio parameter is smaller than the test threshold, a performance test result including a test failure is generated.

In this step, the process of generating performance test results can be understood as the process of generating interface content displayed on the display screen, such as digital display, chart display or other display methods, which is not intended to limit the present invention.

FIG. 4 shows a structural block diagram of the computer performance testing system under the Itanium platform provided by the present invention. For convenience of description, only the parts related to the embodiments of the present invention are shown in the figure.

The test package program installation module 11 installs the software test package program; the file update module 12 updates the HPL.Dat file generated in the process of installing the software test package program; the test module 13 treats the installed software test package program and the generated HPL.Dat file. The maximum CPU peak value extraction module 14 extracts the maximum CPU peak value of the device under test; the performance test result generation module 15 compares the extracted maximum CPU peak value of the device under test with the pre-calculated theoretical CPU peak value to generate the The performance test result of the device under test; the test result display module 16 displays the performance test result of the device under test generated by the performance test result generating module.

In this embodiment, the test package program installation module 11 specifically includes:

The compiler installation module 17 installs the C compiler; the mpich software installation module 18 installs the mpich software; the environment variable adding module 19 adds environment variables to the installation path of the mpich software.

In this embodiment of the present invention, when the installation of the mpich software is completed, the file generation module 20 generates the HPL.Dat file.

In the embodiment of the present invention, the file update module 12 specifically includes:

The device under test information acquisition module 21 acquires the number of CPU cores and memory size of the device under test after the device under test starts running; the first calculation module 22 calculates P and Q according to the acquired number of CPU cores of the device under test. value; the second calculation module 23 calculates the NS value according to the acquired memory size of the device under test; the file parameter modification module 24 revises the generated HPL.Dat file according to the P, Q and NS values obtained by calculation The P, Q and NS values of .

In the embodiment of the present invention, the performance test result generation module 15 specifically includes:

The pre-calculation module 25 pre-calculates the theoretical CPU peak value of the device under test and the test threshold; the comparison and judgment module 26 compares the extracted maximum CPU peak value of the device under test with the pre-calculated theoretical CPU peak value, and judges the maximum CPU peak value and the pre-calculated peak value. The ratio parameter of the theoretical CPU peak value; when the ratio parameter is greater than or equal to the test threshold, the first generation module 27 generates a performance test result that includes the test passing; when the ratio parameter is less than the test threshold, the second generation Module 28 generates performance test results that include test failures.

The functions of the foregoing modules are as described in the foregoing method embodiments, which will not be repeated here.

In the present invention, the software test package program is installed, and the HPL.Dat file generated in the process of installing the software test package program is updated; according to the installed software test package program and the generated HPL.Dat file, the device to be tested is tested and extracted The maximum CPU peak value of the device under test; compare the extracted maximum CPU peak value of the device under test with the pre-calculated theoretical CPU peak value, generate the performance test result of the device under test, and display it, so as to realize the implementation under the Itanium platform The test of CPU performance has a high degree of automation, avoids human-computer interaction, and improves test efficiency and accuracy.

The above descriptions are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention shall be included in the protection of the present invention. within the range.

Claims (8)

1. A computer performance testing method under an Itanium platform is characterized by comprising the following steps:

triggering and automatically installing a software test package program, and updating an HPL.dat file generated in the process of installing the software test package program;

testing equipment to be tested according to an installed software test package program and a generated HPL.dat file, and extracting a maximum CPU peak value of the equipment to be tested, wherein the equipment to be tested is tested for a long time period according to the installed software test package program and the generated HPL.dat file, the CPU peak values of all time periods are respectively obtained, then the CPU peak values of all time periods are counted, and the CPU peak value with the maximum value is extracted as a reference value for detecting and judging the CPU performance;

comparing the extracted maximum CPU peak value of the equipment to be tested with a pre-calculated theoretical CPU peak value to generate and display a performance test result of the equipment to be tested, wherein the performance test result is displayed visually through a display screen, an interface display comprising 'qualified test' and 'unqualified test' is displayed, the performance test result is reminded with voice, information of the performance test result is stored, and subsequent batch tests are continued;

the step of triggering and automatically installing the software test package program specifically comprises the following steps:

installing the C compiler;

installing mpich software;

and adding environment variables to the installation path of the mpich software.

2. The method for testing the performance of a computer under the Itanium platform according to claim 1, wherein the step of installing the mpich software further comprises the following steps:

when the mpich software installation is completed, an hpl.dat file is generated.

3. The method for testing the computer performance under the Itanium platform according to claim 2, wherein the step of updating the HPL.dat file generated in the process of installing the software test package program specifically comprises the following steps:

after the device to be tested is started to operate, acquiring the number of CPU cores and the size of an internal memory of the device to be tested;

calculating P and Q values according to the acquired CPU core number of the equipment to be detected;

calculating an NS value according to the acquired memory size of the equipment to be tested;

modifying P, Q and NS values in the generated HPL.dat file according to the calculated P, Q and NS values.

4. The method for testing the performance of the computer under the Itanium platform according to claim 3, wherein the step of comparing the extracted maximum CPU peak value of the device to be tested with a pre-calculated theoretical CPU peak value to generate the performance test result of the device to be tested specifically comprises the following steps:

pre-calculating a theoretical CPU peak value and a test threshold value of the equipment to be tested;

comparing the extracted maximum CPU peak value of the equipment to be tested with a pre-calculated theoretical CPU peak value, and judging a ratio parameter of the maximum CPU peak value and the pre-calculated theoretical CPU peak value;

when the ratio parameter is greater than or equal to the test threshold, generating a performance test result containing test passing;

and when the ratio parameter is smaller than the test threshold, generating a performance test result containing test failure.

5. A system for testing computer performance under an itanium platform, the system comprising:

the test package program installation module is used for triggering and automatically installing the software test package program;

the file updating module is used for updating the HPL.dat files generated in the process of installing the software test package program;

the test module is used for testing the equipment to be tested according to the installed software test package program and the generated HPL.dat file;

the maximum CPU peak value extraction module is used for extracting the maximum CPU peak value of the equipment to be tested, wherein the equipment to be tested is tested for a long time period according to an installed software test package program and a generated HPL.dat file, the CPU peak values of all the time periods are respectively obtained, then the CPU peak value of each time period is counted, and the CPU peak value with the maximum value is extracted to be used as a reference value for detecting and judging the CPU performance;

the performance test result generation module is used for comparing the extracted maximum CPU peak value of the equipment to be tested with a pre-calculated theoretical CPU peak value to generate a performance test result of the equipment to be tested;

the test result display module is used for displaying the performance test result of the equipment to be tested, which is generated by the performance test result generation module, wherein the performance test result is displayed visually through a display screen, the display screen comprises interface display of qualified test and unqualified test, the voice prompt is accompanied, the information of the performance test result is stored, and the subsequent batch test is continued;

the test package program installation module specifically comprises:

the compiler installation module is used for installing the C compiler;

the mpich software installation module is used for installing mpich software;

and the environment variable adding module is used for adding environment variables to the installation path of the mpich software.

6. The under the Itanium platform computer performance testing system of claim 5, further comprising:

and the file generation module is used for generating the HPL.dat file when the mpich software is installed.

7. The system for testing computer performance under the Itanium platform of claim 6, wherein the file updating module specifically comprises:

the device to be tested information acquisition module is used for acquiring the number of CPU cores and the size of the memory of the device to be tested after the device to be tested is started to operate;

the first calculation module is used for calculating P and Q values according to the acquired CPU core number of the equipment to be detected;

the second calculation module is used for calculating an NS value according to the acquired memory size of the equipment to be tested;

and the file parameter modification module is used for modifying P, Q and NS values in the generated HPL.dat files according to the calculated P, Q and NS values.

8. The system for testing the performance of a computer under an Itanium platform according to claim 7, wherein the performance test result generating module specifically comprises:

the pre-calculation module is used for pre-calculating a theoretical CPU peak value and a test threshold value of the equipment to be tested;

the comparison and judgment module is used for comparing the extracted maximum CPU peak value of the equipment to be tested with a pre-calculated theoretical CPU peak value and judging a ratio parameter of the maximum CPU peak value and the pre-calculated theoretical CPU peak value;

the first generation module is used for generating a performance test result containing a test passing when the ratio parameter is greater than or equal to the test threshold;

and the second generation module is used for generating a performance test result containing test failure when the ratio parameter is smaller than the test threshold.

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