CN107389994B - Configurable pin multiplexing method and system applied to current sensor chip - Google Patents
Configurable pin multiplexing method and system applied to current sensor chip Download PDFInfo
- Publication number
- CN107389994B CN107389994B CN201710626791.2A CN201710626791A CN107389994B CN 107389994 B CN107389994 B CN 107389994B CN 201710626791 A CN201710626791 A CN 201710626791A CN 107389994 B CN107389994 B CN 107389994B
- Authority
- CN
- China
- Prior art keywords
- current
- sensor chip
- current sensor
- pin
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title abstract description 8
- 238000012545 processing Methods 0.000 claims description 18
- 239000003990 capacitor Substances 0.000 claims description 5
- 238000001514 detection method Methods 0.000 claims description 5
- 239000004020 conductor Substances 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 230000001052 transient effect Effects 0.000 description 4
- 230000001965 increasing effect Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
The invention relates to the technical field of multiplexing of pins of a current sensor chip, in particular to a method and a system for multiplexing a configurable pin applied to the current sensor chip, aiming at the problem that high-speed overcurrent indication cannot be met.
Description
Technical Field
The invention relates to the technical field of multiplexing of pins of a current sensor chip, in particular to a method and a system for multiplexing configurable pins applied to the current sensor chip.
Background
The current sensor chip is a chip which obtains the amplitude and polarity of a current signal flowing through a conductor by inducing a magnetic field formed by energizing the conductor inside (or outside) the chip by using a magnetic sensor technology. Such chips are widely used in industrial control, household appliances and other fields. Due to the increasing size of the devices, users want to obtain a current sensor chip with good performance, and meanwhile, want the area occupied by the current sensor chip and peripheral circuits thereof on a PCB to be as small as possible.
FIG. 1 shows a typical current sensor chip pin definition and application circuit: wherein 100 is a current sensor chip; 101-104 are four current pins through which external current to be measured flows into/out of the chip. 105 is the ground pin of the chip and 108 is the power pin of the chip; reference numeral 107 denotes a detection signal output pin of the chip whose output pin voltage varies with the magnitude and polarity of the current flowing into the chip, and 106 denotes a zero current bias voltage signal pin of the chip whose output signal is equal to the voltage value of the reference numeral 107 pin when the current flowing into/out of the chip is zero, that is: a reference signal for a current measurement is provided. The above pin definition and application circuit provide the basic current sensing function.
In addition to providing basic current sensing functionality, in applications with power semiconductor devices, it is desirable for a user to be able to provide an over-current indication signal after the current to be measured exceeds a certain range, so that the semiconductor device can be turned off in time, avoiding damage under high current conditions, and the protection response time required for typical power semiconductor devices is no more than 3 microseconds.
Referring to fig. 2, 200 is a signal output module under test, 202 is a signal pin under test (corresponding to pin 107 of fig. 1), and 203 is a zero current bias voltage signal pin (corresponding to pin 106 of fig. 1). Fig. 3 shows the signal change conditions of the 202 pin and the 203 pin when the current to be measured flowing through the chip changes, wherein a straight line 301 is the voltage signal change output by the 202 pin, and a broken line 302 is the voltage signal change output by the 203 pin. It can be seen that the voltage at pin 202 varies with the polarity and magnitude of the current flowing through the conductor, while the voltage at pin 203 does not vary with the current to be measured flowing through the chip conductor, and the voltage value is equal to the voltage value of the signal pin to be measured (i.e., pin 202) when the current flowing through the chip conductor is zero. In fig. 3, the current values 303 and 304 are the above-mentioned current thresholds for protecting the power semiconductor device, and the voltage values 305 and 306 are the output voltage threshold signals of the signal output pin under the current threshold conditions.
Since it is desirable to filter out unwanted noise signals, the current sensor chip typically employs a low pass filter 201 before the signal output (pin 202 in fig. 2) to ensure good noise characteristics, but the low pass filter reduces the speed of transient response. Under the condition of the normally acceptable noise characteristic, the transient response speed of the signal output end is generally greater than 5-10 microseconds. Since the over-current indication signal is also a transient response, the signal output with the low-pass filter is difficult to meet the requirements for providing a high-speed over-current indication signal. That is, each pin of the existing current sensor chip has only a single function, the pins cannot be reused, and when a user needs to realize more functions, the number of pins can be increased, so that the cost of the chip and the occupied area of the chip on a circuit board are increased.
Disclosure of Invention
Aiming at the problem that the high-speed overcurrent indication cannot be met, the invention provides a configurable pin multiplexing method and a system applied to a current sensor chip, and a user can realize pin multiplexing of the current sensor chip when using the configurable pin multiplexing method and the system.
The technical scheme is as follows: the configurable pin multiplexing method applied to the current sensor chip comprises the current sensor chip and is characterized in that the voltage value output by a detection signal output pin of the current sensor chip is processed before output, a zero current bias voltage signal pin of the current sensor chip is connected with an external power supply through a pull-up resistor or grounded through a capacitor, and when the current to be detected flowing through the current sensor chip exceeds a threshold value, the voltage value curve output by the zero current bias voltage signal pin changes the indication characteristic.
The zero current bias voltage signal pin of the current sensor chip outputs an indication signal that the current to be measured exceeds a threshold value when the current to be measured flowing through the current sensor chip exceeds the threshold value.
The configurable pin system applied to the current sensor chip comprises the current sensor chip, wherein a signal output module to be detected and a low-pass filter are arranged in the current sensor chip, and the configurable pin system is characterized in that a voltage processing module is also arranged in the current sensor chip, one output end of the signal output module to be detected is connected with the input end of the low-pass filter and one input end of the voltage processing module, the output end of the low-pass filter is the detection signal output pin, the output end of the voltage processing module is a zero current bias voltage pin, the other output end of the signal output module to be detected is connected with the other input end of the voltage processing module, the output end of the voltage processing module is the zero current bias voltage signal pin, the voltage processing module comprises three comparators, the output ends of the two comparators are connected with the input ends of two input or gates, the output ends of the two input or gates are connected with the enabling ends of a multiplexer through a switch, the output end of the other comparator is connected with the output end of the multiplexer, and when the current of the other comparator is connected with the output end of the multiplexer, and the current of the multiplexer exceeds the current threshold voltage of the multiplexer, and the current of the multiplexer exceeds the threshold voltage signal output by the threshold value; the zero current bias voltage signal pin is connected with an external power supply through a pull-up resistor or grounded through a capacitor.
It is further characterized in that the comparator is a high-speed comparator with hysteresis characteristics.
After the method and the system of the invention are adopted, a voltage processing module is added, and when the current to be detected flowing through the current sensor chip exceeds a threshold value, the voltage value curve output by the zero current bias voltage signal pin changes the indication characteristic, thereby realizing that one pin can output two curves with different characteristics and realizing the pin multiplexing of the current sensor chip.
Drawings
FIG. 1 is a schematic diagram of a chip structure in the prior art;
FIG. 2 is a schematic diagram of a signal output module to be tested in a chip according to the prior art;
FIG. 3 is a schematic diagram showing the current and voltage variations of a chip according to the prior art;
FIG. 4 is a schematic circuit diagram of the present invention;
FIG. 5 is a diagram showing the current and voltage variations (with hysteresis characteristics) according to the present invention.
Detailed Description
Referring to fig. 4, a configurable pin system applied to a current sensor chip shown in fig. 5 includes a current sensor chip, a signal output module 500 to be tested and a low-pass filter 501 are disposed in the current sensor chip, a voltage processing module 504 is disposed in the current sensor chip, one output end of the signal output module 500 to be tested is connected to an input end of the low-pass filter 501 and one input end of the voltage processing module 504, an output end of the low-pass filter 500 is a detection signal output pin 502, another output end of the signal output module 500 to be tested is connected to another input end of the voltage processing module 504, an output end of the voltage processing module 504 is a zero-current bias voltage signal pin 503, the voltage processing module 504 includes three comparators 504D, 504F, 504J, wherein output ends of the comparators 504D, 540J are connected to input ends of two input or gates 504H, the input end of the comparator 504D is input with a voltage signal 505 which is not sent by a low-pass filter and a positive current threshold voltage 504A, the input end of the comparator 504J is input with a voltage signal 505 which is not sent by a low-pass filter and a negative current threshold voltage 504B, the output end of the two-input OR gate 504H is connected with the enabling end En of the latch 504G, the output end of the comparator 504F is connected with the input end D of the latch 504G, the output end of the latch 504G is connected with the control end of the multiplexer 504E, the zero current bias voltage signal 506 is input into the input end S1 of the multiplexer 504E, the output end of the multiplexer 504E is the output end of the voltage processing module 504, namely the zero current bias voltage pin 503, when the current flowing through the current sensor chip exceeds the threshold value, the zero current bias voltage pin 503 of the current sensor chip outputs an indication signal that the current exceeds the threshold value, the curve 402 shown in fig. 5, the voltage at pin 502 varies with the polarity and magnitude of the current flowing through the conductor, 403, 404 are current thresholds, and 405 and 406 correspond to the output voltage threshold signal under current threshold conditions. Since comparators 504D, 504F, 504J are high-speed comparators with hysteresis characteristics, fig. 5 has hysteresis characteristics.
The zero current bias voltage signal pin 503 is connected to an external power source through a pull-up resistor 507 or to ground through a capacitor 508. When a "weak pull-up" mode is used, a larger resistor 507 is used to connect the pin to an external power source. 504F is a comparator with hysteresis characteristics, 504C is a fixed voltage value between zero current bias voltage and supply voltage. 504G is a D latch with a negative enable. In this connection, the 503 port voltage approaches the supply voltage, so that the output of 504F is low, resulting in the output of 504H being connected to the input S2 of the multiplexer 504E, and the output of the multiplexer 504E being low when the voltage 505 is greater or less in magnitude than the voltage 504A or 504B (504A being the positive current threshold voltage, corresponding to 404 of fig. 5, and 504B being the negative current threshold voltage, corresponding to 403 of fig. 5). Since the enable of latch 504G is latched by the output of or gate 504H, this low level can continue to hold until the magnitude of voltage 505 returns to between voltages 504A and 504B; the above description is that in this configuration, 503 is output as a fast overcurrent indication signal. When a capacitor is used as a load to ground, it is connected to pin 503. With this external circuit configuration, the steady state output of pin 503 will certainly be lower than voltage 504C, so the output of multiplexer 504E will be equal to the S1 input, i.e., voltage 506. Thus in this configuration, pin 503 outputs zero current bias voltage
Since the voltage signal 505 is a high-speed signal that does not pass through the low-pass filter 501, and both 504D and 504J are high-speed comparators, the transient response speed of the overcurrent indication signal output by the pin 503 can be ensured to be greatly higher than that of the pin 502, so that a fast overcurrent protection indication is formed; to avoid intermediate states where power-up is unnecessary on the chip, a "weak pull-down" resistor may be added to the output of multiplexer 504H in practice.
Claims (2)
1. The configurable pin system applied to the current sensor chip comprises the current sensor chip, wherein a signal output module to be detected and a low-pass filter are arranged in the current sensor chip, and the configurable pin system is characterized in that a voltage processing module is also arranged in the current sensor chip, one output end of the signal output module to be detected is connected with the input end of the low-pass filter and one input end of the voltage processing module, the output end of the low-pass filter is a detection signal output pin, the output end of the voltage processing module is a zero current bias voltage signal pin, the other output end of the signal output module to be detected is connected with the other input end of the voltage processing module, the voltage processing module comprises three comparators, wherein the output ends of the two comparators are connected with the input ends of two input OR gates, the output ends of the two input OR gates are connected with the enabling ends of a latch, the output ends of the other comparators are connected with the input ends of the latch through a switch, the output ends of the latch are connected with the control ends of the multiplexer, and when the current of the multiplexer outputs the voltage of the multiplexer exceeds the current sensor chip, and the current of the current sensor exceeds the threshold value of the threshold value; the zero current bias voltage signal pin is connected with an external power supply through a pull-up resistor or grounded through a capacitor.
2. A configurable pin system for a current sensor chip according to claim 1, wherein said comparator is a high-speed comparator with hysteresis characteristics.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710626791.2A CN107389994B (en) | 2017-07-28 | 2017-07-28 | Configurable pin multiplexing method and system applied to current sensor chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710626791.2A CN107389994B (en) | 2017-07-28 | 2017-07-28 | Configurable pin multiplexing method and system applied to current sensor chip |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107389994A CN107389994A (en) | 2017-11-24 |
| CN107389994B true CN107389994B (en) | 2023-08-22 |
Family
ID=60341999
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710626791.2A Active CN107389994B (en) | 2017-07-28 | 2017-07-28 | Configurable pin multiplexing method and system applied to current sensor chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107389994B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107992143B (en) * | 2018-01-23 | 2024-03-01 | 江苏徐工国重实验室科技有限公司 | Multiplexing acquisition port circuit, controller, analog input acquisition method and system |
| CN108562784B (en) * | 2018-03-14 | 2024-03-29 | 杭州思泰微电子有限公司 | Quick overcurrent detection circuit applied to magnetic current sensor |
| CN108444515B (en) * | 2018-03-14 | 2024-10-01 | 杭州思泰微电子有限公司 | Rapid threshold-crossing detection circuit applied to switch modulation signal |
| CN113419124A (en) * | 2021-06-10 | 2021-09-21 | 西安微电子技术研究所 | Static total dose test method and system for satellite-borne microsystem module |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101882864A (en) * | 2010-06-25 | 2010-11-10 | 杭州矽力杰半导体技术有限公司 | Electrifying startup circuit and electrifying startup method thereof |
| CN102831093A (en) * | 2010-02-04 | 2012-12-19 | 矽力杰半导体技术(杭州)有限公司 | Multiplexing circuit and multiplexing method for chip pin |
| CN103246631A (en) * | 2013-05-16 | 2013-08-14 | 北京工业大学 | Pin multiplexing method and circuit for improving pin use rate |
| CN203660493U (en) * | 2013-12-19 | 2014-06-18 | 北汽福田汽车股份有限公司 | Overcurrent protection device and overcurrent protection control equipment |
| CN104237623A (en) * | 2014-10-08 | 2014-12-24 | 武汉弈飞科技有限公司 | High-precision current sensor detecting circuit and detecting method thereof |
| CN105528008A (en) * | 2014-09-30 | 2016-04-27 | 华润矽威科技（上海）有限公司 | A method and a system for adjusting chip output parameters without changing chip pins |
| CN207424025U (en) * | 2017-07-28 | 2018-05-29 | 无锡思泰迪半导体有限公司 | A kind of configurable pin multiplexing system applied to current sensor chip |
-
2017
- 2017-07-28 CN CN201710626791.2A patent/CN107389994B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102831093A (en) * | 2010-02-04 | 2012-12-19 | 矽力杰半导体技术(杭州)有限公司 | Multiplexing circuit and multiplexing method for chip pin |
| CN101882864A (en) * | 2010-06-25 | 2010-11-10 | 杭州矽力杰半导体技术有限公司 | Electrifying startup circuit and electrifying startup method thereof |
| CN103246631A (en) * | 2013-05-16 | 2013-08-14 | 北京工业大学 | Pin multiplexing method and circuit for improving pin use rate |
| CN203660493U (en) * | 2013-12-19 | 2014-06-18 | 北汽福田汽车股份有限公司 | Overcurrent protection device and overcurrent protection control equipment |
| CN105528008A (en) * | 2014-09-30 | 2016-04-27 | 华润矽威科技（上海）有限公司 | A method and a system for adjusting chip output parameters without changing chip pins |
| CN104237623A (en) * | 2014-10-08 | 2014-12-24 | 武汉弈飞科技有限公司 | High-precision current sensor detecting circuit and detecting method thereof |
| CN207424025U (en) * | 2017-07-28 | 2018-05-29 | 无锡思泰迪半导体有限公司 | A kind of configurable pin multiplexing system applied to current sensor chip |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107389994A (en) | 2017-11-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107389994B (en) | Configurable pin multiplexing method and system applied to current sensor chip | |
| EP2391008B1 (en) | Protection circuit and method for electronic devices | |
| CN110784200B (en) | Fast overvoltage and surge detection for high speed and load switches | |
| JP2017215303A (en) | Resistance measurement circuit | |
| CN104808541A (en) | Versatile detection circuit | |
| CN108037341A (en) | A kind of low-leakage current restorer for Power Capacity parting weak current measuring circuit | |
| CN103336165B (en) | A kind of alternating current-direct current over-current detection circuit | |
| US9960588B2 (en) | Power switch device | |
| US12228594B2 (en) | Glitch free brown out detector | |
| CN103018588B (en) | Low-power-consumption anti-interference three-state input detection circuit | |
| CN106410757A (en) | Short-circuit protective circuit | |
| CN115362383B (en) | Fault detection circuit and detection system | |
| CN101493489B (en) | Transient detection circuit and integrated circuit | |
| CN108562784B (en) | Quick overcurrent detection circuit applied to magnetic current sensor | |
| CN207424025U (en) | A kind of configurable pin multiplexing system applied to current sensor chip | |
| CN111624518A (en) | Sensor and open circuit detection circuit thereof | |
| CN103592519A (en) | Surge detection device capable of detecting surge signal characteristics | |
| CN107340414B (en) | Pin multiplexing method and system applied to current sensor chip | |
| CN208239499U (en) | A kind of pin multiplexing system applied to current sensor chip | |
| CA2812119C (en) | Digital input with variable impedance | |
| JP6797035B2 (en) | Magnetic sensor and magnetic sensor device | |
| US20140239971A1 (en) | Debugging circuit and circuit board using same | |
| CN210572476U (en) | IC power supply detection circuit | |
| JP2014062825A (en) | Voltage detection circuit, and voltage detection method | |
| CN207475528U (en) | For the circuit of control electronics |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20221219 Address after: No. 295, Building 17, No. 2723, Fuchunwan Avenue, Chunjiang Street, Fuyang District, Hangzhou, Zhejiang, 310000 Applicant after: Hangzhou Sitai Microelectronics Co.,Ltd. Address before: 214028 No.16 Changjiang Road, Xinwu District, Wuxi City, Jiangsu Province Applicant before: STEADICHIPS Inc. |
|
| TA01 | Transfer of patent application right | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |