CN106992383B

CN106992383B - Non-standard test connector

Info

Publication number: CN106992383B
Application number: CN201710279173.5A
Authority: CN
Inventors: 陈亚军; 王存益
Original assignee: Changzhou Kingsignal Fengshi Communication Equipment Co ltd
Current assignee: Changzhou Kingsignal Fengshi Communication Equipment Co ltd
Priority date: 2017-04-25
Filing date: 2017-04-25
Publication date: 2023-03-03
Anticipated expiration: 2037-04-25
Also published as: CN106992383A

Abstract

The invention provides a non-mapping test connector, one end of which is a standard SMK structure, the other end of which is a non-standard structure, a connecting component and a displacement adjusting component are additionally arranged in the middle of the non-mapping test connector, and one part of a shell structure of the non-mapping test connector is similar to a cylinder and can be fully contacted with the plane of a test device, so that the accuracy of a test result is improved; the flange panel can slide on the shell, and the relative position of the flange panel can be determined according to the length of a test device.

Description

Non-standard test connector

[ technical field ] A method for producing a semiconductor device

The invention relates to the technical field of connectors, in particular to a non-mapping test connector.

[ background of the invention ]

The connector is widely applied, can be used in the fields of communication equipment, industrial equipment and aerospace and navigation, such as telecommunication, radio frequency network, wireless communication, detection and measurement instruments and the like, and has the characteristics of convenience in testing, high reliability and high performance. With the development and increasing frequency of connectors, the requirements of the related industries on the connectors are higher and higher. When a manufacturer carries out installation and debugging, the cable/connector assembly needs to be installed and tested, and because some connectors and cables need to be installed on some carriers for testing, the same connectors are difficult to install in place due to the influence of distance on some special installation carriers, so that test data are influenced, and test results are unreliable. Therefore, manufacturers need to specially manufacture corresponding connectors, and different products need to manufacture a specific connector, which inevitably increases the production cost greatly.

Therefore, there is a need to provide an improved solution to overcome the above problems.

[ summary of the invention ]

The invention aims to provide a non-mapping test connector, which solves the problems of inaccurate test data, high production cost and the like.

To solve the above problems, the present invention provides a non-mapping test connector, comprising: a connecting component, a displacement adjusting component and an inner conductor,

the connecting assembly comprises a first shell and a joint device, the first shell is provided with a first surface, a second surface corresponding to the first surface and a first side surface extending from the first surface to the second surface, the first shell is of a hollow structure, a first through hole is formed in the first shell, the joint device is inserted into the first through hole from the first surface,

the displacement adjusting assembly comprises a second shell and a flange panel, the second shell is provided with a third surface, a fourth surface corresponding to the third surface and a second side surface extending from the third surface to the fourth surface, the second shell is of a hollow structure, a second through hole is formed in the second shell, the first through hole is communicated with the second through hole, the inner conductor is inserted into the first through hole and the second through hole, and the flange panel is sleeved on the second side surface of the second shell and can slide on the second side surface.

As a preferred embodiment of the present invention, the flange panel includes a fifth surface, a sixth surface corresponding to the fifth surface, and a third side surface extending from the fifth surface to the sixth surface, a screw is provided on the third side surface, and the flange panel is fixed to the second housing by the screw.

In a preferred embodiment of the present invention, a plurality of mounting holes are formed in the flange panel, and the mounting holes penetrate from the fifth surface to the sixth surface.

As a preferred embodiment of the present invention, the connector further includes a stopper bar, the stopper bar is disposed between the first housing and the second housing, and a diameter of the stopper bar is larger than a diameter of the first housing and is also larger than a diameter of the second housing.

As a preferred embodiment of the present invention, a part of the second side surface of the second housing has an arc-shaped structure.

As a preferred embodiment of the invention, the second side has a two-thirds cylindrical side structure.

As a preferred embodiment of the present invention, a first insulating dielectric block is inserted into the first through hole, a second insulating dielectric block is inserted into the second through hole, the first insulating dielectric block contacts one end of the inner conductor, and the second insulating dielectric block contacts the other end of the inner conductor.

As a preferred embodiment of the present invention, the first side surface of the first housing is provided with a connecting thread.

Compared with the prior art, one end of the non-mapping test connector is a standard SMK structure, the other end of the non-mapping test connector is a non-standard structure, the connecting component and the displacement adjusting component are additionally arranged in the middle of the non-mapping test connector, one part of a shell structure of the non-mapping test connector is similar to a cylinder and can be fully contacted with the plane of a test device, and the accuracy of a test result is improved; the flange panel can slide on the shell, and the relative position of the flange panel is determined according to the length of the test device.

[ description of the drawings ]

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise. Wherein:

fig. 1 is a schematic diagram of a non-mapping test connector of the present invention;

fig. 2 is a schematic view of a non-mapping test connector of the present invention without a flanged panel;

fig. 3 is a schematic view of a partial cutaway of a non-mapping test connector of the present invention;

fig. 4 is a partially cut-away perspective view of a non-mapping test connector of the present invention.

Wherein, 1 is a first housing, 11 is a first surface, 12 is a first side surface, 121 is a connecting screw thread, 13 is a first through hole, 2 is a connector device, 3 is a second housing, 31 is a fourth surface, 32 is a second side surface, 33 is a second through hole, 4 is a flange panel, 41 is a fifth surface, 42 is a sixth surface, 43 is a third side surface, 44 is a mounting hole, 5 is a screw nail, 6 is a limiting strip, 7 is a first insulating medium block, 8 is a second insulating medium block, and 9 is an inner conductor.

[ detailed description ] embodiments

In order to make the aforementioned objects, features and advantages of the present invention more comprehensible, the present invention is described in detail with reference to the accompanying drawings and the detailed description thereof.

Reference herein to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic may be included in at least one implementation of the invention. The appearances of the phrase "in one embodiment" in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments.

Referring to fig. 1-3, fig. 1 is a schematic structural diagram of a non-mapping test connector according to the present invention; fig. 2 is a schematic view of a non-mapping test connector of the present invention without a flanged panel; fig. 3 is a partially cut-away schematic view of a non-mapping test connector of the present invention. As shown in fig. 1 and 3, the non-mapping trial connector includes a connection assembly (not shown), which is a standard SMK structure, a displacement adjustment assembly (not shown), which is a non-standard structure, and an inner conductor 9.

With continued reference to fig. 2, the connecting assembly includes an internal connector device and an external first housing 1, wherein an end surface of one end of the first housing 1 is a first surface 11, an end surface of the other end is a second surface (not shown), a side surface extending from one end to the other end is a first side surface 12, and a connecting thread 121 is further disposed on the first side surface 12 near the first surface 11 for facilitating connection with a corresponding connector. The displacement adjustment assembly comprises a flange panel 4 and a second shell 3, the end surface of one end of the second shell 3 is a third surface, the end surface of the other end of the second shell is a fourth surface 31, the side surface extending from one end to the other end is a second side surface 32, a limiting strip 6 is arranged between the second surface and the third surface, the second surface, the limiting strip 6 and the third surface are of an integrated structure, the first shell 1 is connected with the second shell 3, and the first shell 1 and the second shell 3 are of a tight-fit assembly structure. Referring to fig. 1 and 3, a flange panel 4 is sleeved on the second housing 3, and the flange panel 4 can slide up and down on the second housing 3.

With continued reference to fig. 1 and 3 in conjunction with fig. 4, fig. 4 is a partially cut-away perspective view of a non-mapping test connector of the present invention. As shown in the figure, the flange panel 4 may also be divided into a fifth surface 41, a sixth surface 42 and a third side surface 43, the fifth surface 41 and the sixth surface 42 are corresponding surfaces, the fifth surface 41 and the sixth surface 42 are both used for fixing a test device, the test device is fixed on the flange panel 4 by providing a plurality of mounting holes 44 penetrating from the fifth surface 41 to the sixth surface 42 on the flange panel 4, and the third side surface 43 of the flange panel 4 is provided with screw nails 5 for limiting the flange panel 4, so that after the flange panel 4 moves up and down to determine its relative position with the second housing 3, the screw nails 5 are screwed, and the relative position of the flange panel 4 and the second housing 3 is fixed.

With reference to fig. 4, the first housing 1 and the second housing 3 are hollow and respectively have a first through hole 13 and a second through hole 33, the first through hole 13 is communicated with the second through hole 33, the inner conductor 9 is inserted between the first through hole 13 and the second through hole 33, a first insulating dielectric block 7 is disposed at one end of the inner conductor 9, a second insulating dielectric block 8 is disposed at the other end, and the connector device 2 is disposed in the first through hole 13 near the first surface 11.

The second side 32 of the second housing 3 has a two-thirds cylindrical structure, in other words, the partial arc surface of the second side 32 is the same as the partial arc surface of the cylindrical structure, the structure of the second side 32 having two-thirds cylindrical side plays a role in fully contacting the surface of the test device, and the two-thirds cylindrical side connecting the flange panel 4 and the second side 32 adopts a loose-fitting structure matched with each other, so that the flange panel 4 with the test device can axially move on the two-thirds cylindrical side of the second side 32 by a certain distance.

It should be understood by those skilled in the art that one of the features or objects of the present invention is to: 1. the connector fully contacts with the surface of the testing device, the accuracy of a measured value is improved, 2, the flange panel can slide up and down, the position of the flange panel can be determined and fixed according to the length of the testing device, and the connector is suitable for various testing devices.

It should be noted that those skilled in the art can make modifications to the embodiments of the present invention without departing from the scope of the appended claims. Accordingly, the scope of the appended claims is not to be limited to the specific embodiments described above.

Claims

1. A non-mapping test connector, comprising: the displacement adjusting assembly comprises a second shell and a flange panel, the second shell is provided with a third surface, a fourth surface corresponding to the third surface and a second side surface extending from the third surface to the fourth surface, the second shell is of a hollow structure, the second shell is provided with a second through hole, a second through hole is formed in the second shell, the first through hole is communicated with the second through hole, the inner conductor is inserted into the first through hole and the second through hole, and the flange panel is sleeved on the second side surface of the second shell and can slide on the second side surface;

the flange panel comprises a fifth surface, a sixth surface corresponding to the fifth surface and a third side surface extending from the fifth surface to the sixth surface, a threaded nail is arranged on the third side surface, and the flange panel is fixed with the second shell through the threaded nail;

a plurality of mounting holes are formed in the flange panel, and the mounting holes penetrate from the fifth surface to the sixth surface;

the connector further comprises a limiting strip, the limiting strip is arranged between the first shell and the second shell, and the diameter of the limiting strip is larger than that of the first shell and that of the second shell.

2. The non-mapping connector of claim 1, wherein a portion of the second side surface of the second housing is in an arc-like configuration.

3. The non-mapping connector of claim 2, wherein the second side has two-thirds of a cylindrical side structure.

4. The non-mapping test connector of claim 1, wherein a first insulating dielectric block is inserted into the first through hole, a second insulating dielectric block is inserted into the second through hole, the first insulating dielectric block contacts one end of the inner conductor, and the second insulating dielectric block contacts the other end of the inner conductor.

5. The non-mapping trial connector of claim 1, wherein the first housing has connecting threads on a first side thereof.