CN106896537A - A kind of lighting jig - Google Patents
A kind of lighting jig Download PDFInfo
- Publication number
- CN106896537A CN106896537A CN201710100873.3A CN201710100873A CN106896537A CN 106896537 A CN106896537 A CN 106896537A CN 201710100873 A CN201710100873 A CN 201710100873A CN 106896537 A CN106896537 A CN 106896537A
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- probe
- base
- lighting fixture
- horizontal direction
- backlight module
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Arrangement Of Elements, Cooling, Sealing, Or The Like Of Lighting Devices (AREA)
- Liquid Crystal (AREA)
Abstract
本发明公开了一种点灯治具，所述点灯治具包括：底座，还包括：探头底板，设置于所述底座上，具有第一水平方向调节性能；探头，具有磁吸附性、导电性以及第二水平方向调节性能，连接于背光模组的电源，其一端设置于所述探头底板上，另一端用于与背光模组的金属引脚接触；磁性装置，设置于所述探头的下方，用以向下吸附所述探头。本发明的点灯治具可适用于检测多款背光模组，同时保证针对各款背光模组进行检测时背光模组的金属引脚的接触良好性。
The invention discloses a lighting fixture. The lighting fixture includes: a base, and further includes: a probe bottom plate, which is arranged on the base, and has a first horizontal direction adjustment performance; a probe, which has magnetic adsorption, conductivity and The second horizontal direction adjustment performance is connected to the power supply of the backlight module, one end of which is arranged on the bottom plate of the probe, and the other end is used to contact the metal pin of the backlight module; the magnetic device is arranged under the probe, Used to absorb the probe downward. The lighting fixture of the present invention is suitable for testing various types of backlight modules, and at the same time ensures good contact of the metal pins of the backlight modules when testing various types of backlight modules.
Description
Technical Field
The present invention relates to the field of display technologies, and in particular, to a lighting fixture.
Background
The backlight module is one of the key components of the liquid crystal display panel. The backlight module has the function of providing sufficient light source with uniform brightness and distribution, so that the liquid crystal display panel can normally display images. In the manufacturing process of the backlight module, impurities may be mixed, or the quality of the display screen may be affected by stains, scratches and the like, so the lighting fixture is usually used to detect the quality of the backlight module.
In the process of detecting the backlight module by using the lighting fixture, a metal pin of an FPC (flexible printed Circuit) of the backlight module needs to be in contact conduction with a conductive unit of the lighting fixture, so as to light the backlight module. However, the pressure head for pressing the metal pins of the backlight module and the conductive unit of the lighting fixture together may be worn in long-term use, so that the pressure head may not contact the metal pins of the backlight module after stopping at the set position, resulting in poor contact between the metal pins of the backlight module and the conductive unit of the lighting fixture.
Patent publication No. CN201410841457 provides a lighting fixture, which makes the conductive unit placed between the conductive unit and the handle and the metal pin of the backlight module contact and conduct through the first adsorption structure below the conductive unit of the lighting fixture and the second adsorption structure on the handle as the pressure head, so as to solve the problem of poor contact.
However, in practical use, the inventors of the present invention have found that the lighting fixture described above still has many limitations. In fact, different types of backlight modules often need to be equipped with different lighting fixtures for detection due to differences in size, connecting line arrangement and the like. That is, each time a backlight module is tested, a batch of corresponding lighting fixtures need to be manufactured, which results in a great waste of resources. Therefore, it is necessary to provide a lighting fixture with versatility and capable of detecting a plurality of types of backlight modules, and simultaneously, to ensure the contact of the metal pins of the backlight module when detecting various types of backlight modules.
Disclosure of Invention
In view of the above, an object of the present invention is to provide a lighting fixture, which has versatility, is suitable for detecting a plurality of types of backlight modules, and simultaneously ensures good contact of metal pins of the backlight modules when detecting the backlight modules.
In view of the above object, the present invention provides a lighting fixture, including: including the base, still include:
the probe bottom plate is arranged on the base and has first horizontal direction adjusting performance;
the probe has magnetic adsorption, conductivity and second horizontal direction adjustment performance, is connected with a power supply of the backlight module, and one end of the probe is arranged on the probe bottom plate while the other end of the probe is used for contacting with a metal pin of the backlight module;
and the magnetic device is arranged below the probe and used for downwards adsorbing the probe.
Wherein the first horizontal direction refers to a front-back direction of the horizontal direction, and the second horizontal direction refers to a left-right direction of the horizontal direction; or,
the first horizontal direction refers to a left-right direction of the horizontal direction, and the second horizontal direction refers to a front-rear direction of the horizontal direction.
The magnetic device is a metal block with magnetism and is arranged on the probe bottom plate or in the probe bottom plate.
Or, the magnetic device is specifically: a conductive coil disposed below the probe, the conductive coil being magnetic when energized.
Further, the tool of lighting a lamp still includes:
the limiting structure is arranged in the base and used for placing the backlight module;
and the clamping edges on one side or two sides of the limiting structure are connected with the screw rod adjusting structure.
Further, the tool of lighting a lamp still includes: a magnifier arranged on the base through a rotating shaft;
the rotation range of the magnifier covers the contact position of the probe and the metal pin of the backlight module.
Further, the tool of lighting a lamp still includes: the temperature and humidity sensor, the liquid crystal display screen embedded in the base and the control unit are arranged on the base;
the control unit displays the temperature and the humidity of the current environment measured by the temperature and humidity sensor through the liquid crystal screen.
Preferably, the power supply of the backlight module is arranged in the base; wherein the power supply is a power supply with adjustable current.
Preferably, the control unit is further configured to display a current magnitude output by the power supply.
Further, the tool of lighting a lamp still includes: a plurality of base knobs supporting the base.
Further, the tool of lighting a lamp still includes: the level gauge is embedded in the base.
In the technical scheme of the embodiment of the invention, the probe can be adjusted left and right and adjusted front and back through the probe bottom plate; or the probe can be adjusted front and back, and can be adjusted left and right through the probe bottom plate, so that the probe can be adjusted to the position in contact with the metal pins according to different sizes of FPCs of backlight modules of different styles, and the probe is suitable for detecting backlight modules of multiple styles.
Meanwhile, the probe also has magnetic adsorption, and a magnetic device is arranged below the probe and can adsorb the probe downwards; the downward absorption force enables the probe to be pressed on the metal pin of the backlight module with a certain pressure, so that good contact between the probe and the metal pin of the backlight module is ensured.
Drawings
Fig. 1 is a schematic structural view of a lighting fixture with an adjustable probe according to an embodiment of the present invention;
FIG. 2 is a schematic view of a knob for driving a probe base plate to move back and forth according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a magnetic device on a probe base plate according to an embodiment of the present invention;
fig. 4 is a schematic structural view of a rotary magnifier in the lighting fixture according to the embodiment of the invention;
fig. 5 is a flowchart illustrating an operation method for testing a backlight module by using a lighting fixture according to an embodiment of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to specific embodiments and the accompanying drawings.
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative only and should not be construed as limiting the invention.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. As used herein, the term "and/or" includes all or any element and all combinations of one or more of the associated listed items.
It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are used for distinguishing two entities with the same name but different names or different parameters, and it should be noted that "first" and "second" are merely for convenience of description and should not be construed as limitations of the embodiments of the present invention, and they are not described in any more detail in the following embodiments.
According to the technical scheme, a probe bottom plate capable of being adjusted back and forth is arranged on a base of the lighting fixture, and a probe capable of being adjusted left and right is arranged on the probe bottom plate; or the base is provided with a probe bottom plate which can be adjusted left and right, and the probe bottom plate is provided with a probe which can be adjusted front and back; the probe is used for contacting with a metal pin of the backlight module. Because the probe can be adjusted from side to side and adjust from side to side through the probe bottom plate, perhaps, the probe can be adjusted from side to side and adjust from side to side through the probe bottom plate for the position that contacts with metal pin can be adjusted to the different sizes of FPC of different style backlight unit to the probe, with be applicable to and detect many types of backlight unit.
Meanwhile, the probe also has magnetic adsorption, and a magnetic device is arranged below the probe and can adsorb the probe downwards; the downward absorption force enables the probe to be pressed on the metal pin of the backlight module at a certain pressure, so that good contact between the probe and the metal pin of the backlight module is ensured.
The technical solution of the embodiments of the present invention is described in detail below with reference to the accompanying drawings.
The lighting fixture provided by the embodiment of the invention is structurally shown in fig. 1, and comprises: a base 100, a probe base plate 101, a probe 102, and a magnetic device (not shown) disposed under the probe 102.
Wherein, the probe bottom plate 101 is disposed on the base 100 and has a first horizontal direction adjusting performance. The first horizontal direction may specifically refer to a front-rear direction of the horizontal direction.
For example, as shown in fig. 2, the probe base plate 101 is disposed on the base 100 through two screw knobs respectively penetrating two elongated slots of the base 100; the screw knob is screwed to a nut on the lower side of the base 100 to fasten the probe base plate 101 to the base 100. When the nut is loosened, the probe base plate 101 can move along the long strip-shaped notch on the base 100, so that the adjustment of back and forth movement is realized. Of course, other configurations for the fore-aft adjustment of the probe base plate 101 may be used by those skilled in the art.
The probe 102 has magnetic attraction and conductivity; one end of the probe 102 is arranged on the probe bottom plate 101, is connected with a power supply of the backlight module, and has second horizontal direction adjustment performance; the other end of the probe 102 is used for contacting with a metal pin of the backlight module. The metal pin of the backlight module can be connected to a power supply of the backlight module through the probe, and is used for supplying power to the backlight module and lightening the backlight module. The second horizontal direction may specifically refer to a left-right direction of the horizontal direction.
For example, as shown in fig. 1, an elongated slot is formed on the probe base plate 101, and an elongated slot is also formed at a corresponding position of the base 100; the screw knob penetrates through one end of the probe 102, penetrates through the notches of the probe base plate 101 and the base 100, and is screwed with a nut below the base 100, so that the probe is fixed on the probe base plate 101. When the nut is loosened, the probe 102 can move along the elongated slot on the probe base plate 101, and left-right adjustment is achieved. Of course, other configurations for left and right adjustment of the probe 102 may be used by those skilled in the art.
Of course, the first horizontal direction described above may also refer to the left-right direction of the horizontal direction, and the second horizontal direction may be the front-rear direction of the horizontal direction.
The magnetic device disposed below the probe 102 can attract the probe having magnetic attraction downward. Preferably, the magnetic device is disposed near one end of the probe 102 contacting the metal pins of the backlight module.
In particular, the magnetic means may be a metal block having magnetic properties. For example, as shown in FIG. 3, the metal block may be disposed on or within the probe base plate.
Alternatively, the magnetic device may be a conductive coil disposed below the probe, the conductive coil passing current when energized to generate a magnetic field that attracts the magnetically attractable probe downward.
The probe can be adjusted left and right, so that the probe can adapt to LED (light emitting diode) FPC bonding pads with different widths of backlight modules of different styles; the probe can be adjusted back and forth through the probe bottom plate, so that the probe can adapt to FPCs with different lengths of backlight modules of different styles;
or the probe can be adjusted back and forth to adapt to FPCs with different lengths of backlight modules with different styles; the probe is adjusted left and right through the probe bottom plate, and can adapt to LED FPC bonding pads with different widths of backlight modules of different styles.
Meanwhile, the magnetic device below the probe attracts the probe with magnetic adsorption downwards, so that the probe is pressed on the metal pin of the backlight module at a certain pressure, and good contact between the probe and the metal pin of the backlight module is ensured.
Further, as shown in fig. 1, the lighting fixture according to the embodiment of the present invention further includes: a limiting structure 103 disposed in the base 100.
The position limiting structure 103 is used for placing the backlight module. The clamping edges on one side or two sides of the limiting structure 103 are connected to the screw rod adjusting structure. Through the knob of rotatory lead screw regulation structure one end, drive the lead screw along screw thread horizontal migration to the card limit that the drive is connected in the lead screw regulation structure other end removes, can fasten backlight unit in limit structure 103. Through adjusting the card limit of one side or both sides of limit structure 103 for limit structure 103 is fit for placing various backlight unit of different sizes.
Further, as shown in fig. 4, the lighting fixture according to the embodiment of the present invention further includes: a magnifying lens 108 provided on the base through a rotation shaft; the magnifying lens may be rotated over the probe 102. Specifically, the rotation range of the magnifier covers the position where the probe 102 contacts with the metal pins of the backlight module.
In fact, the LED FPC pads of the backlight module are usually small, and it may be difficult for a tester to align the LED FPC pads of the backlight module when adjusting the position of the probe. The magnifying lens on the lighting fixture of the embodiment of the invention can rotate to the position above the probe 102, so that a tester can clearly see the relative position of the probe and the LED FPC bonding pad by virtue of the magnifying effect of the magnifying lens, quickly align the probe and the LED FPC bonding pad, and improve the working efficiency.
Further, as shown in fig. 1, the lighting fixture according to the embodiment of the present invention further includes: temperature and humidity sensor 105, liquid crystal display 104 embedded in the base, and a control unit (not shown).
The temperature and humidity sensor 105 is used to measure the temperature and humidity of the current environment.
The control unit displays the temperature and humidity of the current environment measured by the temperature and humidity sensor 105 through the liquid crystal screen 104. Therefore, the tester can correspondingly record the current temperature and humidity conditions in the process of testing the backlight module, and the performance of the backlight module can be conveniently and comprehensively known.
Further, the power supply of the backlight module may be built in the chassis 100. Preferably, the power supply of the backlight module is a current-adjustable power supply.
Furthermore, the control unit can be used for displaying the current output by the power supply of the backlight module so as to adapt to the current required by backlight modules of different styles or models.
Further, as shown in fig. 1, the lighting fixture according to the embodiment of the present invention further includes: a plurality of base knobs 106 supporting the base.
The tester can keep the pedestal 100 of the lighting fixture horizontal by adjusting the pedestal knob 106.
Further, as shown in fig. 1, the lighting fixture according to the embodiment of the present invention further includes: a level 107 embedded in the base.
In the process of adjusting the level of the base 100 of the lighting fixture through the base knob 106, a tester may detect whether the base 100 is currently level by using the level meter 107 embedded in the base.
The operation method for testing the backlight module by using the lighting fixture as shown in fig. 5 comprises the following steps:
step S501: and adjusting the level of the base.
In this step, the tester adjusts the level of the base by the base knob 106, and detects whether the base is level by the level meter 107 embedded in the base.
Step S502: the backlight module is aligned and fixed.
In this step, during the tester placed limit structure 103 with backlight unit to through the knob of rotatory lead screw regulation structure one end, drive the lead screw along screw thread horizontal migration, thereby drive the card limit of connecting in the lead screw regulation structure other end and remove, fasten backlight unit in limit structure 103.
Step S503: and pressing the metal pin of the backlight module under the probe.
In this step, firstly, the probe bottom plate 101 is adjusted to move back and forth to a proper position; then the probe 102 is moved left and right to a proper position; or firstly, the probe bottom plate 101 is adjusted to move left and right to a proper position; the probe 102 is then moved back and forth to the proper position so that the probe is positioned over the metal pins of the backlight module. During the process, the magnifying lens 108 can be rotated above the probe, so as to observe whether the probe is accurately butted with the metal pins of the backlight module. The probe is attracted by the magnetic device and is pressed downwards to be connected with the metal pin of the backlight module.
Step S504: and starting a power supply of the backlight module and regulating the power supply to corresponding current.
In this step, the power supply of the backlight module is turned on, and the current is input to the metal pin of the backlight module along the probe, thereby lighting the backlight module. The tester can adjust the magnitude of the output current of the power supply so as to adapt to the magnitude of the current required by backlight modules of different styles or models.
In the process of lighting the test backlight module, the control unit can display the temperature and the humidity of the current environment measured by the temperature and humidity sensor 105 and the current output by the power supply through the liquid crystal screen 104.
In the technical scheme of the embodiment of the invention, the probe can be adjusted left and right and adjusted front and back through the probe bottom plate, or the probe can be adjusted front and back and adjusted left and right through the probe bottom plate, so that the probe can be adjusted to the position contacting with the metal pins according to different sizes of FPCs of backlight modules of different styles, and is suitable for detecting various backlight modules.
Meanwhile, the probe also has magnetic adsorption, and a magnetic device is arranged below the probe and can adsorb the probe downwards; the downward absorption force enables the probe to be pressed on the metal pin of the backlight module at a certain pressure, so that good contact between the probe and the metal pin of the backlight module is ensured.
Furthermore, the lighting fixture of the embodiment of the invention has the adjustable performance of the clamping edges on one side or two sides of the adjusting and limiting structure, so that backlight modules with different sizes can be placed in the limiting structure.
Furthermore, the magnifying glass on the lighting fixture can rotate to the position above the probe, so that a tester can clearly see the relative position of the probe and the LED FPC bonding pad by means of the magnifying effect of the magnifying glass, the probe and the LED FPC bonding pad can be quickly aligned, and the working efficiency is improved.
Furthermore, the control unit of the lighting fixture in the embodiment of the invention displays the temperature and humidity of the current environment measured by the temperature and humidity sensor through the liquid crystal screen, so that a tester can correspondingly record the current temperature and humidity condition in the process of testing the backlight module, and the performance of the backlight module can be conveniently and comprehensively known.
Furthermore, the power supply of the backlight module embedded in the lighting fixture in the embodiment of the invention has adjustability of output current so as to adapt to the current required by backlight modules of different styles or models.
Those of skill in the art will appreciate that various operations, methods, steps in the processes, acts, or solutions discussed in the present application may be alternated, modified, combined, or deleted. Further, various operations, methods, steps in the flows, which have been discussed in the present application, may be interchanged, modified, rearranged, decomposed, combined, or eliminated. Further, steps, measures, schemes in the various operations, methods, procedures disclosed in the prior art and the present invention can also be alternated, changed, rearranged, decomposed, combined, or deleted.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, is limited to these examples; within the idea of the invention, also features in the above embodiments or in different embodiments may be combined, steps may be implemented in any order, and there are many other variations of the different aspects of the invention as described above, which are not provided in detail for the sake of brevity. Therefore, any omissions, modifications, substitutions, improvements and the like that may be made without departing from the spirit and principles of the invention are intended to be included within the scope of the invention.
Claims (10)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710100873.3A CN106896537B (en) | 2017-02-23 | 2017-02-23 | a lighting fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710100873.3A CN106896537B (en) | 2017-02-23 | 2017-02-23 | a lighting fixture |
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| Publication Number | Publication Date |
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| CN106896537A true CN106896537A (en) | 2017-06-27 |
| CN106896537B CN106896537B (en) | 2020-04-14 |
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| CN201710100873.3A Active CN106896537B (en) | 2017-02-23 | 2017-02-23 | a lighting fixture |
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Cited By (7)
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| CN108981770A (en) * | 2018-05-28 | 2018-12-11 | 合肥京东方显示光源有限公司 | A kind of inspection light assembly |
| CN109031726A (en) * | 2018-08-31 | 2018-12-18 | 贵州华旭光电技术有限公司 | Detection device for liquid crystal display |
| CN109709495A (en) * | 2019-01-07 | 2019-05-03 | 京东方科技集团股份有限公司 | A kind of lighting jig and external lighting mould group detection device |
| CN109916595A (en) * | 2019-03-27 | 2019-06-21 | 京东方科技集团股份有限公司 | A kind of lighting jig and big visual angle optical testing device |
| CN110873719A (en) * | 2018-09-03 | 2020-03-10 | 苏州卡利肯新光讯科技有限公司 | Lens lighting fixture |
| CN111103528A (en) * | 2020-01-16 | 2020-05-05 | 佛山普瑞威尔科技有限公司 | Automatic chip detection device |
| CN114255660A (en) * | 2021-12-29 | 2022-03-29 | 新谱(惠州)电子有限公司 | Lamp shade positioning accurate jig for high-brightness backlight double-lamp shade structure |
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| CN109709495B (en) * | 2019-01-07 | 2021-01-22 | 京东方科技集团股份有限公司 | Lighting jig and external lighting module detection equipment |
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| CN111103528A (en) * | 2020-01-16 | 2020-05-05 | 佛山普瑞威尔科技有限公司 | Automatic chip detection device |
| CN114255660A (en) * | 2021-12-29 | 2022-03-29 | 新谱(惠州)电子有限公司 | Lamp shade positioning accurate jig for high-brightness backlight double-lamp shade structure |
| CN114255660B (en) * | 2021-12-29 | 2024-07-16 | 新谱(惠州)电子有限公司 | High-brightness backlight source double-lampshade structure upper lampshade positioning accurate jig |
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