CN106409922B - Crystal silicon flexible battery and preparation method thereof - Google Patents
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- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 44
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 43
- 239000010703 silicon Substances 0.000 title claims abstract description 42
- 238000002360 preparation method Methods 0.000 title claims abstract description 11
- 239000013078 crystal Substances 0.000 title claims description 9
- 229910004205 SiNX Inorganic materials 0.000 claims abstract description 27
- 238000002161 passivation Methods 0.000 claims abstract description 25
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 18
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 18
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims abstract description 17
- 239000010409 thin film Substances 0.000 claims abstract description 14
- 238000005538 encapsulation Methods 0.000 claims abstract description 10
- 238000003486 chemical etching Methods 0.000 claims abstract description 7
- 238000005530 etching Methods 0.000 claims abstract description 7
- 238000000034 method Methods 0.000 claims description 24
- 238000009792 diffusion process Methods 0.000 claims description 16
- 239000010408 film Substances 0.000 claims description 13
- 238000005245 sintering Methods 0.000 claims description 7
- XHXFXVLFKHQFAL-UHFFFAOYSA-N phosphoryl trichloride Chemical compound ClP(Cl)(Cl)=O XHXFXVLFKHQFAL-UHFFFAOYSA-N 0.000 claims description 6
- 238000001035 drying Methods 0.000 claims description 5
- 229910019213 POCl3 Inorganic materials 0.000 claims description 3
- 239000011248 coating agent Substances 0.000 claims description 2
- 238000000576 coating method Methods 0.000 claims description 2
- 239000000463 material Substances 0.000 claims description 2
- 238000007650 screen-printing Methods 0.000 claims description 2
- 239000000758 substrate Substances 0.000 claims 4
- 239000004411 aluminium Substances 0.000 claims 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 claims 1
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 claims 1
- 239000007789 gas Substances 0.000 claims 1
- 229910052760 oxygen Inorganic materials 0.000 claims 1
- 239000001301 oxygen Substances 0.000 claims 1
- 229920005573 silicon-containing polymer Polymers 0.000 claims 1
- 229910021419 crystalline silicon Inorganic materials 0.000 abstract description 33
- 238000005452 bending Methods 0.000 abstract description 11
- 230000031700 light absorption Effects 0.000 abstract description 9
- 238000010521 absorption reaction Methods 0.000 abstract description 6
- 238000006243 chemical reaction Methods 0.000 abstract description 6
- 239000000969 carrier Substances 0.000 abstract description 5
- 229920006280 packaging film Polymers 0.000 abstract description 3
- 239000012785 packaging film Substances 0.000 abstract description 3
- 238000007747 plating Methods 0.000 abstract 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 7
- 239000004205 dimethyl polysiloxane Substances 0.000 description 5
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 description 5
- 238000005215 recombination Methods 0.000 description 4
- 230000006798 recombination Effects 0.000 description 4
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 239000012299 nitrogen atmosphere Substances 0.000 description 3
- RLOWWWKZYUNIDI-UHFFFAOYSA-N phosphinic chloride Chemical compound ClP=O RLOWWWKZYUNIDI-UHFFFAOYSA-N 0.000 description 3
- 239000005022 packaging material Substances 0.000 description 2
- -1 polydimethylsiloxane Polymers 0.000 description 2
- 230000000717 retained effect Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- ZWNQSJPQMSUVSE-UHFFFAOYSA-N [Cu].[Sn].[In] Chemical compound [Cu].[Sn].[In] ZWNQSJPQMSUVSE-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000007888 film coating Substances 0.000 description 1
- 238000009501 film coating Methods 0.000 description 1
- 239000013067 intermediate product Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002073 nanorod Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
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- H10F77/306—Coatings for devices having potential barriers
- H10F77/311—Coatings for devices having potential barriers for photovoltaic cells
- H10F77/315—Coatings for devices having potential barriers for photovoltaic cells the coatings being antireflective or having enhancing optical properties
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- H10F19/80—Encapsulations or containers for integrated devices, or assemblies of multiple devices, having photovoltaic cells
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Abstract
本发明公开了一种晶硅柔性电池及其制备方法。该晶硅柔性电池包括封装膜和设于封装膜内的电池组件,电池组件由下至上依次由铝背电极层、单晶硅基底层、圆柱形硅阵列结构层、PN结层、SiNx钝化层和ITO薄膜层组成。制备方法包括(1)化学刻蚀:(2)扩散制PN结:(3)制备SiNx钝化层;(4)镀ITO薄膜层:(5)刻蚀硅背面;(6)镀铝背电极:(7)封装。本发明制备的晶硅柔性电池具有良好的陷光结构和大光吸收角,光生载流子吸收长度短,光吸收效率高,光电转化效率高,且弯折性能优异。
The invention discloses a crystalline silicon flexible battery and a preparation method thereof. The crystalline silicon flexible battery includes a packaging film and a battery component arranged in the packaging film. The battery component is sequentially composed of an aluminum back electrode layer, a single crystal silicon base layer, a cylindrical silicon array structure layer, a PN junction layer, and a SiNx passivation layer from bottom to top. layer and ITO thin film layer composition. The preparation method includes (1) chemical etching: (2) diffused PN junction: (3) preparation of SiNx passivation layer; (4) plating ITO thin film layer: (5) etching silicon backside; (6) aluminum plating back electrode : (7) encapsulation. The crystalline silicon flexible battery prepared by the invention has a good light-trapping structure and a large light absorption angle, short absorption length of photogenerated carriers, high light absorption efficiency, high photoelectric conversion efficiency, and excellent bending performance.
Description
技术领域technical field
本发明属于光伏领域,具体涉及一种晶硅柔性电池及其制备方法。The invention belongs to the field of photovoltaics, and in particular relates to a crystalline silicon flexible battery and a preparation method thereof.
背景技术Background technique
目前市面上的太阳能电池很难将柔性、高效以及高电池寿命结合起来。传统晶硅电池拥有较高的电池效率和稳定性以及电池寿命,但做成柔性电池后,在反复弯折的过程中容易出现裂纹和碎片,反复弯折性不好。而新型的太阳能电池如染料敏化太阳能电池、铜铟锡太阳能电池等,可以做成具有反复弯折的柔性电池,但是这些电池的寿命和稳定性都较差。因此,寻求一种不仅稳定性和寿命高,而且反复弯折性能好的太阳能电池成为当务之急。Solar cells currently on the market struggle to combine flexibility, high efficiency, and high battery life. Traditional crystalline silicon batteries have high battery efficiency, stability and battery life, but after being made into flexible batteries, cracks and debris are prone to appear in the process of repeated bending, and the repeated bending performance is not good. And new solar cells such as dye-sensitized solar cells, copper indium tin solar cells, etc., can be made into flexible cells with repeated bending, but the life and stability of these cells are poor. Therefore, it is urgent to seek a solar cell that not only has high stability and long life, but also has good repeated bending performance.
发明内容Contents of the invention
本发明要解决的技术问题是克服现有技术的不足,提供一种具有良好陷光结构和大光吸收角、光生载流子吸收长度短、光吸收效率高、光电转化效率高和弯折性能优异的晶硅柔性电池及其制备方法。The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a light-trapping structure with a large light absorption angle, short absorption length of photogenerated carriers, high light absorption efficiency, high photoelectric conversion efficiency and bending performance. Excellent crystalline silicon flexible battery and its preparation method.
为解决上述技术问题,本发明采用以下技术方案:In order to solve the problems of the technologies described above, the present invention adopts the following technical solutions:
一种晶硅柔性电池,所述晶硅柔性电池包括封装膜和设于封装膜内的电池组件,所述电池组件由下至上依次由铝背电极层、单晶硅基底层、圆柱形硅阵列结构层、PN结层、SiNx钝化层和ITO薄膜层组成。A crystalline silicon flexible battery, the crystalline silicon flexible battery includes an encapsulation film and a battery assembly arranged in the encapsulation film, the battery assembly consists of an aluminum back electrode layer, a single crystal silicon base layer, and a cylindrical silicon array from bottom to top Structure layer, PN junction layer, SiNx passivation layer and ITO film layer.
上述的晶硅柔性电池中,优选的,所述圆柱形硅阵列结构层的阵列单元的直径为1μm~2μm,阵列单元的高为2μm~4μm,相邻阵列单元之间的中心间距为3μm~8μm;和/或,所述PN结层的结深为0.2μm~0.42μm;和/或,所述SiNx钝化层中,Si与N的原子比(即1/x)在0.743与1.014之间,所述SiNx钝化层的厚度为50nm~80nm。In the above crystalline silicon flexible battery, preferably, the diameter of the array unit of the cylindrical silicon array structure layer is 1 μm to 2 μm, the height of the array unit is 2 μm to 4 μm, and the center-to-center distance between adjacent array units is 3 μm to 2 μm. 8 μm; and/or, the junction depth of the PN junction layer is 0.2 μm to 0.42 μm; and/or, in the SiNx passivation layer, the atomic ratio of Si to N (ie 1/x) is between 0.743 and 1.014 Between, the thickness of the SiNx passivation layer is 50nm-80nm.
上述的晶硅柔性电池中,优选的,所述单晶硅基底层的厚度为20μm~100μm;和/或,所述ITO薄膜层的光透过率T>90%,电阻率ρ<4×10-4Ω·cm,折射率n为2.1~2.5。In the above crystalline silicon flexible battery, preferably, the thickness of the monocrystalline silicon base layer is 20 μm to 100 μm; and/or, the light transmittance T of the ITO thin film layer is > 90%, and the resistivity ρ < 4× 10 -4 Ω·cm, and the refractive index n is 2.1 to 2.5.
作为一个总的技术构思,本发明还提供了一种上述的晶硅柔性电池的制备方法,包括以下步骤:As a general technical idea, the present invention also provides a method for preparing the above-mentioned crystalline silicon flexible battery, comprising the following steps:
(1)化学刻蚀:在单晶硅上进行化学刻蚀,刻蚀出圆柱形硅阵列结构,得到圆柱形硅阵列结构层;(1) Chemical etching: perform chemical etching on the single crystal silicon, etch out the cylindrical silicon array structure, and obtain the cylindrical silicon array structure layer;
(2)扩散:在圆柱形硅阵列结构层上采用扩散工艺制备PN结,得到PN结层;(2) Diffusion: A PN junction is prepared by a diffusion process on the cylindrical silicon array structure layer to obtain a PN junction layer;
(3)制备SiNx钝化层:在PN结层上采用PECVD工艺制备SiNx钝化层;(3) Prepare SiNx passivation layer: adopt PECVD process to prepare SiNx passivation layer on PN junction layer;
(4)镀ITO薄膜层:在SiNx钝化层上采用PECVD工艺镀ITO薄膜,得到ITO薄膜层(即Sn掺杂In2O3薄膜);(4) ITO film coating: on the SiNx passivation layer, the PECVD process is used to plate the ITO film to obtain the ITO film layer (i.e. Sn-doped In 2 O 3 film);
(5)刻蚀硅背面:在步骤(1)保留的单晶硅背面进行刻蚀剪薄,得到单晶硅基底层;(5) Etching the back side of silicon: performing etching and thinning on the back side of monocrystalline silicon retained in step (1) to obtain a monocrystalline silicon base layer;
(6)镀铝背电极:在单晶硅基底层的背面丝网印刷铝浆,经烧结后,得到铝背电极层;(6) Aluminum-plated back electrode: aluminum paste is screen-printed on the back of the monocrystalline silicon base layer, and after sintering, an aluminum back electrode layer is obtained;
(7)封装:将步骤(1)~(6)分别制备的各结构层组成的电池组件进行封装,得到晶硅柔性电池。(7) Encapsulation: Encapsulate the battery components composed of the respective structural layers prepared in steps (1) to (6) to obtain a crystalline silicon flexible battery.
上述的晶硅柔性电池的制备方法中,优选的,所述步骤(2)中,所述扩散工艺包括如下过程:先在O2和N2气氛中于600℃~800℃下氧化3min~5min,然后通POCl3、O2和N2,在扩散温度为800℃~825℃下扩散3min~5min,再升高温度至810℃~835℃,在POCl3、O2和N2气氛中深扩散3min~5min,进一步推深PN结。In the above method for preparing a crystalline silicon flexible battery, preferably, in the step (2), the diffusion process includes the following process: first oxidizing at 600°C to 800°C for 3min to 5min in an O2 and N2 atmosphere , then pass through POCl 3 , O 2 and N 2 , diffuse at a diffusion temperature of 800°C to 825°C for 3min to 5min, then increase the temperature to 810°C to 835°C, and deep in POCl 3 , O 2 and N 2 Diffuse for 3 minutes to 5 minutes to further push the PN junction deeper.
上述的晶硅柔性电池的制备方法中,优选的,所述步骤(3)中,所述PECVD工艺的条件为:真空压力为180Pa~230Pa,镀膜温度为430℃~450℃,通入SiH4和NH3,SiH4与NH3的气体流量比为4200∶500,射频功率为3500W~4000W。In the above method for preparing a crystalline silicon flexible battery, preferably, in the step (3), the conditions of the PECVD process are: the vacuum pressure is 180Pa to 230Pa, the coating temperature is 430°C to 450°C, and SiH 4 and NH 3 , the gas flow ratio of SiH 4 and NH 3 is 4200:500, and the radio frequency power is 3500W-4000W.
上述的晶硅柔性电池的制备方法中,优选的,所述步骤(6)中,所述烧结过程如下:先将铝浆烘干,烘干温度为100℃~200℃,烘干时间为10min~20min,然后在400℃~450℃下烧结30min~60min,再于600℃~900℃下烧结10min~25min,形成欧姆接触。In the above method for preparing a crystalline silicon flexible battery, preferably, in the step (6), the sintering process is as follows: first, the aluminum paste is dried at a drying temperature of 100° C. to 200° C. and a drying time of 10 minutes. ~20min, then sintering at 400℃~450℃ for 30min~60min, and then sintering at 600℃~900℃ for 10min~25min to form ohmic contact.
上述的晶硅柔性电池的制备方法中,优选的,所述步骤(7)中,所述封装的材料为聚二甲基硅氧烷(PDMS)。In the above method for preparing a crystalline silicon flexible battery, preferably, in the step (7), the packaging material is polydimethylsiloxane (PDMS).
本发明中,铝背电极层的厚度一般为20μm~30μm。In the present invention, the thickness of the aluminum back electrode layer is generally 20 μm to 30 μm.
本发明中,SiNx充当钝化层、光吸收层的作用,当折射率最小时,三层折射率之间符合以下关系:In the present invention, SiNx acts as a passivation layer and a light-absorbing layer. When the refractive index is the smallest, the three-layer refractive index conforms to the following relationship:
其中,n1为SiNx的折射率,n0为单晶硅的折射率,n0=2.39,n2为封装材料PDMS的折射率,n2=1.40,根据公式(1)可知SiNx的折射率,n1=1.83薄膜的效果光学性质最优,为了提高少子寿命,n1取1.9-2.1之间;Among them, n 1 is the refractive index of SiNx, n 0 is the refractive index of single crystal silicon, n 0 = 2.39, n 2 is the refractive index of the packaging material PDMS, n 2 = 1.40, according to formula (1), we can know the refractive index of SiNx , n 1 = 1.83 The film has the best optical properties, in order to improve the minority carrier lifetime, n 1 is set between 1.9-2.1;
根据SiNx的折射率与Si与N元素含量比(原子比)的经验公式:According to the empirical formula of the refractive index of SiNx and the content ratio of Si and N elements (atomic ratio):
Si与N比(即1/x)在0.743与1.014之间。The Si to N ratio (ie 1/x) is between 0.743 and 1.014.
本发明的创新点在于:The innovation of the present invention is:
本发明在传统晶硅电池的基础上,设计出一种全新的晶硅电池结构,可以反复弯折,是一种高效的柔性电池。本发明是一种3D结构的太阳能电池,在圆柱形硅阵列结构上形成PN结,具有良好的陷光性能,短的光生载流子吸收长度,电池效率高,特殊的3-D微米棒结构可使晶硅柔性电池弯折或者重复弯折,很难产生裂纹,弯曲对电池性能的影响非常小,电池寿命更高。考虑到晶硅具有较长的少子扩散长度,且硅表面有较高的激子复合率,因此圆柱状硅阵列结构进行了优化,将纳米棒的尺度定在微米数量级,这样在保证这种新型电池在具有较的光吸收效率、光电转化效率的同时,降低由于表面复合而造成的损耗。本发明在镀透明导电层ITO之后,拥有刻蚀剪薄的过程,使其更适合于柔性电池。本发明不需要焊接光栅,减少了增光面积,简化了制备步骤,有益于提高产能,降低成本。Based on the traditional crystalline silicon battery, the present invention designs a brand-new crystalline silicon battery structure, which can be bent repeatedly, and is a highly efficient flexible battery. The invention is a solar cell with a 3D structure. A PN junction is formed on a cylindrical silicon array structure, which has good light trapping performance, short photocarrier absorption length, high cell efficiency, and a special 3-D microrod structure. The crystalline silicon flexible battery can be bent or repeatedly bent, and it is difficult to generate cracks. The impact of bending on battery performance is very small, and the battery life is longer. Considering that crystalline silicon has a long minority carrier diffusion length and a high exciton recombination rate on the silicon surface, the columnar silicon array structure is optimized, and the scale of the nanorods is set on the order of microns, so as to ensure that this new type of While the battery has relatively high light absorption efficiency and photoelectric conversion efficiency, it reduces the loss caused by surface recombination. After the transparent conductive layer ITO is plated, the present invention has an etching and thinning process, which makes it more suitable for flexible batteries. The invention does not need to weld the grating, reduces the light-enhancing area, simplifies the preparation steps, and is beneficial to increase the production capacity and reduce the cost.
与现有技术相比,本发明的优点在于:Compared with the prior art, the present invention has the advantages of:
1、本发明制备的晶硅柔性电池具有与现有技术完全不同的结构设计,特别是具有特殊的3-D微米棒结构(即圆柱形阵列结构),这种特殊的3-D微米棒结构在弯折或者重复弯折时很难产生裂纹,弯曲对电池性能的影响非常小,电池寿命更高。1. The crystalline silicon flexible battery prepared by the present invention has a completely different structural design from the prior art, especially a special 3-D microrod structure (ie, a cylindrical array structure). This special 3-D microrod structure It is difficult to produce cracks when bending or repeated bending, and the impact of bending on battery performance is very small, and the battery life is longer.
2、本发明制备的晶硅柔性电池的光吸收效率更高:(1)拥有良好的陷光结构,大光吸收角;(2)短的光子吸收长度;(3)不需要光栅,可减少遮光面积。2. The crystalline silicon flexible battery prepared by the present invention has higher light absorption efficiency: (1) has a good light trapping structure and a large light absorption angle; (2) short photon absorption length; (3) does not require a grating, which can reduce shading area.
3、本发明制备的晶硅柔性电池的光电转化效率更高:(1)短的光生载流子吸收长度;(2)更大的PN结面积,可及时进行光电转化;(3)硅具有较长的少子扩散长度,且硅表面有较高的激子复合率,因此圆柱状硅阵列结构的尺度在微米数量级,这样在保证这种新型电池在具有较高的光吸收效率、光电转化效率的同时,降低由于表面复合而造成的损耗。3. The photoelectric conversion efficiency of the crystalline silicon flexible battery prepared by the present invention is higher: (1) short photogenerated carrier absorption length; (2) larger PN junction area, which can carry out photoelectric conversion in time; (3) silicon has Longer minority carrier diffusion length and higher exciton recombination rate on the silicon surface, so the scale of the cylindrical silicon array structure is on the order of microns, which ensures that this new type of cell has higher light absorption efficiency and photoelectric conversion efficiency. At the same time, the loss caused by surface recombination is reduced.
附图说明Description of drawings
图1为本发明的晶硅柔性电池的结构示意图。FIG. 1 is a schematic structural view of the crystalline silicon flexible battery of the present invention.
图例说明:illustration:
1、铝背电极层;2、单晶硅基底层;3、圆柱形硅阵列结构层;4、PN结层;5、SiNx钝化层;6、ITO薄膜层;7、封装膜。1. Aluminum back electrode layer; 2. Monocrystalline silicon base layer; 3. Cylindrical silicon array structure layer; 4. PN junction layer; 5. SiNx passivation layer; 6. ITO thin film layer; 7. Packaging film.
具体实施方式Detailed ways
以下结合说明书附图和具体优选的实施例对本发明作进一步描述,但并不因此而限制本发明的保护范围。The present invention will be further described below in conjunction with the accompanying drawings and specific preferred embodiments, but the protection scope of the present invention is not limited thereby.
以下实施例中所采用的材料和仪器均为市售。All materials and instruments used in the following examples are commercially available.
实施例:Example:
一种本发明的晶硅柔性电池,如图1所示,该晶硅柔性电池包括封装膜7和设于封装膜7内的电池组件,电池组件由下至上依次由铝背电极层1、单晶硅基底层2、圆柱形硅阵列结构层3、PN结层4、SiNx钝化层5和ITO薄膜层6组成。A crystalline silicon flexible battery of the present invention, as shown in FIG. 1 , the crystalline silicon flexible battery includes an encapsulation film 7 and a battery assembly disposed in the encapsulation film 7, and the battery assembly consists of an aluminum back electrode layer 1, a single The crystal silicon base layer 2, the cylindrical silicon array structure layer 3, the PN junction layer 4, the SiNx passivation layer 5 and the ITO thin film layer 6 are composed.
本实施例中,圆柱形硅阵列结构层3的阵列单元的直径为1.511μm,阵列单元的高为3.24μm,相邻阵列单元之间的中心间距为5.32μm。PN结层4的结深为0.252μm;SiNx钝化层5中,Si与N的原子比为0.875,SiNx钝化层5的厚度为68nm。In this embodiment, the diameter of the array units of the cylindrical silicon array structure layer 3 is 1.511 μm, the height of the array units is 3.24 μm, and the center-to-center distance between adjacent array units is 5.32 μm. The junction depth of the PN junction layer 4 is 0.252 μm; in the SiNx passivation layer 5 , the atomic ratio of Si to N is 0.875, and the thickness of the SiNx passivation layer 5 is 68 nm.
本实施例中,单晶硅基底层2的厚度为55μm;ITO薄膜层6的光透过率T>90%,电阻率ρ<4×10-4Ω·cm,折射率n为2.1,铝背电极层1的厚度为27μm。In this embodiment, the thickness of the monocrystalline silicon base layer 2 is 55 μm; the light transmittance T of the ITO thin film layer 6 is > 90%, the resistivity ρ < 4×10 -4 Ω·cm, the refractive index n is 2.1, and the aluminum The thickness of the back electrode layer 1 was 27 μm.
一种上述本实施例的晶硅柔性电池的制备方法,包括以下步骤:A preparation method of the crystalline silicon flexible battery of the above-mentioned present embodiment, comprising the following steps:
(1)化学刻蚀:在单晶硅上进行化学刻蚀,刻蚀出圆柱形硅阵列结构,得到圆柱形硅阵列结构层3;(1) Chemical etching: perform chemical etching on the single crystal silicon to etch out the cylindrical silicon array structure, and obtain the cylindrical silicon array structure layer 3;
(2)扩散:在圆柱形硅阵列结构层3上采用扩散工艺制备PN结,得到PN结层4;(2) Diffusion: a PN junction is prepared on the cylindrical silicon array structure layer 3 by a diffusion process to obtain a PN junction layer 4;
(3)制备SiNx钝化层5:在PN结层4上采用PECVD工艺制备SiNx钝化层5,其中,Si与N的原子比为0.875;(3) Prepare SiNx passivation layer 5: prepare SiNx passivation layer 5 on PN junction layer 4 by PECVD process, wherein the atomic ratio of Si to N is 0.875;
(4)镀ITO薄膜层6:在SiNx钝化层5上采用PECVD工艺镀ITO薄膜,得到ITO薄膜层6;(4) ITO thin film layer 6: adopt PECVD process to plate ITO thin film on SiNx passivation layer 5, obtain ITO thin film layer 6;
(5)刻蚀硅背面:在步骤(1)保留的单晶硅背面进行刻蚀剪薄,使单晶硅的厚度为55μm,得到单晶硅基底层2;(5) Etching the back side of the silicon: performing etching and thinning on the back side of the single crystal silicon retained in step (1), so that the thickness of the single crystal silicon is 55 μm to obtain the single crystal silicon base layer 2;
(6)镀铝背电极:在单晶硅基底层2的背面采用丝网印刷刷涂铝浆,经烧结后,得到铝背电极层1;此时也得到了电池组件,即步骤(1)~步骤(6)制备的各结构层共同组成了电池组件;(6) Aluminum-plated back electrode: use screen printing to brush aluminum paste on the back side of the monocrystalline silicon base layer 2, and after sintering, obtain the aluminum back electrode layer 1; at this time, the battery assembly is also obtained, that is, step (1) Each structural layer prepared in step (6) together forms a battery assembly;
(7)封装:采用聚二甲基硅氧烷(PDMS)对电池组件进行封装,形成封装膜7,最终得到晶硅柔性电池。(7) Encapsulation: the battery assembly is encapsulated with polydimethylsiloxane (PDMS) to form an encapsulation film 7 , and finally a crystalline silicon flexible battery is obtained.
本实施例的步骤(2)中,扩散工艺条件为:先将带圆柱形硅阵列结构层3的单晶硅在O2和N2气氛中于800℃下氧化3min,然后通POCl3、O2和N2,在扩散温度为825℃下扩散5min,再升高温度至835℃,在POCl3、O2和N2气氛中深扩散5min,进一步推深PN结。In step (2) of this embodiment, the diffusion process conditions are: first oxidize the single crystal silicon with the cylindrical silicon array structure layer 3 in O2 and N2 atmosphere at 800°C for 3min, and then pass POCl3 , O 2 and N 2 , diffused at a diffusion temperature of 825°C for 5 minutes, then raised the temperature to 835°C, and diffused deeply in POCl 3 , O 2 and N 2 atmosphere for 5 minutes to further deepen the PN junction.
本实施例的步骤(3)中,制备SiNx钝化层的PECVD工艺条件为:将步骤(2)得到的中间产品放入PECVD管中进行钝化膜的生长,抽真空至真空度为226.65Pa,并将炉管温度升至430℃,通入SiH4和NH3,SiH4与NH3的气体流量比为4200sccm∶500sccm(单位为每分钟标准立方厘米),射频功率为3800W。In step (3) of this embodiment, the PECVD process conditions for preparing the SiNx passivation layer are: put the intermediate product obtained in step (2) into a PECVD tube to grow the passivation film, and vacuum to a vacuum degree of 226.65Pa , and the temperature of the furnace tube was raised to 430° C., and SiH 4 and NH 3 were introduced. The gas flow ratio of SiH 4 and NH 3 was 4200 sccm: 500 sccm (in standard cubic centimeters per minute), and the radio frequency power was 3800 W.
本实施例的步骤(6)中,先将铝浆烘干,烘干温度为150℃,烘干时间为10min,然后在400℃下烧结45min,再于800℃下烧结10min,形成欧姆接触。In step (6) of this embodiment, the aluminum paste is first dried at a drying temperature of 150° C. for 10 minutes, then sintered at 400° C. for 45 minutes, and then sintered at 800° C. for 10 minutes to form an ohmic contact.
经检测,本发明制备的晶硅柔性电池(3-D微米棒结构)在入射角0~60°时,电池效率没有变化,而普通晶硅电池当入射角到60°时电池效率下降12%。可见本发明的晶硅柔性电池具有良好的陷光结构和大光吸收角。After testing, the crystalline silicon flexible battery (3-D microrod structure) prepared by the present invention has no change in battery efficiency when the incident angle is 0-60°, while the battery efficiency of ordinary crystalline silicon battery drops by 12% when the incident angle reaches 60° . It can be seen that the crystalline silicon flexible battery of the present invention has a good light trapping structure and a large light absorption angle.
普通晶硅电池光生载流子扩散长度为产生光生载流子的位置到细栅线的距离,这取决于细栅的距离,为厘米的量级。而本发明的光生载流子扩散长度为圆柱形硅阵列结构上PN结到ITO的距离(即PN结的深度加上SiNx钝化层的厚度),PN结深H可在.2μm~0.42μm,一般为0.252μm,可见本发明大大降低了光生载流子吸收长度,可大大提高电池的电学性能。The diffusion length of photogenerated carriers in ordinary crystalline silicon cells is the distance from the position where photogenerated carriers are generated to the fine grid line, which depends on the distance of the fine grid, and is on the order of centimeters. And the photogenerated carrier diffusion length of the present invention is the distance from the PN junction to the ITO on the cylindrical silicon array structure (that is, the depth of the PN junction plus the thickness of the SiNx passivation layer), and the depth H of the PN junction can be .2 μm~0.42 μm , generally 0.252 μm, it can be seen that the present invention greatly reduces the absorption length of photogenerated carriers, and can greatly improve the electrical performance of the battery.
本发明的晶硅柔性电池在200次反复弯折试验后,没有出现裂纹、气泡或者破损,其电池为初始效率的93%。The crystalline silicon flexible battery of the present invention has no cracks, bubbles or damage after 200 repeated bending tests, and its battery efficiency is 93% of the initial efficiency.
以上所述,仅是本发明的较佳实施例而已,并非对本发明作任何形式上的限制。虽然本发明已以较佳实施例揭示如上,然而并非用以限定本发明。任何熟悉本领域的技术人员,在不脱离本发明的精神实质和技术方案的情况下,都可利用上述揭示的方法和技术内容对本发明技术方案做出许多可能的变动和修饰,或修改为等同变化的等效实施例。因此,凡是未脱离本发明技术方案的内容,依据本发明的技术实质对以上实施例所做的任何简单修改、等同替换、等效变化及修饰,均仍属于本发明技术方案保护的范围内。The above descriptions are only preferred embodiments of the present invention, and do not limit the present invention in any form. Although the present invention has been disclosed above with preferred embodiments, it is not intended to limit the present invention. Any person familiar with the art, without departing from the spirit and technical solutions of the present invention, can use the methods and technical content disclosed above to make many possible changes and modifications to the technical solutions of the present invention, or modify them to be equivalent Variations of equivalent embodiments. Therefore, any simple modifications, equivalent replacements, equivalent changes and modifications made to the above embodiments according to the technical essence of the present invention, which do not deviate from the technical solutions of the present invention, still fall within the protection scope of the technical solutions of the present invention.
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