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CN106168632A - Fixable probes and probe fixing components - Google Patents

Fixable probes and probe fixing components Download PDF

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Publication number
CN106168632A
CN106168632A CN201610260679.7A CN201610260679A CN106168632A CN 106168632 A CN106168632 A CN 106168632A CN 201610260679 A CN201610260679 A CN 201610260679A CN 106168632 A CN106168632 A CN 106168632A
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China
Prior art keywords
probe
insertion protrusion
horizontal
horizontal portion
vertical
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CN201610260679.7A
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Chinese (zh)
Inventor
金暎昊
孟根英
丘璜燮
金铉济
郑熙锡
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Withmems Co ltd
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GigaLane Co Ltd
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Application filed by GigaLane Co Ltd filed Critical GigaLane Co Ltd
Priority to CN201910794571.XA priority Critical patent/CN110531124A/en
Publication of CN106168632A publication Critical patent/CN106168632A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06705Apparatus for holding or moving single probes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Liquid Crystal (AREA)
  • Geometry (AREA)

Abstract

The present invention relates to a probe capable of being fixed and a probe fixing assembly. The probe fixing assembly of the present invention comprises: a probe seat, which is provided with a probe with a convex insertion bulge on one side surface; and a play prevention part including a first play prevention part preventing the probe from moving from the probe holder in a left-right direction, and a second play prevention part preventing the probe from moving from the probe holder in a vertical direction, wherein the first play prevention part includes a film formed with an insertion hole into which the insertion protrusion is inserted.

Description

能够固定的探针及探针固定组件Fixable probes and probe fixing components

技术领域technical field

本发明涉及一种在检查显示装置时固定探针的探针固定组件和符合这种探针固定组件的探针。The present invention relates to a probe fixing assembly for fixing a probe when inspecting a display device and a probe conforming to the probe fixing assembly.

背景技术Background technique

一般而言,探测装置包括接触在显示装置上形成的接触垫的多个探针,最近,显示装置的接触垫间的间隔,即,间距(pitch)非常窄地形成,因而正在进行旨在使探针准确地位于接触垫上的多样的研究、开发。In general, a probing device includes a plurality of probes that contact contact pads formed on a display device. Recently, the intervals between contact pads of a display device, that is, pitches (pitch) are formed very narrowly, and efforts are being made to make Various researches and developments for accurately positioning probes on contact pads.

如果多个探针的相互间隔稠密,不能保持固定的位置,即使稍微移动或倾斜,则相互邻接的探针相互接触而短路,或超出显示装置的接触位置,存在无法准确检查的问题。If a plurality of probes are closely spaced and cannot maintain a fixed position, even if they are slightly moved or tilted, adjacent probes will contact each other and short-circuit, or exceed the contact position of the display device, resulting in a problem that accurate inspection cannot be performed.

因此,在检查显示装置时,固定探针,使探针不向上下方向、左右方向移动,而能够保持其位置,是对于准确地检查显示装置非常重要的事项。Therefore, when inspecting a display device, it is very important to accurately inspect the display device by fixing the probe so that the probe does not move up and down or left and right but maintains its position.

现有技术文献prior art literature

专利文献patent documents

(专利文献1)韩国公开专利第10-2012-0040484号(2012.04.27)(Patent Document 1) Korean Laid-Open Patent No. 10-2012-0040484 (2012.04.27)

发明内容Contents of the invention

本发明的目的在于提供一种在检查显示装置时防止探针向上下方向及左右方向移动的探针固定组件及能够固定的探针。An object of the present invention is to provide a probe fixing unit and a probe that can be fixed to prevent the probe from moving in the vertical direction and the left and right directions when inspecting a display device.

旨在达成这种目的的本发明的探针固定组件包括:探针座,其在一侧面放置凸出形成有插入凸起的探针;及游动防止部,其包括防止所述探针从所述探针座向左右方向游动的第一游动防止部、防止所述探针从所述探针座向上下方向游动的第二游动防止部,所述第一游动防止部包括形成有供所述插入凸起插入的插入孔的薄膜。The probe fixing assembly of the present invention aimed at achieving this purpose includes: a probe base, which places a protruding probe formed with an insertion protrusion on one side; A first movement prevention part for the probe holder to move in the left and right direction, a second movement prevention part for preventing the probe from the probe holder to move in the up and down direction, the first movement prevention part It includes a film formed with an insertion hole into which the insertion protrusion is inserted.

旨在达成这种目的的本发明的探针固定组件包括:探针座,其在一侧面放置凸出形成有插入凸起的探针;及游动防止部,其包括防止所述探针从所述探针座向左右方向游动的第一游动防止部,所述第一游动防止部包括形成有供所述插入凸起插入的插入孔的薄膜。The probe fixing assembly of the present invention aimed at achieving this purpose includes: a probe base, which places a protruding probe formed with an insertion protrusion on one side; The first movement prevention part for the probe holder to move in the left and right direction includes a thin film formed with an insertion hole into which the insertion protrusion is inserted.

旨在达成这种目的的本发明的探针固定组件包括:探针,其包括沿水平方向较长地形成而使得一端能够接触显示装置电路图案的第一水平部、在所述第一水平部的另一端沿垂直方向延长形成的垂直部、在所述垂直部的另一端向与所述第一水平部相反方向延长形成的第二水平部、包括在所述垂直部凸出形成的第一插入凸起与在所述第二水平部凸出形成的第二插入凸起的插入凸起;探针座,其用于放置所述探针;及游动防止部,其包括防止所述探针的上下方向游动的第二游动防止部。The probe fixing assembly of the present invention aimed at achieving this purpose includes: a probe comprising a first horizontal portion formed long in the horizontal direction so that one end can contact a circuit pattern of a display device, The other end of the vertical portion is extended along the vertical direction to form a vertical portion, the other end of the vertical portion is extended to form a second horizontal portion in the direction opposite to the first horizontal portion, and the vertical portion includes a first protruding portion formed on the vertical portion. an insertion protrusion and a second insertion protrusion protrudingly formed at the second horizontal part; a probe seat for placing the probe; The second movement prevention part for the vertical movement of the needle.

本发明的特征在于,隔着既定间隔设置多个所述探针,在所述薄膜隔着既定间隔形成有多个插入孔。The present invention is characterized in that a plurality of the probes are provided at predetermined intervals, and a plurality of insertion holes are formed at predetermined intervals in the film.

所述探针包括沿水平方向较长地形成而使得一端能够接触显示装置电路图案的第一水平部、在所述第一水平部的另一端沿垂直方向延长形成的垂直部、在所述垂直部的另一端向与所述第一水平部相反方向延长形成的第二水平部,所述插入凸起包括在所述垂直部凸出形成的第一插入凸起、在第二水平部凸出形成的第二插入凸起。The probe includes a first horizontal portion formed long in the horizontal direction such that one end can contact a circuit pattern of the display device, a vertical portion formed elongated in the vertical direction at the other end of the first horizontal portion, The other end of the first horizontal part is extended to form a second horizontal part opposite to the first horizontal part. The second insertion protrusion is formed.

本发明的特征在于,所述第一插入凸起沿垂直方向较长地形成,所述第二插入凸起沿水平方向较长地形成,所述插入孔为矩形形状。The present invention is characterized in that the first insertion protrusion is formed to be long in the vertical direction, the second insertion protrusion is formed to be long in the horizontal direction, and the insertion hole has a rectangular shape.

所述薄膜包括与所述垂直部对应的第一薄膜、与所述第二水平部对应的第二薄膜。The film includes a first film corresponding to the vertical portion, and a second film corresponding to the second horizontal portion.

其特征在于,在所述第一插入凸起上端凸出形成有能够防止所述第一薄膜从所述第一插入凸起分离的卡定突起。It is characterized in that a locking protrusion capable of preventing the first film from being separated from the first insertion protrusion protrudes from the upper end of the first insertion protrusion.

本发明的特征在于,所述第一水平部及第二水平部能够弹性变形。The present invention is characterized in that the first horizontal portion and the second horizontal portion are elastically deformable.

本发明的特征在于,在所述第二水平部形成有使所述第二水平部能够弹性变形的开环形状的孔。The present invention is characterized in that an open loop-shaped hole that enables elastic deformation of the second horizontal portion is formed in the second horizontal portion.

本发明的特征在于,所述探针包括沿水平方向较长地形成而使得一端能够接触显示装置电路图案的第一水平部、在所述第一水平部的另一端沿垂直方向延长形成的垂直部、在所述垂直部的另一端向与所述第一水平部相反方向延长形成的第二水平部,在所述垂直部及所述第二水平部,分别凸出形成有第一插入凸起及第二插入凸起,所述第二游动防止部同时与所述第一插入凸起及第二插入凸起的上端面接触而固定所述探针。The feature of the present invention is that the probe includes a first horizontal portion formed long in the horizontal direction so that one end can contact the circuit pattern of the display device, and a vertical vertical portion extended in the vertical direction at the other end of the first horizontal portion. part, a second horizontal part formed by extending in the opposite direction from the first horizontal part at the other end of the vertical part, and first insertion protrusions protrude from the vertical part and the second horizontal part respectively. and the second insertion protrusion, and the second anti-swimming portion contacts the upper end surfaces of the first insertion protrusion and the second insertion protrusion at the same time to fix the probe.

本发明的探针固定组件的特征在于,还包括探针主体,所述第二游动防止部固定结合于所述探针主体。The probe fixing assembly of the present invention is characterized in that it further includes a probe body, and the second anti-swimming part is fixedly combined with the probe body.

本发明的特征在于,所述第一插入凸起及第二插入凸起上端平坦地形成,以便所述第二游动防止部能够面接触。The present invention is characterized in that the upper ends of the first insertion protrusion and the second insertion protrusion are formed flat so that the second movement preventing portion can be in surface contact.

本发明的特征在于,在所述第二插入凸起上,在与所述第二游动防止部面接触的部位形成有弹性部。The present invention is characterized in that an elastic portion is formed at a portion of the second insertion protrusion that is in surface contact with the second wandering preventing portion.

旨在达成这种目的的本发明的能够固定的探针的特征在于,包括沿水平方向较长地形成而使得一端能够接触显示装置电路图案的第一水平部、在所述第一水平部的另一端沿垂直方向延长形成的垂直部、在所述垂直部的另一端向与所述第一水平部相反方向延长形成的第二水平部,在所述垂直部及第二水平部分别凸出形成有第一插入凸起及第二插入凸起。The fixable probe of the present invention aimed at achieving this object is characterized in that it includes a first horizontal portion formed long in the horizontal direction so that one end can contact the circuit pattern of the display device, The other end is extended along the vertical direction to form a vertical part, and the other end of the vertical part is extended to form a second horizontal part opposite to the direction of the first horizontal part, and the vertical part and the second horizontal part respectively protrude A first insertion protrusion and a second insertion protrusion are formed.

本发明的特征在于,所述第一插入凸起沿垂直方向较长地形成,所述第二插入凸起沿水平方向较长地形成,在所述第一插入凸起上端凸出形成有卡定突起。The present invention is characterized in that the first insertion protrusion is formed long in the vertical direction, the second insertion protrusion is formed long in the horizontal direction, and a card is formed protruding from the upper end of the first insertion protrusion. fixed protrusion.

本发明的特征在于,在所述第二插入凸起形成有弹性部。The present invention is characterized in that an elastic portion is formed on the second insertion protrusion.

本发明的特征在于,在所述第二水平部形成有本发明的开环形状的孔。The present invention is characterized in that the open-loop-shaped hole of the present invention is formed in the second horizontal portion.

从根据附图的以下详细说明,本发明的特征及好处将更加明确。The features and benefits of the present invention will become more apparent from the following detailed description based on the accompanying drawings.

在此之前,本说明书及权利要求书中使用的术语或单词不得按通常的、字典的意义解释,应立足于发明人为了以最佳方法说明其自身的发明而可以适宜地定义术语概念的原则,解释为符合本发明的技术思想的意义和概念。Prior to this, the terms or words used in this specification and claims should not be interpreted according to the usual, dictionary meaning, but should be based on the principle that the inventor can properly define the terms and concepts in order to describe his own invention in the best way , interpreted as meanings and concepts consistent with the technical idea of the present invention.

根据本发明,可以体现如下多样的效果。According to the present invention, various effects as follows can be exhibited.

第一,具有能够防止探针的上下方向游动及左右方向游动的优点。First, there is an advantage in that it is possible to prevent vertical and horizontal wandering of the probe.

第二,防止探针相互接触,防止短路,从而具有能够准确检查的优点。Second, it has the advantage of enabling accurate inspection by preventing the probes from coming into contact with each other and preventing short circuits.

第三,具有能够防止探针的变形的优点。Third, there is an advantage that deformation of the probe can be prevented.

附图说明Description of drawings

图1是表示本发明的探针固定组件的图,FIG. 1 is a diagram showing a probe fixing assembly of the present invention,

图2是本发明的主要部分放大图,Fig. 2 is an enlarged view of main parts of the present invention,

图3是概略地表示本发明的探针固定组件的结合关系的图,Fig. 3 is a diagram schematically showing the coupling relationship of the probe fixing assembly of the present invention,

图4是本发明的能够固定的探针,Fig. 4 is the fixed probe of the present invention,

图5是表示作为本发明的探针固定组件一个重要部分的薄膜与探针的结合状态的图,Fig. 5 is a diagram showing the bonded state of a thin film and a probe, which is an important part of the probe fixing assembly of the present invention,

图6是表示作为本发明一个重要部分的第一游动防止部的一个实施例的图。Fig. 6 is a diagram showing an example of a first wandering preventing portion which is an important part of the present invention.

符号说明Symbol Description

100-探针,110-第一水平部,120-垂直部,130-第二水平部,132-孔,140-插入凸起,142-第一插入凸起,142a-卡定突起,144-第二插入凸起,144a-弹性部,200-探针座,210-凸台,300-游动防止部,310-第一游动防止部,320-第二游动防止部,330-薄膜,330a-插入孔,332-第一薄膜,334-第二薄膜,400-探针主体。100-probe, 110-first horizontal part, 120-vertical part, 130-second horizontal part, 132-hole, 140-insertion protrusion, 142-first insertion protrusion, 142a-locking protrusion, 144- Second insertion protrusion, 144a—elastic part, 200—probe seat, 210—boss, 300—swimming preventing part, 310—first swimming preventing part, 320—second swimming preventing part, 330—film , 330a—insertion hole, 332—first membrane, 334—second membrane, 400—probe body.

具体实施方式detailed description

从与附图相关的以下详细说明和实施例,本发明的目的、特定优点及新特征将更加明确。需要注意的是,在本说明书中,在对各附图的构成要素赋予参照符号方面,限于相同的构成要素,即使显示于不同的附图上,也尽可能使得具有相同的编号。另外,第一、第二等术语可以用于说明多样的构成要素,但所述构成要素并非由所述术语限定。所述术语只用于把一个构成要素区别于其它构成要素的目的。另外,在说明本发明方面,当判断认为对相关公知技术的具体说明可能不必要地混淆本发明的要旨时,省略其详细说明。The purpose, specific advantages and new features of the present invention will be more apparent from the following detailed description and embodiments associated with the accompanying drawings. It should be noted that in this specification, the reference numerals given to the constituent elements of each drawing are limited to the same constituent elements, and even if they are shown in different drawings, the same reference numerals are used as much as possible. In addition, terms such as first and second may be used to describe various constituent elements, but the constituent elements are not limited by the terms. The terms are used only for the purpose of distinguishing one constituent element from other constituent elements. In addition, in describing the present invention, when it is judged that the detailed description of related known technologies may unnecessarily obscure the gist of the present invention, the detailed description will be omitted.

下面参照附图,详细说明本发明的实施例。Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

如图1至图3所示,本发明的探针固定组件包括探针座200及游动防止部300。As shown in FIGS. 1 to 3 , the probe fixing assembly of the present invention includes a probe base 200 and a movement prevention part 300 .

在探针座200上放置探针100。探针座200形成得使探针100容易放置、固定。作为一个示例,在其一侧面可以形成有凸台210,以便探针100能够插入,这种探针座200的形状只要是探针100可以放置、固定的结构,则可以多样地变更设计。The probe 100 is placed on the probe holder 200 . The probe holder 200 is formed so that the probe 100 can be easily placed and fixed. As an example, a boss 210 may be formed on one side thereof so that the probe 100 can be inserted. The shape of the probe holder 200 can be variously designed as long as the probe 100 can be placed and fixed.

游动防止部300发挥防止探针100从探针座200沿上下方向及左右方向游动的功能。因此,探针100在检查显示装置时即使施加力,由于固定于其位置而能够准确检查。The movement prevention part 300 functions to prevent the movement of the probe 100 from the probe holder 200 in the up-down direction and in the left-right direction. Therefore, even if a force is applied when inspecting the display device, the probe 100 can be accurately inspected because it is fixed at its position.

游动防止部300包括第一游动防止部310和第二游动防止部320。The wandering prevention part 300 includes a first wandering prevention part 310 and a second wandering prevention part 320 .

第一游动防止部310发挥防止探针100的左右方向的游动的功能。即,防止相互邻接的探针100的左右方向游动,从而能够防止在检查显示装置时探针间的短路,能够准确检查。The first wandering preventing portion 310 functions to prevent the probe 100 from wandering in the left-right direction. That is, by preventing the adjacent probes 100 from wandering in the left and right directions, it is possible to prevent a short circuit between the probes when inspecting the display device, and to enable accurate inspection.

第二游动防止部320发挥防止探针100的上下方向的游动的功能。即,如果探针100一端接触显示装置电路图案,则力施加于探针100,向上下方向游动,如果反复这种过程,则探针100变形,因而第二游动防止部320使探针100在垂直及水平方向固定,防止探针100向上下方向游动,进一步地,防止探针100的变形。The second movement prevention part 320 functions to prevent movement of the probe 100 in the vertical direction. That is, if one end of the probe 100 touches the circuit pattern of the display device, a force is applied to the probe 100 to swim up and down. If this process is repeated, the probe 100 is deformed, so the second movement prevention part 320 makes the probe 100 is fixed in the vertical and horizontal directions, preventing the probe 100 from moving up and down, and further preventing the probe 100 from being deformed.

本发明的探针固定组件还包括探针主体400,第二游动防止部320固定结合于这种探针主体400。放置于探针主体400的第二游动防止部320可以以螺丝、螺栓等各种连结手段固定结合。The probe fixing assembly of the present invention further includes a probe main body 400 , and the second anti-swimming part 320 is fixedly combined with the probe main body 400 . The second anti-swimming part 320 placed on the probe body 400 can be fixedly combined with various connecting means such as screws and bolts.

另一方面,如图3、图5及图6所示,在探针100的一侧形成有插入凸起140,第一游动防止部310包括形成有插入孔330a的薄膜330,以便插入凸起140能够插入。On the other hand, as shown in FIG. 3, FIG. 5 and FIG. 6, an insertion protrusion 140 is formed on one side of the probe 100, and the first wandering prevention part 310 includes a thin film 330 formed with an insertion hole 330a for inserting the protrusion. Up to 140 can be inserted.

如果探针100隔开既定间隔形成有多个,则在薄膜330上形成的插入孔330a也按与探针100对应的个数形成,优选插入孔330a形状以与插入凸起140形状对应的形状形成。If a plurality of probes 100 are formed at predetermined intervals, the number of insertion holes 330 a formed on the film 330 is also formed corresponding to the number of probes 100 , and the shape of the insertion holes 330 a is preferably a shape corresponding to the shape of the insertion protrusion 140 form.

如图3及图4所示,探针100可以包括第一水平部110、垂直部120、第二水平部130。As shown in FIGS. 3 and 4 , the probe 100 may include a first horizontal portion 110 , a vertical portion 120 , and a second horizontal portion 130 .

第一水平部110沿水平方向较长地形成而使得其一端能够接触显示装置电路图案,垂直部120在第一水平部110的另一端沿垂直方向延长形成,第二水平部130在垂直部120的另一端向与第一水平部110相反方向延长形成。The first horizontal portion 110 is formed long in the horizontal direction so that one end thereof can contact the circuit pattern of the display device, the vertical portion 120 is formed vertically at the other end of the first horizontal portion 110 , and the second horizontal portion 130 is formed at the vertical portion 120. The other end of the first horizontal portion 110 is extended and formed in a direction opposite to the first horizontal portion 110 .

第一水平部110的底面放置于所述探针座200上,垂直部120的一面放置于探针座200一侧面,第二水平部130底面放置于探针座200底面。概略性地,探针座200具有“L”形状的剖面,探针100与探针座200的形状相应,以能够放置的结构形成。The bottom of the first horizontal part 110 is placed on the probe base 200 , one side of the vertical part 120 is placed on a side of the probe base 200 , and the bottom of the second horizontal part 130 is placed on the bottom of the probe base 200 . Schematically, the probe holder 200 has an "L"-shaped cross section, and the probe 100 is formed in a structure that can be placed according to the shape of the probe holder 200 .

此时,在探针座200上也可以形成狭缝,当形成狭缝时,第一水平部110及第二水平部130插入于狭缝。At this time, a slit may be formed in the probe holder 200 , and when the slit is formed, the first horizontal portion 110 and the second horizontal portion 130 are inserted into the slit.

插入凸起140包括在垂直部120凸出形成的第一插入凸起142、在第二水平部130凸出形成的第二插入凸起144,薄膜330包括形成有插入孔330a以便第一插入凸起142能够插入的第一薄膜332、形成有插入孔330a以便第二插入凸起144能够插入的第二薄膜334。The insertion protrusion 140 includes a first insertion protrusion 142 protrudingly formed at the vertical portion 120, a second insertion protrusion 144 protrudingly formed at the second horizontal portion 130, and the film 330 includes an insertion hole 330a formed therein so that the first insertion protrusion The first film 332 into which the protrusion 142 can be inserted, and the second film 334 formed with an insertion hole 330a so that the second insertion protrusion 144 can be inserted.

为了防止第一薄膜332从第一插入凸起142分离,优选在第一插入凸起142上端凸出形成有卡定突起142a。另外,优选倾斜地形成第一插入凸起142与第二插入凸起144的两端,从而容易进行第一薄膜332与第一插入凸起142、及第二薄膜334与第二插入凸起144间的结合。In order to prevent the first film 332 from being separated from the first insertion protrusion 142 , preferably, a locking protrusion 142 a protrudes from the upper end of the first insertion protrusion 142 . In addition, it is preferable to form both ends of the first insertion protrusion 142 and the second insertion protrusion 144 obliquely, so that the first film 332 and the first insertion protrusion 142, and the second film 334 and the second insertion protrusion 144 are easily formed. combination between.

另外,第一插入凸起142及第二插入凸起144优选其上端平坦地形成,以便第二游动防止部320能够面接触,优选通过最大限度地确保宽阔的接触面积而利用第二游动防止部320的防止探针100的上下游动。更优选在第二插入凸起144形成弹性部144a,以便能够防止第二插入凸起144被第二游动防止部320过度地加压而受损。In addition, the upper ends of the first insertion protrusion 142 and the second insertion protrusion 144 are preferably formed flat so that the second movement prevention part 320 can be in surface contact, and it is preferable to utilize the second movement by ensuring a wide contact area as much as possible. The prevention part 320 prevents the probe 100 from moving up and down. More preferably, an elastic portion 144 a is formed on the second insertion protrusion 144 so that the second insertion protrusion 144 can be prevented from being damaged due to excessive pressure by the second movement preventing portion 320 .

第二游动防止部320在垂直及水平方向上固定结合于探针主体400,以便第一插入凸起142及第二插入凸起144能够坚固地面接触第二游动防止部320。The second anti-swimming part 320 is fixedly combined with the probe body 400 in the vertical and horizontal directions, so that the first insertion protrusion 142 and the second insertion protrusion 144 can firmly contact the second anti-swimming part 320 .

当利用探针100检查显示装置时,探针100的一端接触显示装置的电路图案,其另一端接触与检查控制装置连接的电路图案。多个探针100应无遗漏地接触电路图案,为了对接探针100的接触端子,优选探针100的第一水平部110及第二水平部130形成为能够弹性变形。特别是优选在第二水平部130形成开环形状的孔132,使弹性力实现最大化。When the display device is inspected using the probe 100, one end of the probe 100 contacts a circuit pattern of the display device, and the other end thereof contacts a circuit pattern connected to the inspection control device. The plurality of probes 100 should contact the circuit pattern without omission, and the first horizontal portion 110 and the second horizontal portion 130 of the probe 100 are preferably elastically deformable in order to abut the contact terminals of the probes 100 . In particular, it is preferable to form an open-loop hole 132 in the second horizontal portion 130 to maximize the elastic force.

本发明人为了比较本发明的效果,测量了未应用游动防止部300的以往技术与本发明的接触位置误差。计量了1号至100号探针的接触位置,将其误差值整理于下述表1中。In order to compare the effect of the present invention, the present inventors measured the contact position error between the prior art to which the anti-swimming part 300 is not applied and the present invention. The contact positions of probes No. 1 to No. 100 were measured, and the error values thereof are summarized in Table 1 below.

【表1】【Table 1】

如表1所示,测试结果,当未应用游动防止部300时,平均误差值为9.46μm,本发明的平均误差值为4.87μm。即,可知,根据本发明与以往技术相比,平均误差值减小为1/2水平。As shown in Table 1, the test results show that when the anti-swimming part 300 is not applied, the average error value is 9.46 μm, and the average error value of the present invention is 4.87 μm. That is, it can be seen that according to the present invention, the average error value is reduced to 1/2 level compared with the prior art.

以上通过具体实施例详细说明了本发明,这是为了具体说明本发明,并不限定于本发明的能够固定的探针及探针固定组件,可以由本发明所属技术领域的技术人员进行变形及改良,这是不言而喻的。The present invention has been described in detail above through specific embodiments. This is to illustrate the present invention in detail and is not limited to the fixable probe and probe fixing assembly of the present invention. It can be modified and improved by those skilled in the art of the present invention. , which is self-evident.

本发明的单纯变形乃至变更均属于本发明的领域,本发明的具体的保护范围将由权利要求书会更明确。The simple deformation and modification of the present invention belong to the field of the present invention, and the specific protection scope of the present invention will be more clearly defined by the claims.

Claims (18)

1.一种探针固定组件,其特征在于,包括:1. A probe fixing assembly, characterized in that, comprising: 探针座,其在一侧面放置凸出形成有插入凸起的探针;及a probe holder, which places a protruding probe formed with an insertion protrusion on one side; and 游动防止部,其包括防止所述探针从所述探针座向左右方向游动的第一游动防止部、防止所述探针从所述探针座向上下方向游动的第二游动防止部,The anti-swimming part includes a first anti-swimming part for preventing the probe from swimming in the left and right direction from the probe holder, and a second anti-swimming part for preventing the probe from moving in the vertical direction from the probe holder. swimming prevention department, 所述第一游动防止部包括形成有供所述插入凸起插入的插入孔的薄膜。The first movement prevention part includes a film formed with an insertion hole into which the insertion protrusion is inserted. 2.一种探针固定组件,其特征在于,包括:2. A probe fixing assembly, characterized in that, comprising: 探针座,其在一侧面放置凸出形成有插入凸起的探针;及a probe holder, which places a protruding probe formed with an insertion protrusion on one side; and 游动防止部,其包括防止所述探针从所述探针座向左右方向游动的第一游动防止部,a movement preventing part including a first movement preventing part preventing the probe from moving in the left and right direction from the probe holder, 所述第一游动防止部包括形成有供所述插入凸起插入的插入孔的薄膜。The first movement prevention part includes a film formed with an insertion hole into which the insertion protrusion is inserted. 3.根据权利要求1或2所述的探针固定组件,其特征在于,3. The probe fixing assembly according to claim 1 or 2, characterized in that, 隔着既定间隔设置多个所述探针,placing a plurality of the probes at predetermined intervals, 在所述薄膜隔着既定间隔形成有多个插入孔。A plurality of insertion holes are formed at predetermined intervals in the film. 4.根据权利要求3所述的探针固定组件,其特征在于,4. The probe fixation assembly of claim 3, wherein: 所述探针包括沿水平方向较长地形成而使得一端能够接触显示装置电路图案的第一水平部、在所述第一水平部的另一端沿垂直方向延长形成的垂直部、在所述垂直部的另一端向与所述第一水平部相反方向延长形成的第二水平部,The probe includes a first horizontal portion formed long in the horizontal direction such that one end can contact a circuit pattern of the display device, a vertical portion formed elongated in the vertical direction at the other end of the first horizontal portion, The other end of the portion is extended to form a second horizontal portion opposite to the first horizontal portion, 所述插入凸起包括在所述垂直部凸出形成的第一插入凸起、在第二水平部凸出形成的第二插入凸起。The insertion protrusion includes a first insertion protrusion formed protrudingly at the vertical portion, and a second insertion protrusion formed protrudingly at the second horizontal portion. 5.根据权利要求4所述的探针固定组件,其特征在于,5. The probe fixation assembly of claim 4, wherein: 所述第一插入凸起沿垂直方向较长地形成,所述第二插入凸起沿水平方向较长地形成,所述插入孔为矩形形状。The first insertion protrusion is formed to be long in a vertical direction, the second insertion protrusion is formed to be long in a horizontal direction, and the insertion hole has a rectangular shape. 6.根据权利要求4所述的探针固定组件,其特征在于,6. The probe fixation assembly of claim 4, wherein: 所述薄膜包括与所述垂直部对应的第一薄膜、与所述第二水平部对应的第二薄膜。The film includes a first film corresponding to the vertical portion, and a second film corresponding to the second horizontal portion. 7.根据权利要求6所述的探针固定组件,其特征在于,7. The probe fixation assembly of claim 6, wherein: 在所述第一插入凸起上端凸出形成有能够防止所述第一薄膜从所述第一插入凸起分离的卡定突起。A locking protrusion capable of preventing the first film from being separated from the first insertion protrusion protrudes from the upper end of the first insertion protrusion. 8.根据权利要求4所述的探针固定组件,其特征在于,8. The probe fixation assembly of claim 4, wherein: 所述第一水平部及第二水平部能够弹性变形。The first horizontal portion and the second horizontal portion are elastically deformable. 9.根据权利要求8所述的探针固定组件,其特征在于,9. The probe fixation assembly of claim 8, wherein: 在所述第二水平部形成有使所述第二水平部能够弹性变形的开环形状的孔。An open loop-shaped hole that enables elastic deformation of the second horizontal portion is formed in the second horizontal portion. 10.根据权利要求1或2所述的探针固定组件,其特征在于,10. The probe fixing assembly according to claim 1 or 2, characterized in that, 所述探针包括沿水平方向较长地形成而使得一端能够接触显示装置电路图案的第一水平部、在所述第一水平部的另一端沿垂直方向延长形成的垂直部、在所述垂直部的另一端向与所述第一水平部相反方向延长形成的第二水平部,The probe includes a first horizontal portion formed long in the horizontal direction such that one end can contact a circuit pattern of the display device, a vertical portion formed elongated in the vertical direction at the other end of the first horizontal portion, The other end of the portion is extended to form a second horizontal portion opposite to the first horizontal portion, 在所述垂直部及所述第二水平部,分别凸出形成有第一插入凸起及第二插入凸起,A first insertion protrusion and a second insertion protrusion protrude from the vertical portion and the second horizontal portion, respectively, 所述第二游动防止部同时与所述第一插入凸起及第二插入凸起的上端面接触而固定所述探针。The second anti-swimming portion simultaneously contacts the upper end surfaces of the first insertion protrusion and the second insertion protrusion to fix the probe. 11.根据权利要求10所述的探针固定组件,其特征在于,11. The probe fixation assembly of claim 10, wherein: 还包括探针主体,also includes the probe body, 所述第二游动防止部固定结合于所述探针主体。The second anti-swimming part is fixedly combined with the probe main body. 12.根据权利要求10所述的探针固定组件,其特征在于,12. The probe fixation assembly of claim 10, wherein: 所述第一插入凸起及第二插入凸起上端平坦地形成,以便所述第二游动防止部能够面接触。The upper ends of the first insertion protrusion and the second insertion protrusion are formed flat so that the second wandering preventing portion can be in surface contact. 13.根据权利要求12所述的探针固定组件,其特征在于,13. The probe fixation assembly of claim 12, wherein: 在所述第二插入凸起上,在与所述第二游动防止部面接触的部位形成有弹性部。An elastic portion is formed on the second insertion protrusion at a portion that is in surface contact with the second wandering preventing portion. 14.一种探针固定组件,其特征在于,包括:14. A probe fixing assembly, characterized in that, comprising: 探针,其包括沿水平方向较长地形成而使得一端能够接触显示装置电路图案的第一水平部、在所述第一水平部的另一端沿垂直方向延长形成的垂直部、在所述垂直部的另一端向与所述第一水平部相反方向延长形成的第二水平部、包括在所述垂直部凸出形成的第一插入凸起与在所述第二水平部凸出形成的第二插入凸起的插入凸起;The probe includes a first horizontal portion formed long in a horizontal direction so that one end can contact a circuit pattern of a display device, a vertical portion formed elongated in a vertical direction at the other end of the first horizontal portion, The other end of the part is extended to the second horizontal part opposite to the first horizontal part, including the first insertion protrusion formed protruding from the vertical part and the second protruding protruding formed on the second horizontal part. 2 inserting protrusions for inserting protrusions; 探针座,其用于放置所述探针;及a probe holder for placing the probe; and 游动防止部,其包括防止所述探针的上下方向游动的第二游动防止部。The anti-swimming part includes a second anti-swimming part that prevents the probe from moving in the vertical direction. 15.一种能够固定的探针,其特征在于,15. A probe capable of being fixed, characterized in that, 包括沿水平方向较长地形成而使得一端能够接触显示装置电路图案的第一水平部、在所述第一水平部的另一端沿垂直方向延长形成的垂直部、在所述垂直部的另一端向与所述第一水平部相反方向延长形成的第二水平部,It includes a first horizontal part formed long in the horizontal direction so that one end can contact the circuit pattern of the display device, a vertical part formed elongated in the vertical direction at the other end of the first horizontal part, and a vertical part formed at the other end of the vertical part a second horizontal portion formed by extending in a direction opposite to the first horizontal portion, 在所述垂直部及第二水平部分别凸出形成有第一插入凸起及第二插入凸起。A first insertion protrusion and a second insertion protrusion protrude from the vertical portion and the second horizontal portion, respectively. 16.根据权利要求15所述的能够固定的探针,其特征在于,16. The immobilizable probe according to claim 15, wherein: 所述第一插入凸起沿垂直方向较长地形成,所述第二插入凸起沿水平方向较长地形成,在所述第一插入凸起上端凸出形成有卡定突起。The first insertion protrusion is formed long in the vertical direction, the second insertion protrusion is formed long in the horizontal direction, and a locking protrusion protrudes from an upper end of the first insertion protrusion. 17.根据权利要求16所述的能够固定的探针,其特征在于,17. The immobilizable probe according to claim 16, wherein: 在所述第二插入凸起形成有弹性部。An elastic portion is formed on the second insertion protrusion. 18.根据权利要求17所述的能够固定的探针,其特征在于,18. The immobilizable probe according to claim 17, wherein: 在所述第二水平部形成有使所述第二水平部能够弹性变形的开环形状的孔。An open loop-shaped hole that enables elastic deformation of the second horizontal portion is formed in the second horizontal portion.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108834330A (en) * 2018-06-29 2018-11-16 惠州市金百泽电路科技有限公司 A kind of processing method of PCB " D " font abnormal shape pad
CN111141938A (en) * 2018-11-02 2020-05-12 旺矽科技股份有限公司 Probe module suitable for multiple units to be tested with inclined conductive contacts

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102098650B1 (en) * 2019-07-24 2020-04-10 주식회사 프로이천 Pin type probe apparatus
KR102241059B1 (en) * 2020-01-14 2021-04-16 (주)위드멤스 Probe block assembly
KR102241061B1 (en) * 2020-01-14 2021-04-16 (주)위드멤스 Probe block assembly
KR102121618B1 (en) 2020-02-06 2020-06-10 주식회사 프로이천 Integrated Type Probe Array Block
KR102121620B1 (en) 2020-02-11 2020-06-10 주식회사 프로이천 Integrated Type Probe Array Block
KR102225546B1 (en) 2020-11-13 2021-03-10 주식회사 프로이천 Probe Pin Block
CN115436675A (en) * 2021-06-04 2022-12-06 迪科特测试科技(苏州)有限公司 Test device and its probe assembly
KR102563643B1 (en) * 2021-06-10 2023-08-04 주식회사 프로이천 Pin board
KR102357377B1 (en) * 2021-09-06 2022-02-08 가온솔루션 주식회사 Probe pin and probe unit with them
KR102614928B1 (en) * 2021-11-24 2023-12-19 (주)티에스이 Probe card
US12044727B2 (en) 2022-09-19 2024-07-23 Orbotech Ltd. Probes for electrical testing in defect detection systems
KR102820679B1 (en) * 2023-05-04 2025-06-17 주식회사 프로이천 Probe card

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1407612A (en) * 2001-09-03 2003-04-02 木本军生 Detector device
KR100600700B1 (en) * 2005-07-29 2006-07-19 프롬써어티 주식회사 Probe device for flat panel display inspection
KR20060100563A (en) * 2005-03-17 2006-09-21 주식회사 코디에스 Probe block assembly for pattern inspection of flat panel display and assembly method thereof
CN101968501A (en) * 2009-07-27 2011-02-09 日本麦可罗尼克斯股份有限公司 Probe apparatus
CN102081110A (en) * 2009-11-26 2011-06-01 日本麦可罗尼克斯股份有限公司 Probe device
CN102368079A (en) * 2010-06-24 2012-03-07 日本麦可罗尼克斯股份有限公司 Probe assembly
CN102565470A (en) * 2010-12-03 2012-07-11 日本麦可罗尼克斯股份有限公司 Probe assembly

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08271579A (en) * 1995-03-30 1996-10-18 Fujitsu Ltd IC socket and IC test method using the same
US7230437B2 (en) * 2004-06-15 2007-06-12 Formfactor, Inc. Mechanically reconfigurable vertical tester interface for IC probing
JP4571517B2 (en) * 2004-10-19 2010-10-27 株式会社日本マイクロニクス Probe assembly
JP2007303826A (en) * 2006-05-08 2007-11-22 Tokyo Electron Ltd Probe
KR100781379B1 (en) * 2007-01-30 2007-11-30 안재일 Probe Device
CN101315391B (en) * 2007-05-28 2011-11-23 旺矽科技股份有限公司 Stretch Folding Probe
CN101329366B (en) * 2007-06-22 2011-03-30 旺矽科技股份有限公司 A method of manufacturing a probe short circuit prevention structure
JP5222038B2 (en) * 2008-06-20 2013-06-26 東京エレクトロン株式会社 Probe device
KR101049445B1 (en) * 2009-01-12 2011-07-15 주식회사 디엠엔티 Probe unit for display panel inspection
JP5690105B2 (en) * 2009-11-26 2015-03-25 株式会社日本マイクロニクス Probe device
KR101215375B1 (en) * 2011-11-25 2012-12-26 (주)기가레인 Contact film, method for generating the film, probe unit and lcd pannel tester
JP2014182976A (en) * 2013-03-21 2014-09-29 Enplas Corp Electric contact and socket for electric component

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1407612A (en) * 2001-09-03 2003-04-02 木本军生 Detector device
KR20060100563A (en) * 2005-03-17 2006-09-21 주식회사 코디에스 Probe block assembly for pattern inspection of flat panel display and assembly method thereof
KR100600700B1 (en) * 2005-07-29 2006-07-19 프롬써어티 주식회사 Probe device for flat panel display inspection
CN101968501A (en) * 2009-07-27 2011-02-09 日本麦可罗尼克斯股份有限公司 Probe apparatus
CN102081110A (en) * 2009-11-26 2011-06-01 日本麦可罗尼克斯股份有限公司 Probe device
CN102368079A (en) * 2010-06-24 2012-03-07 日本麦可罗尼克斯股份有限公司 Probe assembly
CN102565470A (en) * 2010-12-03 2012-07-11 日本麦可罗尼克斯股份有限公司 Probe assembly

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108834330A (en) * 2018-06-29 2018-11-16 惠州市金百泽电路科技有限公司 A kind of processing method of PCB " D " font abnormal shape pad
CN108834330B (en) * 2018-06-29 2021-07-20 惠州市金百泽电路科技有限公司 Processing method of PCB D-shaped special-shaped bonding pad
CN111141938A (en) * 2018-11-02 2020-05-12 旺矽科技股份有限公司 Probe module suitable for multiple units to be tested with inclined conductive contacts
CN111141938B (en) * 2018-11-02 2021-10-29 旺矽科技股份有限公司 Probe module for multiple units under test with inclined conductive contacts

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TW201716783A (en) 2017-05-16
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JP6055951B2 (en) 2016-12-27
CN110531124A (en) 2019-12-03

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