CN106153011A - Distance measuring system and distance measuring method - Google Patents
Distance measuring system and distance measuring method Download PDFInfo
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- CN106153011A CN106153011A CN201510190600.3A CN201510190600A CN106153011A CN 106153011 A CN106153011 A CN 106153011A CN 201510190600 A CN201510190600 A CN 201510190600A CN 106153011 A CN106153011 A CN 106153011A
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Abstract
Description
技术领域technical field
本发明有关于一种测距系统及测量距离的方法,且特别是能根据所撷取待测物图像而测量待测物距离的测距系统及测量距离的方法。The present invention relates to a distance measuring system and a distance measuring method, and in particular to a distance measuring system and a distance measuring method capable of measuring the distance of the object to be measured according to the captured image of the object to be measured.
背景技术Background technique
目前测量距离的方法有多种,一般可以透过声波(Sound Wave)、红外线(Infrared)、雷射(Laser)的应用,通过已知的声速、光速作为已知条件,测量声波或光波碰到待测物的往返时间即能够换算声波或光波所行走的距离。另外,也可以通过多个摆放于不同位置的图像传感器分别撷取同一待测物不同角度的图像,比对这些图像的相关性来定出图像上各点的相对位置以叠合这些图像,而后在已知这些图像传感器之间的间距与焦距长度的前提下,得以进一步判读出待测物的位置。At present, there are many methods for measuring distance, generally through the application of sound wave (Sound Wave), infrared (Infrared), laser (Laser), through the known speed of sound and speed of light as known conditions, to measure the impact of sound waves or light waves The round-trip time of the object under test can be converted into the distance traveled by sound waves or light waves. In addition, multiple image sensors placed in different positions can also capture images of the same object under different angles, and compare the correlation of these images to determine the relative position of each point on the image to superimpose these images. Then, on the premise of knowing the distance between these image sensors and the focal length, the position of the object under test can be further judged.
不过,在上述几种现有的方法中,透过声波或红外线等方式测量待测物的距离容易因为所发射的声波或红外线的波束发散而受到干扰,因此应用范围较具限制。另外,透过多个摆放于不同位置的图像传感器来测量待测物距离的方法,容易因为这些图像传感器之间的摆放位置关系复杂而产生误差,导致图像精度受到影响且测量的成本也较高。However, in the above-mentioned several existing methods, measuring the distance of the object under test through sound waves or infrared rays is likely to be interfered by the beam divergence of the emitted sound waves or infrared rays, so the application range is relatively limited. In addition, the method of measuring the distance of the object under test through multiple image sensors placed in different positions is prone to errors due to the complex positional relationship between these image sensors, which will affect the image accuracy and reduce the cost of measurement. higher.
发明内容Contents of the invention
本发明有关于一种测距系统及测量距离的方法,且特别是能根据所撷取图像的形变区域相对于未形变区域的形变量而测量待测物距离的测距系统及测量距离的方法。The present invention relates to a distance measuring system and a distance measuring method, and in particular to a distance measuring system and a distance measuring method capable of measuring the distance of an object to be measured according to the deformation amount of the deformed area of the captured image relative to the undeformed area .
本发明其中一实施例所提供的一种测距系统,测距系统包括发光组件、光学元件、图像传感器以及运算单元。发光组件提供光束至待测物。光学元件位于被待测物所反射的光束的传递路径上,其中该待测物所反射的光束适于通过该光学元件。图像传感器位于通过该光学元件的部份光束的传递路径上,图像传感器具有图像传感区以接收通过该光学元件的部份光束及接收未通过光学元件的部份光束,其中光学元件部分重叠图像传感区,图像传感器用于从待测物撷取待测物图像,待测物图像包括由图像传感区所接收通过光学元件的部分光束所产生的形变区域与图像传感区所接收未通过该光学元件的部分光束所产生的未形变区域。运算单元比较待测物图像的形变区域与未形变区域的差异,以获得待测物的距离变化量。One embodiment of the present invention provides a ranging system, the ranging system includes a light emitting component, an optical element, an image sensor and a computing unit. The light emitting component provides light beams to the object under test. The optical element is located on the transmission path of the light beam reflected by the object to be measured, wherein the light beam reflected by the object to be measured is suitable for passing through the optical element. The image sensor is located on the transmission path of the part of the light beam passing through the optical element, the image sensor has an image sensing area to receive the part of the light beam passing through the optical element and receive the part of the light beam not passing through the optical element, wherein the optical element partially overlaps the image In the sensing area, the image sensor is used to capture the image of the object under test from the object under test. The image of the object under test includes the deformation area generated by the part of the light beam received by the image sensing area and passed through the optical element and the unreceived image received by the image sensing area. The undistorted region created by the portion of the beam passing through the optical element. The computing unit compares the difference between the deformed area and the undeformed area of the image of the object to be measured to obtain the distance variation of the object to be measured.
本发明第一实施例提供一种测量距离的方法,当待测物位于第一位置时,撷取第一待测物图像,第一待测物图像包括第一形变区域以及第一未形变区域。计算第一形变区域以及第一未形变区域的形变量据以获得第一位置与测距系统之间的第一距离。The first embodiment of the present invention provides a method for measuring distance. When the object under test is located at the first position, a first image of the object under test is captured. The first image of the object under test includes a first deformed area and a first undeformed area. . Calculating deformation data of the first deformed area and the first undeformed area to obtain a first distance between the first position and the ranging system.
另外,本发明另一实施例提供另一种测量距离的方法,相对于第一实施例来说,当待测物由第一位置位移至第二位置时,运算单元能够计算待测物位于第二位置的差值图像所包括的形变区域及未形变区域之间的相对形变量,从而获得第二位置与测距系统之间的第二距离。运算单元将第二距离与第一距离相减以获得第一位置以及第二位置之间的间距。In addition, another embodiment of the present invention provides another method for measuring distance. Compared with the first embodiment, when the object under test is displaced from the first position to the second position, the calculation unit can calculate the position of the object under test at the second position. The relative deformation between the deformed area and the undeformed area included in the difference image of the two positions is used to obtain the second distance between the second position and the ranging system. The computing unit subtracts the second distance from the first distance to obtain the distance between the first position and the second position.
本发明有关于一种测距系统及测量距离的方法,且特别是能根据不同时间下所撷取图像的相对形变量而测量待测物的距离变化。The present invention relates to a distance measuring system and a method for measuring distance, and in particular can measure the distance change of the object to be measured according to the relative deformation of images captured at different times.
本发明其中一实施例所提供的一种测距系统,测距系统包括发光组件、光学元件、图像传感器以及运算单元。发光组件提供光束至待测物。光学元件位于被待测物所反射的光束的传递路径上,其中待测物所反射的光束适于通过该光学元件。图像传感器位于通过光学元件的部份光束的传递路径上,图像传感器具有图像传感区以接收通过光学元件的部份光束及接收未通过光学元件的部份光束,其中光学元件部分重叠图像传感区。图像传感器用于从待测物图像撷取一待测物图像,待测物图像包括由图像传感区所接收通过光学元件的部分光束所产生的形变区域与图像传感区所接收未通过光学元件的部分光束所产生的未形变区域。运算单元比较比较该待测物图像的形变区域与未形变区域的差异,以获得待测物的距离变化量。One embodiment of the present invention provides a ranging system, the ranging system includes a light emitting component, an optical element, an image sensor and a computing unit. The light emitting component provides light beams to the object under test. The optical element is located on the transmission path of the light beam reflected by the object to be measured, wherein the light beam reflected by the object to be measured is suitable for passing through the optical element. The image sensor is located on the transmission path of the partial light beam passing through the optical element, and the image sensor has an image sensing area to receive the partial light beam passing through the optical element and receive the partial light beam not passing through the optical element, wherein the optical element partially overlaps the image sensor Area. The image sensor is used to capture an image of the object to be tested from the image of the object to be tested. The image of the object to be tested includes the deformed area generated by the part of the light beam received by the image sensing area and passed through the optical element The undistorted area created by a component's partial beam of light. The computing unit compares the difference between the deformed area and the non-deformed area of the image of the object to be tested to obtain the distance variation of the object to be tested.
本发明另一实施例所提供的一种测距系统,测距系统包括发光组件、光学元件、图像传感器以及运算单元。发光组件提供光束至待测物。光学元件位于被待测物所反射的光束的传递路径上,其中待测物所反射的光束适于通过光学元件。图像传感器位于通过光学元件的光束的传递路径上,图像传感器具有图像传感区以接收通过光学元件的光束。运算单元比较不同时间下图像传感区所接收通过该光学元件的光束所产生的第一待测物图像与第二待测物图像的形变差异度,以获得待测物的距离变化量。Another embodiment of the present invention provides a ranging system. The ranging system includes a light-emitting component, an optical element, an image sensor, and a computing unit. The light emitting component provides light beams to the object under test. The optical element is located on the transmission path of the light beam reflected by the object to be measured, wherein the light beam reflected by the object to be measured is suitable for passing through the optical element. The image sensor is located on the transmission path of the light beam passing through the optical element, and the image sensor has an image sensing area to receive the light beam passing through the optical element. The calculation unit compares the deformation difference between the first image of the object under test and the image of the second object under test generated by the light beam received by the image sensing area and passes through the optical element at different times, so as to obtain the distance variation of the object under test.
本发明第二实施例提供一种测量距离的方法,当一待测物位于第一位置时,撷取第一待测物图像,第一待测物图像包括第一形变区域以及第一未形变区域。计算第一形变区域以及第一未形变区域的形变量据以获得第一位置与测距系统之间的第一距离。The second embodiment of the present invention provides a method for measuring distance. When an object under test is located at a first position, a first image of the object under test is captured. The first image of the object under test includes a first deformed area and a first undeformed area. area. Calculating deformation data of the first deformed area and the first undeformed area to obtain a first distance between the first position and the ranging system.
本发明第二实施例提供一种测量距离的方法,当一待测物位于第一位置时,撷取第一待测物图像。当待测物位于第二位置时,撷取第二待测物图像。计算第一待测物图像以及第二待测物图像的形变差异度据以获得第一位置及第二位置之间的间距。The second embodiment of the present invention provides a method for measuring distance. When an object under test is located at a first position, a first image of the object under test is captured. When the object to be tested is located at the second position, a second image of the object to be tested is captured. The deformation difference data of the first object image and the second object image are calculated to obtain the distance between the first position and the second position.
综上所述,本发明第一实施例提供一种测距系统,其包括发光组件、光学元件、图像传感器以及运算单元。光学元件部分重叠图像传感器的图像传感区,而图像传感区得以接收来自待测物所反射且穿透光学元件的光束以及未穿透光学元件的光束。因此,图像传感器所拍摄的待测物的亮图像及暗图像以及图像传感器根据亮图像及暗图像所处理的差值图像皆包括对应光学元件所部分重叠的图像传感区的形变区域及对应光学元件所未重叠的图像传感区的未形变区域。To sum up, the first embodiment of the present invention provides a ranging system, which includes a light-emitting component, an optical element, an image sensor, and a computing unit. The optical element partially overlaps the image sensing area of the image sensor, and the image sensing area can receive the light beam reflected from the object to be measured and pass through the optical element and the light beam not passing through the optical element. Therefore, the bright image and dark image of the object under test captured by the image sensor and the difference image processed by the image sensor according to the bright image and the dark image all include the deformed area of the image sensing area partially overlapped by the corresponding optical element and the corresponding optical element. The undeformed area of the image sensing area where elements do not overlap.
本发明第一实施例提供一种测量距离的方法,由于光学元件仅部分地重叠图像传感区,图像传感器所拍摄的待测物的亮图像以及暗图像包括对应光学元件所部分重叠的图像传感区的形变区域及对应光学元件所未重叠的图像传感区的未形变区域。运算单元可以计算第一差值图像的第一形变区域相对于第一未形变区域的形变量,从而得以获得待测物与测距系统之间的第一距离。The first embodiment of the present invention provides a method for measuring distance. Since the optical element only partially overlaps the image sensing area, the bright image and the dark image of the object to be measured captured by the image sensor include the partially overlapped image sensing area of the corresponding optical element. The deformed area of the sensing area and the non-deformed area of the image sensing area corresponding to the non-overlapped optical elements. The computing unit can calculate the deformation amount of the first deformed area of the first difference image relative to the first undeformed area, so as to obtain the first distance between the object under test and the ranging system.
另外,本发明另一实施例更提供另一种测量距离的方法,相对于第一实施例来说,当待测物由第一位置位移至第二位置时,运算单元能够计算待测物位于第二位置的差值图像所包括的形变区域及未形变区域之间的相对形变量,从而获得第二位置与测距系统之间的第二距离。运算单元将第二距离与第一距离相减以获得第一位置以及第二位置之间的间距。In addition, another embodiment of the present invention provides another method for measuring distance. Compared with the first embodiment, when the object to be tested is displaced from the first position to the second position, the calculation unit can calculate the position of the object to be measured. The relative deformation between the deformed area and the undeformed area included in the difference image of the second position is used to obtain a second distance between the second position and the ranging system. The computing unit subtracts the second distance from the first distance to obtain the distance between the first position and the second position.
此外,本发明第二实施例提供一种测距系统,光学元件全面地重叠图像传感器的图像传感区,而图像传感区得以接收来自待测物所反射且穿透光学元件的光束。因此,图像传感器在不同时间或是不同位置所拍摄的待测物的图像皆对应光学元件所全面地重叠的图像传感区而产生形变。In addition, the second embodiment of the present invention provides a ranging system, the optical element completely overlaps the image sensing area of the image sensor, and the image sensing area can receive the light beam reflected from the object under test and passing through the optical element. Therefore, the images of the object under test captured by the image sensor at different times or at different positions are all deformed corresponding to the fully overlapping image sensing area of the optical element.
本发明第二实施例提供一种测量距离的方法,透过运算单元比较在不同时间或是不同位置下图像传感区所接收通过光学元件的光束所产生的第一待测物图像与第二待测物图像的形变差异度,来获得待测物移动的距离。The second embodiment of the present invention provides a method for measuring distance. Through the computing unit, the first image of the object to be measured and the second image of the object to be measured, which are generated by the light beams received by the image sensing area and passed through the optical element, are compared at different times or at different positions. The deformation difference of the image of the object under test is used to obtain the moving distance of the object under test.
据此,本发明不会如同现有声波或红外线等测量法般容易受到应用上的限制,也不会因为现有方法因多个图像传感器之间的摆放位置关系复杂而导致图像精度受到影响。相较现有技术而言,测距系统仅需透过一个图像传感器即能以获得图像传感器和待测物的间距,不仅测量的成本较低且应用范围较不会受到限制。Accordingly, the present invention will not be subject to application restrictions like existing measurement methods such as sound waves or infrared rays, nor will the image accuracy be affected by the existing methods due to the complex placement relationship between multiple image sensors . Compared with the prior art, the ranging system only needs to use an image sensor to obtain the distance between the image sensor and the object to be measured. Not only the cost of measurement is lower, but also the application range is not limited.
为使能更进一步了解本发明的特征及技术内容,请参阅以下有关本发明的详细说明与附图,然而所附附图仅提供参考与说明用,并非用来对本发明加以限制者。In order to further understand the features and technical contents of the present invention, please refer to the following detailed description and accompanying drawings of the present invention. However, the accompanying drawings are provided for reference and illustration only, and are not intended to limit the present invention.
附图说明Description of drawings
图1A是本发明第一实施例的测距系统的架构示意图。FIG. 1A is a schematic diagram of the architecture of the ranging system according to the first embodiment of the present invention.
图1B是本发明第一实施例的测距系统的功能方块图。FIG. 1B is a functional block diagram of the ranging system according to the first embodiment of the present invention.
图1C是本发明第一实施例提供的测量距离方法的流程示意图。Fig. 1C is a schematic flow chart of the method for measuring distance provided by the first embodiment of the present invention.
图1D是本发明第一实施例提供的图像传感器所撷取的待测物图像示意图。FIG. 1D is a schematic diagram of an image of the object under test captured by the image sensor provided by the first embodiment of the present invention.
图2A是本发明另一实施例的测距系统的架构示意图。FIG. 2A is a schematic structural diagram of a ranging system according to another embodiment of the present invention.
图2B是本发明另一实施例提供的测量距离方法的流程示意图。Fig. 2B is a schematic flowchart of a method for measuring distance provided by another embodiment of the present invention.
图2C是本发明另一实施例提供的图像传感器所撷取的待测物图像示意图。FIG. 2C is a schematic diagram of an image of an object under test captured by an image sensor provided by another embodiment of the present invention.
图3A是本发明第二实施例的测距系统的架构示意图。FIG. 3A is a schematic structural diagram of a distance measuring system according to a second embodiment of the present invention.
图3B是本发明第二实施例提供的测量距离方法的流程示意图。Fig. 3B is a schematic flowchart of a method for measuring distance provided by the second embodiment of the present invention.
图3C是本发明第二实施例提供的图像传感器所撷取的待测物图像示意图。FIG. 3C is a schematic diagram of an image of the object under test captured by the image sensor provided by the second embodiment of the present invention.
【符号说明】【Symbol Description】
100、200 测距系统100, 200 distance measuring system
110 发光组件110 Lighting components
120、220 光学元件120, 220 optics
130、230 图像传感器130, 230 image sensor
132 感光元件132 photosensitive element
134 控制单元134 control unit
136 图像处理单元136 image processing unit
140、240 运算单元140, 240 computing units
150A 第一形变区域150A First deformation zone
150B 第一未形变区域150B First undeformed region
150A’ 第二形变区域150A’ second deformation zone
150B’ 第二未形变区域150B’ second undeformed region
B1、B1’ 背景物B1, B1’ background objects
E1 第一位置E1 first position
E2 第二位置E2 second position
H1 第一距离H1 first distance
H2 第二距离H2 second distance
H3 间距H3 spacing
L1、L1a、L1b 光束L1, L1a, L1b beams
M1 图像传感区M1 image sensing area
S1、S1’ 待测物S1, S1' DUT
P1a 第一亮图像P1a first bright image
P1’a 第二亮图像P1’a second brightest image
P1b 第一暗图像P1b first dark image
P1’b 第二暗图像P1’b second dark image
P1c 第一差值图像P1c first difference image
P1’c 第二差值图像P1'c second difference image
P2a 第一亮图像P2a first bright image
P2’a 第一亮图像P2’a first bright image
P2b 第一暗图像P2b first dark image
P2’b 第二暗图像P2’b second dark image
P2c 第一差值图像P2c first difference image
P2’c 第二差值图像P2'c second difference image
S101~S106 步骤S101~S106 steps
S201~S213 步骤Steps from S201 to S213
S301~S311 步骤Steps S301~S311
具体实施方式detailed description
在随附附图中展示一些例示性实施例,而在下文将参阅随附附图以更充分地描述各种例示性实施例。值得说明的是,本发明概念可能以许多不同形式来体现,且不应解释为限于本文中所阐述的例示性实施例。确切而言,提供此等例示性实施例使得本发明将为详尽且完整,且将向熟习此项技术者充分传达本发明概念的范畴。在每一附图中,为了使得所绘示的各层及各区域能够清楚明确,而可夸示其相对大小的比例,而且类似数字始终指示类似元件。Some exemplary embodiments are shown in the accompanying drawings, and various exemplary embodiments will be described more fully hereinafter with reference to the accompanying drawings. It should be noted that the inventive concept may be embodied in many different forms and should not be construed as limited to the illustrative embodiments set forth herein. Rather, these exemplary embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the inventive concept to those skilled in the art. In each of the drawings, the relative size ratios may be exaggerated for clarity of depicted layers and regions, and like numerals indicate like elements throughout.
图1A是本发明第一实施例的测距系统的架构示意图,图1B是本发明第一实施例的测距系统的功能方块图。请参阅图1A与图1B,测距系统100包括发光组件110、光学元件120、图像传感器130以及运算单元140。发光组件110提供光束L1至待测物S1。光学元件120配置于图像传感器130上并部分重叠图像传感器130,如此一来,图像传感器130所拍摄的待测物图像便会具有对应光学元件120所重叠的形变区域及对应光学元件120所未重叠的未形变区域。运算单元140透过分析图像传感器130所拍摄的待测物图像的灰度值以取得形变区域及未形变区域的形变量,借此以获得待测物S1的距离变化量。FIG. 1A is a schematic structural diagram of a ranging system according to the first embodiment of the present invention, and FIG. 1B is a functional block diagram of the ranging system according to the first embodiment of the present invention. Referring to FIG. 1A and FIG. 1B , the ranging system 100 includes a light emitting component 110 , an optical element 120 , an image sensor 130 and a computing unit 140 . The light emitting component 110 provides the light beam L1 to the object under test S1. The optical element 120 is disposed on the image sensor 130 and partially overlaps the image sensor 130, so that the image of the object under test captured by the image sensor 130 will have the deformed area corresponding to the overlapping of the optical element 120 and the non-overlapping area of the corresponding optical element 120. the undeformed region. The calculation unit 140 obtains the deformation amount of the deformed area and the undeformed area by analyzing the gray value of the image of the object under test captured by the image sensor 130 , so as to obtain the distance variation of the object under test S1 .
发光组件110能够提供光束L1至待测物S1,其中待测物S1适于反射部分光束L1a、L1b。此外,发光组件110适于透过交错地提供光束L1以及未提供光束L1对待测物S1进行照明,以使图像传感器130能分别撷取亮图像(有打光)以及暗图像(未打光),便于在后续运算分析中获得待测物S1的外观特征。于实务上,发光组件110可以是发光二极体(Light Emitting Diode,LED)、氙气闪光灯(High intensity Discharge Lamp)或者是卤素灯泡(Halogen Lamp)等。需要说明的是,图1A是绘示发光组件110整合于图像传感器130之中,于其他实施例中,发光组件110可独立于图像传感器130之外,图1A仅是用以说明,但不限于此。The light emitting component 110 is capable of providing a light beam L1 to the object under test S1, wherein the object under test S1 is suitable for reflecting part of the light beams L1a, L1b. In addition, the light-emitting component 110 is suitable for illuminating the object S1 by alternately providing the light beam L1 and not providing the light beam L1, so that the image sensor 130 can capture bright images (with light) and dark images (without light) respectively. , it is convenient to obtain the appearance characteristics of the object under test S1 in the subsequent calculation and analysis. In practice, the light emitting component 110 may be a light emitting diode (Light Emitting Diode, LED), a xenon flash lamp (High intensity Discharge Lamp) or a halogen bulb (Halogen Lamp) and the like. It should be noted that FIG. 1A shows that the light-emitting component 110 is integrated in the image sensor 130. In other embodiments, the light-emitting component 110 can be independent of the image sensor 130. FIG. 1A is only for illustration, but not limited to this.
光学元件120位于被待测物S1所反射的光束L1a、L1b的传递路径上,而且被待测物S1所反射的光束L1b适于通过光学元件120。待测物S1可以透过光学元件120而成像,其成像会视光学元件120的特性以及待测物S1与测距系统100的距离(第一距离H1)而产生形状变化,例如是缩放、倾斜、扭曲、旋转或错位等。于实务上,光学元件120的种类可以是透镜、棱镜、平面镜等,而光学元件120的材料可以是玻璃、塑胶等可使光束L1b通过的材料。The optical element 120 is located on the transmission path of the light beams L1a, L1b reflected by the object S1 to be tested, and the light beam L1b reflected by the object S1 is adapted to pass through the optical element 120 . The object to be measured S1 can be imaged through the optical element 120, and the imaging will have a shape change depending on the characteristics of the optical element 120 and the distance between the object to be measured S1 and the distance measuring system 100 (the first distance H1), such as zooming and tilting , distortion, rotation or misalignment, etc. In practice, the type of the optical element 120 may be a lens, a prism, a plane mirror, etc., and the material of the optical element 120 may be glass, plastic, or other materials that allow the light beam L1b to pass through.
图像传感器130具有图像传感区M1且图像传感器130包括感光元件132、控制单元134及图像处理单元136。感光元件132位于图像传感区M1内且用以感应光束L1a、L1b以撷取待测物S1图像,所撷取的图像能显示出待测物S1以及位于成像范围内的背景物等。控制单元134用于控制发光组件110提供光束L1与否,也就是说,控制单元134控制发光组件110提供光束L1照明待测物S1以及未提供光束L1照明待测物S1。图像处理单元136则是用来将分别撷取到的待测物S1的亮图像及暗图像进行图像处理,以获得待测物S1的外观特征。在本实施例中,控制单元134与图像处理单元136可以是透过将算法整合于电路之中,而与感光元件形成一单片,又或是另外独立的硬件元件进行控制与计算,此为本发明所欲涵盖的范围。The image sensor 130 has an image sensing region M1 and the image sensor 130 includes a photosensitive element 132 , a control unit 134 and an image processing unit 136 . The photosensitive element 132 is located in the image sensing area M1 and is used to sense the light beams L1a, L1b to capture an image of the object under test S1. The captured image can display the object under test S1 and the background objects within the imaging range. The control unit 134 is used to control whether the light emitting assembly 110 provides the light beam L1 or not, that is, the control unit 134 controls the light emitting assembly 110 to provide the light beam L1 to illuminate the object S1 under test or not to provide the light beam L1 to illuminate the object S1 under test. The image processing unit 136 is used to perform image processing on the captured bright image and dark image of the object S1 to obtain the appearance characteristics of the object S1 . In this embodiment, the control unit 134 and the image processing unit 136 can form a single chip with the photosensitive element by integrating the algorithm into the circuit, or they can be controlled and calculated by other independent hardware components, which is The scope that the present invention intends to cover.
具体而言,图像传感器130位于未通过光学元件120的光束L1a及通过光学元件120的光束L1b的传递路径上,光学元件120部分重叠图像传感区M1,而图像传感区M1得以接收来自待测物S1所反射且穿透光学元件120的光束L1b以及未穿透光学元件120的光束L1a,因此,图像传感器130所拍摄的图像便会包含两个区域,一个区域定义为光束L1b通过光学元件120而成像于图像传感器130上所产生的图像形变区域,另一个区域定义则为光束L1a未通过光学元件120而成像于图像传感器130上所产生的图像未形变区域。Specifically, the image sensor 130 is located on the transmission path of the light beam L1a not passing through the optical element 120 and the light beam L1b passing through the optical element 120, the optical element 120 partially overlaps the image sensing area M1, and the image sensing area M1 can receive the The light beam L1b reflected by the object S1 and transmitted through the optical element 120 and the light beam L1a that does not pass through the optical element 120, therefore, the image captured by the image sensor 130 will include two areas, one area is defined as the light beam L1b passing through the optical element 120 and imaged on the image sensor 130 as an image deformed area, another area is defined as an image undistorted area generated by the light beam L1a not passing through the optical element 120 but being imaged on the image sensor 130 .
在本实施例中,上述的运算单元140可以是数字信号处理器(DigitalSignal Processor,DSP)或者是中央处理器(Central Processing Unit,CPU),其中运算单元140可以根据图像传感器130所拍摄的待测物图像进行处理,例如是根据上述所提及的图像形变区域与图像未形变区域的形变变化量,来计算出待测物S1的距离变化量。In this embodiment, the above-mentioned computing unit 140 may be a digital signal processor (Digital Signal Processor, DSP) or a central processing unit (Central Processing Unit, CPU). The image of the object is processed, for example, the distance change of the object under test S1 is calculated according to the above-mentioned deformation change of the deformed area of the image and the undistorted area of the image.
于实务上,图像传感器130可以是一种具有摄像镜头的图像传感装置,其可装设于相机、智能型手机或是电脑等电子装置上,而感光元件132可以是互补式金属氧化物半导体传感元件(ComplementaryMetal-Oxide-Semiconductor Sensor,CMOS sensor)或电荷耦合元件(Charge-Coupled Device,CCD)。光学元件120可以装设于摄像镜头上且部分遮蔽所述摄像镜头,从而光学元件120得以部分重叠图像传感区M1。In practice, the image sensor 130 can be an image sensing device with a camera lens, which can be installed on an electronic device such as a camera, a smart phone, or a computer, and the photosensitive element 132 can be a CMOS Sensing element (Complementary Metal-Oxide-Semiconductor Sensor, CMOS sensor) or charge-coupled device (Charge-Coupled Device, CCD). The optical element 120 can be installed on the camera lens and partially shield the camera lens, so that the optical element 120 can partially overlap the image sensing area M1.
图1C是本发明第一实施例提供的测量距离方法的流程示意图。图1D是本发明第一实施例提供的图像传感器所撷取的待测物图像示意图。透过本发明第一实施例提供的测量距离方法,可以测量待测物S1与测距系统100之间的第一距离H1,亦即第一位置E1与测距系统100之间的间距。请参阅图1C及图1D,以及配合参阅图1A及图1B。Fig. 1C is a schematic flow chart of the method for measuring distance provided by the first embodiment of the present invention. FIG. 1D is a schematic diagram of an image of the object under test captured by the image sensor provided by the first embodiment of the present invention. Through the distance measuring method provided by the first embodiment of the present invention, the first distance H1 between the object under test S1 and the distance measuring system 100 can be measured, that is, the distance between the first position E1 and the distance measuring system 100 . Please refer to FIG. 1C and FIG. 1D , and refer to FIG. 1A and FIG. 1B together.
执行步骤S101,当待测物S1位于第一位置E1时,待测物S1与测距系统100之间的间距为第一距离H1,控制单元134控制发光组件110提供光束L1至待测物S1,而待测物S1反射部分光束L1a、L1b。Step S101 is executed, when the object S1 is located at the first position E1, the distance between the object S1 and the ranging system 100 is the first distance H1, and the control unit 134 controls the light-emitting component 110 to provide a light beam L1 to the object S1 , and the object S1 reflects part of the light beams L1a, L1b.
接着,执行步骤S102,当控制单元134控制发光组件110提供光束L1至待测物S1时,图像传感器130撷取第一亮图像P1a。如图1D(a)所绘示,第一亮图像P1a显示出待测物S1的图像以及位于成像范围内的背景物B1,第一亮图像P1a包括形变区域及未形变区域,其中形变区域对应光学元件120所部分重叠的图像传感区M1及未形变区域对应光学元件120所未重叠的图像传感区M1。第一亮图像P1a可以是灰阶图像(gray-scale image),适于分析识别。以8位元256色灰度值为例,灰度值由纯黑至灰最后到纯白的变化被量化为256个颜色,而灰度值的范围为0至255。Next, step S102 is executed, when the control unit 134 controls the light emitting component 110 to provide the light beam L1 to the object under test S1, the image sensor 130 captures the first bright image P1a. As shown in Figure 1D(a), the first bright image P1a shows the image of the object under test S1 and the background object B1 within the imaging range. The first bright image P1a includes a deformed area and an undeformed area, wherein the deformed area corresponds to The image sensing area M1 partially overlapped by the optical element 120 and the non-deformed area correspond to the image sensing area M1 not overlapped by the optical element 120 . The first bright image P1a may be a gray-scale image, which is suitable for analysis and identification. Taking the 8-bit 256-color gray value as an example, the change of the gray value from pure black to gray and finally to pure white is quantized into 256 colors, and the gray value ranges from 0 to 255.
值得说明的是,在未形变区域内所显示的待测物S1的图像以及背景物B1的图像为未透过光学元件120而成像的正常显示的图像,其所显示出待测物S1的图像形状大小与测距系统100之间的第一距离H1成比例。在形变区域内所显示的图像为透过光学元件120而成像的变形图像,而形变的特性取决于光学元件120的种类以及材质等。举例来说,在本实施例中,形变区域的图像相对于未形变区域内所显示的图像是呈现放大的形变形式。It is worth noting that the image of the object under test S1 and the image of the background object B1 displayed in the undeformed area are normally displayed images that are not imaged through the optical element 120, and the image of the object under test S1 displayed The size of the shape is proportional to the first distance H1 between the ranging systems 100 . The image displayed in the deformed area is a deformed image formed through the optical element 120 , and the characteristics of the deformation depend on the type and material of the optical element 120 . For example, in this embodiment, the image in the deformed area is in an enlarged deformed form relative to the image displayed in the undeformed area.
接着,执行步骤S103,当控制单元134控制发光组件110未提供光束L1至待测物S1时,图像传感器120撷取第一暗图像P1b。如图1D(b)所绘示,在未提供光束L1来照亮待测物S1时,第一暗图像P1b未显示出待测物S1的图像,若背景物B1为主动发光物件时,第一暗图像P1b则能够显示出背景物B1。其中,第一暗图像P1b亦包括形变区域及未形变区域,同样地,第一暗图像P1b亦可以是灰阶图像(gray-scale image)。Next, step S103 is executed, when the control unit 134 controls the light emitting component 110 to not provide the light beam L1 to the object under test S1, the image sensor 120 captures the first dark image P1b. As shown in FIG. 1D(b), when the light beam L1 is not provided to illuminate the object under test S1, the first dark image P1b does not show the image of the object under test S1. If the background object B1 is an active light-emitting object, the first dark image P1b A dark image P1b can show the background object B1. Wherein, the first dark image P1b also includes a deformed area and an undeformed area, and similarly, the first dark image P1b may also be a gray-scale image.
接着,执行步骤S104,分析第一亮图像P1a以及第一暗图像P1b的灰度值。详细而言,运算单元140分别分析第一亮图像P1a以及第一暗图像P1b的灰度值分布,可以得知在第一亮图像P1a以及第一暗图像P1b之中具有不同灰度值的像素所分布的位置、形状以及范围。Next, step S104 is executed to analyze the grayscale values of the first bright image P1a and the first dark image P1b. In detail, the calculation unit 140 respectively analyzes the gray value distributions of the first bright image P1a and the first dark image P1b, and it can be known that the pixels with different gray values in the first bright image P1a and the first dark image P1b The location, shape and extent of the distribution.
接着,执行步骤S105,对第一亮图像P1a以及第一暗图像P1b执行图像相减(Image Subtraction)。具体来说,将第一亮图像P1a以及第一暗图像P1b相对应位置的像素的灰度值相减,将会得到的此两幅图像的第一差值图像P1c,而第一差值图像P1c的差异灰度值将介于-255至255之间。如图1D(c)所绘示,透过图像相减的步骤,可以将第一亮图像P1a以及第一暗图像P1b的背景物B1的图像滤除,从而所获得的第一差值图像P1c得以显示出待测物S1的图像。同样地,第一差值图像P1c所包括的第一形变区域150A及第一未形变区域150B都是对应第一亮图像P1a以及第一暗图像P1b的形变区域及未形变区域。依此,第一形变区域150A对应光学元件120所部分重叠的图像传感区M1,而第一未形变区域150B则对应光学元件120所未重叠的图像传感区M1。Next, step S105 is executed to perform image subtraction (Image Subtraction) on the first bright image P1a and the first dark image P1b. Specifically, by subtracting the gray values of the pixels corresponding to the first bright image P1a and the first dark image P1b, the first difference image P1c of the two images will be obtained, and the first difference image The difference grayscale value for P1c will be between -255 and 255. As shown in FIG. 1D(c), through the step of image subtraction, the image of the background object B1 of the first bright image P1a and the first dark image P1b can be filtered out, so that the obtained first difference image P1c An image of the object under test S1 can be displayed. Likewise, the first deformed area 150A and the first undeformed area 150B included in the first difference image P1c are both deformed areas and undeformed areas corresponding to the first bright image P1a and the first dark image P1b. Accordingly, the first deformed region 150A corresponds to the image sensing region M1 partially overlapped by the optical element 120 , and the first undeformed region 150B corresponds to the image sensing region M1 not overlapped by the optical element 120 .
执行步骤S106,计算第一形变区域150A相对于第一未形变区域150B的形变量,以获得待测物S1的距离变化量。详细而言,在第一形变区域150A的待测物S1图像形变形式可以是相对于第一未形变区域150B而缩放、倾斜、扭曲、旋转或错位等多种形式,而这些形变的形式是视光学元件120的特性以及第一距离H1等因素所产生的形状变化,其中本实施例以缩放作为实施方式,如图1D(c)所绘示,但不限于此。测距系统100可以还包括一内建数据资料库,内建数据资料库储存有多种不同的形变形式(例如是,缩放、倾斜、扭曲、旋转或错位等)以及这些不同的形变形式所对应的第一距离H1的数值。透过比对内建数据资料库,运算单元140能够根据不同的形变形式所产生的形状变化而对应获得待测物S1与测距系统100之间的第一距离H1。Step S106 is executed to calculate the deformation amount of the first deformed area 150A relative to the first undeformed area 150B, so as to obtain the distance change amount of the object under test S1. In detail, the deformation form of the image of the object under test S1 in the first deformed region 150A can be in various forms such as scaling, tilting, twisting, rotating or dislocation relative to the first undeformed region 150B, and these deformation forms are visually The shape changes caused by the characteristics of the optical element 120 and factors such as the first distance H1 , wherein this embodiment takes zooming as an implementation, as shown in FIG. 1D(c), but is not limited thereto. The ranging system 100 may further include a built-in data database, which stores a variety of different deformation forms (for example, scaling, tilting, twisting, rotation, or misalignment, etc.) and the corresponding The value of the first distance H1. By comparing the built-in data database, the computing unit 140 can correspondingly obtain the first distance H1 between the object under test S1 and the ranging system 100 according to the shape changes produced by different deformation forms.
基于上述,透过本发明一实施例的测量距离方法,由于光学元件120仅部分地重叠图像传感区M1,图像传感器130所拍摄的待测物S1的亮图像以及暗图像包括对应光学元件120所部分重叠的图像传感区M1的形变区域及对应光学元件120所未重叠的图像传感区M1的未形变区域。运算单元140可以计算第一差值图像P1c的第一形变区域150A相对于第一未形变区域150B的形变量,从而得以获得待测物S1与测距系统100之间的第一距离H1。据此,本发明不会如同现有声波或红外线等测量法般容易受到应用上的限制,也不会因为现有方法因多个图像传感器之间的摆放位置关系复杂而导致图像精度受到影响。相较现有技术而言,测距系统100仅需透过一个图像传感器130即能以获得图像传感器130和待测物S1的间距,不仅测量的成本较低且应用范围较不会受到限制。Based on the above, through the distance measuring method according to an embodiment of the present invention, since the optical element 120 only partially overlaps the image sensing area M1, the bright image and the dark image of the object under test S1 captured by the image sensor 130 include the corresponding optical element 120 The partially overlapped deformed area of the image sensing area M1 corresponds to the non-deformed area of the image sensing area M1 not overlapped by the optical element 120 . The computing unit 140 can calculate the deformation amount of the first deformed region 150A relative to the first undeformed region 150B of the first difference image P1c, so as to obtain the first distance H1 between the object under test S1 and the ranging system 100 . Accordingly, the present invention will not be subject to application restrictions like existing measurement methods such as sound waves or infrared rays, nor will the image accuracy be affected by the existing methods due to the complex placement relationship between multiple image sensors . Compared with the prior art, the ranging system 100 can obtain the distance between the image sensor 130 and the object under test S1 only through one image sensor 130 , not only the measurement cost is lower but also the application range is not limited.
图2A是本发明另一实施例的测距系统的架构示意图,图2B是本发明另一实施例提供的测量距离方法的流程示意图。图2C是本发明另一实施例提供的图像传感器所撷取的待测物图像示意图。透过本发明另一实施例提供的测量距离方法,可以测量待测物S1位在第一位置E1与位在第二位置E2之间的间距H3。于第二实施例中,可在前述第一实施例待测物S1位在第一位置E1时测量出第一距离H1后,在待测物S1位移至第二位置E2后,再进一步执行测量距离的步骤。第一距离H1的测量步骤如同前述第一实施例所述,于此不再赘述。请参阅图2A至图2B,以及配合参阅图1B。FIG. 2A is a schematic diagram of the architecture of a ranging system according to another embodiment of the present invention, and FIG. 2B is a schematic flowchart of a method for measuring distance provided by another embodiment of the present invention. FIG. 2C is a schematic diagram of an image of an object under test captured by an image sensor provided by another embodiment of the present invention. Through the distance measuring method provided by another embodiment of the present invention, the distance H3 between the first position E1 and the second position E2 of the object under test S1 can be measured. In the second embodiment, after the first distance H1 is measured when the object under test S1 is at the first position E1 in the first embodiment, the measurement can be further performed after the object under test S1 is displaced to the second position E2 distance steps. The steps of measuring the first distance H1 are the same as those described in the first embodiment above, and will not be repeated here. Please refer to FIGS. 2A-2B , and in conjunction with FIG. 1B .
首先,当待测物S1位于第一位置E1时,执行步骤S201至步骤S206,以获得位于第一位置E1的待测物S1与测距系统100之间的第一距离H1。其中,步骤S201至步骤S206的实施细节皆与步骤S101至步骤S106相同,因此于此不再赘述。另外,在本实施例中,形变区域的图像相对于未形变区域内所显示的图像是呈现旋转扭曲的形变形式。不过,本发明并不对形变区域所呈现的形变形式加以限定。First, when the object S1 is located at the first position E1 , step S201 to step S206 are executed to obtain a first distance H1 between the object S1 at the first position E1 and the ranging system 100 . Wherein, the implementation details of step S201 to step S206 are the same as those of step S101 to step S106, so details are not repeated here. In addition, in this embodiment, the image in the deformed area is deformed in a rotationally twisted form relative to the image displayed in the undeformed area. However, the present invention does not limit the deformation form of the deformation region.
接下来,执行步骤S207,当待测物S1’由第一位置E1位移至第二位置E2时,待测物S1’与测距系统100之间的间距为第二距离H2,控制单元134控制发光组件110提供光束L1至待测物S1’,而待测物S1’反射部分光束L1a。Next, step S207 is executed, when the object S1' is displaced from the first position E1 to the second position E2, the distance between the object S1' and the ranging system 100 is the second distance H2, and the control unit 134 controls The light emitting component 110 provides the light beam L1 to the object under test S1 ′, and the object under test S1 ′ reflects a part of the light beam L1a.
接着,执行步骤S208,当控制单元134控制发光组件110提供光束L1至待测物S1’时,图像传感器130撷取第二亮图像P1’a。如图2C(d)所绘示,第二亮图像P1’a显示出待测物S1’的图像以及位于成像范围内的背景物B1’。透过将光学元件120部分地重叠图像传感区M1,所撷取的第二亮图像P1’a包括对应光学元件120所部分重叠的图像传感区M1的形变区域及对应光学元件120所未重叠的图像传感区M1的未形变区域。第二亮图像P1’a为灰阶图像。Next, step S208 is executed, when the control unit 134 controls the light emitting component 110 to provide the light beam L1 to the object under test S1', the image sensor 130 captures the second bright image P1'a. As shown in FIG. 2C(d), the second bright image P1'a shows the image of the object under test S1' and the background object B1' within the imaging range. By partially overlapping the image sensing area M1 with the optical element 120, the captured second bright image P1'a includes the deformed area corresponding to the partially overlapped image sensing area M1 of the optical element 120 and the area not corresponding to the corresponding optical element 120. The undeformed area of the overlapping image sensing region M1. The second bright image P1'a is a grayscale image.
值得说明的是,在未形变区域内所显示的待测物S1’的图像以及背景物B1’的图像为并未透过光学元件120而成像,其所显示出待测物S1’的图像形状大小与测距系统100之间的第二距离H2成比例。在形变区域内所显示的待测物S1’的图像以及背景物B1’的图像透过光学元件120而成像,而形变的特性取决于光学元件120的种类以及材质等。同样地,形变区域的图像相对于未形变区域内所显示的图像仍是呈现旋转扭曲的形变形式。It is worth noting that the image of the object under test S1' and the image of the background object B1' displayed in the undeformed region are not imaged through the optical element 120, which shows the shape of the image of the object under test S1' The magnitude is proportional to the second distance H2 between ranging systems 100 . The image of the object under test S1' and the image of the background object B1' displayed in the deformed region are imaged through the optical element 120, and the characteristics of the deformation depend on the type and material of the optical element 120 and the like. Likewise, the image in the deformed area still presents a deformed form of rotational distortion relative to the image displayed in the undeformed area.
接着,执行步骤S209,当控制单元134控制发光组件110未提供光束L1至待测物S1’时,图像传感器120撷取第二暗图像P1’b。如图2C(e)所绘示,若背景物B1为主动发光物件时,第二暗图像P1’b能够显示出背景物B1’,第二暗图像P1’b亦包括形变区域及未形变区域。值得说明的是,第二暗图像P1’b亦可以是灰阶图像。Next, step S209 is executed, when the control unit 134 controls the light emitting component 110 to not provide the light beam L1 to the object under test S1', the image sensor 120 captures the second dark image P1'b. As shown in Figure 2C(e), if the background object B1 is an actively luminous object, the second dark image P1'b can display the background object B1', and the second dark image P1'b also includes deformed areas and undeformed areas . It should be noted that the second dark image P1'b can also be a gray scale image.
接着,执行步骤S210,分析第二亮图像P1’a以及第二暗图像P1’b的灰度值。详细而言,运算单元140分别分析第二亮图像P1’a以及第二暗图像P1’b的灰度值分布,可以得知在第二亮图像P1’a以及第二暗图像P1’b之中具有不同灰度值的像素所分布的位置、所呈现的形状以及其范围。Next, step S210 is executed to analyze the grayscale values of the second bright image P1'a and the second dark image P1'b. In detail, the calculation unit 140 respectively analyzes the gray value distribution of the second bright image P1'a and the second dark image P1'b, and it can be known that there is a difference between the second bright image P1'a and the second dark image P1'b. The positions, shapes and ranges of pixels with different gray values in the distribution.
接着,执行步骤S211,对第二亮图像P1’a以及第二暗图像P1’b执行图像相减,以将第一亮图像P1’a以及第二暗图像P1’b相对应位置的像素的灰度值相减,据以获得的此两幅图像的第二差值图像P1’c。如图2C(f)所绘示,同样地,第二差值图像P1’c所包括的第二形变区域150A’及第二未形变区域150B’都是对应第二亮图像P1’a以及第二暗图像P1’b的形变区域及未形变区域。其中,第二形变区域150A’对应光学元件120所部分重叠的图像传感区M1及第二未形变区域150B’对应光学元件120所未重叠的图像传感区M1。Next, step S211 is executed to perform image subtraction on the second bright image P1'a and the second dark image P1'b, so as to obtain The gray values are subtracted to obtain the second difference image P1'c of the two images. As shown in FIG. 2C(f), similarly, the second deformed area 150A' and the second undeformed area 150B' included in the second difference image P1'c are both corresponding to the second bright image P1'a and the second bright image P1'a. Deformed and undeformed regions of two dark images P1'b. Wherein, the second deformed area 150A' corresponds to the image sensing area M1 partially overlapped by the optical element 120 and the second undeformed area 150B' corresponds to the image sensing area M1 not overlapped by the optical element 120.
接着,执行步骤S212,计算第二形变区域150A’相对于第二未形变区域150B’的形变量,以获得待测物S1’在第二位置E2时与测距系统100的距离变化量。本实施例以旋转扭曲的形变形式作为实施方式。透过比对内建数据资料库,运算单元140能够根据旋转扭曲的形变形式所产生的形状变化而对应获得待测物S1’与测距系统100之间的第二距离H2。Next, step S212 is executed to calculate the deformation amount of the second deformed area 150A' relative to the second undeformed area 150B', so as to obtain the distance change amount between the object S1' and the ranging system 100 when the object S1' is in the second position E2. In this embodiment, the twisted deformation form is used as the implementation mode. By comparing the built-in data database, the computing unit 140 can correspondingly obtain the second distance H2 between the object under test S1' and the distance measuring system 100 according to the shape change generated by the deformation form of rotation and twisting.
不过,于其他实施例中,视光学元件120的特性以及第二距离H2等因素,第二形变区域150A’的图像相对于第二未形变区域150B’的图像而呈现缩放、倾斜、扭曲、旋转或错位等多种形式。However, in other embodiments, depending on the characteristics of the optical element 120 and factors such as the second distance H2, the image of the second deformed region 150A' is scaled, tilted, twisted, and rotated relative to the image of the second undeformed region 150B' Or dislocation and other forms.
执行步骤S213,运算单元140根据第一位置E1与测距系统100之间的第一距离H1以及第二位置E2与测距系统100之间的第二距离H2进行计算,据以获得第一位置E1以及第二位置E2之间的间距H3。Step S213 is executed, the calculation unit 140 calculates according to the first distance H1 between the first position E1 and the distance measuring system 100 and the second distance H2 between the second position E2 and the distance measuring system 100 to obtain the first position E1 and the distance H3 between the second position E2.
基于上述,透过本发明另一实施例的测量距离方法,当待测物S1位于第一位置E1时,通过光学元件120使得所拍摄的待测物S1的亮图像以及暗图像包括形变区域及未形变区域,以测量出位在第一位置E1的待测物S1与测距系统100之间的第一距离H1。同样地,当待测物S1由第一位置E1位移至第二位置E2时,通过光学元件120使得所拍摄的待测物S1的亮图像以及暗图像包括形变区域及未形变区域,以再度测量位在第二位置E2的待测物S1’与测距系统100之间的第二距离H2。运算单元140将第二距离H2与第一距离H1相减便可获得第一位置E1以及第二位置E2之间的间距H3。Based on the above, through the distance measuring method according to another embodiment of the present invention, when the object S1 is located at the first position E1, the light image and the dark image of the object S1 captured by the optical element 120 include deformed regions and The undeformed area is used to measure the first distance H1 between the object S1 at the first position E1 and the ranging system 100 . Similarly, when the object S1 is displaced from the first position E1 to the second position E2, the light image and the dark image of the object S1 captured by the optical element 120 include deformed areas and undeformed areas for re-measurement A second distance H2 between the object S1 ′ at the second position E2 and the ranging system 100 . The computing unit 140 subtracts the second distance H2 from the first distance H1 to obtain the distance H3 between the first position E1 and the second position E2 .
应用上述步骤流程,本发明可提供测量距离方法的实施例。需强调的是,在本发明的核心精神下,各步骤的顺序可视不同测量条件而调整。例如,本发明所提供的测量距离方法亦可以先撷取暗图像再撷取亮图像。或者,第一亮图像P1a、第一暗图像P1b、第二亮图像P1’a以及第二暗图像P1’b可以依照图像传感器130的种类而皆是彩色图像。本发明并不对可视不同测量条件而能够调整的步骤顺序加以限定。Using the above steps, the present invention can provide an embodiment of the method for measuring distance. It should be emphasized that, under the core spirit of the present invention, the order of each step can be adjusted according to different measurement conditions. For example, the method for measuring distance provided by the present invention can also capture dark images first and then capture bright images. Alternatively, the first bright image P1a, the first dark image P1b, the second bright image P1'a, and the second dark image P1'b may all be color images according to the type of the image sensor 130. Referring to FIG. The present invention does not limit the sequence of steps that can be adjusted depending on different measurement conditions.
图3A是本发明第二实施例的测距系统的架构示意图。本发明又一实施例与的测距系统200与上述的测距系统100的差异在于,测距系统200的光学元件220覆盖整个图像传感区M1。也就是说,光学元件220全部遮蔽图像传感区M1,因此,图像传感器130所撷取的待测物图像皆是对应被光学元件220所重叠的图像传感区M1的形变区域。另外,图像传感器230及运算单元240的运作在下面详细说明,其余元件如同前述第一实施例所述,于此不再赘述。FIG. 3A is a schematic structural diagram of a distance measuring system according to a second embodiment of the present invention. The difference between the ranging system 200 in another embodiment of the present invention and the aforementioned ranging system 100 is that the optical element 220 of the ranging system 200 covers the entire image sensing area M1. That is to say, the optical element 220 completely covers the image sensing area M1 , therefore, the images of the object under test captured by the image sensor 130 are all corresponding to the deformed area of the image sensing area M1 overlapped by the optical element 220 . In addition, the operation of the image sensor 230 and the operation unit 240 will be described in detail below, and the rest of the elements are the same as those described in the first embodiment above, and will not be repeated here.
图像传感器230位于通过光学元件220的光束L1b的传递路径上,光学元件220全面地重叠图像传感区M1,而图像传感区M1得以接收来自待测物S1所反射且穿透光学元件220的光束L1b。因此,图像传感器230在不同时间或是不同位置所拍摄的待测物S1的图像皆对应光学元件220所全面地重叠的图像传感区M1而产生形变。The image sensor 230 is located on the transmission path of the light beam L1b passing through the optical element 220. The optical element 220 fully overlaps the image sensing region M1, and the image sensing region M1 can receive light reflected from the object S1 and passing through the optical element 220. Beam L1b. Therefore, the images of the object under test S1 captured by the image sensor 230 at different times or at different positions are all deformed corresponding to the fully overlapping image sensing area M1 of the optical element 220 .
运算单元240透过分析在不同时间或是不同位置的图像传感器230所拍摄的待测物图像的灰度值,以取得对应光学元件220所全面地重叠的图像传感区M1的形变区域的形变量(形变差异度),借此以获得待测物S1的距离变化量。The calculation unit 240 obtains the shape of the deformed area corresponding to the fully overlapping image sensing area M1 of the optical element 220 by analyzing the gray value of the image of the object under test captured by the image sensor 230 at different times or at different positions. variable (deformation difference), so as to obtain the distance variation of the object under test S1.
图3B是本发明第二实施例提供的测量距离方法的流程示意图。图3C是本发明第二实施例提供的图像传感器所撷取的待测物图像示意图。本发明第二实施例的测量距离方法与本发明第一实施例的测量距离方法的差异在于,本发明第二实施例的测量距离方法是比较图像传感区M1所接收通过光学元件220的光束在不同时间或是不同位置下所产生的第一待测物图像与第二待测物图像的形变差异度,来获得待测物S1的距离变化量。透过全面地遮蔽图像传感区M1的光学元件220来使图像传感器230所撷取不同位置下的待测物图像产生不同程度的形变。Fig. 3B is a schematic flowchart of a method for measuring distance provided by the second embodiment of the present invention. FIG. 3C is a schematic diagram of an image of the object under test captured by the image sensor provided by the second embodiment of the present invention. The difference between the distance measuring method in the second embodiment of the present invention and the distance measuring method in the first embodiment of the present invention is that the distance measuring method in the second embodiment of the present invention is to compare the light beams received by the image sensing region M1 through the optical element 220 The deformation difference between the first object image and the second object image generated at different times or at different positions is used to obtain the distance variation of the object S1. The images of the object under test captured by the image sensor 230 at different positions are deformed to different degrees by completely covering the optical element 220 of the image sensing area M1 .
执行步骤S301,当待测物S1位于第一位置E1时,待测物S1与测距系统200之间的间距为第一距离H1,控制单元134控制发光组件110提供光束L1至待测物S1,而待测物S1反射部分光束L1b。Step S301 is executed, when the object S1 is located at the first position E1, the distance between the object S1 and the distance measuring system 200 is the first distance H1, and the control unit 134 controls the light emitting component 110 to provide a light beam L1 to the object S1 , and the object S1 reflects part of the light beam L1b.
接着,执行步骤S302,发光组件110提供光束L1至待测物S1时,图像传感器130撷取第一亮图像P2a。如图3C(a)所绘示,第一亮图像P2a显示出待测物S1的图像以及位于成像范围内的背景物B1,第一亮图像P2a对应光学元件220所全面地重叠的图像传感区M1而产生形变,而形变的特性取决于光学元件220的种类以及材质等。其中,本实施例以旋转扭曲的形变形式作为实施方式,如图3C(a)所绘示,但不限于此。Next, step S302 is executed, when the light emitting component 110 provides the light beam L1 to the object under test S1, the image sensor 130 captures the first bright image P2a. As shown in FIG. 3C(a), the first bright image P2a shows the image of the object under test S1 and the background object B1 within the imaging range, and the first bright image P2a corresponds to the fully overlapping image sensor of the optical element 220 The region M1 is deformed, and the characteristics of the deformation depend on the type and material of the optical element 220 . Wherein, the present embodiment takes the twisted deformation form as the implementation, as shown in FIG. 3C(a), but is not limited thereto.
接着,执行步骤S303,当发光组件110未提供光束L1至待测物S1时,图像传感器120撷取第一暗图像P2b。如图3C(b)所绘示,第一暗图像P2b显示出位于成像范围内的背景物B1,第一暗图像P1b亦对应光学元件220所全面地重叠的图像传感区M1而产生形变。Next, step S303 is executed, when the light emitting component 110 does not provide the light beam L1 to the object under test S1, the image sensor 120 captures the first dark image P2b. As shown in FIG. 3C( b ), the first dark image P2b shows the background object B1 within the imaging range, and the first dark image P1b is also deformed corresponding to the fully overlapping image sensing area M1 of the optical element 220 .
接着,执行步骤S304,运算单元240分别分析第一亮图像P2a以及第一暗图像P2b的灰度值分布,可以得知在第一亮图像P2a以及第一暗图像P2b之中具有不同灰度值的像素所分布的位置、形状以及范围。Next, step S304 is executed, the computing unit 240 respectively analyzes the distribution of gray values of the first bright image P2a and the first dark image P2b, and it can be known that the first bright image P2a and the first dark image P2b have different gray values The location, shape and range of the distribution of pixels.
接着,执行步骤S305,对第一亮图像P2a以及第一暗图像P2b执行图像相减,以得到此两幅图像的第一差值图像P2c。如图3C(c)所绘示,所获得的第一差值图像P2c得以显示出待测物S1的图像。同样地,第一差值图像P2c对应光学元件220所全面地重叠的图像传感区M1而产生形变。Next, step S305 is executed to perform image subtraction on the first bright image P2a and the first dark image P2b to obtain a first difference image P2c of the two images. As shown in FIG. 3C( c ), the obtained first difference image P2c can display the image of the object S1 to be tested. Likewise, the first difference image P2c is deformed corresponding to the image sensing region M1 fully overlapped by the optical element 220 .
执行步骤S306,当待测物S1’由第一位置E1位移至第二位置E2时,待测物S1’与测距系统200之间的间距为第二距离H2,发光组件110提供光束L1至待测物S1’,而待测物S1’反射部分光束L1b。Step S306 is executed, when the object S1' is displaced from the first position E1 to the second position E2, the distance between the object S1' and the ranging system 200 is the second distance H2, and the light emitting component 110 provides the light beam L1 to The object under test S1', and the object under test S1' reflects a part of the light beam L1b.
接着,执行步骤S307,当发光组件110提供光束L1至待测物S1’时,图像传感器230撷取第一亮图像P2’a。如图3C(d)所绘示,第二亮图像P2’a显示出待测物S1’的图像以及位于成像范围内的背景物B1’,第二亮图像P2’a对应光学元件220所全面地重叠的图像传感区M1而产生形变。值得说明的是,当待测物S1’由第一位置E1位移至第二位置E2,图像传感器230所撷取的待测物图像会随着不同的位置而产生不同的形变量(形变差异度)。亦即,第二亮图像P2’a的形变量不同于第一亮图像P2a的形变量。形变特性取决于光学元件220的种类以及材质等。Next, step S307 is executed, when the light emitting component 110 provides the light beam L1 to the object under test S1', the image sensor 230 captures the first bright image P2'a. As shown in FIG. 3C(d), the second bright image P2'a shows the image of the object under test S1' and the background object B1' within the imaging range, and the second bright image P2'a corresponds to the entire area of the optical element 220. The overlapping image sensing region M1 causes deformation. It is worth noting that when the object S1' is displaced from the first position E1 to the second position E2, the images of the object captured by the image sensor 230 will have different deformations (deformation differences) with different positions. ). That is, the deformation amount of the second bright image P2'a is different from that of the first bright image P2a. The deformation characteristic depends on the type and material of the optical element 220 .
接着,执行步骤S308,当发光组件110未提供光束L1至待测物S1’时,图像传感器120撷取第二暗图像P2’b。如图3C(e)所绘示,若背景物B1为主动发光物件时,第二暗图像P2’b能够显示出背景物B1’,第二暗图像P2’b对应光学元件220所全面地重叠的图像传感区M1而产生形变。同样地,第二暗图像P2’b的形变量不同于第一暗图像P2b的形变量。值得说明的是,第二暗图像P2’b亦可以是灰阶图像。Next, step S308 is executed, when the light emitting component 110 does not provide the light beam L1 to the object under test S1', the image sensor 120 captures the second dark image P2'b. As shown in FIG. 3C(e), if the background object B1 is an active light-emitting object, the second dark image P2'b can display the background object B1', and the second dark image P2'b corresponds to the full overlap of the optical element 220. The image sensing region M1 is deformed. Likewise, the deformation amount of the second dark image P2'b is different from that of the first dark image P2b. It should be noted that the second dark image P2'b can also be a grayscale image.
接着,执行步骤S309,运算单元240分别分析第二亮图像P2’a以及第二暗图像P2’b的灰度值分布,可以得知在第二亮图像P2’a以及第二暗图像P2’b之中具有不同灰度值的像素所分布的位置、所呈现的形状以及其范围。Next, step S309 is executed, the computing unit 240 analyzes the gray value distributions of the second bright image P2'a and the second dark image P2'b respectively, and it can be known that the second bright image P2'a and the second dark image P2' The distribution position, shape and range of pixels with different gray values in b.
接着,执行步骤S310,对第二亮图像P1’a以及第二暗图像P1’b执行图像相减,以获得此两幅图像的第二差值图像P2’c。如图3C(f)所绘示,同样地,第二差值图像P2’c对应光学元件220所全面地重叠的图像传感区M1而产生形变,其中第二差值图像P2’c的形变量不同于第一差值图像P2c的形变量。Next, step S310 is executed to perform image subtraction on the second bright image P1'a and the second dark image P1'b to obtain a second difference image P2'c of the two images. As shown in FIG. 3C(f), similarly, the second difference image P2'c is deformed corresponding to the image sensing area M1 fully overlapped by the optical element 220, wherein the shape of the second difference image P2'c The variable is different from the deformation amount of the first difference image P2c.
接着,执行步骤S311,计算第二差值图像P2’c相对于第一差值图像P2c的形变量,以获得第二位置E2时与第一位置E1的间距H3。详细而言,本实施例以旋转扭曲的形变形式作为实施方式,当待测物S1’由第一位置E1位移至第二位置E2时,在第二差值图像P2’c的待测物S1’图像的旋转扭曲形变相对于第一差值图像P2c产生不同的形变量。透过比对内建数据资料库,运算单元240能够根据旋转扭曲的形变形式所产生的形状变化而对应获得的间距H3。Next, step S311 is executed to calculate the deformation amount of the second difference image P2'c relative to the first difference image P2c, so as to obtain the distance H3 between the second position E2 and the first position E1. In detail, this embodiment uses the deformation form of rotation twist as the implementation. When the object S1' is displaced from the first position E1 to the second position E2, the object S1 in the second difference image P2'c 'The rotational distortion deformation of the image produces a different deformation amount relative to the first difference image P2c. By comparing the built-in data database, the computing unit 240 can correspond to the obtained distance H3 according to the shape change generated by the deformation form of the rotation and twist.
基于上述,透过本发明第二实施例的测量距离方法,图像传感器130所拍摄的在不同时间或是不同位置下的待测物S1图像对应光学元件220所全面地重叠的图像传感区M1而产生形变。运算单元240可以计算第二差值图像P2’c相对于第一差值图像P2c的形变量,从而得以获得待测物S1移动的距离。据此,本发明不会如同现有声波或红外线等测量法般容易受到应用上的限制,也不会因为现有方法因多个图像传感器之间的摆放位置关系复杂而导致图像精度受到影响。相较现有技术而言,测距系统200仅需透过一个图像传感器230即能以获得图像传感器和待测物之间距,不仅测量的成本较低且应用范围较不会受到限制。Based on the above, through the distance measuring method according to the second embodiment of the present invention, the images of the object under test S1 captured by the image sensor 130 at different times or at different positions correspond to the fully overlapping image sensing area M1 of the optical element 220 resulting in deformation. The computing unit 240 can calculate the deformation amount of the second difference image P2'c relative to the first difference image P2c, so as to obtain the moving distance of the object S1. Accordingly, the present invention will not be subject to application restrictions like existing measurement methods such as sound waves or infrared rays, nor will the image accuracy be affected by the existing methods due to the complex placement relationship between multiple image sensors . Compared with the prior art, the distance measuring system 200 only needs to use one image sensor 230 to obtain the distance between the image sensor and the object to be measured. Not only the measurement cost is lower, but also the application range is not limited.
综上所述,本发明第一实施例提供一种测距系统,其包括发光组件、光学元件、图像传感器以及运算单元。光学元件部分重叠图像传感器的图像传感区,而图像传感区得以接收来自待测物所反射且穿透光学元件的光束以及未穿透光学元件的光束。因此,图像传感器所拍摄的待测物的亮图像及暗图像以及图像传感器根据亮图像及暗图像所处理的差值图像皆包括对应光学元件所部分重叠的图像传感区的形变区域及对应光学元件所未重叠的图像传感区的未形变区域。To sum up, the first embodiment of the present invention provides a ranging system, which includes a light-emitting component, an optical element, an image sensor, and a computing unit. The optical element partially overlaps the image sensing area of the image sensor, and the image sensing area can receive the light beam reflected from the object to be measured and pass through the optical element and the light beam not passing through the optical element. Therefore, the bright image and dark image of the object under test captured by the image sensor and the difference image processed by the image sensor according to the bright image and the dark image all include the deformed area of the image sensing area partially overlapped by the corresponding optical element and the corresponding optical element. The undeformed area of the image sensing area where elements do not overlap.
本发明第一实施例提供一种测量距离的方法,由于光学元件仅部分地重叠图像传感区,图像传感器所拍摄的待测物的亮图像以及暗图像包括对应光学元件所部分重叠的图像传感区的形变区域及对应光学元件所未重叠的图像传感区的未形变区域。运算单元可以计算第一差值图像的第一形变区域相对于第一未形变区域的形变量,从而得以获得待测物与测距系统之间的第一距离。The first embodiment of the present invention provides a method for measuring distance. Since the optical element only partially overlaps the image sensing area, the bright image and the dark image of the object to be measured captured by the image sensor include the partially overlapped image sensing area of the corresponding optical element. The deformed area of the sensing area and the non-deformed area of the image sensing area corresponding to the non-overlapped optical elements. The computing unit can calculate the deformation amount of the first deformed area of the first difference image relative to the first undeformed area, so as to obtain the first distance between the object under test and the ranging system.
另外,本发明另一实施例更提供另一种测量距离的方法,相对于第一实施例来说,当待测物由第一位置位移至第二位置时,运算单元能够计算待测物位于第二位置的差值图像所包括的形变区域及未形变区域之间的相对形变量,从而获得第二位置与测距系统之间的第二距离。运算单元将第二距离与第一距离相减以获得第一位置以及第二位置之间的间距。In addition, another embodiment of the present invention provides another method for measuring distance. Compared with the first embodiment, when the object to be tested is displaced from the first position to the second position, the calculation unit can calculate the position of the object to be measured. The relative deformation between the deformed area and the undeformed area included in the difference image of the second position is used to obtain a second distance between the second position and the ranging system. The computing unit subtracts the second distance from the first distance to obtain the distance between the first position and the second position.
此外,本发明第二实施例提供一种测距系统,光学元件全面地重叠图像传感器的图像传感区,而图像传感区得以接收来自待测物所反射且穿透光学元件的光束。因此,图像传感器在不同时间或是不同位置所拍摄的待测物的图像皆对应光学元件所全面地重叠的图像传感区而产生形变。In addition, the second embodiment of the present invention provides a ranging system, the optical element completely overlaps the image sensing area of the image sensor, and the image sensing area can receive the light beam reflected from the object under test and passing through the optical element. Therefore, the images of the object under test captured by the image sensor at different times or at different positions are all deformed corresponding to the fully overlapping image sensing area of the optical element.
本发明第二实施例提供一种测量距离的方法,透过运算单元比较在不同时间或是不同位置下图像传感区所接收通过光学元件的光束所产生的第一待测物图像与第二待测物图像的形变差异度,来获得待测物移动的距离。The second embodiment of the present invention provides a method for measuring distance. Through the computing unit, the first image of the object to be measured and the second image of the object to be measured, which are generated by the light beams received by the image sensing area and passed through the optical element, are compared at different times or at different positions. The deformation difference of the image of the object under test is used to obtain the moving distance of the object under test.
据此,本发明不会如同现有声波或红外线等测量法般容易受到应用上的限制,也不会因为现有方法因多个图像传感器之间的摆放位置关系复杂而导致图像精度受到影响。相较现有技术而言,测距系统仅需透过一个图像传感器即能以获得图像传感器和待测物的间距,不仅测量的成本较低且应用范围较不会受到限制。Accordingly, the present invention will not be subject to application restrictions like existing measurement methods such as sound waves or infrared rays, nor will the image accuracy be affected by the existing methods due to the complex placement relationship between multiple image sensors . Compared with the prior art, the ranging system only needs to use an image sensor to obtain the distance between the image sensor and the object to be measured. Not only the cost of measurement is lower, but also the application range is not limited.
以上所述仅为本发明的较佳可行实施例,非因此局限本发明的专利范围,故举凡运用本发明说明书及附图内容所做的等效技术变化,均包含于本发明的保护范围内。The above descriptions are only preferred feasible embodiments of the present invention, and therefore do not limit the patent scope of the present invention. Therefore, all equivalent technical changes made by using the description of the present invention and the contents of the accompanying drawings are included in the protection scope of the present invention. .
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