CN106124104A - A kind of micro-cantilever device measuring genetic fragment active force - Google Patents

Abstract

The invention discloses a micro-cantilever beam device for measuring the force of gene fragments, which belongs to the field of detection and weighing of gene fragment interaction forces. It includes a three-layer composite beam, a fixed end, a gene segment A and a gene segment B, and a microsensor; the three-layer composite beam includes a non-impeding layer with adsorption capacity but no friction, a hydrogel layer with a thickness of 10-20 microns, and A silicon layer with a thickness of 5-6 microns; the unobstructed layer is located on the top of the hydrogel layer, and the silicon layer is located at the bottom of the hydrogel layer; the microsensor is a stress sensor with a resolution of 0.01 microPa, installed on a three-layer composite beam Bottom of the right end of ; the thickness of the unobstructed layer is 1‑2 microns. The invention is a micro-cantilever beam device with simple structure, high measuring precision and capable of rapidly measuring the force of two gene fragments.

Description

A micro-cantilever device for measuring the force of gene fragments

technical field

The invention mainly relates to the field of detection and weighing of the interaction force of gene fragments, in particular to a micro-cantilever beam device for measuring the interaction force of gene fragments.

Background technique

Gene is a functional segment of DNA molecule, the basic unit of genetic information, and the most basic factor that determines all biological species; gene determines human life, old age, sickness and death, is the cause of health, beauty, and longevity, and is the manipulator and regulator of life . The spatial configuration of genes determines the force between gene fragments. In a sense, the spatial structure of genes can be identified by detecting the force between adjacent gene fragments, and whether genes are attacked by viruses or not. Partial variation occurs. Therefore, it is of great practical value to design a device that can quickly detect the force between gene fragments.

Contents of the invention

The technical problem to be solved by the present invention is: aiming at the technical problems existing in the prior art, the present invention provides a micro-cantilever device with simple structure, high measurement accuracy, and capable of rapidly measuring the force of two gene segments.

In order to solve the above problems, the solution proposed by the present invention is: a micro-cantilever device for measuring the force of the gene fragment, which includes a three-layer composite beam, a fixed end, gene fragment A and gene fragment B, and a microsensor; The layered composite beam consists of a non-impeding layer composed of adsorption capacity but no friction, a hydrogel layer with a thickness of 10-20 microns, and a silicon layer with a thickness of 5-6 microns; The upper part of the silicon layer is located at the bottom of the hydrogel layer.

The gene fragment A and the gene fragment B of the present invention are adjacently placed on the upper part of the unimpeded layer, and are located in the middle of the three-layer composite beam; the microsensor is a stress sensor with a resolution of 0.01 microPa. At the bottom of the right end of the three-layer composite beam; the thickness of the non-impeding layer is 1-2 microns.

Compared with the prior art, the present invention has the following advantages and beneficial effects:

(1) A micro-cantilever device for measuring the force of gene fragments of the present invention is provided with a three-layer composite beam, which has the characteristics of significant bending deformation and can improve the accuracy of force measurement of gene fragments.

(2) The three-layer composite beam of the present invention is provided with an unimpeded layer, and the two gene segments can slide freely along the unimpeded layer under the interaction force until a new balance is satisfied. It can be seen that the present invention has simple structure, high measurement precision, and realizes rapid and accurate measurement of the force of gene fragments.

Description of drawings

Fig. 1 is a schematic diagram of the structural principle of a micro-cantilever device for measuring the force of gene fragments according to the present invention.

Fig. 2 is a schematic diagram of the principle of the micro-cantilever device of the present invention for measuring the force of gene fragments.

In the figure, 1—three-layer composite beam; 11—unimpeded layer; 12—hydrogel layer; 13—silicon layer; 2—fixed end; 3—gene fragment A before balance; 4—gene fragment B before balance; 5—balanced gene segment A; 6—balanced gene segment B; 7—bending deflection line A; 8—bending deflection line B; 9—microsensor.

detailed description

The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

Referring to shown in Fig. 1, a kind of micro-cantilever device of the present invention for measuring the force of a gene segment comprises a three-layer composite beam 1, a fixed end 2, a gene segment A and a gene segment B, a microsensor 9; a three-layer composite beam 1 Comprising an unimpeded layer 11 composed of adsorption capacity but no friction, a hydrogel layer 12 with a thickness of 10-20 microns, and a silicon layer 13 with a thickness of 5-6 microns; the unimpeded layer 11 is located on the upper part of the hydrogel layer 12 , the silicon layer 13 is located at the bottom of the hydrogel layer 12; the gene segment A and the gene segment B are adjacently placed on the upper part of the unimpeded layer 11, and are located in the middle of the three-layer composite beam 1; the microsensor 9 has a resolution of 0.01 micro The stress sensor of Pa is installed at the bottom of the free end of the three-layer composite beam 1; the thickness of the non-impeding layer 11 is 1-2 microns.

Referring to Fig. 1 and shown in Fig. 2, the gene fragment A and the gene fragment B to be measured are placed on the non-impeding layer 11, that is, the gene fragment A3 before the balance, and the gene fragment B4 before the balance. There is a repulsive force between them, so the two gene fragments move outward respectively; when the balance is reached, they become the balanced gene fragment A5 and the balanced gene fragment B6 in Figure 2; due to the outward movement of the two gene fragments, the gravity Under the action, the three-layer composite beam 1 undergoes significant bending deformation, that is, the bending deflection line A7 becomes the bending deflection line B8, and the reading of the corresponding microsensor 9 also changes; using the reading change of the microsensor 9 and the cantilever The bending deformation formula of the beam can calculate the distance b between the two gene fragments after equilibrium. Assuming that the distance before equilibrium is a, the force between the two gene fragments can be obtained through calculation.

Claims (1)

1. the micro-cantilever device measuring genetic fragment active force, it is characterised in that: include fixing end (2), left end installing Three layers of composite beam (1), genetic fragment A and genetic fragment B on described fixing end (2), microsensor (9)；Answer for described three layers Close beam (1) include that there is absorbability but zerofriction force structure without hydrogel layer that resistance layer (11), thickness are 10-20 micron And silicon layer (13) that thickness is 5-6 micron (12)；The described top being positioned at described hydrogel layer (12) without resistance layer (11), institute State silicon layer (13) and be positioned at the bottom of described hydrogel layer (12)；Described genetic fragment A and genetic fragment B are adjacent to be positioned over described Without the top of resistance layer (11), and it is positioned at the middle part of described three layers of composite beam (1)；Described microsensor (9) be resolution be 0.01 The strain gauge of micro-Pa, is installed in bottom the right-hand member of described three layers of composite beam (1)；The described thickness without resistance layer (11) is 1-2 Micron.