CN105988303B - 一种掩模版传输装置及传输方法 - Google Patents
一种掩模版传输装置及传输方法 Download PDFInfo
- Publication number
- CN105988303B CN105988303B CN201510087602.XA CN201510087602A CN105988303B CN 105988303 B CN105988303 B CN 105988303B CN 201510087602 A CN201510087602 A CN 201510087602A CN 105988303 B CN105988303 B CN 105988303B
- Authority
- CN
- China
- Prior art keywords
- mask
- reticle
- prealignment
- platform
- relative position
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
- G03F7/70741—Handling masks outside exposure position, e.g. reticle libraries
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7073—Alignment marks and their environment
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70775—Position control, e.g. interferometers or encoders for determining the stage position
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7003—Alignment type or strategy, e.g. leveling, global alignment
- G03F9/7007—Alignment other than original with workpiece
- G03F9/7011—Pre-exposure scan; original with original holder alignment; Prealignment, i.e. workpiece with workpiece holder
-
- H10P72/3302—
-
- H10P72/50—
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Library & Information Science (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Respiratory Apparatuses And Protective Means (AREA)
- Robotics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
Claims (6)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510087602.XA CN105988303B (zh) | 2015-02-26 | 2015-02-26 | 一种掩模版传输装置及传输方法 |
| KR1020177027074A KR102043821B1 (ko) | 2015-02-26 | 2016-02-24 | 마스크 전송 장치 및 전송 방법 |
| PCT/CN2016/074407 WO2016134654A1 (zh) | 2015-02-26 | 2016-02-24 | 一种掩模版传输装置及传输方法 |
| EP16754763.7A EP3264178B1 (en) | 2015-02-26 | 2016-02-24 | Mask transmission device and transmission method |
| US15/554,184 US10095132B2 (en) | 2015-02-26 | 2016-02-24 | Mask transmission device and transmission method |
| SG11201706928WA SG11201706928WA (en) | 2015-02-26 | 2016-02-24 | Mask transmission device and transmission method |
| JP2017544920A JP6401872B2 (ja) | 2015-02-26 | 2016-02-24 | マスク搬送装置及びマスク搬送方法 |
| TW105105839A TWI608307B (zh) | 2015-02-26 | 2016-02-26 | Mask board transmission device and transmission method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510087602.XA CN105988303B (zh) | 2015-02-26 | 2015-02-26 | 一种掩模版传输装置及传输方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105988303A CN105988303A (zh) | 2016-10-05 |
| CN105988303B true CN105988303B (zh) | 2018-03-30 |
Family
ID=56787876
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510087602.XA Active CN105988303B (zh) | 2015-02-26 | 2015-02-26 | 一种掩模版传输装置及传输方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US10095132B2 (zh) |
| EP (1) | EP3264178B1 (zh) |
| JP (1) | JP6401872B2 (zh) |
| KR (1) | KR102043821B1 (zh) |
| CN (1) | CN105988303B (zh) |
| SG (1) | SG11201706928WA (zh) |
| TW (1) | TWI608307B (zh) |
| WO (1) | WO2016134654A1 (zh) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109426082A (zh) * | 2017-08-21 | 2019-03-05 | 上海微电子装备(集团)股份有限公司 | 一种掩模版的传输系统以及传输方法 |
| CN107805778B (zh) * | 2017-10-31 | 2019-06-04 | 京东方科技集团股份有限公司 | 一种掩膜板承载装置及蒸镀装置 |
| CN110060950B (zh) * | 2018-01-19 | 2021-07-30 | 华邦电子股份有限公司 | 光罩输送设备 |
| CN110658684B (zh) * | 2018-06-28 | 2020-11-20 | 上海微电子装备(集团)股份有限公司 | 取放版手单元、掩模传输系统和掩模传输方法 |
| CN111623718B (zh) * | 2019-02-28 | 2021-09-28 | 上海微电子装备(集团)股份有限公司 | 一种掩模版凸版检测装置、传输系统及光刻设备 |
| CN114476669B (zh) * | 2022-02-11 | 2023-10-03 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 版库装置、版库系统及姿态调整方法 |
| CN116088283B (zh) * | 2023-04-12 | 2023-06-30 | 深圳市龙图光罩股份有限公司 | 掩模版预校准方法、系统、电子设备以及可读存储介质 |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1052547A2 (en) * | 1999-04-21 | 2000-11-15 | Asm Lithography B.V. | Mask-handling apparatus for lithographic projection apparatus |
| US6226087B1 (en) * | 1998-04-21 | 2001-05-01 | Leica Microsystems Wetzlar Gmbh | Method for measuring the positions of structures on a mask surface |
| JP2005340315A (ja) * | 2004-05-25 | 2005-12-08 | Nikon Corp | 位置合わせ装置、露光装置、位置合わせ方法及び露光方法、並びにデバイス製造方法及び較正用(工具)レチクル |
| CN101067727A (zh) * | 2007-06-05 | 2007-11-07 | 上海微电子装备有限公司 | 掩模版装载工艺 |
| KR20100031984A (ko) * | 2008-09-17 | 2010-03-25 | 주식회사 동부하이텍 | 레티클 예비정렬 장치 및 그 방법 |
| CN102156393A (zh) * | 2010-02-11 | 2011-08-17 | 上海微电子装备有限公司 | 光刻机中掩模版的上版方法 |
| CN103425005A (zh) * | 2012-05-22 | 2013-12-04 | 上海微电子装备有限公司 | 基于光源调制的掩模预对准系统及预对准方法 |
Family Cites Families (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1193297A (en) * | 1966-07-01 | 1970-05-28 | Telefunken Patent | Device for the Fine Adjustment of Photomasks with respect to Semiconductor Elements |
| CH629000A5 (de) * | 1978-05-22 | 1982-03-31 | Bbc Brown Boveri & Cie | Verfahren zum optischen justieren von bauelementen. |
| US4620785A (en) * | 1982-12-01 | 1986-11-04 | Canon Kabushiki Kaisha | Sheet-like member having alignment marks and an alignment apparatus for the same |
| JPH022104A (ja) | 1988-06-15 | 1990-01-08 | Canon Inc | マスク保持装置 |
| US5194743A (en) * | 1990-04-06 | 1993-03-16 | Nikon Corporation | Device for positioning circular semiconductor wafers |
| CN1180180A (zh) | 1994-12-26 | 1998-04-29 | 三星航空产业株式会社 | 刻线片预校正装置及预校正方法 |
| KR100246574B1 (ko) * | 1994-12-26 | 2000-03-15 | 유무성 | 레티클 정렬장치 및 방법 |
| JPH08250410A (ja) | 1995-03-14 | 1996-09-27 | Nikon Corp | マスクの位置決め装置 |
| US6366830B2 (en) * | 1995-07-10 | 2002-04-02 | Newport Corporation | Self-teaching robot arm position method to compensate for support structure component alignment offset |
| JPH11307425A (ja) * | 1998-04-22 | 1999-11-05 | Nikon Corp | マスクの受け渡し方法、及び該方法を使用する露光装置 |
| TW378280B (en) * | 1998-07-22 | 2000-01-01 | United Integrated Circuits Corp | Compatible mask |
| TW446858B (en) * | 1999-04-21 | 2001-07-21 | Asm Lithography Bv | Lithographic projection apparatus, method of manufacturing a device using such a lithographic projection apparatus, and device made by such a method of manufacturing |
| JPWO2003017344A1 (ja) * | 2001-08-20 | 2004-12-09 | 株式会社ニコン | マスク交換方法及び露光装置 |
| US7304720B2 (en) * | 2002-02-22 | 2007-12-04 | Asml Holding N.V. | System for using a two part cover for protecting a reticle |
| EP1431834B1 (en) * | 2002-12-19 | 2008-07-23 | ASML Netherlands B.V. | A device manufacturing method using a lithographic projection mask |
| JP4261932B2 (ja) | 2003-01-31 | 2009-05-13 | キヤノン株式会社 | 露光装置 |
| KR100507359B1 (ko) * | 2003-08-29 | 2005-08-09 | 동부아남반도체 주식회사 | 반도체 제조용 레티클 및 이를 이용한 레티클 예비 정렬방법 |
| JP4710308B2 (ja) * | 2004-10-29 | 2011-06-29 | 株式会社ニコン | レチクル搬送装置、露光装置、及びレチクルの搬送方法 |
| JP4509974B2 (ja) * | 2005-06-30 | 2010-07-21 | エーエスエムエル ネザーランズ ビー.ブイ. | レチクル予備位置合わせセンサ用一体照明システムがあるエンドエフェクタ |
| JP2007194309A (ja) * | 2006-01-18 | 2007-08-02 | Nikon Corp | 搬送方法及び搬送システム |
| KR100724579B1 (ko) * | 2006-02-01 | 2007-06-04 | 삼성전자주식회사 | 웨이퍼 프리 얼라인먼트 유니트를 갖는 노광설비 및 이를이용한 웨이퍼 프리 얼라인먼트 방법 |
| US20110024879A1 (en) * | 2009-07-28 | 2011-02-03 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method to reduce pre-alignment error using multi-notch pattern or in combination with flat side |
| KR20140017767A (ko) * | 2012-07-31 | 2014-02-12 | 삼성디스플레이 주식회사 | 증착용 마스크 및 이의 정렬 방법 |
| NL2011687A (en) * | 2012-12-14 | 2014-06-17 | Asml Netherlands Bv | Method of operating a lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product. |
| CN103984208B (zh) * | 2013-02-07 | 2016-03-02 | 上海微电子装备有限公司 | 掩模版传输系统 |
| CN104035286B (zh) * | 2013-03-05 | 2015-12-23 | 中芯国际集成电路制造(上海)有限公司 | 圆筒形掩模板系统、曝光装置和曝光方法 |
| CN103412428B (zh) * | 2013-07-24 | 2016-01-27 | 北京京东方光电科技有限公司 | 一种对位系统 |
-
2015
- 2015-02-26 CN CN201510087602.XA patent/CN105988303B/zh active Active
-
2016
- 2016-02-24 SG SG11201706928WA patent/SG11201706928WA/en unknown
- 2016-02-24 US US15/554,184 patent/US10095132B2/en active Active
- 2016-02-24 EP EP16754763.7A patent/EP3264178B1/en active Active
- 2016-02-24 KR KR1020177027074A patent/KR102043821B1/ko active Active
- 2016-02-24 JP JP2017544920A patent/JP6401872B2/ja active Active
- 2016-02-24 WO PCT/CN2016/074407 patent/WO2016134654A1/zh not_active Ceased
- 2016-02-26 TW TW105105839A patent/TWI608307B/zh active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6226087B1 (en) * | 1998-04-21 | 2001-05-01 | Leica Microsystems Wetzlar Gmbh | Method for measuring the positions of structures on a mask surface |
| EP1052547A2 (en) * | 1999-04-21 | 2000-11-15 | Asm Lithography B.V. | Mask-handling apparatus for lithographic projection apparatus |
| JP2005340315A (ja) * | 2004-05-25 | 2005-12-08 | Nikon Corp | 位置合わせ装置、露光装置、位置合わせ方法及び露光方法、並びにデバイス製造方法及び較正用(工具)レチクル |
| CN101067727A (zh) * | 2007-06-05 | 2007-11-07 | 上海微电子装备有限公司 | 掩模版装载工艺 |
| KR20100031984A (ko) * | 2008-09-17 | 2010-03-25 | 주식회사 동부하이텍 | 레티클 예비정렬 장치 및 그 방법 |
| CN102156393A (zh) * | 2010-02-11 | 2011-08-17 | 上海微电子装备有限公司 | 光刻机中掩模版的上版方法 |
| CN103425005A (zh) * | 2012-05-22 | 2013-12-04 | 上海微电子装备有限公司 | 基于光源调制的掩模预对准系统及预对准方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW201706719A (zh) | 2017-02-16 |
| TWI608307B (zh) | 2017-12-11 |
| JP6401872B2 (ja) | 2018-10-10 |
| KR102043821B1 (ko) | 2019-11-12 |
| CN105988303A (zh) | 2016-10-05 |
| WO2016134654A1 (zh) | 2016-09-01 |
| EP3264178B1 (en) | 2020-02-19 |
| JP2018508038A (ja) | 2018-03-22 |
| SG11201706928WA (en) | 2017-09-28 |
| US20180039192A1 (en) | 2018-02-08 |
| EP3264178A4 (en) | 2018-11-07 |
| EP3264178A1 (en) | 2018-01-03 |
| KR20170121251A (ko) | 2017-11-01 |
| US10095132B2 (en) | 2018-10-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105988303B (zh) | 一种掩模版传输装置及传输方法 | |
| TWI661505B (zh) | 搬送裝置、搬送方法、曝光裝置、以及元件製造方法 | |
| JP6307022B2 (ja) | 基板処理装置、基板処理方法及び記録媒体 | |
| KR102560788B1 (ko) | 주변 노광 장치, 주변 노광 방법, 프로그램, 및 컴퓨터 기억 매체 | |
| KR20120008447A (ko) | 기판 처리 장치, 기판 처리 방법, 프로그램 및 컴퓨터 기억 매체 | |
| TWI412902B (zh) | Exposure drawing device | |
| JPWO2007088927A1 (ja) | 基板交換装置及び基板処理装置並びに基板検査装置 | |
| JP7196222B2 (ja) | 露光方法 | |
| JP4978471B2 (ja) | 物体の搬出入方法及び搬出入装置、露光方法及び露光装置、並びにデバイス製造方法 | |
| JP5743437B2 (ja) | 露光装置、露光方法、搬送方法及びデバイスの製造方法 | |
| JP5825268B2 (ja) | 基板検査装置 | |
| JP2018050051A (ja) | 基板処理装置、基板処理方法及び記録媒体 | |
| JP2001117064A (ja) | 搬送装置の位置合わせ機構および位置合わせ方法、ならびに基板処理装置 | |
| KR101431867B1 (ko) | 노광 장치 및 디바이스 제조 방법 | |
| CN112147849B (zh) | 一种曝光装置、光刻设备及曝光方法 | |
| JPS6017919A (ja) | ウエハのハンドリング方法およびその装置 | |
| JP2006066636A (ja) | 搬送装置とその方法、及び露光装置 | |
| JPS6365443A (ja) | アライメント付両面自動露光装置 | |
| JP2024120968A (ja) | 基板搬送装置 | |
| JP2012234987A (ja) | 基板処理方法、その基板処理方法を実行させるためのプログラムを記録した記録媒体及び基板処理システム | |
| WO2024193945A1 (en) | System and method for aligning a substrate | |
| JP2010118558A (ja) | 露光装置およびデバイス製造方法 | |
| KR20180015335A (ko) | 이송 로봇의 자동 티칭 장치 및 방법 | |
| KR20060078945A (ko) | 레티클 사전정렬 장치 및 그 방법 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 201203 Shanghai Zhangjiang High Tech Park of Pudong New Area Zhang Road No. 1525 Applicant after: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) Co.,Ltd. Address before: 201203 Shanghai Zhangjiang High Tech Park of Pudong New Area Zhang Road No. 1525 Applicant before: SHANGHAI MICRO ELECTRONICS EQUIPMENT Co.,Ltd. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20250710 Address after: 3 / F, building 19, building 8, No. 498, GuoShouJing Road, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai, 201203 Patentee after: Shanghai Xinshang Microelectronics Technology Co.,Ltd. Country or region after: China Address before: 201203 Pudong New Area East Road, No. 1525, Shanghai Patentee before: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) Co.,Ltd. Country or region before: China |