CN1059205A - A kind of method of emissivity in-site measurement - Google Patents
A kind of method of emissivity in-site measurement Download PDFInfo
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- CN1059205A CN1059205A CN 91107415 CN91107415A CN1059205A CN 1059205 A CN1059205 A CN 1059205A CN 91107415 CN91107415 CN 91107415 CN 91107415 A CN91107415 A CN 91107415A CN 1059205 A CN1059205 A CN 1059205A
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- emissivity
- radiation
- radiometer
- light source
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Abstract
本发明提供了一种发射率现场测量的新方法。 它是把经过调制的一定波长的辐射光束入射到被测 物表面，采用相敏检波方法处理信号的辐射计接收被 反射的调制辐射，再与发射率参考板的信号进行比较 和运算，得到被测物的发射率。因辐射计对环境辐射 和被测物的自身辐射完全不响应，故这种方法可在任 何复杂的辐射环境下工作，也可对任何温度的物体进 行发射率测量。通过控制入射辐射的光谱成分及辐 射计的光谱响应，还可测量各种光谱及光谱范围的发 射率。
The invention provides a new method for field measurement of emissivity. It is to inject a modulated radiation beam of a certain wavelength onto the surface of the object to be measured, and a radiometer that uses phase-sensitive detection to process the signal receives the reflected modulated radiation, and then compares and calculates it with the signal of the emissivity reference plate to obtain the measured value. The emissivity of the measured object. Because the radiometer does not respond to the ambient radiation and the self-radiation of the measured object at all, this method can work in any complex radiation environment, and can also measure the emissivity of objects at any temperature. By controlling the spectral composition of the incident radiation and the spectral response of the radiometer, emissivity can also be measured for various spectra and spectral ranges.
Description
The present invention relates to the metrology and measurement field, particularly a kind of method of the emissivity of object being carried out in-site measurement.
So-called emissivity is exactly actual object and the synthermal black matrix ratio of heat radiation power under the same conditions.The state on the temperature of the emissivity of actual object and wavelength, object, material behavior and surface is closely related, and its numerical value has only by concrete measurement just can be learnt.For radiation temperature measurement, after the apparent temperature that has recorded object, also must carry out the correction of emissivity, just can obtain the true temperature of object, at present, the measuring accuracy of the apparent temperature of object has reached higher level, so the precision of radiation temperature measurement is mainly determined by the precision of measuring the emissivity parameter.
At present, the method for measurement emissivity has calorimetry, reflectivity method and energy comparison.The calorimetric ratio juris is: form a heat-exchange system with sample and object correlation on every side are common, again according to the heat-conduction equation of the relevant material emissivity of heat transfer theory guiding system, measure the temperature value of the relevant point of sample again, just can determine the heat interchange state of system, thereby obtain the emissivity of sample.Calorimetry need be made into less sample to testee, and will measure the temperature value of the relevant point of sample, is not suitable for in-site measurement.
The ultimate principle of energy comparison is: with the radiation power of distinguishing witness mark black matrix and testee with the same detector under the same conditions, ratio between two is exactly the emissivity of object under same temperature.Reference blackbody is the key of this measuring method, and it influences the measuring accuracy of this method largely.
The ultimate principle of reflectivity method is: according to law of conservation of energy and Kirchhoff's law,, and measures surface reflection energy, can try to achieve reflectivity as long as the radiation energy of known strength is projected on the tested opaque materials surface, thus the emissivity of calculating.Reflectivity method needn't be processed testee, does not need to know the temperature of measured object, from this principle, can develop into the on-site measurement method of emissivity.For example, " utilize CO at document
2Laser is than telemeasurement object emissivity " in (Zhang Renhua, Science Bulletin, the 23rd phase,, 1814-1818 page or leaf in 1985), its measuring method just is based on this principle.But the method that the document provides obtains object emissivity information in order to disappear the influence of complex environment radiant illumination, and environmental radiation is constant in the time of must keeping measuring, and must set up the light illumination of two kinds of different capacities.
The method that the purpose of this invention is to provide a kind of emissivity in-site measurement can obtain in certain spectral range or the emissivity of the object of certain spectrum, and higher measuring accuracy is arranged.This method is to carry out non-cpntact measurement, and needn't process and handle measured object, needn't predict the temperature of measured object.
This method initiatively light source places on the certain distance on reference plate/measured object surface, radiometer is placed on the position that can receive the active radiation of light source that is reflected, and the relative position between fixing initiatively light source and radiometer, the measured object/reference plate; Initiatively light source produces the radiation that a branch of radiation wavelength is λ, incides on the measured object surface, and radiometer receives the active radiation of light source that is reflected, and at this moment radiometer is output as V; Replace measured object with reference plate at same position, at this moment radiometer is output as V
s, establish the measured object surface and be opaque lambert surface, because:
V/V
s＝ρ
d/ρ
d8＝（1-ε
d）/（1-ε
d8），
Then: ε
d=1-(V/V
8) (1-ε
D8)
In the formula, ρ
dBe the reflectivity of testee, ρ
D8Be the reflectivity of reference plate, ε
dBe testee emissivity, ε
D8Emissivity for reference plate;
The invention is characterized in the active radiation of light source is modulated, and provide synchronizing signal; Synchronizing signal is used for phase sensitive detection, makes radiometer only respond the chopped radiation that is reflected.
Earlier accompanying drawing of the present invention is done some explanation:
Fig. 1 is the direction emissivity instrumentation plan.1 is modulated active light source among the figure, and 2 is radiometer, and 3 is the distance between active light source and radiometer and the measured object/reference plate, and 4 is measured object, and 5 is reference plate.
Fig. 2 is the block schematic diagram of an embodiment of the inventive method.Wherein 6 is light source, and 7 is driving circuit, and 8 is oscillatory circuit, 9 is synchronizing signal, and 10 is the radiometer optical system, and 11 is detector and amplifying circuit thereof, 12 is wave filter, 13 is phase-sensitive detection circuit, and 14 for direct current amplifies, and 15 is single-chip microcomputer, respectively two signals are sampled, computing, 16 for emissivity shows printing mechanism, 17 are the storage of reference plate rate-aided signal.
The inventor recommends following most preferred embodiment.
Referring to accompanying drawing, form by modulated light source, radiometer and directional reflectance ratio reference plate according to the device that this method is implemented.
The effect of modulated light source part is chopped radiation light beam and the synchronizing signal that produces a branch of required spectrum composition.Light source 6 has adopted gallium arsenide light emitting diode, and radiation wavelength is 0.94 micron, puts a quartz lens before light emitting diode, and can obtain field angle is the outgoing beam of 3.4 degree.Adopt the mode modulated light source radiation of electrical modulation.Its circuit part is earlier 1.3 kilo hertzs pulse signal by frequency of oscillatory circuit 8 generations, after amplifying, deliver to the driving circuit 7 of light emitting diode, making light emitting diode produce a branch of frequency is 1.3 kilo hertzs chopped radiation light beam, provides modulated synchronization signal 9 simultaneously.
The effect of radiometer part is to receive the chopped radiation energy that is reflected.Adopted silicon photoelectric diode to receive 0.94 micron reflection modulation radiation, add a quartz lens before the photodiode, form and receive the optical system 10 that the visual field is 5.2 degree, the electric signal of silicon photoelectric diode and output thereof is through its amplifying circuit 11 and filtering circuit 12, modulated synchronization signal 9 synchronous demodulations that partly provide by modulated light source then, promptly by phase sensitive detection 13, produce a d. c. voltage signal that is directly proportional with incident chopped radiation energy, amplify 14 to single-chip microcomputer 15 through direct current, respectively to the signal of measured object and reference plate sample, computing.By printing display device 16 the emissivity data are printed and shown again.
By the spectral component of control incident radiation and the spectral response of radiometer, can also measure the emissivity of various spectrum or spectral range.
The emissivity reference plate is opaque lambert's body, and its reflectivity and emissivity all equate on all directions, and has its emissivity to equal one to deduct reflectivity.The rate-aided signal 17 of reference plate is stored, with single-chip microcomputer 15 co-operations, when then measuring the emissivity of measured object, can remove from reference plate is placed on the radiation of measured object position measurement reflection modulation, and, can obtain the emissivity of measured object directly the measured object reflection modulation radiation computing of comparing with rate-aided signal.Reference plate divides third gear to implement by the size of emissivity, i.e. emission is respectively 0.10-0.30,0.30-0.60, and the basic, normal, high third gear of 0.60-0.99, like this, applicable to the measurement of the emissivity of wide range.
The inventive method has following good effect and advantage:
1, because having adopted phase sensitive detection, signal to noise ratio is significantly improved, improved measurement sensitivity.
2, owing to adopted modulated light source, so that radiometer only responds chopped radiation, the radiation of certainly penetrating of environmental radiation and measured object is not responded. So this method can be worked, also can carry out emissivity measurement to the object of any temperature under any complex environment radiation.
3, whole measuring process is non-contacting, does not destroy the original temperature field, and is fully suitable In in-site measurement. This method has adopted nonocclusive metering system, can be than telemeasurement, and also can on-line measurement.
4, by the spectrum composition of control incident radiation and the spectral response of radiometer, can measure the direction emissivity of various spectrum and spectral region.
5, the emissivity scope that can survey is very wide.
Claims (1)
1, a kind of method of emissivity in-site measurement, comprising:
1.1, initiatively light source places on the certain distance on measured object reference plate surface, radiometer is placed on the position that can receive the active radiation of light source that is reflected, and the relative position between fixing initiatively light source and radiometer, the measured object/reference plate three;
1.2, initiatively light source produces the radiation that a branch of radiation wavelength is λ, incides on the measured object surface, radiometer receives the active radiation of light source that is reflected, at this moment radiometer is output as V;
1.3, replace measured object with reference plate at same position, at this moment radiometer is output as V
S
1.4, calculate the emissivity of measured object because
V/V
S=ρ
d/ρ
ds=(1-ε
d)/(1-ε
d8)，
Then the emissivity of testee is:
δ
d=1-(V/V
8)(1-ε
d8)
In the formula, ρ
dBe the reflectivity of testee, ρ
D6Be the reflectivity of reference plate, ε
dBe the emissivity of testee, ε
D8Emissivity for reference plate;
It is characterized in that:
1.5, the active radiation of light source is modulated, and provide synchronizing signal;
1.6, synchronizing signal is used for phase sensitive detection, makes radiometer only respond the chopped radiation that is reflected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 91107415 CN1021254C (en) | 1991-05-30 | 1991-05-30 | A Method for Field Measurement of Emissivity |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 91107415 CN1021254C (en) | 1991-05-30 | 1991-05-30 | A Method for Field Measurement of Emissivity |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1059205A true CN1059205A (en) | 1992-03-04 |
| CN1021254C CN1021254C (en) | 1993-06-16 |
Family
ID=4908757
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 91107415 Expired - Fee Related CN1021254C (en) | 1991-05-30 | 1991-05-30 | A Method for Field Measurement of Emissivity |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1021254C (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102042993A (en) * | 2010-11-23 | 2011-05-04 | 清华大学 | System for measuring normal spectral emissivity of high-temperature material |
| CN102081037A (en) * | 2009-11-30 | 2011-06-01 | 中国第一汽车集团公司 | Method for testing coating infrared emittance with spectral reflectance method |
| CN102353691A (en) * | 2011-06-23 | 2012-02-15 | 哈尔滨工业大学 | Multispectral emissivity on-line measuring device based on hemispherical front reflector and method thereof |
| CN102565803A (en) * | 2010-11-17 | 2012-07-11 | 三星电子株式会社 | Infrared sensor module |
| CN103175783A (en) * | 2011-12-21 | 2013-06-26 | 中国航空工业集团公司沈阳发动机设计研究所 | Surface emissivity tester |
| CN107870157A (en) * | 2017-10-24 | 2018-04-03 | 航天材料及工艺研究所 | Device and method for testing high-temperature thermal radiation coefficient of ablation heat-resistant material |
| CN108760770A (en) * | 2018-05-24 | 2018-11-06 | 上海航天测控通信研究所 | A kind of thermal control coating loss test device and method |
| CN114486185A (en) * | 2021-12-27 | 2022-05-13 | 河南师范大学 | A device and method for measuring the emissivity of a mirror body |
-
1991
- 1991-05-30 CN CN 91107415 patent/CN1021254C/en not_active Expired - Fee Related
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102081037A (en) * | 2009-11-30 | 2011-06-01 | 中国第一汽车集团公司 | Method for testing coating infrared emittance with spectral reflectance method |
| CN102565803A (en) * | 2010-11-17 | 2012-07-11 | 三星电子株式会社 | Infrared sensor module |
| CN102565803B (en) * | 2010-11-17 | 2015-09-02 | 三星电子株式会社 | Infrared sensor module |
| CN102042993A (en) * | 2010-11-23 | 2011-05-04 | 清华大学 | System for measuring normal spectral emissivity of high-temperature material |
| CN102042993B (en) * | 2010-11-23 | 2012-05-16 | 清华大学 | A measurement system for normal spectral emissivity of high temperature materials |
| CN102353691A (en) * | 2011-06-23 | 2012-02-15 | 哈尔滨工业大学 | Multispectral emissivity on-line measuring device based on hemispherical front reflector and method thereof |
| CN103175783B (en) * | 2011-12-21 | 2015-05-20 | 中国航空工业集团公司沈阳发动机设计研究所 | Surface emissivity tester |
| CN103175783A (en) * | 2011-12-21 | 2013-06-26 | 中国航空工业集团公司沈阳发动机设计研究所 | Surface emissivity tester |
| CN107870157A (en) * | 2017-10-24 | 2018-04-03 | 航天材料及工艺研究所 | Device and method for testing high-temperature thermal radiation coefficient of ablation heat-resistant material |
| CN107870157B (en) * | 2017-10-24 | 2020-10-23 | 航天材料及工艺研究所 | Device and method for testing high temperature thermal emissivity of ablative heat-resistant materials |
| CN108760770A (en) * | 2018-05-24 | 2018-11-06 | 上海航天测控通信研究所 | A kind of thermal control coating loss test device and method |
| CN108760770B (en) * | 2018-05-24 | 2021-05-11 | 上海航天测控通信研究所 | Thermal control coating loss testing device and method |
| CN114486185A (en) * | 2021-12-27 | 2022-05-13 | 河南师范大学 | A device and method for measuring the emissivity of a mirror body |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1021254C (en) | 1993-06-16 |
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