CN105635388B - A kind of current test method and equipment of intelligent terminal - Google Patents

Abstract

A current testing method for an intelligent terminal, comprising: a test terminal device performs current sampling on the tested intelligent terminal, and records the system precision time of the test terminal device corresponding to each current value obtained by sampling; according to the test terminal device and the system frame number of the wireless signal respectively received by the intelligent terminal, and determine the corresponding relationship between the test terminal equipment and the system precise time of the intelligent terminal; according to the system precise time of the test terminal equipment corresponding to each current value , and the corresponding relationship between the test terminal device and the precise system time of the smart terminal, and determine the corresponding relationship between each current value and the precise system time of the smart terminal. Corresponding devices are also provided. The current test accuracy of the smart terminal can be improved, and it is helpful for the optimization and debugging of the power consumption of the smart terminal.

Description

A current testing method and device for an intelligent terminal

technical field

The invention relates to the technical field of terminal current measurement, in particular to a current testing method and equipment for an intelligent terminal.

Background technique

As the performance of the terminal gets better and better, the screen gets bigger and bigger, and the supported wireless communication rate gets faster and faster, the battery life problem becomes more and more prominent. Therefore, during the development process of each smart terminal, software and hardware will be precisely adjusted to ensure optimal system power consumption. Especially in the wireless communication modem (Modem) part, its power consumption accounts for a large proportion of the system power consumption, and strict and precise adjustment is required.

High-precision current test equipment is an important tool for Modem power consumption debugging. High-precision and high-sampling-rate test instruments such as Agilent 66319 are widely used. But this kind of equipment has a defect: the current data tested by the instrument is not synchronized with the wireless communication process of the terminal under test. That is to say, the instrument measures a large current at a certain point in time, but it cannot accurately correspond to the specific moment of the terminal under test. Because the current wireless communication time slot is at the ms level, taking 4G LTE as an example, a transmission subframe is 1 ms. That is to say, the time point of the current test and the time point of the terminal under test need to be synchronized to the level of 1 ms, so that the current abnormal point can be one-to-one corresponding to each wireless communication subframe of the terminal under test.

When the smart terminal communicates with the wireless network, it is necessary to start the Modem/RF circuit, etc., and the power consumption of the terminal will have current peaks one by one, and the duration of this peak is at the ms level. Moreover, the wireless interaction of the terminal is very frequent and irregular. The time of the current current meter and the terminal network to be tested cannot be synchronized. Therefore, even if some peak points with relatively large current are tested, there is no way to correspond to a specific wireless frame, making it difficult to optimize and debug wireless network power consumption.

Contents of the invention

Embodiments of the present invention provide a current testing method and equipment for an intelligent terminal, so as to improve the current testing accuracy of the intelligent terminal and help optimize and debug power consumption of the intelligent terminal.

In order to solve the above-mentioned technical problems and achieve the above-mentioned beneficial effects, the present invention provides a current testing method of an intelligent terminal, which includes: the test terminal device samples the current of the intelligent terminal under test, and records the corresponding current value of each current value obtained by sampling. The system precision time of the test terminal device; according to the system frame numbers of the wireless signals respectively received by the test terminal device and the intelligent terminal, determine the corresponding relationship between the test terminal device and the system precision time of the intelligent terminal; according to each The system precision time of the test terminal equipment corresponding to each current value, and the corresponding relationship between the test terminal equipment and the system precision time of the smart terminal, and determine the correspondence between each current value and the system precision time of the smart terminal relation.

The present invention also provides a test terminal device, including: a sampler, used to sample the current of the smart terminal under test; a wireless communication module, used to receive wireless signals; a processor, used to record each current value obtained by sampling The corresponding precise system time of the test terminal device; according to the system frame numbers of the wireless signals respectively received by the test terminal device and the intelligent terminal, determine the correspondence between the system precise time of the test terminal device and the intelligent terminal Relationship; according to the system precision time of the test terminal device corresponding to each current value, and the corresponding relationship between the test terminal device and the system precision time of the smart terminal, determine each current value and the system precision time of the smart terminal exact time correspondence.

Compared with the prior art, the present invention uses the test terminal equipment to sample the current of the tested energy terminal, and records the system accurate time of the test terminal equipment corresponding to each current value, according to the wireless signal received by the test terminal equipment and the smart terminal respectively. The system frame number determines the corresponding relationship between the precise system time of the two; furthermore, the corresponding relationship between each current value and the precise system time of the smart terminal can be determined. The precise time of the system is at the ms level. In this way, the time point of the current test and the time point of the smart terminal are synchronized to the ms level, and the current abnormal point can be one-to-one corresponding to each wireless communication subframe of the smart terminal. The power consumption of the wireless communication Modem part of the smart terminal is precisely tuned and optimized.

Description of drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following will briefly introduce the accompanying drawings that are required in the description of the embodiments and prior art. Obviously, the accompanying drawings in the following description are only some implementations of the present invention For example, those skilled in the art can also obtain other drawings based on these drawings without creative work.

FIG. 1 is a schematic diagram of connection between a test terminal device and a tested smart terminal according to an embodiment of the present invention;

2 is a schematic flowchart of a current testing method for a smart terminal provided by an embodiment of the present invention;

FIG. 3 is a schematic structural diagram of a SIB message of LTE;

Figures 4a and 4b are schematic diagrams comparing the wireless system messages of the smart terminal and the test terminal equipment;

Fig. 5 is a schematic structural diagram of a test terminal device provided by an embodiment of the present invention.

Detailed ways

An embodiment of the present invention provides a current testing method for a smart terminal, so as to improve the current testing accuracy of the smart terminal and help optimize and debug power consumption of the smart terminal. The embodiment of the present invention also provides corresponding equipment.

In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

The smart terminal mentioned in the embodiment of the present invention may be, for example, a smart phone, a tablet computer, and the like. In the embodiment of the present invention, a test terminal device is used to perform a current test on the smart terminal.

As shown in FIG. 1 , it is a schematic diagram of the connection between the test terminal device and the smart terminal under test according to the embodiment of the present invention. Among them, the smart terminal can be but not limited to:

1. The power supply is powered by a fake battery, and the power line of the fake battery is connected in series with a resistor with a high precision and a small resistance (it can be but not limited to a 10 milliohm resistor). Here, the resistance is represented by Rmeasu.

2. On the main board of the terminal to be tested, the battery power supply circuit is close to the battery connection position, and a resistor with high precision and small resistance (can be but not limited to a 10 milliohm resistor, and the resistance is represented by Rmeasu here).

That is to say, a resistor is connected in series in the power supply line of the smart terminal, and the test terminal device can obtain the current of the smart terminal by measuring the current of the resistor, and the resistor can be called the resistance to be tested. A test wire can be drawn from both ends of the resistance to be tested. The test end device may have an interface, and the two test wires drawn from both ends of the resistance to be tested of the smart terminal may be connected to the test end device through this interface. Specifically, the test terminal device can calculate the current value according to the voltage value and the resistance value by measuring the voltage value at both ends of the test resistor.

As shown in Figure 1, the test terminal equipment in the embodiment of the present invention may include the following components:

The sampler is used to sample the current of the smart terminal under test; in some embodiments of the present invention, the sampler can use an analog-to-digital converter (Analog-to-Digital Converte, ADC) module, and there must be at least 2 channels , which are respectively used to sample the voltage at both ends of the resistance to be measured. The two test wire signals drawn from both ends of the resistance to be tested can be respectively introduced into the 2-way AD sampler input terminals of the ADC module. In order to achieve accurate one-to-one correspondence between sampling time points and wireless communication subframes, it is preferable that the sampling rate of each channel reaches at least 2 KHz (because each subframe of a wireless network is about 1 ms). Most existing ADCs built into smart terminals can meet this requirement. In the embodiment of the present invention, the test terminal device may use an ADC independent of the smart terminal as a sampler, or may use an ADC built in the smart terminal as a sampler.

The wireless communication module is used to establish a connection with the wireless network and receive wireless signals; the wireless communication module can be implemented by using a Modem, and a SIM card or a USIM card can be inserted into the Modem to access the wireless network. The wireless communication module obtains time synchronization of the wireless network by communicating with the wireless network.

The processor (Central Processing Unit, CPU) is responsible for processing and saving the data sampled by the ADC and the wireless network data obtained by the Modem module. According to the sampling data obtained by the sampler and the wireless signal received by the wireless communication module, the processor can determine the corresponding relationship between the current value in the sampling data and the system precision time (time of ms level) of the intelligent terminal.

Based on the test terminal equipment shown in FIG. 1 and the connection relationship with the smart terminal, a current testing method for the smart terminal is provided.

Please refer to Fig. 2, the current testing method of the smart terminal provided by the embodiment of the present invention may include:

210. The test terminal device performs current sampling on the smart terminal under test, and records the system precise time of the test terminal device corresponding to each current value obtained by sampling.

The test terminal equipment can perform current sampling on the smart terminal according to the preset period or frequency, and the preset period or frequency can be determined according to the scheduling period of the wireless network. For example, in the time domain of the LTE (Long Term Evolution, Long Term Evolution) system The time slot (0.5ms) is used for resource scheduling, so in the embodiment of the present invention, for example, sampling may be performed at a frequency of 2KHz, or in other words, sampling may be performed at a period of 0.5ms. In the obtained sampling data, not only the current value obtained by sampling in each cycle, but also the time corresponding to each current value should be recorded. Generally, the accuracy of local time in devices such as test-end devices or smart terminals cannot reach the ms level. In the embodiment of the present invention, it is also necessary to apply the precise time of the system. The precise time of the system is represented by a serial number. Two adjacent sequences The time difference between numbers is generally at the ms level, for example, 5ms. In the sampling data in the embodiment of the present invention, the recorded time corresponding to each current value includes the corresponding local time and the system precise time.

In some embodiments of the present invention, the current sampling of the smart terminal by the test terminal device may include: the test terminal device collects the voltage value at both ends of the resistance to be tested in real time, and the resistance to be tested is connected in series to the terminal of the smart terminal. In the power supply line: acquire the current value of the smart terminal according to the collected voltage value and the resistance value of the resistance to be measured.

In some embodiments of the present invention, before the test terminal device performs current sampling on the smart terminal, it further includes: the test terminal device accesses the wireless network and resides in the same cell as the smart terminal; the test terminal The device receives the periodic system message transmitted in the wireless network in real time; the test terminal device acquires the periodic system message received by the smart terminal; the test terminal device receives the system frame number and the smart The system frame number in the periodic system message received by the terminal is used to calculate the corresponding relationship between the precise system time of the test terminal device and the precise system time of the smart terminal.

220. Determine the corresponding relationship between the system precision time of the test end device and the smart terminal according to the system frame numbers of the wireless signals respectively received by the test end device and the smart terminal.

The smart terminal can access the wireless network to receive wireless signals. The test terminal device in the embodiment of the present invention can also access the wireless network through the wireless communication module, reside in the same cell as the smart terminal under test, and also receive wireless signals. The wireless signal The system frame number in can represent the transmission time of the data frame of the wireless signal. Since the smart terminal and the test device reside in the same cell, the wireless signals they receive come from the same base station, and the transmission time represented by the system frame number of the wireless signal Time is unified. Therefore, according to the system frame numbers of the wireless signals respectively received by the test end device and the smart terminal, the corresponding relationship between the test end device and the smart terminal's precise system time can be determined.

In some embodiments of the present invention, the wireless signal received in this step may be, for example, a periodic system message, such as wireless communication master information (Master Information Block, MIB) or wireless communication system information (SystemInformation, SIB). It could be other system messages that take advantage of the periodic presence in the wireless network. Wherein, the SIB message is as shown in FIG. 3 .

230. According to the system precision time of the test terminal device corresponding to each current value, and the corresponding relationship between the test terminal device and the system precision time of the smart terminal, determine each current value and the system precision time of the smart terminal exact time correspondence.

Based on the corresponding relationship between the current value obtained in step 210 and the system precise time of the test terminal device, and the corresponding relationship between the test terminal device and the system precise time of the smart terminal obtained in step 220, the current value and the system precise time of the smart terminal can be obtained corresponding relationship. Moreover, since the test cycle and system precision time are both accurate to the ms level, a high-precision correspondence of the ms level is obtained, so that the time point of the current test and the time point of the smart terminal are synchronized to the ms level. The current abnormal point is one-to-one corresponding to each wireless communication subframe of the smart terminal, so that the power consumption of the wireless communication Modem part of the smart terminal can be precisely tuned and optimized. By using the technical solution of the invention, the current value of an intelligent terminal can be accurately measured at any time, and the abnormal point of the current can be easily found for debugging.

In order to facilitate a better understanding of the technical solutions provided by the embodiments of the present invention, an implementation manner in a specific scenario is used as an example to introduce below.

Taking the LTE network as an example, the main system message (MIB) is sent by the base station at a period of every frame (10 ms). The MIB contents of each adjacent four times are exactly the same, only the CRC (Cyclic Redundancy Check, cyclic redundancy check code) is scrambled with different masks to distinguish the order of the four MIBs. So the period is 40ms.

The implementation process of the embodiment of the present invention specifically includes:

S1. Connect the smart terminal to be tested and the current test terminal device according to Figure 1.

S2. The smart terminal to be tested starts up, stays on the network and completes other preparatory work. Read the network standard, frequency band, channel and cell where the smart terminal resides. The smart terminal opens the log (log) and starts to do various tests.

S3. The test terminal device starts up. The test terminal device is inserted into the same SIM card as the smart terminal to be tested, and supports the function of locking the cell, so as to reside in the same cell as the smart terminal. The test end equipment requires the Modem to keep working continuously in order to record the necessary MIB information. Taking LTE as an example, the system frame number range is 0-1023, corresponding to 0-10.23s. Therefore, it is required that the current test terminal needs to record the MIB information at least twice every 10s, so as to align with the time of the smart terminal.

S4. The test terminal device turns on the log and starts to record the voltages U1 and U2 at both ends of the resistance Rmeasu to be tested in real time. Here U1 refers to the voltage of the resistance to be tested close to the battery terminal of the smart terminal to be tested, and U2 refers to the voltage of the resistance to be tested far away from the smart terminal to be tested. Terminal voltage at the battery terminals.

Use U1, U2 and Rmeasu to calculate the current. The calculation principle is: current I=(U1-U2)/Rmeasu. Record at least 2000 times per second, each time the data format can be as shown in Table 1:

Table 1 Current measurement record table

Among them, Index is the serial number, Time is the precise time of the system, Local Time is the local time, and CurrentValue is the current value.

S5. The test end device is tested.

S6. Upload the smart terminal log, the test terminal device log, and the current sampling data measured during the whole process to the data processor for processing. Here, the said data processor may be the processor of the test terminal equipment, or the processor of another computer equipment.

S7. Time calibration is performed first. The calibration algorithm is as follows:

(1) Find MIBs with similar local time times. Taking Figures 4a and 4b as examples, the local time of the smart terminal MIB on the left is 5:54:03, and the serial number of the system precise time (time column) is: 601113115, the system frame Number: 0101100100b (0x164,356).

The local time of the MIB of the test device on the right is 5:54:11, the system precise time (time column) is 4586619, and the system frame number is 0011001000b (0xC8,200).

It should be noted that the precise system time in this example is in units of 5 ms. In the actual situation, due to the different platforms selected by the current test terminal, the unit will be different. The case cited by the present invention is selected to be the MTK (MediaTek, MediaTek) platform, and the precise time unit of its system is 5ms. It will change for other platforms.

The precise time unit of the system refers to: the system precise time difference is one code (code), and the physical time difference is how many ms. For example, in this example, the time difference between the precise time 601113115 and 601113116 of the terminal system to be tested is 5 ms.

(2) Calculate the time alignment point and time difference between the smart terminal and the test device as shown in Table 2:

Table 2 Time alignment point and time difference

in:

Time difference = (frame number of the system where the MIB of the test terminal equipment is located - frame number of the system where the MIB of the intelligent terminal to be tested is located)*10ms=((1023+200)-356)*10ms=8.67s.

The precise time offset calculation method is: time difference/system precise time unit=8.67/0.005=1734.

The physical meaning of this value is: the system time 601113115 of the terminal under test and the system time 4586619-1734=4,584,885 of the current test terminal are precisely synchronized.

S8. The current value of the smart terminal to be tested at any time can be calculated according to the following method:

Time point of the current test terminal=(time point of the terminal to be tested−time comparison point of the terminal to be tested)+(time comparison point of the current test terminal−time difference).

(1) Read the precise time point of the smart terminal system to be tested, for example, the current value at 601118118 in Figure 3 needs to be known.

(3) The smart terminal 601118118 to be tested corresponds to (601118118-601113115)+(4586619-1734)=4,589,888.

(3) Find the current value corresponding to the current test table according to the precise time point 4,589,888 of the system (according to the time column in Table 1).

It should be noted that the time calibration proposed in the embodiment of the present invention may be performed only once, or may be performed multiple times according to the step of S7, so as to more accurately synchronize the time of the smart terminal and the test terminal device.

It should be noted that the test terminal device in the embodiment of the present invention can be directly integrated into the smart terminal to be tested, that is to say, the measurement of the current and the ADC module are completed by the hardware of the smart terminal to be tested. own CPU for data processing. In this way, the smart terminal can perform current self-detection, and if abnormal current is found, it can intelligently trace the application program that caused the abnormal current, and then alarm or forcibly close the program to achieve the purpose of saving power consumption.

It can be seen from the above that in some feasible embodiments of the present invention, the time point of the current test and the time point of the smart terminal can be synchronized to the ms level, so that the current abnormal point and each wireless communication subframe of the smart terminal can be one by one Correspondingly, thus, the power consumption of the wireless communication Modem part of the smart terminal can be precisely tuned and optimized.

In order to better implement the above solutions of the embodiments of the present invention, related devices for coordinating the implementation of the above solutions are also provided below.

Please refer to FIG. 5, an embodiment of the present invention provides a test terminal device 50, which may include:

A sampler 501, configured to perform current sampling on the smart terminal under test;

A wireless communication module 502, configured to receive wireless signals;

The processor 503 is configured to record the system precision time of the test end device corresponding to each current value obtained by sampling; determine the system frame number of the wireless signal received by the test end device and the smart terminal respectively. The corresponding relationship between the test terminal device and the system precise time of the smart terminal; the system precise time of the test terminal device corresponding to each current value, and the correspondence between the test terminal device and the system precise time of the smart terminal The corresponding relationship between each current value and the precise system time of the smart terminal is determined.

Wherein, the sampler 501, the wireless communication module 502 and the processor 503 may be connected through a bus.

In some embodiments of the present invention, the sampler 501 is specifically used to collect the voltage value at both ends of the resistance to be measured in real time, and the resistance to be measured is connected in series in the power supply line of the smart terminal; the processor 503, It is also used to obtain the current value of the smart terminal according to the collected voltage value and the resistance value of the resistance to be measured.

In some embodiments of the present invention, the wireless communication module 502 is also used to access the wireless network and reside in the same cell as the smart terminal; receive periodic system messages transmitted in the wireless network in real time; the processing The device 503 is also used to obtain the periodic system message received by the smart terminal; according to the system frame number in the periodic system message received by the local end and the system frame number in the periodic system message received by the smart terminal, calculate the The corresponding relationship between the system precision time of the test terminal device and the system precision time of the smart terminal.

In some embodiments of the present invention, the periodic system information is wireless communication master information MIB or wireless communication system information SIB.

In some embodiments of the invention, the sampler is an analog-to-digital converter (ADC).

The test terminal device in the embodiment of the present invention may be independent of the smart terminal device, or may be integrated in the smart terminal, for example.

It can be understood that the functions of the test terminal device in the embodiment of the present invention can be specifically realized according to the method in the above method embodiment, and the specific implementation process can refer to the relevant description in the above method embodiment, and will not be repeated here.

It can be seen from the above that in some feasible implementations of the present invention, when the test terminal device samples the current of the energy terminal under test, it records the system accurate time of the test terminal device corresponding to each current value, and according to the test terminal device and the smart The system frame numbers of the wireless signals received by the terminals respectively determine the corresponding relationship between the precise system time of the two; furthermore, the corresponding relationship between each current value and the precise system time of the intelligent terminal can be determined. The precise time of the system is at the ms level. In this way, the time point of the current test and the time point of the smart terminal are synchronized to the ms level, and the current abnormal point can be one-to-one corresponding to each wireless communication subframe of the smart terminal. The power consumption of the wireless communication Modem part of the smart terminal is precisely tuned and optimized.

In the foregoing embodiments, the descriptions of each embodiment have their own emphases, and for parts not described in detail in a certain embodiment, reference may be made to relevant descriptions of other embodiments.

It should be noted that for the foregoing method embodiments, for the sake of simple description, they are expressed as a series of action combinations, but those skilled in the art should know that the present invention is not limited by the described action sequence, because Certain steps may be performed in other orders or simultaneously in accordance with the present invention. Secondly, those skilled in the art should also know that the embodiments described in the specification belong to preferred embodiments, and the actions and modules involved are not necessarily required by the present invention.

Those of ordinary skill in the art can understand that all or part of the steps in the various methods of the above-mentioned embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium, and the storage medium can include: ROM, RAM, disk or CD, etc.

The current testing method and equipment of the smart terminal provided by the embodiment of the present invention have been introduced in detail above. In this paper, specific examples are used to illustrate the principle and implementation of the present invention. The description of the above embodiment is only used to help understand the present invention. The method of the invention and its core idea; at the same time, for those of ordinary skill in the art, according to the idea of the present invention, there will be changes in the specific implementation and scope of application. In summary, the content of this specification should not be understood To limit the present invention.

Claims (11)

1. a kind of current test method of intelligent terminal, which is characterized in that including：

It tests end equipment and current sample, each electric current that record sampling obtains is carried out to tested intelligent terminal according to predetermined period It is worth the system Perfect Time of the corresponding test end equipment, wherein predetermined period is determined according to the dispatching cycle of wireless network；

The System Frame Number of the wireless signal received respectively with the intelligent terminal according to the test end equipment determines the time difference；

Determine that Perfect Time biases according to the time difference；

The correspondence of the test end equipment and the system Perfect Time of the intelligent terminal is determined according to the time offset；

According to each current value it is corresponding it is described test end equipment system Perfect Time and the test end equipment with it is described The correspondence of the system Perfect Time of intelligent terminal determines each current value and the system Perfect Time of the intelligent terminal Correspondence.

2. according to the method described in claim 1, it is characterized in that, the test end equipment carries out current sample to intelligent terminal Including：

The test end equipment acquires the voltage value at testing resistance both ends in real time, and the testing resistance is series at the intelligent terminal Supply line in；

The current value of the intelligent terminal is obtained according to the resistance value of the voltage value of acquisition and the testing resistance.

3. according to the method described in claim 1, it is characterized in that, the test end equipment carries out current sample to intelligent terminal Before, further include：

The test end equipment accesses wireless network and resides in same cell with the intelligent terminal；

The periodic system message of the test end equipment real-time reception transmission in wireless network；

The test end equipment obtains the periodic system message that intelligent terminal receives；

System Frame Number in the periodic system message that the test end equipment is received according to local terminal is received with intelligent terminal Periodic system message in System Frame Number, calculate system Perfect Time and the intelligent terminal of the test end equipment The correspondence of system Perfect Time.

4. according to the method described in claim 3, it is characterized in that,

The periodic system message is wireless communication main information MIB or wireless communication system information SIB.

5. according to any methods of claim 1-3, which is characterized in that

The system Perfect Time is accurate to Millisecond.

6. a kind of test end equipment, which is characterized in that including：

Sampler, for carrying out current sample to tested intelligent terminal according to predetermined period, wherein predetermined period is according to wireless The dispatching cycle of network determines；

Wireless communication module, for receiving wireless signal；

Processor, the system Perfect Time for recording the corresponding test end equipment of each current value that sampling obtains；Root The System Frame Number of the wireless signal received respectively with the intelligent terminal according to the test end equipment determines the time difference, according to described Time difference determines that Perfect Time biases, the system for determining the test end equipment and the intelligent terminal according to the time offset The correspondence of Perfect Time；According to the corresponding test system Perfect Time of end equipment of each current value and described The correspondence for testing end equipment and the system Perfect Time of the intelligent terminal, determines each current value and the intelligent terminal System Perfect Time correspondence.

7. test end equipment according to claim 6, which is characterized in that

The sampler, is specifically used for the voltage value at acquisition testing resistance both ends in real time, and the testing resistance is series at the intelligence In the supply line of energy terminal；

The processor is additionally operable to obtain the intelligent terminal according to the voltage value of acquisition and the resistance value of the testing resistance Current value.

8. test end equipment according to claim 6, which is characterized in that

The wireless communication module is additionally operable to access wireless network and resides in same cell with the intelligent terminal；It connects in real time Receive the periodic system message of transmission in wireless network；

The processor is additionally operable to obtain the periodic system message that intelligent terminal receives；The periodicity received according to local terminal System Frame Number in the periodic system message that System Frame Number in system message is received with intelligent terminal, calculates the test The correspondence of the system Perfect Time of end equipment and the system Perfect Time of the intelligent terminal.

9. test end equipment according to claim 8, which is characterized in that

The periodic system message is wireless communication main information MIB or wireless communication system information SIB.

10. test end equipment according to claim 6, which is characterized in that

The sampler is analog-digital converter ADC.

11. a kind of computer readable storage medium, is stored with computer program, wherein the computer program to calculate Machine executes such as method described in any one of claim 1 to 5.