CN105203807B - Electrical detection jig and electrical inspection method - Google Patents

Abstract

The present invention provides a kind of electrical detection jig and electrical inspection methods, are related to display technology field, can make electrically to detect the electrical connection that the contact on the probe and substrate to be measured of jig is stablized under the premise of not increasing production cost, not extending the manufacturing cycle.Wherein, the electrical detection jig includes carrier and is set to multiple probes of carrier inside, and the tip of probe is protruded from the bottom of carrier, and the electrical detection jig further includes：It is set to multiple air passages of carrier inside, the bottom of one end perforation carrier of air passage；The air extractor being connected with the other end of air passage makes air passage generate negative pressure in the bottom of carrier for being evacuated when carrying out electrically detection.Aforementioned electrical detection jig is for electrically detecting substrate to be measured.

Description

Electrical testing fixture and electrical testing method

technical field

The invention relates to the field of display technology, in particular to an electrical detection fixture and an electrical detection method.

Background technique

During the manufacturing process of the display panel, it is necessary to perform electrical inspection on a quarter panel. Referring to Fig. 1 , during detection, the electrical testing fixture 10 is connected to the testing equipment (not shown in Fig. 1 ) through the lead wire 13, and the probe 12 of the electrical testing fixture 10 is in contact with the contact on the substrate 20 to be tested, thereby realizing The detection device is electrically connected to the substrate 20 to be tested, so that the detection device sends a detection signal to the substrate 20 to be tested to realize the electrical detection of the substrate 20 to be tested.

In the above process, a certain force needs to be applied to the electrical testing fixture 10 and/or the substrate 20 to be tested, so that the probe 12 can be electrically connected to the contacts on the substrate 20 to be tested stably, so as to ensure the smooth progress of the test. The usual practice is that an operator holds the electrical testing jig 10, aligns the probe 12 of the electrical testing jig 10 with the contact on the substrate 20 to be tested, and applies pressure to the electrical testing jig 10 to make the probe 12 is in close contact with the contacts on the substrate 20 to be tested. However, this method cannot guarantee the amount of pressure applied, and applying pressure for a long time will cause fatigue, resulting in unstable electrical connection between the probe 12 and the contact; and because it is necessary to apply pressure artificially, at least two operators are required for detection 1. One person presses the electrical detection jig 10, and the other person performs the measurement, which results in a decrease in work efficiency and an increase in labor costs, which in turn causes prolongation of the manufacturing cycle and increase in production costs.

In view of the above problems, the prior art proposes the method of applying mechanical force, which specifically includes: placing the substrate 20 to be tested on a base, and mechanically pushing the electrical detection jig 10 to move toward the base, so that the electrical detection The probes 12 of the jig 10 are in close contact with the contacts on the substrate 20 to be tested. Although this method can solve the disadvantages caused by manual force application, since it is necessary to set up an abutment specially used to carry the substrate 20 to be tested, and the substrate 20 to be tested is a quarter panel with a larger area, Therefore, the size of the abutment needs to be large, and special equipment for applying force needs to be provided, resulting in increased production costs; in addition, the substrate 20 to be tested needs to be transported from the production line to the abutment during inspection, resulting in a longer manufacturing cycle.

Contents of the invention

In order to overcome the defects in the above-mentioned prior art, the present invention provides an electrical testing fixture and an electrical testing method, so that the probes of the electrical testing fixture and the electrical testing method can be used without increasing the production cost and prolonging the manufacturing cycle. The contacts on the substrate provide a stable electrical connection.

To achieve the above object, the present invention adopts the following technical solutions:

The first aspect of the present invention provides an electrical testing fixture, including a carrier and a plurality of probes arranged inside the carrier, the tips of the probes protrude from the bottom of the carrier, the electrical testing fixture It also includes: a plurality of air passages arranged inside the carrier, one end of the air passages passes through the bottom of the carrier; an air extraction device connected to the air passages, the air extraction device is connected to the air passage The other end is connected, and is used for pumping air during electrical testing, so that the air passage can generate negative pressure at the bottom of the carrier.

In the above-mentioned electrical detection fixture, a plurality of air passages are provided in the carrier, so that one end of the air passages passes through the bottom of the carrier, and an air extraction device is connected to the air passages, and the air extraction device is used to pump air through the air passages. Negative pressure is formed at the bottom, so that when the above-mentioned electrical testing fixture is used for electrical testing of the substrate to be tested, the formed negative pressure can make the bottom of the carrier closely adhere to the surface of the substrate to be tested, and then the probes of the electrical testing fixture and The contacts on the substrate to be tested are tightly fitted to form a stable electrical connection. There is no need to manually apply force during the testing process, and there is no need to specially set up abutments and force-applying equipment, and to move the substrate to be tested. Therefore, the use of the above-mentioned electrical testing fixture will not increase production costs, and will not prolong the manufacturing cycle.

The second aspect of the present invention provides an electrical detection method. The electrical detection method is suitable for the above-mentioned electrical detection fixture. The electrical detection method includes: aligning the probes on the electrical detection fixture The contact of the substrate to be tested; the air extraction device is used to pump air, and a negative pressure is generated between the electrical detection fixture and the substrate to be tested, so that the probe is electrically connected to the contact; The substrate to be tested is electrically inspected.

The above electrical testing method is applicable to the electrical testing jig provided in the first aspect of the present invention, and the beneficial effects it can produce are the same as those of the electrical testing jig, and will not be repeated here.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only These are some embodiments of the present invention. Those skilled in the art can also obtain other drawings based on these drawings without creative work.

Fig. 1 is the cross-sectional structure diagram of the electric detection jig in the prior art;

FIG. 2 is a cross-sectional structure diagram of an electrical testing fixture provided by an embodiment of the present invention.

Explanation of reference signs:

10-Electrical testing fixture; 11-Carrier; 12-Probe;

13-lead wire; 14-ventilation channel; 15-air delivery channel;

16-elastic pad; 20-substrate to be tested.

Detailed ways

In order to make the purpose, features and advantages of the technical solution proposed by the present invention more obvious and understandable, the embodiments of the technical solution proposed by the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are only some of the embodiments of the proposed technical solution, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

Referring to Fig. 2, the embodiment of the present invention provides a kind of electrical detection jig 10, and this electrical detection jig 10 comprises: carrier 11, a plurality of probes 12, a plurality of air passages 14 and suction device (not shown in Fig. 2 Out), wherein, the probe 12 is arranged inside the carrier 11, and the tip of the probe 12 protrudes from the bottom of the carrier 11; the air channel 14 is arranged inside the carrier 11, and one end of the air channel 14 passes through the bottom of the carrier 11; the air extraction device and The other end of the air passage 14 is connected to each other, and the air pumping device is used for drawing air during electrical testing, so that the air passage 14 generates a negative pressure at the bottom of the carrier 11 .

In the electrical detection fixture 10 mentioned above, by providing the air channel 14 and the air extraction device, when performing electrical testing, the air extraction device can be used to draw air through the air channel 14 to form a negative pressure at the bottom of the carrier 11, and the negative pressure formed The pressure can make the bottom of the carrier 11 closely adhere to the surface of the substrate 20 to be tested, so that the probes 12 of the electrical testing fixture 10 closely adhere to the contacts on the substrate 20 to be tested, forming a stable electrical connection. Due to the use of the negative pressure between the bottom of the carrier and the surface of the substrate to be tested, the probe 12 can form a stable electrical connection with the contacts without manual application of force during the detection process, which also avoids problems caused by manual application of force. The problem of unstable electrical connection, low work efficiency and high labor cost avoids the increase of production cost and the prolongation of the manufacturing cycle; and there is no need to specially set up the abutment and force-applying equipment for electrical testing, and it is not necessary to place the The substrate is transported from the production line to the base platform for electrical testing, thereby avoiding the problems of increased production cost and prolonged manufacturing period caused thereby. It can be seen that the electrical testing jig provided in this embodiment realizes the stable electrical contact between the probe 12 of the electrical testing jig 10 and the contact on the substrate 20 to be tested without increasing the production cost and prolonging the manufacturing cycle. connect.

Furthermore, compared with the abutment and force application equipment used in the mechanical force application method in the prior art, the electrical detection fixture 10 provided by this embodiment is smaller in size and better in portability, so the operator can hold it The electrical testing jig directly performs electrical testing on the substrate 20 to be tested on the production line, without the need to carry the substrate 20 to be tested, so the electrical testing jig 10 provided in this embodiment is especially suitable for electrical testing of the substrate 20 to be tested with a large area. .

Moreover, the electrical testing jig 10 provided in this embodiment has extremely high practicability when the horizontal base cannot be found, because the electrical testing jig 10 in the prior art is used, if it is loaded when applying pressure The abutment surface of the substrate to be tested is uneven, and the substrate to be tested is deformed by force, which will cause some contacts on the substrate to be tested to be unable to make good contact with the probes of the electrical testing fixture, thereby failing to form a good electrical connection; this embodiment In this method, since the electrical connection between the probe 12 and the contact is formed, a negative pressure is formed between the electrical testing fixture 10 and the substrate 20 to be tested, so the contact between the probe 12 and the contact is not subject to load. Influenced by the levelness of the surface of the base platform of the substrate 20 , even if the surface of the base platform is uneven, the presence of negative pressure can make the probes 12 closely contact with the contacts to form a stable electrical connection.

In order to make each probe 12 of the electrical detection fixture 10 be electrically connected to each contact on the substrate 20 to be tested, a negative pressure can be uniformly formed on the bottom of the carrier 11 of the electrode detection fixture 10, so that multiple The air passages 14 are evenly arranged inside the carrier 11, so as to realize a good electrical connection between the probe 12 and the contacts. More preferably, the air channel 14 can be arranged at the gap between a plurality of probes 12, so that there is an air channel 14 around each probe 12, which further improves the electrical contact between the probe 12 and the contact. connection performance.

In order to realize the connection between the air channel 14 and the air extraction device, an air delivery channel 15 can be arranged inside the carrier 11, so that the air channel 14 and the air extraction device are connected to the air delivery channel 15 respectively, so that the air extraction device can pass through the air delivery channel uniformly 15 extracts the gas in the air passage 14, which is conducive to simplifying the internal structure of the electrical testing fixture 10. Certainly, the connection between the air channels 14 and the air extraction device can also be connected in other ways, such as each air channel 14 is directly connected with the air extraction device respectively.

In the electrical detection jig 10 provided in this embodiment, an elastic pad 16 can also be provided at the bottom of the carrier 11, and a plurality of first through holes and a plurality of second through holes are arranged in the elastic pad 16, and the probe 12 The tip protrudes from the first through hole to realize electrical connection with the contact on the substrate 20 to be tested, and the second through hole communicates with the air channel 14 to generate negative pressure at the bottom of the carrier 11 . Because the elastic pad 16 has elasticity, it can fill up the gap between the two contact surfaces when the bottom of the carrier 11 is attached to the substrate 20 to be tested, so that the two can be more closely attached, thereby further improving the contact between the probe 12 and the contact surface. The stability of the electrical connection between points. The elastic pad 16 can be made of elastic material. In order to avoid short circuit between the probes 12, the elastic pad 16 is preferably made of elastic material with good insulation performance, such as rubber material.

In order to further improve the stability of the electrical connection between the probe 12 of the electrical detection jig 10 and the contact on the substrate 20 to be tested, a suction cup can also be arranged on the bottom edge of the carrier 11, and the bottom surface of the carrier 11 and the substrate 20 to be tested During the process of fitting the surface of the substrate, the air in the suction cup is squeezed out, thereby forming a negative pressure environment inside the suction cup, so that the bottom surface of the carrier 11 and the surface of the substrate 20 to be tested are more closely attached, and the probe 12 is also It is possible to more stably electrically connect to the contacts. The suction cup is disposed on the edge of the bottom of the carrier 11 so as not to occupy the area where the probes 12 are located and thus not to affect the electrical connection between the probes 12 and the contacts. The number of suction cups can be multiple, so that the bottom surface of the carrier 11 can be more firmly attached to the surface of the substrate 20 to be tested.

It should be noted that, in this embodiment, the length, pipe diameter, number of installations and the power of the air extraction device when the air passage 14 is exhausted can all be determined according to the size of the electrical detection fixture 10, the volume of the substrate 20 to be tested, and the detection According to the actual factors such as the size of the suction that needs to be generated, the corresponding design is carried out.

The electrical testing fixture 10 provided in this embodiment may further include a plurality of lead wires 13, and these lead wires 13 are respectively connected to a plurality of probes 12, so as to connect the probes 12 with the testing equipment.

In this embodiment, the electrical detection jig 10 can also include a spring, which is fixed on the non-tip of the probe 12. During the electrical detection process, the spring shrinks under force. On the one hand, the rebound force generated by the spring acts on the probe. 12, it can ensure that the probe 12 is in electrical contact with the contact on the substrate 20 to be tested. On the other hand, the contraction of the spring can produce a buffering effect on the force when the probe 12 touches the contact, preventing the tip of the probe 12 from touching the contact and the contact. Film layers and components on the substrate 20 to be tested cause damage.

In addition, the material of the carrier 11 in this embodiment can be a polymer material, which has a certain mechanical strength, so as to provide support for the probe 12 , the air channel 14 and the elastic pad 16 .

Based on the above-mentioned electrical detection fixture 10, the present embodiment also provides an electrical detection method, which is suitable for the above-mentioned electrical detection fixture, and the electrical detection method includes the following steps:

Step S1 : Align the probes 12 on the electrical testing jig 10 with the contacts of the substrate 20 to be tested. In this step, the operator can hold the carrier 11 of the electrical testing jig 10 to complete the alignment of the probes 12 and the contacts.

Step S2: Use the air pumping device to pump air to generate a negative pressure between the electrical testing fixture 10 and the substrate 20 to be tested, so that the probe 12 is electrically connected to the contact.

Step S3: performing electrical inspection on the substrate 20 to be tested. In this step, the detection device connected to the probe 12 through the lead wire 13 sends a detection signal to the probe 12, and the detection signal is transmitted to the circuit on the substrate 20 to be tested through the probe 12 and the contact 20, thereby realizing electrical detection .

In the above electrical detection method, by forming a negative pressure at the bottom of the carrier 11 of the electrical detection jig 10, the bottom of the carrier 11 is closely attached to the surface of the substrate 20 to be tested, so that the probe 12 of the electrical detection jig 10 and The contacts on the substrate 20 to be tested are closely attached to form a stable electrical connection. There is no need to manually apply force during the detection process, and there is no need to specially set up a base and force application equipment for electrical detection, thereby avoiding the problems of increased production cost and prolonged manufacturing cycle caused thereby. Moreover, in the electrical testing method described above, the operator can hold the electrical testing jig 10 and directly perform electrical testing on the substrate 20 to be tested on the production line without transporting the substrate 20 to be tested, thereby simplifying the operation during electrical testing.

It should be noted that the electrical detection method provided in this embodiment is applicable to the electrical detection of a display panel or a circuit board to be tested.

The above description is only a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention are all Should be covered within the protection scope of the present invention. Therefore, the protection scope of the present invention should be determined by the protection scope of the claims.

Claims (8)

1. a kind of electrical detection jig, including carrier and the multiple probes for being set to the carrier inside, the tip of the probe It is protruded from the bottom of the carrier, which is characterized in that the electrical detection jig further includes：

Multiple air passages of the carrier inside are set to, one end of the air passage penetrates through the bottom of the carrier；

The air extractor being connected with the other end of the air passage makes the air passage for being evacuated when carrying out electrically detection Negative pressure is generated in the bottom of the carrier；

The multiple air passage is uniformly arranged on the carrier inside；Between the air passage is set between the multiple probe At gap.

2. electrical detection jig according to claim 1, which is characterized in that the electrical detection jig further includes being set to The gas transmission road of the carrier inside, the air passage and the air extractor are connected with the gas transmission road respectively.

3. electrical detection jig according to claim 1, which is characterized in that the electrical detection jig further includes being set to The cushion of the bottom of the carrier has multiple first through hole and multiple second through-holes on the cushion, the probe Tip is prominent from the first through hole, and second through-hole is penetrated through with the air passage.

4. electrical detection jig according to claim 3, which is characterized in that the cushion is rubber pad.

5. electrical detection jig according to claim 1, which is characterized in that the electrical detection jig further includes being set to The sucker at the edge of the bottom of the carrier.

6. electrically detecting jig according to Claims 1 to 5 any one of them, which is characterized in that the electrical detection jig is also Including a plurality of leads being connected respectively with the multiple probe, the lead is for the probe to be connected with detection device.

7. electrically detecting jig according to Claims 1 to 5 any one of them, which is characterized in that the electrical detection jig is also Spring including the non-tip for being fixed on the probe.

8. a kind of electrical inspection method, which is characterized in that the electrical inspection method is suitable for such as any one of claim 1~7 The electrical detection jig, the electrical inspection method include：

By the contact of the probe alignment substrate to be measured on the electrical detection jig；

It is evacuated using air extractor, negative pressure is generated between the electrical detection jig and the substrate to be measured, made described Probe is electrically connected with the contact；

The substrate to be measured is electrically detected.