CN104812945A - Surface-treated electrolytic copper foil, laminates, and printed wiring boards - Google Patents
Surface-treated electrolytic copper foil, laminates, and printed wiring boards Download PDFInfo
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- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/06—Wires; Strips; Foils
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- C—CHEMISTRY; METALLURGY
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- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
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- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
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- C25D1/00—Electroforming
- C25D1/04—Wires; Strips; Foils
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- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/56—Electroplating: Baths therefor from solutions of alloys
- C25D3/58—Electroplating: Baths therefor from solutions of alloys containing more than 50% by weight of copper
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- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/06—Wires; Strips; Foils
- C25D7/0614—Strips or foils
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
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- H—ELECTRICITY
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- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
- H05K3/382—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal
- H05K3/384—Improvement of the adhesion between the insulating substrate and the metal by special treatment of the metal by plating
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0355—Metal foils
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Abstract
Description
技术领域technical field
本发明涉及一种表面处理电解铜箔、积层板、及印刷配线板。The present invention relates to a surface-treated electrolytic copper foil, a laminate, and a printed wiring board.
背景技术Background technique
印刷配线板自这半个世纪以来取得了较大的发展,如今甚至用于几乎所有电子机器。伴随近年的电子机器的小型化、高性能化需要的增大,搭载零件向高密度安装化或信号向高频化发展,对于印刷配线板要求导体图案的微细化(微间距化)或应对高频等。Printed wiring boards have developed considerably over the past half century, and are now even used in almost all electronic devices. With the increasing demand for miniaturization and high performance of electronic equipment in recent years, high-density mounting of mounted parts or high-frequency signals have developed, and printed wiring boards are required to miniaturize (fine-pitch) or respond to conductor patterns. high frequency etc.
铜箔粗糙化处理面的粗糙度越低,越良好地形成导体图案相对于印刷配线板的微间距。因此,伴随近年的导体图案的微间距化,对铜箔粗糙化处理面的低粗糙度化的要求增大。The lower the roughness of the copper foil roughened surface, the better the fine pitch of the conductor pattern with respect to the printed wiring board is formed. Therefore, with the finer pitch of conductor patterns in recent years, there is an increasing demand for low roughness of the roughened surface of copper foil.
另一方面,铜箔与树脂接着而构成积层板,但就此时的与树脂的密接可靠性而言,由于铜箔的粗糙面的粗糙度越大则于粗糙面产生的固定效果越高,因而密接可靠性越好。该密接可靠性于形成微间距的方面为一个重要的管理项目,且只要90°剥离强度为固定值(0.6kg/cm)以上即可。又,作为其它密接可靠性的评价方法,有使与树脂基板的积层体浸渍于260℃的高温浴中,测定于表面产生的突起数的方法,将该突起产生数为0~1个/m2设为密接可靠性的基准。On the other hand, the copper foil is bonded to the resin to form a laminate, but in terms of the reliability of adhesion to the resin at this time, the greater the roughness of the rough surface of the copper foil, the higher the fixing effect on the rough surface. Therefore, the better the bonding reliability is. This adhesion reliability is an important management item in the formation of fine pitches, and it is only necessary that the 90° peel strength be a fixed value (0.6 kg/cm) or more. In addition, as another evaluation method of adhesion reliability, there is a method of immersing a laminate with a resin substrate in a high-temperature bath at 260° C., and measuring the number of protrusions generated on the surface, and the number of protrusions is 0 to 1 per m 2 is set as a standard of adhesion reliability.
关于可实现微间距化且提高与树脂的密接可靠性的铜箔,开发有各种技术。例如,于专利文献1中,揭示有一种表面处理铜箔,其特征在于具备与绝缘树脂基材的接着面,该接着面的表面粗糙度(Rzjis)为2.5μm以下,以利用激光法测定表面积为6550μm2的二维区域时的表面积(三维面积:Aμm2)与二维区域面积之比[(A)/(6550)]所算出的表面积比(B)的值为1.25~2.50,二维区域的每单位面积的铬的量为2.0mg/m2以上。Various technologies have been developed for copper foil that can realize finer pitches and improve the reliability of adhesion to resins. For example, Patent Document 1 discloses a surface-treated copper foil characterized by having an adhesive surface with an insulating resin base material, the surface roughness (Rzjis) of the adhesive surface is 2.5 μm or less, and the surface area is measured by a laser method. The value of the surface area ratio (B) calculated from the ratio of the surface area (three-dimensional area: Aμm 2 ) to the area of the two-dimensional region [(A)/(6550)] when it is a two-dimensional region of 6550 μm 2 is 1.25 to 2.50, and the two-dimensional The amount of chromium per unit area of the region is 2.0 mg/m 2 or more.
专利文献1:日本特开2009-105286号公报。Patent Document 1: Japanese Unexamined Patent Publication No. 2009-105286.
发明内容Contents of the invention
发明所欲解决的课题The problem to be solved by the invention
如专利文献1中所揭示般,背景技术主要为如下技术,即为了提高与树脂的密接可靠性,尤其着眼于铜箔的粗糙化面的Rz,并对其进行控制。然而,根据发明者等人的研究,获得如下结果:即便以使铜箔的粗糙化面的Rz成为相同值的方式进行控制,且其它条件亦设为相同,上述的与树脂基板的接着界面的突起产生数亦不同。因此,可明确若为仅对铜箔的粗糙化面的Rz进行控制的铜箔,则不足以获得良好的密接可靠性。As disclosed in Patent Document 1, the background art mainly focuses on Rz of the roughened surface of copper foil and controls it in order to improve the adhesion reliability with resin. However, according to the studies of the inventors, it was found that even if Rz of the roughened surface of the copper foil is controlled to have the same value and other conditions are the same, the above-mentioned bonding interface with the resin substrate The number of protrusions is also different. Therefore, it became clear that only the copper foil which controls Rz of the roughened surface of copper foil is not enough to acquire favorable adhesion reliability.
本发明提供一种表面处理电解铜箔、积层板、及印刷配线板,该表面处理电解铜箔可实现微间距化且与树脂的密接可靠性优异。The present invention provides a surface-treated electrolytic copper foil, a laminate, and a printed wiring board. The surface-treated electrolytic copper foil can achieve finer pitches and has excellent adhesion reliability with resin.
解决课题的技术手段Technical means to solve the problem
于降低粗糙化面的Rz以使铜箔的导体图案微间距化的情形时,于铜箔表面与树脂基板的接着界面,空气积存于形成于铜箔表面的微细的凹凸。由于难以去除该空气,故而若设为高温状态,则积存于微细的凹凸的空气膨胀而产生突起。因此,本发明者等人反复努力研究,结果发现:通过对铜箔表面赋予如即便使用微间距化用的低粗糙化铜箔而空气亦不易积存于铜箔表面般的构造,从而可抑制所述突起的产生,由此可获得与树脂基板的良好的密接可靠性。When the Rz of the roughened surface is reduced to finer the pitch of the conductor pattern of the copper foil, air accumulates in the fine unevenness formed on the surface of the copper foil at the bonding interface between the surface of the copper foil and the resin substrate. Since it is difficult to remove the air, if the temperature is high, the air accumulated in the fine unevenness expands to form protrusions. Therefore, the inventors of the present invention have made intensive studies and found that by providing the surface of the copper foil with a structure such that air does not easily accumulate on the surface of the copper foil even if a low-roughened copper foil for fine-pitching is used, it is possible to suppress all The generation of the above-mentioned protrusions can be prevented, thereby achieving good adhesion reliability with the resin substrate.
基于以上的见解而完成的本发明的一个方面是一种表面处理电解铜箔,其使用触针式粗糙度计测定出的铜箔的粗糙面的粗糙度Rz为2.0μm以下,所述粗糙面的粗糙度曲线的峰度(kurtosis)数Sku为2~4。One aspect of the present invention made based on the above knowledge is a surface-treated electrodeposited copper foil whose roughness Rz of the rough surface of the copper foil measured using a stylus type roughness meter is 2.0 μm or less, and the rough surface The number of kurtosis (kurtosis) Sku of the roughness curve is 2-4.
于本发明的表面处理电解铜箔的一个实施方式中,所述粗糙度Rz为0.8~1.8μm。In one Embodiment of the surface-treated electrolytic copper foil of this invention, the said roughness Rz is 0.8-1.8 micrometers.
于本发明的表面处理电解铜箔的另一实施方式中,所述峰度数Sku为2.5~3.5。In another embodiment of the surface-treated electrolytic copper foil of the present invention, the number of kurtosis Sku is 2.5 to 3.5.
于本发明的表面处理电解铜箔的又一实施方式中,所述粗糙面的表面积A、与俯视所述粗糙面时所得的面积B之比A/B为1.2~2.0。In still another embodiment of the surface-treated electrodeposited copper foil of the present invention, the ratio A/B of the surface area A of the rough surface to the area B obtained when the rough surface is planarly viewed is 1.2 to 2.0.
于本发明的表面处理电解铜箔的进而又一实施方式中,所述比A/B为1.3~1.9。In still another embodiment of the surface-treated electrodeposited copper foil of this invention, the said ratio A/B is 1.3-1.9.
于本发明的表面处理电解铜箔的进而又一实施方式中,常态剥离强度为0.8kg/cm以上。In yet another embodiment of the surface-treated electrodeposited copper foil of the present invention, the normal-state peel strength is 0.8 kg/cm or more.
本发明的另一方面是一种积层板,其是积层本发明的表面处理电解铜箔与树脂基板而构成。Another aspect of the present invention is a laminate formed by laminating the surface-treated electrolytic copper foil of the present invention and a resin substrate.
本发明的又一方面是一种以本发明的积层板为材料的印刷配线板。Still another aspect of the present invention is a printed wiring board made of the laminate of the present invention.
发明的效果The effect of the invention
根据本发明,可提供一种表面处理电解铜箔、积层板、及印刷配线板,该表面处理电解铜箔可实现微间距化且与树脂的密接可靠性优异。According to the present invention, it is possible to provide a surface-treated electrodeposited copper foil, a laminate board, and a printed wiring board, which can realize finer pitches and has excellent adhesion reliability with resin.
附图说明Description of drawings
图1是实施例1的试样的粗糙化处理面的SEM观察照片。FIG. 1 is an SEM observation photograph of the roughened surface of the sample of Example 1. FIG.
图2是比较例1的试样的粗糙化处理面的SEM观察照片。FIG. 2 is an SEM observation photograph of the roughened surface of the sample of Comparative Example 1. FIG.
具体实施方式Detailed ways
本发明中所使用的电解铜箔是对通过与树脂基板接着而制作积层体,并利用蚀刻将其去除而使用的电解铜箔较为有用。The electrodeposited copper foil used in the present invention is useful as an electrodeposited copper foil that is used by bonding to a resin substrate to form a laminate and removing it by etching.
本发明中所使用的电解铜箔是以于铜箔的与树脂基板接着的面、即粗糙化面提高积层后的铜箔的剥离强度(密接可靠性)为目的,而对预处理后的铜箔的表面实施进行疙瘩状的电镀的粗糙化处理。电解铜箔虽然于制造时间点具有凹凸,但通过粗糙化处理而增强电解铜箔的凸部而使凹凸变得更大。The purpose of the electrolytic copper foil used in the present invention is to improve the peel strength (adhesion reliability) of the laminated copper foil on the surface of the copper foil that is bonded to the resin substrate, that is, the roughened surface, and the pretreated The surface of the copper foil is subjected to a roughening treatment of bump-like plating. Although the electrodeposited copper foil has irregularities at the time of manufacture, the convexities of the electrodeposited copper foil are reinforced by the roughening treatment to make the irregularities larger.
[粗糙度Rz][Roughness Rz]
本发明的表面处理电解铜箔依据JIS B0601-1994并使用触针式粗糙度计测定出的铜箔的粗糙面的粗糙度Rz为2.0μm以下。若粗糙度Rz超过2.0μm,则于铜箔表面与树脂基板的接着界面,空气容易积存于形成于铜箔表面的微细的凹凸而难以去除该空气。因此,若设为高温状态,则积层于微细的凹凸的空气膨胀而产生突起。使用触针式粗糙度计测定出的上述粗糙化面的粗糙度Rz较佳为0.8~1.8μm,更佳为1.0~1.7μm。该粗糙度Rz可通过使铜箔的光泽面(S面)处理条件最佳化及使用两面平滑生箔而进行控制。The surface-treated electrolytic copper foil of the present invention conforms to JIS B0601-1994, and the roughness Rz of the rough surface of the copper foil measured using a stylus roughness meter is 2.0 μm or less. When the roughness Rz exceeds 2.0 μm, air tends to accumulate in fine unevenness formed on the copper foil surface at the bonding interface between the copper foil surface and the resin substrate, and it becomes difficult to remove the air. Therefore, in a high-temperature state, the air deposited on the fine unevenness expands to generate protrusions. The roughness Rz of the roughened surface measured using a stylus-type roughness meter is preferably from 0.8 to 1.8 μm, more preferably from 1.0 to 1.7 μm. This roughness Rz can be controlled by optimizing the glossy surface (S surface) processing conditions of copper foil and using both-surface smooth raw foil.
[峰度数Sku][Kurtosis Sku]
对于本发明的表面处理电解铜箔的存在于粗糙面的凹凸,就其“峭度”对与树脂基板的密接可靠性产生影响的观点而言,将粗糙面的粗糙度曲线的峰度数Sku控制为2~4。粗糙度曲线的峰度数Sku表示铜箔粗糙面上的凹凸的尖峭状况(圆滑状况),峰度数Sku越小,凹凸越成为带有弧度的曲线,峰度数Sku越大,凹凸成为越尖峭的曲线。粗糙度曲线的峰度数Sku是依据ISO25178绘图的利用非接触式粗糙度计的三维表面粗糙度测定中的凹凸的尖峭程度的指标,以下述式表示是三维表面粗糙度的Z轴方向的凹凸(凸起的)高度且于基准长度lr的凸起的高度Z(x)的下述四次方根除以下述均方根粗糙度Rq的四次方而得者。The kurtosis Sku of the roughness curve of the rough surface is controlled from the viewpoint that the "kurtosis" of the unevenness existing on the rough surface of the surface-treated electrodeposited copper foil of the present invention affects the adhesion reliability with the resin substrate. 2 to 4. The kurtosis Sku of the roughness curve indicates the sharpness (smoothness) of the unevenness on the rough surface of the copper foil. The smaller the kurtosis Sku, the more curved the unevenness becomes, and the larger the kurtosis Sku, the sharper the unevenness becomes. curve. The kurtosis number Sku of the roughness curve is an index of the sharpness of the unevenness in the three-dimensional surface roughness measurement using the non-contact roughness meter drawn in accordance with ISO25178, and is represented by the following formula as the unevenness in the Z-axis direction of the three-dimensional surface roughness The (protrusion) height obtained by dividing the following fourth power of the height Z(x) of the protrusion at the reference length lr by the fourth power of the following root mean square roughness Rq.
于基准长度lr的凸起的高度的四次方根:The fourth root of the height of the protrusion at the reference length lr:
{(1/lr)×∫Z4(x)dx(其中,积分为0至lr的累计值)}{(1/lr)×∫Z 4 (x)dx (where the integral is the accumulated value from 0 to lr)}
均方根粗糙度Rq:Root mean square roughness Rq:
Rq:√{(1/lr)×∫Z2(x)dx(其中,积分为0至lr的累计值)}Rq: √{(1/lr)×∫Z 2 (x)dx (wherein, the integral is the cumulative value from 0 to lr)}
粗糙度曲线的峰度数Sku:The number of kurtosis Sku of the roughness curve:
Sku=(1/Rq4)×{(1/lr)×∫Z4(x)dx(其中,积分为0至lr的累计值)}Sku=(1/Rq 4 )×{(1/lr)×∫Z 4 (x)dx (where the integral is the accumulated value from 0 to lr)}
如上所述,于铜箔粗糙面的凹凸的尖峭程度、尖峭形式越陡峭,粗糙度曲线的峰度Sku越大。而且,凹凸的尖峭程度、尖峭形式越陡峭,存在于铜箔粗糙面的凹凸的大小的偏差变得越大。因此,若控制表示控制凹凸形状的粗糙度曲线的峰度数Sku,则可进一步控制存在于铜箔粗糙面的凹凸的大小的更大的偏差。通过如此抑制存在于铜箔粗糙面的凹凸的大小的偏差,即便进行微间距化,空气亦不易积存于铜箔表面。因此,抑制由高温状态下的积存于凹凸内的空气的膨胀所引起的突起的产生,由此可获得与树脂基板的良好的密接可靠性。若粗糙面的粗糙度曲线的峰度Sku未达2,则变得无法保持与树脂的充分的密接力,若超过4,则如上所述,有加热后产生突起的问题。又,粗糙度曲线的峰度数Sku较佳为2.5~3.7,更佳为2.5~3.5,更佳为2.4~3.4。峰度数Sku可通过使铜箔的粗糙化处理条件最佳化而进行控制。As described above, the sharper the degree of sharpness and the steeper the shape of the unevenness on the rough surface of the copper foil, the greater the kurtosis Sku of the roughness curve. In addition, the steeper the degree of sharpness and the sharper form of the unevenness, the greater the variation in the magnitude of the unevenness existing on the rough surface of the copper foil. Therefore, if the number of kurtosis Sku of the roughness curve indicating the control of the uneven shape is controlled, the larger variation in the size of the unevenness existing on the rough surface of the copper foil can be further controlled. By suppressing the variation in the size of the irregularities present on the rough surface of the copper foil in this way, air is less likely to accumulate on the surface of the copper foil even if the pitch is made finer. Therefore, the occurrence of protrusions due to the expansion of the air accumulated in the unevenness in a high-temperature state is suppressed, thereby achieving good adhesion reliability with the resin substrate. When the kurtosis Sku of the roughness curve of the rough surface is less than 2, sufficient adhesive force with the resin cannot be maintained, and if it exceeds 4, as described above, there is a problem that protrusions are generated after heating. In addition, the kurtosis Sku of the roughness curve is preferably from 2.5 to 3.7, more preferably from 2.5 to 3.5, even more preferably from 2.4 to 3.4. The number of kurtosis Sku can be controlled by optimizing the roughening treatment conditions of copper foil.
[表面积比A/B][Surface area ratio A/B]
本发明的表面处理电解铜箔较佳为粗糙面(经粗糙化处理的面)的表面积A、与俯视粗糙面时所得的面积B之比A/B为1.2~2.0。此处,表面积A是利用激光法测定规定范围的二维区域时的表面积(三维面积),俯视粗糙面时所得的面积B表示该二维区域的面积。该等表面积比A/B是表面处理电解铜箔与树脂基板的接触面积的替代指标,若表面积比A/B未达1.2,则有无法充分确保与树脂的密接力的虞,若超过2.0,则如上所述,有出现加热后产生突起的问题的虞。表面积比A/B更佳为1.3~1.9。表面积比A/B可通过使铜箔的粗糙化处理条件最佳化而进行控制。例如,若于铜粗糙化处理液添加W,则表面积比A/B变大。又,若于铜粗糙化处理中提高电流密度,则表面积比A/B变大,若降低电流密度,则表面积比变小。可以如此方式将表面积比A/B控制为1.2~2.0。In the surface-treated electrolytic copper foil of the present invention, it is preferable that the ratio A/B of the surface area A of the rough surface (roughened surface) to the area B obtained when the rough surface is viewed from above is 1.2 to 2.0. Here, the surface area A is the surface area (three-dimensional area) when a two-dimensional region of a predetermined range is measured by the laser method, and the area B obtained when the rough surface is viewed from above represents the area of the two-dimensional region. These surface area ratios A/B are a proxy for the contact area between the surface-treated electrodeposited copper foil and the resin substrate. If the surface area ratio A/B is less than 1.2, sufficient adhesion with the resin may not be ensured. If it exceeds 2.0, Then, as described above, there is a possibility that the problem of protrusions after heating may occur. The surface area ratio A/B is more preferably 1.3 to 1.9. Surface area ratio A/B can be controlled by optimizing the roughening process conditions of copper foil. For example, when W is added to the copper roughening treatment liquid, the surface area ratio A/B increases. In addition, when the current density is increased in the copper roughening treatment, the surface area ratio A/B is increased, and when the current density is decreased, the surface area ratio is decreased. The surface area ratio A/B can be controlled to be 1.2 to 2.0 in this way.
[常态剥离强度][Normal Peel Strength]
本发明的表面处理电解铜箔如上所述具有良好的常态剥离强度。详细而言,本发明的表面处理电解铜箔较佳为依据JIS C5016测定出的常态剥离强度为0.8kg/cm以上。又,该常态剥离强度更佳为0.9kg/cm以上。The surface-treated electrodeposited copper foil of the present invention has good normal-state peel strength as described above. Specifically, the surface-treated electrodeposited copper foil of the present invention preferably has a normal-state peel strength measured in accordance with JIS C5016 of 0.8 kg/cm or more. In addition, the normal-state peel strength is more preferably 0.9 kg/cm or more.
[高温浴槽突起][high temperature bath protrusion]
本发明的表面处理电解铜箔可如上所述良好地抑制高温浴突起。详细而言,本发明的表面处理电解铜箔较佳为形成作为导体图案的微间距电路后,于粗糙化面与树脂基板接着时,于260℃的高温浴槽浸渍1分钟后的突起产生数为0~1个/m2。The surface-treated electrodeposited copper foil of the present invention can suppress high-temperature bath protrusion favorably as described above. Specifically, after the surface-treated electrolytic copper foil of the present invention is preferably formed with a fine-pitch circuit as a conductor pattern, when the roughened surface is bonded to a resin substrate, the number of protrusions after immersion in a high-temperature bath at 260° C. for 1 minute is: 0 to 1 piece/m 2 .
作为本发明的表面处理电解铜箔的制造方法,首先制作电解铜箔(生箔)。本发明中所使用的电解铜箔是具有作为生箔的较为有用的特性即抑制针孔的较高的高温伸长量的电解铜箔。As a method of manufacturing the surface-treated electrodeposited copper foil of the present invention, first, an electrodeposited copper foil (green foil) is produced. The electrodeposited copper foil used in the present invention is an electrodeposited copper foil having high high-temperature elongation that suppresses pinholes, which is a relatively useful characteristic of green foil.
本发明中所使用的电解铜箔可通过使用硫酸酸性硫酸铜电解液的电解进行制作。可通过将该电解液中的胶液浓度调整为0.5ppm以下,较佳为调整为0.01~未达0.2ppm,又,较佳为通过添加经调整的量的氯离子,又,亦一并调整电解液温度、硫酸浓度之类的其它电解条件,而制造无针孔的产生、具有较高的高温伸长量的电解铜箔。减少向使用该电解液所制造的电解铜箔中的胶液的添加量,于高温处理时促进结晶的退火(再结晶),作为其结果,增大高温的伸长率。The electrolytic copper foil used in the present invention can be produced by electrolysis using a sulfuric acid copper sulfate electrolytic solution. The concentration of the glue solution in the electrolyte can be adjusted to be below 0.5ppm, preferably adjusted to 0.01 to less than 0.2ppm, and preferably by adding an adjusted amount of chloride ions, and also adjusted together Other electrolytic conditions such as electrolyte temperature and sulfuric acid concentration can be used to manufacture electrolytic copper foil with no pinholes and high elongation at high temperature. Reducing the amount of glue added to the electrodeposited copper foil manufactured using this electrolytic solution promotes annealing (recrystallization) of crystals during high-temperature treatment, and as a result, increases the elongation at high temperature.
添加氯离子的情形时的本发明中所使用的电解液的组成及电解条件如下所述。The composition and electrolysis conditions of the electrolytic solution used in the present invention when chlorine ions are added are as follows.
(A)电解液组成:(A) Electrolyte composition:
Cu:50~120g/lCu: 50~120g/l
H2SO4:20~200g/l,较佳为40~120g/lH 2 SO 4 : 20-200g/l, preferably 40-120g/l
氯离子(Cl-):20~100ppm(mg/l)Chloride ion (Cl - ): 20~100ppm(mg/l)
胶液:0.5ppm(mg/l)以下,较佳为0.01~未达0.2ppm(mg/l)Glue: less than 0.5ppm (mg/l), preferably 0.01 to less than 0.2ppm (mg/l)
(B)电解条件:(B) Electrolysis conditions:
电解液温度:20~70℃,较佳为40~60℃Electrolyte temperature: 20-70°C, preferably 40-60°C
电流密度:20~150A/dm2 Current density: 20~150A/ dm2
阳极:PbAnode: Pb
若胶液浓度超过0.5ppm,则高温的伸长率几乎未提高。又,为了防止针孔等而必须添加最小限量的胶液。较佳为添加0.01~未达0.2ppm(mg/l)的量的胶液。When the glue concentration exceeds 0.5 ppm, the elongation at high temperature hardly increases. Also, a minimum amount of glue must be added to prevent pinholes and the like. Preferably, the glue solution is added in an amount of 0.01 to less than 0.2 ppm (mg/l).
较理想为将硫酸浓度设为20~200g/l,较佳为40~120g/l。若未达20g/l,则电解液的电导率降低,电解槽电压上升。若超过200g/l,则高温伸长量高的铜箔的制造变得越来越困难,容易产生设备的腐蚀。Ideally, the sulfuric acid concentration is set to 20-200 g/l, preferably 40-120 g/l. If it is less than 20 g/l, the electrical conductivity of the electrolytic solution will decrease, and the voltage of the electrolytic cell will increase. If it exceeds 200 g/l, it will become more and more difficult to manufacture the copper foil with high high-temperature elongation, and corrosion of a facility will become easy to generate|occur|produce.
较佳为于氯离子为20~100ppm(mg/l)的量中添加。于该范围外,电解铜箔的基本特性(抗拉强度、粗糙度等)无法成为固定。氯离子以盐酸、食盐、氯化钾等形式添加。Preferably, it is added in an amount of 20 to 100 ppm (mg/l) of chloride ions. Outside this range, the basic properties (tensile strength, roughness, etc.) of the electrolytic copper foil cannot be fixed. Chloride ions are added in the form of hydrochloric acid, salt, potassium chloride, etc.
较理想为电解液温度设为20~70℃,较佳为40~60℃。若降低电解液温度,则即便胶液浓度较高亦可制造高温伸长量高的铜箔。若未达20℃,则电解液的电导率降低,电解槽电压上升。若超过70℃,则高温伸长量高的铜箔的制造越来越困难,能量成本亦增大。Ideally, the temperature of the electrolyte solution is set at 20-70°C, more preferably at 40-60°C. If the electrolyte temperature is lowered, copper foil with high elongation at high temperature can be produced even if the glue concentration is high. If it is less than 20°C, the electrical conductivity of the electrolytic solution will decrease, and the voltage of the electrolytic cell will increase. When it exceeds 70 degreeC, it will become difficult to manufacture the copper foil with high high temperature elongation, and energy cost will also increase.
为了稳定地且于实用上所容许的时间内制造电解铜箔,电流密度范围为20~150A/dm2。In order to manufacture electrolytic copper foil stably and within a practically allowable time, the current density ranges from 20 to 150 A/dm 2 .
以下,表示生箔制箔中的峰度数Sku的控制方法的例子:The following shows an example of the method of controlling the kurtosis Sku in raw foil manufacturing:
<生箔制箔条件><Conditions for Raw Foil Manufacturing>
于生箔制箔时的电解液中,将胶液浓度设为1~10ppm,SPS[聚二硫二丙烷磺酸钠]设为1~50ppm,胺是化合物[三级胺化合物]设为1~50ppm,由此使生箔表面变得平滑(凹凸变得不尖锐)。由此,于其后的粗糙化处理中,覆铜镀敷后的表面的粗糙化粒子的形状变圆。以如此方式,可使峰度数Sku小于通常的电解铜箔(例如利用添加有铜、硫酸、Cl、胶液的电解液制造生箔的情形)。In the electrolyte solution when raw foil is made of foil, the glue concentration is set to 1-10ppm, SPS [polydithiodipropanesulfonate sodium] is set to 1-50ppm, and the amine compound [tertiary amine compound] is set to 1 ~50ppm, thereby smoothing the surface of the green foil (the unevenness becomes less sharp). Thereby, in the subsequent roughening treatment, the shape of the roughened particles on the surface after the copper clad plating becomes round. In this way, the number of kurtosis Sku can be made smaller than that of ordinary electrolytic copper foil (for example, the case of producing raw foil by using an electrolyte solution added with copper, sulfuric acid, Cl, and glue).
再者,使用以下的化合物作为三级胺化合物。In addition, the following compounds were used as the tertiary amine compound.
(上述化学式中,R1及R2是选自由羟烷基、醚基、芳基、取代芳香族的烷基、不饱和烃基、烷基所组成的群中者;于下述实施例中,R1及R2均设为甲基)(In the above chemical formula, R1 and R2 are selected from the group consisting of hydroxyalkyl groups, ether groups, aryl groups, substituted aromatic alkyl groups, unsaturated hydrocarbon groups, and alkyl groups; in the following examples, R 1 and R 2 are both set to methyl)
再者,下述实施例中所使用的上述化合物可通过混合规定量的例如NagasechemteX股份公司制造的Denacol Ex-314与二甲基胺,于60℃反应3小时而获得。In addition, the above-mentioned compounds used in the following examples can be obtained by mixing predetermined amounts of, for example, Denacol Ex-314 manufactured by NagasechemteX Co., Ltd. and dimethylamine, and reacting at 60° C. for 3 hours.
其次,对电解铜箔的表面进行粗糙化处理。作为粗糙化处理,例如可采用以下所示的条件。于本发明中,将电解铜箔的经粗糙化处理侧的面设为粗糙面。Next, roughen the surface of the electrolytic copper foil. As the roughening treatment, for example, the conditions shown below can be employed. In this invention, the surface of the electrolytic copper foil by the roughening process side is made into a rough surface.
生箔为通常的电解铜箔的情形(例如利用添加有铜、硫酸、Cl、胶液的电解液制造生箔的情形)When the raw foil is ordinary electrolytic copper foil (for example, when the raw foil is produced by using an electrolyte solution added with copper, sulfuric acid, Cl, and glue)
[铜粗糙化处理条件][Copper roughening treatment conditions]
Cu:5~50g/lCu: 5~50g/l
H2SO4:10~100g/lH 2 SO 4 : 10~100g/l
·其他添加元素(條件1~4中的任一个)・Other added elements (any one of conditions 1 to 4)
(条件1)(Condition 1)
As:0.01~20mg/l(ppm)且As: 0.01~20mg/l(ppm) and
W:0.01~10mg/l(ppm)W: 0.01~10mg/l (ppm)
(条件2)(Condition 2)
Mo:0.01~5mg/l(ppm)Mo: 0.01~5mg/l(ppm)
(条件3)(Condition 3)
Mo:0.01~5mg/l(ppm)Mo: 0.01~5mg/l(ppm)
且and
As:0.01~5mg/l(ppm)及/或W:0.01~5mg/l(ppm)及/或Co:0.01~0.5mg/l(ppm)As: 0.01~5mg/l(ppm) and/or W: 0.01~5mg/l(ppm) and/or Co: 0.01~0.5mg/l(ppm)
(条件4)(Condition 4)
As:0.01~20mg/l(ppm)且As: 0.01~20mg/l(ppm) and
W:0.01~10mg/l(ppm)且W: 0.01~10mg/l(ppm) and
Co:0.01~0.5mg/l(ppm)Co: 0.01~0.5mg/l (ppm)
液温:室温(20℃)~50℃Liquid temperature: room temperature (20°C) ~ 50°C
电流密度:5~120A/dm2 Current density: 5~120A/ dm2
时间:1~30秒Time: 1~30 seconds
生箔为两面平滑(平坦)箔(由于将调平剂添加至电解液,故而为铜的析出面较通常的电解铜箔更平滑的箔)的情形(例如利用添加有铜、硫酸、Cl、胶液、SPS、胺化合物的电解液制造生箔的情形)When the raw foil is double-sided smooth (flat) foil (a foil whose copper deposition surface is smoother than ordinary electrolytic copper foil due to the addition of a leveling agent to the electrolyte) (for example, by adding copper, sulfuric acid, Cl, Glue, SPS, electrolyte solution of amine compound when manufacturing raw foil)
[铜粗糙化处理条件][Copper roughening treatment conditions]
Cu:5~50g/lCu: 5~50g/l
H2SO4:10~100g/lH 2 SO 4 : 10~100g/l
·其他添加元素(条件1~4中的任一个)・Other added elements (any one of conditions 1 to 4)
(条件1)(Condition 1)
As:0.01~5mg/l(ppm)且As: 0.01~5mg/l(ppm) and
W:0.01~5mg/l(ppm)W: 0.01~5mg/l (ppm)
(条件2)(Condition 2)
Mo:0.01~3mg/l(ppm)Mo: 0.01~3mg/l(ppm)
(条件3)(Condition 3)
Mo:0.01~3mg/l(ppm)Mo: 0.01~3mg/l(ppm)
且and
As:0.01~5mg/l(ppm)及/或W:0.01~5mg/l(ppm)及/或Co:0.01~1mg/l(ppm)As: 0.01~5mg/l(ppm) and/or W: 0.01~5mg/l(ppm) and/or Co: 0.01~1mg/l(ppm)
(条件4)(Condition 4)
W:0.01~5mg/l(ppm)及/或Co:0.01~1mg/l(ppm)W: 0.01~5mg/l(ppm) and/or Co: 0.01~1mg/l(ppm)
液温:室温(20℃)~50℃Liquid temperature: room temperature (20°C) ~ 50°C
电流密度:5~130A/dm2 Current density: 5~130A/ dm2
时间:1~30秒Time: 1~30 seconds
以下,表示铜粗糙化处理中的峰度数Sku的控制方法的例子:An example of a method of controlling the number of kurtosis Sku in the copper roughening treatment is shown below:
<铜粗糙化处理条件><Copper roughening treatment conditions>
通过于铜粗糙化处理液中添加As及W这两者、或添加Mo,而使粗糙化粒子的形状变圆。以如此方式可使峰度数Sku变小。By adding both As and W, or adding Mo to the copper roughening treatment liquid, the shape of the roughened particles is rounded. In this way, the number of kurtosis Sku can be made small.
又,通过于铜粗糙化处理液中添加Co、或单独添加W(无As),可使粗糙化粒子的形状变尖(粒子的顶端尖锐)。以如此方式可使峰度数Sku变大。Moreover, by adding Co to the copper roughening treatment liquid, or adding W alone (no As), the shape of the roughened particles can be sharpened (the tip of the particle is sharp). In this way, the number of kurtosis Sku can be increased.
进而,可通过降低液温(例如设为20℃以上低于25℃),而使粗糙化粒子的形状变尖(粒子的顶端尖锐)。以如此方式可使峰度数Sku变大。Furthermore, by lowering the liquid temperature (for example, 20° C. or higher and lower than 25° C.), the shape of the roughened particles can be sharpened (the tip of the particle is sharpened). In this way, the number of kurtosis Sku can be increased.
粗糙化处理后,进行较薄的镀铜作为用以防止粒子的脱落的覆层。例如可采用以下的条件。After the roughening treatment, a thinner copper plating is performed as a coating for preventing particle drop-off. For example, the following conditions can be adopted.
[覆铜薄层镀敷条件][Copper clad thin layer plating conditions]
Cu:30~100g/lCu: 30~100g/l
H2SO4:10~200g/lH 2 SO 4 : 10~200g/l
液温:室温~75℃Liquid temperature: room temperature to 75°C
电流密度:5~65A/dm2 Current density: 5~65A/ dm2
时间:1~30秒Time: 1~30 seconds
以下,表示覆铜镀敷处理中的峰度数Sku的控制方法的例子:An example of a method of controlling the number of kurtosis Sku in the copper clad plating process is shown below:
<覆铜镀敷条件><Copper Plating Conditions>
可通过使电流密度变高(例如设为大于60A/dm2),而使粗糙化粒子的形状变尖(粒子的顶端尖锐)。以如此方式可使峰度数Sku变大。By increasing the current density (for example, setting it higher than 60 A/dm 2 ), the shape of the roughened particles can be sharpened (the tip of the particle is sharp). In this way, the number of kurtosis Sku can be increased.
较佳为对粗糙化面进行形成选自Cu、Cr、Ni、Fe、Co及Zn中的1种或2种以上的单一金属层或合金层的加工处理。作为合金镀敷的例子,可列举Cu-Ni、Cu-Co、Cu-Ni-Co、Cu-Zn及其它。如此的加工处理发挥作为决定铜箔的最终特性的作用,又作为障壁的作用。Preferably, the roughened surface is processed to form a single metal layer or an alloy layer of one or more selected from Cu, Cr, Ni, Fe, Co, and Zn. Examples of alloy plating include Cu—Ni, Cu—Co, Cu—Ni—Co, Cu—Zn, and others. Such processing plays a role of determining the final characteristics of the copper foil and also a role of a barrier.
又,亦可以镍、钴、铜、锌的单体或合金等于粗糙化面形成耐热层或防锈层,进而亦可对其表面实施铬酸盐处理、硅烷偶合处理等处理。或亦可不进行粗糙化处理,而以镍、钴、铜、锌的单体或合金等形成耐热层或防锈层,进而对其表面实施铬酸盐处理、硅烷偶合处理等处理。即,可于粗糙化处理层的表面(粗糙化面)形成选自由耐热层、防锈层、铬酸盐处理层及硅烷偶合处理层所组成的群中的1种以上的层,亦可于电解铜箔的表面形成选自由耐热层、防锈层、铬酸盐处理层及硅烷偶合处理层所组成的群中的1种以上的层。再者,上述耐热层、防锈层、铬酸盐处理层、硅烷偶合处理层亦可分别由多层形成(例如2层以上、3层以上等)。In addition, nickel, cobalt, copper, and zinc monomers or alloys can be used to form a heat-resistant layer or an anti-rust layer on the roughened surface, and further treatments such as chromate treatment and silane coupling treatment can also be performed on the surface. Alternatively, without roughening treatment, a heat-resistant layer or an anti-rust layer may be formed with nickel, cobalt, copper, or zinc monomers or alloys, and then the surface may be subjected to chromate treatment, silane coupling treatment, and other treatments. That is, one or more layers selected from the group consisting of a heat-resistant layer, an antirust layer, a chromate-treated layer, and a silane coupling-treated layer may be formed on the surface (roughened surface) of the roughened layer, or One or more layers selected from the group consisting of a heat-resistant layer, a rust-proof layer, a chromate-treated layer, and a silane coupling-treated layer are formed on the surface of the electrolytic copper foil. Furthermore, the above-mentioned heat-resistant layer, rust-proof layer, chromate-treated layer, and silane-coupling-treated layer may each be formed in multiple layers (for example, two or more layers, three or more layers, etc.).
可将本发明的表面处理电解铜箔自粗糙化处理面侧贴合于树脂基板而制造积层体。树脂基板只要为具有可应用于印刷配线板等的特性,则不受特别限制,例如可于刚性PWB(印刷配线板)用中使用纸基材酚树脂、纸基材环氧树脂、合成纤维布基材环氧树脂、玻璃布-纸复合基材环氧树脂、玻璃布-玻璃不织布复合基材环氧树脂及玻璃布基材环氧树脂等,于FPC(柔性配线板)用中使用聚酯膜或聚酰亚胺膜、液晶聚合物(LCP)膜等。A laminate can be produced by bonding the surface-treated electrolytic copper foil of the present invention to a resin substrate from the roughened surface side. The resin substrate is not particularly limited as long as it has properties applicable to printed wiring boards, etc. For example, paper-based phenolic resin, paper-based epoxy resin, synthetic Fiber cloth base epoxy resin, glass cloth-paper composite base epoxy resin, glass cloth-glass non-woven composite base epoxy resin and glass cloth base epoxy resin, etc., used in FPC (flexible wiring board) A polyester film or polyimide film, a liquid crystal polymer (LCP) film, or the like is used.
关于贴合的方法,于刚性PWB用的情形时,准备使树脂含浸于玻璃布等基材,并使树脂硬化至成为半硬化状态而成的预浸体。可通过将铜箔自被覆层的相反侧的面重迭于预浸体并进行加热加压而进行贴合。于FPC的情形时,可通过将聚酰亚胺膜等基材经由接着剂、或不使用接着剂而于高温高压下积层接着于铜箔,或涂布、干燥、硬化聚酰亚胺前驱物等而制造积层板。Regarding the bonding method, in the case of a rigid PWB, a prepreg in which a base material such as glass cloth is impregnated with a resin and cured to a semi-cured state is prepared. Bonding can be performed by laminating the copper foil on the prepreg from the surface on the opposite side of the coating layer, and heating and pressing. In the case of FPC, substrates such as polyimide film can be laminated on copper foil under high temperature and pressure without adhesive or without adhesive, or coated, dried, and hardened polyimide precursor and so on to manufacture laminates.
本发明的积层体可用于各种印刷配线板(PWB),并无特别限制,例如,就导体图案的层数的观点而言,可应用于单面PWB、双面PWB、多层PWB(3层以上),就绝缘基板材料的种类的观点而言,可用于刚性PWB、柔性PWB(FPC)、刚性-柔性PWB。The laminate of the present invention can be used for various printed wiring boards (PWB) without particular limitation, for example, from the viewpoint of the number of layers of the conductor pattern, it can be applied to single-sided PWB, double-sided PWB, and multilayer PWB (3 or more layers), from the viewpoint of the type of insulating substrate material, it can be used for rigid PWB, flexible PWB (FPC), and rigid-flexible PWB.
[实施例][Example]
作为实施例1~6及比较例1~5,通过表1所示的制造条件而制造生箔,继而,通过表2所示的制造条件而进行粗糙化处理,进而,通过表3所示的制造条件而对粗糙化处理面进行覆铜镀敷,而分别形成粗糙面。于表1~3中,处理面M表示无光泽面(铜的析出面),处理面S表示光泽面。As Examples 1 to 6 and Comparative Examples 1 to 5, green foils were manufactured under the manufacturing conditions shown in Table 1, then roughened under the manufacturing conditions shown in Table 2, and then roughened by the manufacturing conditions shown in Table 3. Copper plating is performed on the roughened surface according to the manufacturing conditions to form a rough surface respectively. In Tables 1-3, the processing surface M shows a matte surface (copper precipitation surface), and the processing surface S shows a glossy surface.
[表1][Table 1]
[表2][Table 2]
[表3][table 3]
对于如上所述般制造的实施例及比较例的各样品,如下所述般进行各种评价。Various evaluations were performed as described below about each sample of the examples and comparative examples produced as described above.
触针粗糙度;stylus roughness;
使用小坂研究所股份公司制造的接触粗糙度计Surfcorder SE-3C触针式粗糙度计进行测定。The measurement was performed using a contact roughness meter Surfcorder SE-3C stylus roughness meter manufactured by Kosaka Laboratories Co., Ltd.
表面积比(A/B);Surface area ratio (A/B);
粗糙面的表面积是使用通过激光显微镜的测定法。通过使用Olympus制造的LEXT OLS 4000,测定相当于粗糙化处理面的257.9×257.9μm的面积B(实际资料中为66524μm2)的三维表面积A,并以三维表面积A÷二维表面积B=面积比(A/B)的形式的方法而进行设定。测定环境温度设为23~25℃。The surface area of the rough surface is measured using a laser microscope. Using LEXT OLS 4000 manufactured by Olympus, the three-dimensional surface area A corresponding to the area B of 257.9×257.9 μm (66524 μm 2 in the actual data) of the roughened surface was measured, and the three-dimensional surface area A÷two-dimensional surface area B=area ratio Set in the form of (A/B). The measurement ambient temperature was set at 23 to 25°C.
峰度数Sku;Kurtosis Sku;
使用Olympus制造的LEXT OLS 4000三维表面形状测定装置,以平面0.12μm、高度0.01μm的分辨率测定试验材料的粗糙化处理面的257.9×257.9μm的区域。将测定环境温度设为23~25℃。Using the LEXT OLS 4000 three-dimensional surface profile measuring device manufactured by Olympus, the area of 257.9×257.9 μm on the roughened surface of the test material was measured at a resolution of 0.12 μm in plane and 0.01 μm in height. The measurement environment temperature was set at 23 to 25°C.
常态剥离强度;normal peel strength;
依据JIS C5016(8.1.6测定(1)方法A(90°方向剥离方法)),利用拉伸试验机Autograph100测定常态剥离强度。In accordance with JIS C5016 (8.1.6 Measurement (1) method A (90° direction peeling method)), the normal peel strength was measured using a tensile tester Autograph 100.
高温浴槽突起;High temperature bath protrusion;
将铜箔积层接着于玻璃布基材环氧树脂板,通过蚀刻(氯化铁水溶液)而于铜箔形成微间距电路而制成积层体。继而,将该积层体于260℃的高温浴中浸渍1分钟,测定于表面产生的突起数,并换算为每1m2的个数。Copper foil was laminated on a glass-cloth-based epoxy resin plate, and fine-pitch circuits were formed on the copper foil by etching (aqueous ferric chloride solution) to obtain a laminate. Next, this laminate was immersed in a high-temperature bath at 260° C. for 1 minute, and the number of protrusions formed on the surface was measured and converted into the number per 1 m 2 .
将评价结果示于表4。The evaluation results are shown in Table 4.
[表4][Table 4]
(评价结果)(Evaluation results)
实施例1~6均具有良好的密接可靠性,即便浸渍于高温浴槽中亦未产生突起。All of Examples 1 to 6 had good adhesion reliability, and no protrusions occurred even when immersed in a high-temperature bath.
比较例1~4虽然粗糙度Rz均为2.0μm以下,但由于粗糙面的粗糙度曲线的峰度数Sku为2~4的范围外,故而密接可靠性不良,或浸渍于高温浴槽中时产生大量突起。In Comparative Examples 1 to 4, although the roughness Rz was all 2.0 μm or less, since the kurtosis Sku of the roughness curve of the rough surface was outside the range of 2 to 4, the adhesion reliability was poor, or a large protrusion.
图1中表示实施例1的试样的粗糙化处理面的SEM观察照片。图2中表示比较例1的试样的粗糙化处理面的SEM观察照片。FIG. 1 shows a SEM observation photograph of the roughened surface of the sample of Example 1. As shown in FIG. FIG. 2 shows a SEM observation photograph of the roughened surface of the sample of Comparative Example 1. As shown in FIG.
Claims (8)
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| PCT/JP2013/081806 WO2014081041A1 (en) | 2012-11-26 | 2013-11-26 | Surface-treated electrolytic copper foil, laminate, and printed circuit board |
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| WO2020156159A1 (en) * | 2019-02-01 | 2020-08-06 | 长春石油化学股份有限公司 | Electrolytic copper foil, current collector, electrode, and lithium ion secondary battery comprising electrolytic copper foil |
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| US11283080B2 (en) | 2019-02-01 | 2022-03-22 | Chang Chun Petrochemical Co., Ltd. | Electrodeposited copper foil, current collector, electrode, and lithium ion secondary battery comprising the same |
| CN112118669A (en) * | 2019-06-19 | 2020-12-22 | 金居开发股份有限公司 | Advanced reverse electrolytic copper foil and copper foil substrate using same |
| US11332839B2 (en) | 2019-06-19 | 2022-05-17 | Co-Tech Development Corp. | Advanced electrodeposited copper foil and copper clad laminate using the same |
| CN112118669B (en) * | 2019-06-19 | 2022-08-26 | 金居开发股份有限公司 | Advanced reverse electrolytic copper foil and copper foil substrate using same |
| TWI776168B (en) * | 2019-06-19 | 2022-09-01 | 金居開發股份有限公司 | Advanced reverse-treated electrodeposited copper foil and copper clad laminate using the same |
| CN112864397B (en) * | 2019-11-27 | 2022-04-29 | 长春石油化学股份有限公司 | Electrolytic copper foil, electrode and lithium ion battery comprising same |
| CN112864397A (en) * | 2019-11-27 | 2021-05-28 | 长春石油化学股份有限公司 | Electrolytic copper foil, electrode and lithium ion battery comprising same |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104812945B (en) | 2018-08-28 |
| KR20140124402A (en) | 2014-10-24 |
| KR20170002705A (en) | 2017-01-06 |
| PH12015501174A1 (en) | 2015-08-10 |
| MY176308A (en) | 2020-07-28 |
| WO2014081041A1 (en) | 2014-05-30 |
| JPWO2014081041A1 (en) | 2017-01-05 |
| JP5710845B2 (en) | 2015-04-30 |
| KR102078897B1 (en) | 2020-02-19 |
| PH12015501174B1 (en) | 2019-01-11 |
| TWI509111B (en) | 2015-11-21 |
| TW201428139A (en) | 2014-07-16 |
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Address after: No.4, 10-fan, erdingmu, huzhimen, Tokyo, Japan Patentee after: JX Nippon Mining & Metals Corp. Address before: Tokyo, Japan Patentee before: JX Nippon Mining & Metals Corp. |